HJT battery assembly preparation optimization method based on reliability test

Abstract

The invention provides an HJT battery assembly preparation optimization method based on a reliability test, and the method comprises the steps: optimizing an amorphous silicon film in a CVD technology through a glow breaking technology, carrying out the moist heat test and CTM test of an HJT battery assembly under different CVD radio frequency times, and taking the maximization of the radio frequency time as a target, determining the prolonged CVD radio frequency time according to the test result; multiple types of reliability tests are carried out on the battery assembly of which the TCO is prepared by adopting different PVD technologies, and the adopted target PVD technology is determined; the photoelectric conversion efficiency of the multiple batches of HJT batteries after warehousing and standing is detected again, and the multiple batches of HJT batteries are graded again; and carrying out humidity and heat test, CTM test and UV tolerance test on the HJT battery assembly adopting different packaging adhesive films, and selecting the structure and the type of the packaging adhesive film. According to the method, a multi-stage preparation process is optimized on the basis of various reliability tests, so that the module of which the multi-aspect reliability meets the requirements can be prepared, and the reliability of the prepared HJT battery module is improved.

Description

Technical Field

[0001] The present application relates to the technical field of photovoltaic module preparation, and in particular to an optimization method for preparing HJT battery modules based on reliability testing. Background Art

[0002] At present, the research and development of intrinsic thin-film heterojunction cells (Heterojunction Technology, referred to as HJT) is mainly concentrated on the solar cell end. The research and development of the module end, especially the research and development of the module reliability, is not given enough attention. In the related technology, the preparation of the components of heterojunction solar cells usually continues the manufacturing process of conventional PERC high-temperature cells.

[0003] However, in practical applications, the component preparation methods in the above-mentioned related technologies will bring about low reliability problems in various aspects, such as failure in wet heat test, etc. Therefore, how to optimize the preparation process of HJT battery components to prepare high-reliability heterojunction battery components has become a problem that needs to be solved urgently. Summary of the invention

[0004] The present application aims to solve one of the technical problems in the related art at least to some extent.

[0005] To this end, the first purpose of the present application is to propose an optimization method for the preparation of HJT battery components based on reliability testing. This method optimizes the preparation process in multiple stages based on multiple reliability tests, and is capable of preparing components that meet the requirements of reliability in multiple aspects, thereby improving the reliability of the prepared HJT battery components.

[0006] The second objective of this application is to propose an optimized system for HJT battery assembly preparation based on reliability testing.

[0007] A third object of the present application is to provide a non-transitory computer-readable storage medium.

[0008] To achieve the above objectives, the first aspect of the present application is to propose an optimization method for preparing HJT battery components based on reliability testing, the method comprising the following steps:

[0009] In the process of preparing amorphous silicon passivation layer by chemical vapor deposition (CVD), the amorphous silicon film deposited is optimized by the flash-off process, and the HJT battery components prepared based on the optimized amorphous silicon film under different CVD radio frequency times are subjected to wet heat test and component packaging efficiency loss CTM test. With the goal of maximizing the radio frequency time, the extended CVD radio frequency time is determined based on the test results;

[0010] Conduct various types of reliability tests on battery components that use different physical vapor deposition (PVD) technologies to prepare transparent conductive thin films (TCO), and determine the target PVD technology to be used based on the test results;

[0011] Re-testing the photoelectric conversion efficiency of multiple batches of HJT batteries after storage and rest, re-classifying the multiple batches of HJT batteries according to the updated photoelectric conversion efficiency, and selecting multiple HJT batteries located in the same class after re-classification to prepare battery assemblies;

[0012] The damp heat test, the CTM test and the UV tolerance test are performed on HJT battery components using different packaging films, and the structure and type of the packaging film are selected according to the test results.

[0013] Optionally, in one embodiment of the present application, the optimization of the plated amorphous silicon thin film by the pyrolysis process includes: detecting multiple performance parameters of two types of HJT cells prepared under baseline conditions and under the pyrolysis process, respectively; comparing the difference in multiple performance parameters of the two types of HJT cells, adjusting the process parameters of the pyrolysis process by determining whether the difference is within a preset range, and performing the pyrolysis process according to the determined process parameters to optimize the quality of the amorphous silicon thin film.

[0014] Optionally, in one embodiment of the present application, the wet heat test and the component packaging efficiency loss CTM test are performed on the HJT battery assembly prepared based on the optimized amorphous silicon thin film under different CVD RF times, including: performing a wet heat test on multiple HJT batteries prepared under different CVD RF times in a high temperature and high humidity environment, and after the wet heat test duration exceeds a preset duration, detecting the wet heat attenuation parameters of the multiple HJT batteries; performing the wet heat test and the CTM test on multiple HJT battery assemblies prepared under different CVD RF times, and detecting the CTM values ​​and wet heat attenuation parameters of the multiple HJT battery assemblies; and determining the extended CVD RF time in combination with the wet heat attenuation parameters of the multiple HJT batteries and the CTM values ​​of the multiple HJT battery assemblies.

