Current limiting device logic function test system capable of simulating power grid state

Abstract

The invention relates to the technical field of function testing, and discloses a current limiting device logic function testing system capable of simulating a power grid state. Comprising the following steps of: extracting effective parameters from effective events; judging whether the current limiting device meets a logic function test requirement or not; configuring an analog signal in a test scene; simulating a power grid short-circuit scene, acquiring comprehensive function data in the power grid short-circuit scene, and predicting a logic function state value of the current limiting device. Identifying abnormal data from the comprehensive function data, and performing logic function level division on the current limiting device; compared with the prior art, the condition that the logic function test requirement is not met can be avoided, the dynamic simulation requirement between various current limiting devices of different specifications and types is met, the compatibility of the test system is effectively improved, and meanwhile the performance test model is combined with the prediction effect of the performance test model. The performance strength of the actual logic function of the current limiting device can be accurately predicted, and a comparison basis is provided for the performance strength of the current limiting device.

Description

Technical Field

[0001] The present invention relates to the technical field of functional testing, and more particularly to a current limiting device logic function testing system capable of simulating a power grid state. Background Art

[0002] The current limiting device is mainly used to limit the current within a specific range to protect the power grid equipment and improve the stability and safety of the power system, and effectively prevent the impact of short circuit and overload faults on the power grid. In order to accurately understand the response capability of the current limiting device under the short circuit fault of the power grid, it is necessary to test the performance of the logic function of the current limiting device.

[0003] The patent application with reference publication number CN109828169A discloses an electrical performance test method, device and system for an electrical fire-proof current-limiting protector, which can provide a comprehensive understanding of the electrical performance indicators of the electrical fire-proof current-limiting protector, and at the same time improve the test efficiency, safety, reliability and stability of the product. It can also perform a power supply voltage fluctuation test performance test of the electrical fire-proof current-limiting protector, and automatically generate a test report for easy viewing by personnel; When conducting a logic function test on an existing current limiting device, the various parameters of the current limiting device under a short-circuit state of the power grid are directly collected, and then compared one by one in combination with the various parameters to determine whether the logic function of the current limiting device is normal or not. This one-by-one comparison method not only requires the collection and analysis of a large amount of original data, increasing the test burden of the test system, but also lacks the screening operation for various abnormal data in a poor operating state, resulting in the subsequent logic function test judgment of the current limiting device being susceptible to negative interference, thereby reducing the efficiency and accuracy of the logic function test of the current limiting device, and is not conducive to the subsequent accurate distinction operation of the current limiting device.

[0004] In view of this, the present invention proposes a current limiting device logic function test system capable of simulating the state of a power grid to solve the above-mentioned problem. Summary of the invention

[0005] In order to overcome the above-mentioned defects of the prior art and to achieve the above-mentioned purpose, the present invention provides the following technical solution: a current limiting device logic function test system capable of simulating the state of a power grid, applied to a test platform, comprising: The parameter extraction module is used to filter out valid events from the running events and extract valid parameters from the valid events; A test determination module is used to combine the effective parameters with the parameter identification criteria, identify the operating state of the current limiting device, and determine whether the current limiting device meets the logic function test requirements; The simulation scenario module is used to construct a test scenario when the logic function test requirements are met, and configure a simulation signal in the test scenario to simulate a power grid short circuit scenario; A data collection module is used to obtain the original test data in the power grid short circuit scenario and combine the original test data into comprehensive functional data; A prediction and determination module is used to input the comprehensive function data into the trained performance test model, predict the logical function state value of the current limiting device, and determine whether to perform an abnormality detection operation; The level division module is used to identify abnormal data from the comprehensive functional data and divide the current limiting device into logical functional levels when performing an abnormal detection operation.

[0006] Further, the screening methods for effective events include: Mark the type boxes of all events in the database one by one, identify the type words in the type boxes, and record the events whose type word is "run" as run events; Mark all the data in the running event one by one, and query the recording time of the first data and the recording time of the last data through the timestamp to obtain the start time and end time respectively; The duration between the start time and the end time is recorded as the recorded duration, the recorded duration greater than the lower limit of the duration is recorded as the valid duration, and the running event corresponding to the valid duration is recorded as the valid event, and i valid events are obtained.

[0007] Furthermore, the valid parameters include the fault trigger value and the safety time ratio value; Methods for extracting the safe time ratio include: The operating temperature of the current limiting device in i valid events is queried one by one through the database, the operating temperature within the safe temperature range is recorded as the safe temperature, and the duration of the safe temperature in i valid events is counted to obtain i first durations; During the i first durations, the working voltages of the current limiting devices are queried one by one through the database, the working voltages within the safe voltage range are recorded as safe voltages, and the duration of the safe voltage is counted to obtain i second durations; Compare the i second durations with the i effective durations in sequence to obtain i sub-proportion values; The expression of the sub-ratio value is: ; In the formula, For the The sub-percentage value of valid events, , For the The second duration of a valid event, For the The effective duration of a valid event; Compare the i sub-proportions one by one, and record the minimum value of the sub-proportion as the safe time ratio.

