Comprehensive detection integrated device of multifunctional general survey instrument

Abstract

The invention relates to the technical field of optical cable fault monitoring, in particular to a multifunctional general survey instrument comprehensive detection integrated device which comprises a test obtaining module, a test determining module, a candidate obtaining module, a candidate determining module and a third determining module. The multifunctional general survey instrument comprises a photoelectric detector, an adjusting panel, a light source device and a coupler, a detection sensor of the photoelectric detector faces downwards, and the adjusting panel is located under the detection sensor of the photoelectric detector; the distance between a detection sensor of the photoelectric detector and the adjusting panel is variable; the adjusting panel is a placement platform for placing an optical cable to be evaluated; the placement platform is provided with at least two optical cable grooves. The photoelectric detector is a photoelectric signal conversion device; the coupler comprises a pin and a shell. The device is safe to operate, simple in structure and comprehensive in function, an adjusting panel is not arranged, a knocking point is accurately positioned, then the position of an optical cable is determined, and time and labor are saved.

Description

Technical Field

[0001] The present application relates to the technical field of optical cable fault monitoring, and in particular to a multifunctional survey instrument integrated detection device. Background Art

[0002] At present, driven by the continuous development of power grid automation construction, the application scope of fiber-optic communication technology in the power communication industry is becoming wider and wider. Fiber-optic communication technology is used to connect optical cable lines between various sites in the power grid system, thereby realizing real-time power communication at each site and ensuring the normal operation of power grid automation.

[0003] However, there are some defects in the optical cable survey device used in the prior art. For example, the optical cable survey device on the market is unsafe to operate, has a complex structure, is troublesome to work, has incomplete functions, is large in size, is not equipped with an adjustment panel, cannot accurately hear the knocking point, and thus cannot determine the location of the optical cable, wasting time and labor. Therefore, we propose a multifunctional survey device with integrated detection. Summary of the invention

[0004] To achieve the above objectives, this application provides the following technical solutions:

[0005] According to a first aspect of the present invention, the present invention claims protection for a multifunctional census instrument integrated detection integrated device, comprising: a test acquisition module, a test determination module, a candidate acquisition module, a candidate determination module and a third determination module;

[0006] The multifunctional survey instrument comprises a photoelectric detector, an adjustment panel, a light source and a coupler, wherein the detection sensor of the photoelectric detector faces downward and the adjustment panel is located directly below the detection sensor of the photoelectric detector;

[0007] The distance between the detection sensor of the photoelectric detector and the adjustment panel is variable;

[0008] The adjustment panel is a placement platform for placing the optical cable to be evaluated;

[0009] The placement platform is provided with at least two optical cable troughs;

[0010] The photoelectric detector is a photoelectric signal conversion device;

[0011] The coupler is a pin and a shell;

[0012] The test acquisition module acquires the test surveyed knocking point data and the associated knocking point location data obtained by the multifunctional survey instrument and associated with the optical cable to be evaluated;

[0013] The test determination module determines the impact of the striking point on tunnel safety data associated with the optical cable to be evaluated based on the striking point location data;

[0014] The candidate acquisition module acquires candidate surveyed knock point data obtained by the multifunctional survey instrument and sequentially associated with each candidate optical cable among multiple candidate optical cables; wherein the candidate optical cable is an optical cable that contains the same concerned knock point affecting tunnel safety data as the optical cable to be evaluated;

[0015] The candidate determination module determines the abnormal stage repetition of the knocking point between each candidate optical cable and the optical cable to be evaluated in turn according to the knocking point data of each candidate surveyed and the knocking point data of the test surveyed, including:

[0016] Determine the test knock point placement data by testing the surveyed knock point data; wherein the test knock point placement data includes the test knock point date data sequentially associated with each test knock point placement; for each candidate optical cable, calculate the candidate knock point placement data associated with the candidate optical cable by the candidate surveyed knock point data associated with the candidate optical cable; wherein the candidate knock point placement data includes the candidate knock point date data sequentially associated with each candidate knock point placement; determine the abnormal stage repetition of the knock points between the candidate optical cable and the optical cable to be evaluated according to the test knock point date data sequentially associated with each test knock point placement and the candidate knock point date data sequentially associated with each candidate knock point placement associated with the candidate optical cable, and obtain the abnormal stage repetition of the knock points between each candidate optical cable and the optical cable to be evaluated;

[0017] The test tap point date data includes the test tap point frequency and the test tap point date segment; the candidate tap point date data includes the candidate tap point frequency and the candidate tap point date segment;

[0018] Obtain the intersection of the test knock point placement position and the candidate knock point placement position associated with the candidate optical cable to obtain a key knock point placement position set associated with the candidate optical cable; obtain the absolute knock point abnormal stage of the optical cable to be evaluated and the absolute knock point abnormal stage of the candidate optical cable associated with each key knock point placement position in the key knock point placement position set;

[0019] Among them, the abnormal stage of the absolute knocking point of the optical cable to be evaluated is the percentage of the test knocking point frequency associated with the key knocking point placement position to the sum of the test knocking point frequencies associated with each test knocking point placement position in sequence;

[0020] The abnormal stage of the absolute knocking point of the candidate optical cable is the percentage of the candidate knocking point frequency associated with the key knocking point placement position to the sum of the candidate knocking point frequencies associated with each candidate knocking point placement position in sequence; the absolute characteristic difference value between the candidate optical cable and the optical cable to be evaluated is obtained;

[0021] Among them, the absolute characteristic difference value is the absolute value of the difference between the total absolute knocking point abnormal stage of the optical cable to be evaluated and the total absolute knocking point abnormal stage of the candidate optical cable. The total absolute knocking point abnormal stage of the optical cable to be evaluated is the sum of the absolute knocking point abnormal stages of the optical cable to be evaluated that are sequentially associated with each key knocking point placement position, and the total absolute knocking point abnormal stage of the candidate optical cable is the sum of the absolute knocking point abnormal stages of the candidate optical cables that are sequentially associated with each key knocking point placement position.

