Space environment radiation detection method and related equipment

Abstract

The invention discloses a space environment radiation detection method and related equipment, and relates to the technical field of radiation detection, and the method comprises the steps: obtaining a target image collected for a space environment through a complementary metal oxide semiconductor sensor; feature extraction is carried out on the target image to obtain a first environment feature of the target image, and the first environment feature comprises a dark signal feature, a photosensitive range feature and an image parameter degradation feature of the target image; and based on a preset mapping relationship, determining the irradiation intensity of the space environment according to the first environment feature. According to the application, the complementary metal oxide semiconductor sensor is adopted to collect the radiation data, extract the first environment characteristic and determine the radiation intensity based on the preset mapping relation, so that the cost of radiation data collection equipment can be reduced, the load of a spacecraft can be reduced, and the radiation intensity can be accurately determined.

Description

Technical Field

[0001] The present application relates to the field of radiation detection technology, and more specifically, to a space environment radiation detection method and related equipment. Background Art

[0002] With the continuous development of space technology, space environment radiation detection plays a vital role in the fields of spacecraft design and space environment monitoring. The measurement and analysis of space radiation is of great significance for the study of cosmic background radiation, the development of aerospace engineering and space radiation environment engineering, the effect analysis of aerospace activities and reliability assurance. However, traditional space environment radiation detection methods often rely on crystal sensors, and their high manufacturing costs limit the large-scale deployment of radiation monitoring equipment, resulting in limited coverage and data collection capabilities of space radiation environment monitoring. In addition, crystal sensors are large in size and heavy in weight, which is not conducive to the integrated design of spacecraft and affects the flexibility of spacecraft design.

[0003] In the related art, crystal sensors are usually used for data collection for space environment radiation detection, but this method has problems such as high manufacturing cost, large equipment size, and heavy weight. This traditional detection method fails to fully consider the complexity of the space environment and the fluctuation of sensor performance, resulting in insufficient stability of the detection results, which in turn affects the accurate assessment of the radiation status of the space environment. Especially in the stage of spacecraft design and space environment monitoring, this limitation may lead to a large deviation between the design goals and the actual monitoring results. In other words, there are technical problems in the related art for space environment radiation detection methods such as high cost, high integration difficulty, and low detection stability. Summary of the invention

[0004] A series of simplified concepts are introduced in the summary of the invention, which will be further described in detail in the detailed description. The summary of the invention of this application does not mean to attempt to define the key features and essential technical features of the technical solution claimed for protection, nor does it mean to attempt to determine the scope of protection of the technical solution claimed for protection.

[0005] The space environment radiation detection method and related devices provided in the present application can collect radiation data, extract the first environmental characteristics and determine the radiation intensity based on a preset mapping relationship by adopting a complementary metal oxide semiconductor sensor, thereby reducing the cost of radiation data collection equipment, alleviating the spacecraft load, and accurately determining the radiation intensity.

[0006] In a first aspect, the present application provides a method for detecting radiation in a space environment, comprising: acquiring a target image captured for a space environment through a complementary metal oxide semiconductor sensor; performing feature extraction on the target image to obtain a first environmental feature of the target image, wherein the first environmental feature includes a dark signal feature, a photosensitive range feature, and an image parameter degradation feature of the target image; and determining the irradiation intensity of the space environment according to the first environmental feature based on a preset mapping relationship.

[0007] In a feasible implementation, after determining the radiation intensity of the space environment according to the first environmental characteristics based on a preset mapping relationship, the space environment radiation detection method further includes: performing single-particle effect detection on the target device to obtain the number of single-particle flips within a target time period; determining the radiation impact index of the target device based on the number of single-particle flips and the radiation intensity.

[0008] In a feasible implementation, the single-particle effect detection is performed on the target device to obtain the number of single-particle flips within the target time period, including: performing a cyclic redundancy check on the single-particle data of the target device at a preset period to obtain a check error record; parsing the check error record to obtain the number of single-particle flips within each of the preset periods; and accumulating the number of single-particle flips of the preset periods within the target time period to obtain the number of single-particle flips within the target time period.

[0009] In a feasible implementation, the space environment radiation detection method further includes: performing working state detection on the target device to obtain the working state within the target time period; determining the radiation resistance index of the target device based on the number of single particle flips, the radiation intensity and the working state.

