The invention discloses a photoelectric event identification optimization method and
system for a single photoelectron
detector, and the method comprises the steps: collecting environment
noise data, carrying out the modeling of environment
noise, and generating a
noise processing model; real-time operation
monitoring data of the target single photoelectron
detector are acquired, noise
processing is carried out, and time-
frequency domain waveform decoupling is carried out after
processing is completed; performing pulse accumulation detection through a time-
frequency domain decoupling result, marking an accumulation event, and separating accumulated pulses by using a pre-trained
pulse separation network to obtain
pulse separation information; generating a floating judgment boundary parameter according to the
pulse separation information, and carrying out photoelectric event judgment to obtain a photoelectric event judgment
list; and obtaining a historical photoelectric event discrimination
list of the target single photoelectron
detector, extracting an abnormal discrimination event, analyzing whether maintenance is needed, generating a maintenance self-inspection report, and pushing the maintenance self-inspection report. The detector keeps high robustness and anti-interference capability in the whole life cycle, and the
identification error rate improvement caused by aging change is avoided.