Method, device and equipment for improving quality control precision of complex surface shot deviation and medium

Abstract

The invention relates to the technical field of seismic data acquisition and processing, and discloses a method, a device, equipment and a medium for improving the quality control precision of complex surface shot deviation, and the method comprises the steps: carrying out the static correction of a field single shot of a target complex work area; determining an optimal inversion data range according to the earth surface structure of the target complex work area and the first arrival time of the two sides of the single shot in the field single shot; performing first arrival pickup on the field single shot in the optimal inversion data range to obtain a target first arrival, and detecting the accuracy of the target first arrival and an SPS file; when the accuracy accords with an accuracy threshold value, inverting a real shot point position according to the target first arrival and the detection point information in the SPS file; the edge deviation and the vertical deviation of the real shot point position and the theoretical shot point position in the SPS file are calculated, the shot point offset is calculated according to the edge deviation and the vertical deviation, and the shot deviation quality control precision of the target complex work area is determined according to the shot point offset; according to the invention, the accuracy of quality control of complex surface shot deviation can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of seismic data acquisition and processing, and in particular to a method, device, equipment and medium for improving the quality control accuracy of complex surface shot deviation. Background Art

[0002] Shot deviation inspection is an important part of the quality control process of seismic data acquisition. It is generally believed that the shot point offset cannot be greater than the size of an underground bin, otherwise it will cause uneven coverage and seriously affect the imaging effect of subsequent processing sections. The applicable conditions of shot deviation quality control are different for different work areas. In order to improve the accuracy of shot deviation quality control in work areas with complex surfaces, it is necessary to reduce the impact of rapid changes in near-surface longitudinal and lateral velocities to a certain extent.

[0003] The existing shot deviation quality control is based on the LMO linear dynamic correction method, which checks whether there is a misalignment phenomenon in the first arrival after leveling, and then verifies the accuracy of the shot inspection relationship. In practical applications, when the medium properties in the work area change drastically, it is necessary to divide the work area into multiple small areas according to the near-surface conditions, which makes it difficult to select the accurate dynamic correction speed in each area, resulting in low accuracy in complex surface shot deviation quality control. Summary of the invention

[0004] In view of the above problems, embodiments of the present invention provide a method, device, equipment and medium for improving the quality control accuracy of complex surface shot deviation.

[0005] In a first aspect, an embodiment of the present invention provides a method for improving the quality control accuracy of complex surface shot deviation, comprising:

[0006] Perform static correction on single field shots in complex target areas;

[0007] Determine the optimal inversion data range of the target complex work area according to the surface structure of the target complex work area and the first arrival times on both sides of a single shot in the field after static correction processing;

[0008] Picking the first arrival of a single shot in the field within the range of the optimal inversion data to obtain the first arrival of the target, and detecting the accuracy of the first arrival of the target and the preset SPS file;

[0009] When the accuracy meets the preset accuracy threshold, inverting the real shot point position according to the target first arrival and the detection point information in the SPS file;

[0010] Calculate the longitudinal deviation and vertical deviation of the actual shot point position and the theoretical shot point position in the SPS file, calculate the shot point offset according to the longitudinal deviation and the vertical deviation, and determine the shot offset quality control accuracy of the target complex work area according to the shot point offset.

[0011] According to an embodiment of the present invention, the static correction processing of a single shot in the field in a complex target area includes:

[0012] Obtain the single shot time of a single shot in the field in a complex target area;

[0013] Determining the static correction amount of the field single shot according to the single shot time;

[0014] Static correction processing is performed on the field single shot according to the static correction amount.

[0015] According to an embodiment of the present invention, determining the optimal inversion data range of the target complex work area according to the surface structure of the target complex work area and the first arrival times on both sides of a single shot in the field after static correction processing includes:

[0016] Determine the line direction and the track direction of the target complex work area according to the surface structure;

[0017] Selecting a line receiving data range in the work area within the single shot record arranged in the line direction;

[0018] Selecting a track receiving data range within the single shot record arranged in the work area in the track direction;

[0019] The optimal inversion data range of the target complex work area is determined according to the line receiving data range and the track receiving data range.

[0020] According to an embodiment of the present invention, the first arrival of a single shot in the field within the optimal inversion data range is picked to obtain the first arrival of the target, including:

[0021] Obtaining a target single shot reception record corresponding to a field single shot within the optimal inversion data range;

[0022] Extract the target first arrival corresponding to the target single shot reception record.

[0023] According to an embodiment of the present invention, the calculating of the longitudinal deviation and the vertical deviation between the real shot point position and the theoretical shot point position in the SPS file includes:

[0024] The following formula is used to calculate the longitudinal and vertical deviations between the actual shot point position and the theoretical shot point position in the SPS file:

[0025]

[0026] Among them, ERR x is the edge deviation, ERR y is the vertical deflection, (Z x , Z y ) is the actual shot point position, (L x , Ly ) is the theoretical shot point position.

[0027] According to an embodiment of the present invention, the calculating of the shot point offset according to the longitudinal offset and the vertical offset includes:

[0028] The shot point offset is calculated according to the longitudinal offset and the vertical offset using the following offset calculation formula:

[0029]

[0030] Among them, ERR all is the shot point offset, ERR x is the edge deviation, ERR y is the vertical deviation.

[0031] According to an embodiment of the present invention, the inversion of the real shot point position according to the target first arrival and the detection point information in the SPS file includes:

[0032] The preset near-offset distance is used to invert the real shot point position according to the target first arrival and the detection point information in the SPS file.