[0022] Obtain the abnormal knocking point stages associated with the optical cable to be evaluated and the abnormal knocking point stages associated with the candidate optical cables, which are sequentially associated with each key knocking point placement position in the key knocking point placement position set; wherein, the abnormal knocking point stage associated with the optical cable to be evaluated is the ratio of the absolute abnormal knocking point stage of the optical cable to be evaluated associated with the key knocking point placement position to the sum of the absolute abnormal knocking point stages of the optical cable to be evaluated associated with each key knocking point placement position; the abnormal knocking point stage associated with the candidate optical cable is the ratio of the absolute abnormal knocking point stage of the candidate optical cable associated with the key knocking point placement position to the sum of the absolute abnormal knocking point stages of the candidate optical cables associated with each key knocking point placement position; obtain the associated characteristic difference value between the candidate optical cable and the optical cable to be evaluated;

[0023] Among them, the associated feature difference value is the sum of the associated abnormal stage differences associated with each key knocking point placement position, and the associated abnormal stage difference associated with the key knocking point placement position is the absolute value of the difference between the abnormal stage of the knocking point associated with the optical cable to be evaluated and the abnormal stage of the knocking point associated with the candidate optical cable; the absolute feature difference value is multiplied by the associated feature difference value to obtain the feature difference degree associated with the candidate optical cable; the knocking point abnormal stage repetition between the candidate optical cable and the optical cable to be evaluated is determined based on the feature difference degree, including:

[0024] Obtaining the repetition of the placement of the knocking points between the candidate optical cable and the optical cable to be evaluated; wherein the repetition of the placement of the knocking points is the percentage of the number of the placement of the key knocking points between the optical cable to be evaluated and the candidate optical cable to the total number of the placement of the knocking points;

[0025] The total number of knock point placement positions is the number of knock point placement positions in the union of the test knock point placement position and the candidate knock point placement positions associated with the candidate optical cable; the product of the knock point placement repetition and the characteristic difference is taken as the knock point abnormal stage repetition between the candidate optical cable and the optical cable to be evaluated;

[0026] The third determination module repeatedly determines a predicted fault anomaly associated with at least one optical cable to be evaluated from the candidate optical cables through the knocking point anomaly stage, including:

[0027] Repeatedly adjust each candidate optical cable according to the abnormal stage of each knocking point to obtain test candidate adjustment data;

[0028] Determine the current candidate optical cable by testing the candidate adjustment data;

[0029] Determine the repetition of the knock point state associated with the current candidate optical cable through the test knock point date segment and the candidate knock point date segment associated with each key knock point placement position in the key knock point data set associated with the current candidate optical cable;

[0030] The tap point state repetition is the ratio of the total recurrence frequency to the total tap point frequency, the total recurrence frequency is the sum of the recurrence frequencies between the test tap point date segment and the candidate tap point date segment associated with each key tap point placement position, and the total tap point frequency is the sum of the larger value of the test tap point frequency and the candidate tap point frequency associated with each key tap point placement position;

[0031] Determine whether the state repetition of the tap point meets the state repetition upper limit;

[0032] If the state repetition of the tapping point meets the state repetition upper limit, the current candidate optical cable is determined as a predicted fault anomaly, and it is determined whether a preset number of predicted fault anomalies have been determined;

[0033] If the predicted fault anomaly of the preset predicted fault anomaly number is not determined, the next candidate optical cable of the current candidate optical cable is determined as the current candidate optical cable through the test candidate adjustment data, and the step of determining the knock point state associated with the current candidate optical cable through the test knock point date segment and the candidate knock point date segment associated with each key knock point placement position in the key knock point data set associated with the current candidate optical cable is repeated;

[0034] If the state repetition of the knock point does not meet the state repetition upper limit, the next candidate optical cable of the current candidate optical cable is determined as the current candidate optical cable through the test candidate adjustment data, and the step of determining the state repetition of the knock point associated with the current candidate optical cable through the test knock point date segment and the candidate knock point date segment associated with each key knock point placement position in the key knock point data set associated with the current candidate optical cable is continued.

[0035] The present application relates to the field of optical cable fault monitoring technology, and in particular to a multifunctional survey instrument integrated detection device, including: a test acquisition module, a test determination module, a candidate acquisition module, a candidate determination module and a third determination module; the multifunctional survey instrument includes a photoelectric detector, an adjustment panel, a light source and a coupler, the detection sensor of the photoelectric detector is downward, and the adjustment panel is located directly below the detection sensor of the photoelectric detector; the distance between the detection sensor of the photoelectric detector and the adjustment panel is variable; the adjustment panel is a placement platform for placing the optical cable to be evaluated; the placement platform is provided with at least two optical cable grooves; the photoelectric detector is a photoelectric signal conversion device; the coupler is a pin and a shell. The device of the present invention is safe to operate, simple in structure, comprehensive in function, and is not provided with an adjustment panel. It can accurately locate the knocking point, and then determine the location of the optical cable, saving time and labor. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] Figure 1 A flowchart of a multifunctional census instrument integrated detection device claimed in the embodiment of the present application;

[0037] Figure 2 A second working flow chart of a multifunctional census instrument integrated detection integrated device claimed in the embodiment of the present application;

[0038] Figure 3 A third working flow chart of a multifunctional census instrument integrated detection integrated device claimed in the embodiment of the present application;

[0039] Figure 4 A fourth working flow chart of a multifunctional census instrument integrated detection integrated device claimed in the embodiment of the present application;

[0040] Figure 5 A schematic diagram of the stages of pressure sores in a multifunctional screening instrument with integrated detection device as claimed in an embodiment of the present application. DETAILED DESCRIPTION

[0041] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0042] The terms "first", "second" and "third" in this application are only used for descriptive purposes, and cannot be understood as indicating or implying the importance of association or implicitly indicating the number of technical features indicated. Thus, the features defined as "first", "second" and "third" can explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined. All directional indications in the embodiments of the present application (such as up, down, left, right, front, back...) are only used to explain the associated positional relationship, movement, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication also changes accordingly. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or modules is not limited to the listed steps or modules, but optionally also includes steps or modules that are not listed, or optionally also includes other steps or modules inherent to these processes, methods, products or devices.

[0043] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0044] The present invention seeks to protect a multifunctional survey instrument, characterized in that it comprises: a photoelectric detector, an adjustment panel and a coupler, wherein the detection sensor of the photoelectric detector is downward, and the adjustment panel is located directly below the detection sensor of the photoelectric detector;

[0045] The distance between the detection sensor of the photoelectric detector and the adjustment panel is variable;

[0046] The adjustment panel is a translation sliding structure;

[0047] The detector also includes a placement platform for placing the optical cable to be evaluated;

[0048] The placement platform is also provided with at least two optical cable troughs;

[0049] The photodetector is a photoelectric signal conversion device;

[0050] The coupler is a pin and a housing;

[0051] The detector also includes a light source.

[0052] The user uses a camera to detect the photo of the fault point, and the artificial intelligence detection module will automatically detect the size of the fault point and determine the stage of the fault point based on a specific algorithm. The user can view the test results through a mobile phone or computer and get related treatment suggestions.

[0053] See also Figure 1 , Figure 1 A flow chart of a method for predicting fault anomalies based on a multifunctional census instrument is provided for one embodiment of the present application. In a specific implementation, the executor of the method may be a back-end server that is communicatively connected to the multifunctional census instrument. The method specifically includes the following steps S101 to S105.

