Data analysis method and system for automatic testing of chip

Abstract

The invention relates to the technical field of data analysis, and provides a data analysis method and system for automatic testing of a chip, and the method comprises the steps: S1, obtaining the test data of a to-be-tested chip; s2, comparing the test data with a preset numerical value of a corresponding chip, if a comparison result is qualified, executing a step S4, and if the comparison result is unqualified, executing a step S3; s3, analyzing the test data to generate a first analysis result, putting forward a solution according to the first analysis result, and executing the step S4; s4, identifying similarities and differences of the test data of the to-be-tested chip according to preset chip parameters, and performing performance analysis to generate a second analysis result; and S5, storing the second analysis result into the chip database so as to accurately and effectively analyze the chip test result, reduce errors generated by manual analysis, and organize analysis data so as to provide important data support for later data analysis.

Description

Technical Field

[0001] The present invention relates to the technical field of data analysis, and in particular to a data analysis method and system for chip automated testing. Background Art

[0002] With the rapid development of semiconductor technology, multifunctional semiconductor chips are increasingly used in electronic devices, and the stability and reliability of their performance have become key factors affecting product quality. Traditional semiconductor chip testing methods often rely on manual operation and post-analysis, and have problems such as low test efficiency, large errors, and cumbersome data collation. In addition, in the face of chips of different models and specifications, the setting of test parameters and data analysis also lack unified standards and automated means, resulting in test results that are difficult to accurately reflect the true performance of the chip.

[0003] On the other hand, the rise of big data and artificial intelligence technologies has brought new opportunities to the field of semiconductor chip testing. By collecting images and data in real time during the test process and combining them with advanced data analysis algorithms, it is possible to quickly and accurately evaluate chip performance. However, most existing automated testing systems focus on the automated execution of the test process, and there are still deficiencies in the real-time organization and in-depth analysis of test data, making it difficult to meet the growing testing needs. Summary of the invention

[0004] In view of the above-mentioned defects, the purpose of the present invention is to propose a data analysis method and system for chip automated testing, so as to achieve accurate and effective analysis of chip test results, reduce errors caused by manual analysis, and organize the analysis data to provide important data support for subsequent data analysis.

[0005] To achieve this object, the present invention adopts the following technical solutions:

[0006] A data analysis method for chip testing, the method comprising the steps of:

[0007] S1: Obtain test data of the chip to be tested;

[0008] S2: Compare the test data with the preset value of the corresponding chip. If the comparison result is qualified, execute step S4; if the comparison result is unqualified, execute step S3;

[0009] S3: Analyze the test data to generate a first analysis result, propose a solution according to the first analysis result, and execute step S4;

[0010] S4: identifying similarities and differences of the test data of the chip to be tested according to preset chip parameters, and performing performance analysis to generate a second analysis result;

[0011] S5: storing the second analysis result in the chip database.

[0012] Preferably, in step S2, the comparison includes a fixed value comparison and a range comparison;

[0013] The customized comparison includes: if the test data is equal to a preset value, the comparison result is qualified, otherwise it is unqualified;

[0014] The range comparison includes: if the test data is within a preset range of values, the comparison result is qualified, otherwise it is unqualified.

[0015] Preferably, step S1 further includes generating image data corresponding to the test data of the chip to be tested, wherein the image data includes:

[0016] Generate a three-dimensional image of the chip to be tested, and generate a comparison image of the test data and the preset values ​​of the corresponding chip;

[0017] A data analysis graph of the test data is generated according to the comparison image.

[0018] Preferably, in step S3, analyzing the test data to generate a first analysis result, and proposing a solution according to the first analysis result comprises the following steps:

[0019] S301: Analyze the reasons for failure of the test data according to the chip specification corresponding to the chip to be tested, obtain the specific situation and reasons for failure, and obtain the solution corresponding to the reason for failure from the chip specification corresponding to the chip to be tested. If the solution fails, execute step S302;

[0020] S302: using the chip database to obtain the solution corresponding to the cause of the non-conformity, if the acquisition fails, executing step S303;

[0021] S303: Use a preset tool to analyze the reasons for the non-conformity and propose solutions corresponding to the reasons for the non-conformity.

