Material box for testing photoelectric device and photoelectric device testing equipment

Abstract

The invention provides a material box for testing a photoelectric device and photoelectric device testing equipment, and belongs to the technical field of testing of optical equipment. The material box comprises a box body, the box body is provided with a containing space used for containing at least two photoelectric devices which are stacked up and down, the top of the box body is provided with a loading opening, the side portion of the box body is provided with windows for exposing interfaces of the photoelectric devices, a supporting plate is arranged in the containing space, an elastic piece is arranged between the supporting plate and the box body, and a limiting piece is movably installed at the loading opening. The moving stroke of the limiting piece comprises a yielding station which is jacked and pressed by the photoelectric device to be yielding so as to enable the photoelectric device to pass through the loading port, and a stopping station which is automatically reset after the photoelectric device passes through and stops the photoelectric device. According to the invention, batch detection of the photoelectric devices can be realized, simultaneous movement of the plurality of photoelectric devices can be realized by moving the material box, the operation is simple and convenient, the photoelectric devices are stacked neatly, unified plugging is realized in the testing process, and the testing efficiency can be improved.

Description

Technical Field

[0001] The invention relates to a material box for testing a photoelectric device and photoelectric device testing equipment, belonging to the technical field of testing photoelectric devices. Background Art

[0002] Optoelectronic devices are widely used in the fields of communication, imaging, measurement, etc., such as photodetectors and electro-optic modulators. Photodetectors are devices that can convert optical signals into electrical signals, and electro-optic modulators are devices that control optical signals through electrical signals based on the electro-optic effect to achieve transmission and processing of optical signals. In the production process of optoelectronic devices, the performance of optoelectronic devices needs to be tested to ensure their factory quality.

[0003] The Chinese utility model patent with the authorization announcement number CN217766706U discloses a photodetector responsiveness test device and system, wherein the test device includes a test box and a test fixture, the test fixture includes a PCB board, a DB plug is connected to the PCB board and multiple sockets are installed, each socket can be connected to a photodetector. The test box includes a shell, a DB interface is connected to the shell and multiple self-locking switches are installed, the DB interface and the DB plug are correspondingly plugged, so that each self-locking switch is electrically connected to a socket, and when in use, each self-locking switch is pressed one by one to open the corresponding photodetectors, so that each corresponding photodetector works one by one after being powered on, thereby testing each photodetector one by one.

[0004] The above-mentioned test device can realize batch detection of photoelectric detectors. Of course, the test device with the same architecture can also be used to test other optoelectronic devices such as electro-optical modulators. When using it, you only need to connect the interface of the optoelectronic device to the corresponding interface of the socket in the test device. However, the existing test method requires the installation and removal of optoelectronic devices one by one. The staff needs to mechanically repeat the pick-up and plug-in work many times, which is cumbersome to operate. In addition, there is no unified device for storing batches of optoelectronic devices. The test site is messy and it is easy to get confused during the pick-up and placement process, which affects the test efficiency. In addition, different optoelectronic devices are also easy to collide during the test process, and the safety of the optoelectronic devices cannot be guaranteed. Summary of the invention

[0005] The object of the present invention is to provide a material box for testing optoelectronic devices, so as to solve the problem in the prior art that optoelectronic devices need to be installed and disassembled one by one, and workers need to mechanically repeat the picking and placing and plugging and unplugging work many times, resulting in cumbersome operation and the optoelectronic devices are placed in a messy manner at the test site, which are easy to be confused during the picking and placing process, affecting the test efficiency, and different optoelectronic devices are easy to collide with each other; the object of the present invention is also to provide an optoelectronic device testing equipment to solve the above problems.

[0006] To achieve the above purpose, the photoelectric device testing material box of the present invention adopts the following technical solution: A material box for testing photoelectric devices comprises a box body, wherein the box body has a storage space for accommodating at least two photoelectric devices stacked up and down, the top of the box body has a loading port for loading the photoelectric devices into the loading space, the side of the box body is provided with a window for exposing the interface of each photoelectric device, a support plate for supporting the photoelectric devices is provided in the storage space, an elastic member for being deformed by force during the loading process of the photoelectric devices so as to apply a reaction force to the support plate after the photoelectric devices are loaded is provided between the support plate and the box body, a limiting member is movably installed at the loading port, and the movable travel of the limiting member includes a making way position for making way due to the top pressure of the photoelectric device to allow the photoelectric device to pass through the loading port, and also a stopping position for automatically resetting and stopping the photoelectric device after the photoelectric device passes through.