[0054] Step S101, obtaining the tested knocking point data and the associated knocking point location data obtained by the multifunctional inspection instrument associated with the optical cable to be evaluated.

[0055] The optical cable to be evaluated refers to the optical cable for which fault anomaly prediction is performed; the tested surveyed tapping point data refers to the tapping point data acquired by the multifunctional survey instrument during the surveyed tapping point process of the optical cable to be evaluated; in specific implementation, the tested surveyed tapping point data may specifically include the tapping point placement data of the optical cable to be evaluated and the tapping point date data associated with the tapping point placement data. The tapping point date data may include the tapping point frequency data and the tapping point date segment data.

[0056] The striking point location data is the location data of each striking point in the surveyed striking point data when the optical cable to be evaluated is placed during the test. In order to accurately reflect the striking point location of the optical cable, in specific implementation, it can be real-time location data.

[0057] To ensure the validity of the data, the tested surveyed tapping point data may be surveyed tapping point data within a preset date range from the current one, and the preset date range may be determined based on actual conditions.

[0058] Step S102: Determine the impact of the striking points on tunnel safety data associated with the optical cable to be evaluated based on the striking point location data.

[0059] Among them, the concerned knocking point affecting tunnel safety data is used to indicate the main knocking points of the optical cable to be evaluated that affect tunnel safety. In specific implementation, if the knocking point location data is the real-time location data when the optical cable to be evaluated knocks, the real-time location data can be associated with the location that affects tunnel safety, and the total frequency of knocking points associated with each impacting tunnel safety can be calculated, and then the knocking point with the highest total frequency that affects tunnel safety can be taken as the concerned knocking point affecting tunnel safety data associated with the optical cable to be evaluated; or one or more large-scale impacting tunnel safety collections with a higher total frequency can be determined as the concerned knocking point affecting tunnel safety data associated with the optical cable to be evaluated.

[0060] Step S103, obtaining candidate surveyed striking point data obtained by the multifunctional survey instrument and sequentially associated with each candidate optical cable among multiple candidate optical cables; the candidate optical cable is an optical cable that contains consistent striking points of interest affecting tunnel safety data with the optical cable to be evaluated.

[0061] Specifically, the tunnel safety data of the concerned knocking points associated with the remaining optical cables can be obtained, and then the optical cables that contain the concerned knocking points affecting tunnel safety data consistent with the optical cable to be evaluated are determined as candidate optical cables. On this basis, the candidate surveyed knocking point data associated with each candidate optical cable are obtained in turn.

[0062] Among them, the candidate surveyed tapping point data is the tapping point data obtained by the worn multifunctional survey instrument during the surveyed tapping point process of the candidate optical cable.

[0063] Step S104, determining in sequence based on the candidate investigated tapping point data and the test investigated tapping point data, whether the abnormal stage of the tapping point between each candidate optical cable and the optical cable to be evaluated is repeated.

[0064] Among them, the repetition of the abnormal stage of the knocking point reflects the repetition of the knocking point placement position of the optical cable to be evaluated and the candidate optical cable in the abnormal stage, which can reflect the degree of reproducibility of the knocking points between the optical cable to be evaluated and the candidate optical cable. In this embodiment, the data reflecting the characteristics of the knocking points of the optical cable to be evaluated are the test surveyed knocking point data, and the data reflecting the characteristics of the knocking points of the candidate optical cables are the candidate surveyed knocking point data. By analyzing the test surveyed knocking point data and the candidate surveyed knocking point data sequentially associated with each candidate optical cable, the repetition of the abnormal stage of the knocking points between the optical cable to be evaluated and each candidate optical cable can be determined.

[0065] In the specific implementation, the test knock point placement position is the knock point placement position included in the test surveyed knock point data associated with the optical cable to be evaluated, and the number of test knock point placement positions is one or more; the candidate knock point placement position is the knock point placement position included in the candidate surveyed knock point data associated with the candidate optical cable, and the number of candidate knock point placement positions is one or more.

[0066] Considering that the abnormal stage of the optical cable at a certain knocking point placement position is also related to the knocking point date of the optical cable at the knocking point placement position, based on this, in one embodiment, if Figure 2 As shown in FIG. 1 , step S104 specifically includes the following steps S201 to S203 .

[0067] Step S201, determining test tapping point placement data by testing the surveyed tapping point data; the test tapping point placement data includes the test tapping point date data sequentially associated with each test tapping point placement.

[0068] The test tapping point placement positions are the tapping point placement positions included in the surveyed test tapping point data associated with the optical cable to be evaluated, and the number of the test tapping point placement positions is one or more.

[0069] Step S202: for each candidate optical cable, calculate candidate knock point placement data associated with the candidate optical cable through candidate surveyed knock point data associated with the candidate optical cable; the candidate knock point placement data includes candidate knock point date data sequentially associated with each candidate knock point placement.

[0070] The candidate knock point placement positions are the knock point placement positions included in the candidate surveyed knock point data associated with the candidate optical cable, and the number of the candidate knock point placement positions is one or more.

[0071] Step S203, determine the repetition of abnormal stages of the knocking points between the candidate optical cable and the optical cable to be evaluated based on the test knocking point date data sequentially associated with each test knocking point placement position and the candidate knocking point date data sequentially associated with each candidate knocking point placement position associated with the candidate optical cable, and obtain the repetition of abnormal stages of the knocking points between each candidate optical cable and the optical cable to be evaluated.

[0072] In this embodiment, after obtaining the test knock point date data that are sequentially associated with each test knock point placement position reflecting the optical cable knock point, and the candidate knock point date data that are sequentially associated with each candidate knock point placement position reflecting the candidate optical cable knock point, the test knock point date data that are sequentially associated with each test knock point placement position and the candidate knock point date data that are distributed and associated with each candidate knock point placement position can be used for analysis to determine the repetition of abnormal knock point stages between the candidate optical cable and the optical cable to be evaluated, and then determine the repetition of abnormal knock point stages between each candidate optical cable and the optical cable to be evaluated.

[0073] like Figure 3 As shown in, the above step S203 can be specifically implemented by the following steps S301 to S304:

[0074] Step S301: Obtain the intersection of the test striking point placement positions and the candidate striking point placement positions associated with the candidate optical cable to obtain a key striking point placement position set associated with the candidate optical cable.

[0075] In this embodiment, the test knock point placement position is the knock point placement position associated with the optical cable to be evaluated, and the candidate knock point placement position is the knock point placement position associated with the candidate optical cable. The intersection of the test knock point placement position and the candidate knock point placement position is calculated, and the obtained data is the consistent knock point placement position set contained in the candidate optical cable and the key optical cable, which serves as the key knock point placement position set associated with the candidate optical cable.

