Integrated circuit product automatic reading system and operation method
By laser printing of the Wafer ID and QR code on the wafer, the automatic identification and comparison of the integrated circuit product automatic reading system is realized, which solves the problem of low manual operation efficiency in the existing technology, and improves the production efficiency and automation level.
Patent Information
- Application Number
- CN202411630789.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-15
- Publication Date
- 2025-02-28
AI Technical Summary
In the automatic reading of integrated circuit products, the prior art requires manual input of the Wafer ID, resulting in inefficient equipment operation, prone to errors, and increasing the workload of personnel.
By using laser to print the Wafer ID and corresponding QR code on the wafer, canceling human operations to realize the autonomous recognition and comparison of the automatic reading system.
Improve production efficiency, reduce manual error rate, reduce personnel workload, and realize efficient and automated operation of equipment.
Smart Images

Figure CN119538956A_ABST
Abstract
Description
Technical Field
[0001] The present invention belongs to the technical field of automatic reading of integrated circuit products, and in particular relates to an automatic reading system and an operating method for integrated circuit products. Background Art
[0002] In the field of automatic reading of integrated circuit products, during the production process, personnel are required to manually input the wafer ID to load the WMDU system wafer mapping and comparison. When the equipment is finished, it will automatically load the next piece. If the OP is busy, it cannot be confirmed in the first time, which greatly affects the UPH of the equipment. It not only increases the workload of personnel, but also is prone to errors and low efficiency. Therefore, in order to solve this problem, it is necessary to propose a new automatic reading solution. When the wafer is incoming, the wafer ID and the corresponding QR code are printed on the blank space of the wafer by laser, eliminating manual operation and improving production efficiency. Summary of the invention
[0003] The object of the present invention is to provide an integrated circuit product automatic reading system and an operating method to solve the problems raised in the above background technology.
[0004] To achieve the above-mentioned purpose, the present invention provides the following technical solutions: an automatic reading system for integrated circuit products, comprising a hardware body, a software body, a central processing unit system and a data unit;
[0005] The hardware body includes:
[0006] Reader, the 2D reader is used to read the 2D code on the wafer and transmit the read information to the central processing system for processing;
[0007] Automatic light source provides side light to illuminate the printed surface of the product for plane quality inspection and provides illumination for product printing inspection to achieve clear display.
[0008] The product platform is used to place products and is a platform for barcode readers to read information and collect images.
[0009] Furthermore, the software body includes a function menu area, an information input area, a visual window area, an execution record display area and a Web output area.
[0010] Further, the function menu area includes user management, system settings, and information query;
[0011] The information input area triggers the 2D code reader to read the product information through the operating software, and presents the reading result on the information input area interface, and sends the product information to the central processing unit system;
[0012] In the visual window area, the software triggers the camera and light source to collect product image data, transmit it to the data unit, and present it in the visual window area for users to view;
[0013] The execution record display area records and displays the action and time and date of each step in real time and transmits it to the central processor system and stores it in the data unit for the Web query area to retrieve mapping data;
[0014] In the Web output area, enter the wafer ID in the web and query the wafer mapping of the corresponding batch number through the network to the data unit.
[0015] Furthermore, the central processing system, from the self-inspection central processing unit system, compares the work number, 2D code and other information and the number of image data uploaded by the software body with the number of material boxes and provides information verification operations, feeds back the comparison results to the visual window area of the software body, and stores them in the data unit.
[0016] Furthermore, the central processing unit system is installed on the central control machine, and the central control machine is connected to the software body of the Gold studBond machine via a network cable, so that the data of the two systems can be interoperable.
[0017] Furthermore, the data unit stores all the information wafer mapping comparison result information from the main inspection system, and displays the relevant information through the software body, providing data source, backup and traceability for system history query.
