Socket testing circuit, socket testing method and leakage protector tripping time measuring circuit

Abstract

The invention discloses a socket test circuit, a test method and a leakage protector tripping time measuring circuit. The socket test circuit comprises a first voltage test circuit, a second voltage test circuit and a microprocessor unit, the first test circuit and the second voltage test circuit are both connected with the microprocessor unit; the first test circuit is connected with a live wire L contact, a null line N contact and a power supply VDD, and the first test circuit is used for detecting a voltage value between a live wire and a null line; the second test circuit is connected with a ground wire E contact, a null line N contact and a power supply VDD, and the second test circuit is used for detecting a voltage value between the ground wire and the null line; the microprocessor unit judges the wiring states of the live wire, the zero wire and the ground wire according to the voltage value detected by the first test circuit and the voltage value detected by the second test circuit. The socket test circuit can safely and comprehensively evaluate the voltage condition of the socket, and ensures that each contact is correctly connected and the voltage is normal.

Description

Technical Field

[0001] The present application belongs to the technical field of circuit detection, and specifically refers to a socket testing circuit, a testing method and a leakage protector tripping time measuring circuit. Background Art

[0002] A socket tester is a portable circuit testing instrument that is specially used to measure the wiring status of the circuit in the socket. It is very suitable for the installation and maintenance of household circuits. In the related art, the measurement function of the leakage protector of the socket tester is mainly realized through a mechanical switch and a load resistor. The principle is to introduce leakage current from the live wire to the ground wire to trip the leakage protector. However, if the leakage protector is tested when the ground wire is missing, the ground wire will be pulled to the live wire voltage, which will pose a safety hazard.

[0003] In the prior art, when a socket tester measures the wiring status of a socket, a resistor is usually connected in series between the live wire and the ground wire. However, in actual use, the ground wire of the socket may be suspended in the air. At this time, the live wire voltage will flow to the ground wire through this resistor, causing the connected ground wire to be energized, thus posing a safety hazard. Summary of the invention

[0004] In order to overcome the deficiencies of the prior art, the present application provides a socket testing circuit, a testing method and a leakage protector tripping time measuring circuit, which can safely and comprehensively evaluate the wiring condition of the socket.

[0005] The present application provides a socket test circuit, including: a first voltage test circuit, a second voltage test circuit and a microprocessor unit; the first test circuit and the second voltage test circuit are both connected to the microprocessor unit; the first test circuit is connected to the live wire L contact, the neutral wire N contact and the power supply VDD, and the first test circuit is used to detect the voltage value between the live wire and the neutral wire; the second test circuit is connected to the ground wire E contact, the neutral wire N contact and the power supply VDD, and the second test circuit is used to detect the voltage value between the ground wire and the neutral wire; the microprocessor unit determines the wiring status of the live wire, the neutral wire and the ground wire according to the voltage value detected by the first test circuit and the voltage value detected by the second test circuit.

[0006] Furthermore, the socket test circuit also includes a three-hole plug connected to the socket, and the three pins of the three-hole plug are respectively connected to the live wire L contact, the neutral wire N contact and the ground wire E contact.

[0007] Furthermore, the microprocessor unit at least includes a single-chip microcomputer, and the single-chip microcomputer includes acquisition ports AI1 pin, AI2 pin, AI3 pin and ACM pin.

[0008] Furthermore, the first voltage testing circuit includes a first resistor R1, a second resistor R2 and a third resistor R3, the third resistor R3 is connected in series between the power supply VDD and the live wire L contact, the first resistor R1 and the second resistor R2 are connected in series between the live wire L contact and the neutral wire N contact in sequence, and the connection between the first resistor R1 and the second resistor R2 is connected to the AI1 pin of the microcontroller.

[0009] Further, the second voltage test circuit includes a fourth resistor R4, a fifth resistor R5 and a sixth resistor R6, the sixth resistor R6 is connected in series between the power supply VDD and the ground line E contact, the fourth resistor R4 and the fifth resistor R5 are connected in series in sequence between the ground line E contact and the neutral line N contact, and the connection between the fourth resistor R4 and the fifth resistor R5 is connected to the AI2 pin of the single chip microcomputer;

[0010] The neutral line N contact is connected to the ACM pin of the single chip microcomputer, and the AI3 pin of the single chip microcomputer is connected to the ACM pin.

