Multi-channel parallel test method and system for solid state disk, medium and product

Abstract

The invention discloses a multi-channel parallel testing method and system for a solid state disk, a medium and a product, relates to the field of solid state disk testing, and is applied to a testing system.The method comprises the steps that after a sub-controller receives a testing instruction sent by a main controller, the reading speed and the writing speed of the solid state disk are obtained; the sub-controller determines the test strength corresponding to the solid state disk according to the reading speed, the writing speed and a preset performance index-test strength corresponding table; the sub-controller monitors the read-write speed, the read-write response duration and the read-write error rate of the test channel after sending the read-write test task of the test strength to the solid state disk; and when the read-write speed is lower than a preset speed threshold value, the read-write response duration exceeds a preset duration threshold value and / or the read-write error rate exceeds a preset error rate threshold value, the main controller sends a channel isolation instruction to the sub-controller. The method is used for improving the testing efficiency and reliability of the solid state disk.

Description

Technical Field

[0001] The present application relates to the field of solid-state drive testing, and in particular to a multi-channel parallel testing method, system, medium and product for solid-state drives. Background Art

[0002] With the rapid development of big data and cloud computing technologies, the demand for data storage devices continues to rise. As a new generation of storage media, solid-state drives are gradually replacing traditional mechanical hard drives with their excellent read and write performance, reliable data security, and good environmental adaptability, becoming the preferred storage solution for data centers, enterprise servers, and other scenarios. Driven by the rapid growth of market demand for solid-state drives, manufacturers continue to expand production capacity, which places higher demands on the test efficiency and quality of solid-state drives.

[0003] At present, the testing of SSDs is mainly carried out in a single-channel serial test mode. The test system connects the SSD to be tested through a test channel and performs read and write tests in sequence according to the preset test items. During the test, the test system will collect the performance indicators of the SSD such as read and write speed and response time, and record these data in the test report.

[0004] However, the test system in the related art has some limitations and defects when facing high-concurrency and large-scale SSD testing scenarios. For example, the test efficiency of the single-channel serial test method is low, and when an abnormality occurs in the test channel, the test system needs to suspend all test tasks for inspection and maintenance, which prolongs the test time. Summary of the invention

[0005] The present application provides a multi-channel parallel testing method, system, medium and product for solid-state hard disks, which are used to improve the efficiency and reliability of solid-state hard disk testing.

[0006] In a first aspect, the present application provides a multi-channel parallel testing method for a solid-state hard disk, which is applied to a testing system, wherein the testing system includes a main controller, several sub-controllers, several test channels and several solid-state hard disks, wherein the main controller is connected to the sub-controllers respectively, the sub-controllers are interconnected with the test channels, the test channels are interconnected with the solid-state hard disks, the number of sub-controllers is equal to the number of test channels, and the number of test channels is equal to the number of solid-state hard disks, the method includes: after receiving a test instruction issued by the main controller, the sub-controller obtains a reading speed and a writing speed of the solid-state hard disk; the sub-controller determines the test intensity corresponding to the solid-state hard disk according to the reading speed, the writing speed and a preset performance indicator-test intensity correspondence table, wherein the performance indicator-test intensity correspondence table includes different reading speeds and different writing speeds. corresponding test intensity; after sending the read and write test tasks of the test intensity to the solid-state hard disk, the sub-controller monitors the read and write speed, read and write response time and read and write error rate of the test channel; when the read and write speed is lower than the preset speed threshold, the read and write response time exceeds the preset time threshold and / or the read and write error rate exceeds the preset error rate threshold, the main controller sends a channel isolation instruction to the sub-controller, and the channel isolation instruction is used to indicate that the abnormal test channel is isolated from the normal test channel, the abnormal test channel is used to indicate the test channel whose read and write speed is lower than the preset speed threshold, the read and write response time exceeds the preset time threshold and / or the read and write error rate exceeds the preset error rate threshold, and the normal test channel is used to indicate the test channel whose read and write speed exceeds the preset speed threshold, the read and write response time is lower than the preset time threshold and / or the read and write error rate is lower than the preset error rate threshold.

[0007] By adopting the above technical solution, based on the multi-level control architecture of main controller-sub-controller-test channel-SSD in the test system, multi-channel parallel testing of SSD is realized, which significantly improves the test efficiency. The sub-controller can dynamically adjust the test intensity according to the actual read and write performance of the SSD, avoiding over-testing or under-testing that may be caused by uniform test intensity. When an abnormal test channel is detected, the main controller will send a channel isolation instruction to the sub-controller to process the abnormal test channel separately from the normal test channel, which not only ensures the normal test of the normal test channel, but also can handle abnormal situations in time, and will not affect the overall test progress due to problems in a single test channel, which not only improves the accuracy and reliability of the test, but also optimizes the utilization efficiency of test resources.

[0008] In combination with some embodiments of the first aspect, in some embodiments, the sub-controller determines the test intensity corresponding to the solid-state hard disk based on the read speed, the write speed and a preset performance indicator-test intensity correspondence table, wherein the performance indicator-test intensity correspondence table includes test intensities corresponding to different read speeds and different write speeds, specifically including: the sub-controller matches the read speed and the write speed with the performance indicator-test intensity correspondence table to obtain the test intensity; if the read speed and the write speed cannot match the performance indicator-test intensity correspondence table, the sub-controller determines the preset read speed with the smallest difference from the read speed, the first test intensity corresponding to the preset read speed, the preset write speed with the smallest difference from the write speed, and the second test intensity corresponding to the preset write speed; the sub-controller determines the test intensity based on the read speed, the preset read speed, the first test intensity, the write speed, the preset read speed and the second test intensity.

[0009] By adopting the above technical solution and introducing a matching mechanism of the performance index-test intensity correspondence table, the sub-controller can accurately select the appropriate test intensity for the corresponding solid-state drive. When encountering a situation where an accurate match cannot be made, the sub-controller will select the closest preset parameters by calculating the minimum difference, and intelligently calculate the optimal test intensity based on these preset parameters. This adaptive test intensity determination method ensures that the test intensity matches the actual performance of the solid-state drive being tested, avoids the problem of hard drive loss caused by excessive test intensity or insufficient testing caused by too low test intensity, and improves the scientificity and accuracy of the test.

