Circuit board test probe device

Abstract

The invention discloses a circuit board test probe device, which comprises a probe device used for testing a circuit board and comprising a probe shell, a coaxial connector, a semi-steel cable and a contact piece, the probe shell is provided with an assembly hole and a mounting hole, the coaxial connector is at least partially inserted into one side of the assembly hole, and the semi-steel cable is connected with the coaxial connector and extends out of the other side of the assembly hole; the contact piece is connected to the tail end of the semi-steel cable; the probe seat device comprises a mounting block, a fine adjustment platform, a fixing block, a positioning plate and a protection bottom plate, the probe device is fixed on one side of the mounting block, the other side of the mounting block is fixed with the fine adjustment platform, the fine adjustment platform is fixed or limited on the fixing block, the fixing block is fixed or limited on the positioning plate, and the protection bottom plate is fixed on the positioning plate. The positioning plate is fixed with the protection bottom plate; wherein the positioning plate comprises a positioning column, the positioning column is used for being inserted into a positioning hole of a circuit board, and the contact piece is used for being in contact with a contact of the circuit board. The positioning plate comprises the positioning column, so that the positioning plate and the positioning hole of the circuit board are accurately positioned, and after accurate positioning is realized, the contact piece of the probe device and the contact of the circuit board form reliable contact, so that the stability of signal transmission is ensured.

Description

Technical Field

[0001] The invention relates to the technical field of radio frequency probes for printed circuit board testing, in particular to a circuit board testing probe device. Background Art

[0002] In the design and production of printed circuit boards (PCBs), the integrity of high-frequency signal transmission must be fully considered. Therefore, multiple factors such as etching process, PCB dielectric constant, and wire width must be considered during the processing. Changes in these factors will directly lead to deviations in the characteristic impedance of the PCB transmission line, which in turn affects the performance of reflection loss and transmission loss.

[0003] PCB testing usually uses spring probes, as described in patent CN109061245. However, due to the physical size limitations of spring probes, this testing method cannot effectively test PCBs with small pitches. In addition, this method also has limitations in ultra-high frequency testing, mainly due to the inductance effect of the spring inside the probe under high frequency conditions, which leads to signal distortion. Summary of the invention

[0004] The technical problem to be solved by the present invention is to provide a circuit board test probe device with stable connection and high-quality signal transmission.

[0005] In order to solve the above technical problems, the technical solution of the present invention is as follows:

[0006] A circuit board testing probe device, comprising:

[0007] A probe device, the probe device is used to test a circuit board, the probe device comprises a probe housing, a coaxial connector, a semi-steel cable and a contact piece; the probe housing is provided with an assembly hole and a mounting hole, the coaxial connector is at least partially inserted into one side of the assembly hole, the semi-steel cable is connected to the coaxial connector and extends out from the other side of the assembly hole; the contact piece is connected to the end of the semi-steel cable;

[0008] A needle seat device, the needle seat device comprises a mounting block, a fine-tuning platform, a fixed block, a positioning plate and a protective bottom plate, the probe device is fixed to one side of the mounting block, the other side of the mounting block is fixed to the fine-tuning platform, the fine-tuning platform is fixed or limited to the fixed block, the fixed block is fixed or limited to the positioning plate, and the positioning plate is fixed to the protective bottom plate;

[0009] Wherein, the positioning plate comprises a positioning column, the positioning column is used to be inserted into a positioning hole of a circuit board, and the contact sheet is used to contact a contact point of the circuit board.

[0010] Compared with the prior art, the positioning plate of the present invention includes a positioning column to achieve precise positioning between it and the positioning hole of the circuit board. After precise positioning, the contact piece of the probe device and the contact point of the circuit board form reliable contact to ensure the stability of signal transmission.

[0011] Furthermore, the positioning plate is provided with a window, the fixing block is arranged on one side of the positioning plate, the window is located on the other side of the positioning plate, the contact piece and the semi-steel cable can pass through the window, and the window is used to avoid interference with the semi-steel cable.