[0011] The present application also provides a testing method based on the socket testing circuit described in the present application, the testing method comprising:

[0012] Connect the socket test circuit to the 220V AC circuit of the socket to be tested;

[0013] If the voltage measured by the microprocessor unit through the first voltage test circuit is 220V AC, and the voltage measured by the microprocessor unit through the second voltage test circuit is the normal AC voltage difference between the neutral line and the ground line, the L pin of the socket to be tested is connected to the live wire, the N pin is connected to the neutral line, and the E pin is connected to the ground line, the microprocessor unit outputs a wiring correct signal;

[0014] If the voltage measured by the microprocessor unit through the first voltage test circuit is 220V AC, the voltage measured by the microprocessor unit through the second voltage test circuit is 220V AC, and the voltage measured by the first voltage test circuit and the voltage measured by the second voltage test circuit are equal and in the same phase, then the L pin of the socket to be detected is connected to the neutral line, the N pin is connected to the live line, and the E pin is connected to the ground line, and the microprocessor unit outputs a signal that the live line and the neutral line are connected inversely;

[0015] If the voltage measured by the microprocessor unit through the first voltage test circuit is the normal AC voltage difference between the neutral line and the ground line, and the voltage measured by the microprocessor unit through the second voltage test circuit is 220V AC, the L pin of the socket to be tested is connected to the ground line, the N pin is connected to the neutral line, and the E pin is connected to the live line, the microprocessor unit outputs a signal that the live line and the ground line are connected inversely;

[0016] If the voltage measured by the microprocessor unit through the first voltage test circuit is 220V AC, and the voltage measured by the microprocessor unit through the second voltage test circuit is the power supply DC voltage VDD, the L pin of the socket to be tested is connected to the live wire, the N pin is connected to the neutral wire, and the E pin is left hanging, the microprocessor unit outputs a ground wire missing signal;

[0017] If the voltage measured by the microprocessor unit through the first voltage test circuit is 110V AC, the voltage measured by the microprocessor unit through the second voltage test circuit is 110V AC, the measured voltage of the first voltage test circuit and the measured voltage of the second voltage test circuit are equal and have opposite phases, then the L pin of the socket to be tested is connected to the live wire, the N pin is left floating, and the E pin is connected to the ground wire, and the microprocessor unit outputs a missing neutral wire signal.

[0018] The present application also provides a leakage protector tripping time measurement circuit, the leakage protector tripping time measurement circuit comprising the socket test circuit described in the present application, a first current flow circuit, a first current flow control circuit and a first current flow time measurement circuit;

[0019] The first current flow circuit, the first current flow control circuit, and the first current flow time measurement circuit are all connected to a microprocessor unit in the socket test circuit;

[0020] The first current flow circuit is connected to the first current flow control circuit and the first current flow time measurement circuit respectively, and the first current flow circuit is connected to the live wire L contact and the ground wire E contact;

[0021] The socket test circuit, the first current flow circuit and the first current flow control circuit control the leakage current to be generated only when the socket is wired correctly, and control the leakage current to be cut off; the socket test circuit and the first current flow time measurement circuit record the flow time of the current in the first current flow circuit, and the flow time of the current in the first current flow circuit is the tripping time of the leakage protector.

[0022] Further, the first current flow circuit includes a seventh resistor R7, a rectifier bridge D1, a receiving end of a first thyristor optocoupler U2, and a transmitting end of a second thyristor optocoupler U3;

[0023] Pin 1 of the rectifier bridge D1 is connected to the live wire L contact, pin 3 of the rectifier bridge D1 is connected to the ground wire E contact, pin 2 of the rectifier bridge D1 is connected to one end of the seventh resistor R7, the other end of the seventh resistor R7 is connected to the positive electrode of the transmitting end of the second thyristor optocoupler U3, the negative electrode of the transmitting end of the second thyristor optocoupler U3 is connected to the positive electrode of the receiving end of the first thyristor optocoupler U2, and the negative electrode of the receiving end of the first thyristor optocoupler U2 is connected to pin 4 of the rectifier bridge D1.

[0024] Further, the first current flow control circuit includes an eighth resistor R8 and an emitter end of a first thyristor optocoupler U2;

[0025] One end of the eighth resistor R8 is connected to the microprocessor unit, and the other end of the eighth resistor R8 is connected to the positive electrode of the emitter end of the first thyristor optocoupler U2. The negative electrode of the emitter end of the first thyristor optocoupler U2 is grounded.

