Equipment aging test method, device, computer equipment and system

Abstract

The invention relates to the technical field of equipment testing, in particular to an equipment aging test method and device, computer equipment and a system. The method comprises the steps that an aging test instruction is sent to tested equipment, and the tested equipment responds to the aging test instruction and executes an aging test according to preset test parameters; the preset test parameters comprise aging test times and a time interval between two continuous aging tests; and when the time interval is within or exceeds the time interval, outputting a test progress prompt representing that the aging test is not finished. By adopting the method, the aging test interruption of the tested equipment can be prevented.

Description

Technical Field

[0001] The present application relates to the technical field of equipment testing, and in particular to an equipment aging testing method, device, computer equipment and system. Background Art

[0002] With the development of science and technology, various devices have emerged, which are applied to many aspects of production and life. However, the manufactured equipment cannot be put on the market directly after manufacturing. Instead, it needs to pass the aging test to ensure that the equipment is qualified before it can be officially put on the market.

[0003] Currently, when a device is undergoing an aging test, it is usually manually determined whether the aging test of the device is completed. This may result in misjudgment, thereby interrupting the aging test of the device before the aging test is completed. Summary of the invention

[0004] Based on this, it is necessary to provide a device aging test method, apparatus, computer equipment and system that can avoid interruption of the aging test of the device under test in order to address the above technical problems.

[0005] In a first aspect, the present application provides a device aging test method, which is applied to a terminal device, and the method comprises:

[0006] Sending an aging test instruction to the device under test, the device under test responds to the aging test instruction and performs an aging test according to preset test parameters; the preset test parameters include the number of aging tests and the time interval between two consecutive aging tests;

[0007] Within the time interval or when the time interval is exceeded, a test progress prompt indicating that the aging test is not completed is output.

[0008] In one embodiment, within the time interval or when the time interval is exceeded, outputting a test progress prompt indicating that the aging test is not completed includes:

[0009] During the time interval between two consecutive aging tests of the device under test, the lighting component of the device under test is controlled to be in a constant light state; the constant light state is used to indicate that the aging test of the device under test has not been completed.

[0010] In one embodiment, the method further comprises:

[0011] When the device under test is undergoing an aging test, the light assembly of the device under test is controlled to be in a flashing state; the flashing state is used to indicate that the device under test is undergoing an aging test.

[0012] In one embodiment, the method further comprises:

[0013] During the time interval between two consecutive aging tests on the device under test, the device under test is prohibited from responding to an aging test end operation.

[0014] In one embodiment, within the time interval or when the time interval is exceeded, outputting a test progress prompt indicating that the aging test is not completed includes:

[0015] Obtaining the real-time temperature of the target component in the device under test;

[0016] When the time interval is exceeded, if the real-time temperature is greater than the preset temperature, a test progress prompt is outputted indicating that the aging test has not been completed.

[0017] In one embodiment, the sending of an aging test instruction to the device under test, and the device under test responding to the aging test instruction and performing an aging test according to preset test parameters, includes:

[0018] Sending an aging test instruction to a connected device under test, so that the connected device under test sends a return instruction to the terminal device; the return instruction is used to indicate that the device under test has responded to the aging test instruction;

[0019] A return instruction sent by the device under test is received, and based on the received return instruction, it is determined that the device under test has performed an aging test according to preset test parameters.

[0020] In one embodiment, the sending of the aging test instruction to the connected device under test so that the connected device under test sends a return instruction to the terminal device includes:

[0021] Obtaining a preset waiting time for the return instruction and a sending time of the aging test instruction;

[0022] If the sent time of the aging test instruction is greater than the waiting time and the return instruction sent by the device under test is not received, the aging test instruction is resent to the connected device under test until the return instruction sent by the device under test is received.

[0023] In a second aspect, the present application provides a device for testing aging of an equipment, the device comprising:

[0024] The device testing module is used to send an aging test instruction to the device under test, and the device under test responds to the aging test instruction and performs an aging test according to preset test parameters; the preset test parameters include the number of aging tests and the time interval between two consecutive aging tests;

[0025] The progress prompt module is used to output a test progress prompt indicating that the aging test has not been completed within the time interval or when the time interval is exceeded.