[0010] In a feasible embodiment, before acquiring a target image captured for a space environment through a complementary metal oxide semiconductor sensor, the space environment radiation detection method further includes: irradiating the complementary metal oxide semiconductor sensor after front-end shielding through a ground radiation source with a preset irradiation intensity to obtain a sample image corresponding to the preset irradiation intensity; performing feature extraction on the sample image to obtain a second environmental feature of the sample image, wherein the second environmental feature includes a dark signal feature, a photosensitivity range feature, and an image parameter degradation feature of the sample image; and establishing the preset mapping relationship according to the preset irradiation intensity and the second environmental feature.

[0011] In a feasible implementation, the extracting features of the target image to obtain the first environmental feature of the target image includes: extracting features of the target image through a feature extraction model in a field programmable gate array chip to obtain the first environmental feature of the target image.

[0012] In a feasible implementation, after determining the irradiation intensity of the space environment according to the first environmental feature based on a preset mapping relationship, the space environment radiation detection method further includes: releasing the storage space allocated to the target image and storing the irradiation intensity.

[0013] In the second aspect, the present application also provides a space environment radiation detection device, including: an image acquisition unit, used to acquire a target image collected for a space environment through a complementary metal oxide semiconductor sensor; a feature extraction unit, used to extract features from the target image to obtain a first environmental feature of the target image, wherein the first environmental feature includes a dark signal feature, a sensitive range feature, and an image parameter degradation feature of the target image; an intensity determination unit, used to determine the irradiation intensity of the space environment according to the first environmental feature based on a preset mapping relationship.

[0014] In a third aspect, the present application further provides an electronic device, comprising: a memory and a processor, wherein the processor is used to implement the steps of the space environment radiation detection method described in the first aspect when executing a computer program stored in the memory.

[0015] In a fourth aspect, the present application further provides a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the space environment radiation detection method described in the first aspect.

[0016] In a fifth aspect, the present application also provides a computer program product, including a computer program or computer executable instructions, which, when executed by a processor, implements the space environment radiation detection method provided in an embodiment of the present application.

[0017] In summary, the present application adopts complementary metal oxide semiconductor sensors to replace traditional crystal sensors for radiation data collection, which significantly reduces the manufacturing cost of radiation data collection equipment, making it possible to deploy radiation monitoring equipment on a large scale in medium and low orbit spacecraft, thereby improving the coverage and data collection capabilities of space radiation environment monitoring, and complementary metal oxide semiconductor sensors are small in size and light in weight, which are easy to integrate into spacecraft, helping to reduce the load of spacecraft and improve the flexibility of spacecraft design; by extracting features of the target image, dark signal features, photosensitive range features and image parameter degradation features are obtained, which can fully reflect the radiation conditions of the space environment, and based on these features, the irradiation intensity of the space environment can be more accurately determined; by using a preset mapping relationship, the image features are corresponded to the irradiation intensity, which effectively reduces the influence of environmental factors and sensor performance fluctuations on the detection results, and improves the detection stability. In summary, the space environment radiation detection method provided by the present application can reduce the cost of radiation data collection equipment, reduce the load of spacecraft, and accurately determine the irradiation intensity by using complementary metal oxide semiconductor sensors for radiation data collection, extraction of the first environmental features and determination of the irradiation intensity based on the preset mapping relationship. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present specification. Also, the same reference symbols are used throughout the accompanying drawings to represent the same components. In the accompanying drawings:

[0019] Figure 1 A schematic diagram of a flow chart of a space environment radiation detection method provided in an embodiment of the present application;

[0020] Figure 2 A schematic diagram of the structure of a space environment radiation detection device provided in an embodiment of the present application;

[0021] Figure 3 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0022] The terms "first", "second", "third", "fourth", etc. (if any) in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, rather than to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable where appropriate, so that the embodiments described herein can be implemented in an order other than that illustrated or described herein. In addition, the terms "is" and "has" and any variations thereof involved in the present application are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device comprising a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0023] The term "module" or "unit" in this application refers to a computer program or a part of a computer program that has a predetermined function and works together with other related parts to achieve a predetermined goal, and can be implemented in whole or in part by using software, hardware (such as processing circuits or memories) or a combination thereof. Similarly, a processor (or multiple processors or memories) can be used to implement one or more modules or units. In addition, each module or unit can be part of an overall module or unit that includes the function of the module or unit.

