Detector testing device, system and method

Abstract

The invention provides a detector testing device, system and method. The detector testing device comprises a box body, an array light source, two lamp panels, two dimming control modules and a power supply, the box body comprises a main body and an upper cover; the upper cover is arranged on the main body to form a closed environment; the array light source and the lamp panel are arranged in the box body; the dimming control module and the power supply are arranged on the outer side wall of the main body; the array light source comprises an upper array light source and a lower array light source; the upper array light source is fixedly arranged on one lamp panel, and the lower array light source is fixedly arranged on the other lamp panel; the power supply supplies power to the detector test system; the dimming control modules are electrically connected with the array light sources, one dimming control module controls the brightness of the upper array light source, and the other dimming control module controls the brightness of the lower array light source. According to the detector test system, the two dimming control modules are arranged to independently regulate and control the light emission of the upper array light source and the lower array light source, so that the test of the double-sided area array photosensitive array is realized.

Description

Technical Field

[0001] The invention belongs to the field of detectors and relates to a detector testing device, system and testing method. Background Art

[0002] Existing area array CT detectors (computed tomography detectors) have area array photosensitive arrays on both the upper and lower surfaces of their daughter cards. During board-level testing, double-sided area array photosensitive arrays need to be tested on both sides. Generally, when testing semi-finished products of linear array detectors, only a single visible light source is needed to meet the performance test of the double-sided photosensitive chip. However, when applied to area array CT detectors, the problem is that a single light source cannot simultaneously meet the response test of all pixels in the double-sided area array photosensitive array, which will cause misjudgment of the performance of the area array CT detector during board-level testing of the area array CT detector.

[0003] Therefore, based on the above problems, it is necessary to further study how to reduce the probability of misjudgment of the performance of the area array CT detector when testing the area array CT detector at the board level.

[0004] It should be noted that the above introduction to the technical background is only for the convenience of providing a clear and complete description of the technical solutions of the present invention and for the convenience of understanding by those skilled in the art. It cannot be considered that the above technical solutions are well known to those skilled in the art simply because these solutions are described in the background technology section of the present invention. Summary of the invention

[0005] In view of the shortcomings of the prior art described above, an object of the present invention is to provide a detector testing device, system and testing method for solving the problem in the prior art that a single light source cannot simultaneously satisfy the response test of all pixel points in a double-sided photosensitizing array, which may cause misjudgment of the performance of the array CT detector.

[0006] To achieve the above-mentioned object and other related objects, the present invention provides a detector testing device, which includes: a box, an array light source, two light boards, two dimming control modules and a power supply;

[0007] The box body includes a main body and an upper cover; the upper cover is arranged on the main body to form a closed environment;

[0008] The array light source and the light panel are arranged inside the box, and the dimming control module, the light source and the voltmeter are arranged on the outer side wall of the main body;

[0009] The array light source comprises an upper array light source and a lower array light source; the upper array light source is fixedly arranged on one of the light boards, and the lower array light source is fixedly arranged on the other light board;

[0010] The power supply supplies power to the detector testing system;

[0011] Each dimming control module is electrically connected to the array light source, wherein one dimming control module controls the brightness of the upper array light source, and another dimming control module controls the brightness of the lower array light source.

[0012] Optionally, the detector testing device also includes three indicator lights; each indicator light is arranged on the outer wall of the box, the first indicator light is electrically connected to the upper array light source to obtain the working status of the upper array light source; the second indicator light is electrically connected to the power supply to obtain the power supply status of the detector testing device; the third indicator light is electrically connected to the lower array light source to obtain the working status of the lower array light source.

[0013] Optionally, the detector testing device further comprises a voltage testing module, wherein the voltage testing module is electrically connected to the array light source and is used to obtain a voltage when the array light source is working.

[0014] Optionally, the voltage testing module includes two voltmeters; one of the voltmeters is electrically connected to the upper array light source to display the voltage when the upper array light source is working; the other voltmeter is electrically connected to the lower array light source to display the voltage when the lower array light source is working.