[0076] Step S302: Obtain the absolute striking point abnormality stage of the optical cable to be evaluated and the absolute striking point abnormality stage of the candidate optical cable that are sequentially associated with each key striking point placement position in the key striking point placement set.

[0077] Among them, the absolute knock point abnormal stage of the optical cable to be evaluated is the absolute knock point abnormal stage associated with the optical cable to be evaluated, and the absolute knock point abnormal stage of the candidate optical cable is the absolute knock point abnormal stage associated with the candidate optical cable. Specifically, the absolute knock point abnormal stage of the optical cable to be evaluated is the percentage of the test knock point frequency associated with the key knock point placement position to the sum of the test knock point frequencies associated with each test knock point placement position in sequence; the absolute knock point abnormal stage of the candidate optical cable is the percentage of the candidate knock point frequency associated with the key knock point placement position to the sum of the candidate knock point frequencies associated with each candidate knock point placement position in sequence.

[0078] Step S303: Obtain the absolute characteristic difference value between the candidate optical cable and the optical cable to be evaluated.

[0079] Among them, the absolute characteristic difference value is the absolute value of the difference between the total absolute knocking point abnormal stage of the optical cable to be evaluated and the total absolute knocking point abnormal stage of the candidate optical cable. The total absolute knocking point abnormal stage of the optical cable to be evaluated is the sum of the absolute knocking point abnormal stages of the optical cables to be evaluated that are sequentially associated with each key knocking point placement position, and the total absolute knocking point abnormal stage of the candidate optical cables is the sum of the total absolute knocking point abnormal stages of the candidate optical cables that are sequentially associated with each key knocking point placement position.

[0080] In this embodiment, after obtaining the absolute striking point abnormality stage of the optical cable to be evaluated and the absolute striking point abnormality stage of the candidate optical cable associated with each key striking point placement position, the absolute characteristic difference value between the candidate optical cable and the candidate optical cable is determined based on the difference in the absolute striking point abnormality stage of the optical cable to be evaluated and the candidate optical cable at the key striking point placement positions.

[0081] In this embodiment, the absolute knock point abnormal stage is calculated by the ratio of the frequency of the optical cable at a key knock point placement position to the total frequency at all knock point placement positions, which reflects the abnormal stage degree of the optical cable at the key knock point placement position among all knock point placement positions of the optical cable. Since the optical cable to be evaluated and the candidate optical cable may have multiple key placement positions, the absolute knock point abnormal stages associated with each key knock point placement position are further summed to obtain the total absolute knock point abnormal stage of the optical cable to be evaluated or the total absolute knock point abnormal stage of the candidate optical cable, so as to comprehensively consider the abnormal stages of the optical cable at multiple key knock point placement positions. On this basis, the total absolute abnormal stage of the optical cable to be evaluated, which represents the abnormal stage of the optical cable to be evaluated for each key knocking point placement position, is subtracted from the total absolute abnormal stage of the candidate optical cable, which represents the abnormal stage of the candidate optical cable for each key knocking point placement position, and the absolute value is taken to obtain the difference in the abnormal stage of the key knocking point placement position set as a whole between the optical cable to be evaluated and the candidate optical cable, that is, the absolute feature difference value, when all the knocking point placement positions of the optical cable are considered. It can be understood that the smaller the absolute feature difference value, the smaller the difference in the abnormal stage of the key knocking point placement position set between the optical cable to be evaluated and the candidate optical cable, and the higher the repetition of the abnormal stage of the key knocking point placement position set between the optical cable to be evaluated and the candidate optical cable.

[0082] Step S304, determining the abnormality stage of the knocking point between the candidate optical cable and the optical cable to be evaluated based on the absolute characteristic difference value, and repeating.

[0083] In this embodiment, the absolute feature difference value can reflect the difference in feature degree between the optical cable to be evaluated and the candidate optical cable in the key striking point placement bit set, and thus the abnormal stage repetition of the striking point between the candidate optical cable and the optical cable to be evaluated can be determined based on the absolute feature difference value.

[0084] In practical applications, in order to make the obtained knock point abnormal phase repetition more accurately reflect the degree of reproducibility of the knock point abnormal phase between the optical cable to be evaluated and the candidate optical cable, the degree of reproducibility of the knock point abnormal phase between the optical cable to be evaluated and the candidate optical cable in the key knock point placement set may be further considered. For example, in one embodiment, Figure 4 As shown in FIG. 1 , the following steps S401 to S402 may be included before step S304.

[0085] Step S401, obtaining abnormal stages of the knocking points associated with the optical cables to be evaluated and abnormal stages of the knocking points associated with the candidate optical cables in sequence in the key knocking point placement set.

[0086] Among them, the abnormal stage of the knocking point associated with the optical cable to be evaluated is the abnormal stage of the associated knocking point associated with the optical cable to be evaluated, and the abnormal stage of the knocking point associated with the candidate optical cable is the abnormal stage of the associated knocking point associated with the candidate optical cable; the abnormal stage of the associated knocking point associated with the key knocking point placement position reflects the abnormal stage of the knocking point of the optical cable at the key knocking point placement position among all the key knocking point placement positions of the optical cable, and the abnormal stage of the associated knocking point can be specifically determined according to the absolute knocking point abnormal stage associated with each key knocking point placement position. Specifically, the abnormal stage of the knocking point associated with the optical cable to be evaluated is the ratio of the absolute knocking point abnormal stage of the optical cable to be evaluated associated with the key knocking point placement position to the sum of the absolute knocking point abnormal stages of the optical cable to be evaluated associated with each key knocking point placement position; the abnormal stage of the knocking point associated with the candidate optical cable is the ratio of the absolute knocking point abnormal stage of the candidate optical cable associated with the key knocking point placement position to the sum of the absolute knocking point abnormal stages of the candidate optical cables associated with each key knocking point placement position.

[0087] Step S402: Obtain the correlation feature difference value between the candidate optical cable and the optical cable to be evaluated.

[0088] Among them, the associated feature difference value is the sum of the associated abnormal stage differences associated with each key knocking point placement position, and the associated abnormal stage difference associated with the key knocking point placement position is the absolute value of the difference between the associated knocking point abnormal stage of the optical cable to be evaluated associated with the key knocking point placement position and the associated knocking point abnormal stage of the candidate optical cable.