[0033] In a second aspect, an embodiment of the present invention provides a device for improving the quality control accuracy of complex surface shot deviation, which is characterized by comprising:

[0034] Field single-shot static correction processing module, used to perform static correction processing on field single-shot in complex target work areas;

[0035] An optimal inversion data range determination module is used to determine the optimal inversion data range of the target complex work area according to the surface structure of the target complex work area and the first arrival times on both sides of a single shot in the field after static correction processing;

[0036] A first arrival picking module is used to pick the first arrival of a single shot in the field within the range of the optimal inversion data, obtain the first arrival of the target, and detect the accuracy of the first arrival of the target and the preset SPS file;

[0037] A real shot point position inversion module, used for inverting the real shot point position according to the target first arrival and the detection point information in the SPS file when the accuracy meets the preset accuracy threshold;

[0038] The shot point offset calculation module is used to calculate the longitudinal deviation and vertical deviation of the actual shot point position and the theoretical shot point position in the SPS file, calculate the shot point offset according to the longitudinal deviation and the vertical deviation, and determine the shot point offset quality control accuracy of the target complex work area according to the shot point offset.

[0039] In a third aspect, an embodiment of the present invention provides a device, comprising:

[0040] processor;

[0041] a memory for storing instructions executable by the processor;

[0042] Among them, the processor is configured to execute the instructions to implement a method for improving the quality control accuracy of complex surface artillery deviation as described in the first aspect above.

[0043] In a fourth aspect, an embodiment of the present invention provides a medium having a computer program stored thereon, which, when executed by a processor, implements a method for improving the quality control accuracy of complex surface gun deviation as described in the first aspect.

[0044] Compared with the prior art, the above technical solution of the present invention has the following beneficial effects:

[0045] The embodiment of the present invention performs static correction processing on seismic data in a work area with complex surface structure, selects appropriate near-receiving lines and tracks according to the surface structure characteristics of the work area and the first arrival time on both sides of the single shot record, and then limits the number of receiving arrangements and the range of shot offsets, thereby alleviating the influence of too fast changes in near-surface longitudinal and lateral velocity to a certain extent; first arrivals are picked for seismic data within the selected range, and the accuracy of the first arrivals and SPS files is checked; the real shot point position is inverted using the first arrival and the detection point information in the SPS, and the longitudinal and vertical deviations from the theoretical shot point position in the SPS are calculated to obtain the offset of the final shot point; thereby effectively solving the problem of inaccurate shot point offsets in areas with drastic longitudinal and lateral changes in near-surface velocity, improving the quality of seismic acquisition data, and ensuring subsequent imaging effects. Therefore, the method, device, equipment and medium for improving the quality control accuracy of complex surface shot offsets proposed by the present invention can solve the problem of low accuracy when performing quality control of complex surface shot offsets. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0047] Figure 1 The flowchart of the method for improving the quality control accuracy of complex surface shot deviation according to the first embodiment of the present invention is shown;

[0048] Figure 2a The near-array single-shot recording diagram before the LMO linear dynamic correction of the first embodiment of the present invention is shown;

[0049] Figure 2bThe close-array single-shot recording diagram after the LMO linear dynamic correction of the first embodiment of the present invention is shown;

[0050] Figure 3a A schematic diagram of a long-range single shot recording according to the first embodiment of the present invention is shown;

[0051] Figure 3b A schematic diagram of a single shot recording in a middle arrangement according to the first embodiment of the present invention is shown;

[0052] Figure 3c A schematic diagram of a near-array single shot recording according to the first embodiment of the present invention is shown;

[0053] Figure 4a A schematic diagram showing the data range of full offset inversion according to the first embodiment of the present invention is shown;

[0054] Figure 4b A schematic diagram of shot offset bullseye for full offset inversion according to the first embodiment of the present invention is shown;

[0055] Figure 4c A schematic diagram showing the comparison of the measured shot deviation of the full offset inversion according to the first embodiment of the present invention is shown;

[0056] Figure 5a A schematic diagram showing the data range of the near-offset inversion according to the second embodiment of the present invention;

[0057] Figure 5b A schematic diagram of shot offset bullseye for close offset inversion according to the second embodiment of the present invention is shown;

[0058] Figure 5c A schematic diagram showing the comparison of the measured shot deviation of the near-offset inversion according to the second embodiment of the present invention is shown;

[0059] Figure 6 The functional module diagram of the device for improving the quality control accuracy of complex surface shot deviation according to the third embodiment of the present invention is shown;

[0060] Figure 7 A schematic diagram of the composition structure of an electronic device for implementing the method for improving the quality control accuracy of complex surface shot deviation according to the fourth embodiment of the present invention is shown. DETAILED DESCRIPTION

[0061] The present disclosure is further described below in conjunction with the embodiments shown in the accompanying drawings.

[0062] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0063] The present invention proposes a method for improving the quality control accuracy of complex surface shot deviation based on seismic data acquisition technology. Based on the linear correction theory and combined with the static correction method, a near-surface structure model is built to achieve the inversion of the real shot point position and calculate the shot point offset. Compared with traditional methods, the technology for improving the quality control accuracy of complex surface shot deviation is more efficient and reduces human subjectivity, and has great potential and application prospects in seismic data interpretation applications.

[0064] Embodiment 1

[0065] like Figure 1 As shown, the present invention proposes a method for improving the quality control accuracy of complex surface shot deviation, comprising the following steps:

[0066] S1. Perform static correction on single field shots in complex target work areas.

