Portable rapid electrical test clamp for unpackaged chip

Abstract

The invention discloses a portable rapid electrical test clamp for an unpackaged chip. The portable rapid electrical test clamp for the unpackaged chip comprises a bearing plate used for placing the chip, a limiting piece used for limiting the position of the chip, a first reset piece used for resetting the bearing plate, a probe used for being electrically connected with the chip, a pressing mechanism used for pressing the chip on the bearing plate, and a base used for installing the bearing plate and the pressing mechanism. The two ends of the first reset piece abut against the bearing plate and the base respectively, the bearing plate is provided with a containing groove used for containing a chip, the limiting piece and the probe are both arranged on the base, and when the pressing mechanism presses the chip in the containing groove, the probe penetrates through the bearing plate and stretches into the containing groove to be electrically connected with the chip. According to the portable rapid electrical test clamp for the unpackaged chip, the positions of the probe and the chip can be fixed, it can be ensured that the probe can be aligned with the chip every time, and the result of an electrical test experiment conducted through the clamp is more accurate.

Description

Technical Field

[0001] The present invention relates to the technical field of electrical testing of unpackaged chips, in particular to a portable fast electrical testing fixture for unpackaged chips. Background Art

[0002] To prevent the impact of packaging on chip electrical test results, chip electrical parameter tests are usually performed directly with probes, typically using a probe card. Probe cards are typically composed of a customized PCB, probes, and other functional components. However, contact probe cards require the use of a microscope on a probe station to confirm the probe insertion position, which is subject to many external influences. For the same chip, different personnel operating at different times may result in different test results due to differences in the insertion position, resulting in test errors. At the same time, since the probe station is required for auxiliary positioning, the chip does not have a suitable fixture on the probe card and is easily affected by external vibrations, causing displacement, affecting the insertion position, and thus affecting the electrical test results. For chips of the same size and model, the probe card needs to repeatedly use the probe station to confirm the insertion position every time the chip is changed. This is not only cumbersome to operate, but also makes the test results easily affected by external influences. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to provide a portable fast electrical test fixture for unpackaged chips which can limit the positions of probes and chips.

[0004] In order to solve the above problems, the present invention provides a portable rapid electrical test fixture for unpackaged chips, which includes a carrier plate for placing chips, a limiter for limiting the position of the chip, a first reset member for resetting the carrier plate, a probe for electrically connecting to the chip, a clamping mechanism for pressing the chip on the carrier plate, and a base for installing the carrier plate and the clamping mechanism. The two ends of the first reset member are respectively abutted against the carrier plate and the base. A placement groove for placing the chip is provided on the carrier plate. The limiter and the probe are both provided on the base. When the clamping mechanism presses the chip into the placement groove, the probe passes through the carrier plate and extends into the placement groove to electrically connect with the chip.

[0005] Furthermore, the carrier plate is provided with a taking-out notch for taking out the chip, and the taking-out notch is communicated with the placement groove.

[0006] Furthermore, the supporting plate is provided with a positioning notch for cooperating with the limiting member.

[0007] Furthermore, the supporting plate is provided with an upper receiving hole for receiving the first resetting member, and the base is provided with a lower receiving hole for receiving the first resetting member, and the upper receiving hole is aligned with the lower receiving hole.

[0008] Furthermore, the limiting member has a limiting portion for limiting the carrying plate and a connecting portion for connecting with the base, and the limiting portion is connected to the connecting portion.

[0009] Furthermore, a mounting hole for mounting a probe is provided on the base, the probe is provided in the mounting hole, the probe has a positioning step, the mounting hole has a limiting step adapted to the positioning, and the positioning step and the limiting step cooperate to fix the position of the probe.

[0010] Furthermore, the base includes a base body for limiting the upper end position of the probe and a mounting plate for limiting the lower end position of the probe, the mounting plate is fixed on the base body, the base body is provided with a floating groove for guiding the up and down movement of the supporting plate and an upper step hole for limiting the upper end position of the probe, the mounting plate is provided with a lower step hole for limiting the lower end position of the probe, the upper step hole and the lower step hole constitute a mounting hole, and the upper step hole and the lower step hole are combined to form a mounting hole.

