Z scanning test system
By introducing lighting modules and display modules into the Z-scan testing system, the problem of difficulty in adjusting the sample position is solved, intuitive observation of light beam incident is achieved, and testing efficiency is improved.
Patent Information
- Application Number
- CN202411570044.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-05
- Publication Date
- 2025-02-14
AI Technical Summary
When conducting Z-scan tests, it is difficult for operators to observe whether the sample is set in the optical path for smaller samples, resulting in the need to adjust the sample position multiple times, affecting the test efficiency.
A Z-scan testing system is designed, including a test light source, a collimating beam expansion module, a light splitter, a translation module, a focus lens, a detection module and a display module. By providing the illumination light and displaying the image of the sample, the operator can directly observe whether the second light beam is incident on the sample.
The system enables operators to visually observe whether the beam is incident on the sample, simplifying the adjustment of sample position and improving the efficiency of Z-scan testing.
Smart Images
Figure CN119438136A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of optical testing, and in particular to a Z scanning testing system. Background Art
[0002] Z-scan testing is a method for obtaining nonlinear optical coefficients by measurement. The light beam is focused by a convex lens to generate a light field with varying intensity in space. The nonlinear refractive index and nonlinear absorption coefficient of the sample can be obtained by translating the sample along the propagation direction of the light beam (Z axis). The positive and negative signs of the nonlinear refractive index obtained by the test can determine the self-focusing or self-defocusing behavior of the material. The physical mechanisms of nonlinear absorption mainly include two-photon absorption, multi-photon absorption, saturation absorption, free carrier absorption, etc. The physical mechanisms of nonlinear refraction include electron cloud distortion, molecular orientation, thermal contribution, electrostriction, layout redistribution, etc.
[0003] For samples with smaller sizes, it is difficult to observe whether the sample is set in the light path during the Z scan test. The operator has to adjust the position of the sample multiple times according to the test results, which affects the test. Summary of the invention
[0004] Based on the above problems, the present application provides a Z scanning test system with a simple structure, which is convenient for observing whether the light beam is incident on the sample.
[0005] An embodiment of the present application provides a Z-scan test system, comprising:
[0006] A test light source, used for providing a test light beam;
[0007] A collimation and beam expansion module, used for collimating and expanding the test beam;
[0008] A beam splitter, used for splitting the collimated and expanded light beam into a first light beam and a second light beam;
[0009] A translation module, used to drive the sample to translate;
[0010] A focusing lens, used for focusing the second light beam onto the translation module, so that the second light beam can be incident on the sample and form a sample output light beam;
[0011] A first detection module, used for measuring the power of the first light beam;
[0012] A second detection module, used to measure the power of the sample output light beam;
[0013] An illumination module, used for providing illumination light to the translation module;
[0014] A display module is used to display the image of the sample.
[0015] According to some embodiments of the present application, the test light source includes at least one of a femtosecond laser, a picosecond laser, a single wavelength laser, and a combined wavelength laser.
[0016] According to some embodiments of the present application, the collimating beam expansion module includes a first reflector, a second reflector, and a flat-top beam shaper which are arranged in sequence.
[0017] According to some embodiments of the present application, the collimating beam expansion module further includes a first aperture, and the first aperture is located between the flat-top beam shaper and the beam splitter.
[0018] According to some embodiments of the present application, the translation module includes:
[0019] Translation mechanism;
[0020] The three-dimensional adjustment mechanism is used to carry the sample, and the three-dimensional adjustment mechanism is arranged on the translation mechanism, and the translation mechanism can drive the three-dimensional adjustment mechanism to translate.
[0021] According to some embodiments of the present application, the first detection module includes a first detector, and the first light beam is incident on the first detector.
[0022] According to some embodiments of the present application, the second detection module includes: a second aperture and a second detector, and the sample output light beam passes through the second aperture and is incident on the second detector.
[0023] According to some embodiments of the present application, the display module includes:
[0024] a first moving mechanism;
[0025] An imaging device is disposed on the first moving mechanism, the first moving mechanism can drive the imaging device to move, and the imaging device is used to display the image of the sample.
[0026] According to some embodiments of the present application, the imaging device is movable between the second aperture and the second detector.
[0027] According to some embodiments of the present application, the lighting module includes:
[0028] a second moving mechanism;
[0029] The illumination light source is arranged on the second moving mechanism, and the second moving mechanism can drive the illumination light source to move.