[0067] In one of the practical application scenarios of the present invention, in the desert exploration area with similar surface properties, the LMO linear dynamic correction method is more sensitive to the shot point offset and has a strong shot point offset recognition ability. However, in the exploration area on the edge of the desert, the surface processing desert also has farmland, river beach and other areas, the surface lithology is very drastic, the thickness of the low velocity reduction zone is very large, and the excitation and receiving conditions are complex, which causes the near-surface velocity to change drastically in the vertical and horizontal directions. At this time, the conventional shot deviation quality control method is no longer applicable. Among them, the LMO linear dynamic correction method uses a constant speed to perform linear dynamic correction on a single shot record, checks whether there is a misalignment phenomenon in the first arrival after leveling, and then verifies the accuracy of the shot inspection relationship. Because it is an indoor manual naked eye comparison shot by shot, it is highly subjective, and the reliable limit is a track distance and line distance, and the accuracy is low. When the medium properties in the work area change drastically, it is necessary to divide the work area into multiple small areas according to the near-surface conditions, and it is very difficult to select an accurate dynamic correction speed in each area.

[0068] In the embodiment of the present invention, since conventional shot deviation quality control methods are no longer applicable in the exploration area on the edge of the desert, it is necessary to improve the accuracy of shot deviation quality control on complex surfaces, so as to solve the problem of inaccurate shot point offset in areas with drastic vertical and horizontal velocity changes near the surface, improve the quality of seismic acquisition data, and ensure subsequent imaging effects.

[0069] Furthermore, for work areas with complex surface structures, due to the complex surface conditions, the surface lithology in different areas varies greatly, the thickness of the low velocity reduction zone varies greatly, and the excitation and receiving conditions are complex, which cause the near-surface velocity to vary dramatically in the vertical and horizontal directions. The LMO linear dynamic correction method cannot flatten the first arrival wave, and conventional shot deviation quality control methods are no longer applicable. Therefore, it is first necessary to perform static correction processing on the seismic data in the work area with complex surface structures to correct the time offset in the seismic record so that the first arrival of the seismic wave is aligned in time, thereby obtaining more accurate underground information.

[0070] In the embodiment of the present invention, the field single shot data refers to a single source point in the process of seismic data acquisition in seismic exploration. Considering the complex surface structure of the target complex work area, in order to provide more accurate field single shot data, static correction processing of the field single shot is required.

[0071] In the embodiment of the present invention, the static correction processing of a single shot in the field in a complex target area includes:

[0072] Obtain the single shot time of a single shot in the field in a complex target area;

[0073] Determining the static correction amount of the field single shot according to the single shot time;

[0074] Static correction processing is performed on the field single shot according to the static correction amount.

[0075] In detail, the static correction model obtained by inversion is combined with the shot point position and the receiver position of the seismic record to calculate the static correction value at each receiver position. The static correction value represents the static offset of the seismic record on the time axis, and then the single shot time of the field single shot is corrected in time according to the static correction value. By canceling the offset of the static effect, the time alignment and quality of the seismic record can be improved to obtain more accurate and reliable seismic data.

[0076] For example, the work area is located in the southwest of the Taklimakan Desert. According to the surface characteristics, it is mainly divided into desert, farmland, dense forest, river and water wetland. Among them, the desert area is distributed in the southeast, middle and northwest of the work area, in a strip-like distribution, with honeycomb, fish scale and crescent-shaped sand dunes, with small overall undulations and a height difference of 5-15m. The geophone points involved in the area account for 50.79%, and the gun points account for 41.38%; the farmland area is mainly distributed along the two rivers, and the geophone points involved in the area account for 19.73%, and the gun points account for 32.09%; the dense forest area is mainly distributed on both sides of the river, with dense vegetation, and the geophone points involved account for 20.95%, and the gun points account for 15.95%; the geophone points involved in the two rivers account for 6.94%, and the gun points account for 6.87%; the water and wetland areas in the work area mainly include three major reservoirs, four aquacultures and scattered depressions, and the geophone points involved account for 1.59%, and the gun points account for 3.71%. There are many obstacles in the area, the surface conditions are extremely complex, the surface lithology in different areas varies greatly, the thickness of the low velocity reduction zone varies greatly, and the excitation and receiving conditions are complex, which causes the near-surface velocity to change dramatically in the vertical and horizontal directions, such as Figure 2a As shown in the figure, it is a single shot record diagram of a near arrangement before LMO linear dynamic correction, which represents a single shot record of a near arrangement before LOM linear dynamic correction; Figure 2bAs shown in Figure 1, it is a single shot record diagram of a close arrangement after LMO linear dynamic correction, which represents the single shot record of a close arrangement after LOM linear dynamic correction. The linear dynamic correction method cannot flatten the first arrival wave, and the conventional shot deviation quality control method is no longer applicable.

[0077] Furthermore, appropriate near-receiving lines and traces are selected according to the surface structure characteristics of the work area and the first arrival times on both sides of the single-shot records to obtain a relatively stable near-surface structure model.

[0078] S2. Determine the optimal inversion data range of the target complex work area according to the surface structure of the target complex work area and the first arrival times on both sides of a single shot in the field after static correction.

[0079] In the embodiment of the present invention, the optimal inversion data range is determined by checking the actual trends on both sides of the single shot records in the far, medium and near arrangements of the work area, and the problem of drastic changes in the near-surface longitudinal and lateral velocities under a large offset range is taken into consideration. A more stable refraction layer is obtained by selecting the two means of close arrangement and small offset.