[0007] The beneficial effects of the above technical solution are as follows: the present invention is a pioneering invention, which provides a material box for testing optoelectronic devices, which includes a box body, and the storage space in the box body can accommodate at least two optoelectronic devices stacked up and down, so as to realize batch storage of optoelectronic devices; the loading port at the top of the box body is convenient for loading the optoelectronic devices into the storage space, and the window on the side of the box body can expose the interface of each optoelectronic device for detection; the support plate in the storage space can support the optoelectronic devices, so as to support multiple optoelectronic devices, and the elastic member between the support plate and the box body can exert a reaction force on the support plate, and combined with the stopping effect of the limit member at the loading port, multiple optoelectronic devices can be clamped between the support plate and the limit member, so as to facilitate detection; the limit member is movably installed, and has a clearance position and a stopping position, so as to ensure that the optoelectronic devices can be loaded into the storage space through the loading port.

[0008] When in use, the photoelectric device is pressed against the limiter, and the limiter moves to the clearing position. The photoelectric device can enter the accommodating space through the loading port, and the photoelectric device is supported by the support plate. By analogy, multiple photoelectric devices are loaded, and each photoelectric device is firmly clamped between the support plate and the limiter. Then, the detection device can be used to detect multiple photoelectric devices at the same time. Multiple photoelectric devices can be plugged in and out at the same time, and the moving material box can achieve the simultaneous movement of multiple photoelectric devices. The staff does not need to mechanically repeat the picking and plugging work many times, and the operation is simple. At the same time, the photoelectric devices are neatly stacked and uniformly plugged in during the test, so there will be no collision problems. After the test is completed, the multiple photoelectric devices are in the same material box, avoiding the problem of confusion caused by picking up and putting one by one, which can improve the test efficiency as a whole.

[0009] Furthermore, a discharge port connected to the loading port is provided on the side of the loading port, and the depth of the discharge port satisfies that the top optoelectronic device is higher than the bottom wall of the discharge port, so that the top optoelectronic device can be directly moved out of the box body from the discharge port laterally.

[0010] Furthermore, the loading port is U-shaped, the side opening of the loading port forms a discharge port, and the limiting members are respectively installed on two opposite side walls of the loading port.

[0011] Furthermore, the loading port comprises two parallel and opposite side walls and the limiting members are respectively installed on the two side walls.

[0012] Furthermore, the support plate and the box body are guided and matched along the up-down direction.

[0013] Furthermore, the box body is a rectangular parallelepiped structure, and the four side walls of the box body are respectively provided with the windows, and the edges around the supporting plate are respectively slidably matched with the inner walls of each window.

[0014] Furthermore, the limiting member is a limiting plate, which is installed at the loading port so as to be rotatable up and down through a hinge shaft, and a torsion spring is installed on the hinge shaft for being compressed and deformed when the limiting plate rotates downward so that the limiting plate can automatically reset upward.

[0015] Furthermore, a pair of baffles that can translate left and right or front and back are installed between the upper and lower inner walls of the window.

[0016] Furthermore, the elastic member is a compression spring arranged between the support plate and the bottom wall of the box body.

[0017] To achieve the above purpose, the optoelectronic device testing equipment in the present invention adopts the following technical solutions: The photoelectric device testing equipment comprises a detection device and a material box for testing the photoelectric device. The photoelectric device testing material box comprises a box body, the box body has a storage space for accommodating at least two photoelectric devices stacked up and down, the top of the box body has a loading port for loading the photoelectric device into the storage space, the side of the box body is provided with a window for exposing the interface of each photoelectric device, a support plate for supporting the photoelectric device is provided in the storage space, an elastic member for being deformed by force during the loading process of the photoelectric device so as to apply a reaction force to the support plate after the photoelectric device is loaded is provided between the support plate and the box body, a limiting member is movably installed at the loading port, and the movable travel of the limiting member includes a making way position for making way due to the top pressure of the photoelectric device to allow the photoelectric device to pass through the loading port, and also has a stopping position for automatically resetting and stopping the photoelectric device after the photoelectric device passes.

