Stamping part defect detection method and system

Abstract

The invention provides a stamping part defect detection method and system, and relates to the technical field of stamping part defect detection.The method comprises the steps that a sample stamping part finished product is obtained; collecting an appearance image; determining a trial assembly result; obtaining a to-be-tested sample stamping part finished product; determining a quantity ratio; setting a first sampling point and a second sampling point, and determining first sampling position information and second sampling position information; setting a first reference sampling point and a second reference sampling point, and determining first reference position information and second reference position information; determining the shape defect score of the stamping part; acquiring a load value of detection equipment, and detecting an indentation area and an indentation depth; determining a hardness defect score of the stamping part; determining the defect detection score of the whole stamping part; and generating a stamping part defect detection report. According to the method, the defects of the stamping part can be comprehensively evaluated according to the shape defects and the hardness defects of the stamping part, and the comprehensiveness and the accuracy of defect detection of the stamping part are improved.

Description

Technical Field

[0001] The present invention relates to the technical field of stamping part defect detection, and in particular to a stamping part defect detection method and system. Background Art

[0002] In the related art, CN114187267A discloses a stamping part defect detection method based on machine vision, which collects stamping part images, performs edge detection on stamping part images using LOG operators of different scales, and obtains multiple stamping part edge images of different scales; extracts non-background pixels in each stamping part edge image as possible edge points, calculates the scale deviation of each possible edge point in the stamping part edge image at the corresponding scale; obtains the actual coordinate position of each edge pixel corresponding to the stamping part edge according to the coordinate position and scale deviation in the stamping part edge image where each possible edge point is located; matches the actual coordinate position of the edge pixel point with the standard position of each standard edge pixel point in the template image to detect the defects of the stamping part. Matching the actual coordinate position with the standard position in the template image can ensure the accuracy of the matching, making the defect detection result of the stamping part more accurate.

[0003] CN117830139A discloses a method for defect detection of high-strength stamping parts. The method obtains the comprehensive grayscale characteristic value of the pixel points in the stamping part image; obtains the edge significance of the pixel points in the original stamping part grayscale image according to the difference between the distribution of the comprehensive grayscale characteristic value of the pixel points in the original stamping part grayscale image and the corresponding matching pixel points in the sub-stamping part grayscale image of each scale; uses the preset grayscale value standard deviation to adjust the original stamping part grayscale image based on the adjusted grayscale value standard deviation to obtain the stamping part enhanced grayscale image for defect detection. The scheme adaptively adjusts the preset grayscale value standard deviation based on the edge significance, suppresses noise points in the image, improves the image denoising efficiency, and increases the accuracy of high-strength stamping part defect detection.

[0004] Based on the above related technologies, the accuracy of stamping part defect detection can be improved. However, the related technologies are unable to detect shape defects and hardness defects of stamping parts, that is, they are unable to comprehensively detect defects of stamping parts based on the shape defect conditions and hardness defect conditions of stamping parts.

[0005] The information disclosed in the background technology section of this application is only intended to deepen the understanding of the general background technology of this application, and should not be regarded as an admission or any form of suggestion that the information constitutes the prior art already known to those skilled in the art. Summary of the invention

[0006] The present invention provides a stamping part defect detection method and system, which can solve the technical problem that the related technology cannot comprehensively detect the defects of the stamping parts according to the shape defect conditions and hardness defect conditions of the stamping parts.

[0007] According to a first aspect of the present invention, there is provided a stamping part defect detection method, comprising:

[0008] Sampling finished stamping parts in the current batch to obtain a plurality of sample finished stamping parts;

[0009] Using an image acquisition device, collecting appearance images of multiple sample stamping parts;

[0010] Determine the test assembly results of sample stampings in the simulated assembly test cycle;

[0011] Screening the sample stamping parts according to the appearance image and the test assembly result to obtain a plurality of sample stamping parts to be tested;

[0012] Determine the quantity ratio of the finished sample stamping parts to be tested and the finished sample stamping parts;

[0013] A first sampling point is set at the vertex of the sample stamping product to be tested, and a second sampling point is set at the center of the hole of the sample stamping product to be tested, and the first sampling position information of the first sampling point in the positioning coordinate system is determined, and the second sampling position information of the second sampling point in the positioning coordinate system is determined, wherein the positioning coordinate system is a coordinate system established based on a preset origin in the measuring instrument;

[0014] A first reference sampling point is set at the vertex of the stamping die, and a second reference sampling point is set at the center of the hole of the stamping die, and the first reference position information of the first reference sampling point in the positioning coordinate system is determined, and the second reference position information of the second reference sampling point in the positioning coordinate system is determined;

[0015] Determine a stamping part shape defect score according to the first sampling position information, the second sampling position information, the first reference position information, and the second reference position information;

[0016] In the stamping part hardness test cycle, a load is applied to the finished stamping part of the sample to be tested by the testing equipment, the load value of the testing equipment is obtained, and the indentation area and indentation depth of the finished stamping part of the sample to be tested are detected by the measuring tool;

[0017] Determine a hardness defect score of the stamping part according to the load value, the indentation area and the indentation depth;

[0018] Determine the overall stamping part defect detection score according to the stamping part shape defect score, the stamping part hardness defect score and the quantity ratio;

[0019] A stamping part defect detection report is generated based on the overall stamping part defect detection score.

