Equipment system health management method, device, equipment and medium

Abstract

The invention relates to an equipment system health management method and device, equipment and a medium, and the method comprises the steps: carrying out the preliminary optimization of an original testability matrix, and removing an invalid fault-test incidence relation in the original testability matrix; dividing the testability matrix after preliminary optimization to obtain a plurality of small-scale testability matrixes; analyzing each small-scale testability matrix according to a fault-test association relationship, and decomposing each small-scale testability matrix into a set comprising an association matrix and a non-association matrix; analyzing a matrix in a set comprising an incidence matrix and a non-incidence matrix decomposed from each small-scale testability matrix, and obtaining an optimized testability matrix based on an analysis result; and performing health management on the equipment system by adopting the optimized testability matrix. The complexity of the testability matrix can be reduced, and the function implementation efficiency of the health management system is improved.

Description

Technical Field

[0001] The present invention relates to the technical field of fault diagnosis and health management, and in particular to an equipment system health management method, device, equipment and medium. Background Art

[0002] In the field of fault diagnosis and health management, it has become an important technical approach to realize the function of the equipment health management system through testability analysis. By conducting testability analysis on the equipment system, building a testability model of the equipment system, forming a correlation between the equipment failure mode and the test points of different parts of the system, and realizing the health management function of the equipment system through technical means such as test reasoning or fault equations. However, as the equipment system becomes more and more integrated, its corresponding testability model is becoming larger and more complex, which brings huge challenges to the testability model analysis for the development of health management systems. There are even cases where the testability model analysis cannot be realized because the testability model is too complex and large. Summary of the invention

[0003] The technical problem to be solved by the present invention is to provide an equipment system health management method, device, equipment and medium, which can reduce the complexity of the test matrix and improve the efficiency of realizing the functions of the health management system.

[0004] The technical solution adopted by the present invention to solve the technical problem is: to provide an equipment system health management method, comprising the following steps:

[0005] Preliminarily optimizing the original testability matrix to remove invalid fault-test association relationships in the original testability matrix;

[0006] Divide the preliminarily optimized testability matrix to obtain several small-scale testability matrices;

[0007] Analyze each of the small-scale testability matrices according to the fault-test association relationship, and decompose each of the small-scale testability matrices into a set including an associated matrix and an inassociated matrix; wherein any two matrices in the set including the associated matrix and the inassociated matrix do not have an intersection in the corresponding fault mode set and test set;

[0008] Analyze the matrices in the set including the correlation matrix and the non-correlation matrix decomposed from each of the small-scale testability matrices, and obtain an optimized testability matrix based on the analysis result;

[0009] Use the optimized testability matrix to manage the health of equipment systems.

[0010] The initial optimization of the original testability matrix to remove invalid fault-test association relationships in the original testability matrix is ​​specifically as follows:

[0011] Deleting all-0 rows, all-0 columns, all-1 rows, and all-1 columns of the original testability matrix to obtain a first testability matrix;

[0012] Compare any two rows and any two columns in the first testability matrix respectively. If there are identical rows, one row is retained and the rest of the identical rows are deleted. If there are identical columns, one column is retained and the rest of the identical columns are deleted to obtain a preliminarily optimized testability matrix.

[0013] The plurality of small-scale test matrices have one of the following characteristics:

[0014] The failure modes corresponding to any two small-scale testability matrices are exactly the same, but the corresponding tests have no intersection;

[0015] The tests corresponding to any two small-scale testability matrices are exactly the same, but the corresponding failure modes have no intersection;

[0016] There is no intersection between the failure modes and tests corresponding to any two small-scale testability matrices.

[0017] The analyzing each of the small-scale testability matrices according to the fault-test association relationship and decomposing each of the small-scale testability matrices into a set including an association matrix and a non-association matrix specifically includes:

[0018] List the tests corresponding to each failure mode in any of the small-scale testability matrices;

[0019] If there is an intersection between the tests corresponding to any two failure modes, the two failure modes and the corresponding tests are combined into a correlation matrix;

[0020] If there is no intersection between the test corresponding to the fault mode and the tests corresponding to all other fault modes, then this fault mode and the corresponding test form a non-correlation matrix;

[0021] Repeat the above steps to complete the decomposition of all the small-scale test matrices.