[0026] Further, the first current flow time measurement circuit includes a ninth resistor R9 and a receiving end of a second thyristor optocoupler U3;

[0027] One end of the ninth resistor R9 is connected to the power supply VDD, the other end of the ninth resistor R9 is connected to the positive receiving terminal of the second thyristor optocoupler U3 and the microprocessor unit, and the negative receiving terminal of the second thyristor optocoupler U3 is grounded.

[0028] The beneficial effects of the present invention are as follows: the present application provides a socket test circuit, a test method and a leakage protector tripping time measurement circuit, the socket test circuit includes a first voltage test circuit and a second voltage test circuit, the voltage value between the live wire and the neutral wire is measured by the first voltage test circuit, the voltage value between the ground wire and the neutral wire is measured by the second voltage test circuit, and the voltage relationship between the live wire, the neutral wire and the ground wire is judged according to the voltage conditions between the live wire, the neutral wire and the ground wire to obtain the current wiring state of the socket, which can safely and comprehensively evaluate the voltage condition of the socket to ensure that each contact is correctly connected and the voltage is normal. Moreover, the socket test circuit components provided by the present application are relatively low in cost and comprehensive in function, and can effectively detect various performance indicators of the socket. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] The technical solution and other beneficial effects of the present application will be made apparent by describing in detail the specific implementation methods of the present application in conjunction with the accompanying drawings.

[0030] Figure 1 This is a schematic diagram of the structure of the socket test circuit provided in this embodiment.

[0031] Figure 2This is a schematic diagram of the structure of the leakage protector tripping time measurement circuit provided in this embodiment. DETAILED DESCRIPTION

[0032] The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.

[0033] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application. In addition, the terms "first" and "second" are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present application, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0034] The disclosure below provides many different embodiments or examples to realize the different structures of the present application. In order to simplify the disclosure of the present application, the parts and settings of specific examples are described below. Of course, they are only examples, and the purpose is not to limit the present application. In addition, the present application can repeat reference numbers and / or reference letters in different examples, and this repetition is for the purpose of simplification and clarity, which itself does not indicate the relationship between the various embodiments and / or settings discussed. In addition, the various specific processes and material examples provided by the present application, but those of ordinary skill in the art can appreciate the application of other processes and / or the use of other materials.

[0035] The present invention will now be further described with reference to the accompanying drawings and specific implementation methods.

[0036] like Figure 1The figure is a schematic diagram of the structure of the socket test circuit provided in this embodiment. The socket test circuit includes: a first voltage test circuit, a second voltage test circuit and a microprocessor unit; the first test circuit and the second voltage test circuit are both connected to the microprocessor unit; the first test circuit is connected to the live wire L contact, the neutral wire N contact and the power supply VDD, and the first test circuit is used to detect the voltage value between the live wire and the neutral wire; the second test circuit is connected to the ground wire E contact, the neutral wire N contact and the power supply VDD, and the second test circuit is used to detect the voltage value between the ground wire and the neutral wire; the microprocessor unit determines the connection status of the live wire, the neutral wire and the ground wire according to the voltage value detected by the first test circuit and the voltage value detected by the second test circuit.

[0037] Specifically, in this embodiment, the socket test circuit further includes a three-hole plug connected to the socket, and the three pins of the three-hole plug are respectively connected to the live wire L contact, the neutral wire N contact and the ground wire E contact. The three-hole plug is used to be connected to the socket circuit to be tested.

[0038] The microprocessor unit at least includes a single-chip microcomputer U1, and the single-chip microcomputer U1 includes acquisition ports AI1 pin, AI2 pin, AI3 pin and ACM pin.

[0039] In this embodiment, the single-chip microcomputer U1 of the model SN8P2988 is taken as an example for description. The single-chip microcomputer U1 may also be a single-chip microcomputer U1 of other models, which is not specifically limited here.

[0040] like Figure 1 As shown, the first voltage test circuit includes a first resistor R1, a second resistor R2 and a third resistor R3, the third resistor R3 is connected in series between the power supply VDD and the live wire L contact, the first resistor R1 and the second resistor R2 are connected in series between the live wire L contact and the neutral wire N contact, and the connection between the first resistor R1 and the second resistor R2 is connected to the AI1 pin of the single-chip computer U1. Specifically, the first resistor R1 and the second resistor R2 are connected in series between the live wire L contact and the neutral wire N contact to form a complete loop, and at the same time, the connection between the first resistor R1 and the second resistor R2 is connected to the AI1 pin of the single-chip computer U1, which is used to divide the voltage of the live wire L contact and input it into the AI1 pin of the acquisition port of the single-chip computer U1, so as to measure the voltage value between the live wire and the neutral wire.