[0011] Furthermore, the clamping mechanism includes a clamping plug for clamping the chip, a connecting seat for connecting to the base, a hook for clamping with the connecting seat, and a pressure cover for installing the clamping plug. The pressure cover is hinged to the connecting seat, and the connecting seat is provided with a clamping notch for cooperating with the hook.

[0012] Furthermore, a rebound mechanism is provided on the pressure cover, and the rebound mechanism includes a rebound column for connecting to the pressure cover, a second reset member for resetting the rebound column, and an anti-drop cap for preventing the rebound column from falling off. The second reset member is sleeved on the rebound column, and the two ends of the second reset member are respectively supported on the rebound column and the pressure cover, and the rebound column passes through the pressure cover and is connected to the anti-drop cap.

[0013] Furthermore, the compression plug is mounted on a fixing seat via a fastener, and the fixing seat is fixed on the gland.

[0014] The portable rapid electrical test fixture for unpackaged chips of the present invention uses a base to fix the probe to ensure that the position of the probe is always in the same position, and uses a placement slot to limit the position of the chip. At the same time, a clamping mechanism presses the chip, so that the chip and the probe can always remain relatively fixed. Each time the chip is placed, it is connected to the probe at the same position, which improves the accuracy of the test; there is no need for needle insertion, which greatly reduces the complexity of the operation and saves test time. Since there is no need to use a probe station to determine the needle insertion position, the flexibility of the test is greatly improved and the limitation of the site is removed. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a structural schematic diagram of a preferred embodiment of the portable fast electrical test fixture for unpackaged chips of the present invention.

[0016] Figure 2 This is an exploded view of the base.

[0017] Figure 3 It is a structural diagram of the load-bearing plate.

[0018] Figure 4 It is a bottom view of the load-bearing plate.

[0019] Figure 5 It is a structural diagram of the limiter.

[0020] Figure 6 is a schematic diagram of the probe structure.

[0021] Figure 7 It is a schematic diagram of the structure in which the probe is arranged in the mounting hole.

[0022] Figure 8 It is a structural diagram of the mounting hole.

[0023] Figure 9 It is a structural schematic diagram of the first restoring member being placed in the upper accommodating hole and the lower accommodating hole.

[0024] Figure 10 It is a structural diagram of the clamping mechanism.

[0025] Figure 11 It is a structural diagram of the rebound mechanism.

[0026] The meanings of the reference numerals in the accompanying drawings are:

[0027] Base 1, mounting hole 10, base body 11, floating groove 111, upper step hole 112, guide plate 12, guide hole 121, mounting plate 13, lower step hole 131, probe 21, lower needle 211, upper needle 212, needle rod 213, support member 22, carrying plate 3, placement groove 31, taking notch 32, positioning notch 33, first through-hole 34, second through-hole 35, upper accommodating hole 36, position mark 37, limiter 4, connecting part 41, limiter 42, tightening groove 43, first reset member 5, clamping mechanism 6, pressure cover 61, clamping plug 62, hook 63, connecting seat 64, clamping notch 641, fixing seat 65, rebound mechanism 7, second reset member 71, rebound column 72, anti-drop cap 73, fixing mechanism 8, fixing bolt 81, fixing nut 82, chip 9. DETAILED DESCRIPTION

[0028] The present invention will be further described below with reference to the accompanying drawings.