[0015] Optionally, in one embodiment of the present application, the battery components that use different physical vapor deposition (PVD) technologies to prepare transparent conductive thin film TCO are subjected to various types of reliability tests, and the target PVD technology to be adopted is determined based on the test results, including: performing the wet heat test and the CTM test on the HJT battery components prepared by different PVD equipment, and determining the selected target PVD equipment based on the test results; performing various types of reliability tests on the HJT battery components prepared by the target PVD equipment, taking the tests whose test results do not meet the standards as target tests, and performing the target tests with multiple times the test standards, and optimizing the preparation process of the target PVD equipment based on the test results of the target test.

[0016] Optionally, in one embodiment of the present application, before the multiple batches of HJT batteries are re-classified according to the updated photoelectric conversion efficiency, it also includes: performing hot spot tests and power loss tests on the degraded components and normal components composed of HJT batteries with different efficiency levels at different time points; calculating the power loss deviation of the degraded components and the normal components, and determining the maximum standing time of the prepared HJT batteries based on the hot spot test results and the power loss deviation.

[0017] Optionally, in one embodiment of the present application, the selecting the structure and type of the encapsulation film according to the test results includes: determining the laminated structure adopted by the encapsulation film according to the test results of the damp heat test; performing the ultraviolet UV tolerance test on the HJT battery components using different encapsulation films at different total irradiances, and determining the type of encapsulation film to be selected according to the test results.

[0018] To achieve the above objectives, the second aspect of the present application also proposes an optimization system for HJT battery assembly preparation based on reliability testing, comprising the following modules:

[0019] The extension module is used to optimize the plated amorphous silicon film through the pyrolysis process in the process of preparing the amorphous silicon passivation layer by chemical vapor deposition (CVD), and to perform wet heat test and component packaging efficiency loss CTM test on HJT battery components prepared based on the optimized amorphous silicon film under different CVD radio frequency times, and to determine the extended CVD radio frequency time based on the test results with the goal of maximizing the radio frequency time;

[0020] A determination module is used to perform various types of reliability tests on battery components using different physical vapor deposition (PVD) technologies to prepare transparent conductive thin film TCO, and determine the target PVD technology to be used based on the test results;

[0021] A binning module is used to re-detect the photoelectric conversion efficiency of multiple batches of HJT batteries after storage and rest, re-bin the multiple batches of HJT batteries according to the updated photoelectric conversion efficiency, and select multiple HJT batteries located in the same bin after re-binning to prepare battery assemblies;

[0022] A selection module is used to perform the damp heat test, the CTM test and the UV tolerance test on HJT battery components using different packaging films, and select the structure and type of the packaging film according to the test results.

[0023] In order to implement the above-mentioned embodiments, the third aspect embodiment of the present application also proposes a non-temporary computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the optimization method for preparing HJT battery components based on reliability testing in the above-mentioned first aspect is implemented.

[0024] The technical solution provided by the embodiment of the present application brings at least the following beneficial effects: the present application first optimizes the amorphous silicon thin film through the quenching process in the CVD process, performs wet heat test and CTM test on the HJT battery components under different CVD radio frequency time, and determines the extended CVD radio frequency time according to the test results with the goal of maximizing the radio frequency time; then performs various types of reliability tests on the battery components using different PVD technologies to prepare TCO, and determines the target PVD technology to be used; then re-detects the photoelectric conversion efficiency of multiple batches of HJT batteries after storage and static, and re-classifies multiple batches of HJT batteries; finally, performs wet heat test, CTM test and UV tolerance test on the HJT battery components using different packaging films, and selects the structure and type of the packaging film. Therefore, the present application optimizes the corresponding preparation process at each stage of preparing the battery component based on various types of reliability tests such as wet heat test and CTM test, so as to prepare the components according to the optimized process, and can prepare HJT battery components that meet the requirements of reliability in many aspects, thereby improving the reliability of the prepared HJT battery components. Therefore, the present application can obtain efficient and stable HJT component products, which can ensure that after the product is made into components, it can obtain high power generation and ensure long-term stable power generation.

[0025] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] The above and / or additional aspects and advantages of the present application will become apparent and easily understood from the following description of the embodiments in conjunction with the accompanying drawings, in which:

[0027] Figure 1 A flow chart of an optimization method for preparing a HJT battery assembly based on reliability testing proposed in an embodiment of the present application;

[0028] Figure 2 A flowchart of a method for determining an extended CVD radio frequency time based on reliability testing proposed in an embodiment of the present application;

[0029] Figure 3 A schematic diagram of the influence of different RF times on the CTM of a component proposed in an embodiment of the present application;

[0030] Figure 4A schematic diagram of the structure of an optimized system for preparing HJT battery components based on reliability testing proposed in an embodiment of the present application. DETAILED DESCRIPTION

[0031] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present invention, and should not be construed as limiting the present invention.

[0032] The following describes an optimization method and system for preparing HJT battery components based on reliability testing proposed in an embodiment of the present invention with reference to the accompanying drawings.

