Method and device for measuring illumination intensity of ultraviolet lamp

Abstract

The invention relates to an ultraviolet lamp illumination intensity measuring method and device. The method comprises the steps that an ultraviolet lamp is arranged, a reflecting cover is installed above the ultraviolet lamp, and light rays in the reflecting cover comprise direct light emitted by the ultraviolet lamp and reflected light formed when the direct light is emitted to the reflecting cover; the power of the ultraviolet lamp is set to be first power, direct light proportion distribution is obtained, and the direct light proportion distribution is distribution of the proportion of the illumination intensity of the direct light to the illumination intensity of the direct light and the illumination intensity of the reflected light at all the illumination positions; and adjusting the power of the ultraviolet lamp to second power, obtaining the illumination intensity distribution of the direct light at each illumination position under the second power, and calculating the illumination intensity distribution of the direct light and the reflected light under the second power according to the illumination intensity distribution of the direct light and the direct proportion distribution. The method can effectively measure the illumination intensity of the ultraviolet lamp.

Description

Technical Field

[0001] The present application relates to the field of light intensity measurement, and in particular to a method and device for measuring the light intensity of ultraviolet light. Background Art

[0002] When assembling electronic products, it involves gluing two parts together, and adhesives can be used at this time. In order to obtain a well-cured adhesive layer, the curing process must be carried out under appropriate conditions.

[0003] In the related art, the ultraviolet curing principle can be used to achieve rapid curing, so that the adhesive can be converted from liquid to solid within a few seconds to bond parts. However, when the light energy is insufficient, the adhesive may not be fully cured, and the adhesive may overflow to other parts. When the light energy is too strong, the temperature may be too high and the parts may be damaged by heat. Therefore, how to obtain the light intensity under different ultraviolet lamp powers, so as to accurately control the light intensity of the ultraviolet lamp, is a problem that technicians in this field need to solve urgently. Summary of the invention

[0004] Based on this, in response to the above technical problems, the present application provides a method and device for measuring the light intensity of ultraviolet light. By installing a reflector above the ultraviolet lamp, the light intensity distribution of direct light is calculated by measuring the direct peak value, and then the light intensity distribution of direct light plus reflected light after the power is changed is calculated based on the direct light intensity distribution and the direct light ratio distribution. The light intensity under different ultraviolet lamp powers can be obtained, thereby accurately controlling the light intensity of the ultraviolet lamp.

[0005] In a first aspect, the present application provides a method for measuring the intensity of ultraviolet light. The method comprises:

[0006] An ultraviolet lamp is provided, and a reflector is installed above the ultraviolet lamp, wherein the light in the reflector includes direct light emitted by the ultraviolet lamp and reflected light formed by the direct light emitting from the reflector;

[0007] The power of the ultraviolet lamp is set to a first power, and a direct light ratio distribution is obtained, wherein the direct light ratio distribution is a distribution of a ratio of the direct light intensity at each illumination position to the direct light plus the reflected light intensity;

[0008] The power of the ultraviolet lamp is adjusted to a second power, the illumination intensity distribution of the direct light at each illumination position under the second power is obtained, and the illumination intensity distribution of the direct light plus the reflected light under the second power is calculated based on the illumination intensity distribution of the direct light and the direct light ratio distribution.

[0009] In one embodiment, setting the power of the ultraviolet lamp to a first power and obtaining the direct radiation ratio distribution includes:

[0010] Setting a sensor, and measuring a first full light distribution by moving the position of the sensor, wherein the first full light distribution is a light intensity distribution of direct light plus reflected light at each lighting position under the first power;

[0011] Fixing the sensor directly below the ultraviolet lamp to obtain a first direct peak value, wherein the first direct peak value is a peak value of the light intensity of the direct light at the first power;

[0012] A first lamp intensity is calculated based on the first direct peak value and the light source illumination formula, and a first direct distribution is calculated based on the first lamp intensity and the light source illumination formula, wherein the first direct distribution is the illumination intensity distribution of direct light at each illumination position under the first power;

[0013] The direct light proportion distribution is obtained by calculating the first direct light distribution and the first total light distribution, wherein the direct light proportion distribution is the distribution of the proportion of the first direct light distribution to the first total light distribution;

[0014] Wherein, the light source illumination formula is: Wherein, E(A) refers to the light intensity at the illumination position of point A, Is refers to the lamp intensity, h refers to the height value from the ultraviolet lamp to the illumination position directly below it, and α refers to the angle between the line connecting the ultraviolet lamp to the illumination position directly below it and the ultraviolet lamp and the line connecting the ultraviolet lamp to point A, wherein α is greater than or equal to 0° and less than 90°.