[0089] In this embodiment, after obtaining the abnormal stages of the associated striking points of the optical cable to be evaluated and the abnormal stages of the associated striking points of the candidate optical cables associated with each key striking point placement position, the associated characteristic difference values ​​between the candidate optical cables are determined based on the differences in the abnormal stages of the associated striking points of the optical cable to be evaluated and the candidate optical cables at the key striking point placement positions.

[0090] In the present embodiment, the abnormal stage of the associated knocking point is calculated by the ratio of the frequency of the optical cable on a key knocking point placement position to the total frequency on all key knocking point placement positions, which reflects the abnormal stage degree of the optical cable to the key knocking point placement position in the key knocking point placement position. By performing difference calculation on the associated abnormal stage of the optical cable to be evaluated and the candidate optical cable at the same key knocking point placement position, it is possible to determine the difference in the associated abnormal stage between the optical cable to be evaluated and the candidate optical cable associated with each key knocking point placement position in all key knocking point placement positions (i.e., the associated abnormal stage difference), and further, the associated abnormal stage difference associated with each key knocking point placement position is added to obtain the associated feature difference value that integrates the associated abnormal stage differences of various key knocking point placement positions. It can be understood that the lower the associated feature difference value, the higher the consistency of the abnormal stage degree of the optical cable to be evaluated and the candidate optical cable on the key knocking point placement position for all key knocking point placement positions.

[0091] In this embodiment, three factors related to the repetition of the abnormal stage of the knocking point: the associated feature difference value, the absolute feature difference value, and the repetition of the knocking point placement position are multiplied together, and the product obtained is used as the repetition of the abnormal stage of the knocking point between the optical cable to be evaluated and the candidate optical cable. Multiple factors are combined to determine the repetition of the abnormal stage of the knocking point, which improves the scientificity and accuracy of the repetition of the abnormal stage of the knocking point, and is conducive to determining more accurate predicted fault anomalies.

[0092] Step S105: Repeat the tapping point anomaly stage to determine a predicted fault anomaly associated with at least one optical cable to be evaluated from the candidate optical cables.

[0093] In a specific implementation, after determining the knock point abnormal phase repetitions between each candidate optical cable and the optical cable to be evaluated, each candidate optical cable can be adjusted according to the knock point abnormal phase repetition order from high to low to obtain the knock point abnormal phase repetition adjustment data, and the N candidate optical cables ranked in front are determined as the predicted fault abnormalities associated with the optical cable to be evaluated according to the knock point abnormal phase repetition adjustment data, wherein N is the number of predicted fault abnormalities.

[0094] Taking into account the differences in the knock point date segments of the optical cables, and facilitating the knock point of the optical cable to be evaluated to be associated with the predicted fault anomaly, in one embodiment, the test knock point date data also includes the test knock point date segment, and the candidate knock point date data also includes the candidate knock point date segment. Step S105 can also be implemented according to the following steps:

[0095] Repeatedly adjust each candidate optical cable according to the abnormal stage of each knocking point to obtain test candidate adjustment data;

[0096] Determine the current candidate optical cable by testing the candidate adjustment data;

[0097] Determine the repetition of the knock point state associated with the current candidate optical cable through the test knock point date segment associated with each key knock point placement position and the candidate knock point date segment in the key knock point data set associated with the current candidate optical cable; wherein the knock point state repetition is the ratio of the total recurrence frequency to the total knock point frequency, the total recurrence frequency is the sum of the recurrence frequencies between the test knock point date segment associated with each key knock point placement position and the candidate knock point date segment, and the total knock point frequency is the sum of the larger values ​​of the test knock point frequency associated with each key knock point placement position and the candidate knock point frequency;

[0098] Determine whether the state repetition of the tap point meets the state repetition upper limit;

[0099] If the state repetition of the tapping point meets the state repetition upper limit, the current candidate optical cable is determined as a predicted fault anomaly, and it is determined whether a preset number of predicted fault anomalies have been determined;

[0100] If the predicted fault anomaly of the preset predicted fault anomaly number is not determined, the next candidate optical cable of the current candidate optical cable is determined as the current candidate optical cable through the test candidate adjustment data, and the step of determining the knock point state associated with the current candidate optical cable through the test knock point date segment and the candidate knock point date segment associated with each key knock point placement position in the key knock point data set associated with the current candidate optical cable is repeated;

[0101] If the state repetition of the knock point does not meet the state repetition upper limit, the next candidate optical cable of the current candidate optical cable is determined as the current candidate optical cable through the test candidate adjustment data, and the step of determining the state repetition of the knock point associated with the current candidate optical cable through the test knock point date segment and the candidate knock point date segment associated with each key knock point placement position in the key knock point data set associated with the current candidate optical cable is continued.

[0102] In the present embodiment, after determining the repetition of the abnormal stage of the knocking point between each candidate optical cable and the optical cable to be evaluated, each candidate optical cable is adjusted according to the repetition of each knocking point abnormal stage, and the current candidate optical cable is determined according to the adjustment data, and then whether the current candidate optical cable is used as the predicted fault abnormality associated with the optical cable to be evaluated is determined according to whether the knocking point state repetition associated with the current candidate optical cable meets the state repetition upper limit, thereby further determining the predicted fault abnormality according to the knocking point date period of the optical cable, which is conducive to determining the predicted fault abnormality that is most reproducible with the knocking point and knocking point state of the optical cable to be evaluated, thereby improving the accuracy and prediction effect of fault abnormality prediction, and is conducive to the knocking points of the optical cable and the predicted fault abnormality.

[0103] The repetition of the striking point status is used to measure the repetition of the striking point date segment between the candidate optical cable and the optical cable to be evaluated, and the upper limit of the status repetition can be determined according to the actual situation.

[0104] After determining the predicted fault anomaly associated with the optical cable to be evaluated, in order to facilitate communication between the optical cable to be evaluated and the predicted fault anomaly, in one embodiment, after step S105, the following steps may also be included:

[0105] Generate a medication prescription associated with the predicted fault anomaly based on the received predicted fault anomaly search request for the optical cable to be evaluated;

[0106] The medication prescription is sent to the multifunctional survey instrument associated with the optical cable to be evaluated, so that the multifunctional survey instrument associated with the optical cable to be evaluated displays the medication prescription on a display interface.

[0107] Specifically, the predicted fault anomaly search request can be triggered by the optical cable to be evaluated on the multifunctional survey instrument. After receiving the predicted fault anomaly search request for the optical cable to be evaluated, the execution subject of the present application generates a medication prescription associated with the predicted fault anomaly, and sends the medication prescription to the multifunctional survey instrument, which then displays the medication prescription on the display interface. The medication prescription is used for the optical cable to be evaluated to communicate with the predicted fault anomaly associated with the optical cable to be evaluated. Specifically, the optical cable to be evaluated can communicate with the predicted fault anomaly by leaving a message or replying.

