Photoelectric integrated test system and photoelectric test method

Abstract

The invention relates to the field of photoelectric testing, in particular to a photoelectric integrated testing system and a photoelectric testing method. Comprising a rack, a darkroom fixed to the top of the rack, a photoelectric test assembly installed on the inner wall of the darkroom, a bottom cover located on the inner side of the rack, a detection piece movably embedded in the concave position of the surface of the bottom cover and a clamping piece located on the surface of the detection piece. And the driving mechanism comprises a speed reducing motor mounted on the surface of the lower part of the rack. Through cooperation of the driving part, the positioning part and the switching part, under rotation of a single driving part, switching of the motion state of the detection disc can be realized through the switching part, so that automatic switching of different processes of photoelectric detection is realized, motion switching of the detection disc from autorotation to rising and autorotation again is met, and the detection efficiency is improved. The detection of the photoelectric element by the device is more convenient and efficient, driving is realized through a single driving unit, and the operation fixed fault of the device can be reduced.

Description

Technical Field

[0001] The invention relates to the field of photoelectric detection, in particular to a photoelectric integrated test system and a photoelectric test method. Background Art

[0002] The design principle of optoelectronic devices is based on the change of the propagation mode of guided light by the external field. It is also different from the optoelectronic devices used by people in the early days. Optoelectronic devices are the key and core components of optoelectronic technology. Optoelectronic components need to be tested in a strictly light-proof space during sampling. Existing test equipment often requires multiple drive units to cooperate during the switching of test procedures. The setting of multiple drive units can easily affect the various accuracies of optoelectronic components during the switching of procedures. At the same time, the damage of a single drive unit may affect the normal use of the entire test system, resulting in poor operating stability of the test system. Therefore, an optoelectronic integrated test system and a photoelectric test method are proposed. Summary of the invention

[0003] In view of the problem in the above-mentioned prior art that the operating stability of the test system is difficult to ensure, the present invention is proposed.

[0004] Therefore, an object of the present invention is to provide an optoelectronic integrated testing system.

[0005] In order to solve the above technical problems, the present invention provides the following technical solutions: comprising: a testing mechanism, including a frame, a darkroom fixed on the top of the frame, a photoelectric testing assembly installed on the inner wall of the darkroom, a bottom cover located on the inner side of the frame, a detection member movably embedded in a recessed position on the surface of the bottom cover, and a clamping member located on the surface of the detection member; and The driving mechanism includes a reduction motor installed on the lower surface of the frame, the reduction motor is connected to a driving member through a coupling, a conversion groove is left on the outside of the driving member, a positioning member is arranged on the outside of the conversion groove, the positioning member is fixed on the frame, and an adapter is also connected to the top of the driving member.

[0006] As a preferred solution of the optoelectronic integrated test system of the present invention, grooves matching with the frame are provided on both sides of the bottom cover.

[0007] As a preferred solution of the optoelectronic integrated test system of the present invention, the detection member comprises a detection disk movably arranged on the surface of the bottom cover, a driven head is integrally arranged at the center of the bottom surface of the detection disk, an induction spring is also arranged outside the driven head, and one end of the induction spring is fixed to the bottom surface of the detection disk; The driven head is arranged in a prism shape.

[0008] As a preferred solution of the optoelectronic integrated test system of the present invention, the clamping member includes a positioning plate fixedly arranged on the detection disk, a push plate is further arranged on the outer side of the positioning plate, and a support spring is arranged between the push plate and the positioning plate.

[0009] As a preferred solution of the optoelectronic integrated test system of the present invention, the driving member includes a driving disk connected to the reduction motor, the outer wall of the driving disk is integrally provided with a driving head, the outside of the driving disk is provided with a driving cylinder, and the inner wall of the driving cylinder is provided with a driving groove; The driving groove is arranged in a spiral and inclined manner, and the driving groove and the driving head are in sliding fit.

[0010] As a preferred solution of the optoelectronic integrated test system of the present invention, the conversion slot includes a first rotating slot arranged on the outer wall of the driving cylinder, one end of the first rotating slot is connected to a lifting slot, and one end of the lifting slot is connected to a second rotating slot.