[0022] Before analyzing the matrices in the set including correlation matrices and non-correlation matrices decomposed from each of the small-scale test matrices, the process also includes: performing an invalid matrix elimination operation on the set including correlation matrices and non-correlation matrices decomposed from each of the small-scale test matrices, specifically: deleting the empty sets in the set including correlation matrices and non-correlation matrices decomposed from each of the small-scale test matrices.

[0023] The matrix in the set including the correlation matrix and the non-correlation matrix decomposed from each small-scale testability matrix is ​​analyzed, and an optimized testability matrix is ​​obtained based on the analysis result, specifically:

[0024] The corresponding fault modes and test modes of any two matrices in the set including the correlation matrix and the non-correlation matrix decomposed from all the small-scale testability matrices are compared. If there is an intersection in the fault mode or the test pattern, the two matrices are merged, and the remaining matrices without intersection are merged into one matrix to obtain an optimized testability matrix.

[0025] The technical solution adopted by the present invention to solve the technical problem is: to provide an equipment system health management device, comprising:

[0026] A preliminary optimization module, used to perform preliminary optimization on the original testability matrix to remove invalid fault-test association relationships in the original testability matrix;

[0027] A partitioning module is used to partition the testability matrix after preliminary optimization to obtain several small-scale testability matrices;

[0028] A first analysis module is used to analyze each of the small-scale testability matrices according to the fault-test association relationship, and decompose each of the small-scale testability matrices into a set including an associated matrix and an incorrelative matrix; wherein any two matrices in the set including the associated matrix and the incorrelative matrix do not have an intersection in the corresponding fault mode set and the test set;

[0029] A second analysis module is used to analyze the matrices in the set including the correlation matrix and the non-correlation matrix decomposed from each of the small-scale testability matrices, and obtain an optimized testability matrix based on the analysis result;

[0030] The management module is used to perform health management on the equipment system using an optimized testability matrix.

[0031] The first analysis module and the second analysis module also include: a deletion device, which is used to perform an invalid matrix elimination operation on each of the small-scale test matrices decomposed into a set including an associated matrix and an incorrelative matrix, that is, to delete the empty set in the set including an associated matrix and an incorrelative matrix decomposed into each of the small-scale test matrices.

[0032] The technical solution adopted by the present invention to solve its technical problem is: to provide an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the above-mentioned equipment system health management method when executing the computer program.

[0033] The technical solution adopted by the present invention to solve its technical problem is: providing a computer-readable storage medium on which a computer program is stored, and when the computer program is executed by a processor, the steps of the above-mentioned equipment system health management method are implemented.

[0034] Beneficial Effects

[0035] Due to the adoption of the above-mentioned technical scheme, the present invention has the following advantages and positive effects compared with the prior art: the present invention optimizes and divides the ultra-large test model to form small test matrices that have no correlation with each other in failure mode and test, thereby reducing the complexity of the test matrix and improving the efficiency of realizing the functions of the health management system. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 is a flow chart of a method for managing equipment system health in accordance with a first embodiment of the present invention;

[0037] Figure 2 is a schematic diagram of a small-scale testability matrix D15 in an embodiment of the present invention;

[0038] Figure 3 Schematic diagram of a small-scale testability matrix D14 in an embodiment of the present invention. DETAILED DESCRIPTION

[0039] The present invention will be further described below in conjunction with specific embodiments. It should be understood that these embodiments are only used to illustrate the present invention and are not intended to limit the scope of the present invention. In addition, it should be understood that after reading the content taught by the present invention, those skilled in the art can make various changes or modifications to the present invention, and these equivalent forms fall within the scope limited by the appended claims of the application equally.