[0080] In an embodiment of the present invention, determining the optimal inversion data range of the target complex work area according to the surface structure of the target complex work area and the first arrival times on both sides of a single shot in the field after static correction processing includes:

[0081] Determine the line direction and the track direction of the target complex work area according to the surface structure;

[0082] Selecting a line receiving data range in the work area within the single shot record arranged in the line direction;

[0083] Selecting a track receiving data range within the single shot record arranged in the work area in the track direction;

[0084] The optimal inversion data range of the target complex work area is determined according to the line receiving data range and the track receiving data range.

[0085] In detail, the line direction and the track direction of the target complex work area, the line direction refers to the direction or direction of the line formed by the seismic receivers (or seismic detectors) scattered in the seismic exploration, and the track direction refers to the direction or direction of a single seismic record (or track or track set) on the seismic data acquisition line. Under the premise of ensuring the inversion accuracy, the data within the arrangement in the line direction selection, the data in the same range as the line direction are selected in the track direction, so as to determine the optimal inversion data range of the target complex work area, and ensure that the shot offset and the first arrival have a relatively stable linear relationship.

[0086] For example, the work area is located in the southwest of the Taklimakan Desert. This work area has 6 guns and 32 receiving lines, with a receiving line spacing of 300m and a track spacing of 50m. Figure 3aAs shown in FIG. 1 , it is a schematic diagram of a single shot recording of a long-range array, including the single shot recording of the 32nd line of long-range array reception. The time difference between the left and right sides is as large as 158ms (i.e., 3.653-6.435=0.158). Figure 3b As shown in the figure, it is a schematic diagram of the single shot recording in the middle arrangement, including the single shot recording received in the middle arrangement of the 25th line. The time difference between the left and right sides is reduced to 93ms. Figure 3c As shown in FIG. 1 , it is a schematic diagram of a near-array single-shot record, including the 16th line near-array receiving single-shot record, and the time difference between the left and right branches is as small as 24ms. In summary, under the premise of ensuring the inversion accuracy, the data within the middle arrangement are selected in the line direction (because the source is at the center of the curve of the receiving single-shot record, and the left and right branches are symmetrical, that is, the data received from the 9th line to the 24th line are selected as the data within the middle arrangement), and the data in the same range as the line direction are selected in the track direction (that is, the data within the offset distance of (24-9)*300 / 2=2250m), which ensures to a certain extent that the shot offset has a more stable linear relationship with the first arrival.

[0087] Furthermore, according to the optimal inversion data range of the selected target complex work area, the first arrival of the field single shot in the seismic data within the selected range is picked to improve the accuracy of the inverted real shot point position.

[0088] S3, picking up the first arrival of a single shot in the field within the range of the optimal inversion data to obtain the first arrival of a target, and detecting the accuracy of the first arrival of the target and a preset SPS file.

[0089] In the embodiment of the present invention, the target first arrival is the moment when vibration is detected for a single shot in the field within the best inversion data, which is called the first arrival time of the wave. The time position of the first arrival (i.e., the first arrival of the seismic wave) is identified and marked from the seismic waveform data.

[0090] In the embodiment of the present invention, the first arrival of a single shot in the field within the optimal inversion data range is picked to obtain the first arrival of the target, including:

[0091] Obtaining a target single shot reception record corresponding to a field single shot within the optimal inversion data range;

[0092] Extract the target first arrival corresponding to the target single shot reception record.

[0093] In detail, it is first necessary to determine the target single-shot receiving records within the optimal inversion data range, such as the data arranged in the line direction selection (i.e., the data received from the 9th to the 24th lines). In the track direction, the data in the same range as the line direction is selected, and the first arrival will be picked up in the data received from the 9th to the 24th lines to obtain the first arrival within the optimal inversion data range. Among them, computer algorithms and signal processing techniques can be used to automatically identify and pick up the first arrival in the seismic record.

[0094] Specifically, the accuracy of the target first arrival and SPS file needs to be tested. Under the premise that the target first arrival and SPS file are accurate, the real shot point position can be inverted to calculate the shot point offset, which can be used to evaluate the quality of the seismic data. Check the noise level, data integrity, data resolution and other aspects in the seismic record to ensure that the quality of the data itself is good. Low-quality seismic data may lead to inaccuracy in first arrival picking; for multiple detection points, compare whether their first arrivals are consistent. Under the same seismic event, the target first arrivals at different detection points should be similar or consistent. By checking the consistency of the first arrival, it can be determined whether there is an error or inaccuracy in the first arrival picking; perform terrain and geomorphic analysis to compare whether the target first arrival and the calibrated position in the SPS file are consistent with the geomorphic features. The terrain and geomorphic features can provide additional clues to evaluate the accuracy of the first arrival and shot point location. In this way, the accuracy of the target detection target first arrival and SPS file can be evaluated based on multiple accuracy. The SPS file (Shot Point Spreadsheet) is a spreadsheet file that records the shot point information in seismic exploration. The file contains the location information of each shot point, such as longitude, latitude, and altitude.

[0095] Furthermore, under the premise of the target first arrival and the accuracy of the SPS file, the real shot point position is inverted to calculate the shot point offset, thereby improving the accuracy of the offset calculation.

[0096] S4. When the accuracy meets a preset accuracy threshold, the real shot point position is inverted according to the target first arrival and the detection point information in the SPS file.