[0018] Furthermore, the integrated circuit product automatic reading operation method includes:
[0019] Trigger the QR code reader to read product information through the operating software, present the reading result on the information input area interface, and send the product information to the central processing unit system;
[0020] The CPU compares the number of material boxes with the number in the MES system, calculates and transmits the result to the software body, and displays it to the user through the software body, including displaying images such as wafer mapping in the visual window area;
[0021] The network transmits the results of the central processor's calculations, including images (including photos of self-inspected products), operation records (including input time), product information (such as batch number, 2D number), wafer mapping, etc., to the data unit, so that users can query historical records through the Web output area of the software body;
[0022] The MES production system uses IT technology Web Service to obtain the number of image data of the data unit with batch number information and compares it with the mapping number input by the MES production system. If they are consistent, the loadmapping is completed through comparison; otherwise, the MES system alarms.
[0023] Compared with the prior art, the present invention has the following beneficial effects:
[0024] The present invention enables the GSB device to automatically scan the code and load the mapping comparison by laser on the wafer, thereby reducing the problems of manual error and low efficiency. When the wafer is received, the wafer ID and the corresponding QR code are printed on the blank space of the wafer by laser, eliminating manual operation and improving production efficiency. BRIEF DESCRIPTION OF THE DRAWINGS
[0025] Figure 1 It is a structural schematic diagram of the automatic reading system and operation method of the integrated circuit product of the present invention;
[0026] Figure 2 The present invention is a flowchart of the automatic reading system and operation method of integrated circuit products. DETAILED DESCRIPTION
[0027] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0028] Example
[0029] See also Figure 1-Figure 2 As shown, the present invention provides a technical solution: including a hardware body, a software body, a central processing unit system and a data unit;
[0030] The hardware body includes:
[0031] Reader, the 2D reader is used to read the 2D code on the wafer and transmit the read information to the central processing system for processing;
[0032] Automatic light source provides side light to illuminate the printed surface of the product for plane quality inspection and provides illumination for product printing inspection to achieve clear display.
[0033] The product platform is used to place products and is a platform for barcode readers to read information and collect images.
[0034] Furthermore, the software body includes a function menu area, an information input area, a visual window area, an execution record display area and a Web output area.
[0035] Further, the function menu area includes user management, system settings, and information query;
[0036] The information input area triggers the 2D code reader to read the product information through the operating software, and presents the reading result on the information input area interface, and sends the product information to the central processing unit system;
[0037] In the visual window area, the software triggers the camera and light source to collect product image data, transmit it to the data unit, and present it in the visual window area for users to view;
[0038] The execution record display area records and displays the action and time and date of each step in real time and transmits it to the central processor system and stores it in the data unit for the Web query area to retrieve mapping data;
[0039] In the Web output area, enter the wafer ID in the web and query the wafer mapping of the corresponding batch number through the network to the data unit.
[0040] Furthermore, the central processing system, from the self-inspection central processing unit system, compares the work number, 2D code and other information and the number of image data uploaded by the software body with the number of material boxes and provides information verification operations, feeds back the comparison results to the visual window area of the software body, and stores them in the data unit.
[0041] Furthermore, the central processing unit system is installed on the central control machine, and the central control machine is connected to the software body of the Gold studBond machine via a network cable, so that the data of the two systems can be interoperable.
[0042] Furthermore, the data unit stores all the information wafer mapping comparison result information from the main inspection system, and displays the relevant information through the software body, providing data source, backup and traceability for system history query.
[0043] Furthermore, the integrated circuit product automatic reading operation method includes:
[0044] Trigger the QR code reader to read product information through the operating software, present the reading result on the information input area interface, and send the product information to the central processing unit system;
[0045] The CPU compares the number of material boxes with the number in the MES system, calculates and transmits the result to the software body, and displays it to the user through the software body, including displaying images such as wafer mapping in the visual window area;
[0046] The network transmits the results of the central processor's calculations, including images (including photos of self-inspected products), operation records (including input time), product information (such as batch number, 2D number), wafer mapping, etc., to the data unit, so that users can query historical records through the Web output area of the software body;
[0047] The MES production system uses IT technology Web Service to obtain the number of image data of the data unit with batch number information and compares it with the mapping number input by the MES production system. If they are consistent, the loadmapping is completed through comparison; otherwise, the MES system alarms.