[0008] Furthermore, the parameter identification criteria are: there are no unqualified parameters in the current limiting device; The operating state includes a reliable state and an unreliable state; Methods for identifying reliable and unreliable states include: Compare the fault trigger value with a preset fault trigger threshold, and when the fault trigger value is greater than the preset fault trigger threshold, record the fault trigger value as an unqualified parameter; The safety time ratio is compared with the preset time ratio threshold. When the safety time ratio is less than the preset time ratio threshold, the fault trigger value is recorded as an unqualified parameter. Counting the number of unqualified parameters, and when the number of unqualified parameters is 0, identifying the operating state of the current limiting device as a reliable state; When the number of unqualified parameters is 1 or 2, the operating state of the current limiting device is identified as an unreliable state; The determination methods for whether the logic function test requirements are met include: When the operating state is identified as an unreliable state, it is determined that the logic function test requirements are not met; When the operating state is identified as a reliable state, it is determined that the logic function test requirements are met.

[0009] Further, the analog signal includes a RoCoF signal and a current signal; The simulation methods for power grid short circuit scenarios include: A blank scene with two workstations is constructed by using virtual reality technology, and the two workstations are respectively recorded as the first workstation and the second workstation; Introducing a logic function test device into a first station, and introducing a current limiting device into a second station, to obtain a first test station and a second test station; Marking channel openings at adjacent ends of the first test station and the second test station, respectively, and establishing a test channel between the two channel openings to generate a test scenario; A RoCoF signal and a current signal are configured on a logic function test device, and the RoCoF signal and the current signal are transmitted from a first test station to a second test station through a test channel; When the current limiting device receives the RoCoF signal and the current signal, it simulates the scenario where the power grid is in a short-circuit state and generates a power grid short-circuit scenario.

[0010] Furthermore, the original test data includes a test signal and a signal time; The method for obtaining the test signal and signal time includes: The time when the current limiting device first receives the analog signal is found out through the timestamp, and recorded as the signal start time; After the signal start time, the signal data sent by the current limiting device to the logic function test device are marked one by one through the signal management system; The keywords in the signal data are identified one by one by using natural language processing technology, and the signal data with the keywords of switch drive, switch node and device operation are recorded as switch drive signal, switch node signal and device action signal respectively; After the switch drive signal, the switch node signal and the device action signal are aggregated, a test signal is generated; The times corresponding to when the logic function test device receives the switch drive signal, the switch node signal and the device action signal are queried one by one through the timestamps, and are recorded as the first time, the second time and the third time respectively; The durations from the signal start time to the first time, the second time and the third time are recorded as the first signal duration, the second signal duration and the third signal duration respectively, and the first signal duration, the second signal duration and the third signal duration are summarized to generate the signal time.

[0011] Further, the combined method of comprehensive functional data includes: Constructing a data group having three function bits, and recording the three function bits as a first data bit, a second data bit, and a third data bit in sequence; Draw segmentation lines along the vertical direction at both ends of the first data bit, the second data bit and the third data bit respectively to obtain contour lines; Match the switch drive signal, the switch node signal and the device action signal with the first signal duration, the second signal duration and the third signal duration respectively to generate a first test set, a second test set and a third test set; The first test set, the second test set and the third test set are sequentially filled into the first data bit, the second data bit and the third data bit to generate comprehensive functional data.

[0012] Furthermore, the training method of the performance test model includes: The logic function status value includes normal state and abnormal state; Pre-collecting multiple groups of comprehensive function data and logical function state values ​​corresponding to the comprehensive function data; The comprehensive function data is converted into a corresponding set of feature vectors, the feature vectors are used as the input of the performance test model, the logical function state value is converted into a label corresponding to the comprehensive function data, the normal state is converted into 00, the abnormal state is converted into 11, and the logical function state value corresponding to each set of comprehensive function data is used as the output of the performance test model, the logical function state value is used as the prediction target, and the sum of the prediction errors of all training data is minimized as the training target, and the performance test model is trained until the sum of the prediction errors reaches convergence and the training is stopped; The determination method of whether to perform an anomaly detection operation includes: When the output of the performance test model is 00, the predicted logic function state value is normal, and it is determined that the abnormality detection operation is not performed; When the output of the performance test model is 11, the predicted logic function state value is an abnormal state, and it is determined to perform an abnormal detection operation.

[0013] Furthermore, the method for identifying abnormal data includes: Compare the first signal duration with the first signal standard value, and when the first signal duration is greater than the first signal standard value, record the first signal duration as abnormal data; Compare the duration of the second signal with the second signal standard value, and when the duration of the second signal is greater than the second signal standard value, record the duration of the second signal as abnormal data; The third signal duration is compared with the third signal standard value, and when the third signal duration is greater than the third signal standard value, the third signal duration is recorded as abnormal data.

[0014] Further, the logical function level includes a primary abnormality level and a secondary abnormality level; The classification methods of the primary abnormality level and the secondary abnormality level include: Count the number of abnormal data. When the number of abnormal data is 1, it is classified as the first abnormal level. When the number of abnormal data is 2 or 3, it is classified as the secondary abnormal level.