[0041] The second voltage test circuit includes a fourth resistor R4, a fifth resistor R5 and a sixth resistor R6, the sixth resistor R6 is connected in series between the power supply VDD and the ground wire E contact, the fourth resistor R4 and the fifth resistor R5 are connected in series between the ground wire E contact and the neutral wire N contact, and the connection between the fourth resistor R4 and the fifth resistor R5 is connected to the AI2 pin of the single-chip computer U1. Specifically, the fourth resistor R4 and the fifth resistor R5 are connected in series between the ground wire E contact and the neutral wire N contact to form a complete loop, and the connection between the fourth resistor R4 and the fifth resistor R5 is connected to the AI2 pin of the single-chip computer U1, which is used to divide the voltage of the ground wire E contact and input it into the AI2 pin of the acquisition port of the single-chip computer U1, so as to measure the voltage value between the ground wire and the neutral wire.

[0042] At the same time, the neutral line N contact is connected to the ACM pin of the single-chip microcomputer U1, and the AI3 pin of the single-chip microcomputer U1 is connected to the ACM pin.

[0043] Specifically, pins 1, 26 and 51 of the single-chip microcomputer U1 are connected to the power supply VDD. Pins 2, 27 and 50 of the single-chip microcomputer U1 are connected to the power ground GND. Pin 19 of the single-chip microcomputer U1 is connected to one end of the RCD TEST touch switch, and the other end of the RCD TEST touch switch is grounded.

[0044] The detection principle of the socket test circuit provided in this embodiment is:

[0045] After the three-hole plug is inserted into the 220V AC socket circuit to be tested, the 220V AC voltage enters from the live wire, passes through the first resistor R1 and the second resistor R2, and reaches the neutral wire, forming a complete loop. The 220V AC voltage is divided by the first resistor R1 and the second resistor R2 and input into the AI1 pin of the acquisition port of the single-chip computer U1 for measurement. After calculation, the single-chip computer U1 can obtain the AC voltage between the live wire and the neutral wire. Similarly, the ground wire voltage enters from the ground wire, passes through the fourth resistor R4 and the fifth resistor R5, and reaches the neutral wire, forming a complete loop. After the ground wire voltage is divided by the fourth resistor R4 and the fifth resistor R5, it is input into the AI2 pin of the acquisition port of the single-chip computer U1 for measurement. After calculation, the single-chip computer U1 can obtain the AC voltage between the ground wire and the neutral wire.

[0046] When the socket lacks a ground wire, the ground wire E contact is empty, and the voltage of the power supply VDD passes through the sixth resistor R6, the fourth resistor R4 and the fifth resistor R5 and enters the ACM pin of the single-chip computer U1 after voltage division, and forms a complete loop. The power supply VDD voltage passes through the sixth resistor R6, the fourth resistor R4 and the fifth resistor R5 and is input to the ACM pin of the single-chip computer U1 for measurement, and the single-chip computer U1 can obtain the voltage value of the DC power supply VDD after calculation.

[0047] Because in a normal power supply system, the voltage difference between the neutral wire and the ground wire is a very small AC voltage difference, while the voltage difference between the live wire and the neutral wire or the ground wire is 220V AC voltage.

[0048] Therefore, if the L pin of the socket to be tested is connected to the live wire, the N pin is connected to the neutral wire, and the E pin is connected to the ground wire, the voltage measured by the microprocessor unit through the first voltage test circuit is 220V AC, the voltage measured by the microprocessor unit through the second voltage test circuit is the normal AC voltage difference between the neutral wire and the ground wire, and the microprocessor unit outputs a correct wiring signal.

[0049] If the L pin of the socket to be tested is connected to the neutral wire, the N pin is connected to the live wire, and the E pin is connected to the ground wire, the voltage measured by the microprocessor unit through the first voltage test circuit is 220V AC, the voltage measured by the microprocessor unit through the second voltage test circuit is 220V AC, the measured voltage of the first voltage test circuit and the measured voltage of the second voltage test circuit are equal and in phase, and the microprocessor unit outputs a signal that the live wire and the neutral wire are connected reversely.

[0050] If the L pin of the socket to be tested is connected to the ground wire, the N pin is connected to the neutral wire, and the E pin is connected to the live wire, the voltage measured by the microprocessor unit through the first voltage test circuit is the normal AC voltage difference between the neutral wire and the ground wire, the voltage measured by the microprocessor unit through the second voltage test circuit is 220V AC, and the microprocessor unit outputs a signal that the live wire and the ground wire are connected reversely.