[0012] Furthermore, the fixed block is located on the upper side of the positioning plate, and the protective bottom plate is located on the lower side of the positioning plate; the fixed block includes an inclined surface that extends obliquely, and the fine-tuning platform is fixed to the inclined surface side of the fixed block; the fine-tuning platform is used to achieve position fine-tuning to compensate for the position difference caused by processing deviation.

[0013] Furthermore, the fine-tuning platform includes an upper cover portion, a middle portion and a lower cover portion, the middle portion is clamped between the upper cover portion and the lower cover portion; the fine-tuning platform includes a screw mechanism, a rotating mechanism and a connecting mechanism, the screw mechanism is connected to the lower cover portion, the rotating mechanism is connected to the middle portion, and the connecting mechanism is connected to the upper cover portion; the screw mechanism is configured to drive the rotating mechanism to move, thereby driving the connecting mechanism to move.

[0014] Furthermore, the circuit board test probe device also includes a first screw, a second screw, a third screw and a fourth screw, the first screw fixedly connecting the probe device and the upper cover portion of the fine-tuning platform, the second screw fixedly connecting the upper cover portion and the middle portion of the fine-tuning platform, the third screw fixedly connecting the middle portion and the lower cover portion of the fine-tuning platform, and the fourth screw fixedly connecting the lower cover portion and the fixed block of the fine-tuning platform.

[0015] Furthermore, the installation directions of the first screw, the second screw, the third screw and the fourth screw are the same or parallel.

[0016] Furthermore, the positioning plate includes a step portion defined by a window, and the positioning plate is also provided with a docking space penetrating the step portion along the thickness direction of the positioning plate. The positioning plate includes four positioning columns, and the positioning columns extend from the step portion in a direction away from the docking space.

[0017] Further, the four positioning columns include a first pair of positioning columns and a second pair of positioning columns, and the first positioning columns and the second positioning columns are located on opposite sides of the docking space.

[0018] Furthermore, the positioning plate includes a main body, a first cantilever and a second cantilever, the first cantilever and the second cantilever form at least a partial wall of the docking space, the first cantilever and the second cantilever extend toward each other from different parts of the main body, and there is a gap between the first cantilever and the second cantilever.

[0019] Furthermore, the first pair of positioning posts are respectively connected to the free ends of the first cantilever and the second cantilever, the second pair of positioning posts extend from the main body, and the spacing between the second pair of positioning posts is equal to the spacing between the first pair of positioning posts. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 is a three-dimensional diagram of a circuit board test probe device according to an embodiment of the present invention;

[0021] Figure 2 Yes Figure 1 An exploded view of the circuit board test probe assembly shown;

[0022] Figure 3 Yes Figure 1 A perspective view of the probe device shown;

[0023] Figure 4 Yes Figure 1 A perspective view of the needle holder device shown;

[0024] Figure 5 Yes Figure 2 Another perspective view of the stereogram shown;

[0025] Figure 6 It is a three-dimensional picture of the test circuit board;

[0026] Figure 7 Yes Figure 4 A partial exploded view of the needle holder assembly shown;

[0027] Figure 8 Yes Figure 1 A partial perspective view of the needle holder device shown;

[0028] Fig. 9 Yes Figure 8 Exploded view of the needle holder assembly shown.

[0029] Description of the numbers in the figure:

[0030] Probe device 10, probe housing 11, assembly hole 111, mounting hole 112, coaxial connector 12, semi-steel cable 13, contact sheet 14;

[0031] Needle seat device 50, mounting block 51, fine adjustment platform 52, upper cover 521, middle part 522, lower cover 523, screw mechanism 524, rotating mechanism 525, connecting mechanism 526, fixing block 53, inclined surface 531, positioning plate 54, main body 541, first cantilever 545, second cantilever 546, positioning column 55, window 542, protective bottom plate 55;

[0032] Circuit board 60 , positioning hole 61 , contact 62 , first screw 71 , second screw 72 , third screw 73 , fourth screw 74 . DETAILED DESCRIPTION

[0033] Exemplary embodiments will be described in detail herein, examples of which are shown in the accompanying drawings. When the following description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. Instead, they are merely examples of devices and methods consistent with some aspects of the present invention as detailed in the appended claims.

