Multi-track chip capacitor testing machine
By designing inclined rotating material trays and negative pressure components in a chip capacitor tester, the problem of high leakage rate during loading is solved, and efficient and accurate capacitor loading is achieved.
Patent Information
- Application Number
- CN202411850662.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-16
- Publication Date
- 2025-03-21
AI Technical Summary
In the prior art, when a large number of loading chip capacitors are loaded with capacitors, it is difficult to ensure that each loading point is loaded, and there may be a missed installation, resulting in the inability to meet the design loading requirements.
A multi-track chip capacitor tester is designed. Through the inclination and rotation of the material plate, the capacitor is turned and adsorbed into the material hole. Combined with the role of the negative voltage component, the capacitor is loaded and loaded.
By improving the loading speed and accuracy of the capacitor, the leakage rate is reduced, ensuring that the design loading quantity requirements are met when loading a large amount.
Smart Images
Figure CN119660314A_ABST
Abstract
Description
Technical Field
[0001] The invention belongs to the technical field of capacitor testing machines, and in particular relates to a multi-track chip capacitor testing machine. Background Art
[0002] During the production process, capacitors need to undergo charging tests or other types of tests to ensure that their performance meets the standards. In this process, the loading device plays a vital role, which is responsible for transporting the capacitors from the storage location to the testing equipment for testing.
[0003] When testing chip capacitors, because chip capacitors are usually small in size and their layer structure is very brittle and easily damaged by stress (such as cracks), special care must be taken during the loading process to avoid excessive impact or pressure. At the same time, the positioning accuracy of chip capacitors is very high during the loading process. It is necessary to ensure that each chip capacitor can be accurately and stably placed in the predetermined position to avoid errors and failures in subsequent production.
[0004] Since the size of chip capacitors is small, when a large number of tests are required, a large number of chip capacitors need to be loaded to meet the test requirements. In the prior art chip capacitor loading device, in order to meet the large number of chip capacitors, it is necessary to increase the chip capacitor loading points and detection points. In this case, it is difficult to ensure that each loading point is loaded with chip capacitors, and there may be a situation of missing loading, and the design loading quantity requirements cannot be met. Therefore, it is necessary to ensure that the loading rate of the loading points in the loading device is increased when a large number of materials are loaded. Based on this, a multi-track chip capacitor tester is proposed. Summary of the invention
[0005] In order to solve the above problems existing in the prior art, the present invention provides a multi-track chip capacitor testing machine.
[0006] The purpose of the present invention can be achieved through the following technical solutions:
[0007] A multi-track chip capacitor testing machine of the present invention comprises a shell, a base, a negative pressure component, a driving motor, a loading component, a lower hopper, a testing component and an interface operation component, wherein the interface operation component is arranged on the shell, the negative pressure component, the testing component and the driving motor are arranged on the base, the loading component is tiltedly arranged on the base, the loading component comprises a material tray and a material bin, the driving motor is transmission-connected to the material tray, the lower hopper is arranged on the base and is used to feed the material bin, the material bin is arranged on the base and slidably abuts against the ascending section of the rotation direction of the material tray, a plurality of material holes are arranged on the material tray to surround and form a loading track, the negative pressure component is connected to the plurality of material holes for adsorbing capacitors, the lower side wall of the material bin is tangent to the outer edge of the material hole, the capacitor flips as the material tray rotates and is adsorbed in the material hole, and the testing component is used to detect the chip capacitors in the material hole.
[0008] Furthermore, the plurality of material holes are arranged in a circular array on the material tray, and a plurality of layers are provided on the material tray from the outside to the inside to form a plurality of feeding tracks.
[0009] Furthermore, the material bin is of an arc-shaped structure, and is provided with a plurality of layers of material troughs corresponding to the number and positions of the material holes, and the lower side walls of the plurality of layers of the material troughs are respectively tangent to the outer edges of the material holes of the corresponding layers.
[0010] Furthermore, a negative pressure ring is arranged between the material tray and the base, and a plurality of negative pressure grooves are arranged on the negative pressure ring to correspond to the positions of the material holes in each layer. The negative pressure grooves on the negative pressure ring are connected to the negative pressure assembly and are used to guide the flow direction of the negative pressure.
[0011] Furthermore, a detector is provided on the silo, and a vibrator and a control module are provided on the lower hopper. The detector is electrically connected to the vibrator and the control module. The detector is used to detect the capacitor storage state in the silo, and when the capacitor storage in the silo is lower than the detection height of the detector, the control module instructs the vibrator to vibrate the lower hopper to discharge the material.