[0097] In the embodiment of the present invention, the accuracy of the target first arrival and the detection point information in the SPS file inverting the real shot point position can be guaranteed only when the accuracy of the first arrival and the file content in the SPS file is detected and the accuracy of the first arrival and the file content in the SPS file meets the preset accuracy threshold. The real shot point position is the shot point position obtained after inversion, and the real shot point position is inverted according to the reverse deduction or fitting algorithm in the preset inversion software.

[0098] In the embodiment of the present invention, the inversion of the real shot point position according to the target first arrival and the detection point information in the SPS file includes:

[0099] The preset full offset is used to invert the real shot point position according to the target first arrival and the detection point information in the SPS file.

[0100] In detail, the target first arrival is matched with the detection point information in the SPS file. By comparing the target first arrival of each detection point with the position information of the corresponding detection point in the SPS file, the real shot point position can be calculated and inverted based on the full offset and target first arrival. The full offset provides the distance information between the shot point and the detection point, and the target first arrival can be used to determine the arrival time. By using the inversion algorithm and geometric relationship, the real shot point position that satisfies the full offset and target first arrival can be calculated. The full offset is the distance perpendicular to the propagation path of the seismic wave, which can be used to describe the depth and position of different reflection layers in the seismic record.

[0101] For example, the work area is located in the southwest of the Taklimakan Desert. The near-surface velocity in this area varies significantly, which leads to serious failure of the full-offset inversion results. Figure 4a As shown in the figure, it is a schematic diagram of the data range for full offset inversion, indicating the data range for full offset inversion. The square is the data inversion range, and the black dot in the middle is the inversion center. Figure 4b As shown in the figure, it is a schematic diagram of the shot deviation bull's eye of the full offset inversion, which is represented by a full offset inversion shot deviation bull's eye diagram and a table showing the inverted shot deviation bull's eye diagram and the inverted shot deviation corresponding to the shot point station number; as shown in the figure, it is a schematic diagram of the shot deviation bull's eye of the full offset inversion, which is represented by a full offset inversion shot deviation bull's eye diagram and a table showing the inverted shot deviation bull's Figure 4c As shown in the figure, it is a comparison diagram of the measured shot deviation of full offset inversion, and the inversion offset corresponding to the shot point station number is compared with the actual offset; the inversion shot point offset can be determined according to the shot deviation bullseye diagram of full offset inversion, and the line distance is too large and much larger than the track distance, so the line direction is more seriously affected by the surface conditions, which is manifested as the inversion offset of the line direction (north-south direction) is much larger than the track direction (east-west direction), and the accuracy is lower. Among the 10 maximum offset points found in the comparison table of measured shot deviation, only one is more than 5m after measurement. Therefore, after selecting appropriate near-receiving lines and tracks to obtain a relatively stable near-surface structure model, the inversion accuracy can be improved.

[0102] S5. Calculate the longitudinal deviation and vertical deviation between the actual shot point position and the theoretical shot point position in the SPS file, calculate the shot point offset according to the longitudinal deviation and the vertical deviation, and determine the shot offset quality control accuracy of the target complex work area according to the shot point offset.

[0103] In the embodiment of the present invention, the longitudinal offset is the horizontal offset between the actual shot point position and the theoretical shot point position, and the vertical offset is the vertical offset between the actual shot point position and the theoretical shot point position.

[0104] In the embodiment of the present invention, the calculating of the longitudinal deviation and the vertical deviation between the actual shot point position and the theoretical shot point position in the SPS file includes:

[0105] The following formula is used to calculate the longitudinal and vertical deviations between the actual shot point position and the theoretical shot point position in the SPS file:

[0106]

[0107] Among them, ERR x is the edge deviation, ERR y is the vertical deflection, (Z x , Z y ) is the actual shot point position, (L x , L y ) is the theoretical shot point position.

[0108] In detail, the offset of the final shot point is obtained by calculating the longitudinal and vertical offsets between the actual shot point position and the theoretical shot point position in the SPS, so as to improve the shot offset quality control accuracy and improve the quality of seismic acquisition data.

[0109] In the embodiment of the present invention, the calculating of the shot point offset according to the longitudinal offset and the vertical offset includes:

[0110] The shot point offset is calculated according to the longitudinal offset and the vertical offset using the following offset calculation formula:

[0111]

[0112] Among them, ERR all is the shot point offset, ERR x is the edge deviation, ERR y is the vertical deviation.

[0113] In detail, the process of calculating the offset is automated, with high detection efficiency, and can quantitatively detect the gun offset. The traditional calculation of the offset requires visual observation, which has more or less errors, while the calculation of the gun point offset by the longitudinal offset and the vertical offset does not require manual intervention, and the integrated software module automatically detects the offset of the gun point position.

[0114] Furthermore, the final shot point offset can effectively solve the problem of inaccurate shot point offset in areas with drastic vertical and horizontal velocity changes near the surface, improve the quality of seismic acquisition data, ensure subsequent imaging effects, and thus improve the shot deviation quality control accuracy in complex target areas.

[0115] Embodiment 2

[0116] In order to more clearly understand the present invention, a second embodiment is used below to further explain the situation in which the real shot point position is inverted according to the target first arrival and the detection point information in the SPS file in order to improve the inversion accuracy.

[0117] In the embodiment of the present invention, the inversion of the real shot point position according to the target first arrival and the detection point information in the SPS file includes:

[0118] The preset near-offset distance is used to invert the real shot point position according to the target first arrival and the detection point information in the SPS file.