[0024] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. In the following description, it is related to "some embodiments", which describes a subset of all possible embodiments, but it can be understood that "some embodiments" can be the same subset or different subsets of all possible embodiments, and can be combined with each other without conflict.

[0025] See also Figure 1 , Figure 1 1 is a flow chart of a space environment radiation detection method provided by an embodiment of the present application. The method may specifically include the following steps 101 to 103:

[0026] Step 101, acquiring a target image collected for a space environment through a complementary metal oxide semiconductor sensor;

[0027] Specifically, complementary metal oxide semiconductor (CMOS) is an integrated circuit manufacturing technology that uses complementary N-type and P-type metal oxide semiconductor transistors to implement logic gates and other circuits; complementary metal oxide semiconductor sensors (CMOS sensors) are devices that convert optical signals into electrical signals. Compared with traditional charge coupled device (CCD) sensors, CMOS sensors have the advantages of lower cost, lower power consumption, faster reading speed, and higher integration. The space environment refers to the environment outside the Earth's atmosphere, including low Earth orbit (LEO), medium Earth orbit (MEO), geosynchronous orbit (GEO) and other deep space environments; the space environment has the characteristics of high vacuum, extreme temperature changes, cosmic rays and solar radiation, which may cause radiation damage to the electronic devices of spacecraft. The target image refers to the image data in the space environment captured by the CMOS sensor. These image data contain radiation information and can be used for subsequent analysis and processing.

[0028] For example, a complementary metal oxide semiconductor (CMOS) sensor can be deployed on a spacecraft or space exploration equipment to capture radiation data in the space environment. The CMOS sensor receives radiation energy in the space environment through its photosensitive element and converts it into an electrical signal to generate a target image. The target image contains radiation information of the space environment, providing basic data for subsequent feature extraction and radiation intensity determination.

[0029] Through the implementation of step 101, complementary metal oxide semiconductor sensors are used to replace traditional crystal sensors for collecting radiation data, which significantly reduces the manufacturing cost of radiation data collection equipment. This makes it possible to deploy radiation monitoring equipment on a large scale in medium and low orbit spacecraft, thereby improving the coverage and data collection capabilities of space radiation environment monitoring. In addition, complementary metal oxide semiconductor sensors are small in size and light in weight, and are easy to integrate into spacecraft, which helps to reduce the load of the spacecraft and improve the flexibility of spacecraft design.

[0030] Step 102, extracting features of the target image to obtain first environmental features of the target image, wherein the first environmental features may include dark signal features, photosensitive range features, and image parameter degradation features of the target image;

[0031] Specifically, the first environmental feature refers to a series of features extracted from the target image, which can reflect the impact of the space environment on the image sensor. The first environmental feature is the key information for analyzing the space radiation environment, which is used to subsequently determine parameters such as irradiation intensity. Dark signal usually refers to the signal generated by the CMOS sensor under no light or very low light conditions. This signal is mainly generated by the thermal noise and dark current of the sensor itself; the dark signal feature is the specific value or pattern of the dark signal, which can be used as an indicator of sensor performance and radiation impact. For example, the intensity and distribution of the dark signal may change due to radiation damage. Sensitivity range refers to the range of light intensity that the image sensor can effectively respond to, usually expressed as the dynamic range, that is, the ratio of the darkest detectable signal to the brightest unsaturated signal; the sensitivity range feature reflects the sensor's responsiveness under different lighting conditions. In the space environment, radiation may change the sensor's photosensitivity characteristics and affect its dynamic range. Image parameter degradation refers to the decrease in image quality due to radiation or other factors, which can include changes in image noise level, contrast, resolution and other parameters. Image parameter degradation features specifically describe the degree and pattern of image parameter degradation. For example, radiation may cause the sensor to generate more noise or reduce the contrast of the image. These changes can be extracted and analyzed as features.

[0032] Through the implementation of step 102, by extracting features from the target image, dark signal features, photosensitivity range features and image parameter degradation features are obtained. These features can fully reflect the radiation conditions of the space environment. Based on these features, the radiation intensity of the space environment can be determined more accurately.

