Data center power supply module test method
By obtaining the test data of the power module under different loads and temperatures, and using the preset waveform function to calculate the desirability and waveform error of the input current, the problem of insufficient accuracy of the power module efficiency test in the existing technology is solved, and more accurate Efficiency assessment.
Patent Information
- Application Number
- CN202510012442.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-01-06
- Publication Date
- 2025-02-07
- Estimated Expiration
- Not applicable · inactive patent
AI Technical Summary
In the efficiency test of power modules, the prior art has problems such as inaccurate input power calculation and inconsistent with the actual working environment.
By obtaining the test data of the power module at different loads and temperatures, using the preset input voltage waveform function and the input current waveform function, the desirability and waveform error of the input current are calculated, and more accurate input power and efficiency are obtained.
It improves the accuracy of power module efficiency testing and can more comprehensively reflect the performance of power modules in actual working environments.
Smart Images
Figure CN119395592A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of power module testing, and in particular to a data center power module testing method. Background Art
[0002] As a key component of a data center, the data center power supply unit (PSU) is responsible for providing stable power to servers, storage devices and other computing devices. It can efficiently convert the AC power provided by the power grid into the DC power required by the equipment and ensure the stability of voltage and current, thereby ensuring the normal operation of the equipment. Given the high requirements of modern data centers for power stability and efficiency, efficient and reliable power modules are essential for the reliable operation of data centers.
[0003] In order to verify the efficiency and stability of the power module, it is usually tested for efficiency (i.e., the ratio of output power to input power) with different loads at a standard temperature (25°C). This test helps reduce energy waste, improve the overall operational efficiency of the data center, and extend the service life of the power module. When testing, the room temperature is first adjusted to 25°C, and then the power module is loaded with an electronic load. The input power and output power are then calculated by monitoring the input and output voltage and current within one minute. However, when calculating the input power, although the input voltage is known, it may not be accurate to perform a sinusoidal fit based only on the current change within one minute. This is because the voltage may fluctuate due to factors such as generator switching and long-distance transmission losses, which in turn causes current fluctuations. Therefore, fitting a sinusoidal curve only through current changes may not accurately reflect the actual situation. In addition, although the test at 25°C can provide a benchmark efficiency value, in actual application environments, the operating temperature of the power module is often higher than 25°C. This is because the electronic components in the power module (such as switching transistors, rectifiers, etc.) may have higher internal resistance at high temperatures, resulting in more energy converted into heat. Therefore, setting only the test condition of 25°C may not fully reflect the performance of the power module in the actual working environment.
[0004] In summary, the existing technology for testing the efficiency of power modules has the following two deficiencies: 1. Inaccurate calculation of input power: Since voltage fluctuations may cause current fluctuations, it may not be accurate to calculate the input power only by sinusoidal fitting of current changes. 2. The test conditions do not match the actual working environment: Although the test at 25°C can provide a benchmark efficiency value, the operating temperature of the power module in the actual application environment may be higher, so the test results may not accurately reflect the actual situation. Summary of the invention
[0005] In order to solve the technical problem that the efficiency test of power modules is not accurate enough, the purpose of the present invention is to provide a data center power module test method, and the technical solution adopted is as follows: Acquire test data of the power module under different loads and temperatures, wherein the test data includes input voltage, input current, output voltage, and output current; Obtaining the desirability of input current at different times under different loads and temperatures based on a preset input voltage waveform function and the test data, and obtaining an input current waveform function with known parameters based on a preset input current waveform function with unknown parameters, a preset input current waveform error and function, the desirability of the input current, and the test data; The power factor is obtained based on the phase difference between the input current obtained by the input current waveform function and the input voltage, and the efficiency of the power module under different loads and temperatures is obtained according to the power factor, the average value of the output voltage, the average value of the output current, the input voltage and the input current obtained by the input current waveform function; Obtaining the availability of the power module efficiency at different temperatures, and obtaining the temperature power module efficiency function with known parameters based on the preset temperature power module efficiency function with unknown parameters, the availability of the power module efficiency, the power module efficiency, and a preset temperature power module efficiency error and function; The standard temperature is substituted into the temperature power module efficiency function to obtain the preliminary data center power module efficiency, the preliminary data center power module efficiency of different loads at the standard temperature is fitted to obtain the fitting function, and the final data center power module efficiency is obtained based on the fitting function and the preliminary data center power module efficiency.
[0006] Furthermore, the desirability of obtaining the input current at each time under different loads and different temperatures based on the preset input voltage waveform function and the test data includes: Obtaining a first input voltage value at a load u, temperature v and time t in the test data and a second input voltage value at a load u, temperature v obtained by substituting the time t into the input voltage waveform function; The absolute value of the voltage difference is obtained by subtracting the second input voltage value from the first input voltage value, and the reciprocal of the voltage difference absolute value plus the first hyperparameter is taken as the input value of the maximum and minimum value normalization function, and the output value of the maximum and minimum value normalization function is taken as the desirability of the input current at the load u, temperature v and time t; The process of obtaining the desirability of the input current is repeated to obtain the desirability of the input current at different loads and temperatures at different times.