[0018] The beneficial effects of the above technical scheme are: the present invention belongs to an improved invention, which adds a material box for testing optoelectronic devices to the testing equipment, and the material box includes a box body, and the storage space in the box body can accommodate at least two optoelectronic devices stacked up and down, so as to realize batch storage of optoelectronic devices; the loading port on the top of the box body is convenient for loading the optoelectronic devices into the storage space, and the window on the side of the box body can expose the interface of each optoelectronic device for detection; the support plate in the storage space can support the optoelectronic devices, so as to realize the support of multiple optoelectronic devices, and the elastic member between the support plate and the box body can exert a reaction force on the support plate, and combined with the stopping effect of the limit member at the loading port, multiple optoelectronic devices can be clamped between the support plate and the limit member, so as to facilitate detection; the limit member is movably installed, and has a clearance position and a stopping position, so as to ensure that the optoelectronic devices can be loaded into the storage space through the loading port.

[0019] When in use, the photoelectric device is pressed against the limiter, and the limiter moves to the clearing position. The photoelectric device can enter the accommodating space through the loading port, and the photoelectric device is supported by the support plate. By analogy, multiple photoelectric devices are loaded, and each photoelectric device is firmly clamped between the support plate and the limiter. Then, the detection device can be used to detect multiple photoelectric devices at the same time. Multiple photoelectric devices can be plugged in and out at the same time, and the moving material box can achieve the simultaneous movement of multiple photoelectric devices. The staff does not need to mechanically repeat the picking and plugging work many times, and the operation is simple. At the same time, the photoelectric devices are neatly stacked and uniformly plugged in during the test, so there will be no collision problems. After the test is completed, the multiple photoelectric devices are in the same material box, avoiding the problem of confusion caused by picking up and putting one by one, which can improve the test efficiency as a whole.

[0020] Furthermore, a discharge port connected to the loading port is provided on the side of the loading port, and the depth of the discharge port satisfies that the top optoelectronic device is higher than the bottom wall of the discharge port, so that the top optoelectronic device can be directly moved out of the box body from the discharge port laterally.

[0021] Furthermore, the loading port is U-shaped, the side opening of the loading port forms a discharge port, and the limiting members are respectively installed on two opposite side walls of the loading port.

[0022] Furthermore, the loading port comprises two parallel and opposite side walls and the limiting members are respectively installed on the two side walls.

[0023] Furthermore, the support plate and the box body are guided and matched along the up-down direction.

[0024] Furthermore, the box body is a rectangular parallelepiped structure, and the four side walls of the box body are respectively provided with the windows, and the edges around the supporting plate are respectively slidably matched with the inner walls of each window.

[0025] Furthermore, the limiting member is a limiting plate, which is installed at the loading port so as to be rotatable up and down through a hinge shaft, and a torsion spring is installed on the hinge shaft for being compressed and deformed when the limiting plate rotates downward so that the limiting plate can automatically reset upward.

[0026] Furthermore, a pair of baffles that can translate left and right or front and back are installed between the upper and lower inner walls of the window.

[0027] Furthermore, the elastic member is a compression spring arranged between the support plate and the bottom wall of the box body. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a structural diagram of a stacking table in the optoelectronic device testing equipment of the present invention; Figure 2 It is a structural diagram of a test bench in the optoelectronic device testing equipment of the present invention; Figure 3 This is a three-dimensional appearance diagram of a material box in the optoelectronic device testing equipment of the present invention; Figure 4 A three-dimensional cross-sectional view (one viewing angle) of a material box in the optoelectronic device testing equipment of the present invention; Figure 5 A three-dimensional cross-sectional view of a material box in the optoelectronic device testing equipment of the present invention (from another perspective); Figure 6 A diagram showing the process of loading a photoelectric device from a packaging box into a material box in the photoelectric device testing equipment of the present invention; Figure 7 This is a process diagram of taking out a photoelectric device from a material box and placing it in a packaging box in the photoelectric device testing equipment of the present invention.

[0029] In the figure: 1. stacking table; 2. packaging box; 3. robot; 4. material box; 4-1. box body; 4-1-1. window; 4-1-2. embedding groove; 4-2. top frame; 4-2-1. discharge port; 4-3. bottom plate; 4-4. support plate; 4-5. compression spring; 4-6. baffle; 4-7. limit plate; 5. test bench; 6. detection device; 7. photoelectric device. DETAILED DESCRIPTION

[0030] In view of the technical problems in the prior art, the basic concept of the present invention is to design a material box, which can accommodate multiple optoelectronic devices so that the optoelectronic devices can be stacked up and down, and the interfaces of the optoelectronic devices can be exposed for detection. At the same time, multiple optoelectronic devices can be firmly positioned in the material box, so that multiple optoelectronic devices can be detected simultaneously.