[0010] In combination with some embodiments of the first aspect, in some embodiments, after the sub-controller sends the read and write test tasks of the test intensity to the solid-state hard disk, and monitors the read and write speed, read and write response time and read and write error rate of the test channel, the method also includes: the sub-controller determines the read and write speed change curve, the read and write response time change curve and the read and write error rate change curve according to the read and write speed, read and write response time and read and write error rate of the solid-state hard disk in a first preset time; based on the read and write speed change curve, the read and write response time change curve and the read and write error rate change curve, the sub-controller determines the health status of the solid-state hard disk.

[0011] By adopting the above technical solution, the sub-controller monitors the various performance indicators of the solid-state drive during the first preset period of time and draws a performance indicator change curve, thereby comprehensively evaluating the health status of the solid-state drive. This dynamic monitoring and curve analysis method can not only reflect the current performance status of the solid-state drive, but also show its performance change trend, which helps to discover potential performance degradation or fault hazards early.

[0012] In combination with some embodiments of the first aspect, in some embodiments, after the step in which the main controller issues a channel isolation instruction to the sub-controller when the read / write speed is lower than a preset speed threshold, the read / write response time exceeds a preset time threshold and / or the read / write error rate exceeds a preset error rate threshold, the method further includes: the sub-controller determines the importance of the abnormal solid-state hard drive based on a preset level table and the label of the abnormal solid-state hard drive, the preset level table including the importance corresponding to the label of the solid-state hard drive; the sub-controller determines the channel isolation time according to the importance of the abnormal solid-state hard drive, the higher the importance, the longer the channel isolation time; the sub-controller stops sending the read / write test task to the abnormal solid-state hard drive within the channel isolation time.

[0013] By adopting the above technical solution and introducing a solid-state drive importance grading mechanism, the sub-controller can adaptively adjust the channel isolation time according to the importance of the abnormal solid-state drive. For abnormal solid-state drives with higher importance, the sub-controller will use a longer channel isolation time for full observation and processing, and for abnormal solid-state drives with lower importance, the sub-controller will use a shorter channel isolation time. This differentiated isolation strategy ensures that key products receive sufficient abnormal processing time and avoids excessive isolation that leads to reduced test efficiency.

[0014] In combination with some embodiments of the first aspect, in some embodiments, after the step in which the main controller issues a channel isolation instruction to the sub-controller when the read / write speed is lower than a preset speed threshold, the read / write response time exceeds a preset time threshold and / or the read / write error rate exceeds a preset error rate threshold, the method further includes: the main controller determines a test channel adjacent to the abnormal test channel as an adjacent test channel; the main controller obtains temperature data and current data of the adjacent test channel; if the temperature data exceeds a preset temperature range or the current data exceeds a preset current range, the main controller reduces the test intensity of the adjacent test channel by a preset percentage.

[0015] By adopting the above technical solution, the main controller monitors the temperature data and current data of adjacent test channels, so that possible chain reactions can be discovered in time. When the temperature or current of an adjacent test channel is abnormal, the main controller will automatically reduce its test intensity, which not only maintains the continuity of the test, but also reduces the test pressure, preventing the adjacent test channels from being affected by the abnormal test channels and causing new faults, effectively avoiding the spread of abnormal conditions, improving the safety and reliability of the test system, and optimizing the utilization efficiency of test resources.

[0016] In combination with some embodiments of the first aspect, in some embodiments, after the step of reducing the test intensity of the adjacent test channel by a preset percentage when the temperature data exceeds a preset temperature threshold or the current data exceeds a preset current threshold, the method also includes: within a second preset time period after reducing the test intensity, if the temperature data of the adjacent test channel is within a preset temperature range and the current data is within a preset current range, the main controller restores the test intensity of the adjacent test channel to the original test intensity at a preset speed.

[0017] By adopting the above technical solution, the main controller monitors the temperature and current data of the adjacent test channels in real time after reducing the test intensity. After confirming that the adjacent test channels have returned to normal, the test intensity is gradually restored at a preset speed. This gradual recovery mechanism avoids sudden changes in test intensity and ensures the stability of the test process.

[0018] In combination with some embodiments of the first aspect, in some embodiments, the method also includes: the main controller determines the two-dimensional physical location coordinates of all abnormal test channels; based on the two-dimensional physical location coordinates, the main controller calculates the Euclidean distance between the abnormal test channels; when the number of abnormal test channels whose Euclidean distance is less than a preset distance threshold exceeds a preset number threshold, the main controller determines that the abnormal test channels are clustered; and the main controller issues a warning to the administrator.

[0019] By adopting the above technical solution, the main controller calculates the Euclidean distance between abnormal test channels based on the two-dimensional physical position coordinates of the abnormal test channels, thereby identifying the spatial distribution characteristics of the abnormal test channels. When the abnormal test channels are clustered, the main controller will promptly issue an early warning to the administrator. This spatial clustering analysis method can help quickly discover possible systemic problems, such as uneven heat dissipation and unstable power supply, and help administrators take targeted solutions.

[0020] In a second aspect, an embodiment of the present application provides a test system, which includes: one or more processors and a memory; the memory is coupled to the one or more processors, the memory is used to store computer program code, the computer program code includes computer instructions, and the one or more processors call the computer instructions to enable the test system to execute the method described in the first aspect and any possible implementation method of the first aspect.

[0021] In a third aspect, an embodiment of the present application provides a computer program product comprising instructions, which, when the computer program product is run on a test system, enables the test system to execute the method described in the first aspect and any possible implementation of the first aspect.

[0022] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, comprising instructions, which, when executed on a test system, causes the test system to execute the method described in the first aspect and any possible implementation of the first aspect.

