Binary mixed gas insulation strength evaluation method and device, terminal equipment and storage medium

Abstract

The invention discloses a binary mixed gas insulation strength evaluation method and device, terminal equipment and a storage medium. The method comprises the following steps: acquiring the gas content of each pure gas in binary mixed gas, the electron drift velocity in each different reduced electric field and the average electron energy; solving the net effective ionization rate function of the mixed gas to obtain corresponding common average electron energy when the net effective ionization rate crosses zero; determining the electron drift speed of each pure gas and the corresponding reduced electric field intensity under the common average electron energy; substituting the gas content of each pure gas, the electron drift velocity and the corresponding reduced electric field intensity into a preset function expression of the reduced electric field intensity, and determining a corresponding critical reduced field intensity; and evaluating the insulating strength of the mixed gas according to the critical reduced field intensity. According to the invention, the insulation strength of the binary mixed gas can be evaluated.

Description

Technical Field

[0001] The present invention relates to the field of gas insulating media for electrical equipment, and in particular to a method, a device, a terminal device and a storage medium for evaluating the insulation strength of a binary mixed gas. Background Art

[0002] SF6 gas has been widely used as an efficient insulating and arc-extinguishing gas. However, SF6 gas is a strong greenhouse gas. Reducing the use of SF6 and seeking environmentally friendly alternative gases have become a hot topic in current research. A feasible solution is to mix SF6 gas with other gases to form a binary mixed gas to reduce the emission of SF6 gas without significantly reducing the insulation performance. However, the insulation performance of a mixed gas is not as easy to predict as that of a single gas, because the physical and chemical properties of different gases are different, and the interaction between the gas molecules after mixing becomes complicated, making it difficult to evaluate its insulation performance. Summary of the invention

[0003] An embodiment of the present invention provides a method, apparatus, terminal device and storage medium for evaluating the insulation strength of a binary gas mixture. The present invention can evaluate the insulation strength of a binary gas mixture by calculating the critical reduced field strength of the binary gas mixture based on the common average electron energy.

[0004] An embodiment of the present invention provides a method for evaluating the dielectric strength of a binary mixed gas, comprising:

[0005] Obtain the gas content of each pure gas in the binary gas mixture, the electron drift velocity under different reduced electric fields, and the average electron energy;

[0006] Solving the net effective ionization rate function of the mixed gas to obtain the common average electron energy corresponding to the time when the net effective ionization rate passes through zero; wherein the construction of the net effective ionization rate function includes: constructing the ionization rate expression of each pure gas by expressing it as a function of the common average electron energy, and constructing the ionization rate function of the mixed gas according to the ionization rate expression of each pure gas; constructing the adsorption rate expression of each pure gas by expressing it as a function of the common average electron energy, and constructing the adsorption rate function of the mixed gas according to the adsorption rate expression of each pure gas; constructing the net effective ionization rate function according to the ionization rate function of the mixed gas and the adsorption rate function;

[0007] Matching the common average electron energy with the average electron energy of each pure gas under different reduced electric fields, and determining the electron drift velocity of each pure gas and the corresponding reduced electric field strength under the common average electron energy;

[0008] Substituting the gas content of each pure gas, the electron drift velocity of each pure gas under the common average electron energy, and the corresponding reduced electric field strength into the preset function expression of the reduced electric field strength, the corresponding critical reduced field strength is determined;

[0009] The dielectric strength of the mixed gas is evaluated according to the critical reduced field strength.

[0010] Furthermore, the obtaining of the gas content of each pure gas in the binary mixed gas, the electron drift velocity under different reduced electric fields, and the average electron energy includes:

[0011] Obtaining a collision cross section data set of each pure gas in a preset Lxcat database to determine the collision cross section of each pure gas;

[0012] The collision cross section of each pure gas is input into the preset solver, and the two-term approximation method of the Boltzmann equation is used to calculate the electron drift velocity and average electron energy of each pure gas under different reduced electric fields.

[0013] Furthermore, the net effective ionization rate function of the mixed gas includes:

[0014] k eff，m (<ε〉)=k i，m (<ε〉)-k a，m (<ε>)

[0015] In the formula, k eff，m (<ε>) is the functional expression of the net effective ionization rate of the mixed gas, k i，m (<ε>) is the ionization rate function of the mixed gas, k a，m (<ε>) is the adsorption rate function of the mixed gas.