[0031] The features and performance of the present invention are further described in detail below in conjunction with the embodiments.

[0032] Embodiment 1 of the optoelectronic device testing device of the present invention: like Figure 1 and Figure 2 As shown, the optoelectronic device testing equipment includes a stacking table 1 and a test table 5, and a manipulator 3 is respectively provided on the stacking table 1 and the test table 5. The test table 5 is also provided with a detection device 6, a material box 4 and a packaging box 2. The material box 4 is used to store optoelectronic devices 7. The optoelectronic devices 7 can be photodetectors or electro-optical modulators. The detection device 6 is used to simultaneously detect each optoelectronic device 7 in the material box 4. After the detection is completed, the manipulator 3 takes out each optoelectronic device 7 in the material box 4 and puts it into the packaging box 2. Each optoelectronic device 7 in the material box 4 is stacked by the stacking table 1. The packaging box 2 and the material box 4 are placed on the stacking table 1. The manipulator 3 takes out the optoelectronic devices in the packaging box 2 and puts them into the material box 4.

[0033] The material box 4 includes a box body, such as Figure 3 , Figure 4 and Figure 5 As shown, the box body is a rectangular parallelepiped structure as a whole, including a box body 4-1, a top frame 4-2 and a bottom plate 4-3, that is, the box body in this embodiment is a split structure, wherein the bottom of the box body 4-1 is fixed on the bottom plate 4-3, and the top frame 4-2 is fixed on the top surface of the box body 4-1. The box body has a storage space for accommodating at least two photoelectric devices stacked up and down, which can realize batch storage of photoelectric devices, and the specific number depends on the specific size of the photoelectric devices and the storage space. The top of the box body has a loading port for loading the photoelectric devices into the storage space. Obviously, in this embodiment, the loading port is set on the top frame 4-2, and the loading port is the inner hole of the top frame 4-2, and the inner hole of the top frame 4-2 is connected to the inner hole of the box body 4-1. The side of the box body is provided with a window 4-1-1 for exposing the interface of each optoelectronic device for detection. The window 4-1-1 is provided on the box body 4-1, and the box body 4-1 is a rectangular parallelepiped structure that penetrates from top to bottom, and its inner hole is a rectangular hole, and the shape of the inner hole can adapt to the shape of the optoelectronic device. Windows 4-1-1 are provided on the four side walls of the box body 4-1, and the height of each window 4-1-1 is the same, and the width of the window 4-1-1 on the long side wall is greater than the width of the window 4-1-1 on the short side wall, so as to adapt to the interface arrangement form on the optoelectronic device.

[0034] A support plate 4-4 for supporting the optoelectronic device is provided in the accommodation space, and the support plate 4-4 can support multiple optoelectronic devices ( Figure 3~Figure 5The photoelectric device is not shown in the figure, but the state of the support plate 4-4 is a state of supporting the photoelectric device). An elastic member is provided between the support plate 4-4 and the box body for being deformed by force during the installation of the photoelectric device so as to apply a reaction force to the support plate 4-4 after the photoelectric device is installed. Specifically in the present embodiment, the elastic member is a compression spring 4-5 provided between the support plate 4-4 and the bottom wall of the box body (i.e., the top surface of the bottom plate 4-3). The support plate 4-4 is a rectangular plate as a whole. According to the shape of the support plate 4-4, four compression springs 4-5 are provided to provide sufficient and stable supporting force to the support plate 4-4.

[0035] The support plate 4-4 is guided and matched with the box body 4-1 in the up-down direction. When the photoelectric device is loaded, the photoelectric device presses down the support plate 4-4 or the photoelectric device on the support plate 4-4, so that the support plate 4-4 moves downward under the guidance of the box body 4-1. In this process, the compression spring 4-5 is compressed and deformed. Specifically, the four corners of the support plate 4-4 are respectively guided and slidably matched with the four corners of the inner hole of the box body 4-1. At the same time, the edges around the support plate 4-4 are respectively provided with an insertion portion extending into the corresponding window 4-1-1. The insertion portion is guided and slidably matched with the inner wall of the corresponding window 4-1-1. While guiding the support plate 4-4, the horizontal position of the support plate 4-4 can also be limited to prevent it from moving forward and backward and left and right.