[0012] Furthermore, each of the material holes is connected to a guide groove at the bottom of the material tray, the bottom of the material hole abuts against the top of the negative pressure ring, and the guide groove is connected to the negative pressure groove of the negative pressure ring to provide negative pressure for the material hole.
[0013] Furthermore, a nozzle is rotatably provided at the outlet of the silo, and the nozzle is arranged above several layers of the material holes at the outlet of the silo. The nozzle is connected to high-pressure gas and sprays out through the bottom nozzle to prevent capacitor overflow.
[0014] Furthermore, the silo is in the shape of a quarter of a circle, and is located at the lower part of the ascending section of the tray.
[0015] The beneficial effects of the present invention are:
[0016] (1) By placing the material tray in an inclined state, the capacitor in the material bin will abut against the inner wall of the lower side wall of the material bin, and the capacitor in the material bin will be turned over during the rotation of the material tray, so that the capacitor at the bottom is arranged in sequence along the inner wall of the lower side wall of the material bin during the turning process, and the capacitor at the bottom is sucked into the material hole as the material tray rotates. At this time, the side of the capacitor abutting against the inner wall of the lower side wall of the material bin is flush with the side of the material hole away from the center of the material tray, so the capacitor can be loaded into the material hole more quickly, thereby increasing the loading speed and reducing the leakage rate;
[0017] (2) The guide groove is used for guiding flow, and the bottom of the material hole is abutted against the top of the negative pressure ring, and the guide groove is connected to the negative pressure groove from the side of the material hole. When the capacitor is sucked into the material hole, it will not fall into the negative pressure groove because it is abutted against the top of the negative pressure ring. BRIEF DESCRIPTION OF THE DRAWINGS
[0018] In order to facilitate understanding by those skilled in the art, the present invention is further described below with reference to the accompanying drawings.
[0019] Figure 1 It is a schematic diagram of the overall structure of the present invention;
[0020] Figure 2 It is a schematic diagram of the main structure of the present invention;
[0021] Figure 3 It is a schematic diagram of the structure of some parts of the present invention;
[0022] Figure 4 It is a front structural schematic diagram of the present invention;
[0023] Figure 5 This is a schematic diagram of the internal structure of the silo opened according to the present invention;
[0024] Figure 6 It is a structural schematic diagram of the negative pressure ring of the present invention;
[0025] Figure 7 for Figure 5 The enlarged schematic diagram of point A in the middle;
[0026] Figure 8 It is a structural schematic diagram of the negative pressure ring of the present invention;
[0027] Fig. 9 It is a structural schematic diagram of the material tray of the present invention;
[0028] Fig.10 for Fig. 9 A magnified schematic diagram of point B in the middle.
[0029] Legend: 1. Base; 2. Drive motor; 3. Loading assembly; 31. Material bin; 311. Material trough; 321. Material hole; 322. Guide trough; 32. Material tray; 4. Lower hopper; 5. Detector; 6. Negative pressure ring; 61. Negative pressure trough; 7. Shell. DETAILED DESCRIPTION
[0030] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined invention purpose, the specific implementation methods, structures, features and effects of the present invention are described in detail below in conjunction with the accompanying drawings and preferred embodiments.
[0031] like Figure 1-10 As shown, a multi-track chip capacitor testing machine of the present invention includes a shell 7, a base 1, a negative pressure component, a drive motor 2, a feeding component 3 and a lower hopper 4. The shell 7 is provided with a platform for placing the base 1, and the shell 7 also has a power supply for powering electrical equipment. The negative pressure component and the drive motor 2 are arranged on the base 1, and the feeding component 3 is tilted on the base 1. The feeding component 3 includes a material tray 32 and a silo 31. The drive motor 2 is transmission-connected to the material tray 32. The lower hopper 4 is arranged on the base 1 and is used to feed the silo 31. The silo 31 is arranged on the base 1 and is slidably abutted against the ascending section of the rotation direction of the material tray 32. A plurality of material holes 321 are arranged on the material tray 32 to surround and form a feeding track. The negative pressure component is connected to the plurality of material holes 321 for adsorbing capacitors. The lower side wall of the silo 31 is tangent to the outer edge of the material hole 321. The capacitor flips as the material tray 32 rotates and is adsorbed in the material hole 321.
[0032] There is also a test instrument for testing the chip capacitor on the housing 7, and the test instrument is connected to the test assembly; the test assembly includes several test stations and an interface operation assembly, and the interface operation assembly is used to input various test data or test commands. The feeding track on the material tray 32 is annular, and the material holes 321 in the feeding track are distributed at intervals, and several test stations are arranged above the feeding track. Several test stations are arranged along the rotation direction of the feeding track, and the chip capacitor on each material hole 321 on the feeding track can be tested multiple times.
[0033] Since the size of chip capacitors is small, when a large number of tests are required, a large number of chip capacitors need to be loaded to meet the test requirements. In the prior art, in order to meet the large number of chip capacitors, it is necessary to increase the loading points and testing points of the chip capacitors. In this case, it is difficult to ensure that each loading point is loaded with chip capacitors, and there may be a situation where the chip capacitors are missed, and the design loading amount requirement cannot be met.
[0034] In order to avoid this situation, the capacitors in the silo 31 are constantly turned over by the rotation of the material tray 32, and the material is supplied to the silo 31 through the hopper, so that the capacitors in the silo 31 are in a state of being more. At the same time, it is necessary to provide negative pressure to the material holes 321 on the material tray 32 through the negative pressure component installed on the base 1, so that the capacitors in the silo 31 are more likely to be adsorbed in the material holes 321 during the process of turning over with the rotation of the material tray 32.
[0035] Specifically, the surface of the base 1 for mounting the material tray 32 is an inclined surface, and a circular groove for mounting the material tray 32 is provided on the inclined surface, and a negative pressure assembly is connected in the circular groove to provide negative pressure, and a driving motor 2 is installed in the center of the circular groove to connect with the material tray 32. When the material tray 32 is mounted on the circular groove, since a plurality of material holes 321 are provided on the material tray 32, air will be sucked from the material holes 321 at the top of the material tray 32 when the negative pressure assembly is working, so that negative pressure is formed at the material holes 321. Since the material tray 32 is generally in a horizontal state, although the capacitor on the material tray 32 can be laid flat with the largest area, the probability of the capacitor being loaded into the material hole 321 can be increased, but the amplitude of the capacitor flipping as the material tray 32 rotates is small, so there is still a high rate of missing installation. By placing the material tray 32 in an inclined state, although the area of the capacitors in the material bin 31 flat on the material tray 32 becomes smaller under the condition of the same amount, the amplitude of the flipping is larger after the rotation of the material tray 32. The larger flipping of the capacitors and the negative pressure suction of the negative pressure component on the material hole 321 help to reduce the leakage rate to a greater extent.
[0036] At the same time, in order to increase the number of capacitors in the silo 31 so that they can be loaded into the material holes 321 in a shorter time, it is necessary to have a larger number of capacitors in the silo 31. In this case, the larger the space of the silo 31, and in order to be able to load the capacitors into the material holes 321 more quickly even when the silo 31 has a large space and a large number of capacitors, it is necessary to make the lower side wall of the silo 31 tangent to the outer edge of the material hole 321. The lower side wall of the silo 31 refers to the side wall of the silo 31 away from the center of the circle, and is the inner side of the side wall away from the center of the circle, while the edge of the side of the material hole 321 away from the center of the circle of the material tray 32 is tangent to the lower side wall. In this case, on the one hand, the material tray 32 is in an inclined state, so the capacitor in the material bin 31 will abut against the inner wall of the lower side wall of the material bin 31, and the capacitor in the material bin 31 is turned over during the rotation of the material tray 32, so that the capacitor at the bottom is arranged in sequence along the inner wall of the lower side wall of the material bin 31 during the turning process, and the capacitor at the bottom is sucked into the material hole 321 as the material tray 32 rotates. At this time, the side of the capacitor abutting against the inner wall of the lower side wall of the material bin 31 is flush with the side of the material hole 321 away from the center of the material tray 32, so the capacitor can be loaded into the material hole 321 more quickly, thereby increasing the loading speed and reducing the leakage rate.
[0037] In addition to turning the capacitors in the hopper through the material tray 32, because the capacitors are on the material tray 32 and in the silo 31, when the material tray 32 starts to rotate, the capacitors on the material tray 32 will be closer to the lower side wall position in the silo 31 under the action of centrifugal force, and after the capacitors close to the lower side wall are loaded into the material hole 321, the capacitors on the side away from the lower side wall are gradually replaced, thereby increasing the loading speed of the capacitors on the material tray 32.
[0038] In one embodiment, a plurality of material holes 321 are arranged in a circular array on the material tray 32, and a plurality of layers are set on the material tray 32 from the outside to the inside to form a plurality of feeding tracks. Since there is generally only one feeding track for loading, the missing rate can be reduced by a single feeding track, but the feeding speed of a single feeding track is slow. Therefore, in this embodiment, a four-layer circular array of feeding tracks is formed by a plurality of material holes 321. The feeding track is formed by a plurality of feeding tracks surrounding a circle on the material tray 32, and the four-layer feeding track is a four-layer feeding track with different diameters and concentric. By increasing the number of feeding tracks, the feeding amount can be increased. In actual use, 4 feeding tracks, 8 feeding tracks or 12 feeding tracks are usually set; the test stations are usually set in a manner of 5 stations, 9 stations, 11 stations, 17 stations, 21 stations or 25 stations. The feeding device in this embodiment is easy to realize multi-track efficient feeding and multi-test station expansion, improve production efficiency and flexible setting of test requirements.
[0039] In order to ensure that each material hole 321 can be equipped with a capacitor while increasing the number of layers of the loading track and reduce the probability of missing capacitors, in one embodiment, the material bin 31 is in an arc-shaped structure, and a plurality of layers of material troughs 311 corresponding to the number and position of the material holes 321 are arranged in the material bin 31, and the lower side walls of the plurality of layers of material troughs 311 are respectively tangent to the outer edges of the material holes 321 of the corresponding layers; and, the material bin 31 is in a quarter-circular arc shape, and the material bin 31 is located at the lower position of the ascending section of the material tray 32, that is, in the third quadrant of the material tray 32, and the material holes 321 are located in the material troughs 311 by four layers of material troughs 311 arranged in the material bin 31 according to the position of the loading track, and the material holes 321 are located in the material troughs 311, and the side wall of each layer of material troughs 311 on the side away from the center of the circle is the lower side wall, and the outer edge of the material hole 321 in each layer of material troughs 311 is tangent to the inner wall of the lower side wall in that layer, thereby forming the effect in the above-mentioned embodiment.
[0040] Since the diameter of the material tray 32 is relatively large, there are a large number of material holes 321 on the material tray 32, and the material holes 321 are evenly distributed at local positions on the material tray 32. When the negative pressure component provides negative pressure to the material holes 321 on the material tray 32, since the material tray 32 needs to rotate, there is a large matching gap between the material tray 32 and the base 1, which easily leads to a large amount of negative pressure leakage, and the negative pressure provided to each material hole 321 is relatively small. In order to avoid negative pressure leakage, in one embodiment, a negative pressure ring 6 is provided between the material tray 32 and the base 1, and a plurality of negative pressure grooves 61 are provided on the negative pressure ring 6 to correspond to the position of each layer of material holes 321, and the negative pressure grooves 61 on the negative pressure ring 6 are connected with the negative pressure component and used to guide the negative pressure flow direction;
[0041] The bottom of the negative pressure ring 6 abuts against the bottom of the circular groove, and the top slides against the bottom of the material tray 32. However, the multiple negative pressure grooves 61 on the negative pressure ring 6 form multiple sliding abutment areas with the top of the material tray 32, and the negative pressure leakage is reduced by increasing the contact area. At the same time, the negative pressure grooves 61 are directly connected to each corresponding feeding track, so that the negative pressure formed by the negative pressure component can directly act on the material hole 321. When the negative pressure component is working, the negative pressure formed by the negative pressure component passes through the negative pressure grooves 61 on the negative pressure ring 6, and then leads to the guide grooves 322 along the negative pressure grooves 61. The guide grooves 322 are connected to the material holes 321, and the negative pressure ring 6 environment is formed in the material bin 31 through the material holes 321 for absorbing capacitance.
[0042] Further, a detector 5 is provided on the silo 31, and a vibrator and a control module are provided on the lower hopper 4. The detector 5 is electrically connected to the vibrator and the control module. The detector 5 is used to detect the state of the capacitor storage in the silo 31, and when the capacitor storage in the silo 31 is lower than the detection height of the detector 5, the control module instructs the vibrator to vibrate the lower hopper 4 to discharge the material;
[0043] Specifically, the detector 5 is a fiber optic detector 5, which detects whether the hopper 31 is short of material. If so, the hopper vibrates to send the capacitor into the hopper 31. The hopper 31 is directly connected to the material tray 32. The material tray 32 sucks the component into the material hole 321 through vacuum, and then sends the capacitor to the testing station and the sorting station.
[0044] Further, each material hole 321 is connected with a guide groove 322 at the bottom of the material tray 32, the bottom of the material hole 321 abuts against the top of the negative pressure ring 6, and the guide groove 322 is connected to the negative pressure groove 61 of the negative pressure ring 6 to provide negative pressure for the material hole 321; the guide groove 322 is located at the bottom side of the material tray 32, and each material hole 321 corresponds to a guide groove 322. If the bottom of the material hole 321 is directly aligned with the negative pressure groove 61 below, the capacitor sucked into the material hole 321 by the negative pressure will be further sucked into the negative pressure groove 61 and cannot be in the material hole 321. Therefore, the guide groove 322 is used for diversion, and the bottom of the material hole 321 abuts against the top of the negative pressure ring 6, and the guide groove 322 is connected to the negative pressure groove 61 from the side of the material hole 321. After the capacitor is sucked into the material hole 321, since the capacitor is abutted by the top of the negative pressure ring 6, the capacitor will not fall into the negative pressure groove 61.
[0045] Since the opening of the silo 31 faces upward and there is only an opening facing upward, after the capacitors in the silo 31 are loaded into the material holes 321, they move outward along the opening of the silo 31 as the material tray 32 rotates. After the number of capacitors in the silo 31 decreases, the material added through the hopper is also added through the opening. Therefore, it is easy for the capacitors to overflow when a large amount of material is added, or the capacitors that are not loaded into the material holes 321 also move outward under the action of the flipping of the material tray 32. Therefore, these capacitors need to be removed. Therefore, in one embodiment, a nozzle is rotatably arranged at the outlet of the silo 31. The nozzle is arranged above several layers of material holes 321 at the outlet of the silo 31. The nozzle is connected to high-pressure gas and sprays it through the bottom nozzle to prevent the capacitors from overflowing.
[0046] The above description is only a preferred embodiment of the present invention and does not limit the present invention in any form. Although the present invention has been disclosed as a preferred embodiment as above, it is not used to limit the present invention. Any technical personnel in this field can make some changes or modify the technical contents disclosed above into equivalent embodiments without departing from the scope of the technical solution of the present invention. However, any brief modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present invention without departing from the content of the technical solution of the present invention are still within the scope of the technical solution of the present invention.
Claims
1. A multi-track chip capacitor tester, characterized in that: It includes a shell, a base, a negative pressure component, a drive motor, a loading component, a lower hopper, a test component and an interface operation component, wherein the interface operation component is arranged on the shell, the negative pressure component, the test component and the drive motor are arranged on the base, the loading component is tilted on the base, the loading component includes a material tray and a material bin, the drive motor is transmission-connected to the material tray, the lower hopper is arranged on the base and is used to feed the material bin, the material bin is arranged on the base and slidably abuts against the ascending section of the rotation direction of the material tray, a plurality of material holes are arranged on the material tray to surround and form a loading track, the negative pressure component is connected to a plurality of the material holes for adsorbing capacitors, the lower side wall of the material bin is tangent to the outer edge of the material hole, the capacitor flips as the material tray rotates and is adsorbed in the material hole, and the test component is used to detect the chip capacitor in the material hole.
2. A multi-track chip capacitor tester according to claim 1, characterized in that: The plurality of material holes are arranged in a circular array on the material tray, and a plurality of layers are arranged on the material tray from the outside to the inside to form a plurality of feeding tracks.
3. A multi-track chip capacitor tester according to claim 2, characterized in that: The material bin is of an arc-shaped structure, and is provided with a plurality of layers of material troughs corresponding to the number and positions of the material holes, and the lower side walls of the plurality of layers of the material troughs are respectively tangent to the outer edges of the material holes of the corresponding layers.
4. A multi-track chip capacitor tester according to claim 3, characterized in that: A negative pressure ring is arranged between the material tray and the base, and a plurality of negative pressure grooves are arranged on the negative pressure ring to correspond to the positions of the material holes in each layer. The negative pressure grooves on the negative pressure ring are connected to the negative pressure assembly and are used to guide the flow direction of the negative pressure.
5. The multi-track chip capacitor tester according to claim 1, characterized in that: The silo is provided with a detector, and the lower hopper is provided with a vibrator and a control module. The detector is electrically connected to the vibrator and the control module. The detector is used to detect the capacitor storage state in the silo, and when the capacitor storage in the silo is lower than the detection height of the detector, the control module instructs the vibrator to vibrate the lower hopper to discharge the material.
6. The multi-track chip capacitor tester according to claim 4, characterized in that: Each of the material holes is connected to a guide groove at the bottom of the material tray, the bottom of the material hole abuts against the top of the negative pressure ring, and the guide groove is connected to the negative pressure groove of the negative pressure ring to provide negative pressure for the material hole.
7. The multi-track chip capacitor tester according to claim 1, characterized in that: A nozzle is rotatably provided at the outlet of the silo, and the nozzle is arranged above several layers of the material holes at the outlet of the silo. The nozzle is connected with high-pressure gas and sprays out through the bottom nozzle to prevent capacitor overflow.
8. The multi-track chip capacitor tester according to claim 1, characterized in that: The material bin is in the shape of a quarter of a circle and is located at the lower part of the ascending section of the material tray.