[0040] The first embodiment of the present invention relates to a method for equipment system health management, such as Figure 1 As shown, the following steps are included:

[0041] Step 1: Preliminarily optimize the original testability matrix to remove invalid fault-test association relationships in the original testability matrix.

[0042] This implementation manner is illustrated using the original testability matrix D_Matrix of the fault-test correspondence relationship as an example. The original testability matrix D_Matrix has 52 rows and 24 columns, wherein the 52 rows are F1, F2, F3...F52, which are codes for fault modes, and the 24 columns are T1, T2, T3...T24, which are codes for tests.

[0043] When eliminating invalid fault-test associations in the original testability matrix, delete all-0 rows, all-0 columns, all-1 rows and all-1 columns of the original testability matrix to obtain a first testability matrix; compare any two rows and any two columns in the first testability matrix respectively, if there are identical rows, retain one row and delete the rest of the identical rows; if there are identical columns, retain one column and delete the rest of the identical columns to obtain a preliminary optimized testability matrix. In other words, delete all-0 rows, all-1 rows, all-0 columns, all-1 columns, identical rows (retain 1 row), identical columns (retain 1 column) that appear in the fault-test correspondence in the original matrix. The specific implementation method is as follows:

[0044] Construct the following vector based on the dimensions of the original test matrix D_Matrix:

[0045] F-0=[0,0,0,...,0] 1×52

[0046] F-1=[1,1,1,…,1] 1×52

[0047] T-0=[0,0,0,...,0] 24×1

[0048] T-1=[1,1,1,…,1] 24×1

[0049] Process 1: Compare the i-th row D_Matrix(i,:)(i∈[1,52]) of the original test matrix D_Matrix with F-0 if the following conditions exist:

[0050] D_Matrix(i,:)=F-0

[0051] Then the i-th row D_Matrix(i,:) of the original testability matrix D_Matrix is ​​a row of all 0s, which needs to be removed from the original testability matrix D_Matrix, such as the 24th and 32nd rows (rows marked with red boxes) of the original testability matrix D_Matrix in this embodiment. Similarly, the following processes 2, 3, and 4 are performed.

[0052] Process 2: Compare the i-th row D_Matrix(i,:)(i∈[1,52]) of the original test matrix D_Matrix with F-1 if the following conditions exist:

[0053] D_Matrix(i,:)=F-1

[0054] Then the i-th row D_Matrix(i,:) of the original testability matrix D_Matrix is ​​a row of all 1s, and it needs to be removed from the original testability matrix.

[0055] Process 3: Compare the j-th column D_Matrix(:,j)(j∈[1,24]) of the original test matrix D_Matrix with T-0 if the following conditions exist:

[0056] D_Matrix(:,j)=T-0

[0057] Then the j-th column D_Matrix(i,:) of the original testability matrix D_Matrix is ​​a full zero column and needs to be removed from the original testability matrix.

[0058] Process 4: Compare the j-th column D_Matrix(:,j)(j∈[1,24]) of the original test matrix D_Matrix with T-1 if the following conditions exist:

[0059] D_Matrix(:,j)=T-1

[0060] Then the j-th column D_Matrix(i,:) of the original testability matrix D_Matrix is ​​all 1 columns, and it needs to be removed from the original testability matrix.

[0061] Process 5: After processing in process 1, process 2, process 3, and process 4, it is necessary to determine whether the test matrix D_Matrix still has invalid test rows and columns such as all-0 rows, all-1 rows, all-0 columns, and all-1 columns after the invalid test is eliminated; if the matrix D_Matrix has invalid test rows and columns, it is necessary to perform process 1, process 2, process 3, and process 4 again until the invalid test matrix D_Matrix does not have invalid test rows and columns such as all-0 rows, all-1 rows, all-0 columns, and all-1 columns after the invalid test is eliminated. So far, the first test matrix is ​​obtained, and the next process 6 can be performed.