[0015] In one embodiment, adjusting the power of the ultraviolet lamp to a second power, obtaining the illumination intensity distribution of the direct light at each illumination position under the second power, and calculating the illumination intensity distribution of the direct light plus the reflected light under the second power according to the illumination intensity distribution of the direct light and the direct ratio distribution includes:

[0016] Obtaining a second direct peak value, wherein the second direct peak value is a peak value of the illumination intensity of the direct light at the second power;

[0017] A second lamp intensity is calculated based on the second direct peak value and the light source illumination formula, and a second direct distribution is calculated based on the second lamp intensity and the light source illumination formula, wherein the second direct distribution is the illumination intensity distribution of direct light at each position under the second power;

[0018] A second total light distribution is calculated according to the second direct light distribution and the direct light ratio distribution, wherein the second total light distribution is a light intensity distribution of direct light plus reflected light at the second power.

[0019] In one embodiment, the method further comprises:

[0020] The amount of illumination is calculated based on the illumination intensity distribution of the direct light plus the reflected light and the illumination time.

[0021] In one embodiment, the sensor is configured as follows:

[0022] The sensor is placed on a track below the ultraviolet lamp, and the sensor measures the light intensity distribution of the direct light and reflected light of the ultraviolet lamp at different positions on the track by moving on the track.

[0023] In one embodiment, the method for obtaining the direct peak value includes:

[0024] A fixture for shielding the reflected light is arranged directly above the sensor, and the peak value of the direct light is obtained through the fixture.

[0025] In one embodiment, the reflector is elliptical in shape.

[0026] In one embodiment, the direct radiation ratio distribution is associated with the structure of the reflector, the distance between the lamp tube and the reflector, and the shape of the reflector.

[0027] In a second aspect, the present application also provides a device for measuring the intensity of ultraviolet light, the device comprising:

[0028] UV lamps for direct light;

[0029] A reflector is arranged above the ultraviolet lamp, and the direct light is emitted onto the reflector to form reflected light;

[0030] A sensor is installed directly below the ultraviolet lamp and is used to obtain the light intensity distribution of direct light plus reflected light at each lighting position and the peak value of the direct light;

[0031] A first calculation module calculates the intensity of the lamp tube according to the peak value of the direct light and the light source illumination formula, and calculates the direct light distribution of each illumination position based on the lamp tube intensity and the light source illumination formula; calculates the proportion of the direct light intensity at each illumination position to the light intensity of the direct light plus the reflected light according to the direct light intensity distribution at each illumination position and the light intensity distribution of the direct light plus the reflected light obtained at the same power of the ultraviolet lamp; calculates the light intensity distribution of the direct light plus the reflected light at each illumination position according to the proportion of the direct light intensity at each illumination position to the light intensity of the direct light plus the reflected light and the direct light intensity distribution at each illumination position;

[0032] Wherein, the light source illumination formula is: Wherein, E(A) refers to the light intensity at the illumination position of point A, Is refers to the lamp intensity, h refers to the height value from the ultraviolet lamp to the illumination position directly below it, and α refers to the angle between the line connecting the ultraviolet lamp to the illumination position directly below it and the ultraviolet lamp and the line connecting the ultraviolet lamp to point A, wherein α is greater than or equal to 0° and less than 90°.

[0033] In one of the embodiments, the device further includes a second calculation module, which is used to calculate the amount of light according to the light intensity distribution of the direct light plus the reflected light and the light exposure time.

[0034] In one of the embodiments, the device further includes a fixture for shielding the reflected light, and the fixture is disposed directly above the sensor.

[0035] In one embodiment, the reflector is elliptical in shape.

[0036] In one embodiment, the device further includes a guide rail arranged along a first direction and a carrier arranged on the guide rail, wherein the guide rail is arranged below the reflector, and the carrier can move along the guide rail.