[0034] The terms used in the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The singular forms "a", "said" and "the" used in the present invention and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings.

[0035] It should be understood that the words "first", "second" and similar words used in the specification and claims of the present invention do not indicate any order, quantity or importance, but are only used to distinguish different components. Similarly, words such as "one" or "an" do not indicate a quantity limitation, but indicate the existence of at least one; "plurality" indicates a quantity of two or more. Unless otherwise specified, words such as "front", "rear", "lower" and / or "upper" are only for convenience of description and are not limited to one position or one spatial orientation. Words such as "include" or "comprise" and similar words mean that the elements or objects appearing before "include" or "comprises" include the elements or objects listed after "include" or "comprises" and their equivalents, and do not exclude other elements or objects.

[0036] The exemplary embodiments of the present invention are described in detail below in conjunction with the accompanying drawings. In the absence of conflict, the features of the following embodiments and implementations may complement or be combined with each other.

[0037] like Figures 1 to 9 As shown in FIG. 1 , a circuit board testing probe device according to the present invention is shown, which includes a probe device 10 and a needle holder device 50 .

[0038] The probe device 10 is used to test the circuit board 60, and the probe device 10 includes a probe housing 11, a coaxial connector 12, a semi-steel cable 13 and a contact piece 14. The probe housing 11 is provided with an assembly hole 111 and a mounting hole 112, the coaxial connector 12 is at least partially inserted into one side of the assembly hole 111, the semi-steel cable 13 is connected to the coaxial connector 12, and extends from the other side of the assembly hole 111; the contact piece 14 is connected to the end of the semi-steel cable 13.

[0039] The needle seat device 50 includes a mounting block 51, a fine-tuning platform 52, a fixed block 53, a positioning plate 54 and a protective bottom plate 56. The probe device 10 is fixed to one side of the mounting block 51, and the other side of the mounting block 51 is fixed to the fine-tuning platform 52. The fine-tuning platform 52 is fixed or limited to the fixed block 53, and the fixed block 53 is fixed or limited to the positioning plate 54. The positioning plate 54 and the protective bottom plate 56 are fixed to each other.

[0040] The positioning plate 54 includes a positioning post 55 . The positioning post 55 is used to be inserted into a positioning hole 61 of the circuit board 60 . The contact piece 14 is used to contact with a contact point 62 of the circuit board 60 .

[0041] Compared with the prior art, the positioning plate 54 of the present invention includes a positioning column 55 to achieve precise positioning between it and the positioning hole 61 of the circuit board 60. After precise positioning, the contact piece 14 of the probe device 10 and the contact 62 of the circuit board 60 form reliable contact to ensure the stability of signal transmission.

[0042] The positioning plate 54 is provided with a window 542, the fixing block 53 is arranged on one side of the positioning plate 54, and the window 542 is located on the other side of the positioning plate 54, and the contact piece 14 and the semi-steel cable 13 can pass through the window 542. The window 542 is used to avoid interference with the semi-steel cable 13, and such a setting facilitates the observation angle of the contact piece 14 and the contact 62 of the circuit board 60, which is used for visually observing whether the contact is reliable.

[0043] The fixing block 53 is located on the upper side of the positioning plate 54, and the protective bottom plate 56 is located on the lower side of the positioning plate 54; the fixing block 53 includes an inclined surface 531 extending obliquely, and the fine-tuning platform 52 is fixed to the side of the inclined surface 531 of the fixing block 53; the fine-tuning platform 52 is used to achieve position fine-tuning to compensate for the position difference caused by processing deviation. The fine-tuning platform 52 is fixed to the inclined surface 531 of the fixing block 53, so that the probe device 10 can be tilted relative to the circuit board, which is conducive to improving the docking stability between the contact piece 14 and the contact 62 of the circuit board 60.