[0036] A limiting member is movably installed at the loading entrance, that is, the limiting member is installed on the top frame 4-2, and the movable stroke of the limiting member includes a making way position for being pressed by the photoelectric device to allow the photoelectric device to pass through the loading entrance, and a stopping position for automatically resetting and stopping the photoelectric device after the photoelectric device passes through. In this way, while ensuring that the photoelectric device can be loaded smoothly, the stopping effect of the limiting member and the upward supporting effect of the support plate 4-4 can be used to clamp multiple photoelectric devices between the support plate 4-4 and the limiting member, thereby ensuring the stability of multiple photoelectric devices and facilitating detection.

[0037] Specifically in this embodiment, the limiting member is a limiting plate 4-7, which is installed at the loading port through a hinge shaft and can be rotated up and down, that is, installed on the inner wall of the top frame 4-2. A torsion spring is installed on the hinge shaft of the limiting plate 4-7, which is used to be compressed and deformed when the limiting plate 4-7 rotates downward so that the limiting plate 4-7 can automatically reset upward. Under the action of the torsion spring, the limiting plate 4-7 can swing downward, but cannot swing upward. In this way, the photoelectric device can enter the inner hole of the box body 4-1 through the top frame 4-2 by pressing the limiting plate 4-7 to make it swing downward. After the photoelectric device passes through, the limiting plate 4-7 is reset under the action of the torsion spring, and under the action of the compression spring 4-5, the limiting plate 4-7 blocks the photoelectric device at the top. It should be noted that the hinge shaft and the torsion spring are not shown in the figure. This method belongs to the prior art, and those skilled in the art know how to install it.

[0038] like Figure 3 As shown, a discharge port 4-2-1 connected to the loading port is provided on the side of the loading port, that is, a discharge port 4-2-1 is provided on a side wall of the top frame 4-2. The top frame 4-2 is a rectangular frame, and the discharge port 4-2-1 is provided on one of the short side walls. This arrangement also makes the loading port U-shaped, and at the same time forms an opening on the side of the top frame 4-2, which is the discharge port 4-2-1. Limiting plates 4-7 are respectively installed on the two parallel and opposite long side walls of the top frame 4-2, and there are two limiting plates 4-7 on each long side wall to provide sufficient stopping force to ensure the clamping effect of multiple optoelectronic devices. There is enough gap between the limiting plates 4-7 on both sides and the other short side wall for the manipulator that clamps the optoelectronic device to be inserted, so as to realize the action of the optoelectronic device pressing down the limiting plate 4-7.

[0039] At the same time, the depth of the discharge port 4-2-1 satisfies that the top photoelectric device is higher than the bottom wall of the discharge port 4-2-1, so that when taking out the photoelectric device, the top photoelectric device can be directly moved out of the box body from the discharge port 4-2-1 laterally, which is convenient to take out.

[0040] In addition, if Figure 3~Figure 5 As shown, a pair of movable baffles 4-6 are respectively installed between the upper and lower inner walls of each window 4-1-1. For example, the baffles 4-6 in the front and rear windows 4-1-1 can be translated left and right, and the baffles 4-6 in the left and right windows 4-1-1 can be translated front and back. In this way, for optoelectronic devices with different interface arrangement positions, when the optoelectronic devices are installed in the box body, the pair of baffles 4-6 in the window 4-1-1 can be moved so that the interval between the two baffles 4-6 corresponds to the interface on the optoelectronic device. In the process of plugging the detection device into the interface on the optoelectronic device, a reference can be provided for the detection device, and the detection device can also be guided to a certain extent. Therefore, the baffle 4-6 must be able to move and be fixed in a certain position. In this embodiment, embedded grooves 4-1-2 are respectively provided on the upper and lower inner walls of the window 4-1-1, and protrusions are respectively provided on the upper and lower ends of the baffle 4-6. The protrusions are clamped in the corresponding embedded grooves 4-1-2, which can provide a certain damping force. By applying force, the baffle 4-6 can slide along the embedded groove 4-1-2, and at the same time, the baffle 4-6 can be kept in a predetermined position after the force is unloaded.

