Vector network analyzer double-station test system for realizing integration of spread spectrum module millimeter waves
Through the introduction of external expansion circuits and processing platforms in the vector network analyzer, the dual work of the vector network analyzer host and the expansion module is realized, and the problem of the host cannot work when the existing technology expansion module work in the existing technology. Test efficiency and measurement ability.
Patent Information
- Application Number
- CN202411451014.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-10-17
- Publication Date
- 2025-01-24
AI Technical Summary
When the existing vector network analyzer is tested in the millimeter wave band, the host cannot operate when the spread spectrum module is working, resulting in inefficient testing.
A vector network analyzer dual -station test system is designed. By introducing external expansion circuits and processing platforms in the vector network analyzer host, the vector network analyzer host and the dual -work of the spreading module are realized.
When the spread spectrum module is working, the vector network analyzer host can also work normally, which improves test efficiency and can simultaneously measure DUTs from coaxial to 50GHz and V/W bands, saving equipment and time, and reducing overall costs.
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Figure CN119363252A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of vector network analyzer testing, and in particular to the field of vector network analyzer testing in a millimeter wave frequency band, and specifically refers to a vector network analyzer dual-station testing system that realizes integration of a spread spectrum module millimeter wave. Background Art
[0002] Vector network analyzer is the most important and widely used high-precision intelligent test instrument in the field of microwave and millimeter wave test instruments. It enjoys the reputation of "the king of microwave / millimeter wave test instruments" in the industry. It is mainly used to measure the amplitude-frequency, phase-frequency and group delay characteristics of the two-way S parameters of the scattering parameters of the measured network. It is widely used in the development, production, maintenance and measurement of a new generation of military electronic equipment represented by phased array radars. It can also be used in precision guidance, stealth and anti-stealth, aerospace, satellite communications, radar detection and surveillance, teaching experiments, antenna and RCS testing, component testing, material testing and many other fields.
[0003] At present, most of the spectrum spreading modules on the vector network analyzer provide the RF source and the local oscillator source to the spectrum spreading module through the vector network analyzer host port, which will cause the vector network analyzer host to fail to work when the spectrum spreading module is working. The vector network analyzer dual-station test system for integrating the millimeter wave of the spectrum spreading module proposed in the present invention can work when the spectrum spreading module is working and the vector network analyzer host is also working, greatly improving the working efficiency of the vector network analyzer. Summary of the invention
[0004] The purpose of the present invention is to overcome the shortcomings of the above-mentioned prior art and provide a vector network analyzer duplex test system that is easy to operate, has high working efficiency and a wide range of applications and integrates a spread spectrum module millimeter wave.
[0005] In order to achieve the above-mentioned object, the dual-station test system of the vector network analyzer integrating the millimeter wave of the spread spectrum module of the present invention is as follows:
[0006] The main features of the vector network analyzer dual-station test system for integrating the millimeter wave of the spectrum spreading module are as follows: the system includes a vector network analyzer host and a spectrum spreading module, the vector network analyzer host and the spectrum spreading module are connected, the vector network analyzer host includes a core module and an external spectrum spreading circuit, the external spectrum spreading circuit is connected to the core module and communicates via USB; the core module includes a radio frequency multiplication source, a local oscillator multiplication source, a coupler, a mixer, a digital intermediate frequency module, a port1 interface and a port2 interface, the radio frequency multiplication source is used to multiply the radio frequency source The output is 50GHz, the local oscillator frequency doubling source is used to output the local oscillator source frequency doubling to 50GHz, the mixer is connected to the RF frequency doubling source and the local oscillator frequency doubling source, and is used to mix the RF source and the local oscillator source signals into intermediate frequency signals, the digital intermediate frequency module is connected to the mixer, and is used to digitally process the intermediate frequency signal output by the mixer board, the coupler connects the RF frequency doubling source, the local oscillator frequency doubling source, the mixer and the digital intermediate frequency module, the port1 interface and the port2 interface are the output ports of the vector network analyzer host, respectively connected to the two ends of the device under test.