[0007] Further, the step of acquiring the input current waveform function with known parameters based on the preset input current waveform function with unknown parameters, the preset input current waveform error and function, the desirability of the input current and the test data includes: Obtaining a first input current value at a load u, temperature v and time t in the test data and a second input current value at a load u, temperature v obtained by substituting the time t into the input current waveform function; The absolute value of the first input current value minus the second input current value is taken to obtain an absolute value of the current difference, and the absolute value of the current difference is multiplied by the desirability of the input current at the load u, temperature v and time t to obtain a first product; Repeat the process of obtaining the first product to obtain the first product at each moment under the load u and temperature v, and add the first products in sequence to obtain the input current waveform error and function under the load u and temperature v; The least square method is used to obtain the unknown parameters of the input current waveform function by applying the least square method to the input current waveform error and function.
[0008] Further, obtaining the power factor based on the phase difference between the input current obtained by the input current waveform function and the input voltage includes: Acquire a first phase of the input voltage and acquire a second phase of the input current at a load u and a temperature v via the input current waveform function; Subtracting the second phase from the first phase and taking an absolute value to obtain an absolute value of a phase difference, using the absolute value of the phase difference as an input of a cosine function, and using an output of the cosine function as the power factor at a load u and a temperature v; The power factor acquisition process is repeated to obtain the power factor at different loads and temperatures.
[0009] Furthermore, the efficiency of the power module under different loads and temperatures is obtained according to the power factor, the average value of the output voltage, the average value of the output current, the input voltage, and the input current obtained by the input current waveform function, including: Multiplying the average value of the output current under the load u temperature v with the average value of the output voltage under the load u temperature v to obtain a second product; The power factor at load u and temperature v, the input voltage, and the input current obtained by the input current waveform function at load u and temperature v are sequentially multiplied to obtain a third product; After dividing the second product by the third product, multiplying the resultant by 100% to obtain the efficiency of the power module at load u and temperature v; The process of obtaining the power module efficiency is repeated to obtain the power module efficiency at different loads and temperatures.
[0010] Further, obtaining the availability of the efficiency of the power module under different loads and different temperatures includes: Obtaining a first power module efficiency at a load u and a temperature v and a second power module efficiency at a load u and a temperature k, and multiplying the first power module efficiency and the second power module efficiency to obtain a fourth product at the load u; Repeating the process of obtaining the fourth product to obtain the fourth products under different loads, and adding the fourth products in sequence to obtain the sum of the fourth products; Obtain a first square of the power of the first power module, repeat the process of obtaining the first square to obtain the first squares of different loads at temperature v, add the first squares in sequence to obtain a sum of the first squares, and take the square root of the sum of the first squares to obtain a first square root value; Obtain a second square of the power of the second power module, repeat the process of obtaining the second square to obtain the second square of different loads at temperature v, add the second squares in sequence to obtain a sum of the second squares, and take the square root of the sum of the second squares to obtain a second root value; multiplying the first square root value by the second square root value to obtain a fifth product; After dividing the sum of the fourth products by the fifth product, the sum is divided by the number of the loads to obtain a single availability at temperature k; Repeat the single availability acquisition process to obtain the single availability at each temperature, and add the single availability in sequence to obtain the availability of the power module efficiency at temperature v; The process of obtaining the availability of the power module efficiency is repeated to obtain the availability of the power module efficiency at different temperatures.
[0011] Further, the obtaining of the temperature power module efficiency function with known parameters based on the preset temperature power module efficiency function with unknown parameters, the availability of the power module efficiency, the power module efficiency and the preset temperature power module efficiency error and function comprises: Obtaining a first power module efficiency at a load u and a temperature v, and substituting the temperature v into the temperature power module efficiency function with unknown preset parameters to obtain a second power module efficiency at a load u; The absolute value of the first power module efficiency minus the second power module efficiency is taken to obtain the absolute value of the first power module efficiency difference, and the absolute value of the first power module efficiency difference is multiplied by the availability of the power module efficiency at temperature v to obtain a sixth product at temperature v; Repeat the acquisition process of the sixth product to obtain the sixth product at different temperatures, and add the sixth products in sequence to obtain the temperature power module efficiency error and function under load u; The least square method is used for the temperature power module efficiency error and function to obtain various unknown parameters of the temperature power module efficiency function.
[0012] Further, obtaining the final data center power module efficiency according to the fitting function and the preliminary data center power module efficiency includes: Substituting the load u into the fitting function to obtain a fitting value, subtracting the preliminary data center power module efficiency of the load u at the standard temperature from the fitting value and taking the absolute value to obtain the absolute value of the second power module efficiency difference; The reciprocal of the absolute value of the second power module efficiency difference plus the second hyperparameter is used as the input value of the maximum and minimum normalization function. The output value of the maximum and minimum normalization function is multiplied by the preliminary data center power module efficiency under load u at standard temperature to obtain the final data center power module efficiency under load u at standard temperature.
[0013] Furthermore, the input current waveform function includes: The unknown angular frequency is multiplied by time and then added with the unknown initial phase to serve as the input value of the sine function. The output value of the sine function is multiplied by the unknown maximum input current amplitude and then added with the unknown offset value to obtain the input current waveform function.
[0014] Furthermore, the temperature power module efficiency function includes: The first unknown value is multiplied by the temperature to obtain a negative number, and the second unknown value is added to serve as the input value of the exponential function with e as the base. The output value of the exponential function with e as the base is multiplied by the third unknown value, and the fourth unknown value is added to obtain the temperature power module efficiency function.
