Synthetic test loop test method based on power electronic device, electronic equipment and storage medium

Abstract

The invention discloses a synthetic test loop test method based on a power electronic device, electronic equipment and a storage medium. A synthetic test loop comprises a to-be-tested circuit breaker, a current source loop, a voltage source loop and a frequency modulation loop, wherein the current source loop, the voltage source loop and the frequency modulation loop are connected with the circuit breaker; the test method comprises the following steps: applying an equivalent power frequency short-circuit current to the circuit breaker through the current source loop; predicting a current zero point moment according to the equivalent power frequency short-circuit current, and applying an introduction current to the circuit breaker through the voltage source loop within a preset time before the current zero point moment; wherein the equivalent power frequency short-circuit current and the introduction current have the same slope at the current zero point; and controlling the voltage source loop to be short-circuited when the introduced current does not pass zero, controlling the voltage source loop to be connected to the frequency modulation loop after the introduced current passes zero, and applying recovery voltage to the circuit breaker so as to complete the test of the synthetic test loop.

Description

Technical Field

[0001] The present invention relates to the technical field of power equipment, and in particular to a synthetic test loop testing method based on power electronic devices, electronic equipment and a storage medium. Background Art

[0002] Circuit breakers are the most numerous electrical equipment in the power grid, playing a control and protection role. Once a failure occurs, it will not only directly lead to power grid accidents, but also cause the expansion of existing accidents, bringing huge negative impacts on the national economy and social stability.

[0003] The short-circuit current closing and breaking test of the circuit breaker is one of the type tests stipulated by the state. Its purpose is to verify whether the circuit breaker can meet the national standards. By applying the equivalent voltage and current of the short circuit to the circuit breaker under test, the breaking capacity of the circuit breaker under test is judged, and whether the circuit breaker under test can work reliably under harsh working conditions is verified. However, the current breaking capacity test of the circuit breaker requires the circuit breaker to be transported to a large-capacity test station, which results in complicated steps in the test and testing process, low test efficiency, and poor economic efficiency. Summary of the invention

[0004] The present invention provides a synthetic test loop test method based on power electronic devices, electronic equipment and storage medium to solve the technical problems in the prior art of complicated test and testing processes, low test efficiency and poor economy.

[0005] In order to solve the above technical problems, an embodiment of the present invention provides a synthetic test circuit testing method based on power electronic devices, wherein the synthetic test circuit comprises: a circuit breaker to be tested and a current source circuit, a voltage source circuit and a frequency modulation circuit connected to the circuit breaker; the testing method comprises:

[0006] Applying an equivalent power frequency short-circuit current to the circuit breaker through the current source loop;

[0007] Predicting the current zero point moment according to the equivalent power frequency short-circuit current, and applying an introduction current to the circuit breaker through the voltage source loop at a preset time before the current zero point moment; wherein the slopes of the equivalent power frequency short-circuit current and the introduction current at the current zero point are the same;

[0008] The voltage source circuit is controlled to be short-circuited when the introduced current does not pass through zero, and the frequency modulation circuit is controlled to be connected after the introduced current passes through zero, and a recovery voltage is applied to the circuit breaker, thereby completing the test of the synthetic test circuit.

[0009] As a preferred solution, the current source loop includes: a current booster and a first anti-parallel crystal gate switch;

[0010] The first end of the current booster is connected to the first end of the first anti-parallel crystal gate switch, the second end of the first anti-parallel crystal gate switch is connected to the first end of the circuit breaker, and the second end of the current booster is connected to the second end of the circuit breaker.

[0011] As a preferred solution, the current source loop includes a first capacitor, a first inductor and a second anti-parallel crystal gate switch;

[0012] The first end of the second anti-parallel crystal gate switch is connected to the first end of the circuit breaker, the second end of the second anti-parallel crystal gate switch is connected to the first end of the first inductor, the second end of the first inductor is connected to the first end of the first capacitor, and the second end of the first capacitor is connected to the second end of the circuit breaker.