[0026] In a third aspect, the present application provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of the above method when executing the computer program.

[0027] In a fourth aspect, the present application provides a device aging test system, including a terminal device, wherein the terminal device is used to implement the steps of the above method.

[0028] The above-mentioned equipment aging test method, device, computer equipment and system send an aging test instruction to the equipment under test, and the equipment under test responds to the aging test instruction and performs the aging test according to preset test parameters. The preset test parameters include the number of aging tests and the time interval between two consecutive aging tests. Within the time interval or when the time interval is exceeded, a test progress prompt indicating that the aging test has not been completed is output. The method can determine whether the aging test of the equipment under test is completed based on the output test progress prompt, thereby avoiding interrupting the aging test of the equipment under test when the aging test of the equipment under test has not yet been completed. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 An application environment diagram of a device aging test method in an embodiment;

[0030] Figure 2 A schematic diagram of a flow chart of a device aging test method in one embodiment;

[0031] Figure 3 A schematic diagram of a flow chart of a device aging test method in another embodiment;

[0032] Figure 4 is a structural block diagram of a device aging test device in one embodiment;

[0033] Figure 5 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0034] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0035] The device aging test method provided in the embodiment of the present application can be applied to Figure 1In the application environment shown. Among them, the terminal device 102 interacts with the device under test 104 through a wired channel / wireless channel. The data storage component can store data that needs to be processed by the device under test 104. The terminal device 102 sends an aging test instruction to the device under test 104, and the device under test 104 responds to the aging test instruction and performs the aging test according to the preset test parameters. The preset test parameters include the number of aging tests and the time interval between two consecutive aging tests. When the terminal device 102 is within the time interval or exceeds the time interval, the test progress prompt indicating that the aging test has not ended. Among them, the terminal device 102 can be but is not limited to various personal computers, laptops, smart phones, tablet computers, Internet of Things devices, etc. The device under test can be but is not limited to various electronic atomizers and other devices that require multiple aging tests.

[0036] In one embodiment, Figure 2 As shown, a device aging test method is provided, which is applied to Figure 1 Taking the terminal device 102 in the example as an example, the following steps are included:

[0037] S202, sending an aging test instruction to the device under test, the device under test responds to the aging test instruction and performs an aging test according to preset test parameters. The preset test parameters include the number of aging tests and the time interval between two consecutive aging tests.

[0038] The aging test instruction is a instruction sent by the terminal device to the device under test. The purpose of sending the aging test instruction to the device under test is to activate the preset test parameters in the device under test so that the device under test automatically performs the aging test according to the preset test parameters.

[0039] The preset test parameters are data pre-stored in the device under test. The preset test parameters include the number of aging tests and the time interval between two consecutive aging tests. The number of aging tests refers to the number of times the device under test needs to be aged. For example, the number of aging tests is 10 times. The process of each aging test is the same. When the number of aging tests of the device under test reaches the number of aging tests included in the preset test parameters, the aging test of the device under test is considered to be completed. The time interval between two consecutive aging tests refers to the length of the pause between two consecutive aging tests. For example, if the time interval between two consecutive aging tests is 30s, it means that after the previous aging test is completed, it will wait for 30s before the next aging test. Based on the time interval between two consecutive aging tests, it can be ensured that the device under test has enough time to return to the initial state between two consecutive aging tests, such as the temperature of the device under test returns to the initial state, so that it will not affect the next aging test of the device under test, nor will it damage the device under test.

[0040] The expression form of the preset test parameter includes but is not limited to a program and a character string. For example, the preset test parameter is CMDAGE002270, CMDAGE is a flag, 002 indicates that the number of aging tests is two, 270 indicates that the time interval between two consecutive aging tests is 30 seconds, and the duration of one aging test is 240 seconds.

[0041] S204: within the time interval or when the time interval is exceeded, outputting a test progress prompt indicating that the aging test is not completed.

