High and low temperature impact test box

Abstract

The invention relates to the technical field of test boxes, and discloses a high and low temperature impact test box, switching assemblies are respectively arranged in a high temperature test cavity, a low temperature test cavity and a through groove, and the switching assemblies are used for performing a low temperature test and a high temperature test on a test article; the object placing assembly is arranged in the switching assembly, the object placing assembly is used for placing a test object, an adjusting assembly is arranged on the object placing assembly, and the adjusting assembly is used for adjusting the height of the object placing assembly according to the height of the test object; by holding the storage rack with a hand and pulling a pull column downwards, the pull column drives a U-shaped connecting rod to move downwards, then the two ends of the U-shaped connecting rod drive a mounting plate to move downwards, the mounting plate drives a limiting plate to move on a sliding plate through a pull plate, and one end of the sliding plate is separated from the interior of a limiting groove; at the moment, the storage rack can be pushed to move up and down on the outer side of the connecting rod, so that the height of the storage rack is adjusted to meet the test of articles with different heights, and the applicability of the device is improved.

Description

Technical Field

[0001] The invention relates to the technical field of test chambers, in particular to a high and low temperature impact test chamber. Background Art

[0002] Thermal shock test chamber is an essential testing equipment for metal, plastic, rubber, electronic and other material industries. It is used to test the material structure or composite material to see how well it can withstand continuous extremely high and low temperatures in an instant, and to detect the aging and thermal expansion and contraction properties of the sample in the shortest time.

[0003] The hot and cold shock test chamber can test different items. Since the heights of the items are different, it takes some time to select a suitable test chamber before using the test chamber. In order to quickly test the items, reduce the cost of item testing, and be able to test items of different heights, a high and low temperature shock test chamber is proposed. Summary of the invention

[0004] The purpose of the present invention is to provide a high and low temperature impact test box to solve the problems raised in the above background technology.

[0005] To achieve the above object, the present invention provides the following technical solution: a high and low temperature impact test chamber, comprising

[0006] A test box body, wherein a test chamber is installed inside the test box body, and a high-temperature test cavity and a low-temperature test cavity are respectively arranged inside the test chamber, and a through groove is opened between the high-temperature test cavity and the low-temperature test cavity;

[0007] A switching assembly, wherein the switching assembly is respectively arranged inside the high temperature test cavity, the low temperature test cavity and the through slot, and the switching assembly is used to perform low temperature test and high temperature test on the test object;

[0008] A storage component is arranged inside the switching component, and is used to place test items. An adjustment component is arranged on the storage component, and is used to adjust the height of the storage component according to the height of the test items.

[0009] Preferably, the switching assembly comprises two electric push rods, a fixed plate and a first blocking block, the two electric push rods are respectively installed at the bottom of the low-temperature test chamber and located on both sides of the high-temperature test chamber, the fixed plate is fixedly connected to one end of the push rods of the two electric push rods located inside the low-temperature test chamber, the first blocking block is fixedly connected to the bottom of the fixed plate, four connecting rods are installed at the bottom of the first blocking block, the bottom ends of the four connecting rods are fixedly connected to the second blocking block, the bottom of the second blocking block is fixedly connected to the bottom plate, two guide rods are fixedly connected to both ends of the bottom of the fixed plate, and the bottom ends of the four guide rods pass through the bottom of the low-temperature test chamber.

[0010] Preferably, the above-mentioned storage assembly includes a storage rack, two mounting plates and two pull plates, the storage rack is movably sleeved on the outer sides of the four connecting rods, two mounting grooves are provided at the bottom of the storage rack, the two mounting plates are installed inside the mounting grooves, the two pull plates are respectively hinged at two ends of the mounting plate, one end of the pull plate is hinged to a limit plate, a slide plate is fixedly connected to the inside of the mounting groove, the limit plate is slidably connected to the upper side of the slide plate, one end of the limit plate is fixedly connected to a fixed block, a first telescopic spring is fixedly connected between the fixed block and the slide plate, limiting grooves are provided on the outer sides of the four connecting rods, and one end of the limit plate is movably inserted into the inside of the limit groove.