[0007] Preferably, the external spectrum spread circuit includes RF, LO, IFR, IFA and a waveguide interface, wherein the RF is the radio frequency input port of the external spectrum spread module, connected to the external spectrum spread interface of the vector network analyzer host; the LO is the local oscillator input port of the external spectrum spread module, connected to the external spectrum spread interface of the vector network analyzer host; the IFR is the reference path intermediate frequency output port of the external spectrum spread module, connected to the external spectrum spread interface of the vector network analyzer host; the IFA is the measurement path intermediate frequency output port of the external spectrum spread module, connected to the external spectrum spread interface of the vector network analyzer host; and the waveguide interface is the source output and measurement port of the external spectrum spread module.
[0008] Preferably, the system further comprises a processing platform for connecting the vector network analyzer host and the spectrum spreading module, and for combining a partial frequency band of the vector network analyzer host and a frequency band of the spectrum spreading module into one S parameter curve.
[0009] The dual-station test system of the vector network analyzer that integrates the millimeter wave of the spread spectrum module of the present invention can make the spread spectrum module work when the vector network analyzer host is working, which is more convenient for customers to test. The present invention can test two DUTs at the same time; one is the DUT of coaxial to 50GHz, and the other is the DUT of V / W band. The present invention can save equipment and time for customers, so that the overall cost is reduced. BRIEF DESCRIPTION OF THE DRAWINGS
[0010] Figure 1 The figure is an overall schematic diagram of a vector network analyzer host of the present invention that realizes a dual-station test system of a vector network analyzer integrating a spread spectrum module millimeter wave.
[0011] Figure 2 This is a schematic diagram of the appearance of a vector network analyzer host of a vector network analyzer dual-station test system that integrates a spread spectrum module millimeter wave of the present invention.
[0012] Figure 3 It is a schematic diagram of the external spectrum spreading module of the vector network analyzer duplex test system integrating the spectrum spreading module millimeter wave of the present invention.
[0013] Figure 4 Schematic diagram of testing a millimeter wave vector network analyzer external spread spectrum module in a dual-station test system of a vector network analyzer integrating a millimeter wave spread spectrum module of the present invention.
[0014] Figure 5 This is a test diagram of the connection between the commonly used millimeter-wave vector network analyzer host and the external spread spectrum module on the market.
[0015] Figure 6 This is a schematic diagram of the connection between a vector network analyzer host and an external spread spectrum module of the vector network analyzer dual-station test system integrating a spread spectrum module millimeter wave of the present invention.
[0016] Figure 7 It is a schematic diagram of software testing of a dual-station test system of a vector network analyzer integrating a spread spectrum module millimeter wave according to the present invention. DETAILED DESCRIPTION
[0017] In order to more clearly describe the technical content of the present invention, further description is given below in conjunction with specific embodiments.
[0018] The vector network analyzer duplex test system of the present invention realizes the integration of the spread spectrum module millimeter wave, which includes a vector network analyzer host and a spread spectrum module, wherein the vector network analyzer host and the spread spectrum module are connected, and the vector network analyzer host includes a core module and an external spread spectrum circuit, and the external spread spectrum circuit is connected to the core module and communicates via USB; the core module includes a radio frequency multiplication source, a local oscillator multiplication source, a coupler, a mixer, a digital intermediate frequency module, a port1 interface and a port2 interface, and the radio frequency multiplication source is used to multiply the radio frequency source and output it as 50GHz, the local oscillator frequency doubling source is used to output the local oscillator source frequency doubling to 50GHz, the mixer is connected to the RF frequency doubling source and the local oscillator frequency doubling source, and is used to mix the RF source and the local oscillator source signals into intermediate frequency signals, the digital intermediate frequency module is connected to the mixer, and is used to digitally process the intermediate frequency signal output by the mixer board, the coupler connects the RF frequency doubling source, the local oscillator frequency doubling source, the mixer and the digital intermediate frequency module, the port1 interface and the port2 interface are the output ports of the vector network analyzer host, and are respectively connected to the two ends of the device under test.
[0019] As a preferred embodiment of the present invention, the external spectrum spread circuit includes RF, LO, IFR, IFA and a waveguide interface, wherein the RF is the radio frequency input port of the external spectrum spread module, connected to the external spectrum spread interface of the vector network analyzer host; the LO is the local oscillator input port of the external spectrum spread module, connected to the external spectrum spread interface of the vector network analyzer host; the IFR is the reference path intermediate frequency output port of the external spectrum spread module, connected to the external spectrum spread interface of the vector network analyzer host; the IFA is the measurement path intermediate frequency output port of the external spectrum spread module, connected to the external spectrum spread interface of the vector network analyzer host; and the waveguide interface is the source output and measurement port of the external spectrum spread module.