[0033] Figure 1 A flowchart of an optimization method for preparing a HJT battery assembly based on reliability testing proposed in an embodiment of the present application is shown in FIG. Figure 1 As shown, the method comprises the following steps:

[0034] Step S101, in the process of preparing an amorphous silicon passivation layer by chemical vapor deposition (CVD), the plated amorphous silicon film is optimized by a quenching process, and a wet heat test and a component packaging efficiency loss CTM test are performed on the HJT battery component prepared based on the optimized amorphous silicon film under different CVD radio frequency times. With the goal of maximizing the radio frequency time, the extended CVD radio frequency time is determined based on the test results.

[0035] Specifically, this step analyzes the impact of the amorphous silicon passivation layer preparation process on the reliability of the component. It should be noted that, since the HJT solar cell uses CVD to prepare the amorphous silicon passivation layer, the deposited amorphous silicon film is relatively loose, reaching a certain thickness, the film naturally falls off and adheres to the surface of the silicon wafer under stress, and powder will fall off in the chamber. The subsequent growth of the TCO film will not be able to completely cover the particle dust attached to the silicon wafer, providing a diffusion channel for water vapor and air. During the long-term use of the battery, water vapor will diffuse into the amorphous silicon layer, affecting the conversion efficiency and output power of the battery and the component. Therefore, it is necessary to deposit high-quality, high-density films to reduce powder loss. Due to the serious powder loss of amorphous silicon, especially the p-side i layer thickness is larger, the film in the chamber is thicker, resulting in a shorter cleaning cycle. The reference RF time in the conventional process is about 20000s to 23000s and the chamber needs to be washed. To this end, this application analyzes the impact of different RF times in the CVD process on the reliability of batteries and components, and ensures the reliability of components on the premise of improving the battery conversion efficiency and the operating time (uptime) of the CVD equipment.

[0036] Among them, in the process of depositing intrinsic amorphous silicon by CVD process, this application adopts the intermittent glow process, that is, the coating process of turning off the glow power supply, to improve the quality of the film, thereby alleviating the powder loss phenomenon and extending the RF use cycle of the CVD equipment. When determining the extended RF time specifically, the HJT battery components prepared by the amorphous silicon film optimized by the intermittent glow process under different CVD RF times are subjected to various reliability tests such as wet heat test and component packaging efficiency loss (Cell To Module, referred to as CTM) test. Then, based on the test results, the maximum RF time allowed to meet the reliability of the component is determined.

[0037] In one embodiment of the present application, the coated amorphous silicon film is optimized by the pyrolysis process, including: detecting multiple performance parameters of two types of HJT cells prepared under baseline conditions and under the pyrolysis process, respectively; comparing the differences in multiple performance parameters of the two types of HJT cells, adjusting the process parameters of the pyrolysis process by determining whether the difference is within a preset range, and performing the pyrolysis process according to the determined process parameters to optimize the quality of the amorphous silicon film.

[0038] Specifically, in this embodiment, it is necessary to first analyze the effect of the amorphous silicon passivation layer quenching process on the battery performance, and determine that the quenching process added in this step has basically no effect on the battery conversion efficiency, so as to ensure the photoelectric conversion efficiency of the battery. In specific implementation, analyze multiple electrical performance parameters of the HJT battery prepared according to the method of this step and the benchmark method in the relevant technology, and determine whether the quenching process has an impact on the battery performance by comparison. The test results are shown in the following Table 1

[0039] Table 1 The influence of CVD quenching process on battery performance parameters

[0040]

[0041] It can be seen from Table 1 that the quenching process has little effect on the battery conversion efficiency (Eta), so the optimization method of the present application can be implemented.

[0042] Furthermore, after preparing HJT cells using amorphous silicon thin films deposited using a CVD calorimetry process, the effect of the RF time of the equipment under the CVD process on the cell reliability was analyzed.

[0043] In order to more clearly describe the specific implementation process of determining the extended CVD radio frequency time in the present application, an optimization method proposed in an embodiment of the present application is exemplified below. Figure 2 A flowchart of a method for determining the extended CVD RF time based on reliability testing proposed in an embodiment of the present application, such as Figure 2 As shown, the method comprises the following steps:

[0044] In step S201, a plurality of HJT batteries prepared under different CVD radio frequency times are subjected to a damp heat test in a high temperature and high humidity environment. After the damp heat test duration exceeds a preset duration, the damp heat attenuation parameters of the plurality of HJT batteries are detected.

[0045] For example, two groups of bare cells prepared under different RF times were tested in an environmental test chamber at 85℃RH85%. According to the test results, the bare cells under different RF times have significant differences in reliability performance under high temperature and high humidity environments. After the DH time exceeds 48h, the difference in DH reliability of the cells under different RF times begins to appear. The attenuation of the battery prepared under long RF time is greater. After the DH time exceeds 90h, the DH attenuation of the battery cell under longer RF time has exceeded 5% (i.e., the DH attenuation parameter), indicating that the battery with longer RF time and at the end of the cavity washing period does cause water vapor to diffuse into the battery due to the presence of dust.

[0046] Step S202, performing a damp heat test and a CTM test on a plurality of HJT battery assemblies prepared under different CVD radio frequency times, and detecting the CTM values ​​and damp heat attenuation parameters of the plurality of HJT battery assemblies.