[0011] Preferably, the above-mentioned adjustment assembly includes a U-shaped connecting rod, a tension spring and a pulling column. A groove is provided at the bottom of the storage rack, and the U-shaped connecting rod is arranged inside the groove. Both ends of the U-shaped connecting rod are respectively fixedly connected to the bottoms of two mounting plates. A circular groove is provided at the bottom of the storage rack at the center of the groove. The tension spring is fixedly connected to one end of the U-shaped connecting rod and the bottom of the circular groove. The pulling column is fixedly connected to the bottom of the U-shaped connecting rod and is located inside the circular groove.

[0012] Preferably, a buffer assembly is provided at the inner bottom of the above-mentioned high-temperature test cavity, and the buffer assembly includes a fixed tube, a second telescopic spring and a top column. The fixed tube is fixedly connected to the inner bottom of the high-temperature test cavity, one end of the second telescopic spring is fixedly connected to the inner bottom of the high-temperature test cavity and is located inside the fixed tube, the top column is movably inserted into the interior of the fixed tube, and the bottom end of the top column is fixedly connected to the other end of the second telescopic spring.

[0013] Preferably, a mounting frame is installed on the outside of the above-mentioned low-temperature test cavity, and a compressor, an electronic expansion valve and a condenser are respectively installed on the top of the mounting frame and on the rear side of the low-temperature test cavity, a cooling fan is provided on the condenser, and an evaporator is installed on the inner rear side of the low-temperature test cavity.

[0014] Preferably, a heater is installed inside the high temperature test cavity, and the heater is used for heating the high temperature test cavity.

[0015] Preferably, a first sealing ring is fixedly connected to the bottom of the fixing plate and the top of the bottom plate, and the first sealing ring is respectively located on the outside of the first blocking block and the second blocking block.

[0016] Preferably, a baffle is installed on the inner side of the test box body located on the outer side of the test chamber, a second sealing ring is installed on the outer side of the baffle, and a door is hinged on one side of the test box body.

[0017] Compared with the prior art, the present invention adopts the above technical solution and has the following technical effects:

[0018] 1. The present invention holds the storage rack by hand and then pulls the pulling column downward, so that the pulling column drives the U-shaped connecting rod to move downward, and then the two ends of the U-shaped connecting rod drive the mounting plate to move downward. The mounting plate drives the limiting plate to move on the slide plate through the pulling plate, so that one end of the slide plate is separated from the inside of the limiting groove. At this time, the storage rack can be pushed to move up and down on the outside of the connecting rod, thereby adjusting the height of the storage rack to meet the test of objects of different heights, thereby improving the applicability of the device.

[0019] 2. The present invention drives the fixed plate to move downward through the push rod of the electric push rod, so that the fixed plate drives the bottom plate to move downward through the connecting rod, thereby driving the object to move downward, and can quickly complete the high and low temperature impact test of the object. Moreover, the bottom plate is abutted against the top of the top column, so that the top column moves inside the fixed tube, and the second telescopic spring is squeezed by the force, so that the bottom plate can be buffered to prevent the bottom plate from directly colliding with the bottom of the high-temperature test chamber, thereby extending the service life of the device.

[0020] 3. In the present invention, the first sealing ring abuts against the bottom of the low-temperature test cavity, and the first blocking block moves to the inside of the through groove to seal it, thereby being able to seal the high-temperature test cavity and ensure the efficiency of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0022] Figure 1 It is a schematic diagram of the internal structure of the test box of the present invention;

[0023] Figure 2It is a schematic diagram of the box door structure of the present invention;

[0024] Figure 3 It is a schematic diagram of the fixing plate structure of the present invention;

[0025] Figure 4 This is a schematic diagram of the rear structure of the test chamber of the present invention;

[0026] Figure 5 It is a schematic diagram of the bottom structure of the storage rack of the present invention;

[0027] Figure 6 It is a schematic diagram of the top column structure of the present invention.