[0016] Furthermore, the ionization rate function of the mixed gas includes:

[0017] k i，m (〈ε〉)=xk i，A (<ε>)+(1-x)k i，B (<ε>)

[0018] In the formula, x is the gas content of the first type of pure gas in the binary mixed gas, k i，A (<ε>) is the ionization rate expression of the first type of pure gas, k i，B (<ε>) is the ionization rate expression of the second type of pure gas.

[0019] Furthermore, the adsorption rate function of the mixed gas includes:

[0020] k a，m (<ε>)=xk a，A(<ε>)+(1-x)k a，B (<ε>)

[0021] In the formula, k a，A (<ε>) is the adsorption rate expression of the first type of pure gas, k a，B (<ε>) is the adsorption rate expression of the second type of pure gas.

[0022] Furthermore, the functional expression of the reduced electric field strength includes:

[0023]

[0024] In the formula, is the reduced electric field strength corresponding to the common average electron energy of the mixed gas, is the reduced electric field strength corresponding to the common average electron energy of the first type of pure gas, is the reduced electric field strength corresponding to the common average electron energy of the second type of pure gas, W A is the electron drift velocity corresponding to the common average electron energy of the first type of pure gas, W B is the electron drift velocity corresponding to the common average electron energy of the second type of pure gas.

[0025] Another embodiment of the present invention provides a binary mixed gas dielectric strength evaluation device, comprising: a data acquisition module, a common average electron energy solution module, a data matching module, a critical reduced field strength solution module and an evaluation module;

[0026] The data acquisition module is used to obtain the gas content of each pure gas in the binary mixed gas, the electron drift velocity under different reduced electric fields, and the average electron energy;

[0027] The common average electron energy solving module is used to solve the net effective ionization rate function of the mixed gas to obtain the common average electron energy corresponding to the net effective ionization rate when the net effective ionization rate passes through zero; wherein the construction of the net effective ionization rate function includes: constructing the ionization rate expression of each pure gas by expressing it as a function of the common average electron energy, and constructing the ionization rate function of the mixed gas according to the ionization rate expression of each pure gas; constructing the adsorption rate expression of each pure gas by expressing it as a function of the common average electron energy, and constructing the adsorption rate function of the mixed gas according to the adsorption rate expression of each pure gas; constructing the net effective ionization rate function according to the ionization rate function of the mixed gas and the adsorption rate function;

[0028] The data matching module is used to match the common average electron energy with the average electron energy of each pure gas under different reduced electric fields, and determine the electron drift velocity of each pure gas and the corresponding reduced electric field strength under the common average electron energy;

[0029] The critical reduced field strength solving module determines the corresponding critical reduced field strength by substituting the gas content of each pure gas, the electron drift velocity of each pure gas under the common average electron energy, and the corresponding reduced electric field strength into a preset function expression of the reduced electric field strength;

[0030] The evaluation module is used to evaluate the dielectric strength of the mixed gas according to the critical reduced field strength.

[0031] Furthermore, the data acquisition module includes a collision cross-section acquisition unit and a data calculation unit;

[0032] The collision cross section acquisition unit is used to acquire the collision cross section data set of each pure gas in a preset Lxcat database to determine the collision cross section of each pure gas;

[0033] The data calculation unit is used to input the collision cross section of each pure gas in a preset solver, and use the two-term approximation method of the Boltzmann equation to respectively calculate the electron drift velocity and average electron energy of each pure gas under different reduced electric fields.

[0034] Another embodiment of the present invention provides a terminal device, including a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, and when the processor executes the computer program, a method for evaluating the insulation strength of a binary mixed gas as described in any one of the embodiments is implemented.

[0035] Another embodiment of the present invention provides a storage medium, which includes a stored computer program, wherein when the computer program is running, the device where the storage medium is located is controlled to execute a binary mixed gas insulation strength evaluation method as described in any one of the above embodiments.