[0020] According to a second aspect of the present invention, there is provided a stamping part defect detection system, comprising:

[0021] A sample sampling module is used to sample the finished stamping parts in the current batch to obtain a plurality of sample finished stamping parts;

[0022] A sample image acquisition module is used to acquire appearance images of multiple sample stamping parts through an image acquisition device;

[0023] Stamping test assembly module, used to determine the test assembly results of sample stamping finished products in the simulated assembly test cycle;

[0024] A sample screening module, used to screen sample stamping finished products according to the appearance image and the test assembly result, and obtain a plurality of sample stamping finished products to be tested;

[0025] A sample quantity ratio confirmation module is used to determine the quantity ratio of the sample stamping finished product to be tested and the sample stamping finished product;

[0026] A sample sampling point setting module, used to set a first sampling point at the vertex of the sample stamping product to be tested, and set a second sampling point at the center of the hole of the sample stamping product to be tested, determine the first sampling position information of the first sampling point in the positioning coordinate system, and determine the second sampling position information of the second sampling point in the positioning coordinate system, wherein the positioning coordinate system is a coordinate system established based on a preset origin in the measuring instrument;

[0027] A mold sampling point setting module, used to set a first reference sampling point at the vertex of the stamping mold, and set a second reference sampling point at the center of the hole of the stamping mold, determine the first reference position information of the first reference sampling point in the positioning coordinate system, and determine the second reference position information of the second reference sampling point in the positioning coordinate system;

[0028] A shape defect scoring module, used to determine a stamping part shape defect score according to the first sampling position information, the second sampling position information, the first reference position information and the second reference position information;

[0029] The sample hardness test module is used to apply a load to the sample stamping product to be tested through the detection equipment during the stamping hardness test cycle, obtain the load value of the detection equipment, and detect the indentation area and indentation depth of the sample stamping product to be tested through the measuring tool;

[0030] A hardness defect scoring module, used to determine a hardness defect score of a stamping part according to the load value, the indentation area and the indentation depth;

[0031] A defect detection scoring module, used to determine the overall stamping part defect detection score according to the stamping part shape defect score, the stamping part hardness defect score and the quantity ratio;

[0032] The defect detection report module is used to generate a stamping part defect detection report based on the overall stamping part defect detection score.

[0033] Technical effect: According to the present invention, the stamping parts samples can be screened according to their appearance quality and test results, thereby screening out a plurality of stamping parts samples to be tested, and the stamping parts defects can be comprehensively detected through the two aspects of shape defects and hardness defects of the stamping parts samples to be tested, thereby improving the comprehensiveness and accuracy of stamping parts defect detection. When determining the stamping parts shape defect score, the stamping parts shape defect score can be determined according to the first sampling position information, the second sampling position information, the first reference position information and the second reference position information. During the calculation process, the shape defect status of the stamping parts of the sample to be tested is evaluated according to the difference in shape contour between the stamping parts of the sample to be tested and the stamping parts mold, the difference in the position and size of the holes, and the difference in size. When determining the shape contour difference, the cosine similarity operation is performed based on the first sampling space vector formed by two different first sampling points on the stamping parts of the sample to be tested and the first reference space vector formed by the corresponding two different first reference sampling points, and the minimum value of the similarity is taken, so as to facilitate the determination of the maximum condition of the shape contour difference, thereby improving the comprehensiveness and accuracy of the stamping parts shape defect score. When determining the hardness defect score of the stamping parts, the hardness defect score of the stamping parts can be determined based on the deformation coefficient change rate, deformation coefficient and load value of the finished sample stamping parts to be tested. During the calculation process, the hardness of the finished sample stamping parts to be tested under the load condition that does not reach the limit and under the load condition that reaches the limit can be accurately analyzed based on the load value and deformation coefficient borne by the finished sample stamping parts to be tested during the stamping parts hardness test cycle. Furthermore, the hardness defects of the stamping parts can be evaluated based on the hardness stability and hardness of the finished sample stamping parts to be tested, thereby improving the comprehensiveness and accuracy of the hardness defect score of the stamping parts.

[0034] It should be understood that the above general description and the following detailed description are exemplary and explanatory only and do not limit the present invention. Other features and aspects of the present invention will become more apparent from the following detailed description of exemplary embodiments with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other embodiments can be obtained based on these drawings without creative work.

[0036] Figure 1 A schematic diagram exemplarily shows a flow chart of a stamping part defect detection method according to an embodiment of the present invention;

[0037] Figure 2 A block diagram of a stamping part defect detection system according to an embodiment of the present invention is exemplarily shown. DETAILED DESCRIPTION

[0038] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0039] The technical solution of the present invention is described in detail with specific embodiments below. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described in detail in some embodiments.

[0040] Figure 1 A schematic flow chart of a stamping part defect detection method according to an embodiment of the present invention is exemplarily shown, and the method comprises:

[0041] Step S101, sampling finished stamping parts in the current batch to obtain a plurality of sample finished stamping parts;

[0042] Step S102, collecting appearance images of a plurality of sample stamping parts finished products by using an image acquisition device;

[0043] Step S103, determining the test assembly result of the sample stamping finished product in the simulated assembly test cycle;

[0044] Step S104, screening the sample stamping parts according to the appearance image and the test assembly result to obtain a plurality of sample stamping parts to be tested;

[0045] Step S105, determining the quantity ratio of the sample stamping parts to be tested and the sample stamping parts;

[0046] Step S106, setting a first sampling point at the vertex of the sample stamping product to be tested, and setting a second sampling point at the center of the hole of the sample stamping product to be tested, determining the first sampling position information of the first sampling point in the positioning coordinate system, and determining the second sampling position information of the second sampling point in the positioning coordinate system, wherein the positioning coordinate system is a coordinate system established based on a preset origin in the measuring instrument;

[0047] Step S107, setting a first reference sampling point at the vertex of the stamping die, and setting a second reference sampling point at the center of the hole of the stamping die, determining the first reference position information of the first reference sampling point in the positioning coordinate system, and determining the second reference position information of the second reference sampling point in the positioning coordinate system;

[0048] Step S108, determining a stamping part shape defect score according to the first sampling position information, the second sampling position information, the first reference position information, and the second reference position information;

[0049] Step S109, in the stamping part hardness test cycle, a load is applied to the sample stamping part to be tested by a testing device, a load value of the testing device is obtained, and an indentation area and indentation depth of the sample stamping part to be tested are detected by a measuring tool;

[0050] Step S110, determining a hardness defect score of a stamping part according to the load value, the indentation area and the indentation depth;

[0051] Step S111, determining the overall stamping part defect detection score according to the stamping part shape defect score, the stamping part hardness defect score and the quantity ratio;

[0052] Step S112, generating a stamping part defect detection report according to the overall stamping part defect detection score.