[0022] Furthermore, in step S303, analyzing the reasons for the failure using a preset tool includes:

[0023] Analyze the functions of each block of the chip to be tested, select the most similar blocks in the chip database for splicing, and generate a second chip;

[0024] Verify the operational feasibility of the second chip. If the second chip is feasible, analyze the chip to be tested according to the chip specifications corresponding to each of the blocks and the data in the chip database;

[0025] If the second chip is not feasible, the splicing part is redone.

[0026] Preferably, in step S4, identifying similarities and differences of the test data of the chip to be tested according to preset chip parameters, and performing performance analysis to generate a second analysis result includes:

[0027] Identify the similarities and differences between the parameters of the chip to be tested and the parameters of chips with the same function but different types according to the statistical analysis method;

[0028] The similarities and differences are analyzed in turn according to analysis tools to obtain analysis results of the performance of different types of chips under the same test conditions as the second analysis results. The analysis tools are the chip specification sheet and chip database corresponding to the chip to be tested.

[0029] Preferably, storing the second analysis result in the chip database comprises:

[0030] Creating a correspondence between the chip to be tested and the second analysis result in a chip database;

[0031] The method also includes creating a mapping relationship between the chip to be tested and the test data, the image data and the first analysis result and the chip to be tested, and adding the mapping relationship to the chip database.

[0032] A data analysis system for chip automated testing, comprising:

[0033] A data acquisition module, used to acquire test data of the chip to be tested;

[0034] A data verification module, used to compare the test data with the preset value of the corresponding chip, and if the comparison result is qualified, call the second analysis module, if the comparison result is unqualified, call the first analysis module;

[0035] A first analysis module is used to analyze the test data, generate a first analysis result, propose a solution according to the first analysis result, and call a second analysis module;

[0036] A second analysis module, used to identify similarities and differences of the test data of the chip to be tested according to preset chip parameters, and perform performance analysis to generate a second analysis result;

[0037] A data storage module is used to store the second analysis result in the chip database.

[0038] Furthermore, in the first analysis module, analyzing the test data to generate a first analysis result, and proposing a solution according to the first analysis result includes:

[0039] Analyze the reasons for failure of the test data according to the chip specification sheet corresponding to the chip to be tested, obtain the specific situation and reasons for failure, and obtain the corresponding solutions to the reasons for failure from the chip specification sheet corresponding to the chip to be tested;

[0040] If the acquisition fails, the chip database is used to obtain the solution corresponding to the cause of the failure;

[0041] If the acquisition fails, the reasons for the failure are analyzed using a preset tool, and corresponding solutions are proposed;

[0042] The using of a preset tool to analyze the reasons for the failure also includes: analyzing the functions of each block of the chip to be tested, selecting the most similar blocks in the chip database for splicing, and generating a second chip;

[0043] Verify the operational feasibility of the second chip. If the second chip is feasible, analyze the chip to be tested according to the chip specifications corresponding to each of the blocks and the data in the chip database;

[0044] If the second chip is not feasible, the splicing part is redone.

[0045] Further, in the second analysis module, identifying similarities and differences of the test data of the chip to be tested according to preset chip parameters, and performing performance analysis to generate a second analysis result includes:

[0046] Identify the similarities and differences between the parameters of the chip to be tested and the parameters of chips with the same function but different types according to the statistical analysis method;

[0047] The similarities and differences are analyzed in turn according to analysis tools to obtain analysis results of the performance of different types of chips under the same test conditions as the second analysis results. The analysis tools are the chip specification sheet and chip database corresponding to the chip to be tested.

[0048] One of the above technical solutions has the following advantages or beneficial effects:

[0049] Compare the functions of different chips, identify the similarities and differences between them by comparing the functions and performance of different chips, and analyze the performance of different chips under the same test conditions. Use the database system to record test results and analysis data and curve charts to ensure that the database can display the functional similarities and differences of the chips and provide search and filtering functions. By analyzing the test data of multifunctional semiconductor chips in real time, it is possible to more accurately identify the performance problems and defects of the chips, which helps to improve the accuracy of the test, help engineers quickly diagnose data problems in chip testing, and propose solutions, thereby shortening the time and cycle of problem solving and improving production efficiency. Discover defective products in a timely manner. By proposing improvement measures, improve product quality and yield, thereby reducing production costs, visualize information such as test results, analysis data, and image data, provide strong decision-making support and technical persuasion for management, and discover potential improvement points for products through in-depth analysis of test data, providing important data support for the company's technological innovation. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the provided drawings without paying creative work.