[0042] Among them, within the time interval means that the time duration of the previous aging test is within the time interval of two consecutive aging tests. For example, if the time interval between two consecutive aging tests is 30s, then if the time duration of the previous aging test is within 30s, the test progress prompt indicating that the aging test has not been completed will be output.

[0043] Exceeding the time interval means that the time duration of the previous aging test is outside the time interval of two consecutive aging tests. For example, if the time interval between two consecutive aging tests is 30s, then after the time duration of the previous aging test is 30s, the needle may also output a test progress prompt indicating that the test has not been completed.

[0044] The forms of test progress prompts include, but are not limited to, lighting, voice, and information. For example, when the test progress prompt is output through lighting, the test progress prompt indicating that the aging test has not been completed can be output through the lighting component on the terminal device, or the test progress prompt indicating that the aging test has not been completed can be output through the lighting component on the device under test; when the test progress prompt is output through voice, the test progress prompt indicating that the aging test has not been completed can be output through the voice component on the terminal device, or the test progress prompt indicating that the aging test has not been completed can be output through the voice component on the device under test; when the test progress prompt is output through information, the test progress prompt indicating that the aging test has not been completed can be displayed on the display screen of the terminal device, or the test progress prompt indicating that the aging test has not been completed can be displayed on the display screen of the device under test.

[0045] In some embodiments, when the device under test is performing an aging test, the terminal device / device under test may also output a prompt indicating that the aging test is being performed.

[0046] In some embodiments, when the device under test is performing an aging test, the terminal device / device under test does not output any prompts; if the time duration of the previous aging test is within or exceeds the time interval, a test progress prompt indicating that the aging test has not ended is output. By not outputting any prompts when the device under test is performing an aging test, the resources required for the test progress prompt can be saved, and the situation where multiple aging tests have not yet ended and the resources of the device under test have been consumed, so that the test progress prompt cannot be output, can be avoided.

[0047] In the above-mentioned device aging test method, an aging test instruction is sent to the device under test, and the device under test responds to the aging test instruction and performs the aging test according to preset test parameters. The preset test parameters include the number of aging tests and the time interval between two consecutive aging tests. Within the time interval or when the time interval is exceeded, a test progress prompt is output to indicate that the aging test has not been completed. The method can determine whether the aging test of the device under test is completed based on the output test progress prompt, thereby avoiding interrupting the aging test of the device under test when the aging test of the device under test has not yet been completed.

[0048] In one embodiment, within the time interval or when the time interval is exceeded, a test progress prompt indicating that the aging test is not completed is output, including:

[0049] During the time interval between two consecutive aging tests of the device under test, the light assembly of the device under test is controlled to be in a constant light state. The constant light state is used to indicate that the aging test of the device under test has not been completed.

[0050] The lighting component is a component that can emit light to output a test progress prompt indicating that the aging test of the device under test has not been completed, for example, an LED (Light Emitting Diode).

[0051] The lighting component of the device under test is installed on the housing of the device under test, so that when the lighting component outputs a test progress prompt indicating that the aging test has not been completed, the operator can intuitively observe the test progress prompt output by the lighting component.

[0052] The constant light state means that the light component of the device under test keeps on lighting during the time interval between two consecutive aging tests. The time interval between two consecutive aging tests of the device under test can also be understood as the intermediate time from the end of the previous aging test to the start of the next aging test.

[0053] In some embodiments, the lighting state of the light component of the device under test is inconsistent between the time interval between two consecutive aging tests and the lighting state during the aging test. Further, in the time interval between two consecutive aging tests of the device under test, the light component is always on, and during the aging test of the device under test, the lighting state of the light component can be one of a flashing state and a normally off state.

[0054] In this embodiment, by controlling the light assembly of the device under test to be in a constant light state during the time interval between two consecutive aging tests of the device under test, it can be directly determined that the aging test of the device under test has not been completed through the constant light state of the output.

[0055] In one embodiment, the device aging test method further includes:

[0056] When the device under test is undergoing an aging test, the light assembly of the device under test is controlled to be in a flashing state. The flashing state is used to indicate that the device under test is undergoing an aging test.

