Abnormal self-detection circuit and control method thereof, chip and electronic equipment

Abstract

The invention relates to an abnormity self-detection circuit and a control method thereof, a chip and electronic equipment, and the control method of the abnormity self-detection circuit, the abnormity self-detection circuit comprises a first circuit and a second circuit, and the control method comprises the following steps: the second circuit obtains specific data used for judging whether the first circuit works normally; the second circuit judges whether the first circuit works normally or not based on a comparison result of the specific data and preset data, and the preset data is a set of multiple pieces of feature information representing normal work of the first circuit. The system has the technical effects that all-directional monitoring is realized, and the system can effectively monitor and feed back known faults or unknown abnormities. And the detection process is simplified: through the mode data generated in the normal working state, the dependence on an active detection mechanism is reduced, and the reliability of the system is improved.

Description

Technical Field

[0001] The present invention relates to the field of chip technology, and in particular to an abnormality self-detection circuit and a control method thereof, a chip and an electronic device. Background Art

[0002] At present, the common chip abnormal state detection and processing methods are as follows: Figure 1 As shown, the circuit relies on its own submodules, such as the detection submodule and the data processing control submodule to detect its own working status. If an abnormality is found, the circuit performs a preset operation, such as resetting, shutting down, etc.

[0003] However, this approach has two major disadvantages.

[0004] First, it can only deal with the first situation mentioned above, that is, some of the circuit's most basic functions such as communication, input and output, and control are still normal; but it is powerless against the second situation, that is, the circuit even has problems with its most basic functions, because once the circuit fails, it will be impossible to correctly complete self-detection and make corresponding processing.

[0005] Secondly, this method is to determine whether the circuit is in an abnormal state by detecting various working conditions that may be expected to occur in the circuit. For example, common abnormal conditions in the circuit include: short circuit, current too large or too small, voltage too large or too small, temperature too high or too low, etc. These can be detected and judged through circuit design that can be considered in advance. However, as mentioned in the background section of this article, the working environment that the circuit may face is diverse, changeable, extreme, and unpredictable. In the circuit design stage, it is impossible to perfectly cover all the expected conditions that may occur. This results in the scheme based on "abnormal state detection" may not be able to detect the circuit working state outside the design, and thus mistakenly regard some unknown abnormal states as normal states, causing functional safety hazards.

[0006] Therefore, it is necessary to improve the existing abnormality detection circuit. Summary of the invention

[0007] In response to the above problems, the present invention provides a control method for an abnormal self-detection circuit, wherein the abnormal self-detection circuit includes a first circuit and a second circuit, and includes the steps of: the second circuit acquires specific data for determining whether the first circuit is working normally; the second circuit determines whether the first circuit is working normally based on a comparison result between the specific data and preset data, wherein the preset data is a collection of multiple characteristic information characterizing the normal operation of the first circuit.

[0008] Optionally, the control method of the abnormal self-detection circuit further includes the step of: in response to the first circuit not working normally, the second circuit sending an instruction to the first circuit to perform a predefined operation.

[0009] Optionally, the control method of the abnormality self-detection circuit further includes the steps:

[0010] The first circuit acquires specific data for determining whether the second circuit operates normally;

[0011] The first circuit determines whether the second circuit works normally based on a comparison result between the specific data and preset data, wherein the preset data is a collection of multiple feature information indicating that the second circuit works normally.

[0012] Optionally, the control method of the abnormality self-detection circuit further includes the steps of:

[0013] In response to the second circuit not operating normally, the first circuit sends an instruction to the second circuit to perform a predefined operation.

[0014] Optionally, the predefined operation includes: any one of restarting the circuit, resetting the circuit, repairing the circuit abnormality, and reporting the circuit abnormality.

[0015] Optionally, “the second circuit determines whether the first circuit operates normally based on a comparison result between specific information and preset information” includes: the second circuit periodically determines whether the first circuit operates normally based on a comparison result between the specific data and preset data.