[0051] Figure 1 is a flow chart of a data analysis method for chip testing provided by an embodiment of the present invention;

[0052] Figure 2 is a schematic diagram of the structure of a data analysis system for chip testing provided by an embodiment of the present invention;

[0053] Figure 3 A chip test data and a preset value comparison curve diagram of the chip test data analysis method provided by an embodiment of the present invention;

[0054] Figure 4 It is a chip test data analysis table of the chip test data analysis method provided by the embodiment of the present invention;

[0055] Figure 5 It is a three-dimensional measured image of a chip according to the data analysis method for chip testing provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0056] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0057] In this application, the terms "comprises", "comprising" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, an element defined by the sentence "comprising a ..." does not exclude the presence of other identical elements in the process, method, article or device comprising the element.

[0058] like Figure 1 As shown, a preferred embodiment of the present application includes the steps of:

[0059] S1: Obtain test data of the chip to be tested;

[0060] Specifically, when the device used in this embodiment starts working, the user places the chip to be tested on the platform to be tested, and contacts the pads on the chip through the probe, thereby establishing an electrical connection between the chip and the test device, so that the test device can send signals to the chip and receive response signals from the chip, thereby connecting the chip to the external circuit.

[0061] The user enters the chip model and the corresponding data table to be tested. The user sets the test voltage or current and other parameters within the allowable range of the specifications according to the chip specifications and the user's actual data needs. After the above operations, the user can test the chip through the probe to obtain the maximum, minimum, average and mode of the current, voltage and resistance of the chip under the same test voltage or current.

[0062] S2: Compare the test data with the preset value of the corresponding chip. If the comparison result is qualified, execute step S4; if the comparison result is unqualified, execute step S3;

[0063] Specifically, for a chip of a certain model, such as Z chip, the test data of X batches of Z chips are compared with the preset standards or expected values ​​of Z chips. These preset values ​​may be performance standards set by the manufacturer or design specifications of the chip, or custom values ​​suitable for actual generation. If the test data meets the requirements of the preset values, the chip is considered qualified in this aspect, and step S4 is entered; if not, further analysis is required, and step S3 is executed.

[0064] S3: Analyze the test data to generate a first analysis result, propose a solution according to the first analysis result, and execute step S4;

[0065] Specifically, if the test data does not meet the preset standards, it is necessary to analyze the data that does not meet the standards, such as comparing and statistics on various aspects of the test data, to determine the root cause of the problem and provide solutions to the corresponding problems. This can more accurately identify chip performance problems and defects, thereby improving the accuracy of the test, and then executing step S4; it can help engineers quickly diagnose problems in chip testing, shorten the time and cycle for solving problems, and improve production efficiency; it is conducive to discovering deficiencies in the test process, optimizing the test process, and improving test efficiency.

[0066] S4: identifying similarities and differences of the test data of the chip to be tested according to preset chip parameters, and performing performance analysis to generate a second analysis result;

[0067] Specifically, for example, several groups of values ​​of different types of chips with the same function are set, and these values ​​are compared with the test data of the Z chip to obtain the differences and similarities of the chip performance data, and analyze the performance of these chips under the same test environment to obtain the second analysis result. By comparing the performance of different chips, the design team can understand the best practices and optimize future chip designs accordingly. Analysis can help identify performance anomalies, thereby guiding fault diagnosis and repair, which is conducive to understanding the performance of different chips and determining the market positioning and competitive advantages of their own products. Data analysis can reveal the development trend of chip technology and future research directions.

[0068] S5: storing the second analysis result in the chip database.

[0069] Specifically, the obtained second analysis results are saved in the chip database, which can be used for subsequent test analysis, future reference and comparative analysis. The establishment of a database can effectively manage and retrieve a large number of test results, which helps to continuously monitor and optimize the production quality and performance of the chip.