[0030] The lighting module of the present application can provide illumination light for the translation module, and the display module receives and displays the imaging light of the sample on the translation module, so that the operator can observe whether the second light beam is incident on the sample, thereby improving the efficiency of the Z scan test. BRIEF DESCRIPTION OF THE DRAWINGS
[0031] In order to more clearly illustrate the technical solution of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without exceeding the scope of protection required by the present application.
[0032] Figure 1 is a schematic diagram of a Z-scan test system according to an embodiment of the present application;
[0033] Figure 2 is a schematic diagram of a translation module according to an embodiment of the present application;
[0034] Figure 3 is a schematic diagram of a display module according to an embodiment of the present application;
[0035] Figure 4 Schematic diagram of a lighting module according to an embodiment of the present application. DETAILED DESCRIPTION
[0036] The following is a clear and complete description of the technical solution of the present application in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.
[0037] like Figure 1 As shown, an embodiment of the present application provides a Z-scan test system 100, which includes a test light source 1, a collimating and expanding module 2, a spectrometer 3, a translation module 4, a focusing lens 5, a first detection module 6, a second detection module 7, an illumination module 8 and a display module 9.
[0038] The test light source 1 can produce a test beam, and optionally, the test beam is a Gaussian beam. After being emitted by the test light source 1, the test beam is incident on the collimating and expanding module 2. The collimating and expanding module 2 collimates and expands the test beam to make the beam more parallel and uniform. The collimated and expanded beam is incident on the beam splitter 3, and the beam splitter 3 can split the collimated and expanded beam into a first beam and a second beam.
[0039] The second light beam passes through the focusing lens 5 and is incident on the translation module 4. The translation module 4 is used to carry the sample 200 and drive the sample 200 to translate along the Z direction. The focus of the focusing lens 5 is located on the translation module 4. The focusing lens 5 focuses the second light beam on the translation module 4. The sample 200 on the translation module 4 is located on the optical path of the second light beam. The translation module 4 drives the sample 200 to translate near the focus of the focusing lens 5. The second light beam is incident on the sample 200 and forms a sample output light beam.
[0040] The first light beam split by the beam splitter 3 is incident on the first detection module 6, which can measure the power of the first light beam. The sample output light beam is incident on the second detection module 7, which can measure the power of the sample output light beam.
[0041] The Z-scan test system 100 further includes a control device 10, and the first detection module 6 and the second detection module 7 are respectively connected to the control device 10 for communication. The control device 10 receives the detection information of the first detection module 6 and the second detection module 7, and obtains the Z-scan test result of the sample according to an existing algorithm. Optionally, the control device 10 is a computer.
[0042] After placing the sample 200 on the translation module 4, the lighting module 8 is turned on, and the lighting module 8 is used to provide lighting light to the translation module 4 to increase the brightness of the environment where the sample 200 is located, so that the display module 9 can obtain the imaging light of the sample 200. The display module 9 can convert the optical signal into a digital signal. The display module 9 converts the imaging light of the sample 200 into an image of the sample 200, and the operator can observe the second light beam incident on the sample 200 through the display module 9.
[0043] The lighting module 8 and the display module 9 are both in communication connection with the control device 10 , and the control device 10 controls the lighting module 8 and the display module 9 to operate. Figure 1 The dotted lines between the modules represent communication connection lines.
[0044] The Z scanning test system 100 of this embodiment has a simple structure and is easy to use. The lighting module 8 can provide lighting light for the translation module 4, and the display device 9 receives and displays the imaging light of the sample on the translation module 4, which is convenient for the operator to observe whether the second light beam is incident on the sample, thereby improving the efficiency of the Z scanning test.
[0045] In some embodiments, the test light source 1 includes: a laser. The laser can generate a laser beam, and optionally, the laser beam is a Gaussian beam, and the Gaussian beam is emitted as a test beam. The laser includes at least one of a femtosecond laser, a picosecond laser, a single wavelength laser, and a combined wavelength laser.
[0046] In some embodiments, the collimating beam expansion module 2 includes a first reflector 21, a second reflector 22, and a flat top beam shaper 23, which are arranged in sequence. Optionally, the reflection surface of the first reflector 21 and the reflection surface of the second reflector 22 are arranged opposite to each other. The test beam is incident on the flat top beam shaper 23 after being reflected by the first reflector 21 and the second reflector 22 in sequence. The first reflector 21 and the second reflector 22 can adjust the optical path of the test beam so that the test beam is accurately incident on the flat top beam shaper 23. The flat top beam shaper 23 can widen the beam and improve the uniformity of the beam energy distribution.