[0016] Optionally, the control method of the abnormal self-detection circuit further includes the step of: if the second circuit does not receive the specific data within a preset time, determining that the first circuit operates abnormally.

[0017] Optionally, the first circuit acquires specific information for determining whether the second circuit operates normally, and the first circuit sends an instruction to the second circuit to perform a predefined operation, multiplexing an information transmission channel.

[0018] Optionally, the second circuit acquires specific information for determining whether the first circuit operates normally, and the second circuit sends an instruction to the first circuit to execute a predefined operation, multiplexing an information transmission channel.

[0019] It should be noted that the various steps of the control method for the abnormal self-detection circuits provided in this embodiment can be freely combined based on actual needs, and there is no restriction on the order of precedence. As long as the abnormal self-detection function required by this embodiment can be achieved, it is within the protection scope of this embodiment.

[0020] In order to achieve the above-mentioned purpose of the invention, the present application provides an abnormality self-detection circuit, including a first circuit and a second circuit connected thereto, and applying the control method of the abnormality self-detection circuit described above.

[0021] Optionally, the first circuit includes multiple sub-circuits, and the preset data is a collection of characteristic information when at least some of the multiple sub-circuits operate normally.

[0022] Optionally, if it is determined that the first circuit is not working properly, the second circuit can reversely analyze the characteristic information to determine the sub-circuit that is working abnormally.

[0023] Optionally, in response to the first circuit not working properly, the second circuit sends an instruction to the first circuit to perform a predefined operation, and the second circuit obtains the specific data from the first circuit and sends the instruction to the first circuit using an information transmission channel.

[0024] Optionally, in response to the first circuit not working properly, the second circuit sends an instruction to the first circuit to perform a predefined operation, and the first circuit acquires specific data for determining whether the second circuit is working properly;

[0025] The first circuit determines whether the second circuit works normally based on a comparison result between the specific data and preset data, wherein the preset data is a set of multiple characteristic information indicating that the second circuit works normally;

[0026] In response to the second circuit not operating normally, the first circuit sending an instruction to the second circuit to perform a predefined operation;

[0027] The first circuit and the second circuit transmit specific data to each other through a multiplexing bidirectional information transmission channel; the first circuit and the second circuit send instructions to each other through a multiplexing bidirectional information transmission channel.

[0028] Optionally, in response to the first circuit not working properly, the second circuit sends an instruction to the first circuit to perform a predefined operation, and the first circuit acquires specific data for determining whether the second circuit is working properly;

[0029] The first circuit determines whether the second circuit works normally based on a comparison result between the specific data and preset data, wherein the preset data is a set of multiple characteristic information indicating that the second circuit works normally;

[0030] In response to the second circuit not operating normally, the first circuit sending an instruction to the second circuit to perform a predefined operation;

[0031] The first circuit transmits specific data and sends instructions to the second circuit, multiplexing a unidirectional information transmission channel; the second circuit transmits specific data and sends instructions to the first circuit, multiplexing a unidirectional information transmission channel.

[0032] In order to achieve the above-mentioned purpose of the invention, the present application provides an abnormality self-detection circuit, including a first circuit, a second circuit, ... and an Nth circuit. Among the N circuits, any two connected circuits apply the control method of the abnormality self-detection circuit described above.

[0033] Optionally, the first circuit is an analog front-end chip, and the second circuit is a microcontroller chip.

[0034] Optionally, the analog front-end chip includes a pattern generating circuit and a functional module circuit connected thereto, and the pattern generating circuit can acquire specific data of the functional module circuit and send it to the microcontroller chip connected to the pattern generating circuit.

[0035] Optionally, the microcontroller chip can determine whether the analog front-end chip works normally based on the specific data and preset data. If not, the microcontroller chip can send instructions to the analog front-end chip to perform predefined operations.

[0036] Optionally, the functional module circuit includes: a power management circuit, a signal chain circuit, a communication circuit, a control calculation circuit and an IO circuit.

[0037] In order to achieve the above-mentioned purpose of the invention, the present application provides a chip integrating the above-mentioned abnormality self-detection circuit.