[0015] The present invention has the following beneficial effects: First, obtain the test data of the power module under different loads and temperatures, and the test data includes input voltage, input current, output voltage, and output current. This step is the data basis for subsequent analysis. Based on the preset input voltage waveform function and the test data, the desirability of the input current at each moment under different loads and temperatures is obtained, and based on the preset input current waveform function with unknown parameters, the preset input current waveform error and function, the desirability of the input current, and the test data, the input current waveform function with known parameters is obtained. This step is to determine the specific expression form of the output current waveform function. The power factor is obtained based on the phase difference between the input current and the input voltage obtained by the input current waveform function, and the efficiency of the power module under different loads and temperatures is obtained according to the power factor, the average value of the output voltage, the average value of the output current, the input voltage, and the input current obtained by the input current waveform function. The efficiency of the power module obtained in this step is not accurate enough and needs to be corrected. Obtain the availability of the power module efficiency at different temperatures, and obtain the temperature power module efficiency function with known parameters based on the preset temperature power module efficiency function with unknown parameters, the availability of the power module efficiency, the power module efficiency, and the preset temperature power module efficiency error and function. This step is to determine the specific expression form of the temperature power module efficiency function. Substitute the standard temperature into the temperature power module efficiency function to obtain the preliminary data center power module efficiency, fit the preliminary data center power module efficiency of different loads at the standard temperature to obtain the fitting function, and obtain the final data center power module efficiency based on the fitting function and the preliminary data center power module efficiency. The final data center power module efficiency obtained in this step can make a more comprehensive evaluation of the reliability and stability of the power module. By adopting the present invention, the efficiency performance of the power module under actual working conditions can be more accurately understood. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] In order to more clearly illustrate the technical solutions and advantages in the embodiments of the present invention or the prior art, the drawings required for use in the embodiments or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0017] Figure 1 A flow chart of a data center power module testing method provided by the first embodiment of the present invention; Figure 2 A flow chart of a process for obtaining the desirability of an input current provided by a second embodiment of the present invention; Figure 3A flowchart of a process for obtaining an input current waveform function provided by a third embodiment of the present invention; Figure 4 A flowchart of a process for obtaining a power factor provided by a fourth embodiment of the present invention; Figure 5 A flowchart of a process for obtaining the efficiency of a power module provided in a fifth embodiment of the present invention; Figure 6 A flowchart of a process for obtaining the availability of power module efficiency provided by a sixth embodiment of the present invention; Figure 7 A flowchart of a process for obtaining a temperature power module efficiency function provided by a seventh embodiment of the present invention; Figure 8 A flowchart of a process for obtaining the final data center power module efficiency provided by the eighth embodiment of the present invention; Fig. 9 This is a graph showing the efficiency of a power module in the prior art provided by the ninth embodiment of the present invention. DETAILED DESCRIPTION
[0018] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the following is a detailed description of a data center power module testing method proposed by the present invention, its specific implementation method, structure, features and effects, in combination with the accompanying drawings and preferred embodiments. In the following description, different "one embodiment" or "another embodiment" does not necessarily refer to the same embodiment. In addition, specific features, structures or characteristics in one or more embodiments may be combined in any suitable form.
[0019] Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention belongs.
[0020] A specific scheme of a data center power module testing method provided by the present invention is described in detail below with reference to the accompanying drawings.
[0021] See also Figure 1 , which shows a flow chart of a data center power module testing method provided by an embodiment of the present invention, the method comprising: S101. Acquire test data of a power module under different loads and temperatures, wherein the test data includes input voltage, input current, output voltage, and output current.
[0022] The test tools are: 1. Electronic load: used to simulate the working environment under different loads and accurately control the load of the power module. 2. Voltmeter and ammeter: used to measure the input voltage, input current, output voltage and output current of the power module respectively. 3. Temperature sensor: used to measure the working temperature of the power module in order to evaluate the impact of temperature on efficiency.
[0023] The input end of the power module is connected to the power grid or other power supply system, the output end of the power module is connected to the electronic load, the electronic load is adjusted to a preset load value, the ambient temperature is adjusted to a preset temperature value, and an ammeter and a voltmeter are used to perform a 1 minute test.
[0024] Optionally, the load u may range from 1% to 100%, and the temperature v may range from 1°C to 100°C.
[0025] S102. Obtain the desirability of the input current at each time under different loads and temperatures based on the preset input voltage waveform function and the test data, and obtain the input current waveform function with known parameters based on the preset input current waveform function with unknown parameters, the preset input current waveform error and function, the desirability of the input current and the test data.
[0026] The process of obtaining the desirability of the input current will be described in detail in the second embodiment and will not be repeated here.
[0027] The process of acquiring the input current waveform function will be described in detail in the third embodiment and will not be repeated here.
[0028] S103. Obtain the power factor based on the phase difference between the input current obtained by the input current waveform function and the input voltage, and obtain the power module efficiency under different loads and different temperatures according to the power factor, the average value of the output voltage, the average value of the output current, the input voltage and the input current obtained by the input current waveform function.
[0029] The process of obtaining the power factor will be described in detail in the fourth embodiment and will not be repeated here.
[0030] The process of obtaining the efficiency of the power module will be described in detail in the fifth embodiment and will not be repeated here.
[0031] S104. Obtain the availability of the power module efficiency at different temperatures, and obtain the temperature power module efficiency function with known parameters based on the preset temperature power module efficiency function with unknown parameters, the availability of the power module efficiency, the power module efficiency, and the preset temperature power module efficiency error and function.
[0032] The process of obtaining the availability of the power module efficiency will be described in detail in the sixth embodiment and will not be repeated here.
[0033] The process of obtaining the temperature power module efficiency function will be described in detail in the seventh embodiment and will not be repeated here.