[0037] The above-mentioned method for measuring the intensity of ultraviolet light has at least the following beneficial effects:

[0038] The embodiment scheme provided by the present disclosure can obtain the direct light proportion distribution based on the distribution of the ratio of the direct light intensity to the direct light plus the reflected light intensity. When the power of the ultraviolet lamp changes, the direct light intensity distribution is calculated only by measuring the direct light peak value, and then the direct light intensity distribution of the direct light plus the reflected light after the power change is calculated based on the direct light intensity distribution and the direct light proportion distribution.

[0039] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present disclosure. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure or the conventional technology, the drawings required for use in the embodiments or the conventional technology descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present disclosure, and for ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0041] Figure 1 A diagram showing an application environment of a method for measuring the intensity of ultraviolet light in an embodiment;

[0042] Figure 2 A schematic diagram of a process for measuring the intensity of ultraviolet light in one embodiment;

[0043] Figure 3 is a distribution diagram of light intensity curves at different positions in one embodiment;

[0044] Figure 4 A schematic diagram of a process for measuring the intensity of ultraviolet light in one embodiment;

[0045] Figure 5 A schematic diagram of a process for measuring the intensity of ultraviolet light in one embodiment;

[0046] Figure 6 is a light intensity distribution diagram of a fixture included in one embodiment;

[0047] Figure 7 FIG. 4 is a structural block diagram of an ultraviolet light intensity measuring device in one embodiment. DETAILED DESCRIPTION

[0048] In order to enable ordinary persons in the art to better understand the technical solutions of the present disclosure, the technical solutions in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the accompanying drawings.

[0049] It should be noted that the terms "first", "second", etc. in the specification and claims of the present disclosure and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present disclosure described here can be implemented in an order other than those illustrated or described here. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present disclosure. On the contrary, they are only examples of devices and methods consistent with some aspects of the present disclosure as detailed in the attached claims. The terms "include", "comprise" or any other variant thereof are intended to cover non-exclusive inclusion, so that the process, method, product or device including a series of elements includes not only those elements, but also other elements that are not explicitly listed, or also includes elements inherent to such process, method, product or device. In the absence of more restrictions, it is not excluded that there are other identical or equivalent elements in the process, method, product or device including the elements. For example, if the words first, second, etc. are used to represent the name, they do not represent any specific order.

[0050] The present disclosure provides a method for measuring the intensity of ultraviolet light, which can be applied to Figure 1 In the application environment shown. A reflector 104 is installed above the ultraviolet lamp 102. In the curing equipment processing of mechanical parts, for small parts with irregular sizes, edges, convex and concave conditions, the ultraviolet lamp 102 can be used with a reflector to perform curing, so that most of the ultraviolet light is irradiated to the surface of the mechanical parts, ensuring that the bonding position of the parts obtains sufficient energy to complete the curing. The sensor 106 can be installed inside the reflector to measure the light intensity distribution inside the reflector.

[0051] In some embodiments of the present disclosure, Figure 2 As shown, a method for measuring the illumination intensity of ultraviolet light is provided. In a specific embodiment, the method may include the following steps:

[0052] S202: Setting an ultraviolet lamp, and installing a reflector above the ultraviolet lamp, wherein the light in the reflector includes direct light emitted by the ultraviolet lamp and reflected light formed by the direct light emitting from the reflector.

[0053] Figure 3 : is a distribution diagram of the light intensity curve at different positions in an embodiment, wherein the horizontal axis is the position, the vertical axis is the light intensity, line b is the distribution curve of the direct light intensity, and line a is the total light distribution curve, that is, the light intensity distribution of the direct light plus the reflected light at each lighting position.

[0054] A reflector is a reflector that reflects the light emitted by the light source that cannot shine on the work surface during the use of the lamp. It can be used in the work of fluorescent lamps, street lamps, LED lamps, ultraviolet lamps, etc. The material and shape of the reflector can affect the utilization rate of the output light of the lamp. Reflectors of different materials and shapes have different reflection angles for light, which determines the reflector's ability to handle indirect light from the light source. Install a reflector above the ultraviolet lamp. When the ultraviolet lamp emits direct light, the direct light is emitted to the reflector to form reflected light. The light inside the reflector can include direct light and reflected light, which can reduce the waste of ultraviolet light, concentrate and increase light intensity, and filter infrared light to reduce heat generation.