[0015] The technical effects and advantages of the current limiting device logic function test system capable of simulating the power grid state of the present invention are as follows: The present invention obtains the operation events of the current limiting device, screens out valid events from the operation events, extracts valid parameters from the valid events, identifies the operation state of the current limiting device based on parameter identification criteria, and determines whether the current limiting device meets the logic function test requirements, constructs a test scenario based on a logic function test device and the current limiting device, configures a simulation signal in the test scenario, simulates a power grid short-circuit scenario, obtains original test data in the power grid short-circuit scenario, matches the original test data into a test set, and combines the test set into comprehensive function data, inputs the comprehensive function data into a trained performance test model, predicts the logic function state value of the current limiting device, and determines whether to perform an abnormal detection operation, identifies abnormal data from the comprehensive function data, and divides the current limiting device into logical function levels according to the number of abnormal data; compared with the prior art, the present invention adopts event screening and state identification. The method can judge whether the initial operating state of the current limiting device is normal or not, thereby avoiding situations that do not meet the requirements of the logic function test and avoiding the phenomenon that the current limiting device causes inaccurate test results due to its own poor condition. By constructing a virtual power grid short-circuit scenario, the collection and analysis operations of the current limiting device and the logic function test device in the simulation state can be met, and the dynamic simulation requirements between current limiting devices of various specifications and types can be met, which effectively improves the compatibility of the test system. At the same time, combined with the prediction effect of the performance test model, the performance strength of the actual logic function of the current limiting device can be accurately predicted, and the performance strength of the logic function of the current limiting device can be accurately distinguished according to the prediction results, so as to truly and accurately test whether the logic function of the current limiting device is normal under the power grid short-circuit state, and provide a comparison basis for the performance strength of the current limiting device, thereby providing data support for the subsequent maintenance of the current limiting device. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 A schematic diagram of a current limiting device logic function test system capable of simulating a power grid state provided in Embodiment 1 of the present invention; Figure 2 A flow chart of a method for testing the logic function of a current limiting device capable of simulating a power grid state provided in a second embodiment of the present invention. DETAILED DESCRIPTION

[0017] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0018] Example 1: Please refer to Figure 1As shown, the current limiting device logic function test system capable of simulating the power grid state described in this embodiment is applied to a test platform, including: A parameter extraction module obtains the operation events of the current limiting device, selects valid events from the operation events, and extracts valid parameters from the valid events; Operation events refer to events that contain various basic operation data of the current limiting device in the working state, which can comprehensively represent all the operation dynamics of the current limiting device in the working state and serve as the basis for subsequent data screening and parameter extraction; Since the operation event is a representation of all the operation dynamics of the current limiting device under the working state, different operation events will have different differences. At the same time, when the data in the operation event is incomplete, the operation event at this time cannot represent the real state of the current limiting device. Therefore, it is necessary to accurately filter out valid events with complete content and meeting the requirements from the operation events, so that the valid events can be used as the extraction objects of subsequent valid parameters; Valid event screening methods include: Mark the type boxes of all events in the database one by one, identify the type words in the type boxes, and record the events whose type words are "running" as running events; the type box is a content storage box for the types of events in the database, and the type words are the storage contents in the type box, and are used to accurately and concisely represent the types of events; Mark all the data in the running event one by one, and query the recording time of the first data and the recording time of the last data through the timestamp to obtain the start time and end time respectively; The duration between the start time and the end time is recorded as the recorded duration, and the recorded duration is compared with the lower limit of the duration; the lower limit of the duration refers to the duration span between the first data and the last data marked as the effective duration, which can limit the minimum value of the effective duration to ensure that the effective duration can be maintained within a reasonable span and avoid the effective duration with a duration span that is too small; The recorded duration greater than the lower limit of the duration is recorded as the valid duration, and the running event corresponding to the valid duration is recorded as the valid event, and i valid events are obtained.

[0019] When a valid event is obtained, valid parameters can be extracted from the valid event. The valid parameters at this time can serve as the basis for judging whether the current limiting device meets the requirements of the logic function test in the subsequent test, and play a preliminary role in indicating the basic operating status of the current limiting device. Valid parameters include fault trigger value and safety time ratio; The fault trigger value refers to the maximum number of times the current limiting device stops operating due to a fault within the effective duration in a valid event, which can be used to indicate the number of times the current limiting device fails within the effective duration. The fault trigger value is obtained by taking the maximum value of the number of times the current limiting device stops operating due to a fault within the effective duration after the security defense system queries the number of times the current limiting device stops operating due to a fault within the effective duration. The safe time ratio value refers to the minimum value of the ratio between the time that the current limiting device is in a safe operating state within the effective time and the effective time in the effective event, which can be used to indicate the time that the current limiting device is in a safe and stable state; Methods for extracting the safe time ratio include: The operating temperature of the current limiting device in i valid events is queried one by one through the database, the operating temperature within the safe temperature range is recorded as the safe temperature, and the duration of the safe temperature in the i valid events is counted to obtain i first durations; the safe temperature range refers to the range between the minimum value and the maximum value of the operating temperature of the current limiting device when it is operating normally, so as to serve as a standard for judging whether the operating temperature exceeds the range; In the i first time periods, the working voltage of the current limiting device is queried one by one through the database, the working voltage within the safe voltage range is recorded as the safe voltage, and the duration of the safe voltage is counted to obtain i second time periods; the safe voltage range refers to the range between the minimum value of the working voltage and the maximum value of the working temperature of the current limiting device when it is operating normally, so as to serve as a standard for judging whether the working voltage exceeds the range; Compare the i second durations with the i effective durations in sequence to obtain i sub-proportion values; The expression of the sub-ratio value is: ; In the formula, For the The sub-percentage value of valid events, , For the The second duration of a valid event, For the The effective duration of a valid event; Compare the i sub-proportions one by one, and record the minimum value of the sub-proportion as the safe time ratio.