[0036] The following beneficial effects are achieved by implementing the embodiments of the present invention:

[0037] The embodiment of the present invention provides a method for evaluating the insulation strength of a binary mixed gas. The method obtains the gas content of each pure gas in the binary mixed gas, the electron drift velocity under each different reduced electric field, and the average electron energy; by solving the net effective ionization rate function of the mixed gas, the common average electron energy corresponding to the net effective ionization rate when it passes through zero is obtained; the electron drift velocity and the corresponding reduced electric field strength of each pure gas under the common average electron energy are determined; the gas content, electron drift velocity and corresponding reduced electric field strength of each pure gas are substituted into the function expression of the preset reduced electric field strength to determine the corresponding critical reduced field strength; and the insulation strength of the mixed gas is evaluated according to the critical reduced field strength. Compared with the prior art, the present invention can explain the dependence of energy transfer on inelastic collisions as the reduced electric field strength increases through the method based on the common average electron energy, and evaluate the electron collision and transport data in the mixture, thereby accurately evaluating the insulation strength of the binary mixed gas. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 It is a flow chart of a method for evaluating the insulation strength of a binary mixed gas provided by an embodiment of the present invention.

[0039] Figure 2 Schematic diagram of the electron drift velocity of pure O2 and N2 provided in one embodiment of the present invention.

[0040] Figure 3 It is a schematic diagram of the average energy of pure O2 and N2 provided by one embodiment of the present invention.

[0041] Figure 4 It is a schematic diagram of the ionization rate coefficients of pure O2 and N2 provided in one embodiment of the present invention.

[0042] Figure 5 It is a schematic diagram of the adsorption rate coefficient of pure O2 provided in one embodiment of the present invention.

[0043] Figure 6 It is a schematic diagram of the net effective ionization rate coefficient of the O2-N2 mixed gas provided in one embodiment of the present invention.

[0044] Figure 7 Schematic diagram of the electron drift velocity of an O2-N2 mixed gas provided in one embodiment of the present invention.

[0045] Figure 8 It is a structural schematic diagram of a binary mixed gas insulation strength evaluation device provided by one embodiment of the present invention. DETAILED DESCRIPTION

[0046] In order to make the purpose, technical solutions and advantages of this application clearer, the technical solutions in this application will be clearly and completely described below in conjunction with the drawings in the embodiments of this application. Obviously, the described embodiments are part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0047] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0048] In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "multiple" is more than two, unless otherwise clearly and specifically defined.

[0049] like Figure 1 FIG. 1 is a flow chart of a method for evaluating the insulation strength of a binary mixed gas provided by an embodiment of the present invention, comprising the following steps:

[0050] Step S1, obtaining the gas content of each pure gas in the binary mixed gas, the electron drift velocity under different reduced electric fields, and the average electron energy;

[0051] In the present invention, each pure gas in the above binary mixed gas is named as the first type of pure gas, pure gas A, and the second type of pure gas, pure gas B; schematically, pure gas A can be O2, and pure gas B can be N2;

[0052] By extracting pure gas O2 and pure gas N2, the electron drift velocity and average electron energy under different reduced electric fields provide corresponding data for subsequent operations. Specifically, the electron drift velocity under the above different reduced electric fields is as follows: Figure 2 As shown in the figure, the average electron energy under different reduced electric fields is Figure 3 As shown;

[0053] In a preferred embodiment, the above reduced electric field range is: 0-1000Td;

[0054] In a preferred embodiment, the step of obtaining the gas content of each pure gas in the binary gas mixture, the electron drift velocity under different reduced electric fields, and the average electron energy includes:

[0055] Acquire a collision cross section data set of each pure gas in a preset database to determine the collision cross section of each pure gas;

[0056] The collision cross section of each pure gas is input into the preset solver, and the two-term approximation method of the Boltzmann equation is used to calculate the electron drift velocity and average electron energy of each pure gas under different reduced electric fields.

[0057] The above-mentioned preset database can be schematically an Lxcat database; the above-mentioned preset solver can be schematically a COMSOL Multiphysics solver.