[0011] As a preferred solution of the optoelectronic integrated test system of the present invention, the positioning member includes a vertical pole fixed on the frame, a positioning lever is movably sleeved on the outside of the vertical pole, and a limiting spring is also arranged between the positioning lever and the vertical pole.

[0012] As a preferred solution of the optoelectronic integrated test system of the present invention, wherein: the first rotating groove and the second rotating groove are both arranged in a spiral groove shape, and the projection length of the first rotating groove and the second rotating groove on the driving cylinder is equal to the circumference of the outer wall of the driving cylinder; The lifting slot is arranged vertically; The end of the positioning lever is movably embedded in the first rotating groove.

[0013] As a preferred solution of the optoelectronic integrated test system of the present invention, wherein: the adapter comprises a linkage disk movably arranged inside the bottom cover, a linkage opening is reserved at the center of the surface of the linkage disk, and a push edge is fixedly arranged on the outer edge of the surface of the linkage disk; The push edge has a wedge-shaped cross section, and the push edge cooperates with the push plate; The driven head extends into the linkage port, and the linkage port and the driven head are plug-fitted.

[0014] The object of the present invention is to provide a photoelectric testing method, comprising: The detection disk is driven to rotate by a driving member; Placing the photoelectric elements to be tested in the clamping members on the testing plate in sequence; The gravity change of the fully loaded test plate causes it to fall and cooperate with the adapter to clamp the photoelectric element. The bottom cover is raised by the driving member to close the darkroom, and the test plate is sent into the darkroom; By changing the motion state of the driving member, the detection disk is rotated again, so that the photoelectric test assembly contacts the photoelectric element in turn to complete the detection.

[0015] The beneficial effects of the optoelectronic integrated testing system and the optoelectronic testing method of the present invention are as follows: through the cooperation between the driving part, the positioning part and the adapter, under the rotation of a single driving part, the motion state of the detection disk can be changed through the adapter, thereby realizing automatic switching between different photoelectric detection processes, satisfying the motion switching of the detection disk from self-rotation to rising and then self-rotation, making the device's detection of photoelectric elements more convenient and efficient, and realizing driving through a single driving unit, which can reduce the fixed operating faults of the device, improve various accuracies during photoelectric element detection, and ensure stable detection operation of the device. At the same time, under the change of gravity of the detection disk, it can cooperate with the adapter to realize automatic clamping of the component to be detected, thereby ensuring the stability of the component during the test process. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other accompanying drawings can be obtained based on these accompanying drawings without paying creative work.

[0017] Figure 1 This is a schematic diagram of the overall structure of the optoelectronic integrated test system.

[0018] Figure 2 It is a partial cross-sectional structural schematic diagram of the optoelectronic integrated test system.

[0019] Figure 3 It is a schematic diagram of the structure of the detection component and the clamping component in the optoelectronic integrated test system.

[0020] Figure 4 This is a cross-sectional schematic diagram of the driver in the optoelectronic integrated test system.

[0021] Figure 5 It is a schematic diagram of the coordination structure of the positioning component and the driving component in the optoelectronic integrated test system.

[0022] Figure 6 This is a flow chart of the photoelectric testing method.

[0023] In the figure: 100, test mechanism; 101, frame; 102, darkroom; 103, photoelectric test assembly; 104, bottom cover; 104a, groove; 105, detection member; 105a, detection plate; 105b, driven head; 105c, induction spring; 106; clamping member; 106a, positioning plate; 106b, push plate; 106c, support spring; 200, driving mechanism; 201, reduction motor; 202, driving Part; 202a, driving disk; 202b, driving head; 202c, driving cylinder; 202d, driving slot; 203, conversion slot; 203a, first rotating slot; 203b, lifting slot; 203c, second rotating slot; 204, positioning part; 204a, vertical rod; 204b, positioning lever; 204c, limiting spring; 205, adapter; 205a, linkage disk; 205b, linkage port; 205c, push edge. DETAILED DESCRIPTION

[0024] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are described in detail below in conjunction with the accompanying drawings.