[0020] It should be noted that the acquired fault trigger value and safety time ratio value are not for the determination of all valid events, but are for the representation of typical determination of valid events, and provide a basis for the subsequent identification of the operating status of the current limiting device.

[0021] A test determination module, based on parameter identification criteria, identifies the operating state of the current limiting device and determines whether the current limiting device meets the logic function test requirements; The operating status is a true representation of the actual operation of the current limiting device in the past time period based on the valid parameters in the valid event, and can also provide a comparison basis for whether the current limiting device meets the subsequent logic function test requirements; When identifying the operating status of the current limiting device, it is necessary to make an overall comparison and identification of the fault trigger value and the safety time ratio under the restriction of the parameter identification criteria, so as to ensure the accuracy of the identification of the subsequent operating status; The parameter identification criteria are: there are no unqualified parameters in the current limiting device; that is, it is ensured that the current limiting device has not had any parameters that have a negative impact on the logic function test requirements in the past period of time, so as to increase the determination threshold of the logic function test requirements and improve the accuracy of the logic function test results; The operating state includes a reliable state and an unreliable state; the reliable state is used to indicate that there are no unqualified parameters in the current limiting device, and the unreliable state is used to indicate that there are unqualified parameters in the current limiting device; Methods for identifying reliable and unreliable states include: Compare the fault trigger value with the preset fault trigger threshold; the preset fault trigger threshold is used to represent the maximum number of fault trigger times of the current limiting device in the past time period, so as to represent the operating reliability of the current limiting device; the preset fault trigger threshold is obtained by collecting a large number of minimum values ​​of fault trigger values ​​marked as unqualified parameters in the past and calculating their average value; When the fault trigger value is greater than the preset fault trigger threshold, the number of fault trigger times in the current limiting device is large, and the operation reliability of the current limiting device in the past time period is low, and the fault trigger value is recorded as an unqualified parameter; The safety time ratio value is compared with the preset time ratio threshold value; the preset time ratio threshold value is used to represent the minimum value of the safety time ratio value of the current limiting device in the past time period, so as to represent the operating reliability of the current limiting device; the preset time ratio threshold value is obtained by collecting the maximum values ​​of a large number of safety time ratio values ​​marked as unqualified parameters in the history and calculating their average value; When the safe time ratio is less than the preset time ratio threshold, the safe operation time in the current limiting device is short, and the operation reliability of the current limiting device in the past time period is low, and the fault trigger value is recorded as an unqualified parameter; The number of unqualified parameters is counted. When the number of unqualified parameters is 0, it means that there are no parameters in the current limiting device that have a negative impact on the operation of the current limiting device, and the operation state of the current limiting device is identified as a reliable state; When the number of unqualified parameters is 1 or 2, it indicates that parameters that have a negative impact on the operation of the current limiting device appear in the current limiting device, and the operation state of the current limiting device is identified as an unreliable state.

[0022] Meeting the logic function test requirements is a prerequisite for the subsequent steps. After obtaining the operating status of the current limiting device, it can be determined whether the current limiting device meets the subsequent logic function test requirements based on the actual operating status, thereby ensuring that the subsequent steps can operate normally; The determination methods for whether the logic function test requirements are met include: When the operating state of the current limiting device is identified as an unreliable state, the operating state of the current limiting device is unsafe at this time, and it is determined that the logic function test requirement is not met; When the operating state of the current limiting device is identified as a reliable state, the operating state of the current limiting device is safe at this time, and it is determined that the logic function test requirement is met.

[0023] The simulation scenario module builds a test scenario based on the logic function test device and the current limiting device, and configures a simulation signal in the test scenario to simulate a power grid short circuit scenario; The test scenario refers to a basic scenario that can provide virtual simulation testing for the logic function test device and the current limiting device, thereby providing the necessary preconditions for the subsequent logic function test device and the current limiting device to simulate the short-circuit state of the power grid; After the test scenario is constructed, in order to accurately simulate the short-circuit state of the power grid in the test scenario, it is necessary to configure the analog signal on the test scenario so that the logic function test device and the current limiting device can collect and analyze the relevant changes of the short-circuit state of the power grid based on the analog signal, thereby simulating the short-circuit scenario of the power grid; The analog signal includes a RoCoF signal and a current signal; The simulation methods for power grid short circuit scenarios include: A blank scene with two workstations is constructed through virtual reality technology, and the two workstations are recorded as the first workstation and the second workstation respectively; the blank scene refers to the basic scene outline without substantial content, and serves as a template for the subsequent construction of the power grid short-circuit scene, while the workstation is the position limit used to import specific devices in the blank scene; Introducing a logic function test device into a first station, and introducing a current limiting device into a second station, to obtain a first test station and a second test station; The channel ports are marked at the adjacent ends of the first test station and the second test station respectively, and a test channel is established between the two channel ports to generate a test scenario; the test channel refers to a channel that can realize bidirectional communication and transmission of data signals between the first test station and the second test station, ensuring that bidirectional signal conduction can be maintained between the logic function test device and the current limiting device; A RoCoF signal and a current signal are configured on the logic function test device, and the RoCoF signal and the current signal are transmitted from the first test station to the second test station through the test channel; the RoCoF signal is used to represent the rate of change of the power grid frequency corresponding to the logic function test device, thereby limiting the stability and response speed of the simulated power grid short circuit scenario; When the current limiting device receives the RoCoF signal and the current signal, it simulates the scenario where the power grid is in a short-circuit state and generates a power grid short-circuit scenario.