[0033] Step 103, determining the radiation intensity of the space environment according to the first environmental feature based on a preset mapping relationship;

[0034] Specifically, the mapping relationship is a mathematical or logical correspondence that converts a set of inputs (in the embodiment of the present application, the "first environmental characteristics") into a set of outputs (i.e., "irradiance"); the preset mapping relationship can be obtained through training of a machine learning model or a deep learning model, or a mathematical formula established by an expert based on known conditions and physical laws. Irradiance refers to the radiation energy received per unit area, usually expressed in terms of power per unit area (such as watts per square meter, W / m 2 ) is used to represent it; in a space environment, radiation intensity can come from solar radiation, cosmic rays, or other high-energy particles.

[0035] Exemplarily, first, a preset mapping relationship can be obtained, which defines the corresponding relationship between different environmental characteristic parameters and irradiation intensity; then, using this preset mapping relationship, the obtained first environmental characteristic parameter is converted into a corresponding irradiation intensity value.

[0036] By implementing step 103, a preset mapping relationship is adopted to correspond the image features to the irradiation intensity, thereby effectively reducing the impact of environmental factors and sensor performance fluctuations on the detection results and improving the detection stability.

[0037] In summary, the embodiment of the present application adopts complementary metal oxide semiconductor sensors to replace traditional crystal sensors for radiation data collection, which significantly reduces the manufacturing cost of radiation data collection equipment, making it possible to deploy radiation monitoring equipment on a large scale in medium and low orbit spacecraft, thereby improving the coverage and data collection capabilities of space radiation environment monitoring, and complementary metal oxide semiconductor sensors are small in size and light in weight, which are easy to integrate into spacecraft, helping to reduce the load of spacecraft and improve the flexibility of spacecraft design; by extracting features of the target image, dark signal features, photosensitive range features and image parameter degradation features are obtained, which can fully reflect the radiation conditions of the space environment, and based on these features, the irradiation intensity of the space environment can be more accurately determined; by using a preset mapping relationship, the image features are matched with the irradiation intensity, which effectively reduces the influence of environmental factors and sensor performance fluctuations on the detection results, and improves the detection stability. In summary, the space environment radiation detection method provided in the embodiment of the present application can reduce the cost of radiation data collection equipment, reduce the load of spacecraft, and accurately determine the irradiation intensity by using complementary metal oxide semiconductor sensors for radiation data collection, extraction of the first environmental features and determination of the irradiation intensity based on the preset mapping relationship.

[0038] In some embodiments, after step 103, the aforementioned space environment radiation detection method may further include: performing single particle effect detection on the target device to obtain the number of single particle flips within the target time period; and determining the radiation impact index of the target device according to the number of single particle flips and the radiation intensity.

[0039] Specifically, the target device refers to a specific electronic device that needs to be tested for radiation effects, usually an integrated circuit or semiconductor component operating in a space environment; the target device may include processors, memories, sensors, etc., which are susceptible to radiation in space applications, resulting in performance degradation or functional failure. Single Event Effect (SEE) refers to temporary or permanent failures that may be caused when a single high-energy particle (such as a proton, alpha particle, or heavy ion) in space radiation hits an electronic device; detecting single event effects usually involves monitoring the behavior of the device in a radiation environment to determine whether a single event upset (SEU), single event latch (SEL), or other types of single event effects have occurred. The target period refers to the specific time range for single event effect detection, which can be a few minutes, hours, or longer. Single Event Upset (SEU) refers to the phenomenon that a data bit in an electronic device flips (from 0 to 1 or from 1 to 0) due to the influence of a single high-energy particle; the number of single event upsets refers to the total number of single event upset events monitored within the target period, and this number can be used as an indicator for evaluating the radiation tolerance of the device. The radiation impact index is a quantitative indicator used to describe the degree of influence of radiation on the performance of the target device. By combining the number of single-particle upsets and radiation intensity, the radiation impact index of the target device, as well as its reliability and expected life in a specific space environment, can be more accurately evaluated.

[0040] For example, first, a single event effect test may be performed on the target device to monitor and record the number of single event upsets (SEUs) occurring within the target period; then, the radiation impact index of the target device may be calculated by a certain algorithm or model based on the recorded number of single event upsets and the radiation intensity determined in the previous step 103. This index may be a quantitative value that comprehensively reflects the performance stability or reliability of the target device under given radiation conditions.