[0047] For example, the battery was prepared as a component, and two groups of HJT battery double-glass components prepared under different RF times were selected, among which the first group was in the middle stage of the cavity cleaning, the RF time was 10000S, and the number of components produced was 20; the second group was in the end of the cavity cleaning, the RF time was 20000S, and the number of components was 4. Then the CTM value and damp heat test of the two groups of components were tested and analyzed. Figure 3 The influence of different RF time on the CTM of the module is given. It can be found that the CTM of the module in the middle of the cleaning chamber is 98.88%, while the CTM of the module in the end of the cleaning chamber is 98.60%. There is a certain difference between the two, and with the increase of RF time and the increase of dust, the CTM value of the module decreases slightly, and the difference between the modules also increases.

[0048] Furthermore, in this embodiment, the DH1000 reliability of components prepared at different RF times is compared and analyzed. It can be found that the reliability changes of the two groups of components are not obvious, and there is no clear pattern, indicating that the double-glass component packaging effectively prevents the diffusion of water vapor into the interior of the battery.

[0049] Step S203, determining the extended CVD RF time in combination with the wet heat attenuation parameters of the multiple HJT batteries and the CTM values ​​of the multiple HJT battery assemblies.

[0050] Specifically, the CVD RF time that can meet the component reliability requirements is determined by combining the wet heat attenuation parameters of multiple batteries obtained in the above steps (i.e., the wet heat attenuation ratios of batteries prepared at different RF times) and the CTM values ​​of multiple HJT battery assemblies (i.e., the CTM values ​​of battery assemblies prepared at different RF times). For example, among the test results of multiple groups of CVD RF times obtained in the above steps, the RF time with the longest duration and wet heat attenuation parameters and CTM values ​​that meet the requirements is selected, and this RF time is used as the final extended CVD RF time

[0051] For example, in one example, the test and comparison were performed in the above manner, and the chamber cleaning time of the CVD equipment that met the above reliability test requirements was increased to 26,000 seconds.

[0052] Step S102 , performing various types of reliability tests on battery components using different physical vapor deposition (PVD) technologies to prepare transparent conductive thin films TCO, and determining a target PVD technology to be used based on the test results.

[0053] Specifically, this step analyzes the impact of PVD deposition technology on component reliability. First, a transparent conductive thin film TCO is prepared according to the existing PVD technology, and HJT cells are prepared using the obtained different TCO films. Then, various types of reliability tests are performed on different HJT cells, and the selected PVD technology is determined based on the test results.

[0054] In one embodiment of the application, various types of reliability tests are performed on battery components that use different physical vapor deposition (PVD) technologies to prepare transparent conductive thin films TCO, and the target PVD technology to be used is determined based on the test results, including: performing wet heat tests and CTM tests on HJT battery components prepared using different PVD equipment, and determining the target PVD equipment to be selected based on the test results; and then performing various types of reliability tests on HJT battery components prepared using the target PVD equipment, using tests whose test results do not meet the standards as target tests, and performing target tests with multiple test standards, and optimizing the preparation process of the target PVD equipment based on the test results of the target tests.

[0055] For example, first control the two groups of PVD equipment to be selected, and use different PVD technologies to prepare laminated TCO films. The target materials used in each device are consistent. Then analyze the impact of different PVD equipment on battery performance, mainly analyzing battery efficiency, FF value and Isc value. Then, for the batteries prepared by different PVD equipment, half-piece double-glass modules were made, and the CTM values ​​of the two groups of modules were tested to determine that there was basically no difference between the two. The DH1000 reliability of the two groups of modules was further tested and analyzed, and the PVD equipment corresponding to the battery module with better DH1000 reliability performance, that is, the DH attenuation ratio was selected as the target PVD equipment.

[0056] Furthermore, in order to further improve the performance of the components and obtain high-stability components, six reliability tests were continued on the components prepared by the selected target PVD equipment, including: hot and cold cycle TC test, the above-mentioned DH1000 test, reverse + hot spot test, UV resistance UV15 test, HF10 test and PID192 test. Assume that only the attenuation result of DH1000 in the test results is greater than 2%, and all others are less than 2%, meeting the relevant control standards. In order to further study the maximum attenuation items of wet heat DH and hot and cold cycle TC, this embodiment has been tightened by increasing the DH test time from the IEC standard 1000h to 3000h, and the number of TC cycles from 200 cycles to 600 cycles, and performing 3 times the IEC standard test. According to the test results, the impact of hot and cold cycles on component performance is basically stable after 400 cycles, but for the wet and hot DH test, the component power attenuation has not been saturated, which needs further improvement.

[0057] Furthermore, in view of the test result that the power attenuation in the wet heat DH test did not show saturation, the preparation process of the target PVD equipment was adjusted accordingly, for example, the selected target material was adjusted.

[0058] Step S103, re-testing the photoelectric conversion efficiency of the multiple batches of HJT batteries after storage and standing, re-classifying the multiple batches of HJT batteries according to the updated photoelectric conversion efficiency, and selecting multiple HJT batteries located at the same level after re-classification to prepare battery assemblies.