[0023] It is understandable that the test system provided in the second aspect, the computer program product provided in the third aspect, and the computer storage medium provided in the fourth aspect are all used to execute the method provided in the embodiment of the present application. Therefore, the beneficial effects that can be achieved can refer to the beneficial effects in the corresponding method, which will not be repeated here.

[0024] One or more technical solutions provided in the embodiments of the present application have at least the following technical effects or advantages: 1. By adopting the above technical solution, based on the multi-level control architecture of main controller-sub-controller-test channel-solid state hard disk in the test system, multi-channel parallel testing of solid state hard disk is realized, which significantly improves the test efficiency. The sub-controller can dynamically adjust the test intensity according to the actual read and write performance of the solid state hard disk, avoiding excessive or insufficient testing that may be caused by uniform test intensity. When an abnormal test channel is detected, the main controller will send a channel isolation instruction to the sub-controller to process the abnormal test channel separately from the normal test channel, which not only ensures the normal test of the normal test channel, but also can handle abnormal situations in time, and will not affect the overall test progress due to problems in a single test channel, which not only improves the accuracy and reliability of the test, but also optimizes the utilization efficiency of test resources.

[0025] 2. By adopting the above technical solution and introducing a solid-state drive importance grading mechanism, the sub-controller can adaptively adjust the channel isolation time according to the importance of the abnormal solid-state drive. For abnormal solid-state drives with higher importance, the sub-controller will use a longer channel isolation time for full observation and processing. For abnormal solid-state drives with lower importance, the sub-controller will use a shorter channel isolation time. This differentiated isolation strategy ensures that key products get sufficient abnormal processing time and avoids excessive isolation that leads to reduced test efficiency.

[0026] 3. By adopting the above technical solution, the main controller calculates the Euclidean distance between abnormal test channels based on the two-dimensional physical position coordinates of the abnormal test channels, thereby identifying the spatial distribution characteristics of the abnormal test channels. When the abnormal test channels are clustered, the main controller will promptly issue an early warning to the administrator. This spatial clustering analysis method can help quickly discover possible systemic problems, such as uneven heat dissipation, unstable power supply, etc., and help administrators take targeted solutions. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1It is a structural diagram of a test system in an embodiment of the present application; Figure 2 It is a flowchart of a multi-channel parallel testing method for a solid state drive in an embodiment of the present application; Figure 3 is another flowchart of the multi-channel parallel testing method for solid-state hard disks in an embodiment of the present application; Figure 4 It is a schematic diagram of a physical device structure of a test system in an embodiment of the present application. DETAILED DESCRIPTION

[0028] The terms used in the following embodiments of the present application are only for the purpose of describing specific embodiments, and are not intended to be used as limitations to the present application. As used in the specification of the present application, the singular expressions "one", "a kind of", "above", "the" and "this" are intended to also include plural expressions, unless there is a clear indication to the contrary in the context. It should also be understood that the term "and / or" used in the present application refers to any or all possible combinations comprising one or more of the listed items.

[0029] In the following, the terms "first" and "second" are used for descriptive purposes only and are not to be understood as suggesting or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features, and in the description of the embodiments of the present application, unless otherwise specified, "plurality" means two or more.

[0030] See also Figure 1 , is a schematic diagram of the structure of the test system in the embodiment of the present application.

[0031] The test system includes a main controller, several sub-controllers, several test channels and several solid-state hard drives. The main controller is connected to each sub-controller, each sub-controller corresponds to a test channel, each test channel is connected to a solid-state hard drive, the number of sub-controllers is equal to the number of test channels, and the number of test channels is equal to the number of solid-state hard drives.

[0032] The main controller is the core part of the entire test system, responsible for coordinating and controlling the operation of each subordinate sub-controller. The sub-controller receives instructions from the main controller and directly manages and controls its subordinate SSD through the test channel, which can be an independent microcontroller or FPGA. The test channel is a path or medium used to transmit test signals, data or instructions in the test system. It can be a physical channel such as a cable, interface, etc., or a software-defined channel used to transfer information between the sub-controller and the SSD. A solid-state drive (SSD) is a storage device that uses an array of solid-state electronic storage chips to store data, replacing the rotating disk and moving read-write head in a traditional mechanical hard drive. SSD has faster read and write speeds, lower power consumption, and higher shock resistance. In the test system, SSD can be used to store large amounts of test data, provide high-speed data access, and support efficient test operations.

[0033] The following is a description of the process of the method provided by this implementation. Figure 2 , is a flow chart of a multi-channel parallel testing method for a solid state drive in an embodiment of the present application.

[0034] S201, after receiving the test instruction sent by the main controller, the sub-controller obtains the reading speed and writing speed of the solid state drive; Among them, the test instruction is used to represent the control command to start the SSD test process; the read speed refers to the data transmission rate when the SSD performs data reading operations, usually in MB / s; the write speed refers to the data transmission rate when the SSD performs data writing operations, also in MB / s.

[0035] Specifically, first, the main controller sends a test instruction to the specified sub-controller. After receiving the test instruction, the sub-controller sends read and write commands to the SSD and measures the data transmission time to obtain the actual read speed and write speed. During the speed test, multiple read and write operations are performed using data blocks of preset sizes (such as 4KB, 8KB, etc.), and then the average speed value is calculated to ensure the accuracy of the measurement results.

[0036] S202, the sub-controller determines the test intensity corresponding to the solid-state hard disk according to the read speed, the write speed and a preset performance indicator-test intensity correspondence table, wherein the performance indicator-test intensity correspondence table includes test intensities corresponding to different read speeds and different write speeds; Among them, the performance indicator-test intensity correspondence table refers to a pre-established mapping relationship table between performance parameters and test intensity, which is used to guide the selection of test intensity; test intensity refers to the degree of stress applied to the solid-state drive during the test, including parameters such as read and write frequency and data size; preset represents the standard value or reference value that has been configured before the system runs; the data in the correspondence table is usually based on a large amount of test data and experience values.