[0024] It should be noted that when a power grid short-circuit scenario is generated, the current limiting device will generate various parameters corresponding to the power grid short-circuit state, and transmit these parameters to the logic function test device through the test channel again, so that the logic function test device can simulate the changes in various parameters and signals of the current limiting device when the power grid is in a short-circuit state.

[0025] The data collection module obtains the original test data in the power grid short circuit scenario, matches the original test data into test collections, and combines the test collections into comprehensive functional data; The original test data refers to the representation of various signal parameters generated by the current limiting device in the short-circuit scenario of the power grid and adapted to the short-circuit state of the power grid, that is, the overall representation of the signal parameters sent by the current limiting device to the logic function test device, and serves as the basis for the subsequent evaluation of whether the logic function of the current limiting device meets the requirements; The original test data includes the test signal and signal time; the test signal is a signal used to limit the current generated by the current limiting device and is used as a measure to control the current limiting of the actuator. The signal time is used to indicate the specific moment when the test signal is generated; The method for obtaining the test signal and signal time includes: The time when the current limiting device first receives the analog signal is found out through the timestamp, and recorded as the signal start time; After the signal start time, the signal data sent by the current limiting device to the logic function test device are marked one by one through the signal management system; The keywords in the signal data are identified one by one by using natural language processing technology, and the signal data with the keywords of switch drive, switch node and device operation are recorded as switch drive signal, switch node signal and device action signal respectively; After the switch drive signal, the switch node signal and the device action signal are aggregated, a test signal is generated; The times corresponding to when the logic function test device receives the switch drive signal, the switch node signal and the device action signal are queried one by one through the timestamps, and are recorded as the first time, the second time and the third time respectively; The durations from the signal start time to the first time, the second time and the third time are recorded as the first signal duration, the second signal duration and the third signal duration respectively, and the first signal duration, the second signal duration and the third signal duration are summarized to generate the signal time.

[0026] After obtaining the test signal and signal time, the test signal and signal time can be matched accordingly, so that each specific test signal can be combined with the corresponding signal time, thereby generating a test set with specific action instructions and time representation, and ensuring that the test set can form a data basis that satisfies subsequent analysis and prediction, and generate comprehensive functional data; Combination methods for comprehensive functional data include: A data group with three function bits is constructed, and the three function bits are recorded as the first data bit, the second data bit and the third data bit in sequence; the data group is the basis for forming comprehensive function data, and the function bit is the smallest unit forming the data group and is used as the import position of specific data; Draw a segmentation line along the vertical direction at both ends of the first data bit, the second data bit and the third data bit respectively to obtain a contour line; so that the contour line can define the boundaries on both sides of the first data bit, the second data bit and the third data bit, prevent the data in the first data bit, the second data bit and the third data bit from interfering with each other, and improve the independence of the data on the first data bit, the second data bit and the third data bit; Match the switch drive signal, the switch node signal and the device action signal with the first signal duration, the second signal duration and the third signal duration respectively to generate a first test set, a second test set and a third test set; The first test set, the second test set and the third test set are sequentially filled into the first data bit, the second data bit and the third data bit to generate comprehensive functional data.

[0027] It should be noted that, after the comprehensive functional data is generated, the comprehensive functional data at this time can be used as the object of subsequent testing of the logical functional performance of the current limiting device, and the corresponding test results can be obtained according to the comprehensive functional data.

[0028] The prediction and judgment module inputs the comprehensive function data into the trained performance test model, predicts the logical function state value of the current limiting device, and determines whether to perform an abnormal detection operation; The performance test model refers to a machine learning model that can predict the actual performance strength of the logic function of the current limiting device based on the comprehensive function data of the current limiting device, so as to serve as an analysis basis for whether the logic function of the current limiting device is normal or not, and predict the logic function state value corresponding to the comprehensive function data; The logical function status value is used to indicate whether the logical function of the current limiting device is normal or not in the short-circuit state of the power grid. The logical function status value includes normal state and abnormal state. The logical function status value is obtained by collecting a large amount of historical comprehensive function data in normal state and abnormal state. The training methods for the performance test model include: Pre-collecting multiple groups of comprehensive function data and logical function state values ​​corresponding to the comprehensive function data; Convert the comprehensive function data into a corresponding set of feature vectors, use the feature vectors as the input of the performance test model, convert the logical function state values ​​into labels corresponding to the comprehensive function data, illustratively, convert the normal state into 00, convert the abnormal state into 11, and use the logical function state values ​​corresponding to each set of comprehensive function data as the output of the performance test model, use the logical function state values ​​as the prediction targets, and use minimizing the sum of prediction errors of all training data as the training target, train the performance test model until the sum of prediction errors converges and stops training.