[0058] Step S2, solving the net effective ionization rate function of the mixed gas to obtain the common average electron energy corresponding to the net effective ionization rate when it passes through zero; wherein the construction of the net effective ionization rate function includes: constructing an ionization rate expression of each pure gas as a function of the common average electron energy, and constructing the ionization rate function of the mixed gas according to the ionization rate expression of each pure gas; constructing an adsorption rate expression of each pure gas as a function of the common average electron energy, and constructing the adsorption rate function of the mixed gas according to the adsorption rate expression of each pure gas; constructing the net effective ionization rate function according to the ionization rate function of the mixed gas and the adsorption rate function;

[0059] In the present invention, the ionization rate function and the adsorption rate function of the mixed gas of pure gas O2 and pure gas N2 are expressed as a function of the common average electron energy, the net effective ionization rate function of the mixed gas is calculated, and the common average electron energy corresponding to the zero crossing of the mixed gas is determined, so as to provide corresponding data for the subsequent determination of the electron drift velocity of each pure gas and the corresponding reduced electric field strength;

[0060] Specifically, the ionization rate functions of pure O2 and N2 are as follows: Figure 4 As shown, the adsorption rate function of pure O2 is as follows Figure 5 As shown;

[0061] In a preferred embodiment, the net effective ionization rate function of the mixed gas includes:

[0062] k eff，m (<ε>)=k i，m (<ε>)-k a，m (<ε>)

[0063] In the formula, k eff，m (<ε>) is the functional expression of the net effective ionization rate of the mixed gas, ki，m (<ε>) is the ionization rate function of the mixed gas, k a，m ((ε>) is the adsorption rate function of the mixed gas;

[0064] Schematically, if the mixed gas is O2 and N2, the corresponding net effective ionization rate function includes:

[0065]

[0066] In the formula, is the net effective ionization rate function of the O2 and N2 gas mixture, is the ionization rate function of the mixed gas of O2 and N2, is the adsorption rate function of the mixed gas of O2 and N2:

[0067] In a preferred embodiment, the ionization rate function of the mixed gas includes:

[0068] k i，m (<ε>)=xk i，A (<ε>)+(1-x)k i，B (<ε>)

[0069] In the formula, x is the gas content of the first type of pure gas in the binary mixed gas, k i，A (<ε>) is the ionization rate expression of the first type of pure gas, k i，B (<ε>) is the ionization rate expression of the second type of pure gas;

[0070] Schematically, if the mixed gas is O2 and N2, the corresponding ionization rate function includes:

[0071]

[0072] In the formula, is the gas content of O2 in the binary gas mixture, is the expression for the ionization rate of O2, is the ionization rate expression of N2;

[0073] In a preferred embodiment, the adsorption rate function of the mixed gas includes:

[0074] k a，m (<ε))=xk a，A (<ε>)+(1-x)k a，B (<ε>)

[0075] In the formula, x is the gas content of the first type of pure gas in the binary mixed gas, k a，A (<ε>) is the adsorption rate expression of the first type of pure gas, k a，B(<ε>) is the adsorption rate expression of the second type of pure gas;

[0076] Schematically, if the mixed gas is O2 and N2, the corresponding adsorption rate function includes:

[0077]

[0078] In the formula, is the adsorption rate expression of O2, The adsorption rate expression of N2 is:

[0079] Step S3, matching the common average electron energy with the average electron energy of each pure gas under different reduced electric fields, and determining the electron drift velocity of each pure gas and the corresponding reduced electric field strength under the common average electron energy:

[0080] In the present invention, the above-determined common average electron energy is matched with the acquired electron drift velocity of pure gas and the corresponding reduced electric field strength data to obtain specific data, which provides data for the subsequent calculation of the critical reduced field strength.

[0081] Step S4: Substitute the gas content of each pure gas, the electron drift velocity of each pure gas under the common average electron energy, and the corresponding reduced electric field strength into a preset function expression of the reduced electric field strength to determine the corresponding critical reduced field strength:

[0082] In a preferred embodiment of the present invention, the gas content of each pure gas, the electron drift velocity of each pure gas under the common average electron energy and the corresponding reduced electric field strength are substituted into the preset reduced electric field strength function expression to calculate the critical reduced field strength.