[0029] like Figures 1 to 2As shown, a preferred embodiment of the portable rapid electrical test fixture for unpackaged chips of the present invention includes a base 1, a probe 21, a support member 22, a carrier plate 3, a limit member 4, a first reset member 5 and a clamping mechanism 6. The carrier plate 3 is used to place the chip 9, and the two ends of the first reset member 5 are abutted against the carrier plate 3 and the base 1, so that the carrier plate 3 can float up and down relative to the base 1. The first reset member 5 is usually a spring. The limit member 4 is provided on the base 1, and the limit member 4 is used to limit the carrier plate 3 to prevent the carrier plate 3 from being separated from the base 1. The probe 21 is provided on the base 1, and the upper end of the probe 21 is inserted into the carrier plate 3. When there is no external force pressing the carrier plate 3 downward, the upper end of the probe 21 does not penetrate the carrier plate 3, and the lower end of the probe 21 is abutted against the PCB board of the external testing mechanism. The pressing mechanism 6 is provided on the base 1 and is used to press the chip 9 on the carrier plate 3 so that the upper end of the probe 21 can abut against the chip 9, thereby electrically connecting the probe 21 to the chip 9 and the external PCB. The support member 22 is provided on the base 1, and the upper end of the support member 22 is inserted through the carrier plate 3. The support member 22 is used to support the chip 9, ensuring that the chip 9 is evenly stressed when pressed by the pressing mechanism 6 and is not easily damaged.

[0030] like Figure 3 and Figure 4As shown, the carrier plate 3 has a placement groove 31 for placing the chip 9, a removal notch 32 for facilitating the removal of the chip 9, a positioning notch 33 cooperating with the limiter 4, a first through-hole 34 for the probe 21 to pass through, and a second through-hole 35 for the support member 22 to pass through. The opening of the placement groove 31 is larger at the top and smaller at the bottom, that is, the side wall of the placement groove 31 is an inclined surface, which facilitates guiding the chip 9 to fall into the bottom of the placement groove 31. Even if the position of the bottom of the placement groove 31 is slightly deviated when the chip 9 is placed, the chip 9 can be accurately placed in the placement groove 31, thereby improving the accuracy of placing the chip 9. The first through-hole 34 and the second through-hole 35 are both located at the bottom of the placement groove 31, and the second through-hole 35 are evenly distributed on both sides of the first through-hole 34 to ensure that the chip 9 is evenly stressed. The removal notch 32 is connected to the placement groove 31, so that the chip 9 can be placed into the placement groove 31 or removed from the placement groove 31 through the removal notch 32 with the help of a tool. Generally speaking, the removal notch 32 is provided on both sides of the placement groove 31, that is, provided along the width of the placement groove 31, so that the chip 9 can be easily removed from the placement groove 31 when removing the chip 9. The positioning notch 33 is located at the edge of the carrier plate 3, usually provided on the top surface of the carrier plate 3, that is, formed by a downward depression on the top surface of the carrier plate 3, so that there is space on the carrier plate 3 to accommodate the limiter 4. In this way, when the limiter 4 is in contact with the carrier plate 3, the top surface of the limiter 4 is flush with the top surface of the carrier plate 3, eliminating the need for a clearance space on the clamping mechanism 6 and also improving the appearance. The carrier plate 3 is provided with an upper receiving hole 36 for accommodating the first reset member 5. The upper receiving hole 36 is formed by an upward depression on the bottom surface of the carrier plate 3, and the upper end of the first reset member 5 abuts against the bottom of the hole. The carrier plate 3 is also provided with a position mark 37 for marking the placement direction of the chip 9. The position mark 37 is a circular groove. The position mark 37 can also be a groove of other shapes, which is usually consistent with the shape of the mark on the chip 9. In other embodiments, the position mark 37 can also be a mark pasted on the carrier plate 3.