[0041] Through the implementation of the above-mentioned embodiments, after determining the radiation intensity of the space environment, single-particle effect detection is performed on the target device to obtain the number of single-particle flips within the target time period, and the radiation impact index of the target device is determined based on the number of single-particle flips and the radiation intensity. This helps to evaluate the potential impact of radiation on the performance of the target device and provides important data support for the reliability and durability evaluation of the device.

[0042] In some embodiments, the aforementioned single-particle effect detection on the target device to obtain the number of single-particle flips within the target time period may include: performing a cyclic redundancy check on the single-particle data of the target device at a preset period to obtain a check error record; parsing the check error record to obtain the number of single-particle flips within each preset period; and accumulating the number of single-particle flips of the preset period within the target time period to obtain the number of single-particle flips within the target time period.

[0043] Specifically, the preset period refers to a preset time interval or operation cycle when performing a cyclic redundancy check (CRC); the preset period can be fixed, such as performing a check once per second, per minute, or per hour, depending on the detection requirements and the characteristics of the target device. Cyclic Redundancy Check (CRC) Cyclic Redundancy Check is a technology used to detect errors in data transmission or storage. It verifies the consistency of data by calculating the checksum of data (a value of a fixed length based on the data content). In the embodiment of the present application, CRC is used to detect whether the data stored in the target device is flipped due to a single particle effect. The check error record refers to the information of all check errors recorded during the cyclic redundancy check process. The check error record usually includes the timestamp of the error, the location of the error (such as the data address), and the nature of the error (such as a single particle flip). The number of single particle flips within a preset period refers to the number of single particle flip events obtained by analyzing the check error record in each preset period; the number of single particle flips within a target period refers to the result obtained by accumulating the number of single particle flips in all preset periods in the entire target period. The number of single particle flips within the target period provides an overall indicator for evaluating the degree of impact of the target device due to the single particle effect in a specific time period.

[0044] Through the implementation of the above embodiments, cyclic redundancy check is performed on single-particle data at a preset period, error records of the check are analyzed, and the number of single-particle flips in the target period is accumulated, so that accurate statistics of the number of single-particle flips can be performed, providing a reliable data basis for subsequent irradiation impact assessment.

[0045] In some embodiments, the aforementioned space environment radiation detection method may further include: performing working status detection on the target device to obtain the working status within the target time period; determining the radiation resistance index of the target device according to the number of single particle flips, radiation intensity and working status.

[0046] Specifically, working state detection refers to the process of monitoring the performance and function of the target device during operation. Working state detection may include monitoring the device's voltage, current, temperature, clock frequency, output signal and other parameters to evaluate whether the device is within the normal working range. Working state refers to the operating status of the target device at a specific time point or time period. The working state can be "normal", "abnormal", "standby", "sleep" and other states, which reflects whether the device can perform its functions according to the design requirements. Radiation resistance index refers to one or more indicators used to quantify the ability of the target device to maintain normal operation in a radiation environment. The radiation resistance index is usually determined based on the performance of the device in the radiation environment, such as the number of single-particle upsets, radiation intensity and the working state of the device. The radiation resistance index may include but is not limited to: single-particle upset rate (SEU rate), failure rate, tolerance dose, maximum time to failure (MTTF), etc., which can be used to evaluate the reliability and durability of the device in a radiation environment.

[0047] Exemplarily, first, the operating data of the target device can be collected in real time or periodically through the sensor or monitoring circuit set in the working status detection module. These data may include the power consumption, temperature, operating frequency, input and output signals, etc. of the device, which can reflect the working status of the device in different time periods. By analyzing these data, the working status of the target device in the target time period can be obtained; then, the number of single-particle flips, radiation intensity and working status can be used as input parameters and input into a pre-established radiation resistance evaluation model. The model can comprehensively evaluate the radiation resistance of the target device based on these parameters and output one or more radiation resistance indicators.

[0048] Through the implementation of the above embodiments, the working status of the target device is detected, and the radiation resistance index of the target device is determined according to the number of single-particle flips, radiation intensity and working status. Not only the direct impact of radiation on device performance is considered, but also the radiation resistance of the device under a specific working state is considered, which provides a more comprehensive evaluation basis for device selection and performance optimization.