[0044] The fine-tuning platform 52 includes an upper cover 521, a middle part 522 and a lower cover 523, wherein the middle part 522 is clamped between the upper cover 521 and the lower cover 523, and such a configuration improves the stability of the middle part 522. The fine-tuning platform 52 includes a screw mechanism 524, a rotating mechanism 525 and a connecting mechanism 526, wherein the screw mechanism 524 is connected to the lower cover 523, the rotating mechanism 525 is connected to the middle part 522, and the connecting mechanism 526 is connected to the upper cover 521; the screw mechanism 524 is configured to drive the rotating mechanism 525 to move, thereby driving the connecting mechanism 526 to move, so that the adjustment of the probe device 10 is more precise and easy.

[0045] The circuit board test probe device 10 also includes a first screw 71, a second screw 72, a third screw 73 and a fourth screw 74. The first screw 71 fixes the probe device 10 and the upper cover 521 of the fine-tuning platform 52, the second screw 72 fixes the upper cover 521 and the middle part 522 of the fine-tuning platform 52, the third screw 73 fixes the middle part 522 and the lower cover 523 of the fine-tuning platform 52, and the fourth screw 74 fixes the lower cover 523 of the fine-tuning platform 52 and the fixed block 53.

[0046] The installation directions of the first screw 71 , the second screw 72 , the third screw 73 and the fourth screw 74 are the same or parallel, thereby simplifying the installation process between the fine-tuning platform and the fixed block and reducing the process complexity caused by rotating the screws in different directions.

[0047] The positioning plate 54 includes a step portion 543 defined by an opening 542, and the positioning plate 54 is further provided with a docking space 544 penetrating the step portion 543 along the thickness direction of the positioning plate 54. The positioning plate 54 includes four positioning posts 55, and the positioning posts 55 extend from the step portion 543 in a direction away from the docking space 544. The provision of the docking space 544 improves the clarity of visually observing whether the contact sheet 14 and the contact point 62 of the circuit board 60 are in reliable contact.

[0048] The four positioning posts 55 include a first pair of positioning posts 551 and a second pair of positioning posts 552. The first positioning posts 55 and the second positioning posts 55 are located on opposite sides of the docking space 544, thereby improving the reliable contact between the contact piece 14 of the probe device 10 and the contact 62 of the circuit board 60 to ensure the stability of signal transmission.

[0049] The positioning plate 54 includes a main body 541, a first cantilever 545 and a second cantilever 546. The first cantilever 545 and the second cantilever 546 form at least a partial wall of the docking space 544. The first cantilever 545 and the second cantilever 546 extend toward each other from different parts of the main body, and there is a gap between the first cantilever 545 and the second cantilever 546, so that the first cantilever 545 and the second cantilever 546 are elastic, thereby improving the self-adjustability of the installation caused by installation errors.

[0050] The first pair of positioning posts 551 are respectively connected to the free ends of the first cantilever 545 and the second cantilever 546, and the second pair of positioning posts 552 extend from the main body 541, and the spacing between the second pair of positioning posts 552 is equal to the spacing between the first pair of positioning posts 551. The first pair of positioning posts 551 and the second pair of positioning posts 552 are arranged in the insertion direction of the probe device 10, so as to facilitate the insertion of the first pair of positioning posts 551 and the second pair of positioning posts 552 into the positioning holes 61 of the circuit board 60.

[0051] The present invention is not limited to the above-mentioned specific implementation modes. Various changes made by ordinary technicians in this field based on the above-mentioned concepts without creative work are all within the protection scope of the present invention.