[0053] According to the stamping part defect detection method of the embodiment of the present invention, the stamping part samples can be screened according to their appearance quality and trial assembly results, thereby screening out a plurality of stamping part samples to be tested, and the stamping part defects can be comprehensively detected from two aspects of shape defects and hardness defects of the stamping part samples to be tested, thereby improving the comprehensiveness and accuracy of stamping part defect detection.

[0054] According to an embodiment of the present invention, in step S101, sampling is performed among the finished stamping parts in the current batch to obtain a plurality of sample finished stamping parts.

[0055] For example, random sampling is performed in the current batch of stamping parts to obtain a plurality of sample stamping parts. The efficiency of the inspection can be improved by randomly selecting the sample stamping parts for inspection.

[0056] According to an embodiment of the present invention, in step S102, appearance images of a plurality of sample stamping parts are collected by an image acquisition device.

[0057] For example, a camera can be used to collect appearance images of sample stamping parts from multiple angles.

[0058] According to an embodiment of the present invention, in step S103, during the simulated assembly test cycle, the test assembly result of the sample stamping part product is determined.

[0059] According to one embodiment of the present invention, step S103 includes:

[0060] Sampling the parts of the sample stamping finished product to determine three parts samples;

[0061] According to the matching results of the sample stamping product and the three component samples, a first component matching result, a second component matching result and a third component matching result are determined;

[0062] The trial assembly result of the sample stamping part finished product is determined according to the first component matching result, the second component matching result and the third component matching result.

[0063] For example, by means of simulated assembly, the sample stamping parts are trial-assembled with other parts to detect the matching degree between the sample stamping parts and the parts; since the sample stamping parts may have multiple parts, in order to improve the screening efficiency, the parts of the sample stamping parts are randomly sampled to screen three parts samples; according to the matching results of the sample stamping parts with the three parts samples, the first part matching result, the second part matching result and the third part matching result are determined respectively; if the sample stamping parts are successfully trial-assembled with the first part sample (the sample stamping parts are successfully matched with the part sample, and there is no obvious gap or misalignment), the value of the first part matching result is 1; if the sample stamping parts are unsuccessfully trial-assembled with the first part sample, the value of the first part matching result is 0; the second part matching result is 0. The calculation method of the matching result and the third component matching result is the same as the calculation method of the first component matching result mentioned above, which will not be repeated here; the trial assembly result of the sample stamping finished part is determined according to the product of the first component matching result, the second component matching result and the third component matching result. If the first component matching result, the second component matching result and the third component matching result are all 1, then the trial assembly result of the sample stamping finished part is 1, indicating that the sample stamping finished part and the three component samples are successfully trial-assembled. If the value of any one of the first component matching result, the second component matching result and the third component matching result is 0, then the trial assembly result of the sample stamping finished part is 0, indicating that the sample stamping finished part cannot be successfully trial-assembled with all the component samples, the component matching of the sample stamping finished part is poor, and the sample stamping finished part has functional defects.

[0064] According to an embodiment of the present invention, in step S104, sample stamping finished products are screened according to the appearance image and the test assembly result to obtain a plurality of sample stamping finished products to be tested.

[0065] According to one embodiment of the present invention, step S104 includes:

[0066] In the appearance image, identifying whether there is physical damage on the surface of the stamping part through an image detection model, and determining the physical damage result;

[0067] Determine the sample stamping parts finished product screening result according to the physical damage result and the test assembly result;

[0068] According to the screening results of the sample stamping parts finished products, a plurality of sample stamping parts finished products to be tested are obtained.

[0069] For example, the image detection model is a type of deep learning model. The image detection model is trained through historical data so that the image detection model can identify whether there is physical damage on the surface of the stamping parts. The image detection model is used to identify whether there is physical damage on the surface of the stamping parts. If there is no physical damage on the surface of the stamping parts (for example, cracks, pits, deformations and scratches), the physical damage result is 1; if there is damage on the surface of the stamping parts, the physical damage result is 0; the sample stamping parts finished product screening result is determined according to the product of the physical damage result and the trial assembly result. If the sample stamping parts finished product screening result of the sample stamping parts finished product is 1, it means that the appearance of the sample stamping parts finished product has no physical damage, and the sample stamping parts finished product can match all parts, and the sample stamping parts finished product has no appearance defects and functional defects. The sample stamping parts finished product is determined to be the sample stamping parts finished product to be tested. If the sample stamping parts finished product screening result of the sample stamping parts finished product is 0, it means that the appearance of the sample stamping parts finished product has physical damage, or the sample stamping parts finished product cannot match all parts, and the sample stamping parts finished product has appearance defects or functional defects.

[0070] According to an embodiment of the present invention, in step S105, the quantity ratio of the sample stamping finished product to be tested and the sample stamping finished product is determined.

[0071] For example, the ratio of the number of sample stamping parts to be tested and the number of sample stamping parts is determined based on the number of sample stamping parts to be tested and the number of sample stamping parts. The larger the ratio, the smaller the number of stamping parts with appearance defects and functional defects in the sample stamping parts.

[0072] According to one embodiment of the present invention, in step S106, a first sampling point is set at the vertex of the sample stamping product to be tested, and a second sampling point is set at the center of the hole of the sample stamping product to be tested, and the first sampling position information of the first sampling point in the positioning coordinate system is determined, and the second sampling position information of the second sampling point in the positioning coordinate system is determined, wherein the positioning coordinate system is a coordinate system established based on a preset origin in the measuring instrument.

[0073] For example, a first sampling point is set at the vertex of the finished sample stamping part to be tested, and a second sampling point is set at the center of the hole of the finished sample stamping part to be tested, the finished sample stamping part to be tested is placed in a measuring instrument, and the probe system of the measuring instrument is moved to the first sampling point and the second sampling point of the finished sample stamping part to be tested, and the first sampling position information of the first sampling point in the positioning coordinate system and the second sampling position information of the second sampling point in the positioning coordinate system are determined.

