Automatic chip detection device

Abstract

The invention relates to the technical field of chip detection, and particularly discloses an automatic chip detection device which comprises a shielding chamber and a conveying mechanism, the conveying mechanism is installed on the rear side of the conveying mechanism, a sealing base is rotatably installed on the rear side of the shielding chamber, a rotary circular truncated cone is arranged on the inner side of the sealing base, and a pushing mechanism is arranged on the rear side of the conveying mechanism. And a discharging seat is arranged on the front side of the conveying mechanism, and the pushing mechanism and the discharging seat are located on the two sides of the sealing seat correspondingly. A traditional anechoic chamber is transformed into a small independent test room, the small anechoic chamber has the characteristic of flexible switching between a closed state and an open state, automatic feeding and discharging functions are achieved, the working efficiency is remarkably improved, efficient synchronization of equipment in the test process is ensured through the design of a pushing mechanism and a sliding shaft structure, the labor cost is reduced, and the test efficiency is improved. And meanwhile, the testing accuracy and consistency are improved, and on the whole, the working environment is improved and the flexibility is enhanced through automatic and standardized operation of the device.

Description

Technical Field

[0001] The present invention relates to the technical field of chip detection, and in particular to an automatic chip detection device. Background Art

[0002] Chips usually refer to integrated circuits (ICs), which are the core components of modern electronic devices. They integrate a large number of electronic components (such as transistors, resistors, capacitors, etc.) on a small semiconductor material (usually silicon) to achieve complex functions. The manufacturing process of chips involves multiple complex steps, including lithography, etching, doping, etc. Chip detection is a key process to ensure the quality and performance of integrated circuits (ICs), such as performing EMC tests on chips used in communication equipment to ensure that they are not subject to external electromagnetic interference and do not interfere with other devices. At present, electromagnetic compatibility (EMC) testing is often performed one by one on several devices in a batch of equipment. However, there are some problems such as: frequent opening and closing of darkroom doors and manual replacement of equipment will lead to extended downtime during the test process, which reduces the overall test efficiency and affects the continuity and convenience of operation. Manual replacement of test equipment may introduce human errors. Frequent opening and closing of darkroom doors not only affects the test efficiency, but also may cause changes in the electromagnetic environment inside and outside the darkroom, introduce additional interference sources, and thus have a negative impact on the test results. These problems not only affect the efficiency and accuracy of the test, but also increase the complexity and cost of the operation. Therefore, the present invention proposes an automated chip detection device to solve the problems mentioned in the above background technology. Summary of the invention

[0003] The purpose of the present invention is to solve the shortcomings of the prior art and to propose an automatic chip detection device.

[0004] In order to achieve the above object, the present invention adopts the following technical solutions: An automated chip detection device comprises a shielding room and a conveying mechanism, wherein the conveying mechanism is installed at the rear side of the conveying mechanism, a closed seat is rotatably installed at the rear side of the shielding room, a rotating round table is arranged inside the closed seat, a pushing mechanism is arranged at the rear side of the conveying mechanism, and a material unloading seat is arranged at the front side of the conveying mechanism, the pushing mechanism and the material unloading seat are respectively located at both sides of the closed seat; the pushing mechanism comprises a pushing seat and an electric push rod, the electric push rod is fixedly installed outside the shielding room, the output end of the electric push rod is fixedly connected to the pushing seat, push racks that slide up and down are arranged on both sides of the push seat, a card seat is arranged at the front end of the push rack, and a corresponding A card seat and a support seat for a push rack; two sliding seats that slide back and forth are arranged on the lower side of the shielding room, a spring corresponding to the sliding seat is arranged in the slide groove, a sliding shaft corresponding to the closed seat is rotatably connected between the two sliding seats, a pushing rod is fixed on the outer side of the sliding seat, and the pushing rod slides left and right inside the conveying mechanism; a lifting cylinder rotatably mounted on the shielding room is arranged on the outer side of the closed seat, the output end of the lifting cylinder is rotatably connected to the outer side of the closed seat, the rotating table includes a switching part, the rotating table is rotatably connected to the switching part, a rotating motor connected to the rotating table switching part is installed on the inner side of the closed seat, and a rotating motor fixedly connected to the rotating table is installed inside the rotating table switching part.