[0062] Process 6: For any two rows D_Matrix(i,:), D_Matrix(j,:) (i, j∈[1,52], i≠j) in the first test matrix, if the following conditions exist:

[0063] D_Matrix(i,:)=D_Matrix(j,:)

[0064] Then the i-th row D_Matrix(i,:) and the j-th row D_Matrix(j,:) in the first testability matrix are the same row. For example, the 27th and 48th rows, the 28th and 30th rows, and the 31st and 34th rows of the original testability matrix D_Matrix in this embodiment. Only one row of the same row is retained.

[0065] Process 7: For any two columns D_Matrix(:, i), D_Matrix(:, j) (i, j∈[1,24], i≠j) in the first test matrix, if the following conditions exist:

[0066] D_Matrix(:,i)=D_Matrix(:,j)

[0067] Then the i-th column D_Matrix(:, i) and the j-th row D_Matrix(:, j) in the first test matrix are the same columns. Only one of the same columns is required.

[0068] Through the above-mentioned processes 1 to 7, the initial optimization of the original testability matrix D_Matrix can be achieved to form a preliminary optimized testability matrix.

[0069] Step 2: Divide the preliminarily optimized testability matrix to obtain several small-scale testability matrices. In this step, the testability matrix obtained in the previous step is randomly divided to obtain 24 small-scale testability matrices, which can be represented as a set D = {D1, D2, D3, ..., D24}.

[0070] There are two division methods in this step. The first method is to divide the preliminarily optimized test matrix in the order of rows and columns. Any two small-scale test matrices Di and Dj (i≠j, and i, j≤24) in the set of small-scale test matrices D={D1, D2, D3, ..., D24} after division must have one of the following characteristics:

[0071] Feature 1: The failure modes corresponding to any two small-scale testability matrices are exactly the same, but the corresponding tests have no intersection; for example, in this embodiment, the failure modes corresponding to the small-scale testability matrices D5 and D6 are exactly the same, and the corresponding tests have no intersection.

[0072] D5: Fault mode set [F12, F13, F14, F15], test set [T1, T2, T3, T4, T5];

[0073] D6: Fault mode set [F12, F13, F14, F15], test set [T6, T7, T8, T9, T10];

[0074] Feature 2: The tests corresponding to any two small-scale testability matrices are exactly the same, but the corresponding fault modes have no intersection; for example, in this embodiment, the test sets corresponding to the small-scale testability matrices D5 and D9 are exactly the same, but the corresponding faults have no intersection.

[0075] D5: Fault mode set [F12, F13, F14, F15], test set [T1, T2, T3, T4, T5];

[0076] D9: Fault mode set [F16, F17, F18, F19, F20, F21], test set [T1, T2, T3, T4, T5];

[0077] Feature 3: There is no intersection between the failure modes and tests corresponding to any two small-scale testability matrices; for example, in this embodiment, there is no intersection between the failure mode set and the test set corresponding to the small-scale testability matrices D5 and D10.

[0078] D5: Fault mode set [F12, F13, F14, F15], test set [T1, T2, T3, T4, T5];

[0079] D10: Fault mode set [F16, F17, F18, F19, F20, F21], test set [T6, T7, T8, T9, T10].

[0080] The second method is: randomly select the rows and columns of the preliminarily optimized test matrix and divide them in turn. Any small-scale test matrix Di and Dj (i≠j, and i,j≤24) in the set of small-scale test matrices after division must have one of the following characteristics:

[0081] Feature 1: The failure modes corresponding to any two small-scale testability matrices are exactly the same, but the corresponding tests have no intersection; for example, in this embodiment, the failure modes corresponding to the small-scale testability matrices D5 and D6 are exactly the same, and the corresponding tests have no intersection.

[0082] D5: Fault mode set [F14, F4, F44, F46], test set [T20, T16, T8, T10, T3];

[0083] D6: Fault mode set [F14, F4, F44, F46] test set [T9, T5, T13, T18, T22];

[0084] Feature 2: The tests corresponding to any two small-scale testability matrices are exactly the same, but the corresponding fault modes have no intersection; for example, in this embodiment, the test sets corresponding to the small-scale testability matrix D5 and the matrix D9 are exactly the same, but the corresponding faults have no intersection.