[0119] In detail, near offset refers to the seismic wave data recorded by the receiver point closer to the shot point in seismic exploration. The target first arrival is matched with the receiver point information in the SPS file. By comparing the target first arrival of each receiver point with the position information of the corresponding receiver point in the SPS file, the real shot point position can be calculated and inverted based on the near offset and target first arrival. The accuracy of the offset is guaranteed to a certain extent.

[0120] Exemplarily, the true shot point position is inverted based on the optimal inversion data range of selecting appropriate near-receive lines and traces, such as Figure 5a As shown in the figure, it is a schematic diagram of the data range for near-offset inversion, indicating the data range for near-offset inversion. The irregular shape is the data inversion range, and the black dot in the middle is the inversion center. Figure 5b As shown in the figure, it is a schematic diagram of the shot deviation bull's eye of the near-offset inversion, which is represented by a near-offset inversion shot deviation bull's eye diagram and a table showing the inverted shot deviation bull's eye diagram and the inverted shot deviation corresponding to the shot point station number; as shown in the figure, it is a schematic diagram of the shot deviation bull's eye of the near-offset inversion, which is represented by a near-offset inversion shot deviation bull's eye diagram and a table showing the Figure 5c As shown in the figure, it is a schematic diagram of the comparison of the measured shot deviation of the near-offset inversion, and the inversion offset corresponding to the shot point station number is compared with the actual offset; in the comparison table of the measured shot deviation, the inversion offset is obtained by inversion, while the actual offset is obtained by point-by-point measurement by the exploration personnel, so the inversion offset and the actual offset are compared. Among the 10 points with the largest offset found in the comparison table of the measured shot deviation, 6 of them are more than 5m after measurement, and the 3 points with the largest shot deviation on that day in this area are all found. This effectively solves the problem of inaccurate shot point offset in areas with drastic vertical and horizontal changes in near-surface velocity, improves the quality of seismic acquisition data, and ensures the subsequent imaging effect.

[0121] Embodiment 3

[0122] like Figure 6 As shown, this embodiment also provides a functional module diagram of a device for improving the quality control accuracy of complex surface gun deviation.

[0123] The device 100 for improving the quality control accuracy of complex surface shot deviation described in this embodiment can be installed in a device. According to the functions to be implemented, the device 100 for improving the quality control accuracy of complex surface shot deviation can include a field single shot static correction processing module 101, an optimal inversion data range determination module 102, a first arrival picking module 103, a real shot point position inversion module 104 and a shot point offset calculation module 105. The module described in the present invention can also be referred to as a unit, which refers to a series of computer program segments that can be executed by a device processor and can complete fixed functions, which are stored in the memory of the device.

[0124] In this embodiment, the functions of each module / unit are as follows:

[0125] The field single shot static correction processing module 101 is used to perform static correction processing on the field single shot in the target complex work area;

[0126] The optimal inversion data range determination module 102 is used to determine the optimal inversion data range of the target complex work area according to the surface structure of the target complex work area and the first arrival times on both sides of a single shot in the field after static correction processing;

[0127] The first arrival picking module 103 is used to pick the first arrival of a single shot in the field within the optimal inversion data range, obtain the first arrival of the target, and detect the accuracy of the first arrival of the target and the preset SPS file;

[0128] The real shot point position inversion module 104 is used to invert the real shot point position according to the target first arrival and the detection point information in the SPS file when the accuracy meets the preset accuracy threshold;

[0129] The shot point offset calculation module 105 is used to calculate the longitudinal deviation and vertical deviation between the actual shot point position and the theoretical shot point position in the SPS file, calculate the shot point offset according to the longitudinal deviation and the vertical deviation, and determine the shot point offset quality control accuracy of the target complex work area according to the shot point offset.

[0130] In detail, each module described in the device 100 for improving the quality control accuracy of complex surface shot deviation described in the embodiment of the present invention adopts the same technical means as the method for improving the quality control accuracy of complex surface shot deviation described in Example 1 and Example 2 when used, and can produce the same technical effects, which will not be repeated here.

[0131] Embodiment 4

[0132] like Figure 7 As shown, this embodiment also provides a device, which may include a processor 10, a memory 11, a communication bus 12 and a communication interface 13, and may also include a computer program stored in the memory 11 and executable on the processor 10, such as a program for improving the quality control accuracy of complex surface gun deviation.

[0133] In some embodiments, the processor 10 may be composed of an integrated circuit, for example, a single packaged integrated circuit, or a plurality of packaged integrated circuits with the same or different functions, including one or more central processing units (CPUs), microprocessors, digital processing chips, graphics processors, and combinations of various control chips. The processor 10 is the control core (ControlUnit) of the electronic device, and uses various interfaces and lines to connect various components of the entire electronic device, and executes or executes programs or modules stored in the memory 11 (for example, executing a complex surface gun deviation quality control accuracy improvement program, etc.), and calls data stored in the memory 11 to execute various functions of the electronic device and process data.

[0134] The memory 11 includes at least one type of readable storage medium, and the readable storage medium includes flash memory, mobile hard disk, multimedia card, card-type memory (for example: SD or DX memory, etc.), magnetic memory, disk, optical disk, etc. In some embodiments, the memory 11 can be an internal storage unit of an electronic device, such as a mobile hard disk of the electronic device. In other embodiments, the memory 11 can also be an external storage device of an electronic device, such as a plug-in mobile hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), etc. equipped on the electronic device. Further, the memory 11 can also include both an internal storage unit of the electronic device and an external storage device. The memory 11 can not only be used to store application software and various types of data installed in the electronic device, such as the code of a complex surface gun deviation quality control accuracy improvement program, but can also be used to temporarily store data that has been output or is to be output.