[0051] If the L pin of the socket to be tested is connected to the live wire, the N pin is connected to the neutral wire, and the E pin is left floating, the voltage measured by the microprocessor unit through the first voltage test circuit is 220V AC, the voltage measured by the microprocessor unit through the second voltage test circuit is the power supply DC voltage VDD, and the microprocessor unit outputs a missing ground wire signal.

[0052] If the L pin of the socket to be tested is connected to the live wire, the N pin is floating, and the E pin is connected to the ground wire, the voltage measured by the microprocessor unit through the first voltage test circuit is 110V AC, the voltage measured by the microprocessor unit through the second voltage test circuit is 110V AC, the measured voltage of the first voltage test circuit and the measured voltage of the second voltage test circuit are equal and opposite in phase, and the microprocessor unit outputs a missing neutral line signal.

[0053] The present application provides a socket test circuit, which includes a first voltage test circuit and a second voltage test circuit. The voltage value between the live wire and the neutral wire is measured by the first voltage test circuit, and the voltage value between the ground wire and the neutral wire is measured by the second voltage test circuit. According to the voltage conditions among the live wire, the neutral wire and the ground wire, the voltage relationship among the live wire, the neutral wire and the ground wire is judged to obtain the wiring state of the current socket, which can safely and comprehensively evaluate the voltage condition of the socket to ensure that each contact is correctly connected and the voltage is normal. The socket test circuit provided in this embodiment has no resistor directly connected between the live wire L contact and the ground wire E contact. When the live wire L contact is externally connected to the live wire and the circuit connected to the ground wire E contact is suspended, the voltage of the live wire L contact flows to the circuit connected to the ground wire E contact, thereby making the circuit connected to the ground wire E contact energized. Moreover, the cost of the components of the socket test circuit provided in the present application is relatively low, and the functions are comprehensive, which can effectively detect various performance indicators of the socket.

[0054] This embodiment also provides a method for testing a socket test circuit, the method comprising:

[0055] Connect the socket test circuit to the 220V AC circuit of the socket to be tested;

[0056] If the voltage measured by the microprocessor unit through the first voltage test circuit is 220V AC, and the voltage measured by the microprocessor unit through the second voltage test circuit is the normal AC voltage difference between the neutral line and the ground line, the L pin of the socket to be tested is connected to the live wire, the N pin is connected to the neutral line, and the E pin is connected to the ground line, the microprocessor unit outputs a wiring correct signal;

[0057] If the voltage measured by the microprocessor unit through the first voltage test circuit is 220V AC, the voltage measured by the microprocessor unit through the second voltage test circuit is 220V AC, and the voltage measured by the first voltage test circuit and the voltage measured by the second voltage test circuit are equal and in the same phase, then the L pin of the socket to be detected is connected to the neutral line, the N pin is connected to the live line, and the E pin is connected to the ground line, and the microprocessor unit outputs a signal that the live line and the neutral line are connected inversely;

[0058] If the voltage measured by the microprocessor unit through the first voltage test circuit is the normal AC voltage difference between the neutral line and the ground line, and the voltage measured by the microprocessor unit through the second voltage test circuit is 220V AC, the L pin of the socket to be tested is connected to the ground line, the N pin is connected to the neutral line, and the E pin is connected to the live line, the microprocessor unit outputs a signal that the live line and the ground line are connected inversely;

[0059] If the voltage measured by the microprocessor unit through the first voltage test circuit is 220V AC, and the voltage measured by the microprocessor unit through the second voltage test circuit is the power supply DC voltage VDD, the L pin of the socket to be tested is connected to the live wire, the N pin is connected to the neutral wire, and the E pin is left hanging, the microprocessor unit outputs a ground wire missing signal;

[0060] If the voltage measured by the microprocessor unit through the first voltage test circuit is 110V AC, the voltage measured by the microprocessor unit through the second voltage test circuit is 110V AC, the measured voltage of the first voltage test circuit and the measured voltage of the second voltage test circuit are equal and have opposite phases, then the L pin of the socket to be tested is connected to the live wire, the N pin is left floating, and the E pin is connected to the ground wire, and the microprocessor unit outputs a missing neutral wire signal.