[0057] The flashing state means that when the device under test is undergoing an aging test, the light component emits light according to a preset cycle. For example, when the device under test is undergoing an aging test, the light component emits light once every one second.

[0058] In some embodiments, the time interval between two consecutive aging tests of the light component of the device under test is inconsistent with the light state during the aging test. Further, during the aging test of the device under test, the light state of the light component is a flashing state, and during the time interval between two consecutive aging tests of the device under test, the light state of the light component can be one of a constant on state and a constant off state.

[0059] In this embodiment, when the device under test is undergoing an aging test, the light assembly of the device under test is controlled to be in a flashing state, so that it can be directly determined through the output flashing state that the device under test is undergoing an aging test.

[0060] In one embodiment, the device aging test method further includes:

[0061] During the time interval between two consecutive aging tests of the device under test, the device under test is prohibited from responding to the aging test end operation.

[0062] Among them, prohibiting the device under test from responding to the aging test end operation means that the aging test of the device under test will not be interrupted in the case of an operator's misoperation. For example, the operator forces the device under test to end the aging test in the middle time interval between the end of the previous aging test and the start of the next aging test, so as to send the device under test to the next test workstation. At this time, the device under test will prohibit responding to the aging test end operation triggered by the operator, so that the device under test will not be sent to the next test workstation, but will continue to perform the aging test.

[0063] In this embodiment, by prohibiting the device under test from responding to the end of the aging test in the time interval between two consecutive aging tests of the device under test, this can avoid the situation where the aging test of the device under test is interrupted due to operator error operation before the multiple aging tests of the device under test are completed.

[0064] In one embodiment, within the time interval or when the time interval is exceeded, a test progress prompt indicating that the aging test is not completed is output, including:

[0065] Get the real-time temperature of target components in the device under test.

[0066] When the time interval is exceeded, if the real-time temperature is greater than the preset temperature, a test progress prompt is outputted indicating that the aging test has not been completed.

[0067] The target component refers to the component whose temperature will rise during the aging test of the device under test. The target component includes but is not limited to the heat generating components, power supply, and printed circuit board in the device under test.

[0068] The real-time temperature of the target component can be read by the temperature sensor in the device under test. If the target component is a heat-generating component, one or more thermistors can also be installed near the heat-generating component. Thermistors change with temperature and can therefore be used to directly measure the temperature of the heat-generating component.

[0069] When the time interval between two consecutive aging tests exceeds, if the real-time temperature of the target component in the device under test is still greater than the preset temperature, the test progress prompt indicating that the aging test has not been completed will continue to be output until the real-time temperature of the target component is less than the preset temperature, so as to conduct the next aging test. For example, if the time interval between two consecutive aging tests is 30s, then when the time interval exceeds 30s, if the real-time temperature of the target component in the device under test is still greater than the preset temperature, the test progress prompt indicating that the aging test has not been completed will continue to be output until the real-time temperature of the target component is less than the preset temperature, then the test progress prompt indicating that the aging test has not been completed will stop being output, and the next aging test will start.

[0070] In some embodiments, there are multiple target components in the device under test. When the time interval between two consecutive aging tests is exceeded, if the real-time temperature of at least one target component in the device under test is still greater than the preset temperature, the test progress prompt indicating that the aging test has not ended will continue to be output until the real-time temperature of each target component is less than the preset temperature, and then the next aging test will be performed. The preset temperatures corresponding to the target components may be consistent or inconsistent.

[0071] In some embodiments, if the real-time temperature of the target component is less than a preset temperature within the time interval, a test progress prompt is outputted indicating that the aging test has not been completed.

[0072] In this embodiment, by obtaining the real-time temperature of the target component in the device under test, if the real-time temperature is greater than the preset temperature when the time interval is exceeded, a test progress prompt is output to indicate that the aging test has not been completed. This can avoid the target component of the device under test from being too high during the next aging test, thereby avoiding damage to the device under test.

[0073] In one embodiment, an aging test instruction is sent to the device under test, and the device under test responds to the aging test instruction and performs an aging test according to preset test parameters, including:

[0074] Send an aging test command to the connected device under test so that the connected device under test sends a return command to the terminal device. The return command is used to indicate that the device under test has responded to the aging test command.