[0055] S204: Setting the power of the ultraviolet lamp to a first power, and obtaining a direct light ratio distribution, wherein the direct light ratio distribution is a distribution of a ratio of the direct light intensity at each illumination position to the direct light plus the reflected light intensity.

[0056] S206: Adjust the power of the ultraviolet lamp to a second power, obtain the illumination intensity distribution of the direct light at each illumination position under the second power, and calculate the illumination intensity distribution of the direct light plus the reflected light under the second power according to the illumination intensity distribution of the direct light and the direct light ratio distribution.

[0057] When the position of the ultraviolet lamp remains unchanged, the direct light irradiation area and the direct light plus reflected light irradiation area can be determined according to the structure of the reflector. Therefore, if the structure of the reflector remains unchanged, the direct light proportion distribution remains unchanged.

[0058] The power of the ultraviolet lamp can be adjusted to a second power, where the second power is different from the first power. At this time, the direct light intensity distribution of each illumination position under the second power is obtained, and the light intensity distribution of direct light plus reflected light under the second power can be calculated based on the direct light intensity distribution and the direct light ratio distribution.

[0059] In the above-mentioned method for measuring the illumination intensity of ultraviolet lamp, a reflector may be installed above the ultraviolet lamp to increase the illumination intensity, and the light in the reflector may include direct light emitted by the ultraviolet lamp and reflected light formed by the direct light emitting onto the reflector. At this time, the direct proportion distribution may be obtained according to the distribution of the proportion of the illumination intensity of the direct light to the illumination intensity of the direct light plus the illumination intensity of the reflected light. When the power of the ultraviolet lamp changes, the illumination intensity distribution of the direct light is calculated only by measuring the direct peak value, and then the illumination intensity distribution of the direct light plus the reflected light after the power change is calculated according to the illumination intensity distribution of the direct light and the direct proportion distribution.

[0060] In some embodiments of the present disclosure, Figure 4The flowchart of a method for measuring the illumination intensity of an ultraviolet lamp in an embodiment is as follows: setting the power of the ultraviolet lamp to a first power and obtaining the direct ratio distribution includes:

[0061] S402: Setting a sensor, and measuring a first total light distribution by moving the position of the sensor, wherein the first total light distribution is a light intensity distribution of direct light plus reflected light at each illumination position under the first power.

[0062] The sensor can be used to obtain the light intensity distribution of direct light plus reflected light at each lighting position, and the position of the sensor can be moved to measure the first total light distribution inside the reflector, that is, the light intensity distribution of direct light plus reflected light. The sensor can be placed on the track below the ultraviolet lamp, and the sensor can be moved on the track to measure the light intensity distribution of direct light plus reflected light of the ultraviolet lamp at different positions on the track.

[0063] S404: Fix the sensor directly below the ultraviolet lamp to obtain a first direct-irradiance peak value, wherein the first direct-irradiance peak value is a peak value of the illumination intensity of the direct light at the first power.

[0064] The sensor can be fixed directly under the ultraviolet lamp. The sensor directly receives the light and always monitors the maximum light intensity of the ultraviolet lamp to obtain the first direct light peak. At this time, a jig for shielding reflected light can be set directly above the sensor, and the peak value of the direct light can be obtained through the jig. In some embodiments of the present case, the jig can be an object with a hole in the middle and the rest of the object shielded from light. When it is necessary to measure the direct light peak, the jig can be placed above the sensor. Because the sensor is placed directly under the ultraviolet lamp, the ultraviolet light can shine on the sensor through the hole, so the direct light peak can be directly measured. Figure 3 As shown, the direct peak is the peak of line b.

[0065] S406: Calculate a first lamp intensity based on the first direct peak value and the light source illumination formula, and calculate a first direct distribution based on the first lamp intensity and the light source illumination formula, wherein the first direct distribution is the illumination intensity distribution of direct light at each illumination position under the first power.