[0025] Example 1, reference Figure 1 to Figure 3 , which is the first embodiment of the present invention, provides an integrated optoelectronic testing system that can realize automatic switching of detection processes during the optoelectronic component detection process, and includes a testing mechanism 100 and a driving mechanism 200.

[0026] Specifically, the testing mechanism 100 includes a frame 101, a darkroom 102 is fixedly installed on the top of the frame 101, and a photoelectric testing component 103 for detecting photoelectric elements is installed on the inner wall of the darkroom 102. The photoelectric testing component 103 itself can change its posture to a certain extent to cooperate with the photoelectric elements, and a liftable bottom cover 104 is movably provided on the inner side of the frame 101, and a detection component 105 is movably embedded in a recessed part of the surface of the bottom cover 104, and a clamping component 106 for clamping and fixing the photoelectric element is provided in a ring array on the surface of the detection component 105.

[0027] Furthermore, grooves 104 a cooperating with the frame 101 are provided on both sides of the bottom cover 104 . The grooves 104 a can cooperate with the frame 101 , thereby realizing limiting guidance of the bottom cover 104 during movement, so that the bottom cover 104 can only be lifted and lowered along the frame 101 .

[0028] The detection member 105 includes a detection disk 105a movably arranged on the surface of the bottom cover 104, and a driven head 105b is integrally arranged at the center of the bottom surface of the detection disk 105a, and the driven head 105b is arranged in a prismatic shape. At the same time, a sensing spring 105c is also arranged on the outside of the driven head 105b, and one end of the sensing spring 105c is fixed to the bottom surface of the detection disk 105a. The sensing spring 105c can sense the overall weight of the detection disk 105a, so that when the photoelectric element to be detected is placed on the detection disk 105a, the sensing spring 105c can be contracted by the change of the overall weight of the detection disk 105a, so that the detection disk 105a is lowered, thereby facilitating the subsequent use of the detection disk 105a.

[0029] The clamping member 106 includes a positioning plate 106a fixedly disposed on the detection disk 105a. A push plate 106b is further disposed on the outer side of the positioning plate 106a. A supporting spring 106c is disposed between the push plate 106b and the positioning plate 106a. The lower end of the push plate 106b extends into the inner cavity of the bottom cover 104.

[0030] The driving mechanism 200 includes an adapter 205, which is movably embedded in the internal cavity of the bottom cover 104. The adapter 205 includes a linkage disk 205a movably set in the internal cavity of the bottom cover 104. A linkage port 205b is reserved at the center of the surface of the linkage disk 205a. The linkage port 205b and the driven head 105b are plug-in fit, and the shapes and sizes of the two are adapted. The lower end of the driven head 105b is always located inside the linkage port 205b, so that the linkage disk 205a and the detection disk 105a are always in a connected state. Therefore, under the cooperation of the two, the linkage disk 205a can rotate synchronously with the detection disk 105a, and a push edge 205c is also fixedly provided on the outer edge of the surface of the linkage disk 205a.

[0031] Preferably, the push edge 205c has a wedge-shaped cross-section, and the push edge 205c cooperates with the push plate 106b, so that when the photoelectric element to be tested is placed on the detection disk 105a, and the detection disk 105a as a whole moves downward due to the change in gravity, the push plate 106b can interact with the push edge 205c under contact, so that the push plate 106b can move toward the positioning plate 106a, thereby clamping the optical element to ensure the stability of the optical element during the detection process.

[0032] When in use, the detection disk 105a is rotated to place the optical elements in sequence between the positioning plate 106a and the push plate 106b on the detection disk 105a. As the optical elements are placed in sequence, after the placement is completed, the detection disk 105a completes the downward movement of the extrusion sensing spring 105c, and at the same time, the push plate 106b moves toward the positioning plate 106a under the action of the push edge 205c to complete the clamping and fixing of the optical elements. Then, the bottom cover 104 can be pushed to move upward, and the detection disk 105a is sent into the darkroom 102 while completing the closure of the darkroom 102. At this time, the optical element opposite to it can be detected by the photoelectric test component 103, and under the control of external power, the linkage disk 205a and the detection disk 105a are rotated synchronously, so that each optical element is opposite to the photoelectric test component 103 in sequence, so as to achieve the purpose of sequentially detecting multiple photoelectric elements.

