Reliability test equipment for battery chip processing and method thereof

Abstract

The invention discloses reliability test equipment for battery chip processing and a method thereof, the reliability test equipment comprises a test equipment main body, a controller is fixedly mounted on the front surface of the test equipment main body, and a vibration test mechanism is fixedly connected to the top of the test equipment main body; the top of the vibration testing mechanism is provided with a high-temperature testing mechanism, the rear side of the testing equipment main body is fixedly connected with a lifting mechanism, and the lifting mechanism is fixedly connected with the high-temperature testing mechanism. The reliability testing device for battery chip processing has the advantage of high-efficiency testing, and solves the problems that the testing period of the battery chip is too long and the overall production efficiency of the battery chip is affected due to the fact that the high-temperature testing efficiency and the vibration testing efficiency of the battery chip are relatively low in the using process of the existing reliability testing device for battery chip processing.

Description

Technical Field

[0001] The present invention relates to the technical field of battery chips, and in particular to a reliability testing device and method for processing battery chips. Background Art

[0002] Battery chips refer to a type of integrated circuit used in electronic devices to manage and control battery performance. These chips play a core role in the battery management system, responsible for monitoring, controlling and protecting the battery to ensure its safe and efficient operation. The reliability test equipment for battery chip processing is mainly used to evaluate and ensure the performance and reliability of battery chips under various environmental conditions. This type of equipment can perform a variety of tests to simulate the various extreme conditions that battery chips may encounter throughout their service life. When testing battery chips, they will be subjected to high temperature tests and vibration tests. High temperature tests can evaluate whether the battery chips can work normally in high temperature environments without performance degradation or failure. This is especially important for equipment working in high temperature environments. Vibration tests can evaluate the structural strength and stability of battery chips when subjected to mechanical vibration. This helps ensure that battery chips are not damaged or fail due to vibration during transportation and use.

[0003] During use, the existing reliability testing equipment for battery chip processing has low efficiency in high temperature testing and vibration testing of battery chips, resulting in a too long test cycle for the battery chips, affecting the overall production efficiency of the battery chips. Summary of the invention

[0004] The purpose of the present invention is to provide a reliability testing device and method for battery chip processing, which has the advantage of efficient testing and solves the problem that the existing reliability testing equipment for battery chip processing has low efficiency in high temperature testing and vibration testing of battery chips during use, resulting in a long test cycle of the battery chip and affecting the overall production efficiency of the battery chip.

[0005] To achieve the above object, the present invention provides the following technical solution: A reliability test device for battery chip processing, comprising a test device body, a controller is fixedly installed on the front of the test device body, and a vibration test mechanism is fixedly connected to the top of the test device body;

[0006] A high temperature testing mechanism is arranged on the top of the vibration testing mechanism, and a lifting mechanism is fixedly connected to the rear side of the testing equipment body, and the lifting mechanism is fixedly connected to the high temperature testing mechanism.

[0007] As a preferred reliability testing equipment for battery chip processing of the present invention, the vibration testing mechanism includes a support seat, a placement plate is fixedly connected to the top of the support seat, a chip limiting tool and a clamp are fixedly connected to the top of the placement plate, a battery chip is installed inside the chip limiting tool, a clamp is threadedly connected to the clamp, the bottom of the clamp is movably connected to the top of the battery chip to fix it, and sockets are fixedly connected to the left and right sides of the placement plate.

[0008] As a preferred reliability testing equipment for battery chip processing of the present invention, vibration motors are fixedly installed on both left and right sides of the bottom of the support seat, springs are fixedly connected to the four corners of the bottom of the support seat, a connecting plate is fixedly connected to the bottom of the spring, support rods are fixedly connected to the four corners of the bottom of the connecting plate, the bottom of the support rod is fixedly connected to the top of the test equipment body, sliding rods are fixedly connected to the front and rear sides of the bottom of the support seat, and the sliding rods are movably connected to the connecting plate.

[0009] As a preferred reliability testing equipment for battery chip processing of the present invention, the high temperature testing mechanism includes a high temperature testing box, plugs for use with sockets are fixedly connected on the left and right sides of the high temperature testing box, a plurality of electric heating elements are fixedly installed on the top of the inner cavity of the high temperature testing box, a temperature sensor is fixedly installed on the right side of the high temperature testing box, and the detection end of the temperature sensor passes through the inner cavity of the high temperature testing box.

