Aging test method

Abstract

The invention discloses an aging test method, particularly relates to the field of aging tests, and solves the problem that an aging test result is inaccurate due to the fact that a current shutdown circuit breaker aging test method excessively depends on previous data, and the aging test method specifically comprises the following steps: selecting a fixed number of shutdown circuit breaker screen model machines as test samples; constructing a first test environment and a second test environment of the test sample; performing a hygrothermal aging test on the test sample based on the test parameters of the test environment to obtain a hygrothermal aging normal signal or a hygrothermal aging abnormal signal corresponding to the test sample; performing an ultraviolet aging test on the test sample based on the test parameters of the test environment to obtain an ultraviolet aging normal signal or an ultraviolet aging abnormal signal corresponding to the test sample; the aging test result of the test sample is judged based on the test passing rate. The aging test result of the shutdown circuit breaker screen model machine is accurately analyzed.

Description

Technical Field

[0001] The invention belongs to the technical field of aging test, in particular to an aging test method. Background Art

[0002] In order to ensure that the shutdown circuit breaker can work stably for a long time, the aging test of the shutdown circuit breaker screen prototype is particularly important. However, when conducting the aging test of the shutdown circuit breaker, the current aging test method has problems such as complex operation and too long test cycle. In addition, in order to improve the test efficiency of the aging test, the shutdown circuit breaker is usually tested and compared based on previous test data or fixed data. This test method is too dependent on previous data, which can easily cause inaccurate aging test results of the shutdown circuit breaker screen prototype. To this end, we propose an aging test method. Summary of the invention

[0003] The purpose of the present invention is to provide an aging test method to solve the problems raised in the above background technology.

[0004] In order to achieve the above object, the present invention adopts the following technical solutions: An aging test method, the aging test method is as follows: Step S10, selecting a fixed number of shutdown circuit breaker panel prototypes as test samples; Step S20, constructing a first test environment and a second test environment for the test sample; Step S30, performing a damp heat aging test on the test sample based on the test parameters of the test environment, and obtaining a normal damp heat aging signal or an abnormal damp heat aging signal corresponding to the test sample; Step S40, performing an ultraviolet aging test on the test sample based on the test parameters of the test environment, and obtaining an ultraviolet aging normal signal or an ultraviolet aging abnormal signal corresponding to the test sample; Step S50: determining the aging test result of the test sample based on the test pass rate.

[0005] Furthermore, the first test environment is a damp heat test environment, and the second test environment is an ultraviolet test environment.

[0006] Furthermore, the construction process of the first test environment in step S20 is specifically as follows: Step S201, configuring a wet heat sealing device for testing a test sample under a first test environment; Step S202, the heating device, the humidifying device, and the electrical device are connected to the moist heat sealing device respectively, and the working space where the moist heat sealing device, the heating device, the humidifying device, and the electrical device are located is recorded as the first test environment.

[0007] Furthermore, the process of setting up the second test environment in step S20 is specifically as follows: Step S211, configuring an ultraviolet sealing device for testing the test sample under a second test environment; Step S212: The radiation control device and the colorimeter are connected to the ultraviolet sealing device respectively, and the working space where the ultraviolet sealing device, the colorimeter and the radiation control device are located is marked as the second test environment.

[0008] Furthermore, the test parameters are the test humidity range and the test temperature range of the test sample in the damp heat test environment, the ultraviolet irradiance range of the test sample in the ultraviolet test environment, and the minimum exposure time of different ultraviolet irradiances.

[0009] Furthermore, the step S30 includes the following sub-steps: Step S301, obtaining test parameters of the test sample under the first test environment, and adjusting the real-time temperature value and the real-time humidity value inside the wet heat sealing device to the corresponding test parameters; Step S302, setting a test duration and multiple time points within the test duration, placing the test sample in a first test environment for a damp heat aging test, inputting a rated voltage to the test sample through an electrical device according to the rated voltage of the test sample, and recording the rated voltage input by the electrical device to the test sample as an input voltage; Step S303, the input voltage remains unchanged, the real-time resistance of the test sample under the first test environment is measured at multiple time points, and the test reference power of the test sample under the first test environment at different time points is calculated; Step S304 , constructing a test reference power curve of the test sample under the first test environment according to the test reference powers at different time points.

