Power-down test method and test system for solid state disk

Abstract

The invention discloses a power-down test method and test system for a solid state disk, and the method comprises the steps: a test host sends test data to the solid state disk, and transmits a power-off instruction after determining that the solid state disk receives the test data; the control unit controls a power switch unit to disconnect the power supply of the solid state disk according to the power-off instruction; the test host sends a power-on instruction after a preset first duration; the control unit controls the power switch unit to be communicated with the power supply of the solid state disk according to the power opening instruction; and the test host reads the write-in data in the solid state disk, compares the test data with the write-in data, and determines a normal power failure test result of the solid state disk, thereby realizing simulation test of power failure conditions of the solid state disk in different environments and different power supply occasions. Therefore, the integrity of the solid-state disk storage data is ensured.

Description

Technical Field

[0001] The present application relates to the technical field of solid state drive testing, and in particular to a power-off testing method and testing system for a solid state drive. Background Art

[0002] BGA SSD is an embedded solid state drive storage solution, designed in a single-chip BGA package, which can support a variety of transmission interfaces and protocols. By integrating advanced nand flash memory and SSD controller into a package, and embedding transmission and flash memory management technology internally, a single-chip, small-volume storage solution is realized, making BGA SSD more integrated and reliable.

[0003] BGA SSD can be applied to various embedded platforms to provide storage for mobile devices, industrial control equipment, vehicle-mounted equipment, communications and other equipment. The complex application environment makes the compatibility test of BGA SSD R&D very complicated. During the mass production process, various tests must be passed to simulate the use environment and test and evaluate the stability of the memory.

[0004] How to perform power-off test on BGA SSD control chip is a technical problem that needs to be solved urgently. Summary of the invention

[0005] The present application provides a power-off test method and a test system for a solid-state hard disk, which can perform normal power-off tests and abnormal power-off tests on the solid-state hard disk, thereby realizing power-off tests of the solid-state hard disk under shutdown conditions in different environments and different power supply occasions.

[0006] In a first aspect, an embodiment of the present application provides a power-off test method for a solid-state hard disk, the power-off test method for the solid-state hard disk comprising:

[0007] The test host sends test data to the solid state drive, and issues a power-off instruction after determining that the solid state drive has received the test data;

[0008] The control unit controls the power switch unit to disconnect the power supply of the solid state hard disk according to the power off instruction;

[0009] The test host issues a power-on instruction after a preset first time period;

[0010] The control unit controls the power switch unit to connect the power supply of the solid state hard disk according to the power-on instruction;

[0011] The test host reads the written data in the solid state drive, and compares the test data with the written data to determine a normal power-off test result of the solid state drive.

[0012] In combination with the first aspect, in one implementation, the test host sends test data to the solid state drive, and after determining that the solid state drive has received the test data, issues a power-off instruction, including:

[0013] The test host sends test data to the solid state drive, and issues the power-off instruction after receiving a data reception completion signal returned by the solid state drive.

[0014] In one implementation, the test host reads the written data in the solid state drive, and compares the test data with the written data to determine a normal power-off test result of the solid state drive, including:

[0015] If the test data is the same as the written data, it is determined that the normal power-off test of the solid state drive is qualified;

[0016] If the test data is different from the write data, it is determined that the normal power-off test of the solid state drive fails.

[0017] In one embodiment, the method further comprises:

[0018] The test host issues the power-off instruction during the process of sending the test data to the solid-state hard disk;

[0019] The control unit controls the solid state drive to stop receiving the test data according to the power-off instruction, and controls the power switch unit to disconnect the power supply of the solid state drive;

[0020] The test host issues the power-on instruction after a preset second time period;

[0021] The control unit controls the power switch unit to connect the power supply of the solid state hard disk according to the power-on instruction;

[0022] The test host reads the written data in the solid state drive, and compares the test data with the written data to obtain an abnormal power failure test result of the solid state drive.