[0013] As a preferred solution, the frequency modulation circuit includes: a frequency modulation capacitor, a frequency modulation resistor and a frequency modulation inductor;

[0014] The first end of the frequency-modulating resistor is connected to the first end of the circuit breaker, the second end of the frequency-modulating resistor is connected to the first end of the frequency-modulating capacitor, the second end of the frequency-modulating capacitor is connected to the second end of the circuit breaker, the first end of the frequency-modulating inductor is connected to the second end of the first inductor, the second end of the frequency-modulating inductor is connected to the second end of the circuit breaker, and the second end of the circuit breaker is grounded.

[0015] As a preferred solution, applying an equivalent power frequency short-circuit current to the circuit breaker through the current source loop specifically includes:

[0016] Controlling a first anti-parallel crystal switch in the current source loop to close, thereby turning on the current source loop;

[0017] An equivalent power frequency short-circuit current is applied to the circuit breaker through a current booster in the current source loop.

[0018] As a preferred solution, predicting the current zero point moment according to the equivalent power frequency short-circuit current, and applying an introduction current to the circuit breaker through the voltage source loop at a preset time before the current zero point moment, specifically includes:

[0019] Collecting the equivalent power frequency short-circuit current, and predicting the current zero point time according to the collected equivalent power frequency short-circuit current;

[0020] At a preset time before the current zero point, controlling the second anti-parallel crystal gate switch in the voltage source loop to close, thereby turning on the voltage source loop;

[0021] Through the first capacitor of the voltage source loop, before the zero point of the equivalent power frequency short-circuit current of the current source loop, an introduction current having the same slope as the equivalent power frequency short-circuit current at the zero point is applied to the circuit breaker.

[0022] As a preferred solution, the method of predicting the current zero point time according to the collected equivalent power frequency short-circuit current specifically includes:

[0023] According to the collected equivalent power frequency short-circuit current, the actual current frequency and period output by the actual current source loop are calculated;

[0024] Determine the target zero point of the equivalent power frequency short-circuit current according to the actual current frequency and period, combined with the preset characteristic value output by the current source loop;

[0025] Based on the target zero point and the actual current frequency and period, a current zero point time is determined.

[0026] As a preferred solution, the voltage source circuit is controlled to be short-circuited when the introduced current does not pass through zero, and the frequency modulation circuit is controlled to be connected after the introduced current passes through zero to apply a recovery voltage to the circuit breaker, specifically including:

[0027] Generate a start signal for the frequency modulation circuit at a preset time before the input current provided by the voltage source circuit passes through zero;

[0028] According to the input signal, the first anti-parallel crystal gate switch in the current source loop is disconnected when the introduced current passes through zero, and the voltage source loop is controlled to be short-circuited when the introduced current does not pass through zero;

[0029] After the introduced current passes through zero, the frequency modulation circuit is controlled to be connected, and the transient recovery voltage and the power frequency recovery voltage are jointly provided to the circuit breaker through the frequency modulation capacitor and the frequency modulation inductor of the frequency modulation circuit.

[0030] Correspondingly, the present invention also provides a terminal device, comprising a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein when the processor executes the computer program, it implements the synthetic test loop testing method based on power electronic devices as described in any one of the above.

[0031] Correspondingly, the present invention also provides a computer-readable storage medium, which includes a stored computer program, wherein when the computer program is running, the device where the computer-readable storage medium is located is controlled to execute the synthetic test loop testing method based on power electronic devices as described in any one of the above.

[0032] Compared with the prior art, the embodiments of the present invention have the following beneficial effects:

[0033] The technical solution of the present invention controls the access of the current source circuit, the voltage source circuit and the frequency modulation circuit respectively through the circuit breaker to be tested and the current source circuit, the voltage source circuit and the frequency modulation circuit connected to the circuit breaker, thereby utilizing the characteristic that large current and large voltage do not appear on the circuit breaker at the same time during the actual opening and closing process of the circuit breaker, and adopts two sets of power supplies of the current source circuit and the voltage source circuit to apply current and voltage to the circuit breaker, thereby effectively reducing the power supply capacity requirement, and adopts the anti-parallel mode of the thyristor switch as the circuit switch, which can not only carry the current and voltage flowing through the circuit, but also speed up the triggering time, and reduce the size of the equipment, avoiding the complicated steps of the experiment and the test process, and at the same time, the circuit breaker can be directly restored to normal operation through the frequency modulation circuit, thereby improving the efficiency of the conversion between the test and the normal operation, and also improving the economy of the circuit breaker test, and reducing the excessive test cost caused by the failure of the circuit breaker to work normally during the opening and closing test. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] Figure 1 : A structural diagram of a synthetic test circuit provided by an embodiment of the present invention;