[0020] As a preferred embodiment of the present invention, the system also includes a processing platform for connecting the vector network analyzer host and the spread spectrum module, and for combining part of the frequency band of the vector network analyzer host and the frequency band of the spread spectrum module into an S parameter curve.
[0021] In a specific embodiment of the present invention, it includes: a vector network analyzer host, a spectrum expansion module, and a processing platform. The vector network analyzer host is the core part of the entire system, and mainly includes a radio frequency multiplication source, a local oscillator multiplication source, a coupler, a mixer, a digital intermediate frequency, and an external spectrum expansion circuit. Spread spectrum module: Since the high-frequency coaxial connection loss is relatively large, the host frequency of the network analyzer on the market is basically only up to 67GHz; in the frequency band above 67GHz, the frequency of the vector network analyzer host is mainly expanded to a higher frequency band (V / W band, etc.) through an external S parameter spread spectrum module. The processing platform combines part of the frequency band of the vector network analyzer host and the frequency band of the spread spectrum module into an S parameter curve, which can display both the vector network analyzer host frequency band and the spread spectrum band in one channel of the vector network analyzer. For example, the host frequency band is 1MHz~50GHz and the spread spectrum frequency band is 50GHz~75GHz, and an S parameter curve of 1MHz~50GHz is output.
[0022] The vector network analyzer host mainly comprises port 1, port 2, a radio frequency multiplication source, a local oscillator multiplication source, a mixer board, a coupler, a digital intermediate frequency board, and an external spectrum expansion interface; wherein Port 1 is the output port of port 1 of the vector network analyzer host; Port 2 is the output port of port 2 of the vector network analyzer host; the radio frequency multiplication source is used to multiply the radio frequency source to 50 GHz; the local oscillator multiplication source is used to multiply the local oscillator source to 50 GHz; the coupler is used to connect different circuit modules to realize signal transmission and distribution; the mixer is used to mix the radio frequency source and the local oscillator source signals to produce an intermediate frequency signal; the digital intermediate frequency is used to digitally process the intermediate frequency signal mixed by the mixer board; and the external spectrum expansion circuit is used to provide an interface for connecting the spectrum expansion module with the vector network analyzer host.
[0023] The external spread spectrum mainly includes RF, LO, IFR, IFA, and waveguide interface; RF is the radio frequency input port of the external spread spectrum module, which is connected to the external spread spectrum interface of the vector network analyzer host; LO is the local oscillator input port of the external spread spectrum module, which is connected to the external spread spectrum interface of the vector network analyzer host; IFR is the reference path intermediate frequency output port of the external spread spectrum module, which is connected to the external spread spectrum interface of the vector network analyzer host; IFA is the measurement path intermediate frequency output port of the external spread spectrum module, which is connected to the external spread spectrum interface of the vector network analyzer host; the waveguide interface is the source output and measurement port of the external spread spectrum module.
[0024] The processing platform combines the frequency band of the mainframe of the vector network analyzer and the frequency band of the spread spectrum module into an S parameter curve. The operation of the mainframe frequency band of the vector network analyzer will not affect the scanning of the spread spectrum band curve. Similarly, the operation of the spread spectrum band will not affect the scanning of the mainframe curve of the vector network analyzer.
[0025] The specific working process is as follows:
[0026] 1. Only test the mainframe part of the vector network analyzer. Figure 2 As shown in the figure, connect the Port1 and Port2 of the vector network analyzer host to the two ends of the device under test for testing;
[0027] 2. Only test the external spectrum expansion module. Figure 4 As shown, connect the external spectrum expansion interface of the vector network analyzer host to the external spectrum expansion module in turn, and test the device under test through the waveguide interface;
[0028] 3. Test the vector network analyzer host and spread spectrum module at the same time, including Figure 5 This is the connection between the mainframe and the spectrum expansion module of the vector network analyzer of most manufacturers. When the external spectrum expansion module is working, the source interface of the mainframe of the vector network analyzer is occupied, so the mainframe of the vector network analyzer and the spectrum expansion module cannot work at the same time, and only one device under test can be measured. Figure 6 This is the connection between the vector network analyzer host and the spectrum expansion module of the present invention. When the spectrum expansion module is working, the source interface of the vector network analyzer host is not occupied, and the vector network analyzer host and the spectrum expansion module can measure two devices under test at the same time.