[0041] The working principle of the optoelectronic device testing equipment in the present invention is as follows: First, take out the optoelectronic device 7 from the packaging box 2 on the stacking table 1. Figure 6 Then the manipulator 3 clamps the photoelectric device 7 and presses the limit plate on the material box 4, as shown in (a) of FIG. Figure 6 As shown in (b); the limit plate swings downward, so that the photoelectric device 7 can pass through, and the rear limit plate is reset under the action of the torsion spring, as shown in Figure 6Then the manipulator 3 is released. The thickness, weight and specification of the compression spring of the photoelectric device 7 in this embodiment make the support plate pressed down to a certain height after a photoelectric device 7 is placed, such as Figure 6 As shown in (d) in FIG. 1 , the robot 3 then grabs the next optoelectronic device, such as Figure 6 As shown in (e), after two or more optoelectronic devices are placed, the limiting plate is pressed against the top optoelectronic device to achieve clamping of multiple optoelectronic devices. In other embodiments, the thickness, weight and specifications of the compression spring of the optoelectronic device 7 meet the requirements that when one optoelectronic device is placed, the optoelectronic device can also be clamped between the support plate and the limiting plate.

[0042] The material box 4 with the stacked optoelectronic devices is placed on the test bench 5 for testing. After the testing is completed, the robot 3 takes out the optoelectronic devices one by one and puts them into the packaging box 2. Figure 7 As shown in (a) in FIG. 1 , the robot 3 first moves to the top of the material box 4; then it clamps the top optoelectronic device 7, as shown in FIG. Figure 7 Then the photoelectric device 7 is moved out of the box body directly from the discharge port laterally, as shown in (b) in FIG. Figure 7 Finally, the removed optoelectronic device 7 is placed back into the packaging box 2, as shown in (c) in FIG. Figure 7 As shown in (d) in the figure. It should be noted that if the last one or two remaining photoelectric devices cannot be in a position to cooperate with the stopper of the limit plate under the force of the compression spring, an additional tool can be used to reach into the material box and move the support plate upward so that the photoelectric device is at a height that can be clamped by the robot. In addition, the top photoelectric device can also be replaced by a pressure plate of a certain thickness to prevent the interface of the top photoelectric device from being blocked by the top frame and unable to be detected. Of course, the window height can also be expanded to ensure that the interfaces of all photoelectric devices are exposed, so as to achieve simultaneous detection of each photoelectric device in the material box.

[0043] By using the material box of the present invention, the detection device can detect multiple optoelectronic devices at the same time, and multiple optoelectronic devices can be plugged in and out at the same time, and the simultaneous movement of multiple optoelectronic devices can be achieved by moving the material box, without the need for the staff to mechanically repeat the picking and unplugging work many times, and the operation is simple. At the same time, the optoelectronic devices are neatly stacked and plugged in uniformly during the test, and there will be no problem of mutual collision. After the test is completed, the multiple optoelectronic devices are in the same material box, avoiding the problem of confusion caused by picking up and placing one by one, and the overall test efficiency can be improved. In addition, a manipulator is used to automatically stack the optoelectronic devices, and the manipulator automatically takes them out and puts them back into the packaging box after the test is completed. The degree of automation is high, which greatly improves the test efficiency.

[0044] In other embodiments of the optoelectronic device testing equipment: the limit member can also be replaced by a limit block by a limit plate, the limit block is horizontally movably installed on the top of the box body, and the limit block is provided with an inclined surface for pressing with the optoelectronic device. When the optoelectronic device presses against the inclined surface, a component force for horizontal movement of the limit block can be generated, thereby making the limit block move away from the loading entrance. Of course, in order to facilitate the resetting of the limit block, a tension spring or a compression spring needs to be installed between the limit block and the box body. After the limit block is reset to the stop position, its bottom surface can cooperate with the top optoelectronic device to stop.

[0045] In other embodiments of the optoelectronic device testing equipment: the box body can be composed of a box body and a bottom plate, and the top frame is omitted. In this case, the limit member is directly installed on the top of the box body; of course, in other embodiments, the box body may not be a split type, for example, it can be integrally injection molded.

[0046] In other embodiments of the optoelectronic device testing equipment: the elastic member may also be a tension spring connected between the top of the box body and the edge of the supporting plate.

[0047] In other embodiments of the optoelectronic device testing equipment: a blocking sheet may no longer be installed between the upper and lower inner walls of the window.

[0048] In other embodiments of the optoelectronic device testing device: the support plate may only have four corners that are in guiding and sliding cooperation with the four corners of the inner hole of the box body, and the support plate no longer has an insertion portion that extends into the window, that is, the edges around the support plate no longer have guiding and sliding cooperation with the inner wall of the window. Of course, in other embodiments, the support plate may only rely on the insertion portion to guide and slide with the inner wall of the window, and the four corners of the support plate no longer have guiding and sliding cooperation with the four corners of the inner hole of the box body.