[0035] Figure 2 : A flow chart of a synthetic test loop testing method based on power electronic devices provided by an embodiment of the present invention;

[0036] Figure 3 : is a schematic diagram of a control method of a light-triggered thyristor switch in an embodiment of the present invention;

[0037] Figure 4 : is a schematic diagram of a light-triggered thyristor switch in an embodiment of the present invention;

[0038] Figure 5 : is a control flow diagram of a synthetic test loop based on power electronic devices in an embodiment of the present invention. DETAILED DESCRIPTION

[0039] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0040] Embodiment 1

[0041] Please refer to Figure 1, a synthetic test circuit testing method based on power electronic devices is provided in an embodiment of the present invention, wherein the synthetic test circuit includes: a circuit breaker St to be tested and a current source circuit, a voltage source circuit and a frequency modulation circuit connected to the circuit breaker St.

[0042] As a preferred solution of this embodiment, the current source loop includes: a current booster M1 and a first anti-parallel crystal gate switch S1;

[0043] The first end of the current booster M1 is connected to the first end of the first anti-parallel crystal gate switch S1, the second end of the first anti-parallel crystal gate switch S1 is connected to the first end of the circuit breaker St, and the second end of the current booster M1 is connected to the second end of the circuit breaker St.

[0044] In this embodiment, the current booster M1 of the current source loop serves as a current source loop power supply to provide an equivalent power frequency short-circuit current, and controls the first anti-parallel thyristor switch S1 to apply an equivalent power frequency short-circuit current to the circuit breaker St after the test starts.

[0045] As a preferred solution of this embodiment, the current source loop includes a first capacitor C2, a first inductor L2 and a second anti-parallel crystal gate switch S2;

[0046] The first end of the second anti-parallel crystal gate switch S2 is connected to the first end of the circuit breaker St, the second end of the second anti-parallel crystal gate switch S2 is connected to the first end of the first inductor L2, the second end of the first inductor L2 is connected to the first end of the first capacitor C2, and the second end of the first capacitor C2 is connected to the second end of the circuit breaker St.

[0047] In this embodiment, the voltage source circuit adopts an oscillation circuit composed of a first capacitor C2 and a first inductor L2, and controls the second anti-parallel thyristor switch S2, so as to connect the high-frequency oscillation introduction current slightly before the predicted zero point of the equivalent power frequency short-circuit current, so that the slope of the introduction current zero point provided by the voltage source circuit is consistent with the slope of the short-circuit current zero point provided by the current source, thereby realizing equivalent switching of the two circuits.

[0048] As a preferred solution of this embodiment, the frequency modulation circuit includes: a frequency modulation capacitor C0, a frequency modulation resistor C0 and a frequency modulation inductor L50;

[0049] The first end of the frequency modulation resistor R0 is connected to the first end of the circuit breaker St, the second end of the frequency modulation resistor R0 is connected to the first end of the frequency modulation capacitor C0, the second end of the frequency modulation capacitor C0 is connected to the second end of the circuit breaker St, the first end of the frequency modulation inductor C0 is connected to the second end of the first inductor L50, the second end of the frequency modulation inductor L50 is connected to the second end of the circuit breaker St, and the second end of the circuit breaker St is grounded.

[0050] In this embodiment, the frequency modulation circuit includes a frequency modulation capacitor C0, a frequency modulation resistor R0 and a frequency modulation inductor L50, which is short-circuited when the high-frequency introduction current provided by the voltage source circuit does not pass through zero, and is connected after the high-frequency introduction current passes through zero to provide a recovery voltage for the tested circuit breaker St.