[0028] Explanation of the reference numerals: 1. Test box body; 2. Test chamber; 21. High temperature test chamber; 22. Low temperature test chamber; 3. Through slot; 41. Electric push rod; 42. Fixed plate; 43. First block; 44. Connecting rod; 45. Second block; 46. Bottom plate; 47. Guide rod; 51. Storage rack; 52. Mounting slot; 53. Mounting plate; 54. Pull plate; 55. Limiting plate; 56. Slide plate; 57. Fixed block; 58. First telescopic Spring; 59, groove; 510, U-shaped connecting rod; 511, circular groove; 512, tension spring; 513, pull column; 514, limit groove; 61, fixing cylinder; 62, second telescopic spring; 63, top column; 71, mounting bracket; 72, compressor; 73, evaporator; 74, electronic expansion valve; 75, condenser; 76, cooling fan; 8, heater; 9, first sealing ring; 10, baffle; 11, second sealing ring; 12, cabinet door. DETAILED DESCRIPTION

[0029] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0030] It should be noted that the structures, proportions, sizes, etc. illustrated in the drawings of this specification are only used to match the contents disclosed in the specification for people familiar with this technology to understand and read, and are not used to limit the conditions under which this application can be implemented. Therefore, they have no substantive technical significance. Any structural modification, change in proportional relationship or adjustment of size should still fall within the scope of the technical content disclosed in this application without affecting the effects and purposes that can be achieved by this application.

[0031] Example

[0032] See also Figure 1-6The present invention provides a technical solution: a high and low temperature impact test box, comprising a test box body 1, a test chamber 2 is installed inside the test box body 1, a high temperature test cavity 21 and a low temperature test cavity 22 are respectively arranged inside the test chamber 2, and a through slot 3 is opened between the high temperature test cavity 21 and the low temperature test cavity 22; a switching component, the switching component is respectively arranged inside the high temperature test cavity 21, the low temperature test cavity 22 and the through slot 3, and the switching component is used to perform low temperature test and high temperature test on the test object; a placement component, the placement component is arranged inside the switching component, the placement component is used to place the test object, and an adjustment component is arranged on the placement component, and the adjustment component is used to adjust the height of the placement component according to the height of the test object.

[0033] By setting a switching component, the high-temperature and low-temperature impact tests of the article can be quickly completed; the switching component includes two electric push rods 41, a fixed plate 42 and a first blocking block 43, the two electric push rods 41 are respectively installed at the bottom of the low-temperature test cavity 22 and are located on both sides of the high-temperature test cavity 21, the fixed plate 42 is fixedly connected to one end of the push rods of the two electric push rods 41 located inside the low-temperature test cavity 22, the first blocking block 43 is fixedly connected to the bottom of the fixed plate 42, and four connecting rods 44 are installed at the bottom of the first blocking block 43. The bottom end of the rod 44 is fixedly connected to a second blocking block 45, the bottom of the second blocking block 45 is fixedly connected to a bottom plate 46, and two guide rods 47 are fixedly connected to both ends of the bottom of the fixed plate 42, and the bottom ends of the four guide rods 47 all pass through the bottom of the low-temperature test chamber 22. The arrangement of the four guide rods 47 can ensure the stability of the movement of objects; when the low-temperature test is converted to a high-temperature test, the fixed plate 42 is driven to move downward by the push rod of the electric push rod 41, so that the fixed plate 42 drives the bottom plate 46 to move downward through the connecting rod 44, thereby driving the objects to move downward.

[0034] By setting up the storage assembly, objects of different heights can be placed; the storage assembly includes a storage rack 51, two mounting plates 53 and two pull plates 54. The storage rack 51 is movably sleeved on the outside of the four connecting rods 44. Two mounting grooves 52 are opened at the bottom of the storage rack 51. The two mounting plates 53 are installed inside the mounting grooves 52. The two pull plates 54 are respectively hinged to the two ends of the mounting plates 53. One end of the pull plate 54 is hinged to the limiting plate 55. The inside of the mounting groove 52 is fixedly connected with a slide plate 56. The limiting plate 55 is slidably connected to the upper side of the slide plate 56. One end of the limiting plate 55 is fixedly connected There is a fixing block 57, and a first telescopic spring 58 is fixedly connected between the fixing block 57 and the slide plate 56. The outer sides of the four connecting rods 44 are provided with limiting grooves 514, and one end of the limiting plate 55 is movably inserted into the inner part of the limiting groove 514; by moving the mounting plate 53 downward, the mounting plate 53 drives the limiting plate 55 to move on the slide plate 56 through the pulling plate 54, so that one end of the slide plate 56 is separated from the inner part of the limiting groove 514, and the first telescopic spring 58 is in a compressed state. At this time, the storage rack 51 can be pushed to move up and down on the outer side of the connecting rod 44, so as to adjust the height of the storage rack 51, thereby improving the applicability of the device.