[0010] Furthermore, the step S30 further includes the following sub-steps: Step S305, taking the real-time temperature value inside the wet heat sealing device as a quantitative value and the real-time humidity value as a variable, adjusting the real-time humidity value inside the wet heat sealing device to a value greater than the right end point of the test humidity range through a humidifying device, and the input voltage remains unchanged. Similarly, the humidity increase power of the test sample at different time points under the first test environment can be calculated, and a humidity increase power curve of the test sample under the first test environment is constructed according to the humidity increase power at different time points; At the same time, the real-time humidity value inside the wet heat sealing device is adjusted to be less than the left end point of the test humidity range through the humidifying device, and the input voltage remains unchanged. Similarly, the humidity reduction power of the test sample at different time points under the first test environment can be calculated, and the humidity reduction power curve of the test sample under the first test environment can be constructed according to the humidity increase power at different time points; Step S306, then taking the real-time humidity value inside the wet heat sealing device as a quantitative value and the real-time temperature value as a variable, the real-time temperature value inside the wet heat sealing device is adjusted to a value greater than the right end point of the test temperature range through the heating device, and the input voltage remains unchanged. Similarly, the temperature increase power of the test sample at different time points under the first test environment can be calculated, and the temperature increase power curve of the test sample under the first test environment is constructed according to the temperature increase power at different time points; At the same time, the real-time temperature value inside the wet heat sealing device is adjusted to be less than the left end point of the test temperature range through the heating device, and the input voltage remains unchanged. Similarly, the temperature reduction power of the test sample at different time points under the first test environment is calculated, and the temperature reduction power curve of the test sample under the first test environment is constructed according to the temperature increase power at different time points; Step S307, comparing the humidity increase power curve with the test reference power curve. If the humidity increase power curve completely overlaps with the test reference power curve, no operation is performed. If the humidity increase power curve does not completely overlap with the test reference power curve, the number of non-overlapping areas and the area of ​​each non-overlapping area are counted, and the area of ​​each non-overlapping area is added up to obtain the deviation area between the humidity increase power curve and the test reference power. Step S308, calculating the hygrothermal aging stability value of the humidity increasing power curve, and similarly, obtaining the hygrothermal aging stability values ​​of the humidity decreasing power curve, the temperature increasing power curve, and the temperature decreasing power curve; Step S309: If the humidity-increasing power curve, the humidity-reducing power curve, the temperature-increasing power curve and the temperature-reducing power curve corresponding to the humidity-increasing power curve and the temperature-reducing power curve are all greater than or equal to the humidity-reducing power curve, a humidity-reducing power curve normal signal is generated; if the humidity-reducing power curve, the humidity-reducing power curve, the temperature-increasing power curve and the temperature-reducing power curve corresponding to the humidity-reducing power curve and the temperature-reducing power curve are less than the humidity-reducing power curve, a humidity-reducing power curve abnormal signal is generated.

[0011] Furthermore, the test process of the ultraviolet aging test in step S40 is as follows: Step S401, recording the initial pixel value of the test sample; Step S402, then obtaining the test parameters of the test sample under the second test environment, and setting the ultraviolet irradiance of the test sample; Step S402, placing the test sample in a second test environment for UV aging test, and obtaining real-time pixel values ​​of the test sample at different time points during the UV aging test; wherein the time points also include the test start time point and the test end time point; Step S403, compare the real-time pixel value of the test sample at different time points during the ultraviolet aging test with the initial pixel value. If the real-time pixel value at any time point is not equal to the initial pixel value, the corresponding time point is recorded as the ultraviolet abnormality time point, and the real-time irradiation time of the test sample is obtained by subtracting the corresponding time of the test start time point from the corresponding time of the ultraviolet abnormality time point. The minimum irradiation time corresponding to the test sample is obtained according to the ultraviolet irradiance. When the real-time irradiation time is greater than or equal to the minimum irradiation time, proceed to the next step. When the real-time irradiation time is less than the minimum irradiation time, a ultraviolet aging abnormality signal is generated. If the real-time pixel values ​​at all time points are equal to the initial pixel value, proceed to the next step and increase the ultraviolet irradiance. Step S404, increasing the ultraviolet irradiance of the wet heat sealing device by using the radiation control device, and generating an abnormal ultraviolet aging signal according to the above steps or proceeding to the next step; Step S405: When the ultraviolet irradiance reaches the right end point of the ultraviolet irradiance range and the real-time irradiation durations under all ultraviolet irradiances are greater than or equal to the corresponding minimum irradiation durations, a normal ultraviolet aging signal is generated.