[0085] D5: Fault mode set [F14, F4, F44, F46], test set [T20, T16, T8, T10, T3];

[0086] D9: Fault mode set [F2, F18, F38, F8, F33, F21], test set [T20, T16, T8, T10, T3];

[0087] Feature 3: There is no intersection between the failure modes and tests corresponding to any two small-scale testability matrices; for example, in this embodiment, there is no intersection between the failure mode set and the test set corresponding to the small-scale testability matrices D5 and D10.

[0088] D5: Fault mode set [F14, F4, F44, F46], test set [T20, T16, T8, T10, T3];

[0089] D10: Fault mode set [F2, F18, F38, F8, F33, F21], test set [T9, T5, T13, T18, T22].

[0090] Step 3: Analyze the matrices in the set including the correlation matrix and the non-correlation matrix decomposed from each of the small-scale testability matrices, and obtain an optimized testability matrix based on the analysis result.

[0091] In this step, according to the association and non-association relationship between faults and tests, the small-scale testability matrix Di (i∈[1,24]) in the set D={D1, D2, D3, …, D24} generated in the previous step is analyzed and processed respectively, and the small-scale testability matrix is ​​further decomposed to form a set Di containing association matrices and non-association matrices -Divide = {Di -Divide 1.Di -Divide 2.Di -Divide 3, ..., Di -Divide j}(i∈[1,24], j is the total number of association matrices and non-association matrices decomposed from the small-scale test matrix Di); the matrix set Di formed by the decomposition of any small-scale test matrix Di(i∈[1,24]) -Divide There is no correlation between the matrices in (i∈[1,24]) in terms of faults and tests, that is, any two matrices Di in the same matrix set -Divide m and Di -Divide n (m, n≤the total number of association matrices and non-association matrices decomposed by the small-scale matrix Di) has no intersection in the corresponding fault mode set and test set.

[0092] by Figure 2 Taking the small-scale testability matrix D15 shown in the figure as an example, the tests corresponding to each failure mode in the small-scale testability matrix D15 are listed as follows:

[0093] Failure mode F22 → test T22;

[0094] Fault mode F23 → None;

[0095] Failure mode F25 → test T12, test T13, test T16;

[0096] Failure mode F26 → test T15, test T17;

[0097] Fault mode F27 → None;

[0098] Fault mode F28 → None;

[0099] Failure mode F29 → test T12, test T16;

[0100] Fault mode F31 → None;

[0101] Failure mode F33 → None;

[0102] Failure mode F35 → test T11, test T16;

[0103] Failure mode F36 → None;

[0104] Failure mode F37 → Test T11, Test T12.

[0105] If the tests corresponding to any two fault modes have an intersection, the two fault modes and the corresponding tests are combined into an association matrix. Taking fault mode F25 as an example, its corresponding test set is [test T12, test T13, test T16], which is compared with the test sets corresponding to all other fault modes. Among them, there is an intersection with fault mode F29 (test set [test T12, test T16]), fault mode F35 (test set [test T11, test T16]) and fault mode F37 (test set [test T11, test T12]). These four fault modes can form a test matrix D-Model, and the corresponding fault mode set is [F25, F29, F35, F37], and the corresponding test set is [T11, T12, T13, T16]; and so on, until the test sets corresponding to the remaining fault modes do not have an intersection with the test sets corresponding to the matrix, then the association matrix is ​​the matrix set D15 divided by the small-scale testability matrix D15. -Divide An incidence matrix in .

[0106] If there is no intersection between the test set corresponding to the fault mode and the test sets corresponding to all other fault modes, then the matrix composed of the fault mode and its test is a non-correlated matrix, which is also the matrix set D15 divided by the small-scale testability matrix D15. -DivideA non-correlated matrix in . Such as fault mode F22 and fault mode F26. It is worth mentioning that if the corresponding values ​​between the fault mode and the test are all 0, then the set corresponding to the fault mode is an empty set.