[0059] Specifically, this step analyzes the impact of the dark state attenuation phenomenon of HJT batteries on the CTM value and reliability of the components. Since HJT batteries have a certain dark decay phenomenon, that is, after the battery is prepared, packaged and put into storage, the battery efficiency decays to a certain extent as time goes by. For example, the efficiency decay statistics of batteries with different efficiency levels after 2 months of storage show that the efficiency decay basically increases with the increase in efficiency, and the average decay is 0.15% in 2 months. Due to the efficiency decay, the efficiency distribution of batteries in the same level is too large, and the electroluminescence EL detection of the components shows uneven light and dark in the obtained image. When solar cells with different conversion efficiencies are located in the same component, the CTM value of the component is affected due to the mismatch of electrical properties, and the reliability of the component is at risk.

[0060] To this end, this embodiment re-classifies and tests the multiple batches of cells placed. By analyzing the range comparison of the conversion efficiency of the solar cells at the same level before and after the test, it can be found that the dark decay of the cells causes the efficiency fluctuation at the same level to be significantly amplified, and the maximum range difference at the same level is large, which brings about the problem of light and dark patches, and also affects the CTM value of the component.

[0061] For example, through a specific experimental test, the changes in the CTM value of the components before and after the re-testing were found. Before the battery was retested, 26,429 components were produced, with an average group CTM value of 98.24%. After the battery was retested, 24,472 components were produced, with an average component CTM value of 98.74%, and the component CTM value increased by 0.5%. At the same time, the trend of CTM decreasing with the battery efficiency was alleviated after the retest. Before and after the retest, the EL light and dark degradation ratio of the component improved significantly. Before the retest, the comprehensive light and dark degradation ratio of the component was 1.54%, and the degradation ratio was reduced to 0.53% after the test. Therefore, through the above experiments, it can be seen that the present application re-classifies multiple batches of HJT batteries, and selects multiple HJT batteries located in the same gear after re-classification to prepare battery components, which can effectively improve the CTM value of the component.

[0062] In one embodiment of the present application, before re-classifying multiple batches of HJT batteries according to the updated photoelectric conversion efficiency, it also includes: performing hot spot tests and power loss tests on the degraded components and normal components composed of HJT batteries with different efficiency levels at different time points; calculating the power loss deviation of the degraded components and normal components, and determining the maximum standing time of the prepared HJT batteries based on the hot spot test results and the power loss deviation.

[0063] Specifically, in this embodiment, the reliability test was conducted on the components with brightness degradation, mainly for the hot spot problem during the use of the components that may be caused by the brightness and darkness phenomenon in the EL image. No obvious difference was found in the EL image of the components before and after the hot spot test. Combining the hot spot test results of the brightness degradation components and conventional components, it can be obtained that the hot spot tests of the brightness degradation components and normal components are both qualified, but after the hot spot, the power loss of the brightness degradation components is greater than that of the normal components. Therefore, for the subsequent use of the brightness degradation components, there may be a risk of excessive power attenuation. Therefore, for silicon heterojunction components, it is necessary to complete the component production as soon as possible after the battery preparation is completed to reduce the risk of brightness and darkness patches in the components.

[0064] Furthermore, in this embodiment, hot spot tests and power loss tests are performed on two groups of components at different time points in the above manner, and the power loss deviation of the light-dark degradation components and the normal components is calculated. The maximum standing time of the prepared HJT battery is determined based on the hot spot test results and the power loss deviation. For example, the test time point at which the yellow hot spot test is qualified but the power loss deviation reaches the maximum allowable deviation threshold is used as the maximum standing time of the prepared HJT battery. It is necessary to ensure that the components are prepared between the maximum standing times in the future to reduce the light-dark degradation phenomenon.

[0065] Step S104, performing the damp heat test, CTM test and UV tolerance test on the HJT battery components using different packaging films, and selecting the structure and type of the packaging film according to the test results.

[0066] Specifically, this step analyzes the impact of different encapsulation films on the CTM value and reliability of the module. In order to further improve the electrical performance and reliability of the module, the impact of different encapsulation films on the CTM of the module is tested and analyzed.

[0067] In one embodiment of the present application, the structure and type of the encapsulation film are selected based on the test results, including: determining the laminated structure used by the encapsulation film based on the test results of the damp heat test; performing ultraviolet UV tolerance tests on HJT battery modules using different encapsulation films at different total irradiances, and determining the type of encapsulation film to be selected based on the test results.

[0068] For example, three groups of different types of packaging films were used to make half-cell double-glass modules, with two modules made in each group. By analyzing the electrical properties of each module, it was found that the CTM values ​​of modules made with different packaging films remained basically unchanged, with a difference of 0.1%.

[0069] Furthermore, in order to verify the influence of different encapsulation films on the reliability of components, this embodiment also performs DH1000 reliability tests on components with different encapsulation films. According to the test results, the EPE film with the most attenuation is the one with the EVA / POE / EVA laminated structure, which has both the good adhesion of EVA and the good water barrier of POE, so the reliability of the components prepared by it is the best. Furthermore, this embodiment can use an encapsulation film with the EVA / POE / EVA laminated structure.