[0029] Exemplarily, the performance test model is any one of the CNN neural network model or AlexNet; The calculation formula for the prediction error is: ; In the formula, is the prediction error, is the group number of the eigenvector; For the The predicted state value corresponding to the group feature vector, For the The actual state value corresponding to the group training data.

[0030] By inputting the comprehensive function data into the performance test model, the logic function state value of the current limiting device can be predicted, and the abnormality detection operation is determined based on the predicted logic function state value. The abnormality detection operation is an operation that is only executed when the current limiting device has a logic function test abnormality. The determination method of whether to perform an anomaly detection operation includes: When the output of the performance test model is 00, the predicted logic function state value is normal, indicating that there is no abnormality in the logic function test of the current limiting device, and no abnormality detection is required, so it is determined that the abnormality detection operation is not performed; When the output of the performance test model is 11, the predicted logic function state value is an abnormal state, indicating that an abnormal situation exists in the logic function test of the current limiting device and an abnormality detection is required, and it is determined to perform an abnormality detection operation.

[0031] When it is determined that an abnormality detection operation needs to be performed, the next step is executed to further detect the specific parameters in the abnormal situation. When it is determined that an abnormality detection operation is not required, the above steps are repeated to cyclically detect the logical function status of the current limiting device.

[0032] The level setting module identifies abnormal data from the comprehensive functional data and divides the current limiting device into logical functional levels according to the number of abnormal data; When performing an abnormality detection operation, it is necessary to identify abnormal data from the comprehensive functional data, and to represent the test result of the logic function of the current limiting device under the short-circuit state of the power grid according to the abnormal data; Methods for identifying abnormal data include: Compare the first signal duration with the first signal standard value; the first signal standard value refers to the maximum value of the duration of the switch drive signal generated when the logic function of the current limiting device is normal, which can be used as a basis for analyzing and comparing the first signal duration, so as to accurately identify abnormal data; When the duration of the first signal is greater than the first signal standard value, the duration of the first signal exceeds the maximum duration of generating the switch driving signal when the logic function of the current limiting device is normal, and the duration of the first signal is recorded as abnormal data; Compare the duration of the second signal with the second signal standard value; the second signal standard value refers to the maximum duration of the switch node signal generated when the logic function of the current limiting device is normal, which can be used as a basis for analyzing and comparing the duration of the second signal, so as to accurately identify abnormal data; When the duration of the second signal is greater than the second signal standard value, the duration of the second signal exceeds the maximum duration of generating the switch node signal when the logic function of the current limiting device is normal, and the duration of the second signal is recorded as abnormal data; Compare the duration of the third signal with the third signal standard value; the third signal standard value refers to the maximum duration of the device action signal generated when the logic function of the current limiting device is normal, which can be used as a basis for analyzing and comparing the duration of the third signal, so as to accurately identify abnormal data; When the third signal duration is greater than the third signal standard value, the third signal duration exceeds the maximum duration of the generating device action signal when the logic function of the current limiting device is normal, and the third signal duration is recorded as abnormal data.

[0033] The logic function level is used to specifically indicate the performance strength of the logic function test results of the current limiting device, which can effectively distinguish the results of different performance strengths to facilitate the subsequent display of the test results; The logic function level includes a primary abnormality level and a secondary abnormality level; the abnormality degree of the logic function of the current limiting device corresponding to the primary abnormality level is lower than the abnormality degree of the logic function of the current limiting device corresponding to the secondary abnormality level; The classification methods of the primary abnormality level and the secondary abnormality level include: The number of abnormal data is counted. When the number of abnormal data is 1, the abnormality degree of the logic function of the current limiting device is low, and it is classified as the first abnormality level; When the number of abnormal data is 2 or 3, the abnormality degree of the logic function of the current limiting device is relatively high, and it is classified as the secondary abnormality level.

[0034] It should be noted that the first-level abnormality level and the second-level abnormality level are used to indicate the degree of abnormality of the current limiting device when performing abnormal detection operations. When the abnormal detection operation is not performed, the current limiting device does not generate a logical function level but is at a normal level.