[0108] In a specific implementation, the medication prescription associated with the predicted fault abnormality may display the tap point characteristic data associated with the predicted fault abnormality. The tap point abnormality stage data may include one or more tap point placement positions of the predicted fault abnormality stage. The one or more tap point placement positions may be determined based on the candidate surveyed tap point data associated with the predicted fault abnormality.

[0109] In summary, the present application provides a fault anomaly prediction method, device, equipment and storage medium based on a multifunctional surveyor, the method comprising: obtaining test surveyed knocking point data and associated knocking point location data obtained based on the multifunctional surveyor and associated with the optical cable to be evaluated; determining the tunnel safety data affected by the concerned knocking points associated with the optical cable to be evaluated based on the knocking point location data; obtaining candidate surveyed knocking point data obtained based on the multifunctional surveyor and associated with each candidate optical cable in a plurality of candidate optical cables in sequence; wherein the candidate optical cable is an optical cable containing consistent tunnel safety data affected by the concerned knocking points as the optical cable to be evaluated; determining the knocking point abnormality stage repetition between each candidate optical cable and the optical cable to be evaluated in sequence based on each candidate surveyed knocking point data and the test surveyed knocking point data; and determining at least one predicted fault anomaly associated with the optical cable to be evaluated from the candidate optical cables through the knocking point abnormality stage repetition. The present application determines the tunnel safety data of the optical cable's focus knocking points according to the knocking point location data associated with the surveyed knocking point data (test surveyed knocking point data) obtained by the multifunctional surveying instrument of the optical cable to be evaluated, and then determines the repetition of the abnormal stage of knocking points between each candidate optical cable and the optical cable to be evaluated based on the surveyed knocking point data (candidate surveyed knocking point data) of multiple candidate optical cables that contain consistent tunnel safety data of the focus knocking points affecting the optical cable to be evaluated and the surveyed knocking point data of the optical cable to be evaluated, thereby determining the predicted fault anomaly associated with the optical cable to be evaluated based on the repetition of the abnormal stage of knocking points between each candidate optical cable and the optical cable to be evaluated. On the one hand, it realizes the determination of the repetition of the abnormal stage of knocking points between optical cables based on the actual knocking point data of the optical cables, which is conducive to determining the actual predicted fault anomaly with a high degree of fit and improving the accuracy of fault anomaly prediction. On the other hand, the candidate optical cables and the optical cable to be evaluated contain consistent tunnel safety data of the focus knocking points affecting the optical cable.

[0110] The present application also provides a multifunctional census instrument integrated detection device, which is used to perform the steps in any of the embodiments of the above-mentioned method for predicting fault anomalies of a multifunctional census instrument. Figure 5 , Figure 5 A schematic diagram of the structure of a multifunctional census instrument integrated detection integrated device provided in an embodiment of the present application is shown. The multifunctional census instrument integrated detection integrated device specifically includes a test acquisition module 501, a test determination module 502, a candidate acquisition module 503, a candidate determination module 504 and a third determination module 505.

[0111] The test acquisition module 501 is used to obtain the test surveyed knocking point data and the associated knocking point location data obtained by the multifunctional survey instrument associated with the optical cable to be evaluated;

[0112] A test determination module 502 is used to determine the impact of the striking point on the tunnel safety data associated with the optical cable to be evaluated according to the striking point location data;

[0113] The candidate acquisition module 503 is used to obtain candidate surveyed knock point data obtained by the multifunctional survey instrument and sequentially associated with each candidate optical cable among multiple candidate optical cables; wherein the candidate optical cable is an optical cable that contains the same concerned knock point affecting the tunnel safety data as the optical cable to be evaluated;

[0114] A candidate determination module 504 is used to sequentially determine the repetition of abnormal stages of the knocking points between each candidate optical cable and the optical cable to be evaluated based on the knocking point data of each candidate surveyed and the knocking point data of the test surveyed;

[0115] The third determination module 505 is used to repeatedly determine a predicted fault anomaly associated with at least one optical cable to be evaluated from the candidate optical cables through the knocking point anomaly stage.

[0116] In one embodiment, the candidate determination module 504 may also be specifically configured to:

[0117] Determine the test knock point placement data by testing the surveyed knock point data; wherein the test knock point placement data includes the test knock point date data sequentially associated with each test knock point placement position; for each candidate optical cable, calculate the candidate knock point placement data associated with the candidate optical cable by the candidate surveyed knock point data associated with the candidate optical cable; wherein the candidate knock point placement data includes the candidate knock point date data sequentially associated with each candidate knock point placement position; determine the abnormal stage repetition of the knock points between the candidate optical cable and the optical cable to be evaluated based on the test knock point date data sequentially associated with each test knock point placement position and the candidate knock point date data sequentially associated with each candidate knock point placement position associated with the candidate optical cable, and obtain the abnormal stage repetition of the knock points between each candidate optical cable and the optical cable to be evaluated.

[0118] In one embodiment, the test knock point date data includes the test knock point frequency; the candidate knock point date data includes the candidate knock point frequency; the candidate determination module 504 can also be specifically used to: obtain the intersection of the test knock point placement position and the candidate knock point placement position associated with the candidate optical cable, and obtain the key knock point placement position set associated with the candidate optical cable; obtain the absolute knock point abnormal stage of the optical cable to be evaluated and the absolute knock point abnormal stage of the candidate optical cable associated with each key knock point placement position in the key knock point placement position set; wherein the absolute knock point abnormal stage of the optical cable to be evaluated is the percentage of the test knock point frequency associated with the key knock point placement position to the sum of the test knock point frequencies associated with each test knock point placement position in sequence; the absolute knock point abnormal stage of the candidate optical cable is The percentage of the candidate knock point frequency associated with the key knock point placement position to the sum of the candidate knock point frequencies associated with each candidate knock point placement position in sequence; the absolute characteristic difference value between the candidate optical cable and the optical cable to be evaluated is obtained; wherein the absolute characteristic difference value is the absolute value of the difference between the total absolute knock point abnormal stage of the optical cable to be evaluated and the total absolute knock point abnormal stage of the candidate optical cable, the total absolute knock point abnormal stage of the optical cable to be evaluated is the sum of the absolute knock point abnormal stages of the optical cable to be evaluated associated with each key knock point placement position in sequence, and the total absolute knock point abnormal stage of the candidate optical cable is the sum of the absolute knock point abnormal stages of the candidate optical cables associated with each key knock point placement position in sequence; the repetition of the knock point abnormal stage between the candidate optical cable and the optical cable to be evaluated is determined based on the absolute characteristic difference value.