[0051] Implementing the above embodiments has the following effects:

[0052] The technical solution of the present invention controls the access of the current source circuit, the voltage source circuit and the frequency modulation circuit respectively through the circuit breaker to be tested and the current source circuit, the voltage source circuit and the frequency modulation circuit connected to the circuit breaker, thereby utilizing the characteristic that large current and large voltage do not appear on the circuit breaker at the same time during the actual opening and closing process of the circuit breaker, and adopts two sets of power supplies of the current source circuit and the voltage source circuit to apply current and voltage to the circuit breaker, thereby effectively reducing the power supply capacity requirement, and adopts the anti-parallel mode of the thyristor switch as the circuit switch, which can not only carry the current and voltage flowing through the circuit, but also speed up the triggering time, and reduce the size of the equipment, avoiding the complicated steps of the experiment and the test process, and at the same time, the circuit breaker can be directly restored to normal operation through the frequency modulation circuit, thereby improving the efficiency of the conversion between the test and the normal operation, and also improving the economy of the circuit breaker test, and reducing the excessive test cost caused by the failure of the circuit breaker to work normally during the opening and closing test.

[0053] Embodiment 2

[0054] See also Figure 2 , which is a synthetic test loop test method based on power electronic devices provided by an embodiment of the present invention, based on the loop implementation in Embodiment 1, comprising the following steps S101-S103:

[0055] Step S101: applying an equivalent power frequency short-circuit current to the circuit breaker through the current source loop.

[0056] In this embodiment, during the breaking process, the circuit breaker has a physical characteristic that the current and voltage applied to the circuit breaker do not appear at the same time. When a large power frequency short-circuit current is applied to the circuit breaker, the voltage on the circuit breaker is relatively low, which is an arc voltage. After the large power frequency short-circuit current passes through zero, a transient recovery voltage and a subsequent power frequency recovery voltage appear on the circuit breaker. Therefore, by utilizing this physical characteristic, two sets of power supply equipment are separated to apply an equivalent large power frequency short-circuit current, an equivalent transient recovery voltage, and a power frequency recovery voltage to the tested circuit breaker respectively.

[0057] It should be noted that in order to withstand the high current and high voltage during the test, the thyristor switch is connected in anti-parallel, utilizing its fast response speed and high voltage resistance. It is used as a loop switch to turn on and off the current source loop that provides current and the voltage source loop that provides voltage through light triggering.

[0058] As a preferred solution of this embodiment, applying an equivalent power frequency short-circuit current to the circuit breaker through the current source loop specifically includes:

[0059] The first anti-parallel crystal gate switch in the current source loop is controlled to be closed, thereby turning on the current source loop; and an equivalent power frequency short-circuit current is applied to the circuit breaker through the current booster in the current source loop.

[0060] In this embodiment, the capacitor is first charged, and after the charging is completed, the thyristor switch S1 of the current source loop is controlled to turn on the current source loop to provide a power frequency short-circuit current to the circuit breaker under test.

[0061] In this embodiment, the current source loop provides an equivalent power frequency short-circuit current through a current booster as a current source loop power supply, and controls the anti-parallel thyristor switch. After the test starts, the thyristor switch is controlled to turn on the loop to apply an equivalent power frequency short-circuit current to the circuit breaker under test.

[0062] Step S102: predicting the current zero point moment according to the equivalent power frequency short-circuit current, and applying an introduction current to the circuit breaker through the voltage source loop at a preset time before the current zero point moment; wherein the equivalent power frequency short-circuit current and the introduction current have the same slope at the current zero point.

[0063] As a preferred solution of this embodiment, predicting the current zero point moment according to the equivalent power frequency short-circuit current, and applying the introduction current to the circuit breaker through the voltage source loop at a preset time before the current zero point moment, specifically includes:

[0064] The equivalent power-frequency short-circuit current is collected, and the current zero point is predicted according to the collected equivalent power-frequency short-circuit current; a second anti-parallel crystal gate switch in the voltage source loop is controlled to close at a preset time before the current zero point, thereby turning on the voltage source loop; and an introduction current having the same slope as the equivalent power-frequency short-circuit current at the zero point is applied to the circuit breaker through the first capacitor of the voltage source loop before the zero point of the equivalent power-frequency short-circuit current of the current source loop.