[0037] This step is performed after obtaining the actual read and write speed of the SSD. Specifically, the sub-controller first tries to find the record that best matches the current read and write speed in the performance indicator-test intensity correspondence table. If no completely matching record is found, the closest performance gear will be selected by calculating the difference, and the test intensity will be appropriately adjusted according to the degree of difference between the actual speed and the preset speed. The determination of the test intensity will comprehensively consider the balance of the read and write speeds to avoid a single indicator from excessively affecting the selection of test intensity. At the same time, the system will consider the specific model and application scenario of the SSD to ensure that the selected test intensity can fully verify the performance without causing excessive stress on the device.

[0038] S203, after sending the read and write test task of the test intensity to the solid state drive, the sub-controller monitors the read and write speed, read and write response time and read and write error rate of the test channel; Among them, the read and write test task refers to the specific test instruction sequence generated according to the determined test intensity; the read and write speed refers to the rate at which the solid-state drive reads (read speed) and writes (write speed) data per unit time; the read and write response time refers to the time interval from issuing the read and write test task to receiving the response; the read and write error rate refers to the proportion of errors in the total read and write operations; monitoring refers to the process of continuously collecting and recording relevant performance parameters.

[0039] Specifically, the sub-controller will generate a sequence of read and write test instructions containing different data modes and different transfer sizes according to the test intensity, and these read and write test instructions will be sent to the SSD according to the preset timing. During the test, the sub-controller will record the completion time, data correctness and other information of each read and write operation in real time, and calculate and count various performance indicators.

[0040] S204. When the read / write speed is lower than a preset speed threshold, the read / write response time exceeds a preset time threshold and / or the read / write error rate exceeds a preset error rate threshold, the main controller sends a channel isolation instruction to the sub-controller, and the channel isolation instruction is used to indicate that the abnormal test channel is isolated from the normal test channel. The abnormal test channel is used to indicate a test channel whose read / write speed is lower than the preset speed threshold, the read / write response time exceeds the preset time threshold and / or the read / write error rate exceeds the preset error rate threshold. The normal test channel is used to indicate a test channel whose read / write speed exceeds the preset speed threshold, the read / write response time is lower than the preset time threshold and / or the read / write error rate is lower than the preset error rate threshold.

[0041] Among them, the preset speed threshold is used to indicate the minimum read and write speed standard; the preset time threshold is used to indicate the maximum acceptable response delay time; the preset error rate threshold is used to indicate the maximum probability of error occurrence; the channel isolation instruction refers to a control command that requires the sub-controller to stop using the corresponding test channel; an abnormal test channel refers to a test channel whose performance indicators exceed the preset range; a normal test channel refers to a test channel whose performance indicators are within the normal range.

[0042] Specifically, the main controller will continuously receive and analyze monitoring data from each sub-controller. When it is found that any performance indicator of a test channel exceeds the preset threshold, it will immediately send a channel isolation instruction to the corresponding sub-controller. The channel isolation instruction will clearly indicate the number of the test channel that needs to be isolated. After receiving the channel isolation instruction, the sub-controller will immediately stop sending new read and write test tasks to the test channel and save the current test status information. At the same time, the main controller will activate the corresponding protection mechanism to ensure that problems in abnormal test channels will not affect other normal test channels. During the isolation process, the main controller will continue to monitor the status of the abnormal test channel to provide necessary data support for subsequent fault analysis and recovery.

[0043] By adopting the above technical solution, based on the multi-level control architecture of main controller-sub-controller-test channel-SSD in the test system, multi-channel parallel testing of SSD is realized, which significantly improves the test efficiency. The sub-controller can dynamically adjust the test intensity according to the actual read and write performance of the SSD, avoiding over-testing or under-testing that may be caused by uniform test intensity. When an abnormal test channel is detected, the main controller will send a channel isolation instruction to the sub-controller to process the abnormal test channel separately from the normal test channel, which not only ensures the normal test of the normal test channel, but also can handle abnormal situations in time, and will not affect the overall test progress due to problems in a single test channel, which not only improves the accuracy and reliability of the test, but also optimizes the utilization efficiency of test resources.

[0044] The following is a more detailed description of the process of the method provided by this implementation. Figure 3 , is another flow chart of the multi-channel parallel testing method for solid-state drives in an embodiment of the present application.

[0045] S301, after receiving the test instruction sent by the main controller, the sub-controller obtains the reading speed and writing speed of the solid state drive; For details, please refer to step S101, which will not be described in detail here.

[0046] S302, the sub-controller matches the read speed and the write speed with the performance indicator-test intensity correspondence table to obtain the test intensity; Among them, matching refers to the process of searching for records that are exactly the same or closest to the current read speed and write speed in the performance indicator-test intensity correspondence table; the performance indicator-test intensity correspondence table refers to a pre-configured two-dimensional mapping table, which contains recommended test intensities corresponding to different read speed and different write speed combinations; the test intensity is used to indicate the load level during the test, including specific parameters such as IO queue depth, data block size, and read-write ratio.

[0047] Specifically, first, the sub-controller normalizes the obtained read speed and write speed (such as rounding to a specific precision), and then the sub-controller searches for matching records in the performance indicator-test intensity correspondence table. The performance indicator-test intensity correspondence table is usually in matrix form, with the horizontal axis representing different read speed intervals and the vertical axis representing different write speed intervals. The elements in the matrix are the corresponding test intensities. If a completely matching record is found, the sub-controller will directly use the corresponding test intensity; if there are multiple matches within the allowable deviation range, the sub-controller will select a conservative test intensity to ensure the safety of the test.

[0048] S303, if the read speed and the write speed cannot match the performance indicator-test intensity correspondence table, the sub-controller determines a preset read speed with the smallest difference from the read speed, a first test intensity corresponding to the preset read speed, a preset write speed with the smallest difference from the write speed, and a second test intensity corresponding to the preset write speed; Among them, the preset read speed refers to the read speed gear value pre-defined in the performance indicator-test intensity correspondence table; the preset write speed refers to the write speed gear value pre-defined in the performance indicator-test intensity correspondence table; the minimum difference means that the absolute difference between the actual read speed and the preset read speed is the smallest, and the absolute difference between the actual write speed and the preset write speed is the smallest; the first test intensity is used to represent the test parameter set corresponding to the closest preset read speed; the second test intensity refers to the test parameter set corresponding to the closest preset write speed.