[0119] In one embodiment, the candidate determination module 504 can also be specifically used to: obtain the abnormal knocking point stages associated with the optical cable to be evaluated and the abnormal knocking point stages associated with the candidate optical cables in sequence in the key knocking point placement position set; wherein the abnormal knocking point stages associated with the optical cable to be evaluated are the ratio of the absolute abnormal knocking point stages of the optical cable to be evaluated associated with the key knocking point placement positions to the sum of the absolute abnormal knocking point stages of the optical cable to be evaluated associated with each key knocking point placement position; the abnormal knocking point stages associated with the candidate optical cables are the ratio of the absolute abnormal knocking point stages of the candidate optical cables associated with the key knocking point placement positions to the sum of the absolute abnormal knocking point stages of the optical cables to be evaluated associated with each key knocking point placement position. The ratio of the sum of the absolute knocking point abnormal stages of the optical cable; obtaining the associated feature difference value between the candidate optical cable and the optical cable to be evaluated; wherein the associated feature difference value is the sum of the associated abnormal stage differences associated with each key knocking point placement position, and the associated abnormal stage difference associated with the key knocking point placement position is the absolute value of the difference between the associated knocking point abnormal stage of the optical cable to be evaluated associated with the key knocking point placement position and the associated knocking point abnormal stage of the candidate optical cable; multiplying the absolute feature difference value by the associated feature difference value to obtain the feature difference degree associated with the candidate optical cable; determining the repetition of the knocking point abnormal stage between the candidate optical cable and the optical cable to be evaluated based on the feature difference degree.

[0120] In one embodiment, the candidate determination module 504 can also be specifically used to: obtain the repetition of the knock point placement positions between the candidate optical cable and the optical cable to be evaluated; wherein the knock point placement position repetition is the percentage of the number of key knock point placement positions between the optical cable to be evaluated and the candidate optical cable to the total number of knock point placement positions; wherein the total number of knock point placement positions is the number of knock point placement positions in the union of the test knock point placement positions and the candidate knock point placement positions associated with the candidate optical cable; and the product of the knock point placement repetition and the feature difference is taken as the abnormal stage repetition of the knock point between the candidate optical cable and the optical cable to be evaluated.

[0121] In one embodiment, the test tap point date data further includes a test tap point date segment, and the candidate tap point date data further includes a candidate tap point date segment; the candidate determination module 504 may also be specifically used to:

[0122] Repeatedly adjust each candidate optical cable according to the abnormal stage of each knocking point to obtain test candidate adjustment data;

[0123] Determine the current candidate optical cable by testing the candidate adjustment data;

[0124] Determine the repetition of the knock point state associated with the current candidate optical cable through the test knock point date segment associated with each key knock point placement position and the candidate knock point date segment in the key knock point data set associated with the current candidate optical cable; wherein the knock point state repetition is the ratio of the total recurrence frequency to the total knock point frequency, the total recurrence frequency is the sum of the recurrence frequencies between the test knock point date segment associated with each key knock point placement position and the candidate knock point date segment, and the total knock point frequency is the sum of the larger values ​​of the test knock point frequency associated with each key knock point placement position and the candidate knock point frequency;

[0125] Determine whether the state repetition of the tap point meets the state repetition upper limit;

[0126] If the state repetition of the tapping point meets the state repetition upper limit, the current candidate optical cable is determined as a predicted fault anomaly, and it is determined whether a preset number of predicted fault anomalies have been determined;

[0127] If the predicted fault anomaly of the preset predicted fault anomaly number is not determined, the next candidate optical cable of the current candidate optical cable is determined as the current candidate optical cable through the test candidate adjustment data, and the step of determining the knock point state associated with the current candidate optical cable through the test knock point date segment and the candidate knock point date segment associated with each key knock point placement position in the key knock point data set associated with the current candidate optical cable is repeated;

[0128] If the state repetition of the knock point does not meet the state repetition upper limit, the next candidate optical cable of the current candidate optical cable is determined as the current candidate optical cable through the test candidate adjustment data, and the step of determining the state repetition of the knock point associated with the current candidate optical cable through the test knock point date segment and the candidate knock point date segment associated with each key knock point placement position in the key knock point data set associated with the current candidate optical cable is continued.

[0129] In one embodiment, the multifunctional census instrument integrated detection integrated device further includes a display module, and the display module is used to:

[0130] Based on the received predicted fault anomaly search request for the optical cable to be evaluated, a medication prescription associated with the predicted fault anomaly is generated; the medication prescription is sent to the multifunctional survey instrument associated with the optical cable to be evaluated, so that the multifunctional survey instrument associated with the optical cable to be evaluated displays the medication prescription on a display interface.

[0131] In the several embodiments provided in the present application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of modules is only a logical function division. There may be other division methods in actual implementation, such as multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or modules, which can be electrical, mechanical or other forms.

[0132] In addition, each functional module in each embodiment of the present application can be integrated into a processing module, or each module can exist physically separately, or two or more modules can be integrated into one module. The above integrated modules can be implemented in the form of hardware or in the form of software functional modules. The above is only an implementation method of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the specification and drawings of this application, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.

[0133] The specific implementation methods of the invention are described in detail above, but they are only examples, and the present application is not limited to the specific implementation methods described above. For those skilled in the art, any equivalent modification or substitution of the invention is also within the scope of the present application, and therefore, the equalization, modification, and improvement made without departing from the spirit and principle of the present application should be included in the scope of the present application.

Claims

1. A multifunctional census instrument integrated detection device, characterized in that: include: A test acquisition module, a test determination module, a candidate acquisition module, a candidate determination module and a third determination module; The multifunctional survey instrument comprises a photoelectric detector, an adjustment panel, a light source and a coupler, wherein the detection sensor of the photoelectric detector faces downward and the adjustment panel is located directly below the detection sensor of the photoelectric detector; The distance between the detection sensor of the photoelectric detector and the adjustment panel is variable; The adjustment panel is a placement platform for placing the optical cable to be evaluated; The placement platform is provided with at least two optical cable troughs; The photoelectric detector is a photoelectric signal conversion device; The coupler is a pin and a shell; The test acquisition module acquires the test surveyed knocking point data and the associated knocking point location data obtained by the multifunctional survey instrument and associated with the optical cable to be evaluated; The test determination module determines the impact of the striking point on tunnel safety data associated with the optical cable to be evaluated based on the striking point location data; The candidate acquisition module obtains candidate surveyed striking point data obtained by a multifunctional survey instrument and sequentially associated with each candidate optical cable among multiple candidate optical cables; wherein the candidate optical cable is an optical cable that contains consistent striking points of interest that affect tunnel safety data with the optical cable to be evaluated.