[0034] S105. Substitute the standard temperature into the temperature power module efficiency function to obtain the preliminary data center power module efficiency, fit the preliminary data center power module efficiency of different loads at the standard temperature to obtain the fitting function, and obtain the final data center power module efficiency based on the fitting function and the preliminary data center power module efficiency.
[0035] The process of obtaining the final data center power module efficiency will be described in detail in the eighth embodiment and will not be repeated here.
[0036] Compared with the general calculation of input power which only uses the current change within one minute to perform current sine fitting without considering the problem of voltage fluctuation causing current fluctuation, the present invention starts from the voltage volatility and determines the desirability of the input current at each moment through the fluctuation of the input voltage and the known voltage at each moment, thereby performing optimal sine fitting to obtain more accurate input power.
[0037] In addition, compared to the general test of only adjusting the room temperature to 25°C without considering the internal resistance of the electronic components (such as switching transistors, rectifiers, etc.) in the power module, which causes more energy to be converted into heat, thereby causing the operating temperature of the power module to usually be higher than 25°C, the present invention sets control groups at different temperatures, and conducts comparative tests through the relationship between temperature and efficiency to more accurately understand the efficiency performance of the power module under actual working conditions.
[0038] In a data center, the input voltage of the power module usually comes from the public power grid (alternating current), so the input voltage frequency is known (depending on the country / region, the power grid frequency is usually 50Hz or 60Hz, 50Hz is usually applicable to Europe, Asia and most parts of Africa, and 60Hz is usually applicable to the United States, Canada and some countries in Central and South America); the input voltage amplitude (that is, the size of the voltage) is also known (common AC input voltage amplitudes are: 220V / 230V / 240V is common in many countries, such as Europe and most parts of Asia, 110V / 120V is common in the United States and some regions, 380V / 400V is common in industrial applications and high-power equipment), the input voltage phase is known and controlled, and the input voltage offset is 0 (because the standard situation is used here).
[0039] Figure 2The flowchart of the process of obtaining the desirability of the input current provided by the second embodiment of the present invention, wherein the process of obtaining the desirability of the input current at each time under different loads and different temperatures based on the preset input voltage waveform function and the test data includes: S201. Obtain a first input voltage value at load u, temperature v and time t in the test data and a second input voltage value at load u, temperature v obtained by substituting the time t into the input voltage waveform function.
[0040] The input voltage waveform function can be expressed as: ; Among them, the Indicates the maximum value of the known voltage. Represents a known angular frequency, Represents a known initial phase, Represents a known offset value, the Represents the input voltage waveform function.
[0041] As for the voltage, it may fluctuate due to generator switching, long-distance transmission loss, etc., thereby causing the current to fluctuate. Therefore, if the voltage fluctuates relative to the above-mentioned standard waveform function, that is, the input voltage waveform function, then the current at this moment is also fluctuating, which is not desirable. Therefore, the subsequent formula is constructed to represent the desirability of the input current at the load u temperature v at time t.
[0042] S202. Subtract the second input voltage value from the first input voltage value and take the absolute value to obtain the absolute value of the voltage difference. Add the first hyperparameter to the absolute value of the voltage difference and then take the reciprocal as the input value of the maximum and minimum normalization function. The output value of the maximum and minimum normalization function serves as the desirability of the input current at the load u, temperature v and time t.
[0043] The desirability of the input current at the load u temperature v at time t can be expressed as: ; Among them, the represents the desirability of the input current at the load u temperature v at time t, the f() represents the maximum and minimum value normalized function, the represents the first input voltage value, the represents the second input voltage value, the represents the first hyperparameter, the It represents the fluctuation of the input voltage at the load u, temperature v and time t. The purpose of setting the first hyperparameter is to make the denominator not equal to 0, and its value can be set independently, preferably 1.
[0044] S203. Repeat the process of obtaining the desirability of the input current to obtain the desirability of the input current at each time under different loads and different temperatures.
[0045] Figure 3 A flowchart of the process of obtaining an input current waveform function provided by the third embodiment of the present invention, wherein the input current waveform function with unknown parameters, the preset input current waveform error and function, the desirability of the input current and the test data are used to obtain the input current waveform function with known parameters, including: S301. Obtain a first input current value at load u, temperature v and time t in the test data and a second input current value at load u, temperature v obtained by substituting the time t into the input current waveform function.
[0046] Since the input of the data center power module comes from AC power, not only the input voltage presents a sinusoidal curve, but also the input current presents a sinusoidal curve. The input current waveform function includes: The unknown angular frequency is multiplied by time and then added with the unknown initial phase to serve as the input value of the sine function. The output value of the sine function is multiplied by the unknown maximum input current amplitude and then added with the unknown offset value to obtain the input current waveform function.
[0047] Specifically, the input current waveform function can be expressed as: ; Among them, the Indicates the maximum magnitude of the unknown input current. represents the unknown angular frequency, Represents the unknown initial phase, Indicates an unknown offset value, the Represents the input current waveform function.
[0048] Here, the least square method is used to determine the parameters of the input current waveform function based on the sum of squares of the input current error (the error of the above input current waveform function) at each moment under load u and temperature v. However, if there is a moment when the input current desirability is not high, the credibility of the parameters will be low. Therefore, the moment when the input current desirability is high contributes more to the sum of squares of the error, and the moment when the input current desirability is low contributes less to the sum of squares of the error, making the acquisition of the input current waveform function parameters most accurate. Therefore, the following input current waveform error and function formula is constructed.