[0083] In a preferred embodiment, the functional expression of the reduced electric field strength includes:

[0084]

[0085] In the formula, is the reduced electric field strength corresponding to the common average electron energy of the mixed gas, is the reduced electric field strength corresponding to the common average electron energy of the first type of pure gas, is the reduced electric field strength corresponding to the common average electron energy of the second type of pure gas, W A is the electron drift velocity corresponding to the common average electron energy of the first type of pure gas, W B is the electron drift velocity corresponding to the common average electron energy of the second type of pure gas.

[0086] The following is a detailed description of the derivation process of the functional expression of the reduced electric field intensity:

[0087] For simple gas mixtures, a popular approach is to use Blanc's law to approximate the drift velocity:

[0088]

[0089]

[0090] Where W m is the electron drift velocity in the mixture, W A and W B is the drift velocity in gas A and gas B, n A and n B are the gas densities of the mixed gas composed of gas A and gas B respectively.

[0091] The ionization ki or adsorption rate coefficient ka of a gas mixture is approximated by Wieland's law:

[0092] k m (E / N) = xk A (E / N)+(1-x)k B (E / N);

[0093] Among them, k m is the rate coefficient of the mixture, k A and k B are the rate coefficients for pure gases A and B, which are calculated under the same reduced electric field (E / N).

[0094] Blanc's law itself does not include inelastic collisions. There is a key assumption inherent in the Blanc and Wieland approximation that limits its validity. For a given value of (E / N), the steady-state electron distribution function (EEDF) for each component gas and the combined mixture is the same Maxwell equations. Another significant limitation of the Wieland approximation is that it cannot predict positive cooperativity in gas mixtures, i.e., the critical electric field of the mixture is higher than the critical electric field of any one of the component gases.

[0095] To better account for the dependence of energy transfer on inelastic collisions as (E / N) increases, this application evaluates electron collision and transport data in mixtures based on a Blanc's law approach to mean electron energy <ε>. This alternative approach assumes the equivalence of a mean electron energy <ε> instead of a common reduced electric field (E / N). This assumption allows for arbitrary EEDFs for the component gases or the mixture itself, with the restriction that the integrated moments of mv2 / 2 over each EEDF must be equal.

[0096] First, the non-conservative collision rate ν* in the molecules of the gas mixture is estimated using the average electron energy approximation:

[0097]

[0098] This method refers to the momentum and energy conservation equations for electron transfer. This method assumes a 0D model, giving negligible time and space gradients in the momentum and energy equations. Assuming that the momentum transfer collision frequency is a slowly varying function of the electron average energy, and applying first-order momentum transfer theory and the common electron average energy approximation, the general electron momentum balance equation can be written in the steady-state limit:

[0099]

[0100] Where e is the elementary charge, m e is the mass of the electron, v m is the momentum transfer collision frequency, is the reduced field strength (E / N). For pure gas A, pure gas B and pure gas mixture, three momentum balance expressions can be written from the above formula.

[0101] The momentum transfer collision frequency of the mixture of A and B can be written as:

[0102] v m，m (<ε>)=xv m，A (<ε>)+(1-x)v m，B (<ε>);

[0103] In summary, the first expression for the electron drift velocity in the mixture can be obtained:

[0104]

[0105] Next, consider the energy balance equation in the steady state, where the transport coefficient is also a function of <ε>:

[0106]

[0107] Among them, k B is the Boltzmann constant, T is the temperature of the neutral gas, v e is the energy transfer collision frequency, and the last term represents the threshold energy Δε i and the collision frequency v i The total amount of energy that may be transferred in an inelastic process.

[0108] Again by writing out the steady-state energy balance expression for the pure gases A and B and any mixture of the two, after some algebraic manipulation, a second expression for the electron drift velocity in the mixture can be found:

[0109]

[0110] Both expressions for the drift velocity of electrons in a mixture explicitly express the value of (E / N) in the mixture. Combining the two expressions gives us an expression for the drift velocity:

[0111]

[0112] In other words, we can get the expression of the reduced electric field strength (E / N) in the mixture:

[0113]

[0114] in, and W B =W B (<ε>) are functions of the common average electron energy <ε>.