[0012] Furthermore, the step S50 includes the following sub-steps: Step S501, counting the test samples corresponding to the normal signals of humidity and heat aging and the normal signals of ultraviolet aging as normal samples, and counting the number of normal samples and recording it as the number of normal samples; Step S502, comparing the number of normal samples with the number of test samples to obtain the test pass rate of the test samples; Step S503, the test pass rate is compared with the preset pass rate to determine the quality level of the test sample.

[0013] Furthermore, the process of obtaining the quality grade is as follows: Step S5031, if the test pass rate is less than the first preset pass rate, the quality level of the test sample is the third quality level; Step S5032, if the test pass rate is greater than or equal to the first preset pass rate and less than the second preset pass rate, the quality level of the test sample is the second quality level; Step S5033, if the test pass rate is greater than or equal to the second preset pass rate, the quality level of the test sample is the first quality level; The first preset pass rate is lower than the second preset pass rate, the quality of the first quality level is higher than the quality of the second quality level, and the quality of the second quality level is higher than the quality of the third quality level.

[0014] In summary, due to the adoption of the above technical solution, the beneficial effects of the present invention are: The present invention selects a fixed number of shutdown circuit breaker screen prototypes as test samples, and then constructs a first test environment and a second test environment for the test samples. On the one hand, based on the test parameters of the test environment, the test samples are subjected to a damp heat aging test to obtain a normal damp heat aging signal or an abnormal damp heat aging signal corresponding to the test samples. On the other hand, based on the test parameters of the test environment, the test samples are subjected to an ultraviolet aging test to obtain a normal ultraviolet aging signal or an abnormal ultraviolet aging signal corresponding to the test samples. Finally, the aging test results of the test samples are determined based on the test pass rate. The present invention changes the problem of excessive aging tests and excessive past data, establishes a test reference group during the shutdown circuit breaker screen prototype test, and realizes accurate analysis of the shutdown circuit breaker screen prototype aging test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to facilitate understanding by those skilled in the art, the present invention is further described below with reference to the accompanying drawings.

[0016] Figure 1 is a flow chart of the method of the present invention; Figure 2 A schematic diagram of a reference power curve for testing in the present invention; Figure 3 It is a schematic diagram of the structure of the computer device in the present invention. DETAILED DESCRIPTION

[0017] The technical scheme of the present invention will be clearly and completely described below in conjunction with the embodiments. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0018] In one embodiment, see Figure 1 and Figure 2 As shown, the technical solution provided by the present invention is: an aging test method, comprising the following steps; Step S10, selecting a fixed number of shutdown circuit breaker panel prototypes as test samples; Specifically, the test sample is a shutdown circuit breaker screen prototype with qualified performance.

[0019] Step S20, constructing a first test environment and a second test environment for the test sample; Among them, the first test environment is a damp heat test environment, and the second test environment is an ultraviolet test environment; In specific implementation, the construction process of the first test environment in step S20 is specifically as follows: Step S201, configuring a wet heat sealing device for testing a test sample under a first test environment; In practice, the wet heat sealing device is a sealed box made of heat-resistant material, etc., which is not specifically limited here; Step S202, the heating device, the humidifying device, and the electrical device are connected to the wet heat sealing device respectively, and the working space where the wet heat sealing device, the heating device, the humidifying device, and the electrical device are located is recorded as the first test environment; Furthermore, the process of setting up the second test environment in step S20 includes the following steps: Step S211, configuring an ultraviolet sealing device for testing the test sample under the second test environment; in practice, the ultraviolet sealing device is a sealed box made of an anti-ultraviolet material, etc., and a plurality of sets of ultraviolet lamps are installed inside the ultraviolet sealing device, which is not specifically limited here; Step S212: The radiation control device and the colorimeter are connected to the ultraviolet sealing device respectively, and the working space where the ultraviolet sealing device, the colorimeter and the radiation control device are located is marked as the second test environment.