[0048] Working principle: The 2D code reader is triggered by the operating software to read the product information, and the reading result is presented in the information input area interface, and the product information is sent to the central processing unit system. The central processing unit compares it with the number of material boxes in the MES system, and transmits the result of the operation to the software body, and displays it to the user through the software body, including displaying images such as wafer mapping in the visual window area. The network transmits the results of the central processing unit's operation, including: images, operation records, product information, wafer mapping and other images, to the data unit, so that users can query historical records through the Web output area of the software body; the MES production system uses the IT technology Web Service to obtain the number of image data of the data unit with the batch number information and compares it with the mapping number input by the MES production system. If they are consistent, the loading of wafer mapping is completed through comparison; otherwise, the MES system alarms.
[0049] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.
[0050] The present invention and its embodiments are described above, and such description is not restrictive. The drawings show only one embodiment of the present invention, and the actual structure is not limited thereto. In short, if ordinary technicians in the field are inspired by it, without departing from the purpose of the invention, they can design a structure and embodiment similar to the technical solution without creativity, which should belong to the protection scope of the present invention.
Claims
1. An automatic reading system for integrated circuit products, characterized in that: It includes hardware body, software body, central processing unit system and data unit; The hardware body includes: Reader, the 2D reader is used to read the 2D code on the wafer and transmit the read information to the central processing system for processing; Automatic light source provides side light to illuminate the printed surface of the product for plane quality inspection and provides illumination for product printing inspection to achieve clear display. The product platform is used to place products and is a platform for barcode readers to read information and collect images.
2. The integrated circuit product automatic reading system according to claim 1, characterized in that: The software body includes a function menu area, an information input area, a visual window area, an execution record display area and a Web output area.
3. The integrated circuit product automatic reading system according to claim 2, characterized in that: Function menu area: user management, system settings, information query; The information input area triggers the QR code reader to read the product information through the operating software, and presents the reading result on the information input area interface, and sends the product information to the central processing unit system; In the visual window area, the software triggers the camera and light source to collect product image data, transmit it to the data unit, and present it in the visual window area for users to view; The execution record display area records and displays the action and time and date of each step in real time and transmits it to the central processor system and stores it in the data unit for the Web query area to retrieve mapping data; In the Web output area, enter the wafer ID in the web and query the wafer mapping of the corresponding batch number through the network to the data unit.
4. The integrated circuit product automatic reading system according to claim 1, characterized in that: The central processing system, from the self-checking central processing unit system, compares the work number, 2D code and other information and the number of image data uploaded by the software main body with the number of material boxes and provides information verification operation, feeds back the comparison result to the visual window area of the software main body, and stores it in the data unit.
5. The integrated circuit product automatic reading system and operation method according to claim 4, characterized in that: The central processing unit system is installed on the central control machine, which is connected to the software body of the Gold stud Bond machine via a network cable, allowing the two systems to communicate data.
6. The integrated circuit product automatic reading system and operation method according to claim 1, characterized in that: The data unit stores all the information wafer mapping comparison result information from the autonomous inspection system, and displays the relevant information through the software body, providing data sources, backup and traceability for system history query.
7. An automatic reading operation method for an integrated circuit product, comprising: Trigger the QR code reader to read product information through the operating software, present the reading result on the information input area interface, and send the product information to the central processing unit system; The CPU compares the number of material boxes with the number in the MES system, calculates and transmits the result to the software body, and displays it to the user through the software body, including displaying images such as wafer mapping in the visual window area; The network transmits the results of the central processor's calculations, including images (including photos of self-inspected products), operation records (including input time), product information (such as batch number, 2D number), wafer mapping, etc., to the data unit, so that users can query historical records through the Web output area of the software body; The MES production system uses IT technology Web Service to obtain the number of image data of the data unit with batch number information and compares it with the mapping number input by the MES production system. If they are consistent, the loadmapping is completed through comparison; otherwise, the MES system alarms.
Citation Information
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