[0107] After the above process, the small-scale test matrix D15 can form a matrix set D15 -Divide ; Other small-scale test matrices are also processed in the same way as above to form the corresponding matrix set Di -Divide (i∈[1,24]).

[0108] Since the matrix partitioning in step 2 may cause all-0 rows and all-0 columns to appear in the small-scale test matrix, an empty set will appear in the matrix set obtained after the small-scale test matrix processing in step 3, so such invalid matrices need to be eliminated.

[0109] like Figure 2 As shown in FIG. 1 , the tests associated with the fault modes F23, F27, F28, F31, F33, and F36 corresponding to the small-scale testability matrix D15 are empty sets. Therefore, the matrix set D15 formed after the small-scale testability matrix D15 is decomposed is -Divide If there are empty sets in , delete such empty sets.

[0110] Step 4: Analyze the matrices in the set including the correlation matrix and the non-correlation matrix decomposed from each of the small-scale testability matrices, and obtain an optimized testability matrix based on the analysis result.

[0111] According to the characteristics of the small-scale test matrix Di(i∈[1,24]) when the matrix is ​​partitioned in step 2, that is, the matrix set Di obtained in step 4 -Divide There may be corresponding failure modes or test correlations between (i∈[1,24]). This step generates the matrix set Di for all small-scale test matrices Di(i∈[1,24]) -Divide The matrix Di in (i∈[1,24]) -Divide (i∈[1,24], j is determined according to the number of small-scale matrix decomposition matrices) to analyze and merge the associated matrices, that is, matrix Di -Divide m and matrix Dj -Divide n(i, j∈[1,24], i≠j, m≠n) respectively compare the corresponding fault modes and tests. If there is an intersection between the fault mode and the test mode, the matrix Di -Divide m and matrix Dj -Divide n are merged, and the remaining matrices that have no correlation relationship with each other (that is, no intersection) are merged into one matrix to obtain the optimized testability matrix.

[0112] by Figure 3 The small-scale testability matrix D14 and Figure 2 As shown in the small-scale test matrix D15, the matrix set after the decomposition of the small-scale test matrix D14 is D14 -Divide .

[0113] Among them, the matrix D14 -Divide 1 is {fault mode set [F22, F26], test set [T7]}; matrix D14 -Divide 2 is {fault mode set [F23, F36], test set [T8, T10]}. Matrix D15 -Divide 1{fault mode set [F25, F29, F35, F37], test set [T11, T12, T13, T16]}, matrix D15 -Divide 2{fault mode set [F22], test set [T22]}, matrix D15 -Divide 3{failure mode set [F26], test set [T15, T17]}.

[0114] Matrix D14 -Divide 1 and matrix D15 -Divide 2. Matrix D15 -Divide 3 If there is an intersection of fault modes, the three matrices can be merged to form a matrix D_sample {fault mode set [F22, F26], test set [T7, T15, T17, T22]}; matrix D14 -Divide 2 and matrix D15 -Divide 1 Since there is no association relationship with other matrices, it forms an independent matrix. By analogy, the partition matrix set Di of all small-scale matrix sets Di is completed. -Divide By analyzing the correlation between them and merging their matrices, the original testability matrix can be optimized.

[0115] After the above steps, the original test matrix D_Matrix (52×24) in this embodiment can be optimized into two small matrices D1 (46×23) and D2 (1×1).

[0116] Step 5: Use the optimized testability matrix to perform health management on the equipment system.

[0117] It is not difficult to find that the present invention optimizes and divides the ultra-large test model to form small test matrices that have no correlation with each other in failure mode and test, thereby reducing the complexity of the test matrix and improving the efficiency of the health management system function.