[0038] In order to achieve the above-mentioned purpose of the invention, the present application provides an electronic device using the chip described above.

[0039] The abnormal self-detection circuit and control method provided by the present application can perform all-round monitoring of the circuit to be detected: whether it is a known fault or an unknown abnormality, the system can effectively monitor and feedback. Simplify the detection process: through the mode data generated by the normal working state, the dependence on the active detection mechanism is reduced, and the reliability of the system is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] Figure 1 It is a flow chart of circuit anomaly detection in the prior art.

[0041] Figure 2 It is a schematic diagram of the structure of an abnormality self-detection circuit provided in an embodiment of the present invention.

[0042] Figure 3 It is a schematic diagram of the steps of a control method of an abnormality self-detection circuit provided in an embodiment of the present invention.

[0043] Figure 4 It is a schematic diagram of the steps of a control method of an abnormality self-detection circuit provided in an embodiment of the present invention.

[0044] Figure 5 It is a schematic diagram of the steps of a control method of an abnormality self-detection circuit provided in an embodiment of the present invention.

[0045] Figure 6 It is a schematic diagram of the steps of a control method of an abnormality self-detection circuit provided in an embodiment of the present invention.

[0046] Figure 7 It is a schematic diagram of the steps of a control method of an abnormality self-detection circuit provided in an embodiment of the present invention.

[0047] Figure 8 It is a schematic diagram of the steps of a control method of an abnormality self-detection circuit provided in an embodiment of the present invention.

[0048] Fig. 9 It is a schematic diagram of the structure of an abnormality self-detection circuit provided in an embodiment of the present invention.

[0049] Fig.10 It is a schematic diagram of the structure of an abnormality self-detection circuit provided in an embodiment of the present invention.

[0050] Fig.11 It is a schematic diagram of the structure of an abnormality self-detection circuit provided in an embodiment of the present invention.

[0051] Fig.12 It is a schematic diagram of the structure of an abnormality self-detection circuit provided in an embodiment of the present invention.

[0052] Fig.13 It is a schematic diagram of the structure of an abnormality self-detection circuit provided in an embodiment of the present invention.

[0053] Fig.14 It is a schematic diagram of the structure of an abnormality self-detection circuit provided in an embodiment of the present invention.

[0054] Fig.15 It is a timing diagram of the periodic self-detection of the abnormal self-detection circuit provided in the embodiment of the present invention.

[0055] Fig.16 It is a schematic diagram of the working process of the abnormality self-detection circuit provided in the embodiment of the present invention.

[0056] Fig.17 It is a schematic diagram of the working process of the abnormality self-detection circuit provided in the embodiment of the present invention. DETAILED DESCRIPTION

[0057] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0058] like Figure 2 As shown, this embodiment provides an abnormal self-detection circuit 100, including a first circuit 110 and a second circuit 120 connected thereto, wherein the second circuit 120 can obtain specific data of the first circuit 110, and determine whether the first circuit 110 is operating normally based on a comparison result between the specific data and preset data; the preset data is a collection of multiple characteristic information characterizing the normal operation of the first circuit 110.

[0059] The abnormality self-detection circuit 100 provided in this embodiment extracts a plurality of specific information indicating that the first circuit 110 is working normally to form preset data. If the second circuit 120 obtains specific data corresponding to the preset data and the specific data is different from / does not match the preset data, it is determined that the first circuit 110 is not working normally. The technical effects of such a setting are:

[0060] All-round monitoring: Whether it is a known fault or an unknown abnormality, the system can effectively monitor and provide feedback.

[0061] Simplified detection process: The pattern data generated by normal working status reduces the dependence on active detection mechanism and improves the reliability of the system.

[0062] Since the preset data includes multiple characteristic information characterizing the normal operation of the first circuit 110, determining whether the first circuit 110 is operating normally is specifically to determine the difference between the values / states of these characteristic information and the detection results corresponding to the second circuit 120, and the tolerance for the difference can be independently set based on the actual circuit application or user needs. For example, in some application scenarios, once the specific data is different from the preset data, it is determined that the first circuit 110 is not operating normally, while in other application scenarios, a certain error range is allowed for the specific data relative to the preset data. Once the error range is exceeded, it is determined that the first circuit 110 is not operating normally.