[0075] A feedback instruction sent by the device under test is received, and based on the received feedback instruction, it is determined that the device under test has performed an aging test according to preset test parameters.

[0076] The connected device under test refers to the device under test connected to the terminal device. Only when the terminal device and the device under test are successfully connected can the terminal device send an aging test instruction to the device under test. The connection between the terminal device and the device under test can be a wired connection or a wireless connection. For example, the terminal device and the device under test are connected via USB (Universal Serial Bus), and the terminal device and the device under test are connected via Bluetooth.

[0077] The return instruction is used to prompt the terminal device that the device under test has responded to the aging test instruction. The return instruction can be an instruction consistent with the aging test instruction or a preset instruction.

[0078] After receiving the return instruction sent by the device under test, the terminal device can determine that the device under test has been subjected to the aging test according to the preset test parameters.

[0079] In some embodiments, the process of successfully establishing a connection between the device under test and the terminal device may be: the terminal device is connected to the device under test by wire, and a communication channel for transmitting data or instructions between the device under test and the terminal device is obtained; the device under test sends a target instruction to the terminal device through the communication channel, and the terminal device sends an instruction consistent with the target instruction to the device under test based on the received instruction; the device under test receives the instruction sent by the terminal device, and determines that a connection with the terminal device is successfully established based on the received instruction.

[0080] In this embodiment, an aging test instruction is sent to the connected device under test so that the connected device under test sends a return instruction to the terminal device. This allows the terminal device to determine that the device under test has started to perform the aging test without sending a tiger test instruction to the device under test again, thereby saving resources.

[0081] In one embodiment, sending an aging test instruction to a connected device under test so that the connected device under test sends a return instruction to a terminal device includes:

[0082] Get the preset waiting time for the return command and the sent time of the aging test command.

[0083] If the sent time of the aging test command is greater than the waiting time, and the return command sent by the device under test is not received, the aging test command is resent to the connected device under test until the return command sent by the device under test is received.

[0084] The preset waiting time for the return command refers to the time allowed for the terminal device to wait for the return command after sending the aging test command to the device under test.

[0085] If the terminal device does not receive the return instruction sent by the device under test when the time length of the aging test instruction sent is greater than the waiting time, it means that the device under test has not received the aging test instruction, or the return instruction sent by the device under test is lost. If the device under test does not receive the aging test instruction, it is impossible for the device under test to perform the aging test according to the preset test parameters. The aging test instruction should be resent to the connected device under test until the terminal device receives the return instruction sent by the device under test, so that it can be determined that the device under test has started to perform the aging test. If the return instruction sent by the device under test is lost, the terminal device cannot determine whether the device under test has performed the aging test. The aging test instruction should also be resent to the connected device under test until the terminal device receives the return instruction sent by the device under test, so that the terminal device can determine that the device under test has started to perform the aging test.

[0086] In some embodiments, if the action of the terminal device sending an aging test instruction to the device under test is triggered by an operator, then when the sending time of the aging test instruction is greater than the waiting time and the return instruction sent by the device under test is not received, an alarm prompt is output to prompt the operator that the terminal device has not received the return instruction.

[0087] In this embodiment, if the sent time of the aging test instruction is greater than the waiting time and the return instruction sent by the device under test is not received, the aging test instruction is resent to the connected device under test until the return instruction sent by the device under test is received. This can avoid missing the device under test when performing the aging test on the device under test, thereby ensuring that the aging test is performed on each connected device under test.

[0088] The present application also provides an application scenario, which applies the above-mentioned device aging test method.

[0089] Specifically, the application of the device aging test method in this application scenario is as follows:

[0090] The specific process of aging test for the equipment under test is as follows: Figure 3 As shown. The terminal device is connected to the device under test by wire, and a communication channel for transmitting data or instructions between the device under test and the terminal device is obtained. The device under test sends a target instruction to the terminal device through the communication channel, and the terminal device sends an instruction consistent with the target instruction to the device under test based on the received instruction. The device under test receives the instruction sent by the terminal device, and determines that a connection with the terminal device is successfully established based on the received instruction.