[0033] In summary, through the gravity sensing setting of the detection plate 105a itself, after the photoelectric elements are placed, the gravity of the detection plate 105a changes and as the detection plate 105a falls, the adapter 205 and the clamping member 106 cooperate to achieve synchronous clamping of multiple photoelectric elements, thereby ensuring the stability of the photoelectric elements during the detection process.

[0034] Example 2, reference Figure 1 to Figure 5 , which is the second embodiment of the present invention. Different from the previous embodiment, this embodiment provides an integrated photoelectric testing system, which solves the problem that the photoelectric components are placed in the detection process and are inconvenient to switch automatically.

[0035] Specifically, the driving mechanism 200 includes a reduction motor 201 installed on the lower surface of the frame 101, the reduction motor 201 is connected to the driving member 202 through a coupling, a conversion groove 203 is left outside the driving member 202, a positioning member 204 is provided outside the conversion groove 203, the positioning member 204 is fixed on the frame 101, and the top of the driving member 202 is also connected to an adapter 205.

[0036] Furthermore, the driving member 202 includes a driving disk 202a connected to the reduction motor 201, the outer wall of the driving disk 202a is integrally provided with a driving head 202b, and the outside of the driving disk 202a is provided with a driving cylinder 202c, and the inner wall of the driving cylinder 202c is provided with a driving groove 202d that matches the driving head 202b, that is, the driving head 202b can slide inside the driving groove 202d.

[0037] The conversion groove 203 includes a first rotating groove 203a arranged on the outer wall of the driving cylinder 202c, one end of the first rotating groove 203a is connected to the lifting groove 203b, and one end of the lifting groove 203b is connected to the second rotating groove 203c.

[0038] The positioning member 204 includes a vertical rod 204a fixed on the frame 101, and a positioning lever 204b is movably sleeved on the outside of the vertical rod 204a, and the positioning lever 204b is located inside the starting end of the first rotating groove 203a. At the same time, a limiting spring 204c is also arranged between the positioning lever 204b and the vertical rod 204a. The limiting spring 204c can support the positioning lever 204b, and at the same time, the positioning lever 204b can be prevented from falling when it is located inside the lifting groove 203b, thereby affecting the normal lifting movement of the driving cylinder 202c.

[0039] Preferably, the driving groove 202d is arranged in a spirally inclined manner, and the driving groove 202d and the driving head 202b are slidably matched, so that when the driving cylinder 202c is in a rotationally locked state, as the driving disk 202a and the driving head 202b rotate, the driving groove 202d can be pushed by the driving head 202b, so that the driving cylinder 202c can perform a synchronous lifting and lowering movement during the rotation of the driving disk 202a, thereby meeting the need to lift the bottom cover 104 to close the darkroom 102.

[0040] The first rotating groove 203a and the second rotating groove 203c are both arranged in a spiral groove shape along the outer wall of the driving cylinder 202c, and the lifting groove 203b is arranged vertically. Through the movable arrangement of the positioning lever 204b on the vertical rod 204a, when the end of the positioning lever 204b is movably embedded in the first rotating groove 203a, the positioning lever 204b can slide inside the first rotating groove 203a. At this time, the driving cylinder 202c is not restricted in rotation, so that the driving cylinder 202c and the driving disk 202a can rotate synchronously. When the driving cylinder 202c rotates one circle, the positioning lever 204b moves relatively to the connection between the first rotating groove 203a and the lifting groove 203b, and Under the vertical setting of the descending groove 203b, with the help of the relative locking between the lifting groove 203b and the positioning lever 204b, the driving cylinder 202c is in a rotation locking state at this time, so that the movement state of the driving cylinder 202c at this time is transformed from rotation to lifting movement, that is, the lifting and lowering needs of the bottom cover 104 are met, and when the driving cylinder 202c rises to the highest point, the positioning lever 204b moves relatively to the connection between the lifting groove 203b and the second rotating groove 203c, and the rotation lock of the driving cylinder 202c is unlocked again with the help of the spiral setting of the second rotating groove 203c, which can meet the rotation needs of the driving cylinder 202c again, and realize the rotation detection of the components on the detection disk 105a.