[0063] Optionally, the first circuit 110 includes a plurality of sub-circuits, and the preset data is a set of characteristic information when at least some of the plurality of sub-circuits operate normally.

[0064] Since an integrated circuit is usually designed with multiple functional modules, the first circuit 110 here can be understood as an integrated circuit with systematic functions, and its multiple sub-circuits correspond to multiple functional modules; since each functional module is usually composed of multiple components or sub-circuits, the first circuit 110 can also be understood as a functional module, and its sub-circuits can be sub-circuits or components of the functional modules.

[0065] Optionally, if the first circuit 110 does not work properly, the second circuit 120 can reversely parse the status information of the corresponding sub-circuit according to the abnormal data information. Therefore, the beneficial effect of this feature is that once the second circuit 120 finds the abnormality of the data sent by the first circuit 110, it can locate which sub-circuit in the first circuit 110 is abnormal by reverse parsing the data, so as to take targeted measures, such as repairing the abnormal module to help the circuit return to normal.

[0066] Compared with determining the working state of the first circuit 110 by a single characteristic information, the comprehensive determination of multiple characteristic information can more effectively and accurately determine whether the first circuit 110 is working normally. In addition, the reverse analysis function can determine the abnormal points of the first circuit 110 in a more detailed manner and provide targeted solutions.

[0067] It should be noted that the "normal operation" mentioned in this embodiment includes both the ability to realize basic functions in the usual sense, such as being able to generate matching outputs based on preset inputs; and the absence of potential fault hazards, which does not exclude the possibility that some electronic circuits may have functional or data abnormalities while realizing basic functions. Based on the abnormal self-detection circuit provided in this embodiment, it can "prevent problems before they occur" and determine whether the circuit has potential faults or abnormalities from a more diverse and comprehensive dimension.

[0068] Alternatively, if Figure 3 As shown, this embodiment provides a control method for an abnormality self-detection circuit. The abnormality self-detection circuit 100 includes a first circuit 110 and a second circuit 120, including the steps of:

[0069] The second circuit 120 acquires specific data for determining whether the first circuit 110 is operating normally;

[0070] The second circuit 120 determines whether the first circuit 110 operates normally based on a comparison result between the specific data and the preset data, wherein the preset data is a collection of multiple characteristic information indicating that the first circuit 110 operates normally.

[0071] Alternatively, if Figure 4 As shown, the control method of the abnormal self-detection circuit also includes:

[0072] In response to the first circuit 110 not operating normally, the second circuit 120 sends an instruction to the first circuit 110 to perform a predefined operation.

[0073] Alternatively, if Figure 5 As shown, the control method of the abnormal self-detection circuit also includes:

[0074] The first circuit 110 acquires specific data for determining whether the second circuit 120 is operating normally;

[0075] The first circuit 110 determines whether the second circuit 120 operates normally based on a comparison result between the specific data and the preset data, wherein the preset data is a collection of multiple characteristic information indicating that the second circuit 120 operates normally.

[0076] Optionally, the control method of the abnormality self-detection circuit further includes:

[0077] In response to the second circuit 120 not operating normally, the first circuit 110 sends an instruction to the second circuit 120 to perform a predefined operation.

[0078] The “predefined operations” mentioned in this embodiment are operations used to process or report circuit abnormalities, including but not limited to: resetting the circuit, restarting the circuit, repairing the circuit abnormality, reporting the circuit abnormality, etc.

[0079] Optionally, a control method of an abnormality self-detection circuit, such as Figure 6 As shown, it also includes: "The second circuit 120 determines whether the first circuit 110 is working normally based on the comparison result between the specific information and the preset information", specifically: the second circuit 120 periodically determines whether the first circuit 110 is working normally based on the comparison result between the specific data and the preset data.