[0047] In some embodiments, the collimating beam expansion module 2 further includes a first aperture 24, which is located between the flat top beam shaper 23 and the beam splitter 3. The light beam emitted by the flat top beam shaper 23 is incident on the first aperture 24, and the first aperture 24 at least collimates the light beam. The first aperture 24 can use an existing aperture. The first aperture 24 also reduces stray light and astigmatism.
[0048] like Figure 2 As shown, in some embodiments, the translation module 4 includes: a translation mechanism 41 and a three-dimensional adjustment mechanism 42. The translation mechanism 41 selects an existing translation mechanism, such as a screw translation mechanism. The three-dimensional adjustment mechanism 42 is arranged on the translation mechanism 41, and the translation mechanism 41 can drive the three-dimensional adjustment mechanism 42 to translate. The three-dimensional adjustment mechanism 42 selects an existing three-dimensional adjustment mechanism, such as a robotic arm. The three-dimensional adjustment mechanism 42 is used to carry the sample 200, and the three-dimensional adjustment mechanism 42 can fine-tune the spatial position of the sample 200 so that the sample 200 is located on the optical path of the second light beam. The translation mechanism 41 can drive the three-dimensional adjustment mechanism 42 and the sample 200 to translate near the focus of the focusing lens 5. The translation mechanism 41 is communicatively connected to the control device 10.
[0049] In some embodiments, the first detection module 6 includes a first detector, and the first detector is an existing detector. The first light beam is incident on the first detector, and the first detector can measure the power of the first light beam. The first detector is connected to the control device 10 for communication, and the measurement result of the first detector is sent to the control device 10.
[0050] In some embodiments, the second detection module 7 includes: a second aperture 71 and a second detector 72. The second aperture 71 is a variable aperture, which is used for collimation of the optical path and for closed-aperture Z scanning test. Along the optical path of the second light beam, the second detector 72 is located at the rear side of the second aperture 71. The sample output light beam passes through the second aperture 71 and is incident on the second detector 72. The second detector 72 can measure the power of the sample output light beam. The second detector 72 is connected to the control device 10 for communication, and the measurement result of the second detector 72 is sent to the control device 10.
[0051] like Figure 3 As shown, in some embodiments, the display module 9 includes: a first moving mechanism 91 and an imaging device 92. The first moving mechanism 91 is an existing moving mechanism. The imaging device 92 is arranged on the first moving mechanism 91, and the first moving mechanism 91 can drive the imaging device 92 to move so that the imaging device 92 moves into or out of the optical path of the sample output light beam. The imaging device 92 is an existing imaging device.
[0052] After the lighting module 8 is turned on, the imaging device 92 is moved into the optical path of the sample outgoing light beam, and the sample imaging light is incident on the imaging device 92. The imaging device 92 converts the sample imaging light into a digital signal and displays it. The operator fine-tunes the position of the sample 200 through the sample image displayed by the imaging device 92 to accurately place the sample 200 in the optical path of the second light beam.
[0053] The first moving mechanism 91 is communicatively connected to the control device 10 , and the control device 10 can control the operation of the first moving mechanism 91 .
[0054] In some embodiments, the imaging device 92 can be moved between the second aperture 71 and the second detector 72. When it is necessary to obtain a sample image, the first moving mechanism 91 drives the imaging device 92 to move between the second aperture 71 and the second detector 72, and the sample imaging light is incident on the imaging device 92. When performing a Z scan test, the first moving mechanism 91 drives the imaging device 92 to move out from between the second aperture 71 and the second detector 72 to prevent the imaging device 92 from interfering with the propagation of the sample outgoing light beam.
[0055] like Figure 4 As shown, in some embodiments, the lighting module 8 includes: a second moving mechanism 81 and an illumination light source 82. The second moving mechanism 81 uses an existing moving mechanism. The illumination light source 82 is arranged on the second moving mechanism 81, and the illumination light source 82 can use an illumination lamp, and the illumination light of the illumination light source 82 can be incident on the translation module 4. The second moving mechanism 81 can drive the illumination light source 82 to move, and adjust the position of the illumination light source 82 according to the position of the sample 200 on the translation module 4 to improve the brightness of the environment where the sample 200 is located.
[0056] Optionally, when it is necessary to observe the imaging of the sample, the illumination light source 82 is moved between the beam splitter 3 and the first detection module 6, and the illumination light of the illumination light source 82 is incident on the beam splitter 3, and is incident on the position of the sample through the beam splitter 3 and the focusing lens 5. It is convenient for the operator to observe the second light beam focusing on the position of the translation module 4 and the position of the sample 200. If the sample 200 is not in the optical path of the second light beam, the sample 200 is fine-tuned appropriately to place the sample 200 in the optical path of the second light beam. When starting the test, the illumination light source 82 is moved outside the optical path of the first light beam.