[0023] In one embodiment, the control unit controls the solid state drive to stop receiving the test data according to the power-off instruction, including:

[0024] After receiving the power off instruction, the control unit sends a power off interrupt instruction to the solid state drive to control the solid state drive to stop receiving the test data, and receives a power off interrupt response signal fed back by the solid state drive.

[0025] In one embodiment, the control unit controls the power switch unit to disconnect the power supply of the solid state hard disk according to the power off instruction, including:

[0026] After receiving the power-off instruction, the control unit sends a power-off control signal to the power switch unit, so that the power switch unit disconnects the power supply of the solid state hard disk.

[0027] In one embodiment, the control unit controls the power switch unit to connect the power supply of the solid state drive according to the power-on instruction, including:

[0028] After receiving the power-on instruction, the control unit sends a power connection control signal to the power switch unit, so that the power switch unit connects the power supply of the solid state hard disk.

[0029] In a second aspect, an embodiment of the present application provides a power-off test system for a solid-state hard disk, wherein the power-off test device for the solid-state hard disk comprises:

[0030] A test host, which is used to send test data to the solid state drive and issue a power-off instruction after determining that the solid state drive has received the test data;

[0031] A control unit, configured to control a power switch unit to disconnect power to the solid state hard disk according to the power-off instruction;

[0032] The test host is also used to issue a power-on instruction after a preset first time period;

[0033] The control unit is further used to control the power switch unit to connect the power supply of the solid state hard disk according to the power-on instruction;

[0034] The test host is also used to read the written data in the solid state drive, and compare the test data with the written data to determine the normal power-off test result of the solid state drive.

[0035] In conjunction with the second aspect, in one implementation, the test host is further used for:

[0036] The test host sends test data to the solid state drive, and issues the power-off instruction after receiving a data reception completion signal returned by the solid state drive.

[0037] In one embodiment, the test host is further used for:

[0038] If the test data is the same as the written data, it is determined that the normal power-off test of the solid state drive is qualified;

[0039] If the test data is different from the write data, it is determined that the normal power-off test of the solid state drive fails.

[0040] In one embodiment:

[0041] The test host is further used to issue the power-off instruction during the process of sending the test data to the solid-state hard disk;

[0042] The control unit is further used to control the solid state drive to stop receiving the test data according to the power off instruction, and control the power switch unit to disconnect the power supply of the solid state drive;

[0043] The test host is further configured to issue the power-on instruction after a preset second time period;

[0044] The control unit is further used to control the power switch unit to connect the power supply of the solid state hard disk according to the power-on instruction;

[0045] The test host is also used to read the written data in the solid state drive, and compare the test data with the written data to obtain the abnormal power failure test result of the solid state drive.

[0046] In one embodiment, the control unit is further configured to:

[0047] After receiving the power off instruction, a power off interrupt instruction is sent to the solid state drive to control the solid state drive to stop receiving the test data, and a power off interrupt response signal fed back by the solid state drive is received.

[0048] In one embodiment, the control unit is further configured to:

[0049] After receiving the power-off instruction, the control unit sends a power-off control signal to the power switch unit, so that the power switch unit disconnects the power supply of the solid state hard disk.

[0050] In one embodiment, the control unit is further configured to:

[0051] After receiving the power-on instruction, a power connection control signal is sent to the power switch unit, so that the power switch unit connects the power supply of the solid state hard disk.

[0052] The beneficial effects brought by the technical solution provided in the embodiments of the present application include:

[0053] The present embodiment provides a power-off test method and a test system for a solid-state hard disk, wherein a test host sends test data to the solid-state hard disk, and issues a power-off instruction after determining that the solid-state hard disk has received the test data; a control unit controls a power switch unit to disconnect the power supply of the solid-state hard disk according to the power-off instruction; the test host issues a power-on instruction after a preset first time period; the control unit controls the power switch unit to connect the power supply of the solid-state hard disk according to the power-on instruction; the test host reads the write data in the solid-state hard disk, and compares the test data with the write data to determine a normal power-off test result of the solid-state hard disk.