[0118] A second embodiment of the present invention relates to an equipment system health management device, comprising:

[0119] A preliminary optimization module, used to perform preliminary optimization on the original testability matrix to remove invalid fault-test association relationships in the original testability matrix;

[0120] A partitioning module is used to partition the testability matrix after preliminary optimization to obtain several small-scale testability matrices;

[0121] A first analysis module is used to analyze each of the small-scale testability matrices according to the fault-test association relationship, and decompose each of the small-scale testability matrices into a set including an associated matrix and an incorrelative matrix; wherein any two matrices in the set including the associated matrix and the incorrelative matrix do not have an intersection in the corresponding fault mode set and the test set;

[0122] A second analysis module is used to analyze the matrices in the set including the correlation matrix and the non-correlation matrix decomposed from each of the small-scale testability matrices, and obtain an optimized testability matrix based on the analysis result;

[0123] The management module is used to perform health management on the equipment system using an optimized testability matrix.

[0124] The preliminary optimization module includes:

[0125] a deleting unit, used for deleting all-0 rows, all-0 columns, all-1 rows and all-1 columns of the original testability matrix to obtain a first testability matrix;

[0126] The comparison unit is used to compare any two rows and any two columns in the first testability matrix respectively. If there are identical rows, one row is retained and the other identical rows are deleted. If there are identical columns, one column is retained and the other identical columns are deleted to obtain a preliminarily optimized testability matrix.

[0127] The plurality of small-scale test matrices have one of the following characteristics:

[0128] The failure modes corresponding to any two small-scale testability matrices are exactly the same, but the corresponding tests have no intersection;

[0129] The tests corresponding to any two small-scale testability matrices are exactly the same, but the corresponding failure modes have no intersection;

[0130] There is no intersection between the failure modes and tests corresponding to any two small-scale testability matrices.

[0131] The first analysis module comprises:

[0132] A listing unit, used to list the tests corresponding to each failure mode in any of the small-scale testability matrices;

[0133] A first execution unit is used to form a correlation matrix from the two failure modes and the corresponding tests when there is an intersection between the tests corresponding to any two failure modes;

[0134] The second execution unit is used for forming a non-associative matrix with the fault mode and the corresponding test when there is no intersection between the test corresponding to the fault mode and the tests corresponding to all other fault modes.

[0135] The first analysis module and the second analysis module also include: a deletion device, which is used to perform an invalid matrix elimination operation on each of the small-scale test matrices decomposed into a set including an associated matrix and an incorrelative matrix, that is, to delete the empty set in the set including an associated matrix and an incorrelative matrix decomposed into each of the small-scale test matrices.

[0136] The second analysis module comprises:

[0137] A pattern comparison unit, used for comparing the corresponding fault patterns and test patterns of any two matrices in the set including the correlation matrix and the non-correlation matrix decomposed from all the small-scale testability matrices;

[0138] The merging unit is used to merge the two matrices when there is an intersection between the fault mode or the test mode, and merge the remaining matrices without intersection into one matrix to obtain an optimized testability matrix.

[0139] A third embodiment of the present invention relates to an electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the equipment system health management method of the first embodiment when executing the computer program.

[0140] A fourth embodiment of the present invention relates to a computer-readable storage medium having a computer program stored thereon, and when the computer program is executed by a processor, the steps of the equipment system health management method of the first embodiment are implemented.

[0141] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present application may adopt the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to disk storage and optical storage, etc.) that contain computer-usable program code.

[0142] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0143] These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer-readable memory produce a manufactured product including an instruction method, which is implemented in the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0144] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process in the computer or other programmable device. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0145] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

Claims

1. A method for equipment system health management, characterized in that: The following steps are involved: Preliminarily optimizing the original testability matrix to remove invalid fault-test association relationships in the original testability matrix; Divide the preliminarily optimized testability matrix to obtain several small-scale testability matrices; Analyze each of the small-scale testability matrices according to the fault-test association relationship, and decompose each of the small-scale testability matrices into a set including an associated matrix and an inassociated matrix; wherein any two matrices in the set including the associated matrix and the inassociated matrix do not have an intersection in the corresponding fault mode set and test set; Analyze the matrices in the set including the correlation matrix and the non-correlation matrix decomposed from each of the small-scale testability matrices, and obtain an optimized testability matrix based on the analysis result; Use the optimized testability matrix to manage the health of equipment systems.