[0005] Preferably, spring 2 is arranged on the left and right sides of the outer side of the push seat, and spring 2 is located at the lower side of the rear end of the push frame. The support seat and the surface of the rotating table are provided with a slide groove corresponding to the push frame, and a limiting block corresponding to the card seat is arranged in the support seat slide groove.

[0006] Preferably, a slot is provided on the surface of the holder, and a push plate corresponding to the slot is fixed to the upper end of the push rod.

[0007] Preferably, the material discharge seat is rotatably connected to the outside of the shielding room, a curved surface is provided on one side of the lower portion of the material discharge seat, and a slope corresponding to the curved surface of the lower portion of the material discharge seat is provided on the front end of the push frame.

[0008] Preferably, a toothed plate is fixed on the outer side of the other slide seat, a plurality of ratchet blocks are connected to the upper side of the toothed plate, a ratchet wheel connected to the outside of the shielding chamber is arranged on the upper side of the toothed plate, and the ratchet wheel is engaged with a plurality of ratchet blocks on the lower side.

[0009] Preferably, a bevel gear 1 is fixed to the outside of the ratchet, and a corresponding meshing bevel gear 2 is provided on one side of the bevel gear 1.

[0010] Preferably, the conveying mechanism includes a conveying frame, a plurality of conveying rollers and a conveying belt, the conveying rollers are installed inside the conveying frame, the conveying belt is sleeved outside the plurality of conveying rollers, and one end of the front conveying roller inside the conveying frame is fixedly connected to the second bevel gear.

[0011] Preferably, a switch door is installed on the front side of the shielding room, and the shielding room also includes a signal generator and a receiver.

[0012] Compared with the prior art, the present invention has the following beneficial effects: 1. The traditional anechoic chamber of the present invention is transformed into a relatively independent small test room, and a closed seat structure that can be opened and closed is arranged at the rear side. In the closed state, the test room is a completely closed electromagnetic test room. In the open state, the test room is a relatively open loading and unloading state. With the push mechanism on one side and the unloading seat on the other side, the automatic loading and unloading of the sampling chip can be completed; 2. The push mechanism provided in the present invention, when the closed seat is open and closed, transports the sampling chip pushed by the conveying mechanism to the surface of the rotating truncated table, and pushes the sampling chip that has been tested previously to the unloading seat on the other side. When the push mechanism pushes the push rack to the front end, the unloading seat is squeezed to rotate and tilt to unload the material onto the conveying mechanism, and the push rack falls into the deep groove of the rotating truncated table, so as to avoid bringing back the chip to be tested on the upper side during the resetting process of the push mechanism; 3. The sliding shaft structure provided in the present invention squeezes the sliding shaft during the opening and closing process of the closing seat, so that the push rod connected to the sliding seat on one side moves the connected push plate, and pushes the chip on the conveying mechanism into the card groove on the surface of the pushing frame card seat. During the closing process of the closing seat, the sliding shaft is reset, and the toothed plate connected to the sliding seat on the other side drives the upper ratchet through a plurality of ratchet blocks, so that the ratchet completes intermittent driving of one side of the conveying mechanism through two bevel gears, thereby realizing automatic driving of the conveying mechanism.

[0013] In summary, the present invention transforms the traditional radio darkroom into a small independent test room with the characteristics of flexible switching between closed and open states, realizes automatic loading and unloading functions, and significantly improves work efficiency. The design of the pushing mechanism and the sliding shaft structure ensures efficient synchronization of chips during the test process, reduces labor costs, avoids frequent opening and closing of the shielding room, and improves test accuracy and consistency. Overall, the device improves the working environment and enhances flexibility through automation and standardized operations, and is suitable for a variety of electronic testing needs. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 A schematic diagram of the structure of an automatic chip detection device proposed by the present invention Figure 1 ; Figure 2 A schematic cross-sectional view of an automated chip detection device proposed by the present invention Figure 1 ; Figure 3 A schematic diagram of the side cross-sectional structure of an automated chip detection device proposed by the present invention Figure 1 ; Figure 4 A schematic diagram of the structure of an automatic chip detection device proposed by the present invention Figure 2 ; Figure 5 A schematic cross-sectional view of an automated chip detection device proposed by the present invention Figure 2 ; Figure 6 A schematic diagram of the side cross-sectional structure of an automated chip detection device proposed by the present invention Figure 2 ; Figure 7 This is a schematic diagram of the connection structure of a slide in an automated chip detection device proposed by the present invention; Figure 8 The figure is a schematic diagram of the connection structure of a push mechanism in an automated chip detection device proposed by the present invention.