[0054] The test host issues the power-off instruction during the process of sending the test data to the solid-state hard disk; the control unit controls the solid-state hard disk to stop receiving the test data according to the power-off instruction, and controls the power switch unit to disconnect the power supply of the solid-state hard disk; the test host issues the power-on instruction after a preset second time period; the control unit controls the power switch unit to connect the power supply of the solid-state hard disk according to the power-on instruction; the test host reads the written data in the solid-state hard disk, and compares the test data with the written data to obtain the abnormal power-off test result of the solid-state hard disk.

[0055] The system can simulate normal power failure scenarios and abnormal power failure scenarios of the solid-state hard disk under different power supply conditions and in different environments, so as to ensure the integrity of the data stored in the solid-state hard disk. BRIEF DESCRIPTION OF THE DRAWINGS

[0056] Figure 1 A schematic diagram of the architecture of an embodiment of a power-off test system for a solid-state drive of the present application;

[0057] Figure 2 This is a flow chart of an embodiment of a normal power-off test method for a solid-state hard disk of the present application;

[0058] Figure 3 This is a flow chart of an embodiment of an abnormal power-off test method for a solid state drive of the present application. DETAILED DESCRIPTION

[0059] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0060] In order to make the objectives, technical solutions and advantages of the present application clearer, the implementation methods of the present application will be further described in detail below with reference to the accompanying drawings.

[0061] In a first aspect, an embodiment of the present application provides a power-off test method for a solid-state drive, wherein the solid-state drive may include a BGA SSD solid-state drive or other types of solid-state drives, and this embodiment is described by taking a BGA SSD solid-state drive as an example.

[0062] The power-off test method of the solid state hard disk can be performed as follows: Figure 1 The power-off test system for the solid-state hard disk shown in the figure is implemented. The power-off test system for the solid-state hard disk includes a PC test host, an MCU control unit, a power switch unit and a BGA SSD socket solid-state hard disk card slot (BGA SSD socket, the power-off test system architecture is as follows Figure 1 shown.

[0063] The power-off test system of the solid-state hard disk can integrate a test board, and the external interfaces of the board include an AIC interface and a serial port. The AIC interface is mainly connected to the AIC interface of the test host PC to provide power and high-speed transmission interface to the BGA SSD test system. The serial port is mainly a communication interface between the PC and the MCU. The test device also integrates a solid-state hard disk card slot BGASSD socket, which is mainly used to place the BGA SSD to be tested. When a BGA SSD needs to be tested, the BGA SSD is placed in the solid-state hard disk card slot. After the test is completed, the BGA SSD can be removed from the solid-state hard disk card slot to complete the test. When testing the next BGA SSD, the above steps can be repeated.

[0064] The power-off test system is integrated with a control unit MCU, which communicates with the PC through the serial port and receives instructions. The MCU can output a control signal to control the power supply of the BGA SSD. When the BGA SSD needs to be powered, the MCU sends a power connection control signal to the power switch unit to control the power switch unit to turn on the power switch and provide power to the BGA SSD; when the BGASSD needs to be powered off, the MCU sends a power disconnection control signal to the power switch unit to control the power switch unit to turn off the power switch and stop providing power to the BGA SSD. The MCU sends a power-off interrupt command to the BGA SSD and receives a power-off response signal returned by the BGA SSD.

[0065] It is worth noting that the power-off test method for a solid state drive provided in this embodiment includes a normal power-off test method and an abnormal power-off test method.

[0066] Reference Figure 2 , Figure 2This is a flow chart of an embodiment of a normal power-off test method for a solid state drive of the present application. Figure 2 As shown in the figure, the normal power-off test method of the solid-state drive includes:

[0067] Step S101: The test host sends test data to the solid state drive, and issues a power-off instruction after determining that the solid state drive has received the test data.