[0020] Furthermore, when the test sample is actually tested, the following steps are included: Step S30, performing a damp heat aging test on the test sample based on the test parameters of the test environment, and obtaining a normal damp heat aging signal or an abnormal damp heat aging signal corresponding to the test sample; It should be specifically stated that the test parameters are the test humidity range and test temperature range of the test sample (i.e. the shutdown circuit breaker screen prototype with qualified performance) in the wet heat test environment, and the ultraviolet irradiance range of the test sample (i.e. the shutdown circuit breaker screen prototype with qualified performance) in the ultraviolet test environment and the minimum exposure time of different ultraviolet irradiances; The damp heat aging test in step S30 includes the following sub-steps: Step S301, obtaining the test parameters of the test sample under the first test environment, and adjusting the real-time temperature value and the real-time humidity value inside the wet heat sealing device to the corresponding test parameters by means of a heating device and a humidifying device; Step S302, setting the test duration and multiple time points within the test duration, placing the test sample in the first test environment for a damp heat aging test, inputting the rated voltage to the test sample through the electrical device according to the rated voltage of the test sample, and recording the rated voltage input by the electrical device to the test sample as input voltage Ui, where i is the number of the test sample, and the time points need to include the test start time point and the test end time point; Step S303: The input voltage remains unchanged, and the real-time resistance Rit of the test sample under the first test environment is measured at multiple time points, where t is the number of the time point, and the formula Pit= (Ui / Rit) is used. 2 ×Rit is used to calculate the test reference power Pit of the test sample at different time points under the first test environment; Step S304, constructing a test reference power curve of the test sample under the first test environment according to the test reference power at different time points; in practice, the test reference power curve is obtained with the time point as the X-axis and the test reference power as the Y-axis; Step S305, taking the real-time temperature value inside the wet heat sealing device as a quantitative value and the real-time humidity value as a variable, adjusting the real-time humidity value inside the wet heat sealing device to a value greater than the right end point of the test humidity range through a humidifying device, and the input voltage remains unchanged. Similarly, the humidity increase power of the test sample at different time points under the first test environment can be calculated, and a humidity increase power curve of the test sample under the first test environment is constructed according to the humidity increase power at different time points; At the same time, the real-time humidity value inside the wet heat sealing device is adjusted to be less than the left end point of the test humidity range through the humidifying device, and the input voltage remains unchanged. Similarly, the humidity reduction power of the test sample at different time points under the first test environment can be calculated, and the humidity reduction power curve of the test sample under the first test environment can be constructed according to the humidity increase power at different time points; Step S306, then taking the real-time humidity value inside the wet heat sealing device as a quantitative value and the real-time temperature value as a variable, the real-time temperature value inside the wet heat sealing device is adjusted to a value greater than the right end point of the test temperature range through the heating device, and the input voltage remains unchanged. Similarly, the temperature increase power of the test sample at different time points under the first test environment can be calculated, and the temperature increase power curve of the test sample under the first test environment is constructed according to the temperature increase power at different time points; At the same time, the real-time temperature value inside the wet heat sealing device is adjusted to be less than the left end point of the test temperature range through the heating device, and the input voltage remains unchanged. Similarly, the temperature reduction power of the test sample at different time points under the first test environment can be calculated, and the temperature reduction power curve of the test sample under the first test environment can be constructed according to the temperature increase power at different time points; Step S307, Figure 2 As shown, the humidity increase power curve is compared with the test reference power curve. If the humidity increase power curve completely overlaps with the test reference power curve, no operation is performed. If the humidity increase power curve does not completely overlap with the test reference power curve, the number of non-overlapping areas and the area of ​​each non-overlapping area are counted, and the area of ​​each non-overlapping area is added up to obtain the deviation area between the humidity increase power curve and the test reference power. Step S308, calculate the damp heat aging stability value of the humidity increase power curve by combining the formula, the specific formula is as follows: The wet heat aging stability value = 1 / (the number of non-overlapping areas * the first proportional coefficient + the deviation area * the second proportional coefficient); the second proportional coefficient is greater than the first proportional coefficient; Similarly, the hygrothermal aging stability values ​​of the power curve with humidity reduction, the power curve with temperature increase, and the power curve with temperature reduction are obtained; Step S309: if the hygrothermal aging stability values ​​corresponding to the humidity increase power curve, the humidity decrease power curve, the temperature increase power curve, and the temperature decrease power curve are all greater than or equal to the hygrothermal aging stability threshold, a hygrothermal aging normal signal is generated; if the hygrothermal aging stability value corresponding to any of the humidity increase power curve, the humidity decrease power curve, the temperature increase power curve, and the temperature decrease power curve is less than the hygrothermal aging stability threshold, a hygrothermal aging abnormal signal is generated; Among them, in the damp heat aging test, if the humidity increase power curve, humidity decrease power curve, temperature increase power curve or temperature decrease power curve of the test sample completely overlaps with the test reference power curve, but in order to ensure the accuracy of the test, it is also necessary to take out the test sample and use another group of untested test samples for subsequent test steps.