[0029] According to the technical solution of the present invention, when the spectrum spreading module is working, the vector network analyzer host can perform testing work.
[0030] The technical solution of the present invention outputs the source of the spectrum expansion module not through the RF source port of the host vector network, which can ensure that the host vector network and the spectrum expansion module can be tested at the same time, greatly improving work efficiency. The dual-station test system of the vector network analyzer that integrates the millimeter wave of the spectrum expansion module of the present invention is adopted. When the vector network analyzer host is working, the spectrum expansion module can also work, which is more convenient for customers to test. The technical solution of the present invention can functionally test two devices under test at the same time; one is a coaxial device under test to 50GHz, and the other is a V / W band device under test. The present invention can save equipment and time for customers, thereby reducing overall costs.
[0031] The specific implementation scheme of this embodiment can refer to the relevant description in the above embodiment, which will not be repeated here.
[0032] It can be understood that the same or similar parts of the above embodiments can be referenced to each other, and the contents not described in detail in some embodiments can refer to the same or similar contents in other embodiments.
[0033] It should be noted that, in the description of the present invention, the terms "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying relative importance. In addition, in the description of the present invention, unless otherwise specified, the meaning of "plurality" refers to at least two.
[0034] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.
[0035] The dual-station test system of the vector network analyzer that integrates the millimeter wave of the spread spectrum module of the present invention can make the spread spectrum module work when the vector network analyzer host is working, which is more convenient for customers to test. The present invention can test two DUTs at the same time; one is the DUT of coaxial to 50GHz, and the other is the DUT of V / W band. The present invention can save equipment and time for customers, so that the overall cost is reduced.
[0036] In this specification, the present invention has been described with reference to specific embodiments thereof. However, it is apparent that various modifications and variations may be made without departing from the spirit and scope of the present invention. Therefore, the specification and drawings should be regarded as illustrative rather than restrictive.
Claims
1. A dual-station test system for a vector network analyzer integrating a spread spectrum module millimeter wave, characterized in that: The system includes a vector network analyzer host and a spectrum expansion module, the vector network analyzer host and the spectrum expansion module are connected, the vector network analyzer host includes a core module and an external spectrum expansion circuit, the external spectrum expansion circuit is connected to the core module and communicates via USB; the core module includes a radio frequency multiplication source, a local oscillator frequency multiplication source, a coupler, a mixer, a digital intermediate frequency module, a port1 interface and a port2 interface, the radio frequency multiplication source is used to multiply the radio frequency source and output it to 50GHz, the local oscillator frequency multiplication source is used to multiply the local oscillator source and output it to 50GHz, the mixer is connected to the radio frequency multiplication source and the local oscillator frequency multiplication source, and is used to mix the radio frequency source and the local oscillator source signals into intermediate frequency signals, the digital intermediate frequency module is connected to the mixer, and is used to digitally process the intermediate frequency signal output by the mixer board, the coupler connects the radio frequency multiplication source, the local oscillator frequency multiplication source, the mixer and the digital intermediate frequency module, the port1 interface and the port2 interface are respectively the output ports of the vector network analyzer host, and are respectively connected to the two ends of the device under test.
2. The dual-station test system of a vector network analyzer integrating a spread spectrum module millimeter wave according to claim 1, characterized in that: The external spectrum expansion circuit includes RF, LO, IFR, IFA and a waveguide interface, wherein the RF is the radio frequency input port of the external spectrum expansion module, connected to the external spectrum expansion interface of the vector network analyzer host; the LO is the local oscillator input port of the external spectrum expansion module, connected to the external spectrum expansion interface of the vector network analyzer host; the IFR is the reference path intermediate frequency output port of the external spectrum expansion module, connected to the external spectrum expansion interface of the vector network analyzer host; the IFA is the measurement path intermediate frequency output port of the external spectrum expansion module, connected to the external spectrum expansion interface of the vector network analyzer host; and the waveguide interface is the source output and measurement port of the external spectrum expansion module.
3. The dual-station test system of a vector network analyzer integrating a spread spectrum module millimeter wave according to claim 1, characterized in that: The system also includes a processing platform, which is used to connect the vector network analyzer host and the spectrum expansion module, and is used to combine part of the frequency band of the vector network analyzer host and the frequency band of the spectrum expansion module into an S parameter curve.
Citation Information
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