[0074] According to one embodiment of the present invention, in step S107, a first reference sampling point is set at the vertex of the stamping die, and a second reference sampling point is set at the center of the hole of the stamping die, and the first reference position information of the first reference sampling point in the positioning coordinate system is determined, and the second reference position information of the second reference sampling point in the positioning coordinate system is determined.

[0075] For example, a first reference sampling point is set at the vertex of the stamping die, and a second reference sampling point is set at the center of the hole of the stamping die. The stamping die is placed in a measuring instrument, and the probe system of the measuring instrument is moved to the first reference sampling point and the second reference sampling point of the stamping die to determine the first reference position information of the first reference sampling point in the positioning coordinate system and the second reference position information of the second reference sampling point in the positioning coordinate system.

[0076] According to one embodiment of the present invention, in step S108, determining a stamping part shape defect score according to the first sampling position information, the second sampling position information, the first reference position information, and the second reference position information includes:

[0077] Obtaining the sampling diameter of the hole of the finished stamping part of the sample to be tested;

[0078] Obtain the reference diameter of the hole of the stamping die;

[0079] Determine a sampling hole element vector according to the sampling diameter and the second sampling position information;

[0080] Determining a reference hole element vector according to the reference diameter and the second reference position information;

[0081] A stamping part shape defect score is determined according to the first sampling position information, the first reference position information, the sampling hole element vector, and the reference hole element vector.

[0082] For example, the sampling diameter of the hole of the finished sample stamping part to be tested is measured by a measuring instrument; the reference diameter of the hole of the stamping part mold is measured by a measuring instrument; the sampling hole element vector is determined based on the sampling diameter of the hole of the finished sample stamping part to be tested and the second sampling position information of the center of the hole; the reference hole element vector is determined based on the reference diameter of the hole of the stamping part mold and the second reference position information of the center of the hole; based on the first sampling position information, the first reference position information, the sampling hole element vector and the reference hole element vector, the shape defect status of the stamping part is evaluated and the shape defect score of the stamping part is determined.

[0083] According to one embodiment of the present invention, the stamping part shape defect score is determined according to the first sampling position information, the first reference position information, the sampling hole element vector and the reference hole element vector, including: determining the stamping part shape defect score Spsd of the i-th sample stamping part to be tested according to formula (1): i ,

[0084]

[0085] Among them, α1 and α2 are preset weights, max is the maximum value function, min is the minimum value function, A i，k，sa is the first sampling position information of the kth first sampling point of the i-th sample stamping product to be tested, A i，j，sa is the first sampling position information of the jth first sampling point of the i-th sample stamping product to be tested, (A i，k，sa -A i，j，sa ) is the first sampling space vector formed by the kth first sampling point of the i-th sample stamping product to be tested and the jth first sampling point of the i-th sample stamping product to be tested, (A i，k，sa -A i，j，sa ) T For (A i，k，sa -A i，j，sa ), A k，st is the first reference position information of the kth first reference sampling point of the stamping die, A j，st is the first reference position information of the jth first reference sampling point of the stamping die, (A k，st -A j，st ) is the first reference space vector formed by the kth first reference sampling point of the stamping die and the jth first reference sampling point of the stamping die, D i，r，sa is the sampling diameter of the rth hole of the i-th sample stamping product to be tested, SA i，r，sa is the second sampling position information of the rth hole of the i-th sample stamping product to be tested, is the sampling hole element vector of the rth hole of the i-th sample stamping product to be tested, for The transposed vector, D r，st is the base diameter of the rth hole of the stamping die, SA r，st is the second reference position information of the rth hole of the stamping die, is the reference hole element vector of the rth hole of the stamping die, G T is the preset mold gap threshold, m is the number of vertices of the i-th sample stamping product to be tested, j≤m, k≤m, R is the number of holes of the i-th sample stamping product to be tested, r≤R, j, k, m, r and R are all positive integers.

[0086] According to one embodiment of the present invention, is the cosine similarity between the first sampling space vector formed by the kth first sampling point and the jth first sampling point of the ith sample stamping part to be tested and the first reference space vector formed by the kth first reference sampling point and the jth first reference sampling point of the stamping part die. The larger the cosine similarity, the smaller the difference in contour shape between the sample stamping part to be tested and the stamping part die at the contour line formed by the kth first sampling point and the jth first sampling point. The minimum value of the cosine similarity between the first sampling space vector formed by any two first sampling points in the i-th sample stamping part to be tested and the first reference space vector formed by two first reference sampling points corresponding to the stamping part mold is taken. The above-mentioned minimum value processing can be used to determine the situation where the contour shape difference between the i-th sample stamping part to be tested and the stamping part mold is the largest. The smaller the value, the greater the contour shape difference between the i-th sample stamping part to be tested and the stamping part mold, the more serious the shape defect of the i-th sample stamping part to be tested, and the greater the stamping part shape defect score. is the cosine similarity between the sampling hole element vector of the rth hole of the i-th sample stamping product to be tested and the reference hole element vector of the rth hole of the stamping die. The larger the cosine similarity, the smaller the difference between the center position and diameter of the rth hole of the i-th sample stamping product to be tested and the center position and diameter of the rth hole of the stamping die. The minimum value of the cosine similarity between the sampling hole element vector of any hole in the i-th sample stamping part to be tested and the reference hole element vector of the corresponding hole in the stamping part mold is taken. The above-mentioned minimum value processing can be used to determine the situation where the position and size difference between the hole of the sample stamping part to be tested and the corresponding hole in the stamping part mold is the largest, which is convenient for determining the severity of the shape defects of the sample stamping part to be tested. The smaller the value, the more serious the shape defect of the i-th sample stamping part to be tested is, and the larger the stamping part shape defect score is.