[0010] As a preferred reliability testing device for battery chip processing of the present invention, the high-temperature test box is fixedly connected with cooling components on both the front and rear sides, the front cooling component takes in air, and the rear cooling component discharges air.

[0011] As a preferred reliability testing equipment for battery chip processing of the present invention, the cooling component includes a sealing shell, one side of the sealing shell is connected to a first pipe, the other side of the sealing shell is connected to a second pipe, the second pipe is connected to a high-temperature test box, a fan is fixedly installed in the inner cavity of the first pipe, the output shaft of the fan is fixedly connected to fan blades, and the fan blades are located in the inner cavity of the first pipe.

[0012] As a preferred reliability testing equipment for battery chip processing of the present invention, the left and right sides of the inner cavity of the sealing shell are movably connected with sealing plates, one side of the sealing plate extends to the outside of the sealing shell and is fixedly connected with a cylinder, a fixing frame is fixedly installed on the cylinder, and the fixing frame is fixedly installed on the top of the sealing shell.

[0013] As a preferred reliability testing equipment for battery chip processing of the present invention, the lifting mechanism includes a bent rod, the bottom of the bent rod is fixedly connected to a connecting seat, the connecting seat is fixedly installed on the top of the high-temperature test box, the bottom of the bent rod is fixedly connected to a nut seat, the front side of the nut seat is movably connected to a frame, and the frame is fixedly installed on the rear side of the test equipment body.

[0014] As a preferred reliability testing device for battery chip processing of the present invention, a motor is fixedly connected to the bottom of the frame, a screw is fixedly connected to the output shaft of the motor, the screw is threadedly connected to a nut seat to drive it, and the top of the screw is rotatably connected to the frame.

[0015] A reliability testing method for battery chip processing comprises the following steps:

[0016] S1. Prepare the battery chip to be tested and place it in the chip limit fixture of the vibration test mechanism. Use the clamp on the fixture to fix the battery chip. Connect the electrical interface of the battery chip with the controller and power supply system to ensure that the current can pass smoothly during the test.

[0017] S2, vibration test, set the vibration frequency and amplitude through the controller, start the vibration motor, the vibration motor drives the support base to vibrate, the support base and the placement plate thereon will vibrate under the action of the spring, simulating the vibration environment that may be encountered during transportation or use. During the vibration of the support base, the slide bar is driven to slide inside the connecting plate, causing the support base to vibrate up and down. During the entire vibration test, the status of the battery chip is monitored through the controller, and any abnormal situation is recorded;

[0018] S3, high temperature test, close the vibration test mechanism, start the motor in the lifting mechanism through the controller, the motor drives the screw to rotate, pushes the nut seat to move downward, thereby driving the high temperature test box to move downward until its plug is connected with the socket on the placement plate, so that the high temperature test box covers the placement plate;

[0019] S4, start the high temperature test, set the target temperature in the high temperature test box through the controller, start the electric heating element to heat the air inside the high temperature test box, and at the same time, the temperature sensor monitors the temperature in the box in real time to ensure that the temperature remains within the preset range, so as to perform a high temperature test on the battery chip;

[0020] S5, high and low temperature conversion test. If a low temperature conversion test is required, the controller controls the fan and cylinder in the cooling component to move. The cylinder drives the blocking plate away from the inner cavity of the blocking shell, so that the second pipeline is connected to the first pipeline. The front fan drives the fan blades to rotate, and the external cold air is passed into the high temperature test box. The rear fan drives the fan blades to rotate, and the hot air inside the high temperature test box is extracted, so that the inside of the high temperature test box is quickly cooled down. When the temperature reaches the set temperature, the cooling component is closed to keep the inside of the high temperature test box at a low temperature for a period of time. Then the electric heating element continues to heat the inside of the high temperature test box to increase the temperature inside the high temperature test box, and the high and low temperature conversion test is performed;

[0021] S6. After the test is completed, the controller collects and records the test data, including vibration frequency, amplitude, temperature change curve, and information. The high-temperature test box is disconnected from the placement plate, and the high-temperature test box is lowered back to its original position through the lifting mechanism. Then the battery chip is taken out. Based on the collected data, the performance of the battery chip under vibration and high temperature conditions is analyzed to evaluate its reliability and performance.