[0041] When in use, the driving head 202b and the driving disk 202a rotate under the drive of the reduction motor 201, and the positioning lever 204b is located in the first rotating groove 203a. At this time, the driving cylinder 202c is in a state of unrestricted axial rotation, so that the driving head 202b does not have a relative displacement with the driving groove 202d, so that the driving cylinder 202c can rotate with the rotation of the driving disk 202a, and through the fixed connection between the linkage disk 205a and the driving cylinder 202c, combined with the synchronous rotation between the linkage disk 205a and the detection disk 105a, the driving cylinder 202c can directly drive the detection disk 105a to rotate. At this time, the detection disk 105a can automatically rotate when the photoelectric element is placed, so as to facilitate the placement of the elements one by one. After the driving cylinder 202c rotates one circle, the element placement is completed, and the positioning lever 204b is rotated from the first rotating groove 203a to the connection between it and the lifting groove 203b. As the head 202b continues to rotate, the driving cylinder 202c is restricted by the locking between the positioning lever 204b and the lifting groove 203b, so that a relative displacement occurs between the driving head 202b and the driving groove 202d, and under the spiral setting of the driving groove 202d, the driving cylinder 202c can be lifted and lowered with the rotation of the driving disk 202a, thereby the bottom cover 104 can be lifted up by the driving cylinder 202c, so that the detection disk 105a enters the darkroom 102 for detection. At this time, as the driving cylinder 202c moves, the positioning lever 204b moves relative to it and displaces to the connection between the second rotating groove 203c and the lifting groove 203b, that is, the rotation lock of the driving cylinder 202c is released. As the driving disk 202a continues to rotate, the driving cylinder 202c can be driven to continue to rotate, thereby realizing the sequential rotation detection of the photoelectric elements on the detection disk 105a. After the detection is completed, the motor is reversed to realize the lowering of the detection disk 105a and other operations.

[0042] In summary, through the cooperation between the driving member 202, the positioning member 204 and the adapter 205, under the rotation of the single driving member 202, the motion state of the detection disk 105a can be changed through the adapter 205, thereby realizing automatic switching between different photoelectric detection processes, making the device's detection of photoelectric elements more convenient and efficient, and realizing drive through a single driving unit can reduce fixed operating faults of the device and ensure stable detection operation of the device. Example 3, reference Figure 6 , which is the third embodiment of the present invention, provides a photoelectric testing method, the method comprising: S1, driving the detection plate to rotate through the driving member; S2, placing the photoelectric components to be tested in the clamping parts on the test plate in sequence; S3, through the change of gravity of the fully loaded test plate, it falls down and cooperates with the adapter to complete the clamping of the photoelectric element; S4, raising the bottom cover through the driving member to close the darkroom, and sending the test plate into the darkroom; S5. By changing the motion state of the driving member, the detection disk is rotated again, so that the photoelectric test assembly contacts the photoelectric element in turn to complete the detection.

[0043] The embodiment of the present invention provides a photoelectric testing method, and the principle of solving the technical problem by the method is similar to that of an integrated photoelectric testing system, so the implementation of the method can refer to the implementation of the system.

[0044] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solutions of the present invention may be modified or replaced by equivalents without departing from the spirit and scope of the technical solutions of the present invention, which should all be included in the scope of the claims of the present invention.