[0080] Optionally, a control method of an abnormality self-detection circuit, such as Figure 7 As shown, it also includes: if the second circuit 120 does not receive specific data within a preset time, it is determined that the first circuit 110 is working abnormally.

[0081] Optionally, the control method of the abnormal self-detection circuit also includes: the first circuit 110 obtains specific information for determining whether the second circuit 120 is working normally, and the first circuit 110 sends an instruction to the second circuit 120 to perform a predefined operation, multiplexing an information transmission channel.

[0082] Optionally, the control method of the abnormal self-detection circuit also includes: the second circuit 120 obtains specific information for determining whether the first circuit 110 is working normally, and the second circuit 120 sends an instruction to the first circuit 110 to perform a predefined operation, multiplexing an information transmission channel.

[0083] Optionally, a control method of an abnormality self-detection circuit, such as Figure 8 As shown, if it is determined that the first circuit 110 is not working properly, the second circuit 120 can reversely analyze the characteristic information to determine the sub-circuit that is working abnormally.

[0084] Optionally, this embodiment further provides an abnormality self-detection circuit, and the control method of the abnormality self-detection circuit provided by this embodiment is applied, such as Figure 2 As shown, in the abnormality self-detection circuit 100, between the first circuit 110 and the second circuit 120, the second circuit 120 obtains specific data and sends instructions to the first circuit 110 through different information transmission channels.

[0085] Alternatively, if Fig. 9 As shown, in the abnormality self-detection circuit 200, an information transmission channel is multiplexed between the first circuit 210 and the second circuit 220 for obtaining specific data and sending instructions.

[0086] Alternatively, if Fig.10 As shown, in the abnormal self-detection circuit 300, between the first circuit 310 and the second circuit 320, the second circuit 320 obtains specific data, the first circuit 310 obtains specific data, the second circuit 320 sends instructions to the first circuit 310, and the first circuit 310 sends instructions to the second circuit 320, which are realized through four different information transmission channels.

[0087] Alternatively, if Fig.11 As shown, in the abnormality self-detection circuit 400, the first circuit 410 transmits specific data and sends instructions to the second circuit 420, multiplexing a unidirectional information transmission channel; the second circuit 420 transmits specific data and sends instructions to the first circuit 410, multiplexing a unidirectional information transmission channel.

[0088] Alternatively, if Fig.12 As shown, in the abnormal self-detection circuit 500, the first circuit 510 and the second circuit 520 transmit specific data to each other and reuse a bidirectional information transmission channel; the first circuit 510 and the second circuit 520 send instructions to each other and reuse a bidirectional information transmission channel; with this arrangement, information of the same / similar data type shares an information transmission channel, which reduces costs and improves information transmission efficiency.

[0089] Alternatively, if Fig.13As shown, the present embodiment also provides an abnormal self-detection circuit 600, which includes a first circuit 610, a second circuit 620, ... and an Nth circuit 6N0 connected in sequence, wherein N is a positive integer and N≥3; two adjacent circuits (for example, the first circuit 610 and the second circuit 620, the second circuit 620 and the third circuit 630, the N-1th circuit and the Nth circuit) can interact in the control manner of any abnormal self-detection circuit provided in the present embodiment.

[0090] Optionally, the connection relationship between the first circuit 610, the second circuit 620, ... and the Nth circuit 6N0 may not be limited to being connected in sequence, but may be adaptively and freely connected based on application scenarios or functional requirements. In this connection relationship, any two connected circuits may interact in the control manner of any abnormal self-detection circuit provided in this embodiment.

[0091] Such a design not only allows a more complex circuit architecture to realize the convenient, efficient and accurate self-detection function provided in this embodiment; but also when multiple circuits are connected to the same circuit and tested, the comprehensive feedback of the detection results of different circuits can be used to finally determine whether the detected circuit is working normally, so that the result of the circuit abnormality judgment is more accurate. Specifically, this embodiment does not limit the implementation form of the comprehensive feedback and final judgment based on the detection results of different circuits. In addition, in this case, even if an abnormality occurs in one of the multiple circuits, it will not affect the detection of the target circuit by other circuits. Compared with the reliance on a single detection circuit in the prior art, the "decentralized" detection design of the detection circuit of this application improves the stability and safety of the abnormal self-detection circuit.