[0065] In this embodiment, according to the predicted power frequency current zero point, the voltage source circuit thyristor switch S2 is controlled slightly before the zero point to turn on the voltage source circuit, and the slope of the introduction current provided by the voltage source circuit at the zero point is consistent with the slope of the power frequency short-circuit current at the zero point, so that the power frequency short-circuit current and the introduction current flow through the circuit breaker under test together.

[0066] In this embodiment, the voltage source circuit is an oscillating circuit composed of a capacitor, an inductor and an anti-parallel thyristor switch; since the high-frequency introduction current provided by the voltage source circuit has a single action time between 200μs and 500μs, the high-frequency oscillating current is connected slightly before the predicted zero point of the short-circuit current according to the frequency selected by the voltage source circuit, and the slope of the current zero point provided by the voltage source is made consistent with the slope of the current zero point provided by the current source, so as to achieve equivalent switching of the two circuits. In order to make the slopes of the current zero points provided by the two circuits consistent, that is:

[0067]

[0068] Among them, d i1 is the current component of the current source loop, d i2 is the current component of the voltage source loop, t1 and t2 correspond to the moments when the current source loop and the voltage source loop are at the current zero point, respectively, and d t For the time component.

[0069] The current provided by the current source is expressed as:

[0070] i1=I 1max sin(ω1t)

[0071] Among them, I 1max is the maximum current component of the current source loop, ω1 is the period coefficient, and t is the time.

[0072] The current provided by the voltage source is expressed as:

[0073]

[0074] Among them, I 2max is the maximum current component of the voltage source loop, ω2 is the period coefficient, For the difference.

[0075] Substituting the initial conditions, we can obtain the current relationship between the two circuits:

[0076]

[0077] The frequency of the current introduced by the voltage source loop is between 250Hz and 1000Hz. Observing the voltage source loop, before the introduced current passes through zero, the frequency modulation loop is in a short-circuit state. Therefore, a zero-input second-order circuit response analysis is performed on the voltage source loop, and the capacitance C2 and inductance L2 of the voltage source loop are obtained as follows:

[0078]

[0079] Among them, U cu The voltage provided by the first capacitor, C u It actually corresponds to the voltage source loop capacitance.

[0080] After the voltage source circuit is connected, the current source circuit is controlled to be disconnected at the predicted power frequency current zero point, so that only the introduction current provided by the voltage source circuit flows through the circuit breaker under test. After the introduction current passes zero, the frequency modulation circuit is connected to the circuit and starts working.

[0081] As a preferred solution of this embodiment, predicting the current zero point time according to the collected equivalent power frequency short-circuit current specifically includes:

[0082] According to the collected equivalent power frequency short-circuit current, the actual current frequency and period of the actual current source loop output are calculated; according to the actual current frequency and period, combined with the preset characteristic value of the current source loop output, the target zero point of the equivalent power frequency short-circuit current is determined; based on the target zero point and the actual current frequency and period, the current zero point moment is determined.

[0083] In this embodiment, after the current source loop is turned on, the current zero point of the current signal is predicted by analyzing the collected current signal. Specifically, before the test begins, the circuit breaker under test is in the closed state, and the current booster is used to increase the current of the circuit breaker S under test. t Apply power frequency current and collect current signals, and calculate the actual current frequency f1 and period T1 output by the actual current source loop based on the current signals. After the test starts, connect the current source loop, calculate the target zero point based on the characteristic value of the output current and the period T1, and finally determine the current zero point moment.

[0084] Step S103: controlling the voltage source loop to be short-circuited when the introduced current does not pass through zero, and controlling the frequency modulation loop to be connected after the introduced current passes through zero, applying a recovery voltage to the circuit breaker, thereby completing the test of the synthetic test loop.