[0015] Optionally, a handle for moving the upper cover is provided on the upper cover.

[0016] The present invention also provides a detector testing system, which includes: a low-energy area array photosensitive chip, a high-energy area array photosensitive chip, an assembled printed circuit board and the detector testing device; the low-energy area array photosensitive chip, the high-energy area array photosensitive chip and the assembled printed circuit board are all arranged in the detector testing device; the assembled printed circuit board is arranged between the upper array light source and the lower array light source; the low-energy area array photosensitive chip is arranged on the front side of the assembled printed circuit board, opposite to the upper array light source; the high-energy area array photosensitive chip is arranged on the back side of the assembled printed circuit board, opposite to the lower array light source.

[0017] Optionally, the detector testing system also includes a shielding plate; the shielding plate is arranged between the upper array light source and the lower array light source, and the assembled printed circuit board is embedded in the shielding plate to shield the optical crosstalk generated between the upper array light source and the lower array light source.

[0018] Optionally, the detector testing system further includes a testing module; the testing module is electrically connected to the low-energy area array photosensitive chip and the high-energy area array photosensitive chip to obtain test data.

[0019] Optionally, the low-energy area array photosensitive chip, the high-energy area array photosensitive chip and the array light source share the same power supply.

[0020] The present invention also provides a testing method, which is implemented based on the above detector testing system, characterized in that the testing method comprises: turning on the power supply to power the detector testing system;

[0021] The upper array light source and the lower array light source are respectively controlled by each dimming controller; the upper array light source is used to provide light source for the low-energy area array photosensitive chip to test all pixel points on the low-energy area array photosensitive chip; the lower array light source provides light source for the high-energy area array photosensitive chip to test all pixel points on the high-energy area array photosensitive chip.

[0022] As described above, the present invention provides a detector testing device, system and testing method, which have the following beneficial effects:

[0023] The detector test system of the present invention independently regulates the luminous intensity of the upper array light source and the lower array light source by setting two dimming control modules, and reflects the light intensity of the array light source in real time by setting a voltmeter, so as to simultaneously meet the established requirements of realizing the photosensitive response of the low-energy array photosensitive chip and the high-energy array photosensitive chip, that is, to provide a detector test device with a stable and independently adjustable light source to realize the double-sided test of the double-sided array photosensitive array. And by setting the test module, the test data of the low-energy array photosensitive chip and the high-energy array photosensitive chip can be obtained more conveniently. And the method of testing based on the detector test system of the present invention can improve the stability and test efficiency of the semi-finished product test of the CT detector. At the same time, the detector test system can simultaneously perform double-sided tests on the double-sided array photosensitive array, and can be applied to actual production tests by testing simulated products. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 Shown is a schematic structural diagram of a detector testing device according to an embodiment of the present invention.

[0025] Figure 2 Shown is a schematic diagram of the structure of a detector testing system according to an embodiment of the present invention.

[0026] Figure 3 Shown is a cross-sectional view of a detector testing system according to an embodiment of the present invention.

[0027] Figure 4 Shown is a schematic diagram of a flow chart for implementing the testing method of the present invention.

[0028] Component number description

[0029] 1. Detector test device

[0030] 10 cabinet

[0031] 100 Upper cover

[0032] 101 Main Body

[0033] 102 handles

[0034] 11 Array light source

[0035] 110 array light source

[0036] 111 down array light source

[0037] 12 light board

[0038] 13. Dimming control module

[0039] 14 Power Supply

[0040] 15 Voltage test module

[0041] 150 voltmeter

[0042] 16 indicator lights

[0043] 160 First indicator light

[0044] 161 Second indicator light

[0045] 162 Third indicator light

[0046] 2 Detector test system

[0047] 20 low energy area array photosensitive chips

[0048] 21 High-energy area array photosensitive chip

[0049] 22 Assemble the printed circuit board

[0050] 23 Shielding plate

[0051] 3. Test Method DETAILED DESCRIPTION

[0052] The following is an explanation of the embodiments of the present invention by specific examples. People familiar with the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification.