[0015] In the figure: 1. Shielding room; 2. Conveying mechanism; 3. Pushing mechanism; 301. Pushing seat; 302. Pushing frame; 303. Card seat; 304. Card slot; 305. Inclined surface; 306. Spring 2; 307. Electric push rod; 4. Rotating round table; 5. Push rod; 6. Signal generator; 7. Receiver; 8. Closing seat; 9. Unloading seat; 10. Ratchet; 11. Bevel gear 1; 12. Bevel gear 2; 13. Ratchet block; 14. Spring 1; 15. Sliding seat; 16. Sliding shaft; 17. Lifting cylinder; 18. Support seat; 19. Limiting block. DETAILED DESCRIPTION

[0016] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments.

[0017] Reference Figure 1-8 , an automated chip detection device, comprising a shielding room 1 and a conveying mechanism 2, the conveying mechanism 2 is installed at the rear side of the conveying mechanism 2, a closed seat 8 is rotatably installed at the rear side of the shielding room 1, a rotating round table 4 is arranged inside the closed seat 8, a switch door is installed at the front side of the shielding room 1, and the shielding room 1 also includes a signal generator 6 and a receiver 7. The shielding room 1 is used to eliminate external electromagnetic interference and provide a clean test environment. The receiver 7 is used to receive and analyze the signal radiated by the chip, and is usually equipped with an antenna. The signal generator 6 is used to generate an interference signal of a specific frequency and amplitude to test the anti-interference ability of the chip. The shielding room 1 can be opened by opening the switch door at the front side of the shielding room 1 to debug the chip, and the chip electromagnetic compatibility test of the sampled chip can also be quickly performed by opening the closed seat 8 at the rear side; further, referring to Figure 5 , 6, a pushing mechanism 3 is provided at the rear side of the conveying mechanism 2, and a material discharge seat 9 is provided at the front side of the conveying mechanism 2, the pushing mechanism 3 and the material discharge seat 9 are respectively located on both sides of the closed seat 8, and a lifting cylinder 17 rotatably installed on the shielding room 1 is provided on the outer side of the closed seat 8, and the output end of the lifting cylinder 17 is rotatably connected to the outer side of the closed seat 8, and a rotating motor connected to the adapter of the rotating round table 4 is installed on the inner side of the closed seat 8, and a rotating motor fixed to the rotating round table 4 is installed inside the adapter of the rotating round table 4, and the opening and closing of the closed seat 8 at the rear side of the shielding room 1 is controlled by the extension and contraction of the external lifting cylinder 17. When the closed seat 8 is closed, the rotating round table 4 is located inside the shielding room 1 to perform electromagnetic compatibility testing. When the closed seat 8 is rotated out, the rotating motor of the adapter controls the rotating round table 4 inside the closed seat 8 to always keep it in a horizontal state. At this time, the rotating round table 4 in the rotated-out state corresponds to the pushing mechanism 3 on one side and the material discharge seat 9 on the other side respectively; further, referring to Figure 5 , 8The pushing mechanism 3 includes a pushing seat 301 and an electric push rod 307. The electric push rod 307 is fixedly installed outside the shielding room 1. The output end of the electric push rod 307 is fixedly connected to the pushing seat 301. Push frames 302 that slide up and down are arranged on both sides of the pushing seat 301. A clamping seat 303 is arranged at the front end of the pushing frame 302. A bracket 18 corresponding to the clamping seat 303 and the pushing frame 302 is arranged outside the shielding room 1. Springs 306 are arranged on the left and right sides of the outer side of the pushing seat 301. The springs 306 are located at the lower side of the rear end of the pushing frame 302. The surfaces of the bracket 18 and the rotating round table 4 are provided with sliding grooves corresponding to the pushing frame 302. The depth of the sliding groove in the rotating round table 4 is greater than the depth of the sliding groove of the bracket 18, and A limiting block 19 corresponding to the card seat 303 is set in the slide groove of the bracket 18, and the sampled chip is transported to the side of the shielding room 1 through the conveying mechanism 2. When the closed seat 8 is rotated out, the electric push rod 307 is started to retract, and the electric push rod 307 drives the connected push seat 301 and the push racks 302 on both sides to slide to one side of the rotating round table 4, and the sampled chip on the card seat 303 is transported to the rotating round table 4. When the card seat 303 slides out of the limit block 19 of the slide groove, the push racks 302 on both sides of the push seat 301 move downward under the gravity of the sampling chip, and the sampling chip also falls on the surface of the rotating round table 4. At this time, the