[0115] In a specific embodiment, the expression of the reduced electric field strength of the mixed gas of O2 and N2 includes:

[0116]

[0117] In the formula, is the reduced electric field strength corresponding to the mixed gas O2 and N2 at the common average electron energy, is the reduced electric field strength corresponding to O2 at the common average electron energy, is the reduced electric field strength corresponding to the common average electron energy of N2, is the electron drift velocity of O2 at the common average electron energy, is the electron drift velocity corresponding to N2 at the common average electron energy.

[0118] Step S5: Evaluate the dielectric strength of the mixed gas according to the critical reduced field strength.

[0119] In the present invention, the measured critical reduced field strength of the mixed gas is compared and evaluated with the critical reduced field strength of the known pure gas. The critical reduced field strength is proportional to the insulation strength. The higher the critical reduced field strength of the mixed gas, the better its insulation strength; otherwise, the poorer its insulation strength.

[0120] In a preferred embodiment, it is applied to the mixed gas O2 and N2. The cases where O2 accounts for 25%, 50%, and 75% in the mixed gas are selected for approximate calculation. Finally, the variation trend of the effective ionization rate coefficient with the reduced electric field strength is obtained, such as Figure 6 As shown in the figure, the variation trend of electron drift velocity with the reduced electric field strength is obtained, as shown in Figure 7Finally, the dielectric strength of the N2-O2 mixed gas is evaluated, as shown in Table 1. Table 1 is the critical reduced field strength of the O2-N2 mixed gas provided by an embodiment of the present invention. The actual value in Table 1 is the result of calculation of multiple Boltzmann equations.

[0121] Table 1 Critical reduced field strength of O2-N2 gas mixture

[0122]

[0123] Based on the above method embodiment, the present invention provides a corresponding device embodiment;

[0124] like Figure 8 FIG. 1 is a schematic diagram of a binary mixed gas insulation strength evaluation device provided by an embodiment of the present invention, comprising:

[0125] Data acquisition module, common average electron energy solution module, data matching module, critical reduced field strength solution module and evaluation module;

[0126] The data acquisition module is used to obtain the gas content of each pure gas in the binary mixed gas, the electron drift velocity under different reduced electric fields, and the average electron energy;

[0127] The common average electron energy solving module is used to solve the net effective ionization rate function of the mixed gas to obtain the common average electron energy corresponding to the net effective ionization rate when the net effective ionization rate passes through zero; wherein the construction of the net effective ionization rate function includes: constructing the ionization rate expression of each pure gas by expressing it as a function of the common average electron energy, and constructing the ionization rate function of the mixed gas according to the ionization rate expression of each pure gas; constructing the adsorption rate expression of each pure gas by expressing it as a function of the common average electron energy, and constructing the adsorption rate function of the mixed gas according to the adsorption rate expression of each pure gas; constructing the net effective ionization rate function according to the ionization rate function of the mixed gas and the adsorption rate function;

[0128] The data matching module is used to match the common average electron energy with the average electron energy of each pure gas under different reduced electric fields, and determine the electron drift velocity of each pure gas and the corresponding reduced electric field strength under the common average electron energy;

[0129] The critical reduced field strength solving module determines the corresponding critical reduced field strength by substituting the gas content of each pure gas, the electron drift velocity of each pure gas under the common average electron energy, and the corresponding reduced electric field strength into a preset function expression of the reduced electric field strength;

[0130] The evaluation module is used to evaluate the dielectric strength of the mixed gas according to the critical reduced field strength.

[0131] Furthermore, the data acquisition module includes a collision cross-section acquisition unit and a data calculation unit;

[0132] The collision cross section acquisition unit is used to acquire the collision cross section data set of each pure gas in a preset Lxcat database to determine the collision cross section of each pure gas;

[0133] The data calculation unit is used to input the collision cross section of each pure gas in a preset solver, and use the two-term approximation method of the Boltzmann equation to respectively calculate the electron drift velocity and average electron energy of each pure gas under different reduced electric fields.

[0134] It can be understood that the above-mentioned device item embodiment corresponds to the method item embodiment of the present invention, and it can implement a binary mixed gas insulation strength evaluation method provided by any of the above-mentioned method item embodiments of the present invention.