[0049] S302. Take the absolute value of the first input current value minus the second input current value to obtain an absolute value of the current difference, and multiply the absolute value of the current difference by the desirability of the input current at load u, temperature v and time t to obtain a first product.
[0050] The first product can be expressed as: ; Among them, the The first product at load u temperature v at time t, represents the first input current value, the represents the second input current value, the represents the absolute value function.
[0051] S303. Repeat the process of acquiring the first product to obtain the first product at each moment under load u and temperature v, and add the first products in sequence to obtain the input current waveform error and function under load u and temperature v.
[0052] The input current waveform error and function can be expressed as: ; Among them, the Represents the input current waveform error and function.
[0053] S304. Use the least square method to obtain the unknown parameters of the input current waveform function for the input current waveform error and function.
[0054] It is a prior art to use the least square method to obtain the unknown parameters of the input current waveform function, which will not be described in detail here.
[0055] Figure 4 The flowchart of the process of obtaining the power factor provided by the fourth embodiment of the present invention, wherein obtaining the power factor based on the phase difference between the input current obtained by the input current waveform function and the input voltage comprises: S401. Obtain a first phase of the input voltage and obtain a second phase of the input current at a load u and a temperature v via the input current waveform function.
[0056] S402. Obtain an absolute value of a phase difference by subtracting the second phase from the first phase, and use the absolute value of the phase difference as an input of a cosine function, and use an output of the cosine function as the power factor at a load u and a temperature v.
[0057] The power factor can be expressed as: ; Among them, the represents the power factor at load u and temperature v, represents the first phase, the represents the second phase of the input current at load u and temperature v, is the cosine function, represents the absolute value function.
[0058] S403. Repeat the power factor acquisition process to obtain the power factor under different loads and different temperatures.
[0059] Figure 5 A flowchart of a process for obtaining the efficiency of a power module provided in a fifth embodiment of the present invention, wherein the efficiency of the power module under different loads and temperatures is obtained according to the power factor, the average value of the output voltage, the average value of the output current, the input voltage, and the input current obtained by the input current waveform function, including: S501. Multiply the average value of the output current at load u and temperature v by the average value of the output voltage at load u and temperature v to obtain a second product.
[0060] The second product can be expressed as: ; Among them, the represents the average value of the output voltage under load u and temperature v, Represents the average value of the output current at load u and temperature v.
[0061] Represents the output power at load u and temperature v.
[0062] S502. The power factor at load u and temperature v, the input voltage, and the input current obtained by the input current waveform function at load u and temperature v are multiplied in sequence to obtain a third product.
[0063] The third product can be expressed as: ; Among them, the represents the input voltage, the represents the input current obtained by the input current waveform function under load u and temperature v, Represents the power factor at load u and temperature v.
[0064] Represents the input power at load u and temperature v.
[0065] S503. Divide the second product by the third product, and then multiply the resultant by 100% to obtain the efficiency of the power module at load u and temperature v.
[0066] The power module efficiency can be expressed as: ; Among them, the Indicates the power module efficiency.
[0067] S504. Repeat the process of acquiring the power module efficiency to obtain the power module efficiency under different loads and temperatures.
[0068] When only adjusting the room temperature for testing without considering the internal resistance of the electronic components (such as switching transistors, rectifiers, etc.) inside the power module, these components will convert more energy into heat, causing the actual operating temperature of the power module to deviate from the preset value, thereby significantly reducing its efficiency availability at certain temperatures, which has a greater impact on subsequent processing. Therefore, the primary task of the present invention is to evaluate and determine the efficiency availability of the power module at different temperatures.
[0069] Although temperature changes will have a certain impact on the absolute value of the power module efficiency, causing the overall efficiency to fluctuate, the trend of efficiency increasing with increasing load remains consistent under different load conditions. This is because the pattern of power module efficiency changing with load is fundamentally determined by its electrical characteristics and working principle, and although temperature will increase energy loss, it does not change the basic positive correlation between load and efficiency. Therefore, regardless of how the temperature changes, the efficiency trend of the power module in the 1% to 100% load range is usually stable, but the overall efficiency will be reduced in high temperature environments.
[0070] Based on this, in order to evaluate the efficiency availability of the power module at temperature v, it can be compared with the efficiency trends under other load conditions, and then a formula for the availability of the power module efficiency at temperature v can be constructed.
[0071] Figure 6 This is a flow chart of a process for obtaining the availability of the power module efficiency provided by the sixth embodiment of the present invention. The process for obtaining the availability of the power module efficiency under different loads and temperatures includes: S601. Obtain a first power module efficiency under load u and temperature v and a second power module efficiency under load u and temperature k, and multiply the first power module efficiency and the second power module efficiency to obtain a fourth product under load u.
[0072] The fourth product can be expressed as: ; Among them, the represents the efficiency of the first power module, the Indicates the efficiency of the second power module.
[0073] S602. Repeat the process of obtaining the fourth product to obtain the fourth product under different loads, and add the fourth products in sequence to obtain the sum of the fourth products.
[0074] The sum of the fourth product can be expressed as: ; Wherein, N represents the number of the loads.
[0075] S603. Obtain the first square of the power of the first power module, repeat the process of obtaining the first square to obtain the first square of different loads at temperature v, add the first squares in sequence to obtain the sum of the first squares, and take the square root of the sum of the first squares to obtain the first square root value.