card seat 303 is located at the lower side of the limit blocks 19 on both sides of the slide groove. The push rod 307 controls the connected push seat 301 to move back, and the push frames 302 on both sides are restored to the initial state by the lower part of the limiting blocks 19 on both sides of the slide slot, until the card seat 303 completely slides out of the limiting area of ​​the limiting block 19, and under the elastic force of the springs 306 on both sides of the electric push rod 307, the push frames 302 on both sides rise and return to the initial state, and the electric push rod 307 controls the connected push seat 301 and the push frames 302 on both sides to move forward a distance, so that the card seat 303 falls on the upper side of the slide slot limiting block 19; further, the material discharge seat 9 is rotatably connected to the outside of the shielding room 1, and a curved surface is provided on one side of the lower part of the material discharge seat 9, and a corresponding curved surface of the lower part of the material discharge seat 9 is provided at the front end of the push frame 302. The inclined surface 305, when the push seat 301 and the push frame 302 connected to the electric push rod 307 move forward, the push frame 302 pushes the chip on the surface of the rotating table 4 that has been tested last, so that it falls on the corresponding unloading seat 9 on one side, and when the inclined surface 305 at the front end of the push frame 302 corresponds to the arc surface at the lower side of the unloading seat 9, the unloading seat 9 is tilted and rotated toward the side of the external conveying mechanism 2, so that the chip pushed onto the unloading seat 9 and tested falls on the front part of the conveying mechanism 2. A torsion spring is provided at the junction of the unloading seat 9 and the shielding chamber 1. In the process of the card seat 303 moving back, the unloading seat 9 will rotate and turn flat under the action of the torsion spring; further, referring to Figure 6 , 7, two slides 15 sliding forward and backward are arranged at the lower side of the shielding chamber 1, a spring 14 corresponding to the slide 15 is arranged in the slide groove, a slide shaft 16 corresponding to the closed seat 8 is rotatably connected between the two slides 15, a push rod 5 is fixed on the outer side of one slide 15, the push rod 5 slides left and right inside the conveying mechanism 2, a card slot 304 is opened on the surface of the card seat 303, and a push plate corresponding to the card slot 304 is fixed on the upper end of the push rod 5. When the above-mentioned lifting cylinder 17 controls the closed seat 8 to rotate outward, during the external rotation process, the slides 15 on both sides are squeezed to move to one side through the slide shaft 16, and the push rod 5 connected to the slide 15 on one side moves to one side of the pushing mechanism 3, and the sample chip to be tested transported on the conveying mechanism 2 is pushed into the surface card slot 304 of the card seat 303 through the push plate at its front end; further, referring to Figure 2 , 3 7. The conveying mechanism 2 includes a conveying frame, a plurality of conveying rollers and a conveying belt. The conveying rollers are installed inside the conveying frame, and the conveying belts are sleeved outside the plurality of conveying rollers. One end of the conveying roller on the front side of the conveying frame is fixedly connected to the bevel gear 2 12. A toothed plate is fixed on the outside of the other slide 15. A plurality of ratchet blocks 13 are transferred to the upper side of the toothed plate. A ratchet 10 transferred to the outside of the shielding room 1 is arranged on the upper side of the toothed plate, and the ratchet 10 is engaged with a plurality of ratchet blocks 13 on the lower side. A bevel gear 11 is fixed on the outer side of the ratchet 10, and a corresponding meshing bevel gear 2 12 is arranged on one side of the bevel gear 11. In the process of the sliding shaft 16 being squeezed and sliding, the other slide 15 drives the connected toothed plate And several ratchet blocks 13 on its upper side move inward. During this process, several ratchet blocks 13 are not engaged with the ratchet wheel 10 for transmission. The pushed chip is rotated on the closed seat 8. When testing, the sliding shaft 16 is also released from pressure, and the springs 14 on both sides make the sliding seat 15 return to its initial position. At this time, the returning toothed plate drives several ratchet blocks 13 to move back, and the ratchet block 13 drives the engaged ratchet wheel 10 to rotate. The ratchet wheel 10 also drives the front bevel gear 11 to rotate, and the bevel gear 2 12 engaged on one side of the transmission makes the front conveying roller of the conveying mechanism 2 rotate, thereby completing an intermittent activity of the conveying mechanism 2, realizing the progressive pushing of the chip to be tested, and the pushing and collection of the tested chips.

