Detection system, circuit and method for magnetic angle position sensor chip

Abstract

The invention provides a magnetic angle position sensor chip detection system, circuit and method, and particularly relates to the technical field of sensor chip detection, and the system comprises a sensor chip to be detected, an ATE test platform, a magnetic angle encoder set and an oscilloscope. The sensor chip to be tested is installed at a preset position, and the ATE test platform supplies power to the sensor chip to be tested and sends a magnetic field environment change instruction. The magnetic angle encoder set receives the instruction and then converts the instruction into a magnetic field conversion signal, and the chip to be tested senses the signal and converts the signal into an analog or digital signal. The oscilloscope outputs magnetic angle position information according to the analog signal, and the ATE test platform inputs a digital signal and verifies the accuracy of the magnetic angle position information corresponding to the digital signal. The system solves the technical problems of limited precision, low efficiency and insufficient reliability of an MT6501CT-ADD type magnetic angle position sensor chip in the detection process. Therefore, the detection precision, the detection efficiency and the detection reliability of the chip detection work are obviously improved.

Description

Technical Field

[0001] The present invention relates to the field of sensor chip detection technology, and in particular to a system, circuit and method for detecting a magnetic angle position sensor chip. Background Art

[0002] In modern industrial automation, automotive electronics, robotics and other high-tech fields, magnetic angle position sensors are increasingly used and have become an indispensable key component in control systems. With the continuous advancement of technology, the performance requirements of sensor chips are increasing, especially in terms of accuracy, response speed and stability. However, with the improvement of the integration of electronic products, the difficulty of detecting sensor chips has also increased. Traditional detection methods have been unable to meet the needs of high-precision and high-efficiency detection, especially when facing high-performance magnetic angle position sensor chips such as MT6501CT-ADD. Problems such as limited detection accuracy, low efficiency and insufficient reliability have gradually become prominent, seriously affecting the quality and performance of terminal products.

[0003] For the detection of MT6501CT-ADD magnetic angle position sensor chip, traditional methods usually use manual testing or semi-automatic testing. These methods build a test device that simulates the magnetic field environment, use manual operation or simple instruments to change the magnetic field angle, and observe the deviation between the angle value output by the chip and the actual magnetic field angle, so as to test the analog output function of the chip. In addition, tools such as logic analyzers are used to check the logic level of the signal to test the digital output function of the chip. However, these methods have many limitations. First, manual testing is not only inefficient, but also has low accuracy and is easily affected by human factors. Secondly, although semi-automatic testing has improved efficiency to a certain extent, it is still difficult to meet the detection needs of large-scale production and high-quality products. Especially when dealing with tests under complex working conditions and special environments, traditional methods are often unable to cope with it and it is difficult to comprehensively and accurately evaluate the performance of the chip.

[0004] In summary, how to solve the technical problems of limited accuracy, low efficiency and insufficient reliability of the MT6501CT-ADD magnetic angle position sensor chip in the detection process is an urgent problem to be solved. Summary of the invention

[0005] The main purpose of the present invention is to provide a system, circuit and method for detecting a magnetic angle position sensor chip to solve the technical problems of limited accuracy, low efficiency and insufficient reliability of the MT6501CT-ADD type magnetic angle position sensor chip during the detection process.

[0006] The present invention can achieve the following technical effects:

[0007] Improve detection accuracy: Through precise zeroing of NdFeB magnets and control of the magnetic field environment, the impact of the magnetic field environment on the detection results is reduced. The high-precision measurement capabilities of the ATE test platform and oscilloscope ensure the accuracy of the measurement results and reduce errors.

[0008] Improve detection efficiency: Automated detection technology reduces the time of manual operation and equipment switching. The ATE test platform can quickly perform multiple tests and automatically collect and record data, greatly improving the detection speed.

[0009] Enhanced reliability: The dual signal acquisition method of the ATE test platform and oscilloscope enhances the fault detection and diagnosis capabilities of the sensor chip, and can timely detect and alarm chip faults, improving the stability and reliability of the system. At the same time, the high-precision rotating table of the magnetic angle encoder set fixes the initial position of the NdFeB magnet and accurately controls the initial angle of the NdFeB magnet each time it rotates 360°, which improves the stability of the detection system.

[0010] In order to achieve the above objectives, the present invention provides a system, circuit and method for detecting a magnetic angle position sensor chip.