[0035] By setting an adjustment component, the rack 51 can be adjusted quickly; the adjustment component includes a U-shaped connecting rod 510, a tension spring 512 and a pull column 513. A groove 59 is provided at the bottom of the rack 51. The U-shaped connecting rod 510 is provided inside the groove 59. The two ends of the U-shaped connecting rod 510 are respectively fixedly connected to the bottoms of the two mounting plates 53. A circular groove 511 is provided at the center of the groove 59 at the bottom of the rack 51. The tension spring 512 is fixedly connected to the U-shaped connecting rod 510 and the circular groove 511. At one end of the bottom, the pulling column 513 is fixedly connected to the bottom of the U-shaped connecting rod 510 and is located inside the circular groove 511; according to the height of the items, the storage rack 51 is held in the hand, and then the pulling column 513 is pulled downward, so that the pulling column 513 drives the U-shaped connecting rod 510 to move downward, and then the two ends of the U-shaped connecting rod 510 drive the mounting plate 53 to move downward, and the mounting plate 53 drives the limiting plate 55 to move on the slide plate 56 through the pulling plate 54, so that one end of the slide plate 56 is separated from the inside of the limiting groove 514.

[0036] In order to prevent the bottom plate 46 from directly colliding with the bottom of the high-temperature test cavity 21, thereby extending the service life of the device, a buffer assembly is provided at the inner bottom of the high-temperature test cavity 21, and the buffer assembly includes a fixed tube 61, a second telescopic spring 62 and a top column 63. The fixed tube 61 is fixedly connected to the inner bottom of the high-temperature test cavity 21, one end of the second telescopic spring 62 is fixedly connected to the inner bottom of the high-temperature test cavity 21 and is located inside the fixed tube 61, and the top column 63 is movably inserted into the inside of the fixed tube 61, and the bottom end of the top column 63 is fixedly connected to the other end of the second telescopic spring 62; the bottom plate 46 is in contact with the top column 63, so that the top column 63 moves inside the fixed tube 61, and the second telescopic spring 62 is squeezed by the force, thereby being able to buffer the bottom plate 46.

[0037] A mounting frame 71 is installed on the outside of the low-temperature test chamber 22, and a compressor 72, an electronic expansion valve 74 and a condenser 75 are installed on the top of the mounting frame 71. A cooling fan 76 is provided on the condenser 75, and an evaporator 73 is installed on the inner rear side of the low-temperature test chamber 22; the refrigerant is compressed by the compressor 72, and then the compressed high-temperature and high-pressure gas is subsequently sent to the inside of the condenser 75, and the high-temperature and high-pressure gas releases heat to the external environment through the condenser 75 and the cooling fan 76, and the cooled refrigerant condenses into liquid, and then the condensed liquid refrigerant enters the evaporator 73 through the electronic expansion valve 74, and then the refrigerant absorbs the heat inside the low-temperature test chamber 22 in the evaporator 73, thereby achieving the refrigeration effect, and the low-temperature test of the object can be completed.

[0038] A heater 8 is installed inside the high temperature test cavity 21 , and the heater 8 is used to heat the high temperature test cavity 21 ; during the high temperature test, the high temperature test can be performed on the object by controlling the heater 8 to start.

[0039] The bottom of the fixed plate 42 and the top of the bottom plate 46 are fixedly connected with a first sealing ring 9, and the first sealing ring 9 is respectively located on the outside of the first blocking block 43 and the second blocking block 45; the first sealing ring 9 is in contact with the bottom of the low-temperature test cavity 22, and the first blocking block 43 moves to the inside of the through groove 3 to seal it, so that the high-temperature test cavity 21 can be sealed.

[0040] A baffle 10 is installed on the inner side of the test box body 1 and the outer side of the test chamber 2, and a second sealing ring 11 is installed on the outer side of the baffle 10. A door 12 is hinged on one side of the test box body 1. The second sealing ring 11 can seal the gap between the door 12 and the baffle 10, thereby ensuring the efficiency of the test.