[0087] According to one embodiment of the present invention, The relative difference between the first reference position information of the jth first reference sampling point of the stamping part die and the first sampling position information of the jth first sampling point of the i-th sample stamping part to be tested and the preset die difference threshold, the larger the ratio is, the greater the size difference between the i-th sample stamping part to be tested and the stamping part die at the jth first sampling point is; The maximum value of the relative difference between the first reference position information of any first reference sampling point of the stamping part die and the first sampling position information of the corresponding first sampling point in the i-th sample stamping part to be tested and the preset die difference threshold is taken. The above-mentioned maximum value processing can be used for the maximum condition of the size difference between the i-th sample stamping part to be tested and the stamping part die. The larger the value, the more serious the shape defect of the i-th sample stamping part to be tested, and the stamping part shape defect score.

[0088] In this way, the shape defect score of the stamping part can be determined according to the first sampling position information, the second sampling position information, the first reference position information and the second reference position information. During the calculation process, the shape defect status of the finished sample stamping part to be tested is evaluated according to the difference in shape contour between the finished sample stamping part to be tested and the stamping part mold, the difference in hole position and size, and the difference in size. When determining the shape contour difference, the cosine similarity operation is performed based on the first sampling space vector composed of two different first sampling points on the finished sample stamping part to be tested and the first reference space vector composed of the corresponding two different first reference sampling points, and the minimum value of the similarity is taken, which is convenient for determining the maximum condition of the shape contour difference, thereby improving the comprehensiveness and accuracy of the shape defect score of the stamping part.

[0089] According to one embodiment of the present invention, in step S109, during the stamping part hardness test cycle, a load is applied to the sample stamping part to be tested by a testing device, the load value of the testing device is obtained, and the indentation area and indentation depth of the sample stamping part to be tested are detected by a measuring tool.

[0090] For example, during the stamping part hardness test cycle, a load is applied to the surface of the sample stamping part to be tested by the testing equipment, wherein the load value increases at a uniform rate and reaches a preset standard load value at the end of the stamping part hardness test cycle. At the same time, the load value applied by the testing equipment is obtained and recorded, and the indentation area and indentation depth of the sample stamping part to be tested are detected by the measuring tool.

[0091] According to an embodiment of the present invention, in step S110, a hardness defect score of a stamping part is determined according to the load value, the indentation area and the indentation depth.

[0092] According to one embodiment of the present invention, step S110 includes:

[0093] Determining a deformation coefficient according to the indentation area and the indentation depth;

[0094] Fitting the deformation coefficient and the load value to obtain a deformation coefficient function in a stamping part hardness test cycle;

[0095] Determining a deformation coefficient derivative function according to the deformation coefficient function;

[0096] Determining the deformation coefficient change rate according to the deformation coefficient derivative function;

[0097] The hardness defect score of the stamping part is determined according to the deformation coefficient change rate, the deformation coefficient and the load value.

[0098] For example, a weighted sum is taken based on the indentation area and the indentation depth to determine the deformation coefficient, which represents the deformation condition of the finished sample stamping part to be tested. The larger the deformation coefficient, the more verified the deformation condition of the finished sample stamping part to be tested. The deformation coefficient and the load value are fitted to obtain a deformation coefficient function that describes the law that the deformation coefficient in the stamping part hardness test cycle increases with the increase of the load value. The deformation coefficient function is differentiated to determine the deformation coefficient derivative function. Multiple load values ​​in the stamping part hardness test cycle are substituted into the deformation coefficient derivative function to determine multiple deformation coefficient change rates. According to the deformation coefficient change rate, the deformation coefficient and the load value, the hardness of the stamping part is evaluated to determine the stamping part hardness defect score.

[0099] According to one embodiment of the present invention, the hardness defect score of the stamping part is determined according to the deformation coefficient change rate, the deformation coefficient and the load value, including: determining the stamping part hardness defect score Spss of the i-th sample stamping part to be tested according to formula (2): i ,

[0100]

[0101] Among them, β1, β2 and β3 are preset weights, F E DC1(F E ) is the deformation coefficient caused by the load value at the end of the stamping hardness test cycle, F e is the load value of the sample stamping product to be tested at the eth moment of the stamping hardness test cycle, DC1(F e ) is the deformation coefficient caused by the load value at the eth moment of the stamping hardness test cycle, DC'1(F e ) is the deformation coefficient change rate of the stamping product of the sample to be tested at the eth moment of the stamping hardness test cycle, DC' t is the preset threshold value of the deformation coefficient change rate, E is the number of moments in the stamping part hardness test cycle, e≤E, and both e and E are positive integers.

[0102] According to one embodiment of the present invention, It is the relative difference between the average deformation coefficient change rate of the i-th sample stamping part to be tested in the stamping part hardness test cycle and the preset deformation coefficient change rate threshold. The larger the ratio is, the worse the hardness stability of the i-th sample stamping part to be tested is, and the larger the hardness defect score of the stamping part is. It is the ratio of the load value of the finished stamping part of the sample to be tested at the end of the stamping part hardness test cycle to the deformation coefficient caused by the load value at the end of the stamping part hardness test cycle, indicating the hardness of the finished stamping part of the sample to be tested when the load reaches the limit state. The smaller the ratio is, the lower the hardness of the finished stamping part of the sample to be tested when the load reaches the limit state, and the greater the hardness defect score of the stamping part; It is the ratio of the average value of the load value borne by the i-th sample stamping part finished product at the first E-1 moments of the stamping part hardness test cycle to the average value of the deformation coefficient at the first E-1 moments before the end of the stamping part hardness test cycle, which indicates the hardness condition of the i-th sample stamping part finished product under the condition of not reaching the limit. The smaller the ratio is, the lower the hardness of the i-th sample stamping part finished product under the condition of not reaching the limit, and the greater the hardness defect score of the stamping part.