[0070] Further, in step S2, the comparison includes a fixed value comparison and a range comparison;

[0071] The customized comparison is specifically: if the test data is equal to the preset value, the comparison result is qualified, otherwise it is unqualified;

[0072] The range comparison is specifically: if the test data is within a preset range of values, the comparison result is qualified, otherwise it is unqualified.

[0073] Specifically, taking the range value as an example, the input voltage of the Z chip in batch X is 5V, the output voltage is set to 2.5~5V, and the output current is set to 7.5~10A. After testing, it was found that the actual output voltage of Y chips in batch X of Z chips was 7V and the actual output current was 8A. Compared with the set output value, the actual output voltage of Y chips in batch X exceeded the set output voltage range, so these Y chips were judged as unqualified. The same is true for the test data being equal to a preset value, which will not be repeated here. This ensures that the test of chip performance does not rely solely on a single numerical standard, but is flexibly judged and analyzed according to actual conditions. The combined use of fixed value comparison and range comparison makes it effectively applicable to different types of chips or different test scenarios, reducing misjudgments and unnecessary complexity in the test process. Through precise fixed value comparison and flexible range comparison, unqualified chips can be discovered and processed more quickly, thereby improving product quality and production efficiency.

[0074] In another embodiment of the present application, step S1 further includes generating image data corresponding to the test data of the chip to be tested, wherein generating the image data of the chip to be tested includes:

[0075] Generate a three-dimensional image of the chip to be tested, and generate a comparison image of the test data and the preset values ​​of the corresponding chip;

[0076] A data analysis graph of the test data is generated according to the comparison image.

[0077] Specifically, CAD software such as SolidWorks, AutoCAD or a specialized chip design tool is used to generate a chip design according to the design specifications. Figure 5 The three-dimensional measured image of the chip shown shows the shape, structure and possible internal components of the chip for visual inspection and further analysis. The actual measured data is compared with the preset values ​​to generate a comparison image. The comparison image can be a bar graph, a line graph or other form to clearly show the difference or consistency between the actual test data and the preset values. This embodiment provides such Figure 3 The comparison graph shown in FIG. Data analysis is performed based on the comparison images to generate data analysis graphs. These graphs can be statistical summaries, trend analysis, scatter plots, etc. The present embodiment provides such Figure 4The chip test data analysis table shown helps to gain a deeper understanding of the distribution, deviations, and trends of the test data. The data analysis graphs can provide key insights to help engineers and analysts determine whether the chip performance meets the design specifications or whether there are issues that require further adjustment.

[0078] In another preferred embodiment of the present application, in step S3, analyzing the test data to generate a first analysis result, and proposing a solution according to the first analysis result comprises the following steps:

[0079] S301: Analyze the reasons for failure of the test data according to the chip specification corresponding to the chip to be tested, obtain the specific situation and reasons for failure, and obtain the solution corresponding to the reason for failure from the chip specification corresponding to the chip to be tested. If the solution fails, execute step S302;

[0080] Specifically, the specification sheet usually contains a detailed description and standard of chip performance to help determine the deviation between the actual measured data and the expected value. You can use the chip specification sheet corresponding to the chip to be tested and read the relevant chapters or parts to confirm the specific reasons for the failure. These measures can be technical improvements such as adjusting circuit design, optimizing layout, and modifying process parameters, aiming to make the chip meet design requirements. If the solution is not clearly obtained from the chip specification sheet, proceed to the next step.

[0081] S302: using the chip database to obtain the solution corresponding to the cause of the non-conformity, if the acquisition fails, executing step S303;

[0082] Specifically, the chip database contains chip data of the same or different types, functions, performances and specifications. When a solution to a problem cannot be found in the chip database, the solutions to chips that have had similar problems in the past can be referred to. If a suitable solution is not found in the chip database, proceed to the next step.

[0083] S303: Use a preset tool to analyze the reasons for the non-conformity and propose solutions corresponding to the reasons for the non-conformity.

[0084] Specifically, data analysis tools or artificial intelligence and other tools can be used to analyze the reasons for non-conformity. Compared with the previous two steps, the purpose of this step is to solve the problem that occurs for the first time in the chip. It requires extensive collection of solutions and attempts, selection of the most appropriate solution, and implementation. After the problem is successfully solved, the corresponding data can be stored in the database as a basis for subsequent data improvement.