[0031] like Figure 5As shown, the limiting member 4 includes a connecting portion 41 for connecting to the base 1 and a limiting portion 42 for limiting the load-bearing plate 3. The limiting portion 42 is connected to the connecting portion 41. The limiting portion 42 and the connecting portion 41 are usually formed in one piece for easy assembly. The connecting portion 41 is provided with a thread, and the connecting portion 41 is screwed onto the base 1. The limiting portion 42 is circular, and the diameter of the limiting portion 42 is larger than the diameter of the connecting portion 41, ensuring that the limiting portion 42 can abut against the load-bearing plate 3 while the connecting portion 41 does not interfere with the load-bearing plate 3. In other embodiments, the limiting portion 42 can also be polygonal. When it is polygonal, the width of the limiting portion 42 is larger than the diameter of the connecting portion 41. The limiting portion 42 is provided with a tightening groove 43. The tightening groove 43 is cross-shaped. The tightening groove 43 can also be a straight or hexagonal shape. In this way, a tool such as a screwdriver can be inserted into the tightening groove 43 to rotate the limiting portion 42. The rotation of the limiting portion 42 drives the connecting portion 41 to rotate, thereby installing or removing the limiting member 4 from the base 1. The limiting member 4 is usually a screw, and the use of universal parts reduces costs.

[0032] like Figure 2 as well as Figures 6 to 9 As shown, the base 1 is provided with mounting holes 10 for mounting a probe 21 and a support member 22. The probe 21 and the support member 22 are inserted into the corresponding mounting holes 10. The probe 21 is provided with positioning steps at both ends. The mounting hole 10 has matching limiting steps at both ends to secure the probe 21 and the support member 22 within the base 1. The base 1 has a lower receiving hole for accommodating a first reset member 5. The lower receiving hole is aligned with the upper receiving hole 36, so that the two ends of the first reset member 5 can be respectively abutted against the base 1 and the supporting plate 3.

[0033] Specifically, the probe 21 has an upper needle head 212 for electrically connecting to the chip 9, a lower needle head 211 for electrically connecting to an external PCB board, and a needle rod 213 for connecting the upper needle head 212 and the lower needle head 211. The diameters of the upper needle head 212 and the lower needle head 211 are smaller than the needle rod 213, so that a positioning step is formed at the connection between the upper needle head 212 and the lower needle head 211 and the needle rod 213. The support member 22 usually adopts a probe 21 to improve the versatility of the parts. The probe 21 adopts a retractable probe 21, which is convenient for automatically adjusting the length of the probe 21 according to the movement of the chip 9 when pressing the chip 9, so that the probe 21 can float according to the chip 9, so that the force of the chip 9 and the probe 21 resisting each other when they contact is smaller, reducing the possibility of damage to the chip 9 during the pressing process.

[0034] The base 1 includes a base body 11, a guide plate 12, and a mounting plate 13. The guide plate 12 and the mounting plate 13 are both fixed to the base body 11, and the guide plate 12 is located between the base body 11 and the mounting plate 13. The base body 11 is provided with a floating groove 111 and an inverted upper step hole 112. The support plate 3 is disposed in the floating groove 111. The floating groove 111 is used to limit the support plate 3, ensuring that the support plate 3 can only move up and down. The upper step hole 112 is used to limit the position of the upper end of the probe 21 or the support member 22, that is, the step of the upper step hole 112 is a limit step. The guide plate 12 is provided with a guide hole 121. The guide hole 121 is used to guide the probe 21 or the support member 22, ensuring that the middle part of the probe 21 and the support member 22 does not bend. The mounting plate 13 is provided with a lower step hole 131, and the lower step hole 131 is used to limit the position of the lower end of the probe 21 or the support member 22, that is, the step of the lower step hole 131 is a limiting step. The upper step hole 112, the guide hole 121 and the lower step hole 131 are combined to form the mounting hole 10. The upper and lower ends of the probe 21 are restricted, ensuring that the probe 21 and the support member 22 cannot move, that is, the positions of the probe 21 and the support member 22 are fixed. The base 1 is set to three parts, which can facilitate the installation of the probe 21 and the support member 22 in the base 1, and can also limit the probe 21 and the support member 22. In other embodiments, the guide plate 12 can also be omitted, and the corresponding mounting hole 10 is composed of the upper step hole 112 and the lower step hole 131.

[0035] The base 11 is also provided with a fixing mechanism 8 for fixing the PCB. The fixing mechanism 8 includes a fixing bolt 81 connected to the base 11 and a fixing nut 82. The fixing bolt 81 is screwed onto the fixing bolt 81 and the fixing nut 82 is used to press the PCB against the base 11.