[0049] In some embodiments, before step 101, the aforementioned space environment radiation detection method may further include: irradiating the complementary metal oxide semiconductor sensor after front-end shielding with a ground radiation source of a preset irradiation intensity to obtain a sample image corresponding to the preset irradiation intensity; performing feature extraction on the sample image to obtain a second environmental feature of the sample image, wherein the second environmental feature may include a dark signal feature, a photosensitivity range feature, and an image parameter degradation feature of the sample image; and establishing a preset mapping relationship according to the preset irradiation intensity and the second environmental feature.

[0050] Specifically, a ground radiation source with a preset irradiation intensity refers to a radioactive source used on the ground, whose irradiation intensity is preset and known. The ground radiation source can be used to simulate the radiation conditions in the space environment so as to test and calibrate the sensor in a laboratory environment. A complementary metal oxide semiconductor sensor after front-end shielding refers to a process in which the front end (i.e., the photosensitive surface) of a complementary metal oxide semiconductor (CMOS) sensor is partially shielded during an irradiation test. The shielding can be used to control the amount of radiation irradiated to the sensor and eliminate the interference of photons on quantitative measurements, thereby more accurately simulating and testing the sensor response under different irradiation intensities. A sample image refers to an image obtained by a CMOS sensor under specific irradiation conditions. The sample image is used for subsequent feature extraction and analysis to establish a relationship between radiation intensity and image features. The second environmental feature refers to a series of features extracted from the sample image, similar to the first environmental feature mentioned above, but they are obtained from the sample image irradiated by the ground radiation source. The second environmental feature includes dark signal features, photosensitive range features, and image parameter degradation features. These features are related to the irradiation intensity and are used to establish a preset mapping relationship.

[0051] Exemplarily, first, a complementary metal oxide semiconductor sensor after front-end shielding can be irradiated by a ground radiation source with a preset irradiation intensity, so as to obtain the complementary metal oxide semiconductor sensor under specific conditions as a benchmark for subsequent analysis; then, feature extraction is performed on the sample image obtained by the irradiation, so as to obtain the second environmental features of the sample image, and these second environmental features cover the dark signal features, photosensitivity range features and image parameter degradation features of the sample image, and together reflect the performance of the sensor under a specific irradiation intensity; finally, a preset mapping relationship can be established according to the preset irradiation intensity and the extracted second environmental features, and this relationship will be used in subsequent space environment radiation detection to correct or compensate for the performance differences of the sensor in actual applications.

[0052] Through the implementation of the above embodiments, the accuracy and reliability of the preset mapping relationship are ensured, providing a solid foundation for subsequent space environment radiation intensity detection.

[0053] In some embodiments, the aforementioned step 102 may include: extracting features from the target image through a feature extraction model in a field programmable gate array chip to obtain a first environmental feature of the target image.

[0054] Specifically, a field-programmable gate array chip (FPGA) is a semiconductor device that contains a large number of programmable logic units, memory units, and input / output (I / O) interfaces; the characteristic of FPGA is that it can be programmed by the user after manufacturing to implement specific logic functions, making FPGA very suitable for prototyping, rapid development, and flexible hardware configuration; in space environment radiation detection, FPGA can be used to process image data, execute complex algorithms, and respond to environmental changes in real time. A feature extraction model is an algorithm or calculation model used to extract useful information or features from raw data. In the embodiment of the present application, the feature extraction model is specifically used to extract features related to space environment radiation from the target image, such as dark signal features, photosensitivity range features, and image parameter degradation features.

[0055] Through the implementation of the above-mentioned embodiments, the high-speed parallel processing capability of the programmable gate array chip is utilized, the efficiency and accuracy of feature extraction are improved, thereby improving the performance of the entire space environment radiation detection method. During normal operation, the power consumption of the programmable gate array chip is usually no more than 10W. The low power consumption level will not bring excessive load to the satellite's energy and heat dissipation, and can support low-power normalized observation.

[0056] In some embodiments, after step 103, the aforementioned space environment radiation detection method may further include: releasing the storage space allocated to the target image, and storing the irradiation intensity.

[0057] Specifically, devices such as satellites or space probes usually have limited storage and computing capabilities. After completing the irradiance intensity detection of the target images, timely releasing the storage space allocated to these images can avoid data loss or system crash due to exhaustion of storage space.

[0058] Exemplarily, the operation of releasing storage space involves calling a specific memory management function or API to mark the memory block previously allocated to the target image as available, while storing the irradiance intensity data involves writing the detected irradiance intensity value to a specific file or database in a non-volatile storage device (such as a solid-state drive or flash memory card) for subsequent data analysis, scientific research, or abnormal event monitoring.