[0022] Compared with the prior art, the present invention has the following beneficial effects:

[0023] 1. The present invention can simulate the vibration environment that the battery chip may encounter during transportation and actual use by setting up a vibration test mechanism, which is crucial for evaluating the performance and reliability of the battery chip under dynamic conditions. By accurately controlling the vibration frequency and amplitude of the vibration motor, the consistency and repeatability of the test conditions can be ensured, thereby improving the accuracy and reliability of the test results. The design of the chip limit tooling and fixture can firmly fix the battery chip to prevent displacement or damage during the vibration process, thereby ensuring the safety of the battery chip during the test. The controller can monitor the state of the battery chip during the vibration test in real time, record any abnormal conditions, and promptly discover potential problems. The vibration test mechanism is used in combination with the high temperature test mechanism to complete tests under various environmental conditions in the same device, thereby improving test efficiency and reducing equipment space occupation.

[0024] 2. The present invention heats the air inside the high-temperature test box by an electric heating element, which can simulate the working conditions of the battery chip in a high-temperature environment and evaluate its performance and stability under high-temperature conditions. Through the control of the cooling component, a rapid conversion from high temperature to low temperature can be achieved, simulating the ability of the battery chip to work in an environment with drastic temperature changes, and further verifying its temperature resistance. The temperature sensor monitors the temperature in the high-temperature test box in real time to ensure that the temperature remains within a preset range, thereby improving the accuracy and reliability of the test results. Multiple electric heating elements are distributed on the top of the inner cavity of the high-temperature test box to ensure that the temperature in the box is evenly distributed and avoid local overheating or overcooling. The opening and closing of the sealing plate is controlled by the fan and the cylinder to achieve rapid cooling inside the high-temperature test box. The front fan introduces cold air and the rear fan exhausts hot air to ensure the efficiency of the temperature conversion process. Through multiple high and low temperature cycle tests, the performance of the battery chip in a complex temperature environment is simulated, and its temperature resistance is comprehensively evaluated. The temperature parameters of the high-temperature test box can be conveniently set and controlled by the controller to achieve automated testing, reduce manual intervention, and improve test efficiency.

[0025] 3. The present invention can facilitate the rise and fall of the high-temperature test mechanism by setting a lifting mechanism. The high-temperature test mechanism is installed on the top of the vibration test mechanism. The motor drives the screw to rotate, pushing the nut seat to move downward, thereby driving the high-temperature test box to move downward until its plug is docked with the socket on the placement plate, so that the high-temperature test box covers the placement plate. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is a schematic diagram of the structure of the present invention;

[0027] Figure 2 The structure of the vibration test mechanism of the present invention is shown in FIG. Figure 1 ;

[0028] Figure 3 The structure of the vibration test mechanism of the present invention is shown in FIG. Figure 2 ;

[0029] Figure 4 The high temperature test mechanism structure of the present invention is shown in FIG. Figure 1 ;

[0030] Figure 5 The high temperature test mechanism structure of the present invention is shown in FIG. Figure 2 ;

[0031] Figure 6 This is an exploded view of the cooling component of the present invention;

[0032] Figure 7 It is a schematic diagram of the lifting mechanism structure of the present invention.

[0033] In the figure: 1. Test equipment body; 2. Controller; 3. Vibration test mechanism; 301. Support seat; 302. Placement plate; 303. Battery chip; 304. Chip limit fixture; 305. Clamp; 306. Clamp; 307. Spring; 308. Socket; 309. Support rod; 310. Connecting plate; 311. Sliding rod; 312. Vibration motor; 4. High temperature test mechanism; 401. High temperature test box; 402 , cooling component; 403, temperature sensor; 404, plug; 405, electric heating element; 406, sealing plate; 407, first pipeline; 408, fan blade; 409, fan; 410, fixing frame; 411, sealing shell; 412, second pipeline; 413, cylinder; 5, lifting mechanism; 501, bending rod; 502, connecting seat; 503, nut seat; 504, screw rod; 505, motor; 506, frame. DETAILED DESCRIPTION

[0034] Example 1

[0035] See also Figure 1-Figure 7 A reliability testing device for battery chip processing includes a testing device body 1, a controller 2 is fixedly installed on the front of the testing device body 1, a vibration testing mechanism 3 is fixedly connected to the top of the testing device body 1, a high temperature testing mechanism 4 is arranged on the top of the vibration testing mechanism 3, a lifting mechanism 5 is fixedly connected to the rear side of the testing device body 1, and the lifting mechanism 5 is fixedly connected to the high temperature testing mechanism 4.