[0085] Furthermore, in step S303, analyzing the reasons for the failure using a preset tool includes:

[0086] Analyze the functions of each block of the chip to be tested, select the most similar blocks in the chip database for splicing, and generate a second chip;

[0087] Verify the operational feasibility of the second chip. If the second chip is feasible, analyze the chip to be tested according to the chip specifications corresponding to each of the blocks and the data in the chip database;

[0088] If the second chip is not feasible, the splicing part is redone.

[0089] Specifically, first, AI conducts an in-depth analysis of the chip to be tested, analyzing the role and characteristics of each functional module, including different parts in the circuit design, such as the processor core, input and output interfaces, and memory controllers. AI selects parts from the chip database that are similar or consistent with the various functional modules of the chip to be tested. These similar parts may come from different chip models or different design versions. After determining which modules need to be spliced, AI performs the splicing operation and verifies the operational feasibility of the generated second chip, that is, checks whether the overall design after splicing can operate normally and meet the expected performance requirements.

[0090] If the generated second chip is confirmed to be feasible, that is, it can meet the functional requirements and performance specifications of the chip to be tested, then AI will proceed to the next step. After confirming that the second chip is feasible, AI uses the specific parameters and data of these modules, combined with the chip specifications and information in the database corresponding to each module, to conduct an in-depth analysis of the chip to be tested, including comparing the difference between the measured data and the expected performance, and identifying the specific reasons for failure.

[0091] If the generated second chip is verified to be unfeasible, that is, it cannot meet the functional or performance requirements, the AI ​​will reconsider the spliced ​​parts and re-perform the splicing operation until a feasible design is generated.

[0092] Furthermore, in step S4, identifying the similarities and differences of the test data of the chip to be tested according to the preset chip parameters, and performing performance analysis to generate a second analysis result includes:

[0093] Identify the similarities and differences between the parameters of the chip to be tested and the parameters of chips with the same function but different types according to the statistical analysis method;

[0094] The similarities and differences are analyzed in turn according to analysis tools to obtain analysis results of the performance of different types of chips under the same test conditions as the second analysis results. The analysis tools are the chip specification sheet and chip database corresponding to the chip to be tested.

[0095] Specifically, the chip testing equipment includes a data analysis system, which uses statistical analysis methods, such as t-test, ANOVA, regression analysis, etc., to compare the data tested by batch X of chips with the parameters of chips of the same function and different types in the database to find out the significant differences and similarities. Based on the identified similarities and differences, these points are analyzed one by one using analysis tools. The main analysis tools include the chip specification sheet corresponding to the chip to be tested and the existing chip database. Among them, the analysis is mainly based on the specification sheet of chip X, and secondly on the data specifications of the chips with the highest similarity in the same type, function, performance, and specifications in the database. By comparing and analyzing the similarities and differences, the expected performance of the chip to be tested under specific conditions can be obtained, such as predictions in performance, stability, power consumption, etc.

[0096] Furthermore, storing the second analysis result in the chip database includes:

[0097] Creating a correspondence between the chip to be tested and the second analysis result in a chip database;

[0098] The method also includes creating a mapping relationship between the chip to be tested and the test data, the image data and the first analysis result and the chip to be tested, and adding the mapping relationship to the chip database.

[0099] Specifically, the second analysis result generated by step S4 is stored in a database dedicated to chip information management. The second analysis result includes information such as the performance, advantages and disadvantages analysis, and statistical data of different types of chips with the same function under the same test environment. The storage of these results is to allow users to access and retrieve relevant analysis data at any time. A relationship can be established through the unique identifier of the chip so that users can quickly find the relevant analysis data according to the specific chip identifier.

[0100] At the same time, it is also necessary to establish a mapping relationship between the chip to be tested and its test data, image data, and the first analysis result in the chip database. The establishment of this mapping relationship can help users fully understand the test history and analysis results of each chip, provide a basis for further decision-making, help improve the chip database, and deal with chip problems encountered for the first time. Solutions to chip problems can be obtained based on analysis. For chip problems that have already occurred, the corresponding solutions to the chip problems can be retrieved based on the tool, providing important data support for the company's technological innovation.