Claims

1. A circuit board test probe device, characterized in that: include: A probe device, the probe device is used to test a circuit board, the probe device comprises a probe housing, a coaxial connector, a semi-steel cable and a contact sheet; The probe housing is provided with an assembly hole and a mounting hole, the coaxial connector is at least partially inserted into one side of the assembly hole, the semi-steel cable is connected to the coaxial connector and extends out from the other side of the assembly hole; the contact piece is connected to the end of the semi-steel cable; A needle seat device, the needle seat device comprises a mounting block, a fine-tuning platform, a fixed block, a positioning plate and a protective bottom plate, the probe device is fixed to one side of the mounting block, the other side of the mounting block is fixed to the fine-tuning platform, the fine-tuning platform is fixed or limited to the fixed block, the fixed block is fixed or limited to the positioning plate, and the positioning plate is fixed to the protective bottom plate; Wherein, the positioning plate comprises a positioning column, the positioning column is used to be inserted into a positioning hole of a circuit board, and the contact sheet is used to contact a contact point of the circuit board.

2. The circuit board testing probe device according to claim 1, wherein: The positioning plate is provided with a window, the fixing block is arranged on one side of the positioning plate, the window is located on the other side of the positioning plate, the contact piece and the semi-steel cable can pass through the window, and the window is used to avoid interference with the semi-steel cable.

3. The circuit board testing probe device as claimed in claim 2, characterized in that: The fixed block is located on the upper side of the positioning plate, and the protective bottom plate is located on the lower side of the positioning plate; the fixed block includes an inclined surface that extends obliquely, and the fine-tuning platform is fixed to the inclined surface side of the fixed block; the fine-tuning platform is used to achieve position fine-tuning to compensate for the position difference caused by processing deviation.

4. The circuit board testing probe device as claimed in claim 3, characterized in that: The fine-tuning platform includes an upper cover portion, a middle portion and a lower cover portion, wherein the middle portion is clamped between the upper cover portion and the lower cover portion; the fine-tuning platform includes a screw mechanism, a rotating mechanism and a connecting mechanism, wherein the screw mechanism is connected to the lower cover portion, the rotating mechanism is connected to the middle portion, and the connecting mechanism is connected to the upper cover portion; the screw mechanism is configured to drive the rotating mechanism to move, thereby driving the connecting mechanism to move.

5. The circuit board testing probe device as claimed in claim 4, characterized in that: The circuit board test probe device also includes a first screw, a second screw, a third screw and a fourth screw. The first screw fixes the probe device and the upper cover of the fine-tuning platform, the second screw fixes the upper cover and the middle part of the fine-tuning platform, the third screw fixes the middle part and the lower cover of the fine-tuning platform, and the fourth screw fixes the lower cover of the fine-tuning platform and the fixed block.

6. The circuit board testing probe device as claimed in claim 5, characterized in that: The installation directions of the first screw, the second screw, the third screw and the fourth screw are the same or parallel.

7. The circuit board testing probe device according to claim 6, characterized in that: The positioning plate includes a step portion defined by a window, and the positioning plate is also provided with a docking space penetrating the step portion along the thickness direction of the positioning plate. The positioning plate includes four positioning columns, and the positioning columns extend from the step portion in a direction away from the docking space.

8. The circuit board testing probe device as claimed in claim 7, characterized in that: The four positioning posts include a first pair of positioning posts and a second pair of positioning posts, and the first positioning posts and the second positioning posts are located at opposite sides of the docking space.

9. The circuit board testing probe device as claimed in claim 8, characterized in that: The positioning plate includes a main body, a first cantilever and a second cantilever, wherein the first cantilever and the second cantilever form at least a partial wall of the docking space, and the first cantilever and the second cantilever extend toward each other from different parts of the main body, respectively, and there is a gap between the first cantilever and the second cantilever.

10. The circuit board testing probe device according to claim 9, characterized in that: The first pair of positioning posts are respectively connected to the free ends of the first cantilever and the second cantilever, the second pair of positioning posts extend from the main body, and the spacing between the second pair of positioning posts is equal to the spacing between the first pair of positioning posts.

Images