[0076] The first square root value can be expressed as: ; Wherein, N represents the number of the loads, Indicates the efficiency of the first power module.
[0077] S604. Obtain the second square of the power of the second power module, repeat the second square acquisition process to obtain the second square of different loads at temperature v, add the second squares in sequence to obtain the sum of the second squares, and take the square root of the sum of the second squares to obtain the second root value.
[0078] The second square root value can be expressed as: ; Wherein, N represents the number of the loads, Indicates the efficiency of the second power module.
[0079] S605. Multiply the first square root value and the second square root value to obtain a fifth product.
[0080] The fifth product can be expressed as: ; S606: After dividing the sum of the fourth products by the fifth product, divide the sum by the number of loads to obtain a single availability at temperature k.
[0081] The unitary availability at temperature k can be expressed as: ; in, Represents the power module efficiency set under different loads at temperature v and represents the power module efficiency set at different load conditions at temperature k The cosine similarity between .
[0082] S607. Repeat the single availability acquisition process to obtain the single availability at each temperature, and add the single availability in sequence to obtain the availability of the power module efficiency at temperature v.
[0083] The availability of the power module efficiency at temperature v can be expressed as: ; Wherein, M represents the number of the temperatures (test temperatures).
[0084] S608. Repeat the process of obtaining the availability of the power module efficiency to obtain the availability of the power module efficiency at different temperatures.
[0085] According to the prior art, the efficiency of the power module shows a Boltzmann exponential distribution as the temperature increases. The efficiency of the prior art power module at various temperatures under load u is plotted as follows: Fig. 9 shown.
[0086] Figure 7 A flowchart of a process for obtaining a temperature power module efficiency function provided by a seventh embodiment of the present invention, wherein the temperature power module efficiency function with known parameters is obtained based on the preset temperature power module efficiency function with unknown parameters, the availability of the power module efficiency, the power module efficiency, and the preset temperature power module efficiency error and function, including: S701. Obtain a first power module efficiency under load u and temperature v, and substitute the temperature v into the temperature power module efficiency function with unknown preset parameters to obtain a second power module efficiency under load u.
[0087] The temperature power module efficiency function includes: The first unknown value is multiplied by the temperature to obtain a negative number, and the second unknown value is added to serve as the input value of the exponential function with e as the base. The output value of the exponential function with e as the base is multiplied by the third unknown value, and the fourth unknown value is added to obtain the temperature power module efficiency function.
[0088] Specifically, the temperature power module efficiency function can be expressed as: ; Among them, the represents the first unknown value, the represents the second unknown value, the represents the third unknown value, the represents the fourth unknown value.
[0089] Here, the least square method is also used to determine the parameters of the temperature power module efficiency function according to the sum of squares of the errors of the efficiency of each temperature power module under load u (the error of the temperature power module efficiency function). However, if the temperature at which the efficiency availability of the power module is not high appears, the credibility of the parameters will be reduced. Therefore, here, the temperature with a higher efficiency availability of the power module should contribute more to the sum of squares of the error, and the temperature with a lower efficiency availability of the power module should contribute less to the sum of squares of the error, so that the parameters of the temperature power module efficiency function can be obtained most accurately, and then the temperature power module efficiency error and function formula can be constructed.
[0090] S702. Take the absolute value of the first power module efficiency minus the second power module efficiency to obtain the absolute value of the first power module efficiency difference, and multiply the absolute value of the first power module efficiency difference by the availability of the power module efficiency at temperature v to obtain the sixth product at temperature v.
[0091] The sixth product at temperature v can be expressed as: ; Among them, the represents the availability of the power module efficiency at temperature v, the represents the efficiency of the first power module under load u and temperature v, represents the efficiency of the second power module under load u obtained by substituting the temperature v into the temperature power module efficiency function with unknown preset parameters, represents the absolute value function.
[0092] S703. Repeat the acquisition process of the sixth product to obtain the sixth product at different temperatures, and add the sixth products in sequence to obtain the temperature power module efficiency error and function under load u.
[0093] The temperature power module efficiency error and function can be expressed as: ; Among them, the represents the temperature power module efficiency error and function under load u, and M represents the number of temperatures (test temperatures).
[0094] S704. Use the least square method to obtain the unknown parameters of the temperature power module efficiency function for the temperature power module efficiency error and function.
[0095] It is a prior art to use the least square method to obtain the unknown parameters of the temperature power module efficiency function, which will not be described in detail here.
[0096] Figure 8 The flowchart of the process of obtaining the final data center power module efficiency provided by the eighth embodiment of the present invention, wherein obtaining the final data center power module efficiency according to the fitting function and the preliminary data center power module efficiency includes: S801. Substitute the load u into the fitting function to obtain a fitting value, and take the absolute value of the fitting value minus the preliminary data center power module efficiency of the load u at the standard temperature to obtain the absolute value of the second power module efficiency difference.
[0097] Experimental results show that when the load is low, the efficiency of the power module is low. As the load increases to a certain point, the efficiency reaches the highest point, and then the efficiency decreases at a higher load. Therefore, the relationship between the efficiency and load of the data center power module can be roughly described as an inverted U-shaped curve, that is, the efficiency of all data center power modules at standard temperature can be described as an inverted U-shaped curve. Perform a quadratic fit (the independent variable is the load, the dependent variable is the power module efficiency) to obtain the quadratic fitting function: .
[0098] The absolute value of the efficiency difference of the second power module can be expressed as: ; Among them, the represents the fitting value, the represents the preliminary data center power module efficiency under load u at standard temperature, represents the absolute value function.