[0085] As a preferred solution of this embodiment, the controlling the voltage source circuit to be short-circuited when the introduced current does not pass through zero, and controlling the access to the frequency modulation circuit after the introduced current passes through zero to apply a recovery voltage to the circuit breaker specifically includes:

[0086] A start-up signal of the frequency modulation circuit is generated at a preset time before the introduction current provided by the voltage source circuit passes through zero; according to the start-up signal, the first anti-parallel crystal gate switch in the current source circuit is disconnected when the introduction current passes through zero, and the voltage source circuit is controlled to be short-circuited when the introduction current does not pass through zero; after the introduction current passes through zero, the frequency modulation circuit is controlled to be connected, and the transient recovery voltage and the power frequency recovery voltage are jointly provided to the circuit breaker through the frequency modulation capacitor and the frequency modulation inductor of the frequency modulation circuit.

[0087] In this embodiment, the current source thyristor switch is controlled at the predicted power frequency current zero point to disconnect the current source loop, and thereafter (including the stage before the current is introduced to pass zero) only the voltage source loop is connected to the circuit breaker under test.

[0088] In this embodiment, the frequency modulation circuit is a frequency modulation circuit composed of a frequency modulation capacitor, a frequency modulation resistor, and a frequency modulation inductor. Its function is to be short-circuited when the high-frequency current provided by the voltage source circuit has not passed zero, and to be connected after the high-frequency current passes zero, and then to provide transient recovery voltage and power frequency recovery voltage to the tested circuit breaker together with the voltage source capacitor and the voltage source inductor.

[0089] After the frequency modulation circuit is connected, the inherent oscillation frequency f0 of the voltage source circuit is:

[0090]

[0091] The calculation formula of the frequency modulation resistance R0 of the frequency modulation circuit is:

[0092] R0=-4*L2*f0*ln(K-1)

[0093] The calculation formula of the frequency modulation capacitance of the frequency modulation circuit is:

[0094]

[0095] where t m is the time for the transient recovery voltage to reach the peak value, and K is the amplitude coefficient of the tested circuit breaker.

[0096] After the test, the voltage source circuit switch optical signal is cancelled, so that the thyristor switch disconnects the voltage source circuit.

[0097] See also Figure 3 and 4, which is a schematic diagram of the control method of the light-triggered thyristor switch in the present invention. The acquisition card is controlled by the Labview program. After the task starts, the time for the acquisition card to send a high-level signal, the subsequent low-level signal time and the initial delay time are set in seconds. After the setting is completed, click Start to control the acquisition card. The acquisition card sends a high-level signal to the triode, and the triode is turned on after receiving the high-level signal. After the triode is turned on, the laser diode powered by the DC power supply sends a light signal. After the light signal is transmitted to the thyristor switch, the thyristor switch is forward biased, and the circuit is turned on. Canceling the trigger signal can make the thyristor switch break the circuit.

[0098] See also Figure 5 , which is a control flow diagram of a synthetic test circuit based on power electronic devices. After the test starts, the first anti-parallel thyristor switch is forward biased by issuing an unlocking signal, thereby turning on the current source circuit, and determining the input voltage circuit input time τh, and then collecting the current signal, thereby predicting the current zero point, and then calculating the τh time before zero. Subsequently, an unlocking signal is issued to make the second anti-parallel thyristor switch forward biased, turn on the voltage source circuit, output the high-voltage circuit input signal at the time τy before zero crossing, and finally disconnect the current source circuit at zero point, thereby completing the test of the circuit breaker.

[0099] Implementing the above embodiments has the following effects:

[0100] The technical solution of the present invention controls the access of the current source circuit, the voltage source circuit and the frequency modulation circuit respectively through the circuit breaker to be tested and the current source circuit, the voltage source circuit and the frequency modulation circuit connected to the circuit breaker, thereby utilizing the characteristic that large current and large voltage do not appear on the circuit breaker at the same time during the actual opening and closing process of the circuit breaker, and adopts two sets of power supplies of the current source circuit and the voltage source circuit to apply current and voltage to the circuit breaker, thereby effectively reducing the power supply capacity requirement, and adopts the anti-parallel mode of the thyristor switch as the circuit switch, which can not only carry the current and voltage flowing through the circuit, but also speed up the triggering time, and reduce the size of the equipment, avoiding the complicated steps of the experiment and the test process, and at the same time, the circuit breaker can be directly restored to normal operation through the frequency modulation circuit, thereby improving the efficiency of the conversion between the test and the normal operation, and also improving the economy of the circuit breaker test, and reducing the excessive test cost caused by the failure of the circuit breaker to work normally during the opening and closing test.