[0135] It should be noted that the device embodiments described above are merely schematic, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. In addition, in the accompanying drawings of the device embodiments provided by the present invention, the connection relationship between the modules indicates that there is a communication connection between them, which may be specifically implemented as one or more communication buses or signal lines. A person of ordinary skill in the art may understand and implement it without paying any creative effort.

[0136] Those skilled in the art can clearly understand that for the sake of convenience and brevity, the specific working process of the device described above can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here.

[0137] Another preferred embodiment of the present invention provides a terminal device, including a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein when the processor executes the computer program, a method for evaluating the insulation strength of a binary mixed gas as described in any one of the above embodiments is implemented.

[0138] It should be noted that the terminal device mentioned here can be a computing device such as a desktop computer, a notebook, a PDA, and a cloud server. The terminal device may include, but is not limited to, a processor and a memory. Those skilled in the art will understand that, for example, it may also include input and output devices, network access devices, buses, etc.

[0139] The processor may be a central processing unit (CPU), other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor, etc. The processor is the control center of the terminal device, and uses various interfaces and lines to connect various parts of the entire terminal device.

[0140] The memory can be used to store the computer program, and the processor realizes various functions of the terminal device by running or executing the computer program stored in the memory and calling the data stored in the memory. The memory can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system, at least one application required for a function, etc.; the data storage area can store data created according to the use of the mobile phone, etc. In addition, the memory can include a high-speed random access memory, and can also include a non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), at least one disk storage device, a flash memory device, or other volatile solid-state storage devices.

[0141] Another preferred embodiment of the present invention provides a storage medium, which includes a stored computer program, wherein when the computer program is running, the device where the storage medium is located is controlled to execute a binary mixed gas insulation strength evaluation method as described in any one of the present invention.

[0142] The storage medium is a computer-readable storage medium, and the computer program is stored in the computer-readable storage medium. When the computer program is executed by the processor, the steps of each of the above-mentioned method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium.

[0143] The above is a preferred embodiment of the present invention. It should be pointed out that a person skilled in the art can make several improvements and modifications without departing from the principle of the present invention. These improvements and modifications are also considered to be within the scope of protection of the present invention.

Claims

1. A method for evaluating the dielectric strength of a binary mixed gas, characterized in that: include: Obtain the gas content of each pure gas in the binary gas mixture, the electron drift velocity under different reduced electric fields, and the average electron energy; Solving the net effective ionization rate function of the mixed gas to obtain the common average electron energy corresponding to the time when the net effective ionization rate passes through zero; wherein the construction of the net effective ionization rate function includes: constructing the ionization rate expression of each pure gas by expressing it as a function of the common average electron energy, and constructing the ionization rate function of the mixed gas according to the ionization rate expression of each pure gas; constructing the adsorption rate expression of each pure gas by expressing it as a function of the common average electron energy, and constructing the adsorption rate function of the mixed gas according to the adsorption rate expression of each pure gas; constructing the net effective ionization rate function according to the ionization rate function of the mixed gas and the adsorption rate function; Matching the common average electron energy with the average electron energy of each pure gas under different reduced electric fields, and determining the electron drift velocity of each pure gas and the corresponding reduced electric field strength under the common average electron energy; Substituting the gas content of each pure gas, the electron drift velocity of each pure gas under the common average electron energy, and the corresponding reduced electric field strength into the preset function expression of the reduced electric field strength, the corresponding critical reduced field strength is determined; The dielectric strength of the mixed gas is evaluated according to the critical reduced field strength.

2. A method for evaluating dielectric strength of a binary mixed gas according to claim 1, characterized in that: The method of obtaining the gas content of each pure gas in the binary mixed gas, the electron drift velocity under different reduced electric fields, and the average electron energy includes: Obtaining a collision cross section data set of each pure gas in a preset Lxcat database to determine the collision cross section of each pure gas; The collision cross section of each pure gas is input into the preset solver, and the two-term approximation method of the Boltzmann equation is used to calculate the electron drift velocity and average electron energy of each pure gas under different reduced electric fields.