[0021] Step S40, performing an ultraviolet aging test on the test sample based on the test parameters of the test environment, and obtaining an ultraviolet aging normal signal or an ultraviolet aging abnormal signal corresponding to the test sample; In specific implementation, the test process of the ultraviolet aging test in step S40 is: Step S401, recording the initial pixel value of the test sample; Step S402, then obtaining the test parameters of the test sample under the second test environment, and setting the ultraviolet irradiance of the test sample; Step S402, placing the test sample in a second test environment for UV aging test, and obtaining real-time pixel values ​​of the test sample at different time points during the UV aging test; wherein the time points also include the test start time point and the test end time point; Step S403, compare the real-time pixel value of the test sample at different time points during the ultraviolet aging test with the initial pixel value. If the real-time pixel value at any time point is not equal to the initial pixel value, the corresponding time point is recorded as the ultraviolet abnormality time point, and the real-time irradiation time of the test sample is obtained by subtracting the corresponding time of the test start time point from the corresponding time of the ultraviolet abnormality time point. The minimum irradiation time corresponding to the test sample is obtained according to the ultraviolet irradiance. When the real-time irradiation time is greater than or equal to the minimum irradiation time, proceed to the next step. When the real-time irradiation time is less than the minimum irradiation time, a ultraviolet aging abnormality signal is generated. If the real-time pixel values ​​at all time points are equal to the initial pixel value, proceed to the next step and increase the ultraviolet irradiance. Among them, the comparison method of the real-time pixel value and the initial pixel value can adopt the RGB value comparison method; Step S404, increasing the ultraviolet irradiance of the wet heat sealing device by using the radiation control device, and generating an abnormal ultraviolet aging signal according to the above steps or proceeding to the next step; Step S405: When the ultraviolet irradiance reaches the right end point of the ultraviolet irradiance interval, and the real-time irradiation durations under all ultraviolet irradiances are greater than or equal to the corresponding minimum irradiation durations, a normal ultraviolet aging signal is generated; In the UV aging test, when no pixel change occurs on the test sample under continuous UV irradiation, in order to ensure the accuracy of the test, the test sample needs to be taken out and another untested test sample needs to be used for subsequent test steps.