[0066] The formula for light source illumination is: Wherein, E(A) refers to the light intensity at the illumination position of point A, Is refers to the lamp intensity, h refers to the height value from the ultraviolet lamp to the illumination position directly below it, and α refers to the angle between the line connecting the ultraviolet lamp to the illumination position directly below it and the ultraviolet lamp and the line connecting the ultraviolet lamp to point A, wherein α is greater than or equal to 0° and less than 90°.

[0067] When the first direct peak value and the height value from the UV lamp to the sensor are known, the first lamp intensity can be calculated based on the first direct peak value and the light source illumination formula. By measuring the height value from the UV lamp to the illumination position directly below it, the angle between the line from the UV lamp to the illumination position directly below it and the line from the UV lamp to point A, the illumination intensity at the illumination position of point A can be obtained, that is, the illumination intensity distribution of direct light at each illumination position inside the reflector can be obtained. Figure 3 As shown, the lamp intensity can be calculated based on the direct peak value and the light source illumination formula, and then the light intensity distribution of the direct light at each illumination position can be calculated through the lamp intensity and the light source illumination formula, that is, the direct light distribution curve of line b.

[0068] S408: Calculate the direct light proportion distribution through the first direct light distribution and the first total light distribution, wherein the direct light proportion distribution is the distribution of the proportion of the first direct light distribution to the first total light distribution.

[0069] The first direct light distribution is the light intensity distribution of direct light at each lighting position under the first power, and the first total light distribution is the light intensity distribution of direct light plus reflected light at each lighting position under the first power. The direct light proportion distribution can be calculated by the first direct light distribution and the first total light distribution.

[0070] In some embodiments of the present disclosure, Figure 5 The flowchart of a method for measuring the illumination intensity of ultraviolet light in an embodiment is as follows: adjusting the power of the ultraviolet lamp to a second power, obtaining the illumination intensity distribution of the direct light at each illumination position under the second power, and calculating the illumination intensity distribution of the direct light plus the reflected light under the second power according to the illumination intensity distribution of the direct light and the direct ratio distribution includes:

[0071] S502: Acquire a second direct peak value, wherein the second direct peak value is a peak value of the illumination intensity of the direct light at the second power.

[0072] The sensor can be fixed directly under the UV lamp, so that the sensor directly receives the light and always monitors the maximum light intensity of the UV lamp to obtain the second direct peak value.

[0073] S504: Calculate a second lamp intensity based on the second direct peak value and the light source illumination formula, and calculate a second direct distribution based on the second lamp intensity and the light source illumination formula, wherein the second direct distribution is the illumination intensity distribution of direct light at each position under the second power.

[0074] When the second direct peak value and the height from the ultraviolet lamp to the sensor are known, the second lamp intensity can be calculated based on the second direct peak value and the light source illumination formula. The second direct distribution can be calculated based on the second lamp intensity and the light source illumination formula.

[0075] S506: Calculate a second total light distribution according to the second direct light distribution and the direct light ratio distribution, wherein the second total light distribution is a light intensity distribution of direct light plus reflected light at the second power.

[0076] Under the premise that the reflector structure is constant and the reflected light loss is not considered, the direct light ratio distribution remains unchanged. The light intensity distribution of the direct light plus the reflected light at the second power can be calculated based on the second direct light distribution and the direct light ratio distribution.

[0077] In some embodiments of the present disclosure, the method further includes:

[0078] The amount of illumination is calculated based on the illumination intensity distribution of the direct light plus the reflected light and the illumination time.

[0079] Light intensity refers to the luminous flux of visible light received per unit area, with the unit of megawatt / square meter (mw / cm2), which is used to indicate the intensity of light and the degree of illumination of the surface area of ​​an object. Light quantity is a physical quantity used to characterize light intensity and brightness, indicating the light energy per unit area per unit time, with the unit of millijoule / square meter (mJ / cm2).

[0080] In some embodiments of the present disclosure, the sensor is configured as follows:

[0081] The sensor is placed on a track below the ultraviolet lamp, and the sensor measures the light intensity distribution of the direct light and reflected light of the ultraviolet lamp at different positions on the track by moving on the track.

[0082] A sensor can be installed on the track below the UV lamp. By moving the sensor on the track, the light intensity distribution of direct light plus reflected light at each lighting position at different positions on the track can be measured.