[0041] Working principle or structural principle, before the high and low temperature impact test is carried out on the items, the box door 12 is opened, and then the storage rack 51 is held according to the height of the items, and then the pull column 513 is pulled downward, so that the pull column 513 drives the U-shaped connecting rod 510 to move downward, and the tension spring 512 is in a stretched state, and then the two ends of the U-shaped connecting rod 510 drive the mounting plate 53 to move downward, and the mounting plate 53 drives the limiting plate 55 to move on the slide plate 56 through the pulling plate 54, so that one end of the slide plate 56 is separated from the inside of the limiting groove 514, and the first telescopic spring 58 is in a compressed state. At this time, the rack 51 can be pushed to move up and down on the outside of the connecting rod 44, so as to adjust the height of the rack 51 to meet the test of objects of different heights, thereby improving the applicability of the device; after the rack 51 is moved to a suitable height, the rack 51 is held by hand, and then the pull column 513 is released, so that the first telescopic spring 58 drives one end of the limiting plate 55 to be inserted into the inside of the limiting groove 514, and the rack 51 is fixed. At the same time, the tension spring 512 drives the pull column 513 to reset, so that one end of the pull column 513 moves to the inside of the circular groove 511;

[0042] Place the items on the storage rack 51, and then close the door 12. At this time, the refrigerant can be compressed by the compressor 72, and then the compressed high-temperature and high-pressure gas is sent to the inside of the condenser 75. The high-temperature and high-pressure gas releases heat to the external environment through the condenser 75 and the cooling fan 76. The cooled refrigerant condenses into liquid, and then the condensed liquid refrigerant enters the evaporator 73 through the electronic expansion valve 74. Then the refrigerant absorbs the heat inside the low-temperature test chamber 22 in the evaporator 73, thereby achieving the refrigeration effect, and the low-temperature test of the items can be completed; when a high-temperature test is required, the push rod of the electric push rod 41 is reset by controlling the switch group, so that the push rod of the electric push rod 41 drives the fixed plate 42 to move downward, so that the fixed plate 42 drives the bottom plate 46 to move downward through the connecting rod 44, thereby driving the article to move downward, and the bottom plate 46 abuts against the top of the top column 63, so that the top column 63 moves inside the fixed tube 61, and the second telescopic spring 62 is squeezed by the force, so that the bottom plate 46 can be buffered to prevent the bottom plate 46 from directly colliding with the bottom of the high-temperature test chamber 21, thereby extending the service life of the device and preventing the test article from shifting. At the same time, the first sealing ring 9 abuts against the bottom of the low-temperature test chamber 22, and the first blocking block 43 moves to the inside of the through groove 3 to seal it, which can seal the high-temperature test chamber 21 and ensure the efficiency of the test. During the high-temperature test, the heater 8 is started by controlling the switch group to perform a high-temperature test on the article.

[0043] It will be appreciated by those skilled in the art that the features described in the various embodiments and / or claims of the present invention may be combined and / or combined in various ways, even if such combinations and / or combinations are not explicitly described in the present invention. In particular, the features described in the various embodiments and / or claims of the present invention may be combined and / or combined in various ways without departing from the spirit and teachings of the present invention. All of these combinations and / or combinations fall within the scope of the present invention.

Claims

1. A high and low temperature impact test chamber, characterized in that: include A test box body (1), wherein a test chamber (2) is installed inside the test box body (1), a high temperature test cavity (21) and a low temperature test cavity (22) are respectively arranged inside the test chamber (2), and a through groove (3) is provided between the high temperature test cavity (21) and the low temperature test cavity (22); A switching assembly, wherein the switching assembly is respectively arranged inside the high temperature test cavity (21), the low temperature test cavity (22) and the through slot (3), and the switching assembly is used to perform a low temperature test and a high temperature test on the test object; A storage component is arranged inside the switching component, and is used to place test items. An adjustment component is arranged on the storage component, and is used to adjust the height of the storage component according to the height of the test items.