[0092] In addition, the N circuits are not only freely connected adaptively based on the application scenario or functional requirements, but whether they are configured to have detection functions and the detection logic between circuits can also be freely configured based on the application scenario, functional requirements and the characteristics of the circuits themselves. For example, some circuits with complex functions / structures can be comprehensively detected by multiple circuits; and some circuits that are not prone to failure can be detected by a single or a small number of circuits; due to considerations of space, integration, and circuit complexity, some circuits can also be configured without detection functions. The above design can achieve a balance between the stability and complexity of the circuit.

[0093] Alternatively, if Fig.14As shown, in this embodiment, the first circuit 110 is an analog front-end chip, the second circuit 120 is a microcontroller chip, and the analog front-end chip includes a pattern generating circuit 111 and a functional module circuit 112. The functional module circuit 112 is equivalent to a sub-circuit of the first circuit 110, which includes a power management circuit 1, a signal chain circuit 2, a communication circuit 3, a control calculation circuit 4 and an IO circuit 5; the pattern generating circuit 111 is connected to the functional module circuit 112, and can obtain specific information of any of a plurality of functional module circuits 112 and send the set of specific information to the microcontroller chip, and the microcontroller chip can compare the specific data with the pre-stored preset data to determine whether the analog front-end chip is working normally. If not, a predefined instruction is sent to the analog front-end chip to control the operation of the analog front-end chip.

[0094] Among them, the "specific information" mentioned in this embodiment can be information such as enable status, control bit, configuration bit, output flag bit, etc., or a collection of any of them.

[0095] like Fig.15 As shown, in the first detection cycle, since the specific data sent by the analog front-end chip is consistent with the preset data, the analog front-end chip is determined to be working normally. In the following two cycles, the specific data sent by the analog front-end chip are inconsistent with the preset data, and the microcontroller chip sends a reset instruction to the analog front-end chip through the communication port.

[0096] This solution integrates the self-detection mechanism between the analog front-end chip (AFE) and the microcontroller chip (MCU), forming an efficient and comprehensive circuit detection method. The following is a description of the technical effects of this solution:

[0097] Real-time fault detection:

[0098] The pattern generation circuit 111 of the analog front-end chip collects and generates specific information sets (such as enable status, control bit, configuration bit, output flag bit, etc.) of multiple functional modules in real time to characterize the status of each module. The pattern generation circuit sends this set to the microcontroller chip regularly. The MCU can quickly determine the working status of the analog front-end chip by comparing the difference between the preset data and the real-time data.

[0099] This solution can monitor all key modules in the AFE chip in real time, ensuring that abnormal conditions are captured and fed back the moment they occur, thereby improving the overall safety and stability of the circuit.

[0100] Comprehensive coverage of abnormal conditions:

[0101] This solution uses a specific information set to monitor multiple functional modules, including power management circuits, signal chain circuits, communication circuits, control calculation circuits, IO circuits, etc. Due to the diversity of specific information, it can cover various characteristics of normal circuit operation, so various faults such as abnormality of a certain module, loss of function or logic error can be captured.

[0102] There is no need to detect known fault states one by one. The solution only needs to monitor the normal status data of each module. Therefore, even if an unknown type of fault occurs, as long as the module status information is different from the normal preset value, the solution can identify it as abnormal, with extremely high coverage and versatility.

[0103] Adaptive control and recovery:

[0104] When the MCU determines that the analog front-end chip is not working properly, it will automatically send predefined instructions to the AFE to perform specific control operations. In this way, whether it is a simple circuit reset, state reset, or activation of a backup module, the solution can be implemented through instructions and has a certain self-recovery capability. This improves the fault tolerance of the system, reduces the need for manual intervention, and provides protection for the continuous and stable operation of the system.