[0091] The terminal device sends an aging test instruction to the connected device under test. The connected device under test receives the aging test instruction sent by the terminal device, and based on the received aging test instruction, sends a return instruction to the terminal device. The terminal device receives the return instruction sent by the device under test, and based on the received return instruction, determines that the device under test has performed the aging test according to the preset test parameters. The preset test parameters include the number of aging tests and the time interval between two consecutive aging tests.

[0092] The terminal device also obtains the preset waiting time for the return instruction and the sent time of the aging test instruction. When the sent time of the aging test is greater than the waiting time, if the terminal device still has not received the return instruction sent by the device under test, the terminal device resends the aging test instruction to the connected device under test until it receives the return instruction sent by the device under test.

[0093] During the aging test of the device under test, the terminal device controls the light component of the device under test to be in a flashing state, so as to indicate that the aging test of the device under test is being performed through the flashing state. During the middle time interval of continuous aging tests of the device under test, the terminal device controls the light component of the device under test to be in a constant light state, so as to indicate that the aging test of the device under test is not completed through the constant light state. When the time interval between two consecutive aging tests exceeds, if the real-time temperature of the target component in the device under test is still greater than the preset temperature, the light component of the device under test continues to be controlled to be in a constant light state, so as to indicate that the aging test of the device under test is not completed through the constant light state, until the real-time temperature of the target component is less than the preset temperature, and the next aging test is performed. Among them, during the middle time interval of two consecutive aging tests of the device under test, the terminal device prohibits the device under test from responding to the aging test end operation.

[0094] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0095] Based on the same inventive concept, the embodiment of the present application also provides a device aging test apparatus for implementing the device aging test method involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the above method, so the specific limitations in one or more device aging test apparatus embodiments provided below can refer to the limitations of the device aging test method above, and will not be repeated here.

[0096] In one embodiment, Figure 4 As shown, a device aging test device is provided, comprising:

[0097] The device testing module 402 is used to send an aging test instruction to the device under test, and the device under test responds to the aging test instruction and performs an aging test according to preset test parameters. The preset test parameters include the number of aging tests and the time interval between two consecutive aging tests.

[0098] The progress prompt module 404 is used to output a test progress prompt indicating that the aging test is not finished within the time interval or when the time interval is exceeded.

[0099] In one implementation, the progress prompt module includes:

[0100] The first prompt unit is used to control the light assembly of the device under test to be in a constant light state during the time interval between two consecutive aging tests of the device under test. The constant light state is used to indicate that the aging test of the device under test has not been completed.

[0101] In one implementation, the device aging test apparatus further includes:

[0102] The second prompting unit is used to control the light assembly of the device under test to be in a flashing state when the device under test is undergoing an aging test. The flashing state is used to indicate that the device under test is undergoing an aging test.

[0103] In one implementation, the device aging test apparatus further includes:

[0104] The prohibition response unit is used to prohibit the device under test from responding to the aging test end operation during the time interval between two consecutive aging tests of the device under test.

[0105] In one implementation, the progress prompt module includes:

[0106] The temperature acquisition unit is used to obtain the real-time temperature of the target component in the device under test.

[0107] The third prompt unit is used to output a test progress prompt indicating that the aging test has not been completed if the real-time temperature is greater than the preset temperature when the time interval has expired.

[0108] In one implementation, the device testing module includes:

[0109] The instruction sending unit is used to send an aging test instruction to the connected device under test, so that the connected device under test sends a return instruction to the terminal device. The return instruction is used to indicate that the device under test has responded to the aging test instruction.

[0110] The instruction receiving unit is used to receive the feedback instruction sent by the device under test, and determine based on the received feedback instruction that the device under test has performed the aging test according to the preset test parameters.

[0111] In one implementation, the instruction sending unit includes:

[0112] The duration acquisition subunit is used to acquire the preset waiting duration for the return instruction and the sent duration of the aging test instruction.