[0068] In one embodiment, the test host sends test data to the solid-state drive and issues the power-off instruction after receiving the data reception completion signal returned by the solid-state drive, thereby ensuring that the power is turned off after the solid-state drive completes receiving the test data, thereby simulating a normal shutdown and power-off scenario of the device.

[0069] Step S102: The control unit controls the power switch unit to disconnect the power supply of the solid state hard disk according to the power off instruction.

[0070] Specifically, after receiving the power-off instruction, the control unit sends a power-off control signal to the power switch unit, so that the power switch unit disconnects the power supply to the solid-state hard disk.

[0071] Step S103: the test host sends a power-on instruction after a preset first time period.

[0072] Step S104: the control unit controls the power switch unit to connect the power supply of the solid state drive according to the power-on instruction.

[0073] Specifically, after receiving the power-on instruction, the control unit sends a power connection control signal to the power switch unit, so that the power switch unit connects the power supply of the solid state hard disk.

[0074] Step S105: the test host reads the written data in the solid state drive, and compares the test data with the written data to determine a normal power-off test result of the solid state drive.

[0075] Specifically, the test host reads the write data in the solid-state hard disk, and compares the test data with the write data to determine the normal power-off test result of the solid-state hard disk, including: if the test data is the same as the write data, it is determined that the normal power-off test of the solid-state hard disk is passed; if the test data is different from the write data, it is determined that the normal power-off test of the solid-state hard disk is unqualified.

[0076] Exemplarily, the normal power-off test of the solid-state drive specifically includes the following process: the test host PC sends a certain amount of test data to a specific area of ​​the solid-state drive BGA SSD through the PCIe high-speed transmission interface. After the BGA SSD completes the reception of the test data, it returns a data reception completion signal to the PC through the PCIe high-speed interface. When the PC receives the data reception completion signal returned by the BGA SSD, it sends a power-off instruction to the control unit MCU through the serial port interface. When the MCU receives the power-off instruction sent by the PC, it sends a power-off control signal to the power switch unit, so that the power switch unit turns off the power switch, thereby disconnecting the power supply of the BGA SSD, and then the MCU sends a response to the completion of the power-off instruction to the PC through the serial port.

[0077] After the preset first time period, the PC sends a power on command to the MCU through the serial port. When the MCU receives the power on command, it sends a power connection control signal to the power switch unit to turn on the power switch and supply power to the BGA SSD. Then the MCU sends a response to the completion of the power on command to the PC through the serial port. After receiving the response, the PC identifies the BGASSD, reads the write data in the BGA SSD from the area last written to the BGA SSD through the PCIe high-speed transmission interface, and compares the read write data with the test data sent to the BGA SSD to confirm the correctness of the data. When the write data read in the BGA SSD is the same as the test data sent to the BGA SSD before the power is off, it means that the BGA SSD has passed the normal power-off test this time. When the write data and the test data are different, it means that the BGA SSD has failed the normal power-off test this time.

[0078] It is worth noting that after the normal power-off test is passed, the previous actions are repeated, and the PC sends a certain amount of data to another area of ​​the BGA SSD, and the above test actions are repeated. If the test is passed, the test continues until all storage areas of the BGA SSD are tested, indicating that the normal power-off test of the BGA SSD is OK. Otherwise, one area fails, indicating that the normal power-off test of the entire BGA SSD fails.

[0079] Please refer to Figure 3 , Figure 3 This is a flow chart of an embodiment of an abnormal power failure test method for a solid state drive of the present application. Figure 3 As shown in the figure, the normal power-off test method of the solid-state drive includes:

[0080] Step S201: The test host issues the power-off instruction during the process of sending the test data to the solid-state drive.

[0081] Step S202: the control unit controls the solid state drive to stop receiving the test data according to the power-off instruction, and controls the power switch unit to disconnect the power supply to the solid state drive.

[0082] In one embodiment, after receiving the power-off instruction, the control unit sends a power-off interrupt instruction to the solid-state hard disk to control the solid-state hard disk to stop receiving the test data, receives a power-off interrupt response signal fed back by the solid-state hard disk, and sends a power-off control signal to the power switch unit to cause the power switch unit to disconnect the power supply to the solid-state hard disk.