[0049] This step is performed after a complete match fails. Specifically, the sub-controller will calculate the difference between the actual read and write speeds and all the preset speed values ​​in the corresponding table. For the read speed, the system selects the preset read speed with the smallest difference and its corresponding first test intensity; for the write speed, the preset write speed with the smallest difference and its corresponding second test intensity are also selected. The unit consistency of the speed is considered when calculating the difference, and unit conversion is performed when necessary. If there are multiple preset values ​​with the same difference, the system will select a smaller preset value to ensure the safety of the test.

[0050] S304, the sub-controller determines the test intensity according to the read speed, the preset read speed, the first test intensity, the write speed, the preset read speed and the second test intensity; Specifically, first, the sub-controller calculates the deviation ratio between the actual read speed and the preset read speed, and the deviation ratio between the actual write speed and the preset write speed, and then the sub-controller weightedly adjusts the first test intensity and the second test intensity according to the deviation direction and size. The importance weight of the read and write speeds will be considered during the adjustment, and the weight of the read performance is usually slightly higher than that of the write performance. If the actual read and write speeds are higher than the preset read and write speeds or the actual write speeds are higher than the preset write speeds, the sub-controller will appropriately increase the corresponding test intensity; if the actual read and write speeds are lower than the preset read and write speeds or the actual write speeds are lower than the preset write speeds, the sub-controller will reduce the test intensity accordingly. The final test intensity will be obtained by weighted averaging or other preset calculation formulas, taking into account the test intensities of the two dimensions of read and write. The sub-controller will also ensure that the calculated test intensity does not exceed the safety range.

[0051] S305, after sending the read and write test task of the test intensity to the solid state drive, the sub-controller monitors the read and write speed, read and write response time and read and write error rate of the test channel; For details, please refer to step S103, which will not be described in detail here.

[0052] S306, the sub-controller determines a read / write speed variation curve, a read / write response time variation curve, and a read / write error rate variation curve according to the read / write speed, the read / write response time, and the read / write error rate of the solid state hard disk in the first preset time period; Among them, the first preset duration refers to a pre-set performance data collection period, usually several hours or days; the read and write speed change curve refers to a graphical representation of the change trend of the solid-state drive's read and write speed over time, with the horizontal axis being time and the vertical axis being the read and write speed value; the read and write response time change curve refers to a graphical representation of the change trend of the solid-state drive's command response delay over time, reflecting the real-time performance of the solid-state drive; the read and write error rate change curve refers to a graphical representation of the change trend of the solid-state drive's read and write error occurrence frequency over time, and is used to reflect the reliability of the solid-state drive.

[0053] Specifically, first, the sub-controller pre-processes the collected read and write speeds, read and write response times, and read and write error rates of the solid-state hard disk in the first preset time, including removing outliers, data smoothing and other operations. Then, the sub-controller arranges the processed data points in chronological order and generates a continuous change curve through interpolation or fitting algorithms. In order to improve the reliability of the curve, the sub-controller will use techniques such as moving average to eliminate the impact of short-term fluctuations. The generated curve will include annotations of key feature points, such as performance mutation points, stable intervals, etc. At the same time, the sub-controller will also calculate various statistical characteristics of the curve, such as rate of change, fluctuation range, etc., to provide a basis for subsequent health status assessment.

[0054] S307, the sub-controller determines the health status of the solid state drive based on the read / write speed change curve, the read / write response time change curve, and the read / write error rate change curve; Specifically, first, the sub-controller analyzes the key features of the read / write speed change curve, the read / write response time change curve, and the read / write error rate change curve, including but not limited to: the overall trend of the curve (increasing, decreasing, or stable), the fluctuation amplitude of the curve (reflecting the stability of performance), the inflection point position of the curve (indicating performance mutation), and the correlation between the curves. Then, the sub-controller matches these features with the preset health status determination rules. For example, if all curves show a stable trend and small fluctuations, it is determined to be in an "excellent" state; if there is an obvious downward trend but the warning threshold has not been reached, it is determined to be in a "good" state; if there is a sharp performance drop or frequent error rate peaks, it is determined to be in a "warning" or "dangerous" state. The sub-controller also considers the weights of different performance indicators, and usually the weight of the read / write error rate is higher than the read / write speed. The final health status assessment result will be reported to the main controller, and may trigger the corresponding early warning or protection mechanism.

[0055] S308. When the read / write speed is lower than a preset speed threshold, the read / write response time exceeds a preset time threshold, and / or the read / write error rate exceeds a preset error rate threshold, the main controller sends a channel isolation instruction to the sub-controller, and the channel isolation instruction is used to indicate that an abnormal test channel is isolated from a normal test channel, and the abnormal test channel is used to indicate a test channel whose read / write speed is lower than a preset speed threshold, whose read / write response time exceeds a preset time threshold, and / or whose read / write error rate exceeds a preset error rate threshold, and the normal test channel is used to indicate a test channel whose read / write speed exceeds a preset speed threshold, whose read / write response time is lower than a preset time threshold, and / or whose read / write error rate is lower than a preset error rate threshold; For details, please refer to step S104, which will not be described in detail here.

[0056] S309, the sub-controller determines the importance of the abnormal solid state drive according to a preset level table and the label of the abnormal solid state drive, wherein the preset level table includes the importance corresponding to the label of the solid state drive; Among them, the preset level table refers to a pre-configured SSD importance grading table, which is used to store the importance of different SSDs; the label refers to the unique identification number of the SSD, which usually contains the serial number or location information; the abnormal SSD refers to the SSD that has been detected to have abnormal performance; the importance refers to the criticality of the SSD in the entire test system, which is usually divided into multiple levels (such as core, important, general, etc.).