[0061] like Figure 2 As shown, this embodiment also provides a leakage protector tripping time measurement circuit, and the leakage protector tripping time measurement circuit includes the socket test circuit provided in this embodiment, the first current flow circuit, the first current flow control circuit and the first current flow time measurement circuit. Wherein, the first current flow circuit, the first current flow control circuit and the first current flow time measurement circuit are all connected to the microprocessor unit in the socket test circuit; the first current flow circuit is respectively connected to the first current flow control circuit and the first current flow time measurement circuit, and the first current flow circuit is connected to the live wire L contact and the ground wire E contact; the socket test circuit, the first current flow circuit and the first current flow control circuit control the leakage current to be generated only when the socket is correctly wired, and control the leakage current to be turned off; the socket test circuit and the first current flow time measurement circuit record the flow time of the current in the first current flow circuit, and the flow time of the current in the first current flow circuit is the tripping time of the leakage protector.

[0062] Specifically, Figure 2 As shown, the first current flow circuit includes a seventh resistor R7, a rectifier bridge D1, a receiving end of a first thyristor optocoupler U2, and a transmitting end of a second thyristor optocoupler U3;

[0063] Pin 1 of the rectifier bridge D1 is connected to the live wire L contact, pin 3 of the rectifier bridge D1 is connected to the ground wire E contact, pin 2 of the rectifier bridge D1 is connected to one end of the seventh resistor R7, the other end of the seventh resistor R7 is connected to the positive electrode of the emitter end of the second thyristor optocoupler U3, the negative electrode of the emitter end of the second thyristor optocoupler U3 is connected to the positive electrode of the receiving end of the first thyristor optocoupler U2, and the negative electrode of the receiving end of the first thyristor optocoupler U2 is connected to pin 4 of the rectifier bridge D1. The first current flow circuit is used to provide a leakage protector test current.

[0064] The first current flow control circuit includes an eighth resistor R8 and an emitter end of a first thyristor optocoupler U2;

[0065] One end of the eighth resistor R8 is connected to the P55 interface of the single-chip microcomputer U1 in the microprocessor unit, and the other end of the eighth resistor R8 is connected to the positive electrode of the emitter end of the first thyristor optocoupler U2, and the negative electrode of the emitter end of the first thyristor optocoupler U2 is grounded. The first current flow control circuit is used to control the leakage protector test current.

[0066] The first current flow time measurement circuit includes a ninth resistor R9 and a receiving end of a second thyristor optocoupler U3;

[0067] One end of the ninth resistor R9 is connected to the power supply VDD, the other end of the ninth resistor R9 is connected to the positive electrode of the receiving end of the second thyristor optocoupler U3 and connected to the P00 interface of the single-chip computer U1 in the microprocessor unit, and the negative electrode of the receiving end of the second thyristor optocoupler U3 is grounded.

[0068] Specifically, when the leakage protector tripping time measurement circuit provided in this embodiment is connected to the socket to be tested, when it is detected that the wiring of the socket to be tested is in the correct state and the single-chip computer U1 detects that the RCD TEST touch switch leakage protector is pressed, the P55 interface output current of the single-chip computer U1 controls the first thyristor optocoupler U2 to turn on, so that the second thyristor optocoupler U3 is turned on, thereby pulling down the level of the P00 interface of the single-chip computer U1. At the same time, the single-chip computer U1 generates an interrupt signal to control the timer in the single-chip computer U1 to start working. When the leakage current in the circuit disappears, the second thyristor optocoupler U3 is turned off, and the single-chip computer U1 will detect that the level of the P00 interface is pulled up, and the timer in the single-chip computer U1 stops working. Then the single-chip computer U1 outputs the working time T1 of the timer, and this working time T1 is the tripping time of the leakage protector. The single-chip computer U1 outputs the tripping time of the leakage protector.

[0069] When the single chip microcomputer U1 detects the leakage current signal and it does not disappear within 100ms, it indicates that the leakage protector under test has failed, and then the leakage current control signal is turned off to cut off the leakage test current, thereby avoiding the potential safety hazard caused by excessive ground leakage current. At this time, the single chip microcomputer U1 outputs a leakage protector failure signal.

[0070] When it is detected that the socket to be tested is not in a correctly wired state and the single-chip computer U1 detects that the RCD TEST touch switch leakage protector is pressed, the single-chip computer U1 will not output a leakage current conduction signal, thereby avoiding safety hazards caused by excessive ground wire leakage current. The single-chip computer U1 outputs a leakage protector trip test signal that cannot be performed.