[0036] Furthermore, the vibration testing mechanism 3 includes a support base 301, a placement plate 302 is fixedly connected to the top of the support base 301, a chip limiting tool 304 and a clamp 306 are fixedly connected to the top of the placement plate 302, a battery chip 303 is installed inside the chip limiting tool 304, a clamp 305 is threadedly connected to the clamp 306, the bottom of the clamp 305 is movably connected to the top of the battery chip 303 to fix it, and sockets 308 are fixedly connected to the left and right sides of the placement plate 302.

[0037] Furthermore, vibration motors 312 are fixedly installed on the left and right sides of the bottom of the support seat 301, the four corners of the bottom of the support seat 301 are fixedly connected to springs 307, the bottom of the spring 307 is fixedly connected to a connecting plate 310, the four corners of the bottom of the connecting plate 310 are fixedly connected to support rods 309, the bottom of the support rod 309 is fixedly connected to the top of the test equipment body 1, the front and back sides of the bottom of the support seat 301 are fixedly connected to sliding rods 311, and the sliding rods 311 are movably connected to the connecting plate 310.

[0038] By setting up a vibration test mechanism 3, the vibration environment that the battery chip 303 may encounter during transportation and actual use can be simulated, which is crucial for evaluating the performance and reliability of the battery chip 303 under dynamic conditions. By accurately controlling the vibration frequency and amplitude of the vibration motor 312, the consistency and repeatability of the test conditions can be ensured, thereby improving the accuracy and reliability of the test results. The design of the chip limit fixture 304 and the fixture 306 can firmly fix the battery chip 303 to prevent displacement or damage during the vibration process, thereby ensuring the safety of the battery chip 303 during the test. The controller 2 can monitor the status of the battery chip 303 during the vibration test in real time, record any abnormal conditions, and promptly discover potential problems. The vibration test mechanism 3 is used in combination with the high temperature test mechanism 4 to complete tests under various environmental conditions in the same device, thereby improving test efficiency and reducing equipment space.

[0039] Furthermore, the high temperature testing mechanism 4 includes a high temperature testing box 401, and plugs 404 for use with the socket 308 are fixedly connected on both sides of the left and right sides of the high temperature testing box 401. Several electric heating elements 405 are fixedly installed on the top of the inner cavity of the high temperature testing box 401, and a temperature sensor 403 is fixedly installed on the right side of the high temperature testing box 401. The detection end of the temperature sensor 403 passes through the inner cavity of the high temperature testing box 401.

[0040] Furthermore, cooling components 402 are fixedly connected to the front and rear sides of the high temperature test box 401, the front cooling component 402 takes in air, and the rear cooling component 402 discharges air.

[0041] Furthermore, the cooling component 402 includes a sealing shell 411, one side of the sealing shell 411 is connected to a first pipe 407, the other side of the sealing shell 411 is connected to a second pipe 412, the second pipe 412 is connected to the high-temperature test box 401, and a fan 409 is fixedly installed in the inner cavity of the first pipe 407. The output shaft of the fan 409 is fixedly connected to a fan blade 408, and the fan blade 408 is located in the inner cavity of the first pipe 407.

[0042] Furthermore, the left and right sides of the inner cavity of the sealing shell 411 are movably connected with sealing plates 406, one side of the sealing plate 406 extends to the outside of the sealing shell 411 and is fixedly connected with a cylinder 413, and a fixing frame 410 is fixedly installed on the cylinder 413, and the fixing frame 410 is fixedly installed on the top of the sealing shell 411.