[0035] In this embodiment, by acquiring the operation events of the current limiting device, screening out valid events from the operation events, and extracting valid parameters from the valid events, the operation state of the current limiting device is identified based on the parameter identification criteria, and it is determined whether the current limiting device meets the logic function test requirements, a test scenario is constructed based on the logic function test device and the current limiting device, and a simulation signal is configured in the test scenario to simulate a power grid short circuit scenario, and the original test data in the power grid short circuit scenario is acquired, the original test data is matched into a test set, and the test set is combined into comprehensive function data, and the comprehensive function data is input into the trained performance test model, the logic function state value of the current limiting device is predicted, and it is determined whether to perform an abnormal detection operation, identify abnormal data from the comprehensive function data, and divide the current limiting device into logical function levels according to the number of abnormal data; compared with the prior art, the event screening and state recognition are adopted. In other ways, it is possible to judge whether the initial operating state of the current limiting device is normal or not, thereby avoiding situations that do not meet the requirements of the logic function test, and avoiding the phenomenon that the current limiting device has inaccurate test results due to its own poor condition. By constructing a virtual power grid short-circuit scenario, it can meet the collection and analysis operations of the current limiting device and the logic function test device in the simulation state, meet the dynamic simulation requirements between current limiting devices of various specifications and types, and effectively improve the compatibility of the test system. At the same time, combined with the prediction effect of the performance test model, it can accurately predict the performance of the actual logic function of the current limiting device, and accurately distinguish the performance of the logic function of the current limiting device based on the prediction results, so as to truly and accurately test whether the logic function of the current limiting device is normal under the power grid short-circuit state, and provide a comparison basis for the performance of the current limiting device, thereby providing data support for the subsequent maintenance of the current limiting device.

[0036] Example 2: Please refer to Figure 2 As shown, the part not described in detail in this embodiment is described in the first embodiment, and a method for testing the logic function of a current limiting device capable of simulating a power grid state is provided, which is applied to a test platform and implemented based on a system for testing the logic function of a current limiting device capable of simulating a power grid state, including: S1: Filter out valid events from running events, and extract valid parameters from valid events; S2: Combine the valid parameters and the parameter identification criteria to identify the operating state of the current limiting device and determine whether the current limiting device meets the logic function test requirements; when the logic function test requirements are met, execute S3; when the logic function test requirements are not met, repeat S1-S2; S3: When the logic function test requirements are met, a test scenario is constructed, and a simulation signal is configured in the test scenario to simulate a power grid short circuit scenario; S4: obtaining original test data in a power grid short circuit scenario, and combining the original test data into comprehensive functional data; S5: input the comprehensive function data into the trained performance test model, predict the logic function state value of the current limiting device, and determine whether to perform an abnormality detection operation; when the abnormality detection operation is performed, execute S6; when the abnormality detection operation is not performed, repeat S4-S5; S6: When performing an abnormality detection operation, abnormal data is identified from the comprehensive functional data, and the current limiting device is divided into logical functional levels.

[0037] The above description is only a specific implementation mode of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A current limiting device logic function test system capable of simulating the state of a power grid, applied to a test platform, characterized in that: include: The parameter extraction module is used to filter out valid events from the running events and extract valid parameters from the valid events; A test determination module is used to combine the effective parameters with the parameter identification criteria, identify the operating state of the current limiting device, and determine whether the current limiting device meets the logic function test requirements; The simulation scenario module is used to construct a test scenario when the logic function test requirements are met, and configure a simulation signal in the test scenario to simulate a power grid short circuit scenario; A data collection module is used to obtain the original test data in the power grid short circuit scenario and combine the original test data into comprehensive functional data; A prediction and determination module is used to input the comprehensive function data into the trained performance test model, predict the logical function state value of the current limiting device, and determine whether to perform an abnormality detection operation; The level division module is used to identify abnormal data from the comprehensive functional data and divide the current limiting device into logical functional levels when performing an abnormal detection operation.

2. A current limiting device logic function test system capable of simulating a power grid state according to claim 1, characterized in that: Valid event screening methods include: Mark the type boxes of all events in the database one by one, identify the type words in the type boxes, and record the events whose type word is "run" as run events; Mark all the data in the running event one by one, and query the recording time of the first data and the recording time of the last data through the timestamp to obtain the start time and end time respectively; The duration between the start time and the end time is recorded as the recorded duration, the recorded duration greater than the lower limit of the duration is recorded as the valid duration, and the running event corresponding to the valid duration is recorded as the valid event, and i valid events are obtained.

3. A current limiting device logic function test system capable of simulating a power grid state according to claim 2, characterized in that: Valid parameters include fault trigger value and safety time ratio; Methods for extracting the safe time ratio include: The operating temperature of the current limiting device in i valid events is queried one by one through the database, the operating temperature within the safe temperature range is recorded as the safe temperature, and the duration of the safe temperature in i valid events is counted to obtain i first durations; During the i first durations, the working voltages of the current limiting devices are queried one by one through the database, the working voltages within the safe voltage range are recorded as safe voltages, and the duration of the safe voltage is counted to obtain i second durations; Compare the i second durations with the i effective durations in sequence to obtain i sub-proportion values; The expression of the sub-ratio value is: ； In the formula, For the The sub-percentage value of valid events, , For the The second duration of a valid event, For the The effective duration of a valid event; Compare the i sub-proportions one by one, and record the minimum value of the sub-proportion as the safe time ratio.