[0083] Step S203: the test host issues the power-on instruction after a preset second time period.

[0084] Step S204: the control unit controls the power switch unit to connect the power supply of the solid state drive according to the power-on instruction.

[0085] Specifically, after receiving the power-on instruction, the control unit sends a power connection control signal to the power switch unit, so that the power switch unit connects the power supply of the solid state hard disk.

[0086] Step S205: the test host reads the written data in the solid state drive, and compares the test data with the written data to obtain an abnormal power failure test result of the solid state drive.

[0087] Specifically, if the test data is the same as the write data, it is determined that the abnormal power-off test of the solid state drive is qualified; if the test data is different from the write data, it is determined that the abnormal power-off test of the solid state drive is unqualified.

[0088] Exemplarily, the abnormal power-off test for the solid-state drive specifically includes the following process: the test host PC sends a certain amount of test data to a specific area of ​​the BGA SSD through the PCIe high-speed transmission interface. During the data transmission process, the PC sends a power-off command to the control unit MCU through the serial port. When the MCU receives the power-off command, it first sends a power-off interrupt command to the BGA SSD. When the BGA SSD receives the power-off interrupt command, it stops the high-speed signal transmission between the PC and no longer receives the test data sent by the PC. After storing the test data sent by the PC in a specific area, it sends a power-off interrupt response signal to the MCU. When the MCU receives the power-off interrupt response signal fed back by the BGA SSD, it sends a power-off control signal to the power switch unit to turn off the power switch and disconnect the power supply of the BGA SSD. Then the MCU sends a power-off command to complete the response to the PC.

[0089] When the PC receives the power off command completion response, it waits for the second preset time and sends a power on command to the MCU through the serial port. When the MCU receives the power on command, it sends a power connection control signal to the power switch unit to turn on the power switch to power the BGA SSD. Then the MCU sends a power on command completion response to the PC through the serial port. When the PC receives the power on completion response, it identifies the BGA SSD, reads data from a specific area of ​​the BGA SSD, and compares the write data read from the BGA SSD with the test data sent to the BGA SSD by the PC before the power off. When the read write data and the test data are the same, it means that the BGA SSD is qualified for the current abnormal power off. When the read write data and the test data are different, it means that the current abnormal power off is unqualified.

[0090] When the abnormal power-off test is completed, repeat the previous actions, the PC sends a certain amount of test data to another area of ​​the BGASSD, and repeats the above test actions. If the test is qualified, continue testing until all storage areas of the BGA SSD are tested, indicating that the BGA SSD abnormal power-off test is qualified. Otherwise, one area fails, indicating that the BGA SSD abnormal power-off test has failed.

[0091] The power-off test method for a solid-state hard disk provided in the present embodiment has the beneficial effect that a power-off test system based on a solid-state hard disk can meet the normal power-off test requirements and abnormal power-off test requirements of the solid-state hard disk through the power-off test method for the solid-state hard disk, and can simulate normal power-off scenarios and abnormal power-off scenarios of the solid-state hard disk when it is shut down in different environments and different power supply occasions, thereby ensuring the integrity of the data stored in the solid-state hard disk.

[0092] In a second aspect, an embodiment of the present application also provides a power-off test system for a solid state drive.

[0093] In one embodiment, referring to Figure 1 , Figure 1 This is a functional module diagram of an embodiment of a power-off test system for a solid-state hard disk of the present application. Figure 1 As shown, the power-off test system of the solid-state drive includes:

[0094] A test host, which is used to send test data to the solid state drive and issue a power-off instruction after determining that the solid state drive has received the test data;

[0095] A control unit, configured to control a power switch unit to disconnect power to the solid state hard disk according to the power-off instruction;

[0096] The test host is also used to issue a power-on instruction after a preset first time period;

[0097] The control unit is further used to control the power switch unit to connect the power supply of the solid state hard disk according to the power-on instruction;

[0098] The test host is also used to read the written data in the solid state drive, and compare the test data with the written data to determine the normal power-off test result of the solid state drive.