[0053] See also Figures 1 to 4. It should be noted that the structures, proportions, sizes, etc. illustrated in the drawings in this specification are only used to match the contents disclosed in the specification for people familiar with this technology to understand and read, and are not used to limit the limiting conditions for the implementation of the present invention, so they have no substantial technical significance. Any structural decoration, change in proportional relationship or adjustment of size should still fall within the scope of the technical content disclosed by the present invention without affecting the effects and purposes that can be achieved by the present invention. At the same time, the terms such as "upper", "lower", "left", "right", "middle" and "one" quoted in this specification are only for the convenience of description, and are not used to limit the scope of the implementation of the present invention. Changes or adjustments in their relative relationships should also be regarded as the scope of the implementation of the present invention without substantially changing the technical content.

[0054] like Figure 1 As shown, this embodiment provides a detector testing device 1 , including: a box 10 , an array light source 11 , two light panels 12 , two dimming control modules 13 and a power supply 14 .

[0055] like Figure 1 As shown, the box body 10 includes a main body 100 and an upper cover 101; the upper cover 101 is arranged on the main body 100 to form a closed environment.

[0056] Specifically, in the present embodiment, the shape of the box 10 is set to a hexahedron. In actual use, the shape of the box can be set arbitrarily as needed, and is not limited to the present embodiment. The box 10 includes a main body 100 and an upper cover 101, and a handle 102 is provided on the upper cover 101 for moving the upper cover 101. As an example, when the number of handles 102 is set to 1, the handle 102 is set at the middle position on the upper cover 101, which is convenient for lifting the upper cover 101, that is, separating the upper cover 101 from the main body 100, facilitating the replacement of the test chip or facilitating the maintenance of the structure inside the box. In actual use, the handle can be set at any position of the upper cover as needed, and will not be described one by one here. As another example, when the number of handles 102 is set to 2, the two handles 102 are respectively set at both ends of the upper cover 101, so as to achieve the purpose of lifting the upper cover 101 more labor-savingly to replace the test chip or facilitate the maintenance of the structure inside the box. In actual use, the number of handles 102 can be set arbitrarily as needed, and is not limited to the present embodiment.

[0057] like Figure 2 As shown, the array light source 11 and the light board 12 are arranged inside the box 10 , and the dimming control module 13 and the power supply 14 and the voltmeter 15 are arranged on the outer wall of the main body 100 .

[0058] Specifically, in this embodiment, the dimming control module 13 and the power supply 14 are arranged on the outer wall of the main body 100, that is, the dimming control module 13 and the power supply 14 are arranged on a side of the box 10 away from the array light source 11 and the light board 12, so that there is enough space between the dimming control module 13 and the array light source 11 to set the connection circuit (not shown in the figure). In actual use, the dimming control module and the power supply can be arranged at any position of the box as needed, which will not be described one by one here. And the power supply 14 supplies power to the detector test system 1.

[0059] More specifically, in the present embodiment, the array light source 11 includes an upper array light source 110 and a lower array light source 111; the upper array light source 110 is fixedly disposed on one of the lamp boards 12, and the lower array light source 111 is fixedly disposed on the other lamp board 12. The upper array light source 110 and the lamp board 12 are fixedly disposed on the upper cover 101, and the lower array light source 111 and the lamp board 12 are fixedly disposed on the bottom of the main body 100, that is, the box body 10 serves as a carrier of the array light source 11 and the lamp board 12 to fix the lamp board 12. Among them, the lamp board 12 serves as a carrier board of the array light source 11, and is used to fix and lock the array light source 11. In actual use, any device that can serve as a carrier board of the array light source is applicable to the present invention, and will not be described one by one here. That is

[0060] like Figure 2 As shown, each dimming control module 13 is electrically connected to the array light source 11 , wherein one dimming control module 13 controls the brightness of the upper array light source 110 , and another dimming control module 13 controls the brightness of the lower array light source 111 .