[0022] Step S50, determining the aging test result of the test sample based on the test pass rate; The step S50 includes the following sub-steps, which are as follows: Step S501, counting the test samples corresponding to the normal signals of humidity and heat aging and the normal signals of ultraviolet aging as normal samples, and counting the number of normal samples and recording it as the number of normal samples; Step S502, comparing the number of normal samples with the number of test samples to obtain the test pass rate of the test samples; Step S503, the test pass rate is compared with the preset pass rate to determine the quality level of the test sample, specifically: Step S5031, if the test pass rate is less than the first preset pass rate, the quality level of the test sample is the third quality level; Step S5032, if the test pass rate is greater than or equal to the first preset pass rate and less than the second preset pass rate, the quality level of the test sample is the second quality level; Step S5033, if the test pass rate is greater than or equal to the second preset pass rate, the quality level of the test sample is the first quality level; wherein the first preset pass rate is less than the second preset pass rate, based on the above comparison relationship, it can be seen that the quality of the first quality level is higher than the quality of the second quality level, and the quality of the second quality level is higher than the quality of the third quality level; In this application, if corresponding calculation formulas appear, the above calculation formulas are all dimensionless and take their numerical calculations. The weight coefficients, proportional coefficients and other coefficients in the formulas are set to a result value obtained by quantifying each parameter. The size of the weight coefficient and the proportional coefficient can be determined as long as it does not affect the proportional relationship between the parameter and the result value.

[0023] In a specific embodiment, Figure 3The structural diagram of a computer device is illustrated, and the computer device may include: a processor, a communication interface, a memory, and a communication bus, wherein the processor, the communication interface, and the memory communicate with each other through the communication bus. The processor may call the logic instructions in the memory to execute an aging test method, which includes: selecting a fixed number of shutdown circuit breaker screen prototypes as test samples; constructing a first test environment and a second test environment for the test samples; performing a damp heat aging test on the test samples based on the test parameters of the test environment to obtain a damp heat aging normal signal or a damp heat aging abnormal signal corresponding to the test samples; performing an ultraviolet aging test on the test samples based on the test parameters of the test environment to obtain an ultraviolet aging normal signal or an ultraviolet aging abnormal signal corresponding to the test samples; and determining the aging test results of the test samples based on the test pass rate.

[0024] In addition, the logic instructions in the above-mentioned memory can be implemented in the form of software functional units and can be stored in a computer-readable storage medium when sold or used as an independent product. Based on this understanding, the technical solution of the present application can be essentially or partly embodied in the form of a software product that contributes to the prior art. The computer software product is stored in a storage medium, including several instructions to enable a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0025] On the other hand, the present application also provides a computer program product, which includes a computer program stored on a computer-readable storage medium, and the computer program includes program instructions. When the program instructions are executed by a computer, the computer can execute an aging test method provided by the above methods, which method includes: selecting a fixed number of shutdown circuit breaker screen prototypes as test samples; constructing a first test environment and a second test environment for the test samples; performing a wet heat aging test on the test samples based on the test parameters of the test environment to obtain a normal wet heat aging signal or an abnormal wet heat aging signal corresponding to the test samples; performing an ultraviolet aging test on the test samples based on the test parameters of the test environment to obtain a normal ultraviolet aging signal or an abnormal ultraviolet aging signal corresponding to the test samples; and determining the aging test results of the test samples based on the test pass rate.

[0026] On the other hand, the present application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, is implemented to perform an aging test method provided above, the method comprising: selecting a fixed number of shutdown circuit breaker screen prototypes as test samples; constructing a first test environment and a second test environment for the test samples; performing a damp heat aging test on the test samples based on the test parameters of the test environment to obtain a normal damp heat aging signal or an abnormal damp heat aging signal corresponding to the test samples; performing an ultraviolet aging test on the test samples based on the test parameters of the test environment to obtain a normal ultraviolet aging signal or an abnormal ultraviolet aging signal corresponding to the test samples; and determining the aging test results of the test samples based on the test pass rate.

[0027] The device embodiments described above are merely illustrative, wherein the units described as separate components may or may not be physically separated, and the components displayed as units may or may not be physical units, that is, they may be located in one place, or they may be distributed on multiple network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the scheme of this embodiment. Ordinary technicians in this field can understand and implement it without paying creative labor.

[0028] Through the description of the above implementation methods, those skilled in the art can clearly understand that each implementation method can be implemented by means of software plus a necessary general hardware platform, and of course, can also be implemented by hardware. Based on this understanding, the above technical solution is essentially or the part that contributes to the prior art can be embodied in the form of a software product, and the computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a disk, an optical disk, etc., including a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0029] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. An aging test method, characterized in that: The aging test method is as follows: Step S10, selecting a fixed number of shutdown circuit breaker panel prototypes as test samples; Step S20, constructing a first test environment and a second test environment for the test sample; Step S30, performing a damp heat aging test on the test sample based on the test parameters of the test environment, and obtaining a normal damp heat aging signal or an abnormal damp heat aging signal corresponding to the test sample; Wherein, the step S30 includes the following sub-steps: Step S301, obtaining test parameters of the test sample under the first test environment, and adjusting the real-time temperature value and the real-time humidity value inside the wet heat sealing device to the corresponding test parameters; Step S302, setting a test duration and multiple time points within the test duration, placing the test sample in a first test environment for a damp heat aging test, inputting a rated voltage to the test sample through the electrical device according to the rated voltage, and the rated voltage input by the electrical device is recorded as the input voltage; Step S303, the input voltage remains unchanged, the real-time resistance of the test sample under the first test environment is measured at multiple time points, and the test reference power of the test sample under the first test environment at different time points is calculated; Step S304, constructing a test reference power curve of the test sample under the first test environment according to the test reference powers at different time points; Step S40, performing an ultraviolet aging test on the test sample based on the test parameters of the test environment, and obtaining an ultraviolet aging normal signal or an ultraviolet aging abnormal signal corresponding to the test sample; Step S50: determining the aging test result of the test sample based on the test pass rate.

2. An aging test method according to claim 1, characterized in that: The first test environment is a damp heat test environment, and the second test environment is an ultraviolet test environment.

3. An aging test method according to claim 2, characterized in that: The construction process of the first test environment in step S20 is specifically as follows: Step S201, configuring a wet heat sealing device for testing a test sample under a first test environment; Step S202, the heating device, the humidifying device, and the electrical device are connected to the moist heat sealing device respectively, and the working space where the moist heat sealing device, the heating device, the humidifying device, and the electrical device are located is recorded as the first test environment.

4. An aging test method according to claim 3, characterized in that: The process of setting up the second test environment in step S20 is specifically as follows: Step S211, configuring an ultraviolet sealing device for testing the test sample under a second test environment; Step S212: The radiation control device and the colorimeter are connected to the ultraviolet sealing device respectively, and the working space where the ultraviolet sealing device, the colorimeter and the radiation control device are located is marked as the second test environment.

5. An aging test method according to claim 1, characterized in that: The test parameters are the test humidity range and test temperature range of the test sample in the damp heat test environment, the ultraviolet irradiance range of the test sample in the ultraviolet test environment and the minimum exposure time of different ultraviolet irradiances.

6. An aging test method according to claim 1, characterized in that: The step S30 further includes the following sub-steps: Step S305, taking the real-time temperature value inside the wet heat sealing device as a quantitative value and the real-time humidity value as a variable, adjusting the real-time humidity value inside the wet heat sealing device to a value greater than the right end point of the test humidity range through a humidifying device, and the input voltage remains unchanged. Similarly, the humidity increase power of the test sample at different time points under the first test environment can be calculated, and a humidity increase power curve of the test sample under the first test environment is constructed according to the humidity increase power at different time points; At the same time, the real-time humidity value inside the wet heat sealing device is adjusted to be less than the left end point of the test humidity range through the humidifying device, and the input voltage remains unchanged. Similarly, the humidity reduction power of the test sample at different time points under the first test environment can be calculated, and the humidity reduction power curve of the test sample under the first test environment can be constructed according to the humidity increase power at different time points; Step S306, then taking the real-time humidity value inside the wet heat sealing device as a quantitative value and the real-time temperature value as a variable, the real-time temperature value inside the wet heat sealing device is adjusted to a value greater than the right end point of the test temperature range through the heating device, and the input voltage remains unchanged. Similarly, the temperature increase power of the test sample at different time points under the first test environment can be calculated, and the temperature increase power curve of the test sample under the first test environment is constructed according to the temperature increase power at different time points; At the same time, the real-time temperature value inside the wet heat sealing device is adjusted to be less than the left end point of the test temperature range through the heating device, and the input voltage remains unchanged. Similarly, the temperature reduction power of the test sample at different time points under the first test environment is calculated, and the temperature reduction power curve of the test sample under the first test environment is constructed according to the temperature increase power at different time points; Step S307, comparing the humidity increase power curve with the test reference power curve. If the humidity increase power curve completely overlaps with the test reference power curve, no operation is performed. If the humidity increase power curve does not completely overlap with the test reference power curve, the number of non-overlapping areas and the area of ​​each non-overlapping area are counted, and the area of ​​each non-overlapping area is added up to obtain the deviation area between the humidity increase power curve and the test reference power. Step S308, calculating the hygrothermal aging stability value of the humidity increasing power curve, and similarly, obtaining the hygrothermal aging stability values ​​of the humidity decreasing power curve, the temperature increasing power curve, and the temperature decreasing power curve; Step S309: If the humidity-increasing power curve, the humidity-reducing power curve, the temperature-increasing power curve and the temperature-reducing power curve corresponding to the humidity-increasing power curve and the temperature-reducing power curve are all greater than or equal to the humidity-reducing power curve, a humidity-reducing power curve normal signal is generated; if the humidity-reducing power curve, the humidity-reducing power curve, the temperature-increasing power curve and the temperature-reducing power curve corresponding to the humidity-reducing power curve and the temperature-reducing power curve are less than the humidity-reducing power curve, a humidity-reducing power curve abnormal signal is generated.

7. An aging test method according to claim 6, characterized in that: The test process of the ultraviolet aging test in step S40 is as follows: Step S401, recording the initial pixel value of the test sample; Step S402, then obtaining the test parameters of the test sample under the second test environment, and setting the ultraviolet irradiance of the test sample; Step S402, placing the test sample in a second test environment for UV aging test, and obtaining real-time pixel values ​​of the test sample at different time points during the UV aging test; wherein the time points also include the test start time point and the test end time point; Step S403, compare the real-time pixel value of the test sample at different time points during the ultraviolet aging test with the initial pixel value. If the real-time pixel value at any time point is not equal to the initial pixel value, the corresponding time point is recorded as the ultraviolet abnormality time point, and the real-time irradiation time of the test sample is obtained by subtracting the corresponding time of the test start time point from the corresponding time of the ultraviolet abnormality time point. The minimum irradiation time corresponding to the test sample is obtained according to the ultraviolet irradiance. When the real-time irradiation time is greater than or equal to the minimum irradiation time, proceed to the next step. When the real-time irradiation time is less than the minimum irradiation time, a ultraviolet aging abnormality signal is generated. If the real-time pixel values ​​at all time points are equal to the initial pixel value, proceed to the next step and increase the ultraviolet irradiance. Step S404, increasing the ultraviolet irradiance of the wet heat sealing device by using the radiation control device, and generating an abnormal ultraviolet aging signal according to the above steps or proceeding to the next step; Step S405: When the ultraviolet irradiance reaches the right end point of the ultraviolet irradiance range and the real-time irradiation durations under all ultraviolet irradiances are greater than or equal to the corresponding minimum irradiation durations, a normal ultraviolet aging signal is generated.

8. An aging test method according to claim 7, characterized in that: The step S50 includes the following sub-steps: Step S501, counting the test samples corresponding to the normal signals of humidity and heat aging and the normal signals of ultraviolet aging as normal samples, and counting the number of normal samples and recording it as the number of normal samples; Step S502, comparing the number of normal samples with the number of test samples to obtain the test pass rate of the test samples; Step S503, the test pass rate is compared with the preset pass rate to determine the quality level of the test sample.

9. An aging test method according to claim 8, characterized in that: The process of obtaining the quality grade is as follows: Step S5031, if the test pass rate is less than the first preset pass rate, the quality level of the test sample is the third quality level; Step S5032, if the test pass rate is greater than or equal to the first preset pass rate and less than the second preset pass rate, the quality level of the test sample is the second quality level; Step S5033, if the test pass rate is greater than or equal to the second preset pass rate, the quality level of the test sample is the first quality level; The first preset pass rate is lower than the second preset pass rate, the quality of the first quality level is higher than the quality of the second quality level, and the quality of the second quality level is higher than the quality of the third quality level.

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