[0135] The communication bus 12 may be a peripheral component interconnect (PCI) bus or an extended industry standard architecture (EISA) bus, etc. The bus may be divided into an address bus, a data bus, a control bus, etc. The bus is configured to realize connection and communication between the memory 11 and at least one processor 10, etc.

[0136] The communication interface 13 is used for communication between the above-mentioned electronic device and other devices, including a network interface and a user interface. Optionally, the network interface may include a wired interface and / or a wireless interface (such as a WI-FI interface, a Bluetooth interface, etc.), which is generally used to establish a communication connection between the electronic device and other electronic devices. The user interface may be a display (Display), an input unit (such as a keyboard (Keyboard)), and optionally, the user interface may also be a standard wired interface, a wireless interface. Optionally, in some embodiments, the display may be an LED display, a liquid crystal display, a touch-sensitive liquid crystal display, and an OLED (Organic Light-Emitting Diode, organic light-emitting diode) touch device, etc. Among them, the display may also be appropriately referred to as a display screen or a display unit, which is used to display information processed in the electronic device and to display a visual user interface.

[0137] The figure only shows an electronic device with components. Those skilled in the art will understand that the structure shown in the figure does not constitute a limitation on the electronic device, and may include fewer or more components than shown in the figure, or combine certain components, or arrange the components differently.

[0138] For example, although not shown, the device may also include a power source (such as a battery) for supplying power to each component. Preferably, the power source may be logically connected to the at least one processor 10 through a power management device, so that the power management device can realize functions such as charging management, discharging management, and power consumption management. The power source may also include any components such as one or more DC or AC power sources, recharging devices, power failure detection circuits, power converters or inverters, power status indicators, etc. The electronic device may also include a variety of sensors, Bluetooth modules, Wi-Fi modules, etc., which will not be repeated here.

[0139] It should be understood that the embodiment is for illustration only and the scope of the patent application is not limited to this structure.

[0140] The program for improving the precision of complex surface shot deviation quality control stored in the memory 11 of the device is a combination of multiple instructions. When running in the processor 10, it can achieve:

[0141] Perform static correction on single field shots in complex target areas;

[0142] Determine the optimal inversion data range of the target complex work area according to the surface structure of the target complex work area and the first arrival times on both sides of a single shot in the field after static correction processing;

[0143] Picking the first arrival of a single shot in the field within the range of the optimal inversion data to obtain the first arrival of the target, and detecting the accuracy of the first arrival of the target and the preset SPS file;

[0144] When the accuracy meets the preset accuracy threshold, inverting the real shot point position according to the target first arrival and the detection point information in the SPS file;

[0145] Calculate the longitudinal deviation and vertical deviation of the actual shot point position and the theoretical shot point position in the SPS file, calculate the shot point offset according to the longitudinal deviation and the vertical deviation, and determine the shot offset quality control accuracy of the target complex work area according to the shot point offset.

[0146] Specifically, the specific implementation method of the processor 10 for the above instructions can refer to the description of the relevant steps in the corresponding embodiment of the accompanying drawings, which will not be repeated here.

[0147] Furthermore, if the module / unit integrated in the device is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. The medium can be volatile or non-volatile. For example, the medium can include: any entity or device capable of carrying the computer program code, a recording medium, a USB flash drive, a mobile hard disk, a magnetic disk, an optical disk, a computer memory, and a read-only memory (ROM).

[0148] Embodiment 5

[0149] This embodiment provides a medium storing a computer program. When the computer program is executed by a processor, the steps of the method for improving the quality control accuracy of complex surface shot deviation as described above are implemented.

[0150] These program codes can also be loaded onto a computer or other programmable data processing device so that a series of operation steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions executed on the computer or other programmable device for implementing the process. Figure 1 The steps of a specified function in a process or multiple processes.

[0151] Media include permanent and non-permanent, removable and non-removable media, and can be implemented by any method or technology to store information. Information can be computer-readable instructions, data structures, modules of programs or other data. Examples of storage media can include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disk read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, magnetic disk storage or other magnetic storage devices or any other non-transmission medium that can be used to store information that can be accessed by a computing device.

[0152] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. When the terms "include" and / or "include" are used in this specification, they indicate the presence of features, steps, operations, devices, components and / or their combinations.

[0153] It is to be understood that the terms so used are interchangeable under appropriate circumstances such that the embodiments of the application described herein are, for example, capable of operation in sequences other than those illustrated or described herein.

[0154] In the several embodiments provided by the present invention, it should be understood that the disclosed devices, apparatuses and methods can be implemented in other ways. For example, the device embodiments described above are only schematic, for example, the division of the modules is only a logical function division, and there may be other division methods in actual implementation.

[0155] The modules described as separate components may or may not be physically separated, and the components shown as modules may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0156] In addition, each functional module in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of hardware plus software functional modules.

[0157] It is obvious to those skilled in the art that the present invention is not limited to the details of the above exemplary embodiments, and that the present invention can be implemented in other specific forms without departing from the spirit or essential characteristics of the present invention.

[0158] Therefore, no matter from which point of view, the embodiments should be regarded as illustrative and non-restrictive, and the scope of the present invention is limited by the appended claims rather than the above description, so it is intended that all changes falling within the meaning and scope of the equivalent elements of the claims are included in the present invention. Any attached figure mark in the claims should not be regarded as limiting the claims involved.