[0061] Specifically, in the present embodiment, one dimming control module 13 is electrically connected to the upper array light source 110 to independently control the luminous brightness of the upper array light source 110. Another dimming control module 13 is electrically connected to the lower array light source 111 to independently control the luminous brightness of the lower array light source 111. The dimming control modules 13 are respectively provided for the upper array light source 110 and the lower array light source 111, so as to achieve the purpose of independently modulating the luminous brightness of each array light source. In actual use, the number of dimming control modules can be arbitrarily selected according to the number of array light sources, which will not be described one by one here.

[0062] Specifically, in the present embodiment, the detector testing device 1 further includes a voltage testing module 15, which is electrically connected to the array light source 11, and is used to obtain the voltage of the array light source 11 when it is working. Among them, the voltage testing module 15 includes two voltmeters 150, each of which is arranged on the outer wall of the main body 100. In actual use, the number of voltmeters can be arbitrarily set as needed, and is not limited to the present embodiment. And one of the voltmeters 150 is electrically connected to the upper array light source 110 to display the voltage when the upper array light source 110 is working; the other voltmeter 150 is electrically connected to the lower array light source 111 to display the voltage when the lower array light source 111 is working. In actual use, any device that can obtain test data of the array light source is applicable to the present invention, and will not be described one by one here.

[0063] As another implementation of the present invention, Figure 1 and Figure 2 As shown, the detector test device 1 also includes three indicator lights 16; each indicator light 16 is arranged on the outer wall of the box body 10, that is, the indicator light 16, the voltmeter 15, the power supply 14 and the dimming control module 13 are all on the same plane (the same outer wall). Among them, the first indicator light 160 is electrically connected to the upper array light source 110 to obtain the working status of the upper array light source 110; the second indicator light 161 is electrically connected to the power supply 14 to obtain the power supply status of the detector test device 1; the third indicator light 162 is electrically connected to the lower array light source 111 to obtain the working status of the lower array light source 111. In actual use, the number of indicator lights can be set arbitrarily according to needs, and will not be described one by one here. That is, the indicator light 16 is used to obtain the working status of the detector test device 1. In actual use, any device that can reflect the working status of the detector test system is applicable to the present invention, and is not limited to this embodiment.

[0064] The present invention also provides a detector testing system 2, such as Figure 3As shown, the detector test system 2 also includes a low-energy array photosensitive chip 20, a high-energy array photosensitive chip 21, an assembled printed circuit board 22 and a detector test device 1; wherein the low-energy array photosensitive chip 20, the high-energy array photosensitive chip 21 and the assembled printed circuit board 22 are all arranged in the detector test device 1. And the detector test device 1 can also be applied to other systems that require independent regulation of dual light sources, including but not limited to dual-light source circular systems. Among them, the assembled printed circuit board 22 is arranged between the upper array light source 110 and the lower array light source 111; that is, the distance between the assembled printed circuit board 22 and the upper array light source 110 is equal to the distance between the assembled printed circuit board 22 and the lower array light source 111, so that during the test process, each pixel on the low-energy array photosensitive chip 20 and the high-energy array photosensitive chip 21 can obtain relatively uniform light input, ensuring the accuracy of the test results. The assembled printed circuit board 22 (PCBA circuit board) serves as a carrier board for the low-energy array photosensitive chip 20 and the high-energy array photosensitive chip 21 to achieve circuit connectivity. That is, the low-energy area array photosensitive chip 20 is arranged on the front side of the assembled printed circuit board 22, and is arranged face to face with the upper array light source 110. The high-energy area array photosensitive chip 21 is arranged on the back side of the assembled printed circuit board 22, and is arranged face to face with the lower array light source 111. In actual use, any device that can serve as a carrier for low-energy area array photosensitive chips and high-energy area array photosensitive chips and can achieve circuit connectivity is applicable to the present invention, and is not limited to this embodiment. And the low-energy area array photosensitive chip 20, the high-energy area array photosensitive chip 21 and the array light source 11 share the same power supply to further save space, making the layout of the entire system more reasonable and neat. In actual use, any method that can power the low-energy area array photosensitive chip, the high-energy area array photosensitive chip and the array light source is applicable to the present invention, and will not be described one by one here.