[0057] Specifically, first, the sub-controller reads the unique label from the abnormal SSD, and then the sub-controller queries the preset level table to obtain the corresponding importance information. The preset level table usually adopts a hierarchical structure, and different levels correspond to different processing strategies. For example, a SSD storing critical business data will be marked as the highest importance, while a SSD storing temporary data may be marked as a lower importance. If the label is not clearly defined in the preset level table, the sub-controller will be graded according to the default rules.

[0058] S310, the sub-controller determines the channel isolation time according to the importance of the abnormal solid state hard disk, the higher the importance, the longer the channel isolation time; The channel isolation duration refers to the duration of suspending the test of the abnormal solid-state hard disk; the higher the importance, the longer the channel isolation duration refers to the increasing relationship between the importance and the channel isolation duration.

[0059] Specifically, the sub-controller will determine the channel isolation time of the abnormal SSD based on the preset importance-channel isolation time correspondence table and the importance of the abnormal SSD. For example, for core-level SSDs, a longer channel isolation time (such as 24 hours) may be set to ensure adequate cooling and troubleshooting; for general-level SSDs, a shorter channel isolation time (such as 2 hours) may be used to quickly resume testing. The sub-controller will also consider historical fault records. If the SSD has experienced similar problems many times, the channel isolation time may be extended. At the same time, the determination of the channel isolation time will also take into account the overall test progress and resource utilization of the test system.

[0060] S311, the sub-controller stops sending the read-write test task to the abnormal solid-state hard disk within the channel isolation time length; Specifically, the sub-controller terminates all test instructions currently being executed on the abnormal solid state hard disk, clears the instruction queue of the abnormal test channel, and marks the abnormal test channel as being in an isolated state.

[0061] S312, the main controller determines the test channel adjacent to the abnormal test channel as an adjacent test channel; The abnormal test channel refers to the test channel where the solid-state hard disk that has detected an abnormal condition is located; the adjacent test channel refers to other test channels that are directly connected to the abnormal test channel in physical position.

[0062] Specifically, first, the main controller determines the location of the abnormal test channel based on the physical layout diagram of the test system, and then the main controller identifies all the test channels directly adjacent to it. Adjacent relationships usually include vertical and horizontal adjacent, and may also include diagonal adjacent in some test systems. The main controller will establish an adjacent channel list to record all channel numbers that need special monitoring. For abnormal test channels at the edge, there may be adjacent test channels only in some directions.

[0063] S313, the main controller obtains temperature data and current data of the adjacent test channel; The temperature data refers to the temperature values ​​of adjacent test channels collected in real time by temperature sensors; the current data refers to the real-time current consumption of adjacent test channels.

[0064] Specifically, the main controller collects temperature data and current data in real time through the sensor network of each adjacent test channel. Temperature data is usually in degrees Celsius, and the sampling frequency may vary from multiple times per second to every minute. Current data records the power consumption of adjacent test channels and reflects the actual situation of the test load. The main controller will pre-process the raw data, including filtering, calibration and other operations to ensure the accuracy of the data. At the same time, it will also calculate the data change trend in the short term to provide a basis for subsequent judgment.

[0065] S314, if the temperature data exceeds a preset temperature range or the current data exceeds a preset current range, the main controller reduces the test intensity of the adjacent test channel by a preset percentage; Among them, the preset temperature range refers to the preset normal temperature variation range; the preset current range refers to the preset current fluctuation range under normal operating conditions; and the preset percentage refers to the proportion by which the test intensity needs to be reduced.

[0066] Specifically, the main controller compares the collected temperature data with the preset temperature range, and compares the collected current data with the preset current range. If the temperature exceeds 85°C or the current exceeds 120% of the rated value, the main controller will immediately activate the protection mechanism. The reduction of test intensity is usually progressive, first reducing the preset percentage (such as reducing it by 30%), and observing the parameter changes. Specific measures to reduce test intensity include reducing the number of concurrent operations, reducing the data transmission rate, and increasing the operation interval.

[0067] S315, within the second preset time after reducing the test intensity, if the temperature data of the adjacent test channel is within the preset temperature range and the current data is within the preset current range, the main controller restores the test intensity of the adjacent test channel to the original test intensity at a preset speed; Specifically, the main controller continuously monitors the operating parameters of adjacent test channels within a second preset time period (e.g., 30 minutes), wherein the second preset time period refers to the waiting time for observing the stability of the parameters of adjacent test channels. If all operating parameters are maintained within a safe range, the main controller begins to execute the test intensity recovery process. The recovery process adopts a progressive scheme, gradually increasing the test intensity at a preset speed (e.g., increasing by 10% every 5 minutes) until it returns to the original test intensity. During the recovery process, if the operating parameter abnormality occurs again, the main controller will immediately interrupt the recovery process and reduce the test intensity again.

[0068] S316, the main controller determines the two-dimensional physical position coordinates of all abnormal test channels; Specifically, first, the main controller obtains the physical layout diagram containing all sub-controllers, test channels, and solid-state hard disks. Then, the main controller maps the physical position of each abnormal test channel to a standardized two-dimensional coordinate system to obtain the two-dimensional physical position coordinates of each abnormal test channel. The two-dimensional coordinate system usually adopts a Cartesian coordinate system, where the X-axis represents the horizontal position and the Y-axis represents the vertical position. The main controller will establish a position index table to record the specific coordinate values ​​of each abnormal test channel for subsequent spatial analysis.

[0069] S317, the main controller calculates the Euclidean distance between the abnormal test channels according to the two-dimensional physical position coordinates; Specifically, the main controller pairs all abnormal test channels and calculates the Euclidean distance between each pair of abnormal test channels, where the Euclidean distance refers to the straight-line distance between two points, which is calculated by taking the square root of the square of the coordinate difference. The formula for calculating the Euclidean distance is: √[(x1-x2)²+(y1-y2)²], where (x1, y1) and (x2, y2) are the two-dimensional physical position coordinates of the two abnormal test channels. The main controller generates a distance matrix to store the Euclidean distances between all abnormal test channels, providing data support for subsequent distribution feature analysis.