[0049] In other embodiments of the optoelectronic device testing equipment: the support plate may no longer cooperate with the guide of the box body, but utilize the connection relationship between the tension spring or compression spring and the support plate so that when the support plate is pressed, there is basically no horizontal movement.

[0050] In other embodiments of the optoelectronic device testing equipment: the limiting member may be installed only on one side wall of the loading port.

[0051] In other embodiments of the optoelectronic device testing equipment: two discharge ports can be provided, the two discharge ports are arranged opposite to each other, and any discharge port can be used for discharge. In this case, the top structure of the box body is two parallel side walls, and the space between the two side walls forms a loading port.

[0052] In other embodiments of the optoelectronic device testing equipment: a discharge port may no longer be provided. When the optoelectronic device needs to be taken out, other tools may be used to press down the limit plate, or the limit block may be pulled out of the loading port. In short, the limit member may be moved to the clear position by other manual means. At this time, the optoelectronic device may be taken out from the loading port from bottom to top.

[0053] In other embodiments of the optoelectronic device testing equipment: the process of loading and unloading optoelectronic devices into and out of the material box can also be operated purely manually, without relying on a robot.

[0054] Embodiment of the material box for testing optoelectronic devices in the present invention: The specific structure of the material box for testing optoelectronic devices is the same as the material box in any embodiment of the optoelectronic device testing equipment described above, and will not be repeated here.

[0055] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. The patent protection scope of the present invention shall be based on the claims. All equivalent structural changes made using the contents of the description and drawings of the present invention should also be included in the protection scope of the present invention.

Claims

1. A material box for testing optoelectronic devices, characterized in that: The invention comprises a box body, wherein the box body has a storage space for accommodating at least two photoelectric devices stacked up and down, the top of the box body has a loading port for loading the photoelectric devices into the loading space, the side of the box body is provided with a window for exposing the interface of each photoelectric device, a support plate for supporting the photoelectric device is provided in the storage space, an elastic member for being deformed by force during the loading process of the photoelectric device so as to apply a reaction force to the support plate after the photoelectric device is loaded is provided between the support plate and the box body, a limiting member is movably installed at the loading port, and the movable travel of the limiting member includes a making way position for making way due to the top pressure of the photoelectric device so that the photoelectric device can pass through the loading port, and a stopping position for automatically resetting and stopping the photoelectric device after the photoelectric device passes through.

2. The photoelectric device testing kit according to claim 1, characterized in that: A discharge port connected to the loading port is arranged on the side of the loading port, and the depth of the discharge port satisfies that the top photoelectric device is higher than the bottom wall of the discharge port, so that the top photoelectric device can be directly moved out of the box body from the discharge port laterally.

3. The photoelectric device testing kit according to claim 2, characterized in that: The loading port is U-shaped, and the side opening of the loading port forms a discharge port. The limiting members are respectively installed on two opposite side walls of the loading port.

4. The photoelectric device testing kit according to claim 1, characterized in that: The loading port comprises two parallel and opposite side walls and the limiting members are respectively installed on the two side walls.

5. The photoelectric device testing kit according to any one of claims 1 to 4, characterized in that: The support plate and the box body are guided and matched along the up-down direction.

6. The photoelectric device testing kit according to claim 5, characterized in that: The box body is a rectangular parallelepiped structure. The four side walls of the box body are respectively provided with the windows. The edges around the supporting plate are respectively guided and slidably matched with the inner walls of the windows.

7. The photoelectric device testing kit according to any one of claims 1 to 4, characterized in that: The limiting member is a limiting plate, which is installed at the loading port through a hinge shaft and can rotate up and down. The hinge shaft is equipped with a torsion spring for being compressed and deformed when the limiting plate rotates downward so that the limiting plate can automatically reset upward.

8. The photoelectric device testing kit according to any one of claims 1 to 4, characterized in that: A pair of baffles which can be translated leftwards or rightwards or backwards are installed between the upper and lower inner walls of the window.

9. The photoelectric device testing kit according to any one of claims 1 to 4, characterized in that: The elastic member is a compression spring arranged between the supporting plate and the bottom wall of the box body.

10. Photoelectric device testing equipment, including a detection device, characterized in that: It also includes a photoelectric device testing kit as described in any one of claims 1 to 9.

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