[0159] The embodiments of the present application can acquire and process relevant data based on artificial intelligence technology. Among them, artificial intelligence (AI) is the theory, method, technology and application system that uses digital computers or machines controlled by digital computers to simulate, extend and expand human intelligence, perceive the environment, acquire knowledge and use knowledge to obtain the best results.

[0160] In addition, it is clear that the word "comprising" does not exclude other units or steps, and the singular does not exclude the plural. Multiple units or devices stated in the system claim can also be implemented by one unit or device through software or hardware. The words first, second, etc. are used to indicate names, and do not indicate any particular order.

[0161] Finally, it should be noted that the above embodiments are only used to illustrate the technical solution of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that the technical solution of the present invention can be modified or replaced by equivalents without departing from the spirit and scope of the technical solution of the present invention.

Claims

1. A method for improving the quality control accuracy of complex surface shot deviation, characterized in that: The method comprises: Perform static correction on single field shots in complex target areas; Determine the optimal inversion data range of the target complex work area according to the surface structure of the target complex work area and the first arrival times on both sides of a single shot in the field after static correction processing; Picking the first arrival of a single shot in the field within the range of the optimal inversion data to obtain the first arrival of the target, and detecting the accuracy of the first arrival of the target and the preset SPS file; When the accuracy meets the preset accuracy threshold, inverting the real shot point position according to the target first arrival and the detection point information in the SPS file; Calculate the longitudinal deviation and vertical deviation of the actual shot point position and the theoretical shot point position in the SPS file, calculate the shot point offset according to the longitudinal deviation and the vertical deviation, and determine the shot offset quality control accuracy of the target complex work area according to the shot point offset.

2. The method for improving the quality control accuracy of complex surface shot deviation according to claim 1, characterized in that: The static correction process for a single shot in the field in a complex target area includes: Obtain the single shot time of a single shot in the field in a complex target area; Determining the static correction amount of the field single shot according to the single shot time; Static correction processing is performed on the field single shot according to the static correction amount.

3. The method for improving the quality control accuracy of complex surface shot deviation according to claim 1, characterized in that: Determining the optimal inversion data range of the target complex work area according to the surface structure of the target complex work area and the first arrival times on both sides of a single shot in the field after static correction processing includes: Determine the line direction and the track direction of the target complex work area according to the surface structure; Selecting a line receiving data range in the work area within the single shot record arranged in the line direction; Selecting a track receiving data range within the single shot record arranged in the work area in the track direction; The optimal inversion data range of the target complex work area is determined according to the line receiving data range and the track receiving data range.

4. The method for improving the quality control accuracy of complex surface shot deviation according to claim 1, characterized in that: The first arrival of a single shot in the field within the optimal inversion data range is picked to obtain the first arrival of the target, including: Obtaining a target single shot reception record corresponding to a field single shot within the optimal inversion data range; Extract the target first arrival corresponding to the target single shot reception record.

5. The method for improving the quality control accuracy of complex surface shot deviation according to claim 1, characterized in that: The calculating of the longitudinal deviation and the vertical deviation between the real shot point position and the theoretical shot point position in the SPS file comprises: The following formula is used to calculate the longitudinal and vertical deviations between the actual shot point position and the theoretical shot point position in the SPS file: Among them, ERR x is the edge deviation, ERR y is the vertical deflection, (Z x ,Z y ) is the actual shot point position, (L x ,L y ) is the theoretical shot point position.

6. The method for improving the quality control accuracy of complex surface shot deviation according to claim 1, characterized in that: The calculating of the shot point offset according to the longitudinal offset and the vertical offset comprises: The shot point offset is calculated according to the longitudinal offset and the vertical offset using the following offset calculation formula: Among them, ERR all is the shot point offset, ERR x is the edge deviation, ERR y is the vertical deviation.

7. The method for improving the quality control accuracy of complex surface shot deviation according to claim 1, characterized in that: The inversion of the real shot point position according to the target first arrival and the detection point information in the SPS file includes: The preset near-offset distance is used to invert the real shot point position according to the target first arrival and the detection point information in the SPS file.

8. A device for improving the quality control accuracy of complex surface shot deviation, characterized in that: The device comprises: Field single-shot static correction processing module, used to perform static correction processing on field single-shot in complex target work areas; An optimal inversion data range determination module is used to determine the optimal inversion data range of the target complex work area according to the surface structure of the target complex work area and the first arrival times on both sides of a single shot in the field after static correction processing; A first arrival picking module is used to pick the first arrival of a single shot in the field within the range of the optimal inversion data, obtain the first arrival of the target, and detect the accuracy of the first arrival of the target and the preset SPS file; A real shot point position inversion module, used for inverting the real shot point position according to the target first arrival and the detection point information in the SPS file when the accuracy meets the preset accuracy threshold; The shot point offset calculation module is used to calculate the longitudinal deviation and vertical deviation of the actual shot point position and the theoretical shot point position in the SPS file, calculate the shot point offset according to the longitudinal deviation and the vertical deviation, and determine the shot point offset quality control accuracy of the target complex work area according to the shot point offset.

9. An electronic device, comprising: processor; a memory for storing instructions executable by the processor; The processor is configured to execute the instructions to implement the method for improving the quality control accuracy of complex surface shot deviation as described in any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: A computer program is stored thereon, and when the program is executed by a processor, the method for improving the quality control accuracy of complex surface shot deviation as described in any one of claims 1 to 7 is implemented.

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