[0059] The implementation of the above-mentioned embodiments helps to save storage space while ensuring the long-term preservation and traceability of irradiation intensity data, which provides convenience for subsequent data analysis and application. It only needs to record irradiation intensity data and does not require large-capacity storage of target images. This can ensure that the space environment radiation detection method proposed in this application can be used for normalized detection.

[0060] Furthermore, as an implementation of the aforementioned method embodiment, the present application also provides a space environment radiation detection device for implementing the aforementioned method embodiment. The device embodiment corresponds to the aforementioned method embodiment. For ease of reading, the present space environment radiation detection device embodiment will no longer repeat the details of the aforementioned method embodiment one by one, but it should be clear that the device in the embodiment of the present application can correspond to and implement all the contents of the aforementioned method embodiment. Figure 2 As shown, the space environment radiation detection device 20 includes: an image acquisition unit 201, a feature extraction unit 202 and an intensity determination unit 203, wherein the image acquisition unit 201 is used to acquire a target image collected for the space environment through a complementary metal oxide semiconductor sensor; the feature extraction unit 202 is used to extract features from the aforementioned target image to obtain a first environmental feature of the target image, wherein the first environmental feature may include a dark signal feature, a photosensitivity range feature and an image parameter degradation feature of the target image; the intensity determination unit 203 is used to determine the irradiation intensity of the space environment according to the first environmental feature based on a preset mapping relationship.

[0061] In some embodiments, the intensity determination unit 203 is further used to perform single particle effect detection on the target device to obtain the number of single particle upsets within the target period; and determine the radiation impact index of the target device according to the number of single particle upsets and the radiation intensity.

[0062] In some embodiments, the strength determination unit 203 is further used to perform a cyclic redundancy check on the single-particle data of the target device at a preset period to obtain a check error record; parse the check error record to obtain the number of single-particle flips within each preset period; accumulate the number of single-particle flips of the preset period within the target time period to obtain the number of single-particle flips within the target time period.

[0063] In some embodiments, the intensity determination unit 203 is further used to detect the working state of the target device to obtain the working state within the target time period; and determine the radiation resistance index of the target device according to the number of single particle upsets, the radiation intensity and the working state.

[0064] In some embodiments, the space environment radiation detection device 20 also includes: a model training unit, which is used to irradiate the complementary metal oxide semiconductor sensor after front-end shielding through a ground radiation source with a preset irradiation intensity to obtain a sample image corresponding to the preset irradiation intensity; perform feature extraction on the sample image to obtain a second environmental feature of the sample image, wherein the second environmental feature includes a dark signal feature, a photosensitivity range feature, and an image parameter degradation feature of the sample image; and establish a preset mapping relationship based on the preset irradiation intensity and the second environmental feature.

[0065] In some embodiments, the feature extraction unit 202 is further configured to extract features from the target image through a feature extraction model in a field programmable gate array chip to obtain a first environmental feature of the target image.

[0066] In some embodiments, the space environment radiation detection device 20 further includes: a data storage unit, which is used to release the storage space allocated to the target image and store the radiation intensity.

[0067] The present application also provides a computer-readable storage medium, which stores computer-executable instructions or computer programs. When the computer-executable instructions or computer programs are executed by a processor, the processor will be caused to execute any step of the space environment radiation detection method provided in the present application.

[0068] In some embodiments, the computer-readable storage medium may be a memory such as RAM, read-only memory (ROM), flash memory, magnetic surface memory, optical disk, or compact disc read-only memory (CD-ROM); or it may be various devices including one or any combination of the above memories.

[0069] In some embodiments, computer executable instructions may be in the form of a program, software, software module, script or code, written in any form of programming language (including compiled or interpreted languages, or declarative or procedural languages), and may be deployed in any form, including as a stand-alone program or as a module, component, subroutine or other unit suitable for use in a computing environment.

[0070] In some embodiments, computer-executable instructions may, but need not, correspond to a file in a file system, may be stored as part of a file storing other programs or data, for example, in one or more scripts in a HyperText Markup Language (HTML) document, in a single file dedicated to the program in question, or in multiple coordinated files (e.g., files storing one or more modules, subroutines, or code portions).