2. A high and low temperature impact test chamber according to claim 1, characterized in that: The switching assembly comprises two electric push rods (41), a fixing plate (42) and a first blocking block (43); the two electric push rods (41) are respectively installed at the bottom of the low-temperature test chamber (22) and are located on both sides of the high-temperature test chamber (21); the fixing plate (42) is fixedly connected to one end of the push rods of the two electric push rods (41) located inside the low-temperature test chamber (22); the first blocking block (43) is fixedly connected to the bottom of the fixing plate (42); four connecting rods (44) are installed at the bottom of the first blocking block (43); the bottom ends of the four connecting rods (44) are fixedly connected to the second blocking block (45); the bottom of the second blocking block (45) is fixedly connected to the bottom plate (46); two guide rods (47) are fixedly connected to both ends of the bottom of the fixing plate (42); the bottom ends of the four guide rods (47) all pass through the bottom of the low-temperature test chamber (22).

3. A high and low temperature impact test chamber according to claim 2, characterized in that: The storage assembly comprises a storage rack (51), two mounting plates (53) and two pull plates (54); the storage rack (51) is movably sleeved on the outer sides of the four connecting rods (44); two mounting grooves (52) are provided at the bottom of the storage rack (51); the two mounting plates (53) are mounted inside the mounting grooves (52); the two pull plates (54) are respectively hinged to the two ends of the mounting plate (53); one end of the pull plate (54) is hinged to a limit plate (55), a slide plate (56) is fixedly connected inside the installation groove (52), the limit plate (55) is slidably connected to the upper side of the slide plate (56), one end of the limit plate (55) is fixedly connected to a fixed block (57), a first telescopic spring (58) is fixedly connected between the fixed block (57) and the slide plate (56), and the outer sides of the four connecting rods (44) are each provided with a limit groove (514), and one end of the limit plate (55) is movably inserted into the inside of the limit groove (514).

4. A high and low temperature impact test chamber according to claim 3, characterized in that: The adjustment assembly comprises a U-shaped connecting rod (510), a tension spring (512) and a pull column (513); a groove (59) is provided at the bottom of the storage rack (51); the U-shaped connecting rod (510) is arranged inside the groove (59); two ends of the U-shaped connecting rod (510) are respectively fixedly connected to the bottoms of two mounting plates (53); a circular groove (511) is provided at the bottom of the storage rack (51) at the center of the groove (59); the tension spring (512) is fixedly connected to one end of the U-shaped connecting rod (510) and the bottom of the circular groove (511); and the pull column (513) is fixedly connected to the bottom of the U-shaped connecting rod (510) and is located inside the circular groove (511).

5. The high and low temperature impact test chamber according to claim 1, characterized in that: A buffer assembly is provided at the inner bottom of the high temperature test cavity (21), and the buffer assembly comprises a fixed tube (61), a second telescopic spring (62) and a top column (63); the fixed tube (61) is fixedly connected to the inner bottom of the high temperature test cavity (21); one end of the second telescopic spring (62) is fixedly connected to the inner bottom of the high temperature test cavity (21) and is located inside the fixed tube (61); the top column (63) is movably inserted into the interior of the fixed tube (61); and the bottom end of the top column (63) is fixedly connected to the other end of the second telescopic spring (62).

6. The high and low temperature impact test chamber according to claim 1, characterized in that: A mounting frame (71) is installed on the outside of the low-temperature test chamber (22); a compressor (72), an electronic expansion valve (74) and a condenser (75) are installed on the top of the mounting frame (71); a heat dissipation fan (76) is provided on the condenser (75); and an evaporator (73) is installed on the rear side of the low-temperature test chamber (22).

7. The high and low temperature impact test chamber according to claim 1, characterized in that: A heater (8) is installed inside the high-temperature test cavity (21), and the heater (8) is used to heat the high-temperature test cavity (21).

8. The high and low temperature impact test chamber according to claim 2, characterized in that: A first sealing ring (9) is fixedly connected to the bottom of the fixed plate (42) and the top of the bottom plate (46), and the first sealing ring (9) is respectively located on the outside of the first blocking block (43) and the second blocking block (45).

9. The high and low temperature impact test chamber according to claim 1, characterized in that: A baffle (10) is installed on the inner side of the test box body (1) and located on the outer side of the test chamber (2), a second sealing ring (11) is installed on the outer side of the baffle (10), and a door (12) is hinged on one side of the test box body (1).

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