2. The multifunctional census instrument integrated detection device according to claim 1, characterized in that: The candidate determination module determines the abnormal stage repetition of the knocking point between each candidate optical cable and the optical cable to be evaluated in turn according to the knocking point data of each candidate surveyed and the knocking point data of the test surveyed, including: Determine the test knock point placement data by testing the surveyed knock point data; wherein the test knock point placement data includes the test knock point date data sequentially associated with each test knock point placement; for each candidate optical cable, calculate the candidate knock point placement data associated with the candidate optical cable by the candidate surveyed knock point data associated with the candidate optical cable; wherein the candidate knock point placement data includes the candidate knock point date data sequentially associated with each candidate knock point placement; determine the abnormal stage repetition of the knock points between the candidate optical cable and the optical cable to be evaluated according to the test knock point date data sequentially associated with each test knock point placement and the candidate knock point date data sequentially associated with each candidate knock point placement associated with the candidate optical cable, and obtain the abnormal stage repetition of the knock points between each candidate optical cable and the optical cable to be evaluated; The test tap point date data includes the test tap point frequency and the test tap point date segment; the candidate tap point date data includes the candidate tap point frequency and the candidate tap point date segment; Obtain the intersection of the test knock point placement position and the candidate knock point placement position associated with the candidate optical cable to obtain a key knock point placement position set associated with the candidate optical cable; obtain the absolute knock point abnormal stage of the optical cable to be evaluated and the absolute knock point abnormal stage of the candidate optical cable associated with each key knock point placement position in the key knock point placement position set; Among them, the abnormal stage of the absolute knocking point of the optical cable to be evaluated is the percentage of the test knocking point frequency associated with the key knocking point placement position to the sum of the test knocking point frequencies associated with each test knocking point placement position in sequence; The abnormal stage of the absolute knocking point of the candidate optical cable is the percentage of the candidate knocking point frequency associated with the key knocking point placement position to the sum of the candidate knocking point frequencies associated with each candidate knocking point placement position in sequence; the absolute characteristic difference value between the candidate optical cable and the optical cable to be evaluated is obtained; Among them, the absolute characteristic difference value is the absolute value of the difference between the total absolute knocking point abnormal stage of the optical cable to be evaluated and the total absolute knocking point abnormal stage of the candidate optical cable. The total absolute knocking point abnormal stage of the optical cable to be evaluated is the sum of the absolute knocking point abnormal stages of the optical cable to be evaluated that are sequentially associated with each key knocking point placement position, and the total absolute knocking point abnormal stage of the candidate optical cable is the sum of the absolute knocking point abnormal stages of the candidate optical cables that are sequentially associated with each key knocking point placement position. Obtain the abnormal knocking point stages associated with the optical cable to be evaluated and the abnormal knocking point stages associated with the candidate optical cables, which are sequentially associated with each key knocking point placement position in the key knocking point placement position set; wherein, the abnormal knocking point stage associated with the optical cable to be evaluated is the ratio of the absolute abnormal knocking point stage of the optical cable to be evaluated associated with the key knocking point placement position to the sum of the absolute abnormal knocking point stages of the optical cable to be evaluated associated with each key knocking point placement position; the abnormal knocking point stage associated with the candidate optical cable is the ratio of the absolute abnormal knocking point stage of the candidate optical cable associated with the key knocking point placement position to the sum of the absolute abnormal knocking point stages of the candidate optical cables associated with each key knocking point placement position; obtain the associated characteristic difference value between the candidate optical cable and the optical cable to be evaluated.

3. The multifunctional census instrument integrated detection device according to claim 2, characterized in that: The associated feature difference value is the sum of the associated abnormal stage differences associated with each key knocking point placement position, and the associated abnormal stage difference associated with the key knocking point placement position is the absolute value of the difference between the abnormal stage of the knocking point associated with the optical cable to be evaluated and the abnormal stage of the knocking point associated with the candidate optical cable; the absolute feature difference value is multiplied by the associated feature difference value to obtain the feature difference degree associated with the candidate optical cable; The abnormal stage of determining the knocking point between the candidate optical cable and the optical cable to be evaluated is repeated according to the characteristic difference, including: Obtaining the repetition of the placement of the knocking points between the candidate optical cable and the optical cable to be evaluated; wherein the repetition of the placement of the knocking points is the percentage of the number of the placement of the key knocking points between the optical cable to be evaluated and the candidate optical cable to the total number of the placement of the knocking points; Among them, the total number of knock point placement positions is the number of knock point placement positions in the union of the test knock point placement position and the candidate knock point placement positions associated with the candidate optical cable; the product of the knock point placement repetition and the characteristic difference is taken as the knock point abnormal stage repetition between the candidate optical cable and the optical cable to be evaluated.

4. The multifunctional census instrument integrated detection device according to claim 3, characterized in that: The third determination module repeatedly determines a predicted fault anomaly associated with at least one optical cable to be evaluated from the candidate optical cables through the knocking point anomaly stage, including: Repeatedly adjust each candidate optical cable according to the abnormal stage of each knocking point to obtain test candidate adjustment data; Determine the current candidate optical cable by testing the candidate adjustment data; Determine the repetition of the knock point state associated with the current candidate optical cable through the test knock point date segment and the candidate knock point date segment associated with each key knock point placement position in the key knock point data set associated with the current candidate optical cable; The tap point state repetition is the ratio of the total recurrence frequency to the total tap point frequency, the total recurrence frequency is the sum of the recurrence frequencies between the test tap point date segment and the candidate tap point date segment associated with each key tap point placement position, and the total tap point frequency is the sum of the larger value of the test tap point frequency and the candidate tap point frequency associated with each key tap point placement position; Determine whether the state repetition of the tap point meets the state repetition upper limit; If the state repetition of the tapping point meets the state repetition upper limit, the current candidate optical cable is determined as a predicted fault anomaly, and it is determined whether a preset number of predicted fault anomalies have been determined; If the predicted fault anomaly of the preset predicted fault anomaly number is not determined, the next candidate optical cable of the current candidate optical cable is determined as the current candidate optical cable through the test candidate adjustment data, and the step of determining the knock point state associated with the current candidate optical cable through the test knock point date segment and the candidate knock point date segment associated with each key knock point placement position in the key knock point data set associated with the current candidate optical cable is repeated; If the state repetition of the knock point does not meet the state repetition upper limit, the next candidate optical cable of the current candidate optical cable is determined as the current candidate optical cable through the test candidate adjustment data, and the step of determining the state repetition of the knock point associated with the current candidate optical cable through the test knock point date segment and the candidate knock point date segment associated with each key knock point placement position in the key knock point data set associated with the current candidate optical cable is continued.

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