[0043] By heating the air inside the high temperature test box 401 with the electric heating element 405, the working conditions of the battery chip 303 in a high temperature environment can be simulated, and its performance and stability under high temperature conditions can be evaluated. By controlling the cooling component 402, a rapid conversion from high temperature to low temperature can be achieved, simulating the ability of the battery chip 303 to work in an environment with drastic temperature changes, and further verifying its temperature resistance. The temperature sensor 403 monitors the temperature in the high temperature test box 401 in real time to ensure that the temperature remains within a preset range, thereby improving the accuracy and reliability of the test results. Multiple electric heating elements 405 are distributed in the high temperature test box 401. The top of the inner cavity ensures uniform temperature distribution in the box to avoid local overheating or overcooling. The opening and closing of the sealing plate 406 is controlled by the fan 409 and the cylinder 413 to achieve rapid cooling inside the high-temperature test box 401. The front fan 409 introduces cold air and the rear fan 409 exhausts hot air to ensure the efficiency of the temperature conversion process. Through multiple high and low temperature cycle tests, the performance of the battery chip 303 in a complex temperature environment is simulated to comprehensively evaluate its temperature resistance. The temperature parameters of the high-temperature test box 401 can be easily set and controlled through the controller 2 to achieve automated testing, reduce manual intervention, and improve test efficiency.

[0044] Furthermore, the lifting mechanism 5 includes a bent rod 501, the bottom of the bent rod 501 is fixedly connected to a connecting seat 502, the connecting seat 502 is fixedly installed on the top of the high temperature test box 401, the bottom of the bent rod 501 is fixedly connected to a nut seat 503, the front side of the nut seat 503 is movably connected to a frame 506, and the frame 506 is fixedly installed on the rear side of the test equipment main body 1.

[0045] Furthermore, the bottom of the frame 506 is fixedly connected to the motor 505 , the output shaft of the motor 505 is fixedly connected to the screw rod 504 , the screw rod 504 is threadedly connected to the nut seat 503 to drive it, and the top of the screw rod 504 is rotatably connected to the frame 506 .

[0046] By setting up the lifting mechanism 5, it is convenient to drive the high temperature test mechanism 4 to rise and fall. The high temperature test mechanism 4 is installed on the top of the vibration test mechanism 3. The motor 505 drives the screw rod 504 to rotate, pushing the nut seat 503 to move downward, thereby driving the high temperature test box 401 to move downward until its plug 404 is connected with the socket 308 on the placement tray 302, so that the high temperature test box 401 covers the placement tray 302.

[0047] Example 2

[0048] See also Figure 1-Figure 7 , a reliability testing method for battery chip processing, comprising the following steps:

[0049] S1. Prepare the battery chip 303 to be tested and place it in the chip limiting fixture 304 of the vibration test mechanism 3. Use the clamp 305 on the fixture 306 to fix the battery chip 303. Connect the electrical interface of the battery chip 303 with the controller 2 and the power supply system to ensure that the current can pass smoothly during the test.

[0050] S2, vibration test, the vibration frequency and amplitude are set by the controller 2, and the vibration motor 312 is started. The vibration motor 312 drives the support base 301 to vibrate. The support base 301 and the placement plate 302 thereon will vibrate under the action of the spring 307 to simulate the vibration environment that may be encountered during transportation or use. During the vibration of the support base 301, the slide bar 311 is driven to slide inside the connecting plate 310, so that the support base 301 vibrates up and down. During the entire vibration test, the state of the battery chip 303 is monitored by the controller 2, and any abnormal situation is recorded;

[0051] S3, high temperature test, close the vibration test mechanism 3, start the motor 505 in the lifting mechanism 5 through the controller 2, the motor 505 drives the screw rod 504 to rotate, pushes the nut seat 503 to move downward, thereby driving the high temperature test box 401 to move downward until its plug 404 is connected with the socket 308 on the placement plate 302, so that the high temperature test box 401 covers the placement plate 302;

[0052] S4, start the high temperature test, set the target temperature in the high temperature test box 401 through the controller 2, start the electric heating element 405 to heat the air inside the high temperature test box 401, and at the same time, the temperature sensor 403 monitors the temperature in the box in real time to ensure that the temperature remains within the preset range, so as to perform a high temperature test on the battery chip 303;