[0083] In some embodiments of the present disclosure, the method for obtaining the direct peak value includes:

[0084] A fixture for shielding the reflected light is arranged directly above the sensor, and the peak value of the direct light is obtained through the fixture.

[0085] Figure 6It is a light intensity distribution diagram including a fixture in one embodiment. Line c is the full light distribution curve measured without a fixture, line e is the full light distribution curve measured with a fixture, the full light distribution refers to the light intensity distribution of direct light plus reflected light, and line d is the direct light distribution curve with a fixture. Among them, the fixture can be used to shield reflected light. The fixture is installed directly above the sensor. The direct peak value, that is, the peak value of line d, can be measured by the sensor on which the fixture is installed. The lamp intensity is then calculated by the direct peak value and the light source illumination formula. The light intensity distribution of direct light at each illumination position, that is, line d, is then calculated by the lamp intensity and the light source illumination formula. In some embodiments of the present case, the fixture can be an object with a hole in the middle and the rest of the light shielded. When it is necessary to measure the direct peak value, the fixture can be placed above the sensor. Because the sensor is placed directly below the ultraviolet lamp, the ultraviolet light can be irradiated onto the sensor through the hole, so that the direct peak value, that is, the peak value of line d, can be directly measured.

[0086] In some embodiments of the present disclosure, the reflector is elliptical in shape.

[0087] There are three main types of reflectors at present: focusing type, non-focusing type and multi-faceted reflector type. Each of the three types of reflectors has its own unique characteristics and can be selected according to actual use requirements. The material selection, shape, installation location and heat dissipation of the reflector will affect the energy of ultraviolet light. The shape of the reflector is to ensure that the ultraviolet light can be gathered together, so an elliptical reflector can be selected for measurement to improve the utilization rate of ultraviolet light.

[0088] In some embodiments of the present disclosure, the direct radiation ratio distribution is associated with the structure of the reflector, the distance between the lamp tube and the reflector, and the shape of the reflector.

[0089] The structure of the reflector, the distance between the lamp and the reflector, and the structure of the reflector can all affect the direct ratio distribution. The shape of the reflector mainly refers to the impact on the reflection angle of the light, which determines the reflector's ability to handle indirect light from the light source. The material and shape of the reflector determine the output efficiency and output luminous flux of the lamp.

[0090] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0091] Based on the same inventive concept, the embodiment of the present disclosure also provides an ultraviolet light intensity measuring device for implementing the above-mentioned method for measuring the intensity of ultraviolet light. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above-mentioned method, so the specific limitations in the embodiment of the ultraviolet light intensity measuring device provided below can refer to the limitations of the ultraviolet light intensity measuring method above, and will not be repeated here.

[0092] The device may include a system (including a distributed system), software (application), module, component, server, client, etc. using the method described in the embodiments of this specification and a device in combination with necessary implementation hardware. Based on the same innovative concept, the device in one or more embodiments provided in the embodiments of the present disclosure is as described in the following embodiments. Since the implementation scheme and method for solving the problem of the device are similar, the implementation of the specific device in the embodiments of this specification can refer to the implementation of the aforementioned method, and the repetitions will not be repeated. As used below, the term "unit" or "module" can implement a combination of software and / or hardware for predetermined functions. Although the device described in the following embodiments is preferably implemented in software, the implementation of hardware, or a combination of software and hardware, is also possible and conceived.

[0093] In one embodiment, Figure 7 As shown, an ultraviolet light intensity measuring device 700 is provided.

[0094] The apparatus 700 may include:

[0095] an ultraviolet lamp 702 for emitting direct light;

[0096] A reflector 704 is disposed above the ultraviolet lamp, and the direct light is emitted onto the reflector to form reflected light;

[0097] The sensor 706 is installed directly below the ultraviolet lamp and is used to obtain the light intensity distribution of the direct light plus the reflected light at each lighting position and the peak value of the direct light;

[0098] The first calculation module 708 calculates the intensity of the lamp tube according to the peak value of the direct light and the light source illumination formula, and calculates the direct light distribution of each illumination position based on the lamp tube intensity and the light source illumination formula; calculates the proportion distribution of the direct light intensity at each illumination position to the light intensity of the direct light plus the reflected light according to the direct light intensity distribution at each illumination position and the light intensity distribution of the direct light plus the reflected light obtained at the same power of the ultraviolet lamp; calculates the light intensity distribution of the direct light plus the reflected light at each illumination position according to the proportion distribution of the direct light intensity at each illumination position to the light intensity of the direct light plus the reflected light and the direct light intensity distribution at each illumination position;