[0065] Specifically, in this embodiment, Figure 3 As shown, the detector test system 2 further includes a shielding plate 23; the shielding plate 23 is disposed between the upper array light source 110 and the lower array light source 111, and the assembled printed circuit board 22 is embedded on the shielding plate 23, that is, the shielding plate 23 is connected to the assembled printed circuit board 22 and is in the same straight line as the assembled printed circuit board 22, so as to shield the optical crosstalk generated between the upper array light source 110 and the lower array light source 111. In actual use, any device capable of shielding the optical crosstalk between array light sources is applicable to the present invention, and will not be described in detail here.

[0066] As another implementation of the present invention, the detector test system 2 further includes a test module (not shown in the figure), which includes but is not limited to a host computer, and the test module is electrically connected to the low-energy array photosensitive chip 20 and the high-energy array photosensitive chip 21 to obtain test data. That is, during the test process, the test data of all pixels on the low-energy array photosensitive chip 20 and the high-energy array photosensitive chip 21 are transmitted to the test module for data processing.

[0067] like Figure 4 As shown, the present invention also provides a test method 3, which includes: starting the power supply to power the detector test system 2, and the second indicator light is on. The working states of the upper array light source 110 and the lower array light source 111 are controlled by each dimming controller 13; that is, the luminous brightness of the upper array light source 110 is controlled by one of the dimming controllers 13, and the luminous intensity of the upper array light source 110 is determined by the voltage data displayed by the voltmeter electrically connected to the upper array light source 110. The upper array light source 110 provides a light source for the low-energy array photosensitive chip 20, so that the upper array light source 110 provides a relatively uniform light input for each pixel on the low-energy array photosensitive chip 20, so as to perform a response test on all pixel points on the low-energy array photosensitive chip 20, and output the test data to the test module for data processing. Another dimming controller 13 controls the luminous brightness of the lower array light source 111, and the luminous intensity of the lower array light source 111 is determined by the voltage data displayed by the voltmeter electrically connected to the lower array light source 111. The lower array light source 111 provides light for the high-energy array photosensitive chip 21, so that the lower array light source 111 provides relatively uniform light input for each pixel on the high-energy array photosensitive chip 21, so as to perform response tests on all pixels on the high-energy array photosensitive chip 21, and also output the test data to the test module for data processing. At the same time, the indicator light connected to the array light source 11 is observed to determine whether the array light source 11 is working normally.

[0068] In summary, the present invention provides a detector testing device, system and testing method, including: a box, an array light source, two light boards, two dimming control modules and a power supply; the box includes a main body and an upper cover; the upper cover is arranged on the main body to form a closed environment; the array light source and the light board are arranged inside the box, and the dimming control module and the power supply are arranged on the outer wall of the main body; the array light source includes an upper array light source and a lower array light source; the upper array light source is fixedly arranged on one of the light boards, and the lower array light source is fixedly arranged on another light board; the power supply supplies power to the detector testing system; each dimming control module is electrically connected to the array light source, one dimming control module controls the brightness of the upper array light source, and the other dimming control module controls the brightness of the lower array light source. The detector testing system of the present invention independently regulates the luminous intensity of the upper array light source and the lower array light source by setting two dimming control modules, thereby realizing the double-sided test of the double-sided array photosensitive array. And the method for performing detector testing based on the detector testing system of the present invention can improve the stability and test efficiency of the semi-finished product test of the CT detector. Therefore, the present invention effectively overcomes the various shortcomings in the prior art and has a high industrial utilization value.