[0101] Embodiment 3

[0102] Correspondingly, the present invention also provides a terminal device, comprising: a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein when the processor executes the computer program, it implements the synthetic test loop testing method based on power electronic devices as described in any one of the above embodiments.

[0103] The terminal device of this embodiment includes: a processor, a memory, and a computer program and a computer instruction stored in the memory and executable on the processor. When the processor executes the computer program, each step in the above-mentioned embodiment 1 is implemented, for example: Figure 2 Steps S101 to S103 are shown.

[0104] Exemplarily, the computer program may be divided into one or more modules / units, which are stored in the memory and executed by the processor to implement the present invention. The one or more modules / units may be a series of computer program instruction segments capable of implementing specific functions, which are used to describe the execution process of the computer program in the terminal device.

[0105] The terminal device may be a computing device such as a desktop computer, a notebook, a PDA, and a cloud server. The terminal device may include, but is not limited to, a processor and a memory. Those skilled in the art will appreciate that the schematic diagram is merely an example of a terminal device and does not constitute a limitation on the terminal device. The terminal device may include more or fewer components than shown in the diagram, or may combine certain components, or different components. For example, the terminal device may also include an input / output device, a network access device, a bus, etc.

[0106] The processor may be a central processing unit (CPU), other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor, etc. The processor is the control center of the terminal device, and uses various interfaces and lines to connect various parts of the entire terminal device.

[0107] The memory can be used to store the computer program and / or module, and the processor realizes various functions of the terminal device by running or executing the computer program and / or module stored in the memory, and calling the data stored in the memory. The memory can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system, at least one application required for a function, etc.; the data storage area can store data created according to the use of the mobile terminal, etc. In addition, the memory can include a high-speed random access memory, and can also include a non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (SecureDigital, SD) card, a flash card (Flash Card), at least one disk storage device, a flash memory device, or other volatile solid-state storage devices.

[0108] Wherein, if the module / unit integrated in the terminal device is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on such an understanding, the present invention implements all or part of the processes in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. Wherein, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, U disk, mobile hard disk, disk, optical disk, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), electric carrier signal, telecommunication signal and software distribution medium. It should be noted that the content contained in the computer-readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electric carrier signals and telecommunication signals.

[0109] Embodiment 4

[0110] Accordingly, the present invention also provides a computer-readable storage medium, which includes a stored computer program, wherein when the computer program is running, the device where the computer-readable storage medium is located is controlled to execute the synthetic test loop testing method based on power electronic devices as described in any one of the above embodiments.

[0111] The specific embodiments described above further illustrate the purpose, technical solutions and beneficial effects of the present invention. It should be understood that the above description is only a specific embodiment of the present invention and is not intended to limit the scope of protection of the present invention. It is particularly pointed out that for those skilled in the art, any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the scope of protection of the present invention.

Claims

1. A synthetic test loop testing method based on power electronic devices, characterized in that: The synthetic test circuit includes: a circuit breaker to be tested and a current source circuit, a voltage source circuit and a frequency modulation circuit connected to the circuit breaker; the test method includes: Applying an equivalent power frequency short-circuit current to the circuit breaker through the current source loop; Predicting the current zero point moment according to the equivalent power frequency short-circuit current, and applying an introduction current to the circuit breaker through the voltage source loop at a preset time before the current zero point moment; wherein the slopes of the equivalent power frequency short-circuit current and the introduction current at the current zero point are the same; The voltage source circuit is controlled to be short-circuited when the introduced current does not pass through zero, and the frequency modulation circuit is controlled to be connected after the introduced current passes through zero, and a recovery voltage is applied to the circuit breaker, thereby completing the test of the synthetic test circuit.

2. A synthetic test loop testing method based on power electronic devices as claimed in claim 1, characterized in that: The current source loop comprises: a current booster and a first anti-parallel crystal gate switch; The first end of the current booster is connected to the first end of the first anti-parallel crystal gate switch, the second end of the first anti-parallel crystal gate switch is connected to the first end of the circuit breaker, and the second end of the current booster is connected to the second end of the circuit breaker.