[0113] The instruction sending subunit is used to resend the aging test instruction to the connected device under test if the return instruction sent by the device under test is not received when the sending time of the aging test instruction is greater than the waiting time, until the return instruction sent by the device under test is received.

[0114] Each module in the above-mentioned equipment aging test device can be implemented in whole or in part by software, hardware and their combination. Each module can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute the corresponding operations of each module above.

[0115] In one embodiment, a computer device is provided. The computer device may be a terminal device, and its internal structure diagram may be as follows: Figure 5 As shown. The computer device includes a processor, a memory, a communication interface, a display screen and an input device connected through a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The communication interface of the computer device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be achieved through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a device aging test method is implemented. The display screen of the computer device can be a liquid crystal display screen or an electronic ink display screen, and the input device of the computer device can be a touch layer covered on the display screen, or a key, trackball or touchpad set on the computer device housing, or an external keyboard, touchpad or mouse, etc.

[0116] Those skilled in the art will understand that Figure 5 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0117] In one embodiment, a computer device is further provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above method embodiments when executing the computer program.

[0118] In one embodiment, a device aging test system is also provided, including a terminal device, and the terminal device is used to implement the steps in the above method embodiments.

[0119] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties.

[0120] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0121] The technical features of the above embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0122] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A device aging test method, applied to terminal equipment, characterized in that: The method comprises: Sending an aging test instruction to the device under test, the device under test responds to the aging test instruction and performs an aging test according to preset test parameters; the preset test parameters include the number of aging tests and the time interval between two consecutive aging tests; Within the time interval or when the time interval is exceeded, a test progress prompt indicating that the aging test is not completed is output.

2. The method according to claim 1, characterized in that The step of outputting a test progress prompt indicating that the aging test is not finished within or beyond the time interval includes: During the time interval between two consecutive aging tests of the device under test, the lighting component of the device under test is controlled to be in a constant light state; the constant light state is used to indicate that the aging test of the device under test has not been completed.

3. The method according to claim 2, characterized in that The method further comprises: When the device under test is undergoing an aging test, the light assembly of the device under test is controlled to be in a flashing state; the flashing state is used to indicate that the device under test is undergoing an aging test.

4. The method according to claim 1, 2 or 3, characterized in that: The method further comprises: During the time interval between two consecutive aging tests on the device under test, the device under test is prohibited from responding to an aging test end operation.

5. The method according to claim 1, characterized in that The step of outputting a test progress prompt indicating that the aging test is not finished within or beyond the time interval includes: Obtaining the real-time temperature of the target component in the device under test; When the time interval is exceeded, if the real-time temperature is greater than the preset temperature, a test progress prompt is outputted indicating that the aging test has not been completed.

6. The method according to claim 1, characterized in that The step of sending an aging test instruction to the device under test, and the device under test responding to the aging test instruction and performing an aging test according to preset test parameters, includes: Sending an aging test instruction to a connected device under test, so that the connected device under test sends a return instruction to the terminal device; the return instruction is used to indicate that the device under test has responded to the aging test instruction; A return instruction sent by the device under test is received, and based on the received return instruction, it is determined that the device under test has performed an aging test according to preset test parameters.

7. The method according to claim 6, characterized in that The sending of the aging test instruction to the connected device under test so that the connected device under test sends a return instruction to the terminal device includes: Obtaining a preset waiting time for the return instruction and a sending time of the aging test instruction; If the sent time of the aging test instruction is greater than the waiting time and the return instruction sent by the device under test is not received, the aging test instruction is resent to the connected device under test until the return instruction sent by the device under test is received.

8. An equipment aging test device, characterized in that: The device comprises: The device testing module is used to send an aging test instruction to the device under test, and the device under test responds to the aging test instruction and performs an aging test according to preset test parameters; the preset test parameters include the number of aging tests and the time interval between two consecutive aging tests; The progress prompt module is used to output a test progress prompt indicating that the aging test has not been completed within the time interval or when the time interval is exceeded.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A device aging test system, comprising a terminal device, characterized in that: The terminal device is used to implement the steps of the method according to any one of claims 1 to 7.

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