[0099] Furthermore, in one embodiment, the test host is also used for:

[0100] The test host sends test data to the solid state drive, and issues the power-off instruction after receiving a data reception completion signal returned by the solid state drive.

[0101] Furthermore, in one embodiment, the test host is also used for:

[0102] If the test data is the same as the written data, it is determined that the normal power-off test of the solid state drive is qualified;

[0103] If the test data is different from the write data, it is determined that the normal power-off test of the solid state drive fails.

[0104] Furthermore, in one embodiment:

[0105] The test host is further used to issue the power-off instruction during the process of sending the test data to the solid-state hard disk;

[0106] The control unit is further used to control the solid state drive to stop receiving the test data according to the power off instruction, and control the power switch unit to disconnect the power supply of the solid state drive;

[0107] The test host is further configured to issue the power-on instruction after a preset second time period;

[0108] The control unit is further used to control the power switch unit to connect the power supply of the solid state hard disk according to the power-on instruction;

[0109] The test host is also used to read the written data in the solid state drive, and compare the test data with the written data to obtain the abnormal power failure test result of the solid state drive.

[0110] Furthermore, in one embodiment, the control unit is also used for:

[0111] After receiving the power off instruction, a power off interrupt instruction is sent to the solid state drive to control the solid state drive to stop receiving the test data, and a power off interrupt response signal fed back by the solid state drive is received.

[0112] Furthermore, in one embodiment, the control unit is also used for:

[0113] After receiving the power-off instruction, the control unit sends a power-off control signal to the power switch unit, so that the power switch unit disconnects the power supply of the solid state hard disk.

[0114] Furthermore, in one embodiment, the control unit is also used for:

[0115] After receiving the power-on instruction, a power connection control signal is sent to the power switch unit, so that the power switch unit connects the power supply of the solid state hard disk.

[0116] Among them, the functional implementation of each module in the above-mentioned power-off test system for solid state hard disk corresponds to each step in the above-mentioned power-off test system embodiment for solid state hard disk, and its functions and implementation processes are no longer repeated here.

[0117] It should be noted that the serial numbers of the above-mentioned embodiments of the present application are only for description and do not represent the advantages or disadvantages of the embodiments.

[0118] The terms "including" and "having" and any variations thereof in the specification and claims of this application and the above-mentioned drawings are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not limited to the listed steps or units, but optionally includes steps or units that are not listed, or optionally includes other steps or units inherent to these processes, methods, products or devices. The terms "first", "second" and "third" are used to distinguish different objects, etc., and do not represent a sequence, nor do they limit "first", "second" and "third" to different types.

[0119] In the description of the embodiments of the present application, "exemplary", "for example" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary", "for example" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary", "for example" or "for example" is intended to present related concepts in a specific way.

[0120] In the description of the embodiments of the present application, unless otherwise specified, “ / ” means or, for example, A / B can mean A or B; the “and / or” in the text is merely a description of the association relationship of associated objects, indicating that three relationships may exist, for example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone. In addition, in the description of the embodiments of the present application, “multiple” refers to two or more than two.

[0121] In some processes described in the embodiments of the present application, multiple operations or steps that appear in a specific order are included, but it should be understood that these operations or steps may not be executed in the order in which they appear in the embodiments of the present application or in parallel, and the sequence number of the operation is only used to distinguish the different operations, and the sequence number itself does not represent any execution order. In addition, these processes may include more or fewer operations, and these operations or steps may be executed in sequence or in parallel, and these operations or steps may be combined.

[0122] Through the description of the above implementation methods, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) as described above, and includes a number of instructions for a terminal device to execute the methods described in each embodiment of the present application.