[0103] In this way, the hardness defect score of the stamping parts can be determined according to the deformation coefficient change rate, deformation coefficient and load value of the finished sample stamping parts to be tested. During the calculation process, the hardness of the finished sample stamping parts to be tested under the load condition not reaching the limit and under the load condition reaching the limit can be accurately analyzed based on the load value and deformation coefficient borne by the finished sample stamping parts to be tested during the stamping parts hardness test cycle. Furthermore, the hardness defects of the stamping parts can be evaluated according to the hardness stability and hardness of the finished sample stamping parts to be tested, thereby improving the comprehensiveness and accuracy of the hardness defect score of the stamping parts.

[0104] According to one embodiment of the present invention, in step S111, the overall stamping part defect detection score is determined based on the stamping part shape defect score, the stamping part hardness defect score and the quantity ratio.

[0105] According to one embodiment of the present invention, step S111 includes:

[0106] Determine the shape defect recognition result of the i-th sample stamping part to be tested according to the stamping part shape defect score of the i-th sample stamping part to be tested;

[0107] Determine the overall shape defect recognition result according to the shape defect recognition result of the i-th sample stamping part to be tested;

[0108] Determine the hardness defect recognition result of the i-th sample stamping part to be tested according to the stamping part hardness defect score of the i-th sample stamping part to be tested;

[0109] Determine the overall hardness defect recognition result according to the hardness defect recognition result of the i-th sample stamping part to be tested;

[0110] Determining an overall defect recognition result according to the overall shape defect recognition result and the overall hardness defect recognition result;

[0111] An overall stamping part defect detection score is determined based on the overall defect identification result and the quantity ratio.

[0112] For example, if the stamping part shape defect score of the i-th sample stamping part to be tested is greater than or equal to the set stamping part shape defect score threshold, it means that the shape defect of the i-th sample stamping part to be tested is serious, and the value of the shape defect recognition result of the i-th sample stamping part to be tested is 0; if the stamping part shape defect score of the i-th sample stamping part to be tested is less than the set stamping part shape defect score threshold, it means that there is almost no shape defect in the i-th sample stamping part to be tested, and the value of the shape defect recognition result of the i-th sample stamping part to be tested is 1; the shape defect recognition results of all the sample stamping parts to be tested are averaged to determine the overall shape defect recognition result. The larger the overall shape defect recognition result, the smaller the number of sample stamping parts to be tested that have shape defects; if the stamping part hardness defect score of the i-th sample stamping part to be tested is greater than or equal to the set stamping part hardness defect score threshold, it means that the hardness defect of the i-th sample stamping part to be tested is serious, and the i-th The hardness defect recognition result of the sample stamping parts is 0. If the stamping parts hardness defect score of the i-th sample stamping parts to be tested is less than the set stamping parts hardness defect score threshold, it means that the i-th sample stamping parts to be tested have almost no hardness defects. The hardness defect recognition result of the i-th sample stamping parts to be tested is 1. The hardness defect recognition results of all the sample stamping parts to be tested are averaged to determine the overall hardness defect recognition result. The larger the overall hardness defect recognition result, the smaller the number of sample stamping parts to be tested with hardness defects. The overall defect recognition result is determined by summing the overall shape defect recognition result and the overall hardness defect recognition result. The larger the overall defect recognition result, the smaller the number of sample stamping parts to be tested with defects. The overall stamping parts defect detection score is determined according to the product of the overall defect recognition result and the quantity ratio. The larger the overall stamping parts defect detection score, the higher the overall quality of the current batch of stamping parts and the smaller the number of stamping parts with defects.

[0113] According to one embodiment of the present invention, in step S112, a stamping part defect detection report is generated according to the overall stamping part defect detection score.

[0114] For example, if the overall stamping part defect detection score is less than the set overall stamping part defect detection score threshold, the quality of the current batch of stamping parts is too low and the number of defective stamping parts is too large.

[0115] According to the stamping part defect detection method of the embodiment of the present invention, the stamping part sample can be screened according to the appearance quality and trial assembly results of the stamping part sample, so as to screen out a plurality of stamping part samples to be tested, and the stamping part defects can be comprehensively detected by the shape defects and hardness defects of the stamping part sample to be tested, thereby improving the comprehensiveness and accuracy of the stamping part defect detection. When determining the stamping part shape defect score, the stamping part shape defect score can be determined according to the first sampling position information, the second sampling position information, the first reference position information and the second reference position information. During the calculation process, the shape defect status of the stamping part of the sample to be tested is evaluated according to the difference in shape contour between the stamping part of the sample to be tested and the stamping part mold, the difference in the position and size of the hole, and the difference in size. When determining the shape contour difference, the cosine similarity operation is performed according to the first sampling space vector composed of two different first sampling points on the stamping part of the sample to be tested and the first reference space vector composed of the corresponding two different first reference sampling points, and the minimum value of the similarity is taken, so as to facilitate the determination of the maximum condition of the shape contour difference, thereby improving the comprehensiveness and accuracy of the stamping part shape defect score. When determining the hardness defect score of the stamping parts, the hardness defect score of the stamping parts can be determined based on the deformation coefficient change rate, deformation coefficient and load value of the finished sample stamping parts to be tested. During the calculation process, the hardness of the finished sample stamping parts to be tested under the load condition that does not reach the limit and under the load condition that reaches the limit can be accurately analyzed based on the load value and deformation coefficient borne by the finished sample stamping parts to be tested during the stamping parts hardness test cycle. Furthermore, the hardness defects of the stamping parts can be evaluated based on the hardness stability and hardness of the finished sample stamping parts to be tested, thereby improving the comprehensiveness and accuracy of the hardness defect score of the stamping parts.