[0070] S318, when the number of abnormal test channels whose Euclidean distance is less than a preset distance threshold exceeds a preset number threshold, the main controller determines that the abnormal test channels present a cluster distribution; Among them, the preset distance threshold refers to the standard value used to determine the approximate distance between abnormal test channels; the preset number threshold refers to the minimum number of abnormal test channels for determining the cluster distribution phenomenon; and the cluster distribution indicates that the abnormal test channels are densely clustered in space.

[0071] Specifically, first, the main controller sets the judgment criteria, such as the preset distance threshold may be set to 1.5 times the standard channel spacing, and the preset number threshold may be set to 3 or more. Then, the main controller checks the distance matrix and counts the number of channel pairs whose Euclidean distance is less than the preset distance threshold. If there is a tight group formed by multiple abnormal test channels, and the number of channels in the group exceeds the preset number threshold, the main controller determines that a cluster distribution phenomenon has occurred. Cluster distribution may indicate that there are systemic problems in a certain area, such as uneven heat dissipation, unstable power supply, etc.

[0072] S319. The main controller issues an early warning to the administrator.

[0073] Specifically, the main controller generates detailed warning information, including key information such as the specific location of the abnormal test channel, cluster feature description, abnormal parameter values, etc. Warnings can be sent to administrators through multiple channels, such as consoles, mobile phone text messages, emails, etc., to ensure that the information can be delivered in a timely manner. At the same time, warnings may trigger automated response measures, such as reducing the overall test load in the relevant area.

[0074] By adopting the above technical solution and introducing a solid-state drive importance grading mechanism, the sub-controller can adaptively adjust the channel isolation time according to the importance of the abnormal solid-state drive. For abnormal solid-state drives with higher importance, the sub-controller will use a longer channel isolation time for full observation and processing, and for abnormal solid-state drives with lower importance, the sub-controller will use a shorter channel isolation time. This differentiated isolation strategy ensures that key products receive sufficient abnormal processing time and avoids excessive isolation that leads to reduced test efficiency.

[0075] By adopting the above technical solution, the main controller calculates the Euclidean distance between abnormal test channels based on the two-dimensional physical position coordinates of the abnormal test channels, thereby identifying the spatial distribution characteristics of the abnormal test channels. When the abnormal test channels are clustered, the main controller will promptly issue an early warning to the administrator. This spatial clustering analysis method can help quickly discover possible systemic problems, such as uneven heat dissipation and unstable power supply, and help administrators take targeted solutions.

[0076] The following describes the test system in the embodiment of the present invention from the perspective of hardware processing. Figure 4 , is a schematic diagram of a physical device structure of a test system in an embodiment of the present application.

[0077] It should be noted that Figure 4 The structure of the test system shown is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present invention.

[0078] like Figure 4As shown, the test system includes a central processing unit (CPU) 401, which can perform various appropriate actions and processes according to the program stored in the read-only memory (ROM) 402 or the program loaded from the storage part 408 to the random access memory (RAM) 403, such as executing the method described in the above embodiment. In RAM 403, various programs and data required for system operation are also stored. CPU 401, ROM 402 and RAM 403 are connected to each other through bus 404. Input / output (I / O) interface 405 is also connected to bus 404.

[0079] The following components are connected to the I / O interface 405: an input section 406 including an audio input device, a button switch, etc.; an output section 407 including a liquid crystal display (LCD) and an audio output device, an indicator light, etc.; a storage section 408 including a hard disk, etc.; and a communication section 409 including a network interface card such as a LAN (Local Area Network) card, a modem, etc. The communication section 409 performs communication processing via a network such as the Internet. A drive 410 is also connected to the I / O interface 405 as needed. A removable medium 411, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc., is installed on the drive 410 as needed so that a computer program read therefrom is installed into the storage section 408 as needed.

[0080] In particular, according to an embodiment of the present invention, the process described above with reference to the flowchart can be implemented as a computer software program. For example, an embodiment of the present invention includes a computer program product, which includes a computer program carried on a computer-readable medium, and the computer program includes a computer program for executing the method shown in the flowchart. In such an embodiment, the computer program can be downloaded and installed from a network through the communication part 409, and / or installed from a removable medium 411. When the computer program is executed by the central processing unit (CPU) 401, various functions defined in the present invention are performed.

[0081] It should be noted that specific examples of computer-readable storage media may include, but are not limited to: an electrical connection with one or more wires, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM), a flash memory, an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In the present invention, a computer-readable storage medium may be any tangible medium containing or storing a program that may be used by or in combination with an instruction execution system, apparatus, or device.

[0082] The flowcharts and block diagrams in the accompanying drawings illustrate the possible architecture, functions and operations of the systems, methods and computer program products according to various embodiments of the present invention. Each box in the flowchart or block diagram may represent a module, a program segment, or a part of a code, and the above-mentioned module, program segment, or a part of a code contains one or more executable instructions for implementing the specified logical functions. It should also be noted that in some alternative implementations, the functions marked in the box may also occur in an order different from that marked in the accompanying drawings.

[0083] Specifically, the test system of this embodiment includes a processor and a memory. The memory stores a computer program. When the computer program is executed by the processor, the multi-channel parallel test method of the solid state drive provided in the above embodiment is implemented.

[0084] As another aspect, the present invention further provides a computer-readable storage medium, which may be included in the test system described in the above embodiment; or may exist independently without being assembled into the test system. The above storage medium carries one or more computer programs, and when the above one or more computer programs are executed by a processor of the test system, the test system implements the multi-channel parallel test method for solid-state hard disks provided in the above embodiment.

[0085] As described above, the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

[0086] As used in the above embodiments, the term "when..." may be interpreted to mean "if..." or "after..." or "in response to determining..." or "in response to detecting...", depending on the context. Similarly, the phrases "upon determining..." or "if (the stated condition or event) is detected" may be interpreted to mean "if determining..." or "in response to determining..." or "upon detecting (the stated condition or event)" or "in response to detecting (the stated condition or event)", depending on the context.