[0070] Furthermore, the ultraviolet reliability of HJT components is studied. In this embodiment, the ultraviolet (UV) tolerance of HJT components is tested and analyzed. It is assumed that the UV band of the UV test is 280nm-400nm, of which the UVB band irradiance of 280nm-320nm accounts for 3%-10%, and the light uniformity is ±15%. During the experiment, the temperature is 60±5℃, and the total irradiance is tested at 15, 30, 45 and 60kwh / m2 for component power. According to the test results, the reliability test results of the components made of the two packaging films used in this embodiment, namely the UV cutoff and high-transmittance films, for the UV cutoff film, after UV60, the component power attenuation is 1.73%, and for the high-transmittance film, the UV60 component power attenuation reaches 3.07%. Although the component UV test results of the two packaging films are qualified, the component prepared by the UV cutoff film has better reliability. At the same time, from the perspective of various parameters, UV mainly affects the filling factor of the component. By comparing the transmittance of different types of packaging films and the EQE of HJT cells, it can be found that UV cut-off films can filter ultraviolet light below 380nm, thereby protecting the amorphous silicon passivation layer of HJT solar cells.

[0071] Therefore, through this embodiment, it can be determined that the UV cut-off film with EVA / POE / EVA laminated structure is used as the packaging film to carry out the packaging process of the HJT battery assembly.

[0072] In summary, the optimization method for preparing HJT battery components based on reliability testing in the embodiment of the present application first optimizes the amorphous silicon film through the extinguishing process in the CVD process, performs wet heat test and CTM test on HJT battery components under different CVD radio frequency times, and maximizes the radio frequency time as the goal, and determines the extended CVD radio frequency time according to the test results; then, various types of reliability tests are performed on battery components using different PVD technologies to prepare TCO, and the target PVD technology used is determined; then, the photoelectric conversion efficiency of multiple batches of HJT batteries after storage and standing is re-tested, and multiple batches of HJT batteries are re-classified; finally, the HJT battery components using different packaging films are subjected to wet heat test, CTM test and UV tolerance test, and the structure and type of the packaging film are selected. Thus, the method is based on various types of reliability tests such as wet heat test and CTM test, optimizes the corresponding preparation process at each stage of preparing the battery component, and prepares the component according to the optimized process, and can prepare HJT battery components that meet the requirements of reliability in many aspects, thereby improving the reliability of the prepared HJT battery components. Therefore, this method can obtain efficient and stable HJT component products, which can ensure that after the products are made into components, they can obtain high power generation and ensure long-term stable power generation.

[0073] In order to implement the above embodiment, the present application also proposes an optimization system for preparing HJT battery components based on reliability testing. The figure is a structural schematic diagram of an optimization system for preparing HJT battery components based on reliability testing proposed in an embodiment of the present application. As shown in the figure, the system includes:

[0074] The extension module 100 is used to optimize the plated amorphous silicon film through the intermittent process in the process of preparing an amorphous silicon passivation layer by chemical vapor deposition (CVD), and to perform a wet heat test and a component packaging efficiency loss CTM test on the HJT battery component prepared based on the optimized amorphous silicon film under different CVD radio frequency times, and to maximize the radio frequency time, and determine the extended CVD radio frequency time according to the test results.

[0075] The determination module 200 is used to perform various types of reliability tests on battery components using different physical vapor deposition (PVD) technologies to prepare transparent conductive thin films TCO, and determine the target PVD technology to be used according to the test results.

[0076] The binning module 300 is used to re-test the photoelectric conversion efficiency of multiple batches of HJT batteries after they have been put into storage and left to stand, re-bin the multiple batches of HJT batteries according to the updated photoelectric conversion efficiency, and select multiple HJT batteries located at the same bin after re-binning to prepare battery assemblies.

[0077] The selection module 400 is used to perform a damp heat test, a CTM test and an ultraviolet UV tolerance test on HJT battery components using different packaging films, and select the structure and type of the packaging film according to the test results.

[0078] Optionally, in one embodiment of the present application, the extension module 100 is specifically used to: detect multiple performance parameters of two types of HJT batteries prepared under baseline conditions and under the pyrolysis process, respectively; compare the differences in multiple performance parameters of the two types of HJT batteries, adjust the process parameters of the pyrolysis process by determining whether the difference is within a preset range, and perform the pyrolysis process according to the determined process parameters to optimize the quality of the amorphous silicon thin film.

[0079] Optionally, in one embodiment of the present application, the extension module 100 is specifically used to: perform a wet heat test on multiple HJT batteries prepared under different CVD RF times in a high temperature and high humidity environment, and after the wet heat test duration exceeds a preset duration, detect the wet heat attenuation parameters of the multiple HJT batteries; perform the wet heat test and CTM test on multiple HJT battery assemblies prepared under different CVD RF times, and detect the CTM values ​​and wet heat attenuation parameters of the multiple HJT battery assemblies; determine the extended CVD RF time in combination with the wet heat attenuation parameters of the multiple HJT batteries and the CTM values ​​of the multiple HJT battery assemblies.