[0071] Therefore, the leakage protector tripping time measurement circuit provided in this embodiment can control the leakage current to be generated only when the socket to be detected is correctly wired through the first current flow control circuit and the first current flow circuit, and shut down the leakage current within the safe time, thereby enhancing the safety of the circuit when testing the leakage protector. And through the first current flow time measurement circuit, when the single-chip microcomputer U1 detects that there is a current flow signal in the first current flow circuit, and records the duration of the first current flow signal, this time is the leakage protector tripping time. And through the external trigger interrupt and timer of the single-chip microcomputer U1, when there is a current flow signal in the first current flow circuit, the single-chip microcomputer U1 reacts quickly to record the first current flow signal time, which can improve the accuracy of the first current flow signal time, thereby improving the accuracy of the leakage protector tripping time.

[0072] Although the preferred embodiments of the embodiments of the present invention have been described, those skilled in the art may make additional changes and modifications to these embodiments once they are aware of the basic creative concepts. Therefore, the attached claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the embodiments of the present invention. Finally, it should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variant thereof are intended to cover non-exclusive inclusion, so that the process, method, article or terminal device including a series of elements includes not only those elements, but also other elements that are not explicitly listed, or also includes elements inherent to such process, method, article or terminal device. In the absence of more restrictions, the elements defined by the sentence "including one..." do not exclude the existence of other identical elements in the process, method, article or terminal device including the elements.

[0073] The above is a detailed introduction to a socket test circuit, a test method and a leakage protector tripping time measurement circuit provided in the embodiments of the present application. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. The description of the above embodiments is only used to help understand the technical solutions and core ideas of the present application. Ordinary technicians in this field should understand that they can still modify the technical solutions recorded in the aforementioned embodiments, or replace some of the technical features therein with equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A socket test circuit, characterized in that: include: A first voltage test circuit, a second voltage test circuit and a microprocessor unit; the first test circuit and the second voltage test circuit are both connected to the microprocessor unit; The first test circuit is connected to the live wire L contact, the neutral wire N contact and the power supply VDD, and the first test circuit is used to detect the voltage value between the live wire and the neutral wire; The second test circuit is connected to the ground wire E contact, the neutral wire N contact and the power supply VDD, and the second test circuit is used to detect the voltage value between the ground wire and the neutral wire; The microprocessor unit determines the connection status of the live wire, the neutral wire, and the ground wire according to the voltage value detected by the first test circuit and the voltage value detected by the second test circuit.

2. The socket test circuit according to claim 1, characterized in that: The socket test circuit also includes a three-hole plug connected to the socket, and the three pins of the three-hole plug are respectively connected to the live wire L contact, the neutral wire N contact and the ground wire E contact.

3. The socket test circuit according to claim 1, characterized in that: The microprocessor unit at least includes a single chip microcomputer, and the single chip microcomputer includes acquisition ports AI1 pin, AI2 pin, AI3 pin and ACM pin.

4. The socket test circuit according to claim 3, characterized in that: The first voltage testing circuit includes a first resistor R1, a second resistor R2 and a third resistor R3. The third resistor R3 is connected in series between the power supply VDD and the live wire L contact. The first resistor R1 and the second resistor R2 are connected in series between the live wire L contact and the neutral wire N contact in sequence. The connection between the first resistor R1 and the second resistor R2 is connected to the AI1 pin of the microcontroller.

5. The socket test circuit according to claim 4, characterized in that: The second voltage test circuit includes a fourth resistor R4, a fifth resistor R5 and a sixth resistor R6, the sixth resistor R6 is connected in series between the power supply VDD and the ground line E contact, the fourth resistor R4 and the fifth resistor R5 are connected in series in sequence between the ground line E contact and the neutral line N contact, and the connection between the fourth resistor R4 and the fifth resistor R5 is connected to the AI2 pin of the single chip microcomputer; The neutral line N contact is connected to the ACM pin of the single chip microcomputer, and the AI3 pin of the single chip microcomputer is connected to the ACM pin.