[0053] S5, high and low temperature conversion test. If a low temperature conversion test is required, the controller 2 controls the fan 409 and the cylinder 413 in the cooling component 402 to operate. The cylinder 413 drives the blocking plate 406 away from the inner cavity of the blocking shell 411, so that the second pipe 412 is connected to the first pipe 407. The front fan 409 drives the fan blades 408 to rotate to pass the external cold air into the high temperature test box 401. The rear fan 409 drives the fan blades 408 to rotate to extract the hot air inside the high temperature test box 401, so that the inside of the high temperature test box 401 is quickly cooled down. When the temperature reaches the set temperature, the cooling component 402 is closed to keep the inside of the high temperature test box 401 at a low temperature for a period of time. Then, the electric heating element 405 continues to heat the inside of the high temperature test box 401 to increase the temperature inside the high temperature test box 401, and the high and low temperature conversion test is performed.

[0054] S6, the test is finished. After the test is finished, the controller 2 collects and records the test data, including the vibration frequency, amplitude, temperature change curve, and information. The high-temperature test box 401 is disconnected from the placement plate 302, and the high-temperature test box 401 is lowered back to its original position through the lifting mechanism 5. Then, the battery chip 303 is taken out. Based on the collected data, the performance of the battery chip 303 under vibration and high temperature conditions is analyzed to evaluate its reliability and performance.

[0055] The above are only preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A reliability testing device for battery chip processing, comprising a testing device body (1), characterized in that: A controller (2) is fixedly mounted on the front of the test device body (1), and a vibration test mechanism (3) is fixedly connected to the top of the test device body (1); A high temperature testing mechanism (4) is provided on the top of the vibration testing mechanism (3), and a lifting mechanism (5) is fixedly connected to the rear side of the testing equipment body (1), and the lifting mechanism (5) is fixedly connected to the high temperature testing mechanism (4).

2. A reliability testing device for battery chip processing according to claim 1, characterized in that: The vibration testing mechanism (3) comprises a support seat (301), a placement plate (302) is fixedly connected to the top of the support seat (301), a chip limiting tool (304) and a clamp (306) are fixedly connected to the top of the placement plate (302), a battery chip (303) is installed inside the chip limiting tool (304), a clamp (305) is threadedly connected to the clamp (306), the bottom of the clamp (305) is movably connected to the top of the battery chip (303) to fix it, and sockets (308) are fixedly connected to the left and right sides of the placement plate (302).

3. A reliability testing device for battery chip processing according to claim 2, characterized in that: Vibration motors (312) are fixedly installed on both left and right sides of the bottom of the support seat (301); springs (307) are fixedly connected to the four corners of the bottom of the support seat (301); a connecting plate (310) is fixedly connected to the bottom of the spring (307); support rods (309) are fixedly connected to the four corners of the bottom of the connecting plate (310); the bottom of the support rod (309) is fixedly connected to the top of the test equipment body (1); sliding rods (311) are fixedly connected to the front and rear sides of the bottom of the support seat (301); and the sliding rods (311) are movably connected to the connecting plate (310).

4. The reliability testing equipment for battery chip processing according to claim 1, characterized in that: The high temperature test mechanism (4) comprises a high temperature test box (401), plugs (404) for use with a socket (308) are fixedly connected to the left and right sides of the high temperature test box (401), a plurality of electric heating elements (405) are fixedly installed on the top of the inner cavity of the high temperature test box (401), a temperature sensor (403) is fixedly installed on the right side of the high temperature test box (401), and a detection end of the temperature sensor (403) passes through the inner cavity of the high temperature test box (401).

5. A reliability testing device for battery chip processing according to claim 4, characterized in that: The high temperature test box (401) is fixedly connected to cooling components (402) on both the front and rear sides, the front cooling component (402) takes in air, and the rear cooling component (402) discharges air.

6. A reliability testing device for battery chip processing according to claim 5, characterized in that: The cooling component (402) comprises a blocking shell (411), one side of the blocking shell (411) is connected to a first pipe (407), the other side of the blocking shell (411) is connected to a second pipe (412), the second pipe (412) is connected to the high temperature test box (401), a fan (409) is fixedly installed in the inner cavity of the first pipe (407), the output shaft of the fan (409) is fixedly connected to a fan blade (408), and the fan blade (408) is located in the inner cavity of the first pipe (407).