[0105] Modular design flexibility:

[0106] The submodules of the functional module circuit are independently adjustable, which means that the detection solution can adapt to different analog front-end chip configurations. For example, the required subcircuit can be selected as the detection object in different applications, which brings high flexibility to circuit design and application expansion. The solution is not only suitable for single-chip circuits, but also can adapt to multiple AFE chips in the system, and realize centralized detection and control of multiple analog front ends through unified management of MCU.

[0107] In general, this solution utilizes the self-detection mechanism between AFE and MCU, providing comprehensive support for real-time monitoring, rapid fault location, adaptive control and stability of the system, and has broad application prospects.

[0108] Optionally, this embodiment further provides a chip, which applies the abnormality self-detection circuit provided by this embodiment or applies the control method of the abnormality self-detection circuit provided by this embodiment.

[0109] Optionally, this embodiment further provides an electronic device using the chip provided in this embodiment.

[0110] Alternatively, if Fig.16As shown, the control method of the abnormal self-detection circuit can be specifically as follows: first, the first circuit generates specific data according to the working status information of its internal sub-circuit, and then, the first circuit periodically sends the data to the second circuit through its IO port, and then the second circuit determines whether the data matches the preset data. If so, it is determined that the first circuit is working normally. If not, it is determined that the first circuit is working abnormally, and an instruction is sent to the first circuit to perform a predefined operation.

[0111] Alternatively, if Fig.17 As shown, the control method of the abnormal self-detection circuit can also be specifically as follows: the first circuit and the second circuit respectively generate specific data according to the working status information of their internal sub-circuits, and then periodically send corresponding data to each other through the IO interface, and then determine whether the two circuits are working normally based on whether the received data matches the preset data. If not, send instructions to each other to make it perform predefined operations.

[0112] So far, the technical solution of the present invention has been described in conjunction with the accompanying drawings. However, it is easy for those skilled in the art to understand that the protection scope of the present invention is obviously not limited to the above-mentioned specific embodiments. Without departing from the principle of the present invention, those skilled in the art can make equivalent changes or substitutions to the relevant technical features, and the technical solutions after these changes or substitutions will fall within the protection scope of the present invention.

Claims

1. A control method for an abnormality self-detection circuit, wherein the abnormality self-detection circuit comprises a first circuit and a second circuit, characterized in that: Includes steps: The second circuit acquires specific data for determining whether the first circuit operates normally; The second circuit determines whether the first circuit works normally based on a comparison result between the specific data and preset data, wherein the preset data is a collection of multiple feature information indicating that the first circuit works normally.

2. The control method of the abnormality self-detection circuit according to claim 1, characterized in that: Also includes the steps: In response to the first circuit not operating normally, the second circuit sends an instruction to the first circuit to perform a predefined operation.

3. The control method of the abnormality self-detection circuit according to claim 1, characterized in that: Also includes the steps: The first circuit acquires specific data for determining whether the second circuit operates normally; The first circuit determines whether the second circuit works normally based on a comparison result between the specific data and preset data, wherein the preset data is a collection of multiple feature information indicating that the second circuit works normally.

4. The control method of the abnormality self-detection circuit according to claim 3, characterized in that: Also includes the steps: In response to the second circuit not operating normally, the first circuit sends an instruction to the second circuit to perform a predefined operation.

5. The control method of the abnormality self-detection circuit according to claim 2 or 4, characterized in that: The predefined operation includes any one of restarting the circuit, resetting the circuit, repairing the circuit abnormality, and reporting the circuit abnormality.

6. The control method of the abnormality self-detection circuit according to any one of claims 1 to 4, characterized in that: The “second circuit determines whether the first circuit operates normally based on a comparison result between specific information and preset information” includes: the second circuit periodically determines whether the first circuit operates normally based on a comparison result between the specific data and preset data.

7. The control method of the abnormality self-detection circuit according to any one of claims 1 to 4, characterized in that: Also includes the steps: If the second circuit does not receive the specific data within a preset time, it is determined that the first circuit operates abnormally.