[0099] S802. The absolute value of the second power module efficiency difference plus the second hyperparameter is taken as the inverse of the input value of the maximum and minimum normalization function, and the output value of the maximum and minimum normalization function is multiplied by the preliminary data center power module efficiency of the load u at the standard temperature to obtain the final data center power module efficiency of the load u at the standard temperature.
[0100] The preliminary data center power module efficiency can be finally corrected using the fitting function (if the error between the preliminary data center power module efficiency and the fitting function is small, then the preliminary data center power module efficiency should be closer to the true efficiency), that is, the following formula is constructed to represent the corrected final data center power module efficiency at the standard temperature of load u.
[0101] The final data center power module efficiency can be expressed as: ; Among them, the represents the final data center power module efficiency, Represents the second hyperparameter. The purpose of setting the second hyperparameter is to ensure that the denominator is not 0. Its value can be set independently and is preferably 1.
[0102] At this point, the test is completed to obtain the final data center power module efficiency at loads of 1%, 2%, ..., 100% at standard temperature. , … , in order to make a more comprehensive assessment of the reliability and stability of the power module.
[0103] The present invention has the following beneficial effects: First, obtain the test data of the power module under different loads and temperatures, and the test data includes input voltage, input current, output voltage, and output current. This step is the data basis for subsequent analysis. Based on the preset input voltage waveform function and the test data, the desirability of the input current at each moment under different loads and temperatures is obtained, and based on the preset input current waveform function with unknown parameters, the preset input current waveform error and function, the desirability of the input current, and the test data, the input current waveform function with known parameters is obtained. This step is to determine the specific expression form of the output current waveform function. The power factor is obtained based on the phase difference between the input current and the input voltage obtained by the input current waveform function, and the efficiency of the power module under different loads and temperatures is obtained according to the power factor, the average value of the output voltage, the average value of the output current, the input voltage, and the input current obtained by the input current waveform function. The efficiency of the power module obtained in this step is not accurate enough and needs to be corrected. Obtain the availability of the power module efficiency at different temperatures, and obtain the temperature power module efficiency function with known parameters based on the preset temperature power module efficiency function with unknown parameters, the availability of the power module efficiency, the power module efficiency, and the preset temperature power module efficiency error and function. This step is to determine the specific expression form of the temperature power module efficiency function. Substitute the standard temperature into the temperature power module efficiency function to obtain the preliminary data center power module efficiency, fit the preliminary data center power module efficiency of different loads at the standard temperature to obtain the fitting function, and obtain the final data center power module efficiency based on the fitting function and the preliminary data center power module efficiency. The final data center power module efficiency obtained in this step can make a more comprehensive evaluation of the reliability and stability of the power module. By adopting the present invention, the efficiency performance of the power module under actual working conditions can be more accurately understood.
[0104] It should be noted that the sequence of the above embodiments of the present invention is only for description and does not represent the advantages and disadvantages of the embodiments. The processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.
[0105] The various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referenced to each other, and each embodiment focuses on the differences from other embodiments.
Claims
1. A data center power module testing method, characterized in that: The method comprises: Acquire test data of the power module under different loads and temperatures, wherein the test data includes input voltage, input current, output voltage, and output current; Obtaining the desirability of input current at different times under different loads and temperatures based on a preset input voltage waveform function and the test data, and obtaining an input current waveform function with known parameters based on a preset input current waveform function with unknown parameters, a preset input current waveform error and function, the desirability of the input current, and the test data; The power factor is obtained based on the phase difference between the input current obtained by the input current waveform function and the input voltage, and the efficiency of the power module under different loads and temperatures is obtained according to the power factor, the average value of the output voltage, the average value of the output current, the input voltage and the input current obtained by the input current waveform function; Obtaining the availability of the power module efficiency at different temperatures, and obtaining the temperature power module efficiency function with known parameters based on the preset temperature power module efficiency function with unknown parameters, the availability of the power module efficiency, the power module efficiency, and a preset temperature power module efficiency error and function; The standard temperature is substituted into the temperature power module efficiency function to obtain the preliminary data center power module efficiency, the preliminary data center power module efficiency of different loads at the standard temperature is fitted to obtain the fitting function, and the final data center power module efficiency is obtained based on the fitting function and the preliminary data center power module efficiency.
2. The data center power module testing method according to claim 1, characterized in that: The desirability of obtaining the input current at each time under different loads and different temperatures based on the preset input voltage waveform function and the test data includes: Obtaining a first input voltage value at a load u, temperature v and time t in the test data and a second input voltage value at a load u, temperature v obtained by substituting the time t into the input voltage waveform function; The absolute value of the voltage difference is obtained by subtracting the second input voltage value from the first input voltage value, and the reciprocal of the voltage difference absolute value plus the first hyperparameter is taken as the input value of the maximum and minimum value normalization function, and the output value of the maximum and minimum value normalization function is taken as the desirability of the input current at the load u, temperature v and time t; The process of obtaining the desirability of the input current is repeated to obtain the desirability of the input current at different loads and temperatures at different times.