[0057] The second moving mechanism 81 and the illumination light source 82 are both in communication connection with the control device 10 , and the control device 10 can control the operation of the second moving mechanism 81 and the illumination light source 82 respectively.
[0058] The process of testing a sample by the Z scanning test system 100 of the present application includes:
[0059] The Gaussian beam emitted by the test light source 1 passes through the first reflector 21, the second reflector 22 and the flat-top beam shaper 23, and is transformed from the original Gaussian beam into a flat-top beam, and then passes through the first aperture 24. The first aperture 24 has a small hole limitation on the one hand, which can reduce the effect of stray light, and on the other hand, can also be used to collimate the light path. After the adjusted beam enters the beam splitter 3 for beam splitting, a first beam and a second beam are formed.
[0060] The second light beam is focused by a focusing lens 5 (the focal length of the focusing lens 5 can be selected according to actual conditions) and is focused at the position of the sample. The translation module 4 drives the sample to move in the Z direction during the test. The three-dimensional adjustment mechanism 42 can fine-tune the position of the sample.
[0061] The sample outgoing light beam passes through the second aperture 71 and enters the second detector 72. When the aperture of the second aperture 71 is fully opened, the signal received by the second detector 72 is used as the result of the aperture Z scan to obtain the nonlinear absorption coefficient.
[0062] When the small hole of the second aperture 71 is not completely opened, the result of the closed-aperture Z scan can be obtained in combination with the signal of the first light beam received by the first detection module 6 to obtain the nonlinear refractive index.
[0063] The illumination module 8 and the display module 9 are used to observe the position where the second light beam is incident on the sample before the test. When the test starts, the illumination light source 82 and the imaging device 92 need to be moved to a position that does not affect the Z scan test.
[0064] The embodiments of the present application are described in detail above. Specific examples are used herein to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the technical solution and core ideas of the present application. Therefore, changes or deformations made by those skilled in the art based on the ideas of the present application, the specific implementation methods and the scope of application of the present application, all belong to the scope of protection of the present application. In summary, the contents of this specification should not be construed as limiting the present application.
Claims
1. A Z-scan test system, characterized in that: include: A test light source, used for providing a test light beam; A collimation and beam expansion module, used for collimating and expanding the test light beam; A beam splitter, used for splitting the collimated and expanded light beam into a first light beam and a second light beam; A translation module, used to drive the sample to translate; A focusing lens, used for focusing the second light beam onto the translation module, so that the second light beam can be incident on the sample and form a sample output light beam; A first detection module, used for measuring the power of the first light beam; A second detection module, used to measure the power of the sample output light beam; An illumination module, used for providing illumination light to the translation module; A display module is used to display the image of the sample.
2. The Z-scan test system according to claim 1, characterized in that: The test light source includes at least one of a femtosecond laser, a picosecond laser, a single wavelength laser, and a combined wavelength laser.
3. The Z-scan test system according to claim 1, characterized in that: The collimating beam expansion module comprises a first reflector, a second reflector and a flat-top beam shaper which are arranged in sequence.
4. The Z-scan test system according to claim 3, characterized in that: The collimating beam expansion module further includes a first aperture, which is located between the flat-top beam shaper and the beam splitter.
5. The Z-scan test system according to claim 1, characterized in that: The translation module comprises: Translation mechanism; The three-dimensional adjustment mechanism is used to carry the sample, and the three-dimensional adjustment mechanism is arranged on the translation mechanism, and the translation mechanism can drive the three-dimensional adjustment mechanism to translate.
6. The Z-scan test system according to claim 1, characterized in that: The first detection module includes a first detector, and the first light beam is incident on the first detector.
7. The Z-scan test system according to claim 1, characterized in that: The second detection module includes: a second aperture and a second detector. The sample output light beam passes through the second aperture and enters the second detector.
8. The Z-scan test system according to claim 7, characterized in that: The display module comprises: a first moving mechanism; An imaging device is disposed on the first moving mechanism, the first moving mechanism can drive the imaging device to move, and the imaging device is used to display the image of the sample.
9. The Z-scan test system according to claim 8, characterized in that: The imaging device is movable between the second aperture and the second detector.
10. The Z-scan test system according to claim 1, characterized in that: The lighting module comprises: a second moving mechanism; The illumination light source is arranged on the second moving mechanism, and the second moving mechanism can drive the illumination light source to move.