3. A synthetic test loop testing method based on power electronic devices as claimed in claim 2, characterized in that: The current source loop includes a first capacitor, a first inductor and a second anti-parallel crystal gate switch; The first end of the second anti-parallel crystal gate switch is connected to the first end of the circuit breaker, the second end of the second anti-parallel crystal gate switch is connected to the first end of the first inductor, the second end of the first inductor is connected to the first end of the first capacitor, and the second end of the first capacitor is connected to the second end of the circuit breaker.

4. A synthetic test loop testing method based on power electronic devices as claimed in claim 3, characterized in that: The frequency modulation circuit includes: a frequency modulation capacitor, a frequency modulation resistor and a frequency modulation inductor; The first end of the frequency-modulating resistor is connected to the first end of the circuit breaker, the second end of the frequency-modulating resistor is connected to the first end of the frequency-modulating capacitor, the second end of the frequency-modulating capacitor is connected to the second end of the circuit breaker, the first end of the frequency-modulating inductor is connected to the second end of the first inductor, the second end of the frequency-modulating inductor is connected to the second end of the circuit breaker, and the second end of the circuit breaker is grounded.

5. A synthetic test loop testing method based on power electronic devices as claimed in claim 4, characterized in that: The step of applying an equivalent power frequency short-circuit current to the circuit breaker through the current source loop specifically includes: Controlling a first anti-parallel crystal switch in the current source loop to close, thereby turning on the current source loop; An equivalent power frequency short-circuit current is applied to the circuit breaker through a current booster in the current source loop.

6. A synthetic test circuit testing method based on power electronic devices as claimed in claim 5, characterized in that: The predicting of the current zero point moment according to the equivalent power frequency short-circuit current and applying an introduction current to the circuit breaker through the voltage source loop at a preset time before the current zero point moment specifically includes: Collecting the equivalent power frequency short-circuit current, and predicting the current zero point time according to the collected equivalent power frequency short-circuit current; At a preset time before the current zero point, controlling the second anti-parallel crystal gate switch in the voltage source loop to close, thereby turning on the voltage source loop; Through the first capacitor of the voltage source loop, before the zero point of the equivalent power frequency short-circuit current of the current source loop, an introduction current having the same slope as the equivalent power frequency short-circuit current at the zero point is applied to the circuit breaker.

7. A synthetic test loop testing method based on power electronic devices as claimed in claim 6, characterized in that: The method of predicting the current zero point time according to the collected equivalent power frequency short-circuit current specifically includes: According to the collected equivalent power frequency short-circuit current, the actual current frequency and period output by the actual current source loop are calculated; Determine the target zero point of the equivalent power frequency short-circuit current according to the actual current frequency and period, combined with the preset characteristic value output by the current source loop; Based on the target zero point and the actual current frequency and period, a current zero point time is determined.

8. A synthetic test circuit testing method based on power electronic devices as claimed in claim 6, characterized in that: The controlling the voltage source circuit to be short-circuited when the introduced current does not pass through zero, and controlling the access to the frequency modulation circuit after the introduced current passes through zero to apply a recovery voltage to the circuit breaker specifically includes: Generate a start signal for the frequency modulation circuit at a preset time before the input current provided by the voltage source circuit passes through zero; According to the input signal, the first anti-parallel crystal gate switch in the current source loop is disconnected when the introduced current passes through zero, and the voltage source loop is controlled to be short-circuited when the introduced current does not pass through zero; After the introduced current passes through zero, the frequency modulation circuit is controlled to be connected, and the transient recovery voltage and the power frequency recovery voltage are jointly provided to the circuit breaker through the frequency modulation capacitor and the frequency modulation inductor of the frequency modulation circuit.

9. A terminal device, characterized in that: It comprises a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, and when the processor executes the computer program, it implements the synthetic test loop testing method based on power electronic devices as described in any one of claims 1 to 8.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium includes a stored computer program, wherein when the computer program is executed, the device where the computer-readable storage medium is located is controlled to execute the synthetic test loop testing method based on power electronic devices according to any one of claims 1 to 8.

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