[0087] Those skilled in the art can understand that to implement all or part of the processes in the above-mentioned embodiments, the processes can be completed by computer programs to instruct related hardware, and the programs can be stored in computer-readable storage media. When the programs are executed, they can include the processes of the above-mentioned method embodiments. The aforementioned storage media include: ROM or random access memory RAM, magnetic disk or optical disk and other media that can store program codes.

Claims

1. A multi-channel parallel testing method for a solid state drive, characterized in that: Applied to a test system, the test system includes a main controller, a plurality of sub-controllers, a plurality of test channels and a plurality of solid-state hard disks, the main controller is connected to the sub-controllers respectively, the sub-controllers are connected to the test channels, the test channels are connected to the solid-state hard disks, the number of the sub-controllers is equal to the number of the test channels, the number of the test channels is equal to the number of the solid-state hard disks, and the method includes: After receiving the test instruction sent by the main controller, the sub-controller obtains the reading speed and writing speed of the solid state drive; The sub-controller determines the test intensity corresponding to the solid-state hard disk according to the read speed, the write speed and a preset performance indicator-test intensity correspondence table, wherein the performance indicator-test intensity correspondence table includes test intensities corresponding to different read speeds and different write speeds; After sending the read and write test tasks of the test intensity to the solid state drive, the sub-controller monitors the read and write speed, read and write response time and read and write error rate of the test channel; When the read / write speed is lower than a preset speed threshold, the read / write response time exceeds a preset time threshold and / or the read / write error rate exceeds a preset error rate threshold, the main controller sends a channel isolation instruction to the sub-controller, and the channel isolation instruction is used to indicate that an abnormal test channel is isolated from a normal test channel, and the abnormal test channel is used to indicate a test channel whose read / write speed is lower than a preset speed threshold, whose read / write response time exceeds a preset time threshold and / or whose read / write error rate exceeds a preset error rate threshold, and the normal test channel is used to indicate a test channel whose read / write speed exceeds a preset speed threshold, whose read / write response time is lower than a preset time threshold and / or whose read / write error rate is lower than a preset error rate threshold.

2. The method according to claim 1, characterized in that: The sub-controller determines the test intensity corresponding to the solid-state hard disk according to the read speed, the write speed and a preset performance indicator-test intensity correspondence table, wherein the performance indicator-test intensity correspondence table includes test intensities corresponding to different read speeds and different write speeds, specifically including: The sub-controller matches the read speed and the write speed with the performance indicator-test intensity correspondence table to obtain the test intensity; If the read speed and the write speed cannot match the performance indicator-test intensity correspondence table, the sub-controller determines a preset read speed with the smallest difference from the read speed, a first test intensity corresponding to the preset read speed, a preset write speed with the smallest difference from the write speed, and a second test intensity corresponding to the preset write speed; The sub-controller determines the test intensity according to the read speed, the preset read speed, the first test intensity, the write speed, the preset read speed, and the second test intensity.

3. The method according to claim 1, characterized in that After the sub-controller sends the read and write test task of the test intensity to the solid state drive, and monitors the read and write speed, read and write response time, and read and write error rate of the test channel, the method further includes: The sub-controller determines a read / write speed variation curve, a read / write response time variation curve, and a read / write error rate variation curve according to the read / write speed, the read / write response time, and the read / write error rate of the solid state hard disk in a first preset time period; Based on the read / write speed variation curve, the read / write response time variation curve, and the read / write error rate variation curve, the sub-controller determines the health status of the solid state drive.

4. The method according to claim 1, characterized in that After the step of the main controller sending a channel isolation instruction to the sub-controller when the read / write speed is lower than a preset speed threshold, the read / write response time exceeds a preset time threshold, and / or the read / write error rate exceeds a preset error rate threshold, the method further includes: The sub-controller determines the importance of the abnormal solid-state hard disk according to a preset level table and the label of the abnormal solid-state hard disk, wherein the preset level table includes the importance corresponding to the label of the solid-state hard disk; The sub-controller determines the channel isolation duration according to the importance of the abnormal solid state hard disk, and the higher the importance, the longer the channel isolation duration; The sub-controller stops sending the read-write test task to the abnormal solid-state hard disk within the channel isolation time.

5. The method according to claim 1, characterized in that After the step of the main controller sending a channel isolation instruction to the sub-controller when the read / write speed is lower than a preset speed threshold, the read / write response time exceeds a preset time threshold, and / or the read / write error rate exceeds a preset error rate threshold, the method further includes: The main controller determines a test channel adjacent to the abnormal test channel as an adjacent test channel; The main controller acquires temperature data and current data of the adjacent test channels; If the temperature data exceeds a preset temperature range or the current data exceeds a preset current range, the main controller reduces the test intensity of the adjacent test channel by a preset percentage.

6. The method according to claim 5, characterized in that After the step of reducing the test intensity of the adjacent test channel by a preset percentage when the temperature data exceeds a preset temperature threshold or the current data exceeds a preset current threshold, the method further includes: Within the second preset time after reducing the test intensity, if the temperature data of the adjacent test channel is within the preset temperature range and the current data is within the preset current range, the main controller restores the test intensity of the adjacent test channel to the original test intensity at a preset speed.

7. The method according to claim 1, characterized in that The method further comprises: The main controller determines the two-dimensional physical position coordinates of all abnormal test channels; According to the two-dimensional physical position coordinates, the main controller calculates the Euclidean distance between the abnormal test channels; When the number of abnormal test channels whose Euclidean distance is less than a preset distance threshold exceeds a preset number threshold, the main controller determines that the abnormal test channels present a cluster distribution; The main controller issues an early warning to the administrator.

8. A testing system, characterized in that: The test system comprises: one or more processors and a memory; the memory is coupled to the one or more processors, the memory is used to store computer program code, the computer program code comprises computer instructions, and the one or more processors call the computer instructions so that the test system executes the method as described in any one of claims 1-7.

9. A computer-readable storage medium comprising instructions, characterized in that: When the instructions are executed on a test system, the test system is caused to execute the method according to any one of claims 1 to 7.

10. A computer program product, characterized in that When the computer program product is run on a test system, the test system is caused to execute the method according to any one of claims 1 to 7.

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