[0101] like Figure 2 As shown, the embodiment of the present invention also provides a data analysis system for chip automated testing, including a data acquisition module 1, which is used to acquire test data of a chip to be tested;

[0102] The data inspection module 2 is used to compare the test data with the preset value of the corresponding chip, and if the comparison result is qualified, the second analysis module 4 is called, and if the comparison result is unqualified, the first analysis module 3 is called;

[0103] A first analysis module 3 is used to analyze the test data, generate a first analysis result, propose a solution according to the first analysis result, and call a second analysis module 4;

[0104] A second analysis module 4, used to identify similarities and differences of the test data of the chip to be tested according to preset chip parameters, and perform performance analysis to generate a second analysis result;

[0105] Data storage module 5, used for storing the second analysis result in the chip database;

[0106] This embodiment implements the data analysis method and implementation process of chip automatic testing. Please refer to the above embodiments and will not be described in detail here.

[0107] Furthermore, in the first analysis module 3, the test data is analyzed to generate a first analysis result, and a solution is proposed according to the first analysis result, including:

[0108] Analyze the reasons for failure of the test data according to the chip specification sheet corresponding to the chip to be tested, obtain the specific situation and reasons for failure, and obtain the corresponding solutions to the reasons for failure from the chip specification sheet corresponding to the chip to be tested;

[0109] If the acquisition fails, the chip database is used to obtain the solution corresponding to the cause of the failure;

[0110] If the acquisition fails, the reasons for the failure are analyzed using a preset tool, and corresponding solutions are proposed;

[0111] The using of a preset tool to analyze the reasons for the failure also includes: analyzing the functions of each block of the chip to be tested, selecting the most similar blocks in the chip database for splicing, and generating a second chip;

[0112] Verify the operational feasibility of the second chip. If the second chip is feasible, analyze the chip to be tested according to the chip specifications corresponding to each of the blocks and the data in the chip database;

[0113] If the second chip is not feasible, the splicing part is redone.

[0114] Furthermore, in the first analysis module 3, the test data is analyzed to generate a first analysis result, and a solution is proposed according to the first analysis result, including:

[0115] Analyze the reasons for failure of the test data according to the chip specification sheet corresponding to the chip to be tested, obtain the specific situation and reasons for failure, and obtain the corresponding solutions to the reasons for failure from the chip specification sheet corresponding to the chip to be tested;

[0116] If the acquisition fails, the chip database is used to obtain the solution corresponding to the cause of the failure;

[0117] If the acquisition fails, the reasons for the failure are analyzed using a preset tool, and corresponding solutions are proposed;

[0118] The using of a preset tool to analyze the reasons for the failure also includes: analyzing the functions of each block of the chip to be tested, selecting the most similar blocks in the chip database for splicing, and generating a second chip;

[0119] Verify the operational feasibility of the second chip. If the second chip is feasible, analyze the chip to be tested according to the chip specifications corresponding to each of the blocks and the data in the chip database;

[0120] If the second chip is not feasible, the splicing part is redone.

[0121] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0122] Although the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A data analysis method for chip automated testing, characterized in that: The method comprises the steps of: S1: Obtain test data of the chip to be tested; S2: Compare the test data with the preset value of the corresponding chip. If the comparison result is qualified, execute step S4; if the comparison result is unqualified, execute step S3; S3: Analyze the test data to generate a first analysis result, propose a solution according to the first analysis result, and execute step S4; S4: identifying similarities and differences of the test data of the chip to be tested according to preset chip parameters, and performing performance analysis to generate a second analysis result; S5: storing the second analysis result in the chip database.

2. The data analysis method according to claim 1, characterized in that: In step S2, the comparison includes a fixed value comparison and a range comparison; The customized comparison includes: if the test data is equal to a preset value, the comparison result is qualified, otherwise it is unqualified; The range comparison includes: if the test data is within a preset range of values, the comparison result is qualified, otherwise it is unqualified.

3. The data analysis method according to claim 1, characterized in that: Step S1 also includes generating image data corresponding to the test data of the chip to be tested, and the image data includes: Generate a three-dimensional image of the chip to be tested, and generate a comparison image of the test data and the preset values ​​of the corresponding chip; A data analysis graph of the test data is generated according to the comparison image.