[0116] Figure 2 A block diagram of a stamping part defect detection system according to an embodiment of the present invention is exemplarily shown, the system comprising:

[0117] A sample sampling module is used to sample the finished stamping parts in the current batch to obtain a plurality of sample finished stamping parts;

[0118] A sample image acquisition module is used to acquire appearance images of multiple sample stamping parts through an image acquisition device;

[0119] Stamping test assembly module, used to determine the test assembly results of sample stamping finished products in the simulated assembly test cycle;

[0120] A sample screening module, used to screen sample stamping finished products according to the appearance image and the test assembly result, and obtain a plurality of sample stamping finished products to be tested;

[0121] A sample quantity ratio confirmation module is used to determine the quantity ratio of the sample stamping finished product to be tested and the sample stamping finished product;

[0122] A sample sampling point setting module, used to set a first sampling point at the vertex of the sample stamping product to be tested, and set a second sampling point at the center of the hole of the sample stamping product to be tested, determine the first sampling position information of the first sampling point in the positioning coordinate system, and determine the second sampling position information of the second sampling point in the positioning coordinate system, wherein the positioning coordinate system is a coordinate system established based on a preset origin in the measuring instrument;

[0123] A mold sampling point setting module, used to set a first reference sampling point at the vertex of the stamping mold, and set a second reference sampling point at the center of the hole of the stamping mold, determine the first reference position information of the first reference sampling point in the positioning coordinate system, and determine the second reference position information of the second reference sampling point in the positioning coordinate system;

[0124] A shape defect scoring module, used to determine a stamping part shape defect score according to the first sampling position information, the second sampling position information, the first reference position information and the second reference position information;

[0125] The sample hardness test module is used to apply a load to the sample stamping product to be tested through the detection equipment during the stamping hardness test cycle, obtain the load value of the detection equipment, and detect the indentation area and indentation depth of the sample stamping product to be tested through the measuring tool;

[0126] A hardness defect scoring module, used to determine a hardness defect score of a stamping part according to the load value, the indentation area and the indentation depth;

[0127] A defect detection scoring module, used to determine the overall stamping part defect detection score according to the stamping part shape defect score, the stamping part hardness defect score and the quantity ratio;

[0128] The defect detection report module is used to generate a stamping part defect detection report based on the overall stamping part defect detection score.

[0129] The present invention may be a method, an apparatus, a system and / or a computer program product. The computer program product may include a computer-readable storage medium carrying computer-readable program instructions for executing various aspects of the present invention.

[0130] It should be understood by those skilled in the art that the embodiments of the present invention described above and shown in the accompanying drawings are only examples and do not limit the present invention. The purpose of the present invention has been fully and effectively achieved. The functional and structural principles of the present invention have been demonstrated and explained in the embodiments, and the embodiments of the present invention may be deformed or modified in any way without departing from the principles.

Claims

1. A stamping part defect detection method, characterized in that: include: Sampling finished stamping parts in the current batch to obtain a plurality of sample finished stamping parts; Using an image acquisition device, collecting appearance images of multiple sample stamping parts; Determine the test assembly results of sample stampings in the simulated assembly test cycle; Screening the sample stamping parts according to the appearance image and the test assembly result to obtain a plurality of sample stamping parts to be tested; Determine the quantity ratio of the finished sample stamping parts to be tested and the finished sample stamping parts; A first sampling point is set at the vertex of the sample stamping product to be tested, and a second sampling point is set at the center of the hole of the sample stamping product to be tested, and the first sampling position information of the first sampling point in the positioning coordinate system is determined, and the second sampling position information of the second sampling point in the positioning coordinate system is determined, wherein the positioning coordinate system is a coordinate system established based on a preset origin in the measuring instrument; A first reference sampling point is set at the vertex of the stamping die, and a second reference sampling point is set at the center of the hole of the stamping die, and the first reference position information of the first reference sampling point in the positioning coordinate system is determined, and the second reference position information of the second reference sampling point in the positioning coordinate system is determined; Determine a stamping part shape defect score according to the first sampling position information, the second sampling position information, the first reference position information, and the second reference position information; In the stamping part hardness test cycle, a load is applied to the finished stamping part of the sample to be tested by the testing equipment, the load value of the testing equipment is obtained, and the indentation area and indentation depth of the finished stamping part of the sample to be tested are detected by the measuring tool; Determine a hardness defect score of the stamping part according to the load value, the indentation area and the indentation depth; Determine the overall stamping part defect detection score according to the stamping part shape defect score, the stamping part hardness defect score and the quantity ratio; A stamping part defect detection report is generated based on the overall stamping part defect detection score.

2. The stamping part defect detection method according to claim 1, characterized in that: During the simulated assembly test cycle, the test assembly results of the sample stamping parts are determined, including: Sampling the parts of the sample stamping finished product to determine three parts samples; According to the matching results of the sample stamping product and the three component samples, a first component matching result, a second component matching result and a third component matching result are determined; The trial assembly result of the sample stamping part finished product is determined according to the first component matching result, the second component matching result and the third component matching result.

3. The stamping part defect detection method according to claim 2, characterized in that: According to the appearance image and the test assembly result, the sample stamping parts are screened to obtain a plurality of sample stamping parts to be tested, including: In the appearance image, identifying whether there is physical damage on the surface of the stamping part through an image detection model, and determining the physical damage result; Determine the sample stamping parts finished product screening result according to the physical damage result and the test assembly result; According to the screening results of the sample stamping parts finished products, a plurality of sample stamping parts finished products to be tested are obtained.

4. The stamping part defect detection method according to claim 1, characterized in that: Determining a stamping part shape defect score according to the first sampling position information, the second sampling position information, the first reference position information, and the second reference position information includes: Obtaining the sampling diameter of the hole of the finished stamping part of the sample to be tested; Obtain the reference diameter of the hole of the stamping die; Determine a sampling hole element vector according to the sampling diameter and the second sampling position information; Determining a reference hole element vector according to the reference diameter and the second reference position information; A stamping part shape defect score is determined according to the first sampling position information, the first reference position information, the sampling hole element vector, and the reference hole element vector.