[0080] Optionally, in one embodiment of the present application, the determination module 200 is specifically used to: perform wet heat tests and CTM tests on HJT battery components prepared by different PVD equipment, and determine the target PVD equipment to be selected based on the test results; perform various types of reliability tests on HJT battery components prepared by the target PVD equipment, use the tests whose test results do not meet the standards as target tests, and perform target tests with multiple test standards, and optimize the preparation process of the target PVD equipment based on the test results of the target test.

[0081] Optionally, in one embodiment of the present application, the grading module 300 is specifically used to: perform hot spot testing and power loss detection on the degraded components and normal components consisting of HJT batteries with different efficiency levels at different time points; calculate the power loss deviation of the degraded components and the normal components, and determine the maximum standing time of the prepared HJT battery based on the hot spot test results and the power loss deviation.

[0082] Optionally, in one embodiment of the present application, module 400 is selected, which is specifically used to: determine the laminated structure used for the encapsulation film according to the test results of the damp heat test; perform ultraviolet UV tolerance tests on HJT battery modules using different encapsulation films at different total irradiances, and determine the type of encapsulation film to be selected according to the test results.

[0083] It should be noted that the aforementioned explanation of the embodiment of the optimization method for preparing HJT battery components based on reliability testing is also applicable to the system of this embodiment and will not be repeated here.

[0084] In summary, the optimization system for preparing HJT battery components based on reliability testing in the embodiment of the present application optimizes the corresponding preparation process at each stage of preparing battery components based on various types of reliability tests such as wet heat test and CTM test, so as to prepare components according to the optimized process, and can prepare HJT battery components that meet the requirements in various aspects of reliability, thereby improving the reliability of the prepared HJT battery components. As a result, the system can obtain efficient and stable HJT component products, which can ensure that after the product is made into components, it can obtain high power generation and ensure long-term stable power generation.

[0085] In order to implement the above-mentioned embodiments, the present application also proposes a non-temporary computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, it implements the optimization of HJT battery component preparation based on reliability testing as described in any one of the above-mentioned first aspect embodiments.

[0086] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0087] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0088] Any process or method description in a flowchart or otherwise described herein may be understood to represent a module, fragment or portion of code comprising one or more executable instructions for implementing the steps of a custom logical function or process, and the scope of the preferred embodiments of the present application includes alternative implementations in which functions may not be performed in the order shown or discussed, including performing functions in a substantially simultaneous manner or in the reverse order depending on the functions involved, which should be understood by technicians in the technical field to which the embodiments of the present application belong.

[0089] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as an ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute instructions), or in combination with these instruction execution systems, devices or apparatuses. For the purpose of this specification, "computer-readable medium" can be any device that can contain, store, communicate, propagate or transmit a program for use by an instruction execution system, device or apparatus, or in combination with these instruction execution systems, devices or apparatuses. More specific examples of computer-readable media (a non-exhaustive list) include the following: an electrical connection with one or more wires (electronic device), a portable computer disk box (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), a fiber optic device, and a portable compact disk read-only memory (CDROM). In addition, the computer-readable medium may even be paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium and then editing, interpreting or processing in other suitable ways if necessary, and then stored in a computer memory.

[0090] It should be understood that the various parts of the present application can be implemented by hardware, software, firmware or a combination thereof. In the above-mentioned embodiments, a plurality of steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0091] A person skilled in the art may understand that all or part of the steps in the method for implementing the above-mentioned embodiment may be completed by instructing related hardware through a program, and the program may be stored in a computer-readable storage medium, which, when executed, includes one or a combination of the steps of the method embodiment.

[0092] In addition, each functional unit in each embodiment of the present application may be integrated into a processing module, or each unit may exist physically separately, or two or more units may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of a software functional module. If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it may also be stored in a computer-readable storage medium.

[0093] The storage medium mentioned above may be a read-only memory, a magnetic disk or an optical disk, etc. Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limiting the present application. A person of ordinary skill in the art may change, modify, replace and modify the above embodiments within the scope of the present application.

Claims

1. An optimization method for preparing HJT battery components based on reliability testing, characterized in that: The following steps are involved: In the process of preparing amorphous silicon passivation layer by chemical vapor deposition (CVD), the amorphous silicon film deposited is optimized by the flash-off process, and the HJT battery components prepared based on the optimized amorphous silicon film under different CVD radio frequency times are subjected to wet heat test and component packaging efficiency loss CTM test. With the goal of maximizing the radio frequency time, the extended CVD radio frequency time is determined based on the test results; Conduct various types of reliability tests on battery components that use different physical vapor deposition (PVD) technologies to prepare transparent conductive thin films (TCO), and determine the target PVD technology to be used based on the test results; Re-testing the photoelectric conversion efficiency of multiple batches of HJT batteries after storage and rest, re-classifying the multiple batches of HJT batteries according to the updated photoelectric conversion efficiency, and selecting multiple HJT batteries located in the same class after re-classification to prepare battery assemblies; The damp heat test, the CTM test and the UV tolerance test are performed on HJT battery components using different packaging films, and the structure and type of the packaging film are selected according to the test results.