[0036] like Figure 10 and Figure 11 As shown, the pressing mechanism 6 includes a pressing cover 61, a pressing plug 62, a hook 63, and a connecting seat 64. The connecting seat 64 is fixed to the base 1, the pressing cover 61 is hinged to the connecting seat 64, the pressing plug 62 is fixed to the pressing cover 61, and the pressing plug 62 is used to press the chip 9. The hook 63 is hinged to the pressing cover 61 and is used to engage with the connecting seat 64. When the hook 63 is engaged with the connecting seat 64, the pressing plug 62 presses the chip 9 into the placement groove 31, and the carrier plate 3 is pressed against the base 1, thereby allowing the probe 21 and the support member 22 to abut against the chip 9.

[0037] The compression plug 62 is made of a material with a certain degree of softness, such as rubber, so that it can protect the chip 9. The shape of the rubber plug is consistent with the appearance of the chip 9, ensuring that the chip 9 is evenly stressed. The compression plug 62 is installed on the fixing seat 65 by fasteners such as bolts, and the fixing seat 65 is further fixed to the pressure cover 61 by bolts; the compression plug 62 is installed on the pressure cover 61 through the fixing seat 65, so that the bolts can pass through the fixing seat 65 and then connect with the compression plug 62, so that there will be no fasteners on the side of the compression plug 62 that contacts the chip 9, and the chip 9 will not be damaged.

[0038] The connecting seat 64 is provided with a snap-fit ​​notch 641, and the hook 63 is snap-fitted to the snap-fit ​​notch 641. The connecting seat 64 is fixed to the base 1, and the hook 63 is snap-fitted to the connecting seat 64, and can also press the pressing plug 62 against the chip 9.

[0039] The pressure cover 61 is also provided with a rebound mechanism 7, which includes a second reset member 71, a rebound column 72 and an anti-drop cap 73. The second reset member 71 is usually a spring, and the second reset member 71 is passed through the rebound column 72. One end of the reset second reset member 71 abuts against the pressure cover 61, and the other end of the second reset member 71 abuts against the rebound column 72. The second reset member 71 is used to reset the rebound column 72. The rebound column 72 passes through the pressure cover 61 and is connected to the anti-drop cap 73. The anti-drop cap 73 is used to prevent the rebound column 72 from falling off the pressure cover 61. When the hook 63 is engaged with the engaging notch 641, that is, when the clamping mechanism 6 clamps the chip 9, the second reset member 71 is compressed. When the hook 63 disengages from the engaging notch 641, the second reset member 71 pushes the pressure cover 61 to flip backward, thereby opening the pressure cover 61. It is only necessary to unhook the hook 63, and there is no need to manually flip the pressure cover 61. Because most of the probe 21 is completely enclosed by the test fixture, the chance of the probe being damaged is greatly reduced compared to a conventional probe card, making it easier to store. In the present invention, the probe and the PCB are connected by contact, which makes probe replacement more cost-effective and convenient compared to the soldering connection of a conventional probe card.

[0040] When the chip 9 needs to be fixed, the chip 9 is placed in the placement groove 31, and then the pressure cover 61 is turned over and the hook 63 is clamped in the clamping notch 641 to complete the fixation of the chip 9. Since the probe 21 is limited by the mounting hole 10, the probe 21 cannot move, so that the position of the probe 21 is always in the same position. The chip 9 is placed in the placement groove 31 and can always be accurately electrically connected to the probe 21, ensuring the test accuracy. There is no need for needle insertion, which greatly reduces the complexity of the operation and saves test time. Since there is no need to use the probe 21 to determine the needle insertion position, the flexibility of the test is greatly improved and the site restriction is removed. Since the probe 21 is almost wrapped by the base, the probability of damage to the probe 21 is greatly reduced compared to the existing needle insertion method, and it is easier to store. The probe 21 and the PCB board are contact-connected. Compared with the needle insertion method that requires welding connection, the replacement cost of the probe 21 is lower and more convenient.