[0018] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. An automated chip detection device, comprising a shielding chamber (1) and a conveying mechanism (2), characterized in that: The conveying mechanism (2) is installed on the rear side of the shielding room (1); a closed seat (8) is rotatably installed on the rear side of the shielding room (1); a rotating round table (4) is arranged inside the closed seat (8); a pushing mechanism (3) is arranged on the rear side of the conveying mechanism (2); and a material discharge seat (9) is arranged on the front side of the conveying mechanism (2); the pushing mechanism (3) and the material discharge seat (9) are respectively located on both sides of the closed seat (8); the pushing mechanism (3) comprises a pushing seat (301) and an electric push rod (307); the electric push rod (307) is fixedly installed outside the shielding room (1); the output end of the electric push rod (307) is fixedly connected to the pushing seat (301); both sides of the pushing seat (301) are provided with pushing frames (302) that slide up and down; a clamping seat (303) is arranged at the front end of the pushing frame (302); the outside of the shielding room (1) A support seat (18) corresponding to the card seat (303) and the push frame (302) is provided; two slide seats (15) sliding forward and backward are provided at the lower side of the shielding chamber (1); a spring (14) corresponding to the slide seat (15) is provided in the slide groove; a slide shaft (16) corresponding to the closed seat (8) is rotatably connected between the two slide seats (15); a push rod (5) is fixed on the outer side of the slide seat (15); the push rod (5) slides left and right inside the conveying mechanism (2); a lifting cylinder (17) rotatably mounted on the shielding chamber (1) is provided on the outer side of the closed seat (8); the output end of the lifting cylinder (17) is rotatably connected to the outer side of the closed seat (8); a rotating motor connected to the adapter part of the rotating table (4) is installed on the inner side of the closed seat (8); and a rotating motor fixedly connected to the rotating table (4) is installed inside the adapter part of the rotating table (4).

2. The automatic chip detection device according to claim 1, characterized in that: The outer sides of the push seat (301) are both provided with springs 2 (306), and the springs 2 (306) are located at the lower side of the rear end of the push frame (302). The surfaces of the support seat (18) and the rotating truncated table (4) are both provided with sliding grooves corresponding to the push frame (302). The depth of the sliding groove in the rotating truncated table (4) is greater than the depth of the sliding groove in the support seat (18), and a limiting block (19) corresponding to the clamping seat (303) is provided in the sliding groove of the support seat (18).

3. The automated chip detection device according to claim 1, characterized in that: A slot (304) is provided on the surface of the holder (303), and a push plate corresponding to the slot (304) is fixed to the upper end of the push rod (5).

4. The automated chip detection device according to claim 1, characterized in that: The material discharge seat (9) is rotatably connected to the outside of the shielding room (1), a curved surface is provided on one side of the lower part of the material discharge seat (9), and a slope (305) corresponding to the curved surface of the lower part of the material discharge seat (9) is provided at the front end of the push frame (302).

5. The automated chip detection device according to claim 1, characterized in that: A toothed plate is fixed on the outside of the other slide seat (15), a plurality of ratchet blocks (13) are connected to the upper side of the toothed plate, a ratchet wheel (10) connected to the outside of the shielding room (1) is arranged on the upper side of the toothed plate, and the ratchet wheel (10) is engaged with a plurality of ratchet blocks (13) on the lower side.

6. The automated chip detection device according to claim 5, characterized in that: A bevel gear 1 (11) is fixed to the outside of the ratchet (10), and a corresponding meshing bevel gear 2 (12) is provided on one side of the bevel gear 1 (11).

7. The automated chip detection device according to claim 1, characterized in that: The conveying mechanism (2) comprises a conveying frame, a plurality of conveying rollers and a conveying belt, wherein the conveying rollers are installed inside the conveying frame, the conveying belt is sleeved outside the plurality of conveying rollers, and one end of the conveying roller on the front side of the conveying frame is fixedly connected to a second bevel gear (12).

8. The automated chip detection device according to claim 1, characterized in that: A switch door is installed on the front side of the shielding room (1), and a signal generator (6) and a receiver (7) are also included in the shielding room (1).

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