[0071] In some embodiments, computer executable instructions may be deployed to be executed on one electronic device, or on multiple electronic devices located at one site, or on multiple electronic devices distributed at multiple sites and interconnected by a communication network.

[0072] like Figure 3As shown, the present application also provides an electronic device 30, including a memory 310, a processor 320, and a computer program 311 stored in the memory 310 and executable on the processor, and when the processor 320 executes the computer program 311, any step of the above-mentioned space environment radiation detection method is implemented.

[0073] The present application also provides a computer program product, which includes a computer program or a computer executable instruction, and the computer program or the computer executable instruction is stored in a computer-readable storage medium. The processor of the electronic device reads the computer program or the computer executable instruction from the computer-readable storage medium, and the processor executes the computer program or the computer executable instruction, so that the electronic device performs any step of the space environment radiation detection method described above in the present application.

[0074] The above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A method for detecting radiation in a space environment, characterized in that: include: Acquiring target images for space environment acquisition through complementary metal oxide semiconductor sensors; Performing feature extraction on the target image to obtain a first environmental feature of the target image, wherein the first environmental feature includes a dark signal feature, a photosensitive range feature, and an image parameter degradation feature of the target image; Based on a preset mapping relationship, the radiation intensity of the space environment is determined according to the first environmental characteristics.

2. The space environment radiation detection method according to claim 1, characterized in that: After determining the irradiation intensity of the space environment according to the first environmental feature based on the preset mapping relationship, the space environment radiation detection method further includes: Perform single-particle effect detection on the target device to obtain the number of single-particle upsets within the target period; An irradiation impact index of the target device is determined according to the number of single event upsets and the irradiation intensity.

3. The space environment radiation detection method according to claim 2, characterized in that: The single-particle effect detection is performed on the target device to obtain the number of single-particle upsets in the target time period, including: Performing a cyclic redundancy check on the single particle data of the target device at a preset period to obtain a check error record; Parsing the verification error record to obtain the number of single-particle upsets in each of the preset cycles; The number of single-particle upsets in the preset period within the target time period is accumulated to obtain the number of single-particle upsets in the target time period.

4. The space environment radiation detection method according to claim 2, characterized in that: The space environment radiation detection method further includes: Performing working state detection on the target device to obtain the working state within the target time period; The radiation resistance index of the target device is determined according to the number of single event upsets, the radiation intensity and the working state.

5. The space environment radiation detection method according to any one of claims 1 to 4, characterized in that: Before acquiring a target image collected for a space environment through a complementary metal oxide semiconductor sensor, the space environment radiation detection method further includes: The complementary metal oxide semiconductor sensor after front end shielding is irradiated by a ground radiation source with a preset irradiation intensity to obtain a sample image corresponding to the preset irradiation intensity; Performing feature extraction on the sample image to obtain a second environmental feature of the sample image, wherein the second environmental feature includes a dark signal feature, a photosensitive range feature, and an image parameter degradation feature of the sample image; The preset mapping relationship is established according to the preset radiation intensity and the second environmental characteristic.

6. The space environment radiation detection method according to any one of claims 1 to 4, characterized in that: The step of extracting features from the target image to obtain a first environmental feature of the target image includes: The feature extraction model in the field programmable gate array chip is used to extract the feature of the target image to obtain the first environmental feature of the target image.

7. The space environment radiation detection method according to any one of claims 1 to 4, characterized in that: After determining the irradiation intensity of the space environment according to the first environmental feature based on the preset mapping relationship, the space environment radiation detection method further includes: The storage space allocated to the target image is released, and the irradiance intensity is stored.

8. A space environment radiation detection device, characterized in that: include: An image acquisition unit, used for acquiring a target image collected for a space environment through a complementary metal oxide semiconductor sensor; A feature extraction unit, configured to extract features from the target image to obtain a first environmental feature of the target image, wherein the first environmental feature includes a dark signal feature, a photosensitive range feature, and an image parameter degradation feature of the target image; An intensity determination unit is used to determine the radiation intensity of the space environment according to the first environmental characteristics based on a preset mapping relationship.

9. An electronic device, comprising: A memory and a processor, wherein the processor is used to implement the steps of the space environment radiation detection method as described in any one of claims 1 to 7 when executing the computer program stored in the memory.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the space environment radiation detection method according to any one of claims 1 to 7 are implemented.

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