4. The data analysis method according to claim 1, characterized in that: In step S3, analyzing the test data to generate a first analysis result, and proposing a solution according to the first analysis result includes the following steps: S301: Analyze the reasons for failure of the test data according to the chip specification corresponding to the chip to be tested, obtain the specific situation and reasons for failure, and obtain the solution corresponding to the reason for failure from the chip specification corresponding to the chip to be tested. If the solution fails, execute step S302; S302: using the chip database to obtain the solution corresponding to the cause of the non-conformity, if the acquisition fails, executing step S303; S303: Use a preset tool to analyze the reasons for the non-conformity and propose solutions corresponding to the reasons for the non-conformity.

5. The data analysis method according to claim 4, characterized in that: In step S303, analyzing the reasons for the failure using a preset tool includes: Analyze the functions of each block of the chip to be tested, select the most similar blocks in the chip database for splicing, and generate a second chip; Verify the operational feasibility of the second chip. If the second chip is feasible, analyze the chip to be tested according to the chip specifications corresponding to each of the blocks and the data in the chip database; If the second chip is not feasible, the splicing part is redone.

6. The data analysis method according to claim 1, characterized in that: In step S4, identifying the similarities and differences of the test data of the chip to be tested according to the preset chip parameters, and performing performance analysis to generate a second analysis result includes: Identify the similarities and differences between the parameters of the chip to be tested and the parameters of chips with the same function but different types according to the statistical analysis method; The similarities and differences are analyzed in turn according to analysis tools to obtain analysis results of the performance of different types of chips under the same test conditions as the second analysis results. The analysis tools are the chip specification sheet and chip database corresponding to the chip to be tested.

7. The data analysis method according to claim 6, characterized in that: The storing the second analysis result into the chip database comprises: Creating a correspondence between the chip to be tested and the second analysis result in a chip database; The method also includes creating a mapping relationship between the chip to be tested and the test data, the image data and the first analysis result and the chip to be tested, and adding the mapping relationship to the chip database.

8. A data analysis system for chip automated testing, characterized in that: include: A data acquisition module, used to acquire test data of the chip to be tested; A data verification module, used to compare the test data with the preset value of the corresponding chip, and if the comparison result is qualified, call the second analysis module, if the comparison result is unqualified, call the first analysis module; A first analysis module is used to analyze the test data, generate a first analysis result, propose a solution according to the first analysis result, and call a second analysis module; A second analysis module, used to identify similarities and differences of the test data of the chip to be tested according to preset chip parameters, and perform performance analysis to generate a second analysis result; A data storage module is used to store the second analysis result in the chip database.

9. The data analysis system according to claim 8, characterized in that: In the first analysis module, analyzing the test data to generate a first analysis result, and proposing a solution according to the first analysis result includes: Analyze the reasons for failure of the test data according to the chip specification sheet corresponding to the chip to be tested, obtain the specific situation and reasons for failure, and obtain the corresponding solutions to the reasons for failure from the chip specification sheet corresponding to the chip to be tested; If the acquisition fails, the chip database is used to obtain the solution corresponding to the cause of the failure; If the acquisition fails, the reasons for the failure are analyzed using a preset tool, and corresponding solutions are proposed; The using of a preset tool to analyze the reasons for the failure also includes: analyzing the functions of each block of the chip to be tested, selecting the most similar blocks in the chip database for splicing, and generating a second chip; Verify the operational feasibility of the second chip. If the second chip is feasible, analyze the chip to be tested according to the chip specifications corresponding to each of the blocks and the data in the chip database; If the second chip is not feasible, the splicing part is redone.

10. The data analysis system according to claim 8, characterized in that: In the second analysis module, identifying similarities and differences of the test data of the chip to be tested according to the preset chip parameters, and performing performance analysis to generate a second analysis result includes: Identify the similarities and differences between the parameters of the chip to be tested and the parameters of chips with the same function but different types according to the statistical analysis method; The similarities and differences are analyzed in turn according to analysis tools to obtain analysis results of the performance of different types of chips under the same test conditions as the second analysis results. The analysis tools are the chip specification sheet and chip database corresponding to the chip to be tested.

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