2. The equipment system health management method according to claim 1, characterized in that: The initial optimization of the original testability matrix to remove invalid fault-test association relationships in the original testability matrix is ​​specifically as follows: Delete the all-0 rows, all-0 columns, all-1 rows and all-1 columns of the original testability matrix to obtain a first testability matrix; compare any two rows and any two columns in the first testability matrix respectively, if there are identical rows, retain one row and delete the rest of the identical rows; if there are identical columns, retain one column and delete the rest of the identical columns to obtain a preliminarily optimized testability matrix.

3. The equipment system health management method according to claim 1, characterized in that: The plurality of small-scale test matrices have one of the following characteristics: The failure modes corresponding to any two small-scale testability matrices are exactly the same, but the corresponding tests have no intersection; The tests corresponding to any two small-scale testability matrices are exactly the same, but the corresponding failure modes have no intersection; There is no intersection between the failure modes and tests corresponding to any two small-scale testability matrices.

4. The equipment system health management method according to claim 1, characterized in that: The analyzing each of the small-scale testability matrices according to the fault-test association relationship and decomposing each of the small-scale testability matrices into a set including an association matrix and a non-association matrix specifically includes: List the tests corresponding to each failure mode in any of the small-scale testability matrices; If there is an intersection between the tests corresponding to any two failure modes, the two failure modes and the corresponding tests are combined into a correlation matrix; If there is no intersection between the test corresponding to the fault mode and the tests corresponding to all other fault modes, then this fault mode and the corresponding test form a non-correlation matrix; Repeat the above steps to complete the decomposition of all the small-scale test matrices.

5. The equipment system health management method according to claim 1, characterized in that: Before analyzing the matrices in the set including the correlation matrix and the non-correlation matrix decomposed from each of the small-scale test matrices, the method further includes: An invalid matrix elimination operation is performed on each of the small-scale test matrix decompositions into a set including an incidence matrix and an incorrelation matrix, specifically: an empty set in the set including an incidence matrix and an incorrelation matrix is ​​deleted.

6. The equipment system health management method according to claim 1, characterized in that: The matrix in the set including the correlation matrix and the non-correlation matrix decomposed from each small-scale testability matrix is ​​analyzed, and an optimized testability matrix is ​​obtained based on the analysis result, specifically: The corresponding fault modes and test modes of any two matrices in the set including the correlation matrix and the non-correlation matrix decomposed from all the small-scale testability matrices are compared. If there is an intersection in the fault mode or the test pattern, the two matrices are merged, and the remaining matrices without intersection are merged into one matrix to obtain an optimized testability matrix.

7. An equipment system health management device, characterized in that: include: A preliminary optimization module, used to perform preliminary optimization on the original testability matrix to remove invalid fault-test association relationships in the original testability matrix; A partitioning module is used to partition the testability matrix after preliminary optimization to obtain several small-scale testability matrices; A first analysis module is used to analyze each of the small-scale testability matrices according to the fault-test association relationship, and decompose each of the small-scale testability matrices into a set including an associated matrix and an incorrelative matrix; wherein any two matrices in the set including the associated matrix and the incorrelative matrix do not have an intersection in the corresponding fault mode set and the test set; A second analysis module is used to analyze the matrices in the set including the correlation matrix and the non-correlation matrix decomposed from each of the small-scale testability matrices, and obtain an optimized testability matrix based on the analysis result; The management module is used to manage the health of the equipment system using an optimized testability matrix.

8. The equipment system health management device according to claim 7, characterized in that: The first analysis module and the second analysis module also include: a deletion device, which is used to perform an invalid matrix elimination operation on each of the small-scale test matrices decomposed into a set including an associated matrix and an incorrelative matrix, that is, to delete the empty set in the set including an associated matrix and an incorrelative matrix decomposed into each of the small-scale test matrices.

9. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the computer program, the steps of the equipment system health management method as described in any one of claims 1-6 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the equipment system health management method as described in any one of claims 1-6 are implemented.

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