[0123] The above are only preferred embodiments of the present application, and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A power-off test method for a solid state hard disk, characterized in that: The power-off test method of the solid state hard disk comprises: The test host sends test data to the solid state drive, and issues a power-off instruction after determining that the solid state drive has received the test data; The control unit controls the power switch unit to disconnect the power supply of the solid state hard disk according to the power off instruction; The test host issues a power-on instruction after a preset first time period; The control unit controls the power switch unit to connect the power supply of the solid state hard disk according to the power-on instruction; The test host reads the written data in the solid state drive, and compares the test data with the written data to determine a normal power-off test result of the solid state drive.

2. The power-off test method for a solid state drive according to claim 1, wherein: The test host sends test data to the solid state drive, and after determining that the solid state drive has received the test data, issues a power-off instruction, including: The test host sends test data to the solid state drive, and issues the power-off instruction after receiving a data reception completion signal returned by the solid state drive.

3. The power-off test method for a solid state drive according to claim 1, wherein: The test host reads the written data in the solid state drive, and compares the test data with the written data to determine a normal power-off test result of the solid state drive, including: If the test data is the same as the written data, it is determined that the normal power-off test of the solid state drive is qualified; If the test data is different from the write data, it is determined that the normal power-off test of the solid state drive fails.

4. The power-off test method for a solid state drive according to claim 1, wherein: The method further includes: The test host issues the power-off instruction during the process of sending the test data to the solid-state hard disk; The control unit controls the solid state drive to stop receiving the test data according to the power-off instruction, and controls the power switch unit to disconnect the power supply of the solid state drive; The test host issues the power-on instruction after a preset second time period; The control unit controls the power switch unit to connect the power supply of the solid state hard disk according to the power-on instruction; The test host reads the written data in the solid state drive, and compares the test data with the written data to obtain an abnormal power failure test result of the solid state drive.

5. The power-off test method of a solid state drive according to claim 4, wherein: The control unit controls the solid state drive to stop receiving the test data according to the power-off instruction, including: After receiving the power-off instruction, the control unit sends a power-off interrupt instruction to the solid-state hard disk to control the solid-state hard disk to stop receiving the test data, and receives a power-off interrupt response signal fed back by the solid-state hard disk.

6. The power-off test method for a solid state drive according to any one of claims 1 or 4, characterized in that: The control unit controls the power switch unit to disconnect the power supply of the solid state hard disk according to the power off instruction, including: After receiving the power-off instruction, the control unit sends a power-off control signal to the power switch unit, so that the power switch unit disconnects the power supply of the solid state hard disk.

7. The power-off test method for a solid state drive according to any one of claims 1 or 4, characterized in that: The control unit controls the power switch unit to connect the power supply of the solid state hard disk according to the power-on instruction, including: After receiving the power-on instruction, the control unit sends a power connection control signal to the power switch unit, so that the power switch unit connects the power supply of the solid state hard disk.

8. A power-off test system for a solid state hard disk, characterized in that: The power-off test device of the solid state hard disk comprises: A test host, which is used to send test data to the solid state drive and issue a power-off instruction after determining that the solid state drive has received the test data; A control unit, configured to control a power switch unit to disconnect power to the solid state hard disk according to the power-off instruction; The test host is also used to issue a power-on instruction after a preset first time period; The control unit is further used to control the power switch unit to connect the power supply of the solid state hard disk according to the power-on instruction; The test host is also used to read the written data in the solid state drive, and compare the test data with the written data to determine the normal power-off test result of the solid state drive.

9. The power-off test system for a solid state drive as claimed in claim 8, characterized in that: The test host is also used to: The test host sends test data to the solid state drive, and issues the power-off instruction after receiving a data reception completion signal returned by the solid state drive.

10. The power-off test system for a solid state drive according to claim 8, wherein: The test host is also used to: If the test data is the same as the written data, it is determined that the normal power-off test of the solid state drive is qualified; If the test data is different from the write data, it is determined that the normal power-off test of the solid state drive fails.

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