2. The optimization method according to claim 1, characterized in that: The amorphous silicon film deposited by optimizing the flash-off process comprises: Testing multiple performance parameters of two types of HJT cells prepared under baseline conditions and under the pyrolysis process; The differences in multiple performance parameters of the two types of HJT cells are compared, and the process parameters of the quenching process are adjusted by determining whether the differences are within a preset range. The quenching process is performed according to the determined process parameters to optimize the quality of the amorphous silicon film.

3. The optimization method according to claim 2, characterized in that: The wet heat test and component packaging efficiency loss CTM test of the HJT battery component prepared based on the optimized amorphous silicon thin film under different CVD radio frequency times include: Performing a damp heat test on a plurality of HJT batteries prepared under different CVD radio frequency times in a high temperature and high humidity environment, and detecting damp heat attenuation parameters of the plurality of HJT batteries after the damp heat test duration exceeds a preset duration; Performing the damp heat test and the CTM test on a plurality of HJT battery assemblies prepared under different CVD radio frequency times, and detecting the CTM values ​​and damp heat attenuation parameters of the plurality of HJT battery assemblies; The extended CVD RF time is determined by combining the wet heat attenuation parameters of the multiple HJT batteries and the CTM values ​​of the multiple HJT battery assemblies.

4. The optimization method according to claim 1, characterized in that: The battery components using different physical vapor deposition (PVD) technologies to prepare transparent conductive thin film TCO are subjected to various types of reliability tests, and the target PVD technology to be used is determined according to the test results, including: Perform the damp heat test and the CTM test on HJT battery components prepared by different PVD equipment, and determine the target PVD equipment to be selected according to the test results; Various types of reliability tests are performed on the HJT battery components prepared by the target PVD equipment, and the tests whose test results do not meet the standards are used as target tests. The target tests are performed with multiple times the test standards, and the preparation process of the target PVD equipment is optimized based on the test results of the target tests.

5. The optimization method according to claim 1, characterized in that: Before re-classifying the plurality of batches of HJT cells according to the updated photoelectric conversion efficiency, the method further includes: Hot spot tests and power loss tests were performed on the light and dark degraded components and normal components composed of HJT cells of different efficiency levels at different time points; The power loss deviation of the degraded component and the normal component is calculated, and the maximum standing time of the prepared HJT battery is determined based on the hot spot test result and the power loss deviation.

6. The optimization method according to claim 1, characterized in that: The structure and type of the packaging film are selected according to the test results, including: Determining the laminated structure adopted by the encapsulation film according to the test results of the damp heat test; The UV tolerance test is performed on HJT battery components using different packaging films at different total irradiances, and the type of packaging film to be selected is determined based on the test results.

7. An optimization system for HJT battery assembly preparation based on reliability testing, characterized in that: include: The extension module is used to optimize the plated amorphous silicon film through the pyrolysis process in the process of preparing the amorphous silicon passivation layer by chemical vapor deposition (CVD), and to perform wet heat test and component packaging efficiency loss CTM test on HJT battery components prepared based on the optimized amorphous silicon film under different CVD radio frequency times, and to determine the extended CVD radio frequency time based on the test results with the goal of maximizing the radio frequency time; A determination module is used to perform various types of reliability tests on battery components using different physical vapor deposition (PVD) technologies to prepare transparent conductive thin film TCO, and determine the target PVD technology to be used based on the test results; A binning module is used to re-detect the photoelectric conversion efficiency of multiple batches of HJT batteries after storage and rest, re-bin the multiple batches of HJT batteries according to the updated photoelectric conversion efficiency, and select multiple HJT batteries located in the same bin after re-binning to prepare battery assemblies; A selection module is used to perform the damp heat test, the CTM test and the UV tolerance test on HJT battery components using different packaging films, and select the structure and type of the packaging film according to the test results.

8. The optimization system according to claim 7, characterized in that: The extension module is specifically used for: Testing multiple performance parameters of two types of HJT cells prepared under baseline conditions and under the pyrolysis process; The differences in multiple performance parameters of the two types of HJT cells are compared, and the process parameters of the quenching process are adjusted by determining whether the differences are within a preset range. The quenching process is performed according to the determined process parameters to optimize the quality of the amorphous silicon film.

9. The preparation system according to claim 8, characterized in that: The extension module is specifically used for: Performing a damp heat test on a plurality of HJT batteries prepared under different CVD radio frequency times in a high temperature and high humidity environment, and detecting damp heat attenuation parameters of the plurality of HJT batteries after the damp heat test duration exceeds a preset duration; Performing the damp heat test and the CTM test on a plurality of HJT battery assemblies prepared under different CVD radio frequency times, and detecting the CTM values ​​and damp heat attenuation parameters of the plurality of HJT battery assemblies; The extended CVD RF time is determined by combining the wet heat attenuation parameters of the multiple HJT batteries and the CTM values ​​of the multiple HJT battery assemblies.

10. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the optimization method for preparing a HJT battery assembly based on reliability testing as described in any one of claims 1 to 6 is implemented.

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