4. A current limiting device logic function test system capable of simulating a power grid state according to claim 3, characterized in that: The parameter identification criteria are: there are no unqualified parameters in the current limiting device; The operating state includes a reliable state and an unreliable state; Methods for identifying reliable and unreliable states include: Compare the fault trigger value with a preset fault trigger threshold, and when the fault trigger value is greater than the preset fault trigger threshold, record the fault trigger value as an unqualified parameter; The safety time ratio is compared with the preset time ratio threshold. When the safety time ratio is less than the preset time ratio threshold, the fault trigger value is recorded as an unqualified parameter. Counting the number of unqualified parameters, and when the number of unqualified parameters is 0, identifying the operating state of the current limiting device as a reliable state; When the number of unqualified parameters is 1 or 2, the operating state of the current limiting device is identified as an unreliable state; The determination methods for whether the logic function test requirements are met include: When the operating state is identified as an unreliable state, it is determined that the logic function test requirements are not met; When the operating state is identified as a reliable state, it is determined that the logic function test requirements are met.

5. A current limiting device logic function test system capable of simulating a power grid state according to claim 4, characterized in that: The analog signal includes a RoCoF signal and a current signal; The simulation methods for power grid short circuit scenarios include: A blank scene with two workstations is constructed by using virtual reality technology, and the two workstations are respectively recorded as the first workstation and the second workstation; Introducing a logic function test device into a first station, and introducing a current limiting device into a second station, to obtain a first test station and a second test station; Marking channel openings at adjacent ends of the first test station and the second test station, respectively, and establishing a test channel between the two channel openings to generate a test scenario; A RoCoF signal and a current signal are configured on a logic function test device, and the RoCoF signal and the current signal are transmitted from a first test station to a second test station through a test channel; When the current limiting device receives the RoCoF signal and the current signal, it simulates the scenario where the power grid is in a short-circuit state and generates a power grid short-circuit scenario.

6. A current limiting device logic function test system capable of simulating a power grid state according to claim 5, characterized in that: The original test data includes the test signal and signal time; The method for obtaining the test signal and signal time includes: The time when the current limiting device first receives the analog signal is found out through the timestamp, and recorded as the signal start time; After the signal start time, the signal data sent by the current limiting device to the logic function test device are marked one by one through the signal management system; The keywords in the signal data are identified one by one by using natural language processing technology, and the signal data with the keywords of switch drive, switch node and device operation are recorded as switch drive signal, switch node signal and device action signal respectively; After the switch drive signal, the switch node signal and the device action signal are aggregated, a test signal is generated; The times corresponding to when the logic function test device receives the switch drive signal, the switch node signal and the device action signal are queried one by one through the timestamps, and are recorded as the first time, the second time and the third time respectively; The durations from the signal start time to the first time, the second time and the third time are recorded as the first signal duration, the second signal duration and the third signal duration respectively, and the first signal duration, the second signal duration and the third signal duration are summarized to generate the signal time.

7. A current limiting device logic function test system capable of simulating a power grid state according to claim 6, characterized in that: Combination methods for comprehensive functional data include: Constructing a data group having three function bits, and recording the three function bits as a first data bit, a second data bit, and a third data bit in sequence; Draw segmentation lines along the vertical direction at both ends of the first data bit, the second data bit and the third data bit respectively to obtain contour lines; Match the switch drive signal, the switch node signal and the device action signal with the first signal duration, the second signal duration and the third signal duration respectively to generate a first test set, a second test set and a third test set; The first test set, the second test set and the third test set are sequentially filled into the first data bit, the second data bit and the third data bit to generate comprehensive functional data.

8. A current limiting device logic function test system capable of simulating a power grid state according to claim 7, characterized in that: The training methods for the performance test model include: The logic function status value includes normal state and abnormal state; Pre-collecting multiple sets of comprehensive function data and logical function state values ​​corresponding to the comprehensive function data; The comprehensive function data is converted into a corresponding set of feature vectors, the feature vectors are used as the input of the performance test model, the logical function state value is converted into a label corresponding to the comprehensive function data, the normal state is converted into 00, the abnormal state is converted into 11, and the logical function state value corresponding to each set of comprehensive function data is used as the output of the performance test model, the logical function state value is used as the prediction target, and the sum of the prediction errors of all training data is minimized as the training target, and the performance test model is trained until the sum of the prediction errors reaches convergence and the training is stopped; The determination method of whether to perform an anomaly detection operation includes: When the output of the performance test model is 00, the predicted logic function state value is normal, and it is determined that the abnormality detection operation is not performed; When the output of the performance test model is 11, the predicted logic function state value is an abnormal state, and it is determined to perform an abnormal detection operation.

9. A current limiting device logic function test system capable of simulating a power grid state according to claim 8, characterized in that: Methods for identifying abnormal data include: Compare the first signal duration with the first signal standard value, and when the first signal duration is greater than the first signal standard value, record the first signal duration as abnormal data; Compare the duration of the second signal with the second signal standard value, and when the duration of the second signal is greater than the second signal standard value, record the duration of the second signal as abnormal data; The third signal duration is compared with the third signal standard value, and when the third signal duration is greater than the third signal standard value, the third signal duration is recorded as abnormal data.

10. A current limiting device logic function test system capable of simulating a power grid state according to claim 9, characterized in that: The logical function level includes the primary abnormality level and the secondary abnormality level; The classification methods of the primary abnormality level and the secondary abnormality level include: Count the number of abnormal data. When the number of abnormal data is 1, it is classified as the first abnormal level. When the number of abnormal data is 2 or 3, it is classified as the secondary abnormal level.

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