7. A reliability testing device for battery chip processing according to claim 6, characterized in that: The left and right sides of the inner cavity of the blocking shell (411) are movably connected with blocking plates (406), one side of the blocking plate (406) extends to the outside of the blocking shell (411) and is fixedly connected to a cylinder (413), a fixing frame (410) is fixedly mounted on the cylinder (413), and the fixing frame (410) is fixedly mounted on the top of the blocking shell (411).

8. A reliability testing device for battery chip processing according to claim 7, characterized in that: The lifting mechanism (5) comprises a bent rod (501), the bottom of the bent rod (501) is fixedly connected to a connecting seat (502), the connecting seat (502) is fixedly installed on the top of the high-temperature test box (401), the bottom of the bent rod (501) is fixedly connected to a nut seat (503), the front side of the nut seat (503) is movably connected to a frame (506), and the frame (506) is fixedly installed on the rear side of the test equipment body (1).

9. A reliability testing device for battery chip processing according to claim 8, characterized in that: The bottom of the frame (506) is fixedly connected to a motor (505), the output shaft of the motor (505) is fixedly connected to a screw rod (504), the screw rod (504) is threadedly connected to a nut seat (503) to drive it, and the top of the screw rod (504) is rotatably connected to the frame (506).

10. A reliability testing method for battery chip processing, applicable to a reliability testing device for battery chip processing as claimed in any one of claims 1 to 9, characterized in that: The following steps are involved: S1. Prepare the battery chip (303) to be tested and place it in the chip limiting fixture (304) of the vibration test mechanism (3). Use the clamping piece (305) on the fixture (306) to fix the battery chip (303). Connect the electrical interface of the battery chip (303) with the controller (2) and the power supply system to ensure that the current can pass smoothly during the test. S2, vibration test, the vibration frequency and amplitude are set by the controller (2), and the vibration motor (312) is started. The vibration motor (312) drives the support base (301) to vibrate. The support base (301) and the placement plate (302) thereon will vibrate under the action of the spring (307), simulating the vibration environment that may be encountered during transportation or use. During the vibration of the support base (301), the slide bar (311) is driven to slide inside the connecting plate (310), so that the support base (301) vibrates up and down. During the entire vibration test process, the state of the battery chip (303) is monitored by the controller (2), and any abnormal situation is recorded; S3, high temperature test, close the vibration test mechanism (3), start the motor (505) in the lifting mechanism (5) through the controller (2), the motor (505) drives the screw rod (504) to rotate, pushes the nut seat (503) to move downward, thereby driving the high temperature test box (401) to move downward until its plug (404) is connected with the socket (308) on the placement plate (302), so that the high temperature test box (401) covers the placement plate (302); S4, starting the high temperature test, setting the target temperature in the high temperature test box (401) through the controller (2), starting the electric heating element (405) to heat the air inside the high temperature test box (401), and at the same time, the temperature sensor (403) monitors the temperature in the box in real time to ensure that the temperature remains within a preset range, so as to perform a high temperature test on the battery chip (303); S5, high and low temperature conversion test. If a low temperature conversion test is required, the controller (2) controls the fan (409) and the cylinder (413) in the cooling component (402) to operate. The cylinder (413) drives the blocking plate (406) away from the inner cavity of the blocking shell (411), so that the second pipe (412) and the first pipe (407) are connected. The fan (409) on the front side drives the fan blades (408) to rotate, and the external cold air is passed into the high temperature test box (401). The fan (409) drives the fan blades (408) to rotate, extracting hot air from the high temperature test box (401), so that the temperature inside the high temperature test box (401) is rapidly reduced. When the temperature reaches the set temperature, the cooling component (402) is closed, so that the temperature inside the high temperature test box (401) is kept at a low temperature for a period of time. Then, the electric heating element (405) continues to heat the inside of the high temperature test box (401), raising the temperature inside the high temperature test box (401), and performing a high-low temperature conversion test. S6, the test is finished. After the test is finished, the controller (2) collects and records the test data, including the vibration frequency, amplitude, temperature change curve, and information. The high temperature test box (401) is disconnected from the placement plate (302). The high temperature test box (401) is lowered back to its original position through the lifting mechanism (5). Then, the battery chip (303) is taken out. Based on the collected data, the performance of the battery chip (303) under vibration and high temperature conditions is analyzed to evaluate its reliability and performance.

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