[0099] Wherein, the light source illumination formula is: Where E(A) refers to the light intensity at the illumination position of point A, Is refers to the lamp intensity, h refers to the height of the UV lamp to the illumination position directly below it, and α refers to the angle between the line from the UV lamp to the illumination position directly below it to the UV lamp and the line from the UV lamp to point A, where α is greater than or equal to 0° and less than 90°

[0100] In one embodiment, the device further includes a second calculation module, which is used to calculate the amount of light according to the light intensity distribution of the direct light plus the reflected light and the light exposure time.

[0101] In one embodiment, the device further comprises a fixture for shielding the reflected light, and the fixture is arranged directly above the sensor.

[0102] In one embodiment, the reflector is elliptical in shape.

[0103] In one embodiment, the device further comprises a guide rail arranged along a first direction and a carrier arranged on the guide rail, wherein the guide rail is arranged below the reflector, and the carrier can move along the guide rail.

[0104] Regarding the device in the above embodiment, the specific manner in which each module performs operations has been described in detail in the embodiment of the method, and will not be elaborated here.

[0105] Each module in the above-mentioned device for measuring the intensity of ultraviolet light can be implemented in whole or in part by software, hardware, or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute operations corresponding to each module.

[0106] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided by the present disclosure can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided by the present disclosure may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited thereto. The processor involved in each embodiment provided by the present disclosure may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited thereto.

[0107] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0108] The above-described embodiments only express several implementation methods of the present disclosure, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present invention. It should be pointed out that, for a person of ordinary skill in the art, several modifications and improvements can be made without departing from the concept of the present disclosure, and these all belong to the protection scope of the present disclosure. Therefore, the protection scope of the present disclosure shall be subject to the attached claims.

Claims

1. A method for measuring the intensity of ultraviolet light, characterized in that: The method comprises: An ultraviolet lamp is provided, and a reflector is installed above the ultraviolet lamp, wherein the light in the reflector includes direct light emitted by the ultraviolet lamp and reflected light formed by the direct light emitting from the reflector; The power of the ultraviolet lamp is set to a first power, and a direct light ratio distribution is obtained, wherein the direct light ratio distribution is a distribution of a ratio of the direct light intensity at each illumination position to the direct light plus the reflected light intensity; The power of the ultraviolet lamp is adjusted to a second power, the illumination intensity distribution of the direct light at each illumination position under the second power is obtained, and the illumination intensity distribution of the direct light plus the reflected light under the second power is calculated based on the illumination intensity distribution of the direct light and the direct light ratio distribution.

2. The method for measuring the intensity of ultraviolet light according to claim 1, characterized in that: The step of setting the power of the ultraviolet lamp to a first power and obtaining the direct radiation ratio distribution comprises: Setting a sensor, and measuring a first full light distribution by moving the position of the sensor, wherein the first full light distribution is a light intensity distribution of direct light plus reflected light at each lighting position under the first power; Fixing the sensor directly below the ultraviolet lamp to obtain a first direct peak value, wherein the first direct peak value is a peak value of the light intensity of the direct light at the first power; A first lamp intensity is calculated based on the first direct peak value and the light source illumination formula, and a first direct distribution is calculated based on the first lamp intensity and the light source illumination formula, wherein the first direct distribution is the illumination intensity distribution of direct light at each illumination position under the first power; The direct light proportion distribution is obtained by calculating the first direct light distribution and the first total light distribution, wherein the direct light proportion distribution is the distribution of the proportion of the first direct light distribution to the first total light distribution; Wherein, the light source illumination formula is: Wherein, E(A) refers to the light intensity at the illumination position of point A, Is refers to the lamp intensity, h refers to the height value from the ultraviolet lamp to the illumination position directly below it, and α refers to the angle between the line connecting the ultraviolet lamp to the illumination position directly below it and the ultraviolet lamp and the line connecting the ultraviolet lamp to point A, wherein α is greater than or equal to 0° and less than 90°.