[0069] The above embodiments are merely illustrative of the principles and effects of the present invention, and are not intended to limit the present invention. Anyone familiar with the art may modify or alter the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or alterations made by a person of ordinary skill in the art without departing from the spirit and technical concept disclosed by the present invention shall still be covered by the claims of the present invention.

Claims

1. A detector testing device, characterized in that: The detector testing device comprises: a box, an array light source, two light panels, two dimming control modules and a power supply; The box body includes a main body and an upper cover; the upper cover is arranged on the main body to form a closed environment; The array light source and the light panel are arranged inside the box, and the dimming control module and the power supply are arranged on the outer side wall of the main body; The array light source comprises an upper array light source and a lower array light source; the upper array light source is fixedly arranged on one of the light boards, and the lower array light source is fixedly arranged on the other light board; The power supply supplies power to the detector testing device; Each dimming control module is electrically connected to the array light source, wherein one dimming control module controls the brightness of the upper array light source, and another dimming control module controls the brightness of the lower array light source.

2. The detector testing device according to claim 1, characterized in that: The detector test device also includes three indicator lights; each indicator light is arranged on the outer side wall of the box body, the first indicator light is electrically connected to the upper array light source to obtain the working state of the upper array light source; the second indicator light is electrically connected to the power supply to obtain the power supply state of the detector test device; The third indicator light is electrically connected to the lower array light source and is used to obtain the working status of the lower array light source.

3. The detector testing device according to claim 1, characterized in that: The detector testing device further comprises a voltage testing module, which is electrically connected to the array light source and is used to obtain the voltage of the array light source when it is working.

4. The detector testing device according to claim 3, characterized in that: The voltage testing module includes two voltmeters; one of the voltmeters is electrically connected to the upper array light source to display the voltage when the upper array light source is working; the other voltmeter is electrically connected to the lower array light source to display the voltage when the lower array light source is working.

5. The detector testing device according to claim 1, characterized in that: The upper cover is provided with a handle for moving the upper cover.

6. A detector testing system, characterized in that: The detector testing system comprises: a low-energy area array photosensitive chip, a high-energy area array photosensitive chip, an assembled printed circuit board and a detector testing device as described in any one of claims 1 to 5; the low-energy area array photosensitive chip, the high-energy area array photosensitive chip and the assembled printed circuit board are all arranged in the detector testing device; the assembled printed circuit board is arranged between the upper array light source and the lower array light source; the low-energy area array photosensitive chip is arranged on the front side of the assembled printed circuit board, opposite to the upper array light source; the high-energy area array photosensitive chip is arranged on the back side of the assembled printed circuit board, opposite to the lower array light source.

7. The detector testing system according to claim 6, characterized in that: The detector testing system also includes a shielding plate; the shielding plate is arranged between the upper array light source and the lower array light source, and the assembled printed circuit board is embedded in the shielding plate to shield the optical crosstalk generated between the upper array light source and the lower array light source.

8. The detector testing system according to claim 6, characterized in that: The detector testing system also includes a testing module; the testing module is electrically connected to the low-energy array photosensitive chip and the high-energy array photosensitive chip to obtain test data.

9. The detector testing system according to claim 6, characterized in that: The low-energy area array photosensitive chip, the high-energy area array photosensitive chip and the array light source share a same power supply.

10. A testing method, implemented based on the detector testing system according to any one of claims 6 to 9, characterized in that: The test method comprises: Starting the power supply to supply power to the detector testing system; The upper array light source and the lower array light source are respectively controlled by each dimming controller; the upper array light source is used to provide light source for the low-energy area array photosensitive chip to test all pixel points on the low-energy area array photosensitive chip; the lower array light source provides light source for the high-energy area array photosensitive chip to test all pixel points on the high-energy area array photosensitive chip.

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