6. A method for testing a socket test circuit according to any one of claims 1 to 5, characterized in that: The test method includes: Connect the socket test circuit to the 220V AC circuit of the socket to be tested; If the voltage measured by the microprocessor unit through the first voltage test circuit is 220V AC, and the voltage measured by the microprocessor unit through the second voltage test circuit is the normal AC voltage difference between the neutral line and the ground line, the L pin of the socket to be tested is connected to the live wire, the N pin is connected to the neutral line, and the E pin is connected to the ground line, the microprocessor unit outputs a wiring correct signal; If the voltage measured by the microprocessor unit through the first voltage test circuit is 220V AC, the voltage measured by the microprocessor unit through the second voltage test circuit is 220V AC, and the voltage measured by the first voltage test circuit and the voltage measured by the second voltage test circuit are equal and in the same phase, then the L pin of the socket to be detected is connected to the neutral line, the N pin is connected to the live line, and the E pin is connected to the ground line, and the microprocessor unit outputs a signal that the live line and the neutral line are connected inversely; If the voltage measured by the microprocessor unit through the first voltage test circuit is the normal AC voltage difference between the neutral line and the ground line, and the voltage measured by the microprocessor unit through the second voltage test circuit is 220V AC, the L pin of the socket to be tested is connected to the ground line, the N pin is connected to the neutral line, and the E pin is connected to the live line, the microprocessor unit outputs a signal that the live line and the ground line are connected inversely; If the voltage measured by the microprocessor unit through the first voltage test circuit is 220V AC, and the voltage measured by the microprocessor unit through the second voltage test circuit is the power supply DC voltage VDD, the L pin of the socket to be tested is connected to the live wire, the N pin is connected to the neutral wire, and the E pin is left hanging, the microprocessor unit outputs a ground wire missing signal; If the voltage measured by the microprocessor unit through the first voltage test circuit is 110V AC, the voltage measured by the microprocessor unit through the second voltage test circuit is 110V AC, the measured voltage of the first voltage test circuit and the measured voltage of the second voltage test circuit are equal and have opposite phases, then the L pin of the socket to be tested is connected to the live wire, the N pin is left floating, and the E pin is connected to the ground wire, and the microprocessor unit outputs a missing neutral wire signal.

7. A leakage protector tripping time measurement circuit, characterized in that: The leakage protector tripping time measurement circuit comprises the socket test circuit as claimed in any one of claims 1 to 5, a first current flow circuit, a first current flow control circuit and a first current flow time measurement circuit; The first current flow circuit, the first current flow control circuit, and the first current flow time measurement circuit are all connected to a microprocessor unit in the socket test circuit; The first current flow circuit is connected to the first current flow control circuit and the first current flow time measurement circuit respectively, and the first current flow circuit is connected to the live wire L contact and the ground wire E contact; The socket test circuit, the first current flow circuit and the first current flow control circuit control the leakage current to be generated only when the socket is wired correctly, and control the leakage current to be cut off; the socket test circuit and the first current flow time measurement circuit record the flow time of the current in the first current flow circuit, and the flow time of the current in the first current flow circuit is the tripping time of the leakage protector.

8. The tripping time measuring circuit of the leakage protector according to claim 7, characterized in that: The first current flow circuit includes a seventh resistor R7, a rectifier bridge D1, a receiving end of a first thyristor optocoupler U2, and a transmitting end of a second thyristor optocoupler U3; Pin 1 of the rectifier bridge D1 is connected to the live wire L contact, pin 3 of the rectifier bridge D1 is connected to the ground wire E contact, pin 2 of the rectifier bridge D1 is connected to one end of the seventh resistor R7, the other end of the seventh resistor R7 is connected to the positive electrode of the transmitting end of the second thyristor optocoupler U3, the negative electrode of the transmitting end of the second thyristor optocoupler U3 is connected to the positive electrode of the receiving end of the first thyristor optocoupler U2, and the negative electrode of the receiving end of the first thyristor optocoupler U2 is connected to pin 4 of the rectifier bridge D1.

9. The leakage protector tripping time measuring circuit according to claim 8, characterized in that: The first current flow control circuit includes an eighth resistor R8 and an emitter end of a first thyristor optocoupler U2; One end of the eighth resistor R8 is connected to the microprocessor unit, and the other end of the eighth resistor R8 is connected to the positive electrode of the emitter end of the first thyristor optocoupler U2. The negative electrode of the emitter end of the first thyristor optocoupler U2 is grounded.

10. The tripping time measuring circuit of the leakage protector according to claim 8, characterized in that: The first current flow time measurement circuit includes a ninth resistor R9 and a receiving end of a second thyristor optocoupler U3; One end of the ninth resistor R9 is connected to the power supply VDD, the other end of the ninth resistor R9 is connected to the positive receiving terminal of the second thyristor optocoupler U3 and the microprocessor unit, and the negative receiving terminal of the second thyristor optocoupler U3 is grounded.

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