3. The method for measuring the intensity of ultraviolet light according to claim 2, characterized in that: The step of adjusting the power of the ultraviolet lamp to a second power, obtaining the illumination intensity distribution of the direct light at each illumination position under the second power, and calculating the illumination intensity distribution of the direct light plus the reflected light under the second power according to the illumination intensity distribution of the direct light and the direct ratio distribution includes: Obtaining a second direct peak value, wherein the second direct peak value is a peak value of the illumination intensity of the direct light at the second power; A second lamp intensity is calculated based on the second direct peak value and the light source illumination formula, and a second direct distribution is calculated based on the second lamp intensity and the light source illumination formula, wherein the second direct distribution is the illumination intensity distribution of direct light at each position under the second power; A second total light distribution is calculated according to the second direct light distribution and the direct light ratio distribution, wherein the second total light distribution is a light intensity distribution of direct light plus reflected light at the second power.

4. The method for measuring the intensity of ultraviolet light according to claim 1, characterized in that: The method further comprises: The amount of illumination is calculated based on the illumination intensity distribution of the direct light plus the reflected light and the illumination time.

5. The method for measuring the intensity of ultraviolet light according to claim 2, characterized in that: The sensor is arranged in the following manner: The sensor is placed on a track below the ultraviolet lamp, and the sensor measures the light intensity distribution of the direct light and reflected light of the ultraviolet lamp at different positions on the track by moving on the track.

6. The method for measuring the intensity of ultraviolet light according to claim 2, characterized in that: The method for obtaining the direct peak value includes: A fixture for shielding the reflected light is arranged directly above the sensor, and the peak value of the direct light is obtained through the fixture.

7. The method for measuring the intensity of ultraviolet light according to claim 1, characterized in that: The reflector is in an elliptical shape.

8. The method for measuring the intensity of ultraviolet light according to claim 1, characterized in that: The direct radiation ratio distribution is associated with the structure of the reflector, the distance between the lamp tube and the reflector, and the shape of the reflector.

9. An ultraviolet light intensity measuring device, characterized in that: include: UV lamps for direct light; A reflector is arranged above the ultraviolet lamp, and the direct light is emitted onto the reflector to form reflected light; A sensor is installed directly below the ultraviolet lamp and is used to obtain the light intensity distribution of direct light plus reflected light at each lighting position and the peak value of the direct light; A first calculation module, which calculates the intensity of the lamp tube according to the peak value of the direct light and the light source illumination formula, and calculates the distribution of the direct light at each illumination position based on the lamp tube intensity and the light source illumination formula; The proportion distribution of the direct light intensity at each illumination position to the direct light plus the reflected light intensity is calculated based on the distribution of the direct light intensity at each illumination position and the distribution of the direct light plus the reflected light intensity at the same power of the ultraviolet lamp; the distribution of the direct light intensity at each illumination position to the direct light plus the reflected light intensity is calculated based on the distribution of the direct light intensity at each illumination position to the direct light plus the reflected light intensity and the distribution of the direct light intensity at each illumination position; Wherein, the light source illumination formula is: Wherein, E(A) refers to the light intensity at the illumination position of point A, Is refers to the lamp intensity, h refers to the height value from the ultraviolet lamp to the illumination position directly below it, and α refers to the angle between the line connecting the ultraviolet lamp to the illumination position directly below it and the ultraviolet lamp and the line connecting the ultraviolet lamp to point A, wherein α is greater than or equal to 0° and less than 90°.

10. The ultraviolet light intensity measuring device according to claim 9, characterized in that: The device also includes a second calculation module, which is used to calculate the amount of light according to the light intensity distribution of the direct light plus the reflected light and the light exposure time.

11. The ultraviolet light intensity measuring device according to claim 9, characterized in that: The device also includes a fixture for shielding the reflected light, and the fixture is arranged directly above the sensor.

12. The ultraviolet light intensity measuring device according to claim 9, characterized in that: The reflector is in an elliptical shape.

13. The ultraviolet light intensity measuring device according to claim 9, characterized in that: The device further comprises a guide rail arranged along a first direction and a carrier arranged on the guide rail, wherein the guide rail is arranged below the reflector, and the carrier can move along the guide rail.

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