8. The control method of the abnormal self-detection circuit according to any one of claims 1 to 4, wherein the first circuit comprises a plurality of sub-circuits, and the preset data is a collection of characteristic information when at least some of the plurality of sub-circuits are working normally, characterized in that: The step is also included: if it is determined that the first circuit is not working properly, the second circuit can reversely analyze based on the characteristic information to determine the sub-circuit that is working abnormally.

9. An abnormality self-detection circuit, comprising a first circuit and a second circuit connected thereto, characterized in that: A control method for an abnormality self-detection circuit according to any one of claims 1 to 8.

10. The abnormality self-detection circuit according to claim 9, characterized in that: The first circuit includes a plurality of sub-circuits, and the preset data is a collection of characteristic information when at least some of the plurality of sub-circuits operate normally.

11. The abnormality self-detection circuit according to claim 10, characterized in that: If it is determined that the first circuit is not working properly, the second circuit can reversely analyze based on the characteristic information to determine the sub-circuit that is working abnormally.

12. The abnormality self-detection circuit according to claim 9, characterized in that: In response to the first circuit not working properly, the second circuit sends an instruction to the first circuit to perform a predefined operation, and the second circuit obtains the specific data from the first circuit and sends the instruction to the first circuit using a multiplexed information transmission channel.

13. The abnormality self-detection circuit according to claim 9, characterized in that: In response to the first circuit not working properly, the second circuit sends an instruction to the first circuit to perform a predefined operation, and the first circuit acquires specific data for determining whether the second circuit is working properly; The first circuit determines whether the second circuit works normally based on a comparison result between the specific data and preset data, wherein the preset data is a set of multiple characteristic information indicating that the second circuit works normally; In response to the second circuit not operating normally, the first circuit sending an instruction to the second circuit to perform a predefined operation; The first circuit and the second circuit transmit specific data to each other through a multiplexing bidirectional information transmission channel; the first circuit and the second circuit send instructions to each other through a multiplexing bidirectional information transmission channel.

14. The abnormality self-detection circuit according to claim 9, characterized in that: In response to the first circuit not working properly, the second circuit sends an instruction to the first circuit to perform a predefined operation, and the first circuit acquires specific data for determining whether the second circuit is working properly; The first circuit determines whether the second circuit works normally based on a comparison result between the specific data and preset data, wherein the preset data is a set of multiple characteristic information indicating that the second circuit works normally; In response to the second circuit not operating normally, the first circuit sending an instruction to the second circuit to perform a predefined operation; The first circuit transmits specific data and sends instructions to the second circuit, multiplexing a unidirectional information transmission channel; the second circuit transmits specific data and sends instructions to the first circuit, multiplexing a unidirectional information transmission channel.

15. An abnormality self-detection circuit, comprising a first circuit, a second circuit, ... and an Nth circuit, characterized in that: Any two of the N circuits connected to each other are subjected to the control method for the abnormality self-detection circuit according to any one of claims 1 to 8.

16. The abnormality self-detection circuit according to any one of claims 9 to 15, characterized in that: The first circuit is an analog front-end chip, and the second circuit is a microcontroller chip.

17. The abnormality self-detection circuit according to claim 16, characterized in that: The analog front-end chip includes a pattern generation circuit and a functional module circuit connected thereto. The pattern generation circuit can acquire specific data of the functional module circuit and send the data to the microcontroller chip connected to the pattern generation circuit.

18. The abnormality self-detection circuit according to claim 17, characterized in that: The microcontroller chip can determine whether the analog front-end chip is operating normally based on the specific data and the preset data. If not, the microcontroller chip can send instructions to the analog front-end chip to perform predefined operations.

19. The abnormality self-detection circuit according to claim 17, characterized in that: The functional module circuit includes: a power management circuit, a signal chain circuit, a communication circuit, a control calculation circuit and an IO circuit.

20. A chip, characterized in that: The abnormality self-detection circuit according to any one of claims 9 to 19 is integrated.

21. An electronic device, characterized in that: Use the chip described in claim 20.

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