3. The data center power module testing method according to claim 1, characterized in that: The method of obtaining the input current waveform function with known parameters based on the preset input current waveform function with unknown parameters, the preset input current waveform error and function, the desirability of the input current and the test data includes: Obtaining a first input current value at a load u, temperature v and time t in the test data and a second input current value at a load u, temperature v obtained by substituting the time t into the input current waveform function; The absolute value of the first input current value minus the second input current value is taken to obtain an absolute value of the current difference, and the absolute value of the current difference is multiplied by the desirability of the input current at the load u, temperature v and time t to obtain a first product; Repeat the process of obtaining the first product to obtain the first product at each moment under load u and temperature v, and add the first products in sequence to obtain the input current waveform error and function under load u and temperature v; The least square method is used to obtain the unknown parameters of the input current waveform function by applying the least square method to the input current waveform error and function.
4. The data center power module testing method according to claim 1, characterized in that: Obtaining the power factor based on the phase difference between the input current obtained by the input current waveform function and the input voltage includes: Acquire a first phase of the input voltage and acquire a second phase of the input current at a load u and a temperature v via the input current waveform function; Subtracting the second phase from the first phase and taking an absolute value to obtain an absolute value of a phase difference, using the absolute value of the phase difference as an input of a cosine function, and using an output of the cosine function as the power factor at a load u and a temperature v; The power factor acquisition process is repeated to obtain the power factor at different loads and temperatures.
5. The data center power module testing method according to claim 1, characterized in that: The efficiency of the power module under different loads and temperatures is obtained according to the power factor, the average value of the output voltage, the average value of the output current, the input voltage, and the input current obtained by the input current waveform function, including: Multiplying the average value of the output current under the load u temperature v with the average value of the output voltage under the load u temperature v to obtain a second product; The power factor at load u and temperature v, the input voltage, and the input current obtained by the input current waveform function at load u and temperature v are sequentially multiplied to obtain a third product; After dividing the second product by the third product, multiplying the resultant by 100% to obtain the efficiency of the power module at load u and temperature v; The process of obtaining the power module efficiency is repeated to obtain the power module efficiency at different loads and temperatures.
6. The data center power module testing method according to claim 1, characterized in that: The availability of obtaining the efficiency of the power module under different loads and different temperatures includes: Obtaining a first power module efficiency at a load u and a temperature v and a second power module efficiency at a load u and a temperature k, and multiplying the first power module efficiency and the second power module efficiency to obtain a fourth product at the load u; Repeating the process of obtaining the fourth product to obtain the fourth products under different loads, and adding the fourth products in sequence to obtain the sum of the fourth products; Obtain a first square of the power of the first power module, repeat the process of obtaining the first square to obtain the first squares of different loads at temperature v, add the first squares in sequence to obtain a sum of the first squares, and take the square root of the sum of the first squares to obtain a first square root value; Obtain a second square of the power of the second power module, repeat the process of obtaining the second square to obtain the second square of different loads at temperature v, add the second squares in sequence to obtain a sum of the second squares, and take the square root of the sum of the second squares to obtain a second root value; multiplying the first square root value by the second square root value to obtain a fifth product; After dividing the sum of the fourth products by the fifth product, the sum is divided by the number of the loads to obtain a single availability at temperature k; Repeat the single availability acquisition process to obtain the single availability at each temperature, and add the single availability in sequence to obtain the availability of the power module efficiency at temperature v; The process of obtaining the availability of the power module efficiency is repeated to obtain the availability of the power module efficiency at different temperatures.
7. The data center power module testing method according to claim 1, characterized in that: The method of obtaining the temperature power module efficiency function with known parameters based on the preset temperature power module efficiency function with unknown parameters, the availability of the power module efficiency, the power module efficiency and the preset temperature power module efficiency error and function comprises: Obtaining a first power module efficiency at a load u and a temperature v, and substituting the temperature v into the temperature power module efficiency function with unknown preset parameters to obtain a second power module efficiency at a load u; The absolute value of the first power module efficiency minus the second power module efficiency is taken to obtain the absolute value of the first power module efficiency difference, and the absolute value of the first power module efficiency difference is multiplied by the availability of the power module efficiency at temperature v to obtain a sixth product at temperature v; Repeat the acquisition process of the sixth product to obtain the sixth product at different temperatures, and add the sixth products in sequence to obtain the temperature power module efficiency error and function under load u; The least square method is used for the temperature power module efficiency error and function to obtain various unknown parameters of the temperature power module efficiency function.
8. The data center power module testing method according to claim 1, characterized in that: Obtaining a final data center power module efficiency according to the fitting function and the preliminary data center power module efficiency includes: Substituting the load u into the fitting function to obtain a fitting value, subtracting the preliminary data center power module efficiency of the load u at the standard temperature from the fitting value and taking the absolute value to obtain the absolute value of the second power module efficiency difference; The reciprocal of the absolute value of the second power module efficiency difference plus the second hyperparameter is used as the input value of the maximum and minimum normalization function. The output value of the maximum and minimum normalization function is multiplied by the preliminary data center power module efficiency under load u at standard temperature to obtain the final data center power module efficiency under load u at standard temperature.
9. The data center power module testing method according to claim 1, characterized in that: The input current waveform function includes: The unknown angular frequency is multiplied by time and then added with the unknown initial phase to serve as the input value of the sine function. The output value of the sine function is multiplied by the unknown maximum input current amplitude and then added with the unknown offset value to obtain the input current waveform function.
10. The data center power module testing method according to claim 1, characterized in that: The temperature power module efficiency function includes: The first unknown value is multiplied by the temperature to obtain a negative number, and the second unknown value is added to serve as the input value of the exponential function with e as the base. The output value of the exponential function with e as the base is multiplied by the third unknown value, and the fourth unknown value is added to obtain the temperature power module efficiency function.