Claims

1. An optoelectronic integrated test system, characterized in that: include, A testing mechanism (100) comprises a frame (101), a darkroom (102) fixed to the top of the frame (101), a photoelectric testing assembly (103) mounted on the inner wall of the darkroom (102), a bottom cover (104) located on the inner side of the frame (101), a detection member (105) movably embedded in a recessed portion of the surface of the bottom cover (104), and a clamping member (106) located on the surface of the detection member (105); and, The driving mechanism (200) comprises a reduction motor (201) mounted on the lower surface of a frame (101); the reduction motor (201) is connected to a driving member (202) via a coupling; a conversion slot (203) is provided on the outside of the driving member (202); a positioning member (204) is provided on the outside of the conversion slot (203); the positioning member (204) is fixed on the frame (101); and a conversion member (205) is also connected to the top of the driving member (202).

2. The optoelectronic integrated test system according to claim 1, characterized in that: Grooves (104a) matching with the frame (101) are provided on both sides of the bottom cover (104).

3. The optoelectronic integrated test system according to claim 2, characterized in that: The detection member (105) comprises a detection disk (105a) movably arranged on the surface of the bottom cover (104); a driven head (105b) is integrally arranged at the center of the bottom surface of the detection disk (105a); an induction spring (105c) is also arranged outside the driven head (105b); one end of the induction spring (105c) is fixed to the bottom surface of the detection disk (105a); The driven head (105b) is arranged in a prism shape.

4. The optoelectronic integrated test system according to claim 3, characterized in that: The clamping member (106) comprises a positioning plate (106a) fixedly arranged on the detection plate (105a), a push plate (106b) is further arranged on the outer side of the positioning plate (106a), and a support spring (106c) is arranged between the push plate (106b) and the positioning plate (106a).

5. The optoelectronic integrated test system according to claim 4, characterized in that: The driving member (202) comprises a driving disk (202a) connected to the reduction motor (201); a driving head (202b) is integrally provided on the outer wall of the driving disk (202a); a driving cylinder (202c) is provided outside the driving disk (202a); and a driving groove (202d) is provided on the inner wall of the driving cylinder (202c); The driving groove (202d) is arranged in a spirally inclined manner, and the driving groove (202d) and the driving head (202b) are in sliding fit.

6. The optoelectronic integrated test system according to claim 5, characterized in that: The conversion groove (203) comprises a first rotating groove (203a) arranged on the outer wall of the driving cylinder (202c), one end of the first rotating groove (203a) is connected to a lifting groove (203b), and one end of the lifting groove (203b) is connected to a second rotating groove (203c).

7. The optoelectronic integrated test system according to claim 6, characterized in that: The positioning member (204) comprises a vertical rod (204a) fixed on the frame (101), a positioning lever (204b) is movably sleeved outside the vertical rod (204a), and a limiting spring (204c) is further provided between the positioning lever (204b) and the vertical rod (204a).

8. The optoelectronic integrated test system according to claim 7, characterized in that: The first rotating groove (203a) and the second rotating groove (203c) are both arranged in a spiral groove shape, and the projection lengths of the first rotating groove (203a) and the second rotating groove (203c) on the driving cylinder (202c) are equal to the circumference of the outer wall of the driving cylinder (202c); The lifting slot (203b) is arranged vertically; The end of the positioning lever (204b) is movably embedded in the first rotating groove (203a).

9. The optoelectronic integrated test system according to claim 8, characterized in that: The adapter (205) comprises a linkage disk (205a) movably arranged inside the bottom cover (104), a linkage opening (205b) being provided at the center of the surface of the linkage disk (205a), and a push edge (205c) being fixedly provided at the outer edge of the surface of the linkage disk (205a); The push edge (205c) has a wedge-shaped cross section, and the push edge (205c) cooperates with the push plate (106b); The driven head (105b) extends into the interior of the linkage port (205b), and the linkage port (205b) and the driven head (105b) are plug-fitted.

10. A photoelectric testing method, characterized in that: include: The detection disk is driven to rotate by a driving member; Placing the photoelectric elements to be tested in the clamping members on the testing plate in sequence; The gravity change of the fully loaded test plate causes it to fall and cooperate with the adapter to clamp the photoelectric element. The bottom cover is raised by the driving member to close the darkroom, and the test plate is sent into the darkroom; By changing the motion state of the driving member, the detection disk is rotated again, so that the photoelectric test assembly contacts the photoelectric element in turn to complete the detection.

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