5. The stamping part defect detection method according to claim 4, characterized in that: Determining a stamping part shape defect score according to the first sampling position information, the first reference position information, the sampling hole element vector, and the reference hole element vector includes: According to the formula Determine the stamping part shape defect score Spsd of the i-th sample stamping part to be tested i , where α1 and α2 are preset weights, max is the maximum value function, min is the minimum value function, A i,k,sa is the first sampling position information of the kth first sampling point of the i-th sample stamping product to be tested, A i,j,sa is the first sampling position information of the jth first sampling point of the i-th sample stamping product to be tested, (A i,k,sa -A i,j,sa ) is the first sampling space vector formed by the kth first sampling point of the i-th sample stamping product to be tested and the jth first sampling point of the i-th sample stamping product to be tested, (A i,k,sa -A i,j,sa ) T For (A i,k,sa -A i,j,sa ), A k,st is the first reference position information of the kth first reference sampling point of the stamping die, A j,st is the first reference position information of the jth first reference sampling point of the stamping die, (A k,st -A j,st ) is the first reference space vector formed by the kth first reference sampling point of the stamping die and the jth first reference sampling point of the stamping die, D i,r,sa is the sampling diameter of the rth hole of the i-th sample stamping product to be tested, SA i,r,sa is the second sampling position information of the rth hole of the i-th sample stamping product to be tested, is the sampling hole element vector of the rth hole of the i-th sample stamping product to be tested, for The transposed vector, D r,st is the base diameter of the rth hole of the stamping die, SA r,st is the second reference position information of the rth hole of the stamping die, is the reference hole element vector of the rth hole of the stamping die, G T is the preset mold gap threshold, m is the number of vertices of the i-th sample stamping product to be tested, j≤m, k≤m, R is the number of holes of the i-th sample stamping product to be tested, r≤R, j, k, m, r and R are all positive integers.

6. The stamping part defect detection method according to claim 1, characterized in that: Determining the hardness defect score of the stamping part according to the load value, the indentation area and the indentation depth includes: Determining a deformation coefficient according to the indentation area and the indentation depth; Fitting the deformation coefficient and the load value to obtain a deformation coefficient function in a stamping part hardness test cycle; Determining a deformation coefficient derivative function according to the deformation coefficient function; Determining the deformation coefficient change rate according to the deformation coefficient derivative function; The hardness defect score of the stamping part is determined according to the deformation coefficient change rate, the deformation coefficient and the load value.

7. The stamping part defect detection method according to claim 6, characterized in that: Determining the hardness defect score of the stamping part according to the deformation coefficient change rate, the deformation coefficient and the load value includes: According to the formula Determine the stamping hardness defect score Spss of the stamping product of the i-th sample to be tested i , where β1, β2 and β3 are preset weights, F E DC1(F E ) is the deformation coefficient caused by the load value at the end of the stamping hardness test cycle, F e is the load value of the sample stamping product to be tested at the eth moment of the stamping hardness test cycle, DC1(F e ) is the deformation coefficient caused by the load value at the eth moment of the stamping hardness test cycle, DC'1(F e ) is the deformation coefficient change rate of the stamping product of the sample to be tested at the eth moment of the stamping hardness test cycle, DC' t is the preset threshold value of the deformation coefficient change rate, E is the number of moments in the stamping part hardness test cycle, e≤E, and both e and E are positive integers.

8. The stamping part defect detection method according to claim 1, characterized in that: Determining the overall stamping part defect detection score according to the stamping part shape defect score, the stamping part hardness defect score and the quantity ratio includes: Determine the shape defect recognition result of the i-th sample stamping part to be tested according to the stamping part shape defect score of the i-th sample stamping part to be tested; Determine the overall shape defect recognition result according to the shape defect recognition result of the i-th sample stamping part to be tested; Determine the hardness defect recognition result of the i-th sample stamping part to be tested according to the stamping part hardness defect score of the i-th sample stamping part to be tested; Determine the overall hardness defect recognition result according to the hardness defect recognition result of the i-th sample stamping part to be tested; Determining an overall defect recognition result according to the overall shape defect recognition result and the overall hardness defect recognition result; An overall stamping part defect detection score is determined based on the overall defect identification result and the quantity ratio.

9. A stamping part defect detection system, characterized in that: include: A sample sampling module is used to sample the finished stamping parts in the current batch to obtain a plurality of sample finished stamping parts; A sample image acquisition module is used to acquire appearance images of multiple sample stamping parts through an image acquisition device; Stamping test assembly module, used to determine the test assembly results of sample stamping finished products in the simulated assembly test cycle; A sample screening module, used to screen sample stamping finished products according to the appearance image and the test assembly result, and obtain a plurality of sample stamping finished products to be tested; A sample quantity ratio confirmation module is used to determine the quantity ratio of the sample stamping finished product to be tested and the sample stamping finished product; A sample sampling point setting module, used to set a first sampling point at the vertex of the sample stamping product to be tested, and set a second sampling point at the center of the hole of the sample stamping product to be tested, determine the first sampling position information of the first sampling point in the positioning coordinate system, and determine the second sampling position information of the second sampling point in the positioning coordinate system, wherein the positioning coordinate system is a coordinate system established based on a preset origin in the measuring instrument; A mold sampling point setting module, used to set a first reference sampling point at the vertex of the stamping mold, and set a second reference sampling point at the center of the hole of the stamping mold, determine the first reference position information of the first reference sampling point in the positioning coordinate system, and determine the second reference position information of the second reference sampling point in the positioning coordinate system; A shape defect scoring module, used to determine a stamping part shape defect score according to the first sampling position information, the second sampling position information, the first reference position information and the second reference position information; The sample hardness test module is used to apply a load to the sample stamping product to be tested through the detection equipment during the stamping hardness test cycle, obtain the load value of the detection equipment, and detect the indentation area and indentation depth of the sample stamping product to be tested through the measuring tool; A hardness defect scoring module, used to determine a hardness defect score of a stamping part according to the load value, the indentation area and the indentation depth; A defect detection scoring module, used to determine the overall stamping part defect detection score according to the stamping part shape defect score, the stamping part hardness defect score and the quantity ratio; The defect detection report module is used to generate a stamping part defect detection report based on the overall stamping part defect detection score.

Images