3. A method for evaluating dielectric strength of binary mixed gas according to claim 1, characterized in that: The net effective ionization rate function of the mixed gas includes: k eff,m (<ε>)=k i,m (<ε>)-k a,m (<ε>) In the formula, k eff,m (<ε>) is the functional expression of the net effective ionization rate of the mixed gas, k i,m (<ε>) is the ionization rate function of the mixed gas, k a,m (<ε>) is the adsorption rate function of the mixed gas.

4. A method for evaluating dielectric strength of binary mixed gas as claimed in claim 3, characterized in that: The ionization rate function of the mixed gas includes: k i,m (<ε>)=xk i,A (<ε>)+(1-x)k i,B (<ε>) In the formula, x is the gas content of the first type of pure gas in the binary mixed gas, k i,A (<ε>) is the ionization rate expression of the first type of pure gas, k i,B (<ε>) is the ionization rate expression of the second type of pure gas.

5. A method for evaluating dielectric strength of binary mixed gas according to claim 4, characterized in that: The adsorption rate function of the mixed gas includes: k a,m (<ε>)=xk a,A (<ε>)+(1-x)k a,B (<ε>) In the formula, k a,A (<ε>) is the adsorption rate expression of the first type of pure gas, k a,B (<ε>) is the adsorption rate expression of the second type of pure gas.

6. A method for evaluating dielectric strength of binary mixed gas according to claim 5, characterized in that: The functional expression of the reduced electric field strength includes: In the formula, is the reduced electric field strength corresponding to the common average electron energy of the mixed gas, is the reduced electric field strength corresponding to the common average electron energy of the first type of pure gas, is the reduced electric field strength corresponding to the common average electron energy of the second type of pure gas, W A is the electron drift velocity corresponding to the common average electron energy of the first type of pure gas, W B is the electron drift velocity corresponding to the common average electron energy of the second type of pure gas.

7. A binary mixed gas insulation strength evaluation device, characterized in that: include: Data acquisition module, common average electron energy solution module, data matching module, critical reduced field strength solution module and evaluation module; The data acquisition module is used to obtain the gas content of each pure gas in the binary mixed gas, the electron drift velocity under different reduced electric fields, and the average electron energy; The common average electron energy solving module is used to solve the net effective ionization rate function of the mixed gas to obtain the common average electron energy corresponding to the net effective ionization rate when the net effective ionization rate passes through zero; wherein the construction of the net effective ionization rate function includes: constructing the ionization rate expression of each pure gas by expressing it as a function of the common average electron energy, and constructing the ionization rate function of the mixed gas according to the ionization rate expression of each pure gas; constructing the adsorption rate expression of each pure gas by expressing it as a function of the common average electron energy, and constructing the adsorption rate function of the mixed gas according to the adsorption rate expression of each pure gas; constructing the net effective ionization rate function according to the ionization rate function of the mixed gas and the adsorption rate function; The data matching module is used to match the common average electron energy with the average electron energy of each pure gas under different reduced electric fields, and determine the electron drift velocity of each pure gas and the corresponding reduced electric field strength under the common average electron energy; The critical reduced field strength solving module determines the corresponding critical reduced field strength by substituting the gas content of each pure gas, the electron drift velocity of each pure gas under the common average electron energy, and the corresponding reduced electric field strength into a preset function expression of the reduced electric field strength; The evaluation module is used to evaluate the dielectric strength of the mixed gas according to the critical reduced field strength.

8. A binary mixed gas insulation strength evaluation device as claimed in claim 7, characterized in that: The data acquisition module includes a collision cross-section acquisition unit and a data calculation unit; The collision cross section acquisition unit is used to acquire the collision cross section data set of each pure gas in a preset Lxcat database to determine the collision cross section of each pure gas; The data calculation unit is used to input the collision cross section of each pure gas in a preset solver, and use the two-term approximation method of the Boltzmann equation to respectively calculate the electron drift velocity and average electron energy of each pure gas under different reduced electric fields.

9. A terminal device, characterized in that: The method comprises a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein when the processor executes the computer program, a method for evaluating the insulation strength of a binary mixed gas as claimed in any one of claims 1 to 6 is implemented.

10. A storage medium, characterized in that: The storage medium includes a stored computer program, wherein when the computer program is executed, the device where the storage medium is located is controlled to execute a binary mixed gas insulation strength evaluation method as described in any one of claims 1 to 6.

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