[0011] In a first aspect, the present invention provides a system for detecting a magnetic angle position sensor chip, the system comprising:

[0012] A sensor chip to be tested, wherein the sensor chip to be tested is installed at a predetermined position in a chip detection system;

[0013] ATE test platform, the ATE test platform is connected to the sensor chip to be tested;

[0014] A magnetic angle encoder set, wherein the magnetic angle encoder set is connected to the ATE test platform;

[0015] An oscilloscope, the oscilloscope being connected to the sensor chip to be tested;

[0016] Among them, the ATE test platform is used to power the sensor chip to be tested, and the ATE test platform is also used to send an instruction to the magnetic angle encoder set to change the magnetic field environment of the sensor chip to be tested; the magnetic angle encoder set is used to convert the instruction into a magnetic field conversion signal for changing the magnetic field environment, the sensor chip to be tested converts the sensed magnetic field conversion signal into an analog signal and a digital signal, the oscilloscope is used to output information of the magnetic angle position corresponding to the analog signal according to the analog signal, and the ATE test platform is also used to input the digital signal and determine whether the information of the magnetic angle position corresponding to the digital signal is accurate according to the digital signal.

[0017] Optionally, the magnetic angle encoder kit comprises:

[0018] A stepper motor controller, wherein the stepper motor controller is connected to the ATE test platform;

[0019] A stepper motor driver, the stepper motor driver is connected to the stepper motor controller;

[0020] A neodymium iron boron magnet connected to the stepper motor driver;

[0021] Among them, the stepper motor controller is used to receive the instruction, and the stepper motor controller is also used to provide and send an angle movement signal according to the instruction. The stepper motor driver is used to receive the angle movement signal, and the stepper motor driver is also used to drive the stepper motor according to the angle movement signal and drive the neodymium iron boron magnet on the rotating shaft of the stepper motor to rotate. The neodymium iron boron magnet is used to provide a magnetic field conversion signal for changing the magnetic field environment for the sensor chip to be tested.

[0022] Optionally, the detection system further comprises a test fixture, wherein the test fixture is connected to the ATE test platform, and the test fixture is used to place the sensor chip to be tested, and connect the ATE test platform to the sensor chip to be tested to transmit information.

[0023] In a second aspect, the present invention provides a detection circuit for a magnetic angle position sensor chip, the method is applied to the detection system for a magnetic angle position sensor chip described in the first aspect, and the detection circuit comprises:

[0024] A detection system power supply total power input circuit, wherein the detection system power supply total power input circuit is connected to the ATE test platform;

[0025] An electric signal is converted into a magnetic field conversion signal circuit, wherein the input end of the electric signal is converted into a magnetic field conversion signal circuit is connected to the ATE test platform, and the output end of the electric signal is converted into a magnetic field conversion signal circuit is connected to the magnetic angle encoder set;

[0026] The magnetic field signal is converted into an analog signal output interface circuit, and the magnetic field signal is converted into an analog signal output interface circuit connected to the sensor chip to be tested;

[0027] A circuit for converting a magnetic field signal into a digital signal, wherein the circuit for converting a magnetic field signal into a digital signal is connected to the sensor chip to be tested;

[0028] A digital signal input and output interface circuit, the digital signal input and output interface circuit is connected to the ATE test platform and the circuit for converting the magnetic field signal into a digital signal;

[0029] Among them, the detection system power supply total power input circuit is used to power the sensor chip to be tested, the digital signal input and output interface circuit is used to output the ATE test platform to send an instruction to the magnetic angle encoder set to change the magnetic field environment of the sensor chip to be tested, the electrical signal is converted into a magnetic field conversion signal circuit to convert the instruction into a magnetic field conversion signal for changing the magnetic field environment, the magnetic field signal is converted into an analog signal output interface circuit to convert the magnetic field conversion signal sensed by the sensor chip to be tested into an analog signal and output the information of the magnetic angle position corresponding to the analog signal according to the analog signal, the magnetic field signal is converted into a digital signal circuit to convert the magnetic field conversion signal sensed by the sensor chip to be tested into a digital signal, and the digital signal input and output interface circuit is also used to input the digital signal and determine whether the information of the magnetic angle position corresponding to the digital signal is accurate through the ATE test platform according to the digital signal.

[0030] Optionally, the circuit for converting the electrical signal into a magnetic field conversion signal comprises:

[0031] A controller circuit, wherein the controller circuit is connected to the ATE test platform via a digital signal input and output interface circuit;

[0032] a driver circuit connected to the controller circuit;

[0033] Among them, the controller circuit is used to indicate the circuit in the stepper motor controller, the driver circuit is used to indicate the circuit in the stepper motor driver, the controller circuit is used to input the instructions, and the controller circuit is also used to assist the stepper motor controller to provide and output an angle motion signal according to the instructions, the driver circuit is used to input the angle motion signal, and the driver circuit is also used to assist the stepper motor driver to drive the stepper motor according to the angle motion signal and drive the neodymium iron boron magnet on the rotating shaft of the stepper motor to rotate to provide a magnetic field conversion signal for changing the magnetic field environment for the sensor chip to be tested.

[0034] In a third aspect, the present invention provides a method for detecting a magnetic angle position sensor chip, the method being applied to the magnetic angle position sensor chip detection system described in the first aspect, the detection method comprising:

[0035] Powering the sensor chip to be tested through the ATE test platform;

[0036] Sending an instruction to change the magnetic field environment of the sensor chip to be tested to the magnetic angle encoder kit through the ATE test platform;

[0037] Using the magnetic angle encoder set to convert the instruction into a magnetic field conversion signal for changing the magnetic field environment;

[0038] The sensor chip to be tested converts the sensed magnetic field conversion signal into an analog signal and a digital signal;

[0039] Using the oscilloscope to output information of the magnetic angle position corresponding to the analog signal according to the analog signal;

[0040] The digital signal is input through the ATE test platform, and it is determined according to the digital signal whether the information of the magnetic angle position corresponding to the digital signal is accurate.

[0041] Optionally, the step of converting the instruction into a magnetic field conversion signal for changing the magnetic field environment by using the magnetic angle encoder set comprises:

[0042] receiving the instruction through a stepper motor controller, and providing and sending an angle motion signal according to the instruction;

[0043] receiving the angular motion signal via the stepper motor driver;

[0044] Driving a stepper motor according to the angular motion signal and driving a neodymium iron boron magnet on a rotating shaft of the stepper motor to rotate;

[0045] The NdFeB magnet provides the sensor chip to be tested with a magnetic field conversion signal for changing the magnetic field environment.

[0046] The present application provides a system, circuit and method for detecting a magnetic angle position sensor chip, which integrates a sensor chip to be tested, an ATE test platform, a magnetic angle encoder set and an oscilloscope. The sensor chip to be tested is installed at a predetermined position, and the ATE test platform is connected to it, responsible for power supply and sending instructions. The magnetic angle encoder set receives the instructions of the ATE test platform and converts them into magnetic field conversion signals, thereby changing the magnetic field environment of the sensor chip. The sensor chip senses this change and converts the signal into an analog or digital signal. The oscilloscope is connected to the sensor chip and outputs magnetic angle position information according to the analog signal. The ATE test platform simultaneously inputs a digital signal and determines whether the corresponding magnetic angle position information is accurate. The system solves the technical problems of limited accuracy, low efficiency and insufficient reliability of the MT6501CT-ADD type magnetic angle position sensor chip during the detection process. Thereby significantly improving the detection accuracy, detection efficiency and detection reliability of the chip detection work. BRIEF DESCRIPTION OF THE DRAWINGS

[0047] The drawings constituting a part of the present application are used to provide a further understanding of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0048] Figure 1 A schematic diagram of a magnetic angle position sensor chip detection system provided in this embodiment;

[0049] Figure 2 A schematic diagram of the design of the total power input circuit for the detection system provided in this embodiment;

[0050] Figure 3 A schematic diagram of a circuit design for converting an electrical signal into a magnetic field conversion signal provided in this embodiment;

[0051] Figure 4 A voltage curve diagram of the output of the analog signal output interface circuit converted into the magnetic field signal provided in this embodiment;

[0052] Figure 5 A schematic diagram of a circuit design for converting a magnetic field signal into a digital signal provided in this embodiment;

[0053] Figure 6 Schematic diagram of the digital signal input and output interface circuit design provided in this embodiment Figure 1 ;

[0054] Figure 7 Schematic diagram of the digital signal input and output interface circuit design provided in this embodiment Figure 2 ;

[0055] Figure 8 Schematic diagram of the digital signal input and output interface circuit design provided in this embodiment Figure 3 ;

[0056] Fig. 9 Schematic diagram of the digital signal input and output interface circuit design provided in this embodiment Figure 4 ;

[0057] Fig.10 Schematic diagram of the digital signal input and output interface circuit design provided in this embodiment Figure 5 ;

[0058] Fig.11 Schematic diagram of the digital signal input and output interface circuit design provided in this embodiment Figure 6 ;

[0059] Fig.12 A schematic flow chart of a method for detecting a magnetic angle position sensor chip provided in this embodiment.

[0060] The above drawings have shown clear embodiments of the present application, which will be described in more detail later. These drawings and text descriptions are not intended to limit the scope of the present application in any way, but to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0061] In order to make the purpose, technical solutions and advantages of this application clearer, the technical solutions in this application will be clearly and completely described below in conjunction with the drawings in this application. Obviously, the described embodiments are part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0062] The terms "first", "second", "third", "fourