Phased array probe assembly

Abstract

The invention aims to provide a phased array probe assembly which comprises a probe carrier, a plurality of probes and a probe cable, the probe carrier comprises an outer shell, a containing cavity is defined in the outer shell, and an opening is formed in one axial end of the outer shell. The plurality of probes are fixed in the accommodating cavity, and the plurality of probes have the same female header. The probe cables correspond to the probes in number and are provided with connectors, the size of the connectors is configured to allow the connectors to enter the containing cavity from the openings, and the connectors are internally provided with pin headers corresponding to the female header structures. And after penetrating through the opening, the probe cable is detachably connected with the female header of the probe through the pin header in the accommodating cavity. By means of the phased array probe assembly, efficient detection of the CRDM pipe can be achieved, and meanwhile maintenance and replacement are convenient.

Description

Technical Field

[0001] The invention relates to the field of nondestructive testing of nuclear power equipment, and in particular to a phased array probe assembly. Background Art

[0002] About 16% of the world's electricity comes from nuclear reactors, and it is particularly important to ensure the safe operation of nuclear reactors in nuclear power plants without nuclear leakage. The nuclear power control rod drive mechanism claw housing (hereinafter referred to as "CRDM tube") is a key part of the reactor pressure vessel (hereinafter referred to as RPV) of a nuclear power plant. RPV is a high-pressure vessel that withstands high temperature, high pressure, and long-term radiation. The main function of the CRDM tube is to serve as a transmission channel for nuclear reactor control rods and coolants, so the pipeline also works for a long time in an environment of high temperature, high pressure, and strong radiation of the primary circuit medium water. Long-term work will produce primary circuit water stress corrosion cracking (PWSCC). In severe cases, it will cause the top cover to leak, destroy the integrity of the primary circuit boundary, and cause shutdown and degradation. Therefore, corrosion detection of CRDM tubes becomes particularly urgent and important.

[0003] At present, the application of phased array ultrasound in the field of in-service inspection and non-destructive testing is becoming more and more extensive, showing an explosive growth trend in China. Conventional TRL dual crystal probes are still used in nuclear power CRDM tube inspection. Compared with TRL dual crystal probes, the sound wave transmission and reception of phased array probes are completed by multiple array element chips in the form of arrays, and each array element can be controlled by the phase of the electronic circuit to achieve the deflection and focusing of the ultrasonic wave, achieve a larger scanning range, and greatly improve the scanning sensitivity and resolution, thereby improving the detection efficiency.

[0004] However, due to the narrowness of the nuclear power CRDM pipeline, there are restrictions on the size of the carrier, which in turn places high requirements on the manufacturing of phased array probes, a high degree of integration, and great difficulty in probe manufacturing. How to provide a phased array probe assembly that can achieve high efficiency and easy maintenance is an issue that urgently needs to be solved. Summary of the invention

[0005] The object of the present invention is to provide a phased array probe assembly that can achieve efficient detection of CRDM tubes and facilitate maintenance and replacement.

[0006] A phased array probe assembly for achieving the above-mentioned purpose comprises:

[0007] The probe carrier comprises an outer shell, wherein a receiving cavity is enclosed inside the outer shell, and an opening is provided at one axial end of the outer shell;

[0008] A plurality of probes are fixed in the accommodating cavity, and the plurality of probes have the same female connector; and

[0009] A probe cable, arranged in accordance with the number of the probes, having a connector, the size of the connector being configured to allow entry from the opening into the accommodating cavity, the connector being provided with a pin header corresponding to the female header structure;

[0010] Wherein, after the probe cable passes through the opening, it is detachably connected to the female connector of the probe through the pin connector in the accommodating cavity.

[0011] In one or more embodiments, the probe carrier is provided with a probe clamping block, the probe clamping block provides a mounting groove, and the probe can be fixedly assembled in the mounting groove;

[0012] Wherein, an elastic member is arranged between the probe clamping block and the outer shell.

[0013] In one or more embodiments, after the probe clamping block is connected to the outer shell by a fastener, an elastic member is arranged between the probe clamping block and the outer shell, and the elastic member is a coil spring.

[0014] In one or more embodiments, the probe carrier has an end cap at one axial end and a guide head at the other end, and the opening is formed in the end cap.

[0015] In one or more embodiments, the probe carrier further includes a lead tube, wherein the lead tube is connected to the end cover flange, and the lead tube in a connected state is communicated with the opening.

[0016] In one or more embodiments, the probe includes an oblique probe, a circumferential oblique probe, and a circumferential straight probe;

[0017] A first wedge is provided in the angle probe, and a probe wafer is provided on the first wedge. Along the detection direction, an angle of 19 to 20 degrees is formed between the upper surface of the first wedge and the positive direction of the detection direction, and along the width direction of the first wedge, an angle of 5 to 7 degrees is formed between the upper surface of the first wedge and the horizontal plane.

[0018] A second wedge is provided in the circumferential oblique probe, and the probe wafer is provided on the second wedge. Along the detection direction, an angle of 19 to 20 degrees is formed between the upper surface of the second wedge and the positive direction of the detection direction, and an angle of 5 to 7 degrees is formed between the upper surface of the second wedge and the horizontal plane along the width direction of the second wedge.

[0019] A third wedge is arranged in the circumferential straight probe, and the probe wafer is arranged on the third wedge. Along the detection direction, the upper surface of the third wedge is parallel to the detection direction, and along the width direction of the third wedge, the upper surface of the third wedge forms an angle of 5 to 7 degrees with the horizontal plane.

[0020] Among them, the bottom surface of the oblique probe is a first curved surface, the bottom surface of the circumferential oblique probe is a second curved surface, and the bottom surface of the circumferential straight probe is a third curved surface. The arc extension direction of the first curved surface is perpendicular to the detection direction of the oblique probe, the arc extension direction of the second curved surface is parallel to the detection direction of the circumferential oblique probe, and the arc extension direction of the third curved surface is parallel to the detection direction of the circumferential straight probe.

[0021] In one or more embodiments, in the assembled state, the first arcuate surface, the second arcuate surface and the third arcuate surface are respectively conformal and matched with the inner circumferential surface of the pipeline to be detected.

[0022] In one or more embodiments, the outer shell is a split shell.

[0023] In one or more embodiments, a first matching portion is provided on the outer periphery of the female row of the probe, and a second matching portion is provided on the outer periphery of the pin row of the connector;

[0024] During assembly, the first mating portion and the second mating portion can guide the pin header to be inserted into the female header.

[0025] In one or more embodiments, a sealing gasket is provided at the second mating portion.

[0026] The beneficial effects of the present invention are:

[0027] Since the probe cable is detachably connected to the probe, a single probe cable can be replaced, providing an efficient and economical way to repair cable wear or damage in special circumstances during the detection process. At the same time, the phased array ultrasonic probe is a consumable, while the probe cable is a non-consumable item. The probe can be replaced at the work site by disassembling the carrier, greatly improving the detection efficiency.

[0028] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present application. Moreover, the same reference numerals are used throughout the drawings to represent the same components. In the drawings:

[0030] Figure 1 A three-dimensional schematic diagram of a probe assembly according to some embodiments of the present application is shown;

[0031] Figure 2 A schematic diagram of an exploded view of a probe assembly according to some embodiments of the present application is shown;

[0032] Figure 3 A schematic side view of a connector according to some embodiments of the present application is shown;

[0033] Figure 4 A schematic top view of a connector according to some embodiments of the present application is shown;

[0034] Figure 5 for Figure 2 A partial enlarged schematic diagram of

[0035] Fig. 6A A front schematic diagram of an angle probe according to some embodiments of the present application is shown;

[0036] Figure 6B A side schematic diagram of an angle probe according to some embodiments of the present application is shown;

[0037] Figure 6C A schematic top view of an oblique probe according to some embodiments of the present application is shown;

[0038] Fig. 7A A front schematic diagram of a circumferential oblique probe according to some embodiments of the present application is shown;

[0039] Figure 7B A side schematic diagram of a circumferential oblique probe according to some embodiments of the present application is shown;

[0040] Figure 7C A schematic top view of a circumferential oblique probe according to some embodiments of the present application is shown;

[0041] Fig. 8A A front schematic diagram of a circumferential straight probe according to some embodiments of the present application is shown;

[0042] Figure 8B A side schematic diagram of a circumferential straight probe according to some embodiments of the present application is shown;

[0043] Figure 8C A schematic top view of a circumferential straight probe according to some embodiments of the present application is shown;

[0044] Fig. 9 Schematic diagrams of some embodiments of the phased array probe assembly in a detection state are shown. DETAILED DESCRIPTION

[0045] The following embodiments of the technical solution of the present application are described in detail in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application, and are therefore only used as examples, and cannot be used to limit the scope of protection of the present application.

[0046] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0047] At present, traditional phased array probes cannot be disassembled because the probes and cables are directly connected, and cannot be replaced at any time at the work site. For nuclear power CRDM pipe detection, due to the narrow pipeline, if non-detachable probes and cables are used, the probes cannot be replaced at any time in actual working conditions. The probe assembly needs to be disassembled and replaced, which is cumbersome.

[0048] Based on this, according to some embodiments of the present application, a phased array probe assembly is provided. Figure 1 shows a three-dimensional schematic diagram of a probe assembly according to some embodiments of the present application, Figure 2 The schematic diagram of the probe assembly according to some embodiments of the present application is shown. The probe assembly includes a probe carrier 1, multiple probes 2 and a probe cable 3. The probe carrier 1 includes an outer shell 11, the outer shell 11 surrounds a receiving cavity 10, and an opening 12 is provided at one axial end of the outer shell. Multiple probes 2 are fixed in the receiving cavity 10, and the multiple probes 2 have the same female connector.

[0049] The probe cable 3 is set to correspond to the number of probes 2, and has a connector 30. Figure 3 shows a side view of a connector according to some embodiments of the present application, Figure 4 The top view schematic diagram of the connector according to some embodiments of the present application is shown, the size of the connector 30 is configured to allow entry from the opening 12 into the accommodating cavity 10, and the connector 30 is provided with a pin row 31 corresponding to the mother row structure. In a specific embodiment, the mother row and the pin row are designed to be a double-row structure, that is, the pin row 31 provided in the connector 30 is a double-row structure as shown in the figure, thereby allowing the connector 30 as a whole to be made flat. In actual working conditions, multiple cables may be arranged in the opening 12. If the size of the connector 30 is too wide, it will cause the connector 30 to be difficult to pass through the opening 12. The connector 30 is designed to be flat, so that the connector 30 as a whole can pass through the opening 12. In a specific embodiment, a flat connector 30 means that the length of the connector is 2-5 times the width. For example Figure 2In a specific embodiment shown in , a coupling agent transmission tube 4 is also arranged in the accommodating cavity 10. The coupling agent transmission tube 4 is mainly used to transmit the coupling agent (water). During the phased array ultrasonic inspection, the probe and the CRDM tube of the test object cannot be in dry contact. The coupling agent is required to ensure that the sound wave is incident on the inside of the test object. During the inspection process, the inner wall of the CRDM tube must be completely wetted with coupling agent water, and water must be continuously supplied to ensure that the probe is well coupled with the inner wall of the tube. Due to the arrangement of the coupling agent transmission tube 4, the internal space of the probe carrier 1 is limited, and there is adjustment on how to assemble the probe.

[0050] During assembly, after the probe cable 3 passes through the opening 12 , it is detachably connected to the female connector of the probe 2 via the male connector 31 in the accommodating cavity 10 .

[0051] Since the probe cable 3 is detachably connected to the probe 2, a single probe cable 3 can be replaced, and can be replaced in a limited space, providing an efficient and economical way to repair cable wear or damage in special circumstances during the detection process. At the same time, the phased array ultrasonic probe is a consumable, while the probe cable 3 is a non-consumable item. The probe can be replaced at the work site by disassembling the carrier, which greatly improves the detection efficiency.

[0052] In the description of the embodiments of the present application, “plurality” means more than two, unless otherwise clearly and specifically defined.

[0053] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0054] Figure 5 for Figure 2 A partially enlarged schematic diagram is shown. In some embodiments of the phased array probe assembly, a probe clamping block 13 is provided in the probe carrier 1. The probe clamping block 13 provides a mounting groove 130. The probe 2 can be fixedly assembled in the mounting groove 130. An elastic member 14 is provided between the probe clamping block 13 and the outer shell 11.

[0055] Furthermore, in a specific embodiment, after the probe clamping block 13 is connected to the outer shell 11 by a fastener, an elastic member 14 is arranged between the outer shell 11, and the elastic member 14 is a coil spring. By setting the elastic member 14, the probe 2 installed in the accommodating cavity 10 has a certain degree of freedom of movement, and the probe 2 can be slightly adjusted to ensure that the probe 2 maintains a close fit with the CRDM tube 90 to be detected.

[0056] In some embodiments of the phased array probe assembly, the probe carrier 1 has an end cap 15 at one axial end and a guide head 16 at the other end. An opening 12 is provided in the end cap 15. The guide head 16 allows the probe carrier 1 to be easily inserted into the CRDM tube for detection.

[0057] In some embodiments of the phased array probe assembly, the probe carrier 1 further includes a lead tube 17, which is flange-connected to the end cover 15. The lead tube 17 in the connected state is connected to the opening 12, so that the probe cable 3 passes through the lead tube 17 and then enters the accommodating cavity 10 through the opening 12.

[0058] In some embodiments of the phased array probe assembly, the probe 2 includes an oblique probe 21 , a circumferential oblique probe 22 , and a circumferential straight probe 23 .

[0059] Specifically, Fig. 6A 1 shows a front view of an oblique probe according to some embodiments of the present application, Figure 6B A side schematic diagram of an oblique probe according to some embodiments of the present application is shown. Figure 6C A schematic top view of an oblique probe according to some embodiments of the present application is shown. A first wedge 211 is provided in the oblique probe 21, and a probe wafer 200 is provided on the first wedge 211. Along the detection direction a, a first angle x1 is provided between the upper surface 212 of the first wedge 211 and the positive direction of the detection direction a. The first angle x1 is 19 to 20 degrees, and is provided in this way to achieve a larger scanning range of the probe. Along the width direction of the first wedge 211, a first roof angle y1 is provided between the upper surface 212 of the first wedge 211 and the horizontal plane. The first roof angle y1 is 5 to 7 degrees, and is provided in this way to increase the focusing strength of the probe and improve the resolution. In some specific embodiments, preferably, the first angle x1 is 19.5 degrees, and the first roof angle y1 is 6 degrees.

[0060] Fig. 7A shows a front view of a circumferential oblique probe according to some embodiments of the present application, Figure 7B A side schematic diagram of a circumferential oblique probe according to some embodiments of the present application is shown. Figure 7CA schematic top view of a circumferential oblique probe according to some embodiments of the present application is shown. A second wedge 221 is provided in the circumferential oblique probe 22, and the probe wafer 200 is provided on the second wedge 221. Along the detection direction b, there is a second angle x2 between the upper surface 222 of the second wedge and the positive direction of the detection direction b, and the second angle x2 is an angle of 19 to 20 degrees, so as to achieve a larger scanning range of the probe. Along the width direction of the second wedge 221, there is a second roof angle y2 between the upper surface 222 of the second wedge 221 and the horizontal plane, and the second roof angle y2 is an angle of 5 to 7 degrees. The detection direction a of the oblique probe 21 is perpendicular to the detection direction b of the circumferential oblique probe 22, so as to increase the focusing strength of the probe and improve the resolution. Preferably, the second angle x2 is 19.5 degrees, and the second roof angle y2 is 6 degrees.

[0061] Fig. 8A shows a front schematic diagram of a circumferential straight probe according to some embodiments of the present application, Figure 8B shows a side schematic diagram of a circumferential straight probe according to some embodiments of the present application, Figure 8C A schematic top view of a circumferential straight probe according to some embodiments of the present application is shown. A third wedge 231 is provided in the circumferential straight probe 23, and the probe wafer 200 is provided on the third wedge 231. Along the detection direction c, the upper surface 232 of the third wedge 231 is parallel to the detection direction c. Along the width direction of the third wedge 231, there is a third roof angle y3 between the upper surface 232 of the third wedge 231 and the horizontal plane, and the third roof angle y3 is at an angle of 5 to 7 degrees. With such a configuration, the circumferential straight probe is mainly used to achieve accurate testing of the thickness change of the tube wall. Preferably, the third roof angle y3 is 6 degrees.

[0062] Among them, Figure 6C , Figure 7C as well as Figure 8C The configuration of the female header 201 on the probe is shown in FIG. 1 , which matches the configuration of the male header 31 .

[0063] Among them, combined with reference 6A to 8C The bottom surface of the oblique probe 21 is a first arc-shaped surface 213, the bottom surface of the circumferential oblique probe 22 is a second arc-shaped surface 223, and the bottom surface of the circumferential straight probe 23 is a third arc-shaped surface 233. Fig. 6A as well as Figure 6B As shown, the arc extension direction of the first arc surface 213 is perpendicular to the detection direction a of the oblique probe. Fig. 7A as well as Figure 7BAs shown, the arc surface extending direction of the second arc surface 223 is parallel to the detection direction b of the circumferential oblique probe 22, and the arc surface extending direction of the third arc surface 233 is parallel to the detection direction c of the circumferential straight probe 23. This enables the oblique probe 21 to perform axial scanning on the CRDM tube, the circumferential oblique probe 22 to perform circumferential scanning on the CRDM tube, and the circumferential straight probe 23 to perform circumferential scanning on the CRDM tube, and simultaneously accurately test the thickness change of the tube wall.

[0064] Through the above-mentioned design, the phased array probe assembly can realize defect detection in multiple directions, reducing the risk of missed detection, and utilizing the multi-chip of the phased array probe and the electronic circuit to control the chip transmission / reception, which can complete the detection efficiently at one time, and realize the detachable function of the connecting wire and the probe array element of the phased array probe, which is convenient for maintenance and replacement.

[0065] In the description of the embodiments of the present application, technical terms such as "first" and "second" are only used to distinguish different objects and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features.

[0066] In some embodiments of the phased array probe assembly, in the assembled state, the first arc surface 213, the second arc surface 223 and the third arc surface 233 are respectively conformal and matched with the inner circumferential surface of the pipeline to be detected, for example, consistent with the inner diameter of the CRDM tube, and are all configured with an arc radius of 35 mm. Such a setting can achieve reliability of scanning.

[0067] In some embodiments of the phased array probe assembly, Figure 2 As shown, the outer shell 11 is a split shell, so that the probe 2 therein can be replaced by splitting the outer shell 11 in half.

[0068] In some embodiments of the phased array probe assembly, a first mating portion is provided on the outer periphery of the female connector of the probe 2, and a second mating portion is provided on the outer periphery of the pin connector 31 of the connector 30. During assembly, the first mating portion and the second mating portion can guide the pin connector to be inserted into the female connector. In a specific embodiment, for example Figure 4 As shown, the second matching portion is a guide groove 32 arranged on the outer periphery of the pin header 31. Correspondingly, a guide protrusion can be arranged on the probe 2 to enable the pin header 31 to be inserted into the female connector by guidance.

[0069] Further, in some embodiments of the phased array probe assembly, Figure 4 As shown, a sealing gasket 33 is provided at the second matching portion to ensure sealing between the probe 2 and the connector 3 after they are plugged in.

[0070] Fig. 9A schematic diagram of some embodiments of the phased array probe assembly in the detection state is shown, in which the carrier 1 can extend the probe 2 into the CRDM tube 90 to be detected for detection. Specifically, the carrier is lifted into the CRDM tube 90 by the lifting connecting rod 91, and the probe 2 is connected to the external detection device 92 through the probe cable 3.

[0071] In a specific embodiment, the probe 2 further includes an outer shell, and the outer shell is made of POM material.

[0072] In a specific embodiment, the probe wafer is made of the same ceramic sheet, which is coated by the same magnetron sputtering process to form a stack, and then cut into 8×4 array elements by a cutting machine to form a wafer used in the product.

[0073] In a specific embodiment, the probe wafer is connected to the first to third wedges by bonding, and after curing, an ultrasonic vibrator semi-finished product is manufactured, and after packaging, the probe 2 is formed.

[0074] In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to the specific circumstances.

[0075] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them; although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application, and they should all be included in the scope of the claims and specification of the present application. In particular, as long as there is no structural conflict, the various technical features mentioned in the various embodiments can be combined in any way. The present application is not limited to the specific embodiments disclosed herein, but includes all technical solutions that fall within the scope of the claims.

Claims

1. A phased array probe assembly, characterized in that: include: The probe carrier comprises an outer shell, wherein a receiving cavity is enclosed inside the outer shell, and an opening is provided at one axial end of the outer shell; A plurality of probes are fixed in the accommodating cavity, and the plurality of probes have the same female row; as well as A probe cable, arranged in accordance with the number of the probes, having a connector, the size of the connector being configured to allow entry from the opening into the accommodating cavity, the connector being provided with a pin header corresponding to the female header structure; Wherein, after the probe cable passes through the opening, it is detachably connected to the female connector of the probe through the pin connector in the accommodating cavity.

2. The phased array probe assembly according to claim 1, characterized in that: The probe carrier is provided with a probe clamping block, the probe clamping block provides a mounting groove, and the probe can be fixedly assembled in the mounting groove; Wherein, an elastic member is arranged between the probe clamping block and the outer shell.

3. The phased array probe assembly according to claim 2, characterized in that: After the probe clamping block is connected to the outer shell through a fastener, an elastic member is arranged between the probe clamping block and the outer shell, and the elastic member is a coil spring.

4. The phased array probe assembly according to claim 1, characterized in that: The probe carrier has an end cap at one axial end and a guide head at the other end, and the opening is formed in the end cap.

5. The phased array probe assembly according to claim 4, characterized in that: The probe carrier also includes a lead tube, which is connected to the end cover flange. The lead tube in a connected state is communicated with the opening.

6. The phased array probe assembly according to claim 1, characterized in that: The probes include an oblique probe, a circumferential oblique probe and a circumferential straight probe; A first wedge is provided in the angle probe, and a probe wafer is provided on the first wedge. Along the detection direction, an angle of 19 to 20 degrees is formed between the upper surface of the first wedge and the positive direction of the detection direction, and along the width direction of the first wedge, an angle of 5 to 7 degrees is formed between the upper surface of the first wedge and the horizontal plane. A second wedge is provided in the circumferential oblique probe, and the probe wafer is provided on the second wedge. Along the detection direction, an angle of 19 to 20 degrees is formed between the upper surface of the second wedge and the positive direction of the detection direction, and an angle of 5 to 7 degrees is formed between the upper surface of the second wedge and the horizontal plane along the width direction of the second wedge. A third wedge is arranged in the circumferential straight probe, and the probe wafer is arranged on the third wedge. Along the detection direction, the upper surface of the third wedge is parallel to the detection direction, and along the width direction of the third wedge, the upper surface of the third wedge forms an angle of 5 to 7 degrees with the horizontal plane; Among them, the bottom surface of the oblique probe is a first curved surface, the bottom surface of the circumferential oblique probe is a second curved surface, and the bottom surface of the circumferential straight probe is a third curved surface. The arc extension direction of the first curved surface is perpendicular to the detection direction of the oblique probe, the arc extension direction of the second curved surface is parallel to the detection direction of the circumferential oblique probe, and the arc extension direction of the third curved surface is parallel to the detection direction of the circumferential straight probe.

7. The phased array probe assembly according to claim 6, characterized in that: In the assembled state, the first arcuate surface, the second arcuate surface and the third arcuate surface are respectively conformal and matched with the inner peripheral surface of the pipeline to be detected.

8. The phased array probe assembly according to claim 1, characterized in that: The outer shell is a split shell.

9. The phased array probe assembly according to claim 1, characterized in that: The outer periphery of the female row of the probe is provided with a first matching portion, and the outer periphery of the pin row of the connector is provided with a second matching portion; During assembly, the first mating portion and the second mating portion can guide the pin header to be inserted into the female header.

10. The phased array probe assembly according to claim 9, characterized in that: A sealing gasket is arranged at the second matching portion.

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