[0041] When the chip 9 needs to be taken out, the hook 63 is released, and the pressing cover 61 is automatically opened under the action of the rebound mechanism 7, and then the chip 9 can be taken out, which is convenient.

[0042] The above are merely embodiments of the present invention and are not intended to limit the patent scope of the present invention. Any equivalent structures made using the contents of the present invention's description and drawings, directly or indirectly applied to other related technical fields, are also within the patent protection scope of the present invention.

Claims

1. A portable fast electrical test fixture for unpackaged chips, characterized by: It includes a carrier plate for placing chips, a limiter for limiting the position of the chip, a first reset member for resetting the carrier plate, a probe for electrically connecting to the chip, a clamping mechanism for pressing the chip on the carrier plate, and a base for installing the carrier plate and the clamping mechanism. The two ends of the first reset member are respectively abutted against the carrier plate and the base. A placement groove for placing the chip is provided on the carrier plate. The limiter and the probe are both provided on the base. When the clamping mechanism presses the chip into the placement groove, the probe passes through the carrier plate and extends into the placement groove to be electrically connected to the chip.

2. The portable fast electrical test fixture for unpackaged chips as claimed in claim 1, characterized in that: The carrying plate is provided with a taking notch for taking the chip, and the taking notch is communicated with the placement groove.

3. The portable fast electrical test fixture for unpackaged chips as claimed in claim 1, characterized in that: The bearing plate is provided with a positioning notch for cooperating with the limiting member.

4. The portable fast electrical test fixture for unpackaged chips as claimed in claim 1, characterized in that: An upper receiving hole for receiving the first resetting member is provided on the supporting plate, and a lower receiving hole for receiving the first resetting member is provided on the base, wherein the upper receiving hole is aligned with the lower receiving hole.

5. The portable fast electrical test fixture for unpackaged chips as claimed in claim 1, characterized in that: The limiting member comprises a limiting portion for limiting the carrying plate and a connecting portion for connecting with the base, and the limiting portion is connected with the connecting portion.

6. The portable fast electrical test fixture for unpackaged chips as claimed in claim 1, characterized in that: The base is provided with a mounting hole for mounting the probe, the probe is arranged in the mounting hole, the probe has a positioning step, the mounting hole has a limiting step adapted for positioning, and the positioning step and the limiting step cooperate to fix the position of the probe.

7. The portable fast electrical test fixture for unpackaged chips as claimed in claim 6, characterized in that: The base includes a base body for limiting the upper end position of the probe and a mounting plate for limiting the lower end position of the probe, the mounting plate is fixed on the base body, the base body is provided with a floating groove for guiding the up and down movement of the supporting plate and an upper step hole for limiting the upper end position of the probe, the mounting plate is provided with a lower step hole for limiting the lower end position of the probe, the upper step hole and the lower step hole constitute a mounting hole, and the upper step hole and the lower step hole are combined to form a mounting hole.

8. The portable fast electrical test fixture for unpackaged chips as claimed in claim 1, characterized in that: The clamping mechanism includes a clamping plug for clamping the chip, a connecting seat for connecting to the base, a hook for clamping with the connecting seat, and a pressure cover for installing the clamping plug. The pressure cover is hinged to the connecting seat, and the connecting seat is provided with a clamping notch for cooperating with the hook.

9. The portable fast electrical test fixture for unpackaged chips as claimed in claim 8, characterized in that: The pressure cover is also provided with a rebound mechanism, which includes a rebound column connected to the pressure cover, a second reset member for resetting the rebound column and an anti-drop cap for preventing the rebound column from falling off, the second reset member is sleeved on the rebound column, the two ends of the second reset member are respectively abutted on the rebound column and the pressure cover, and the rebound column passes through the pressure cover and is connected to the anti-drop cap.

10. The portable fast electrical test fixture for unpackaged chips as claimed in claim 8, characterized in that: The compression plug is mounted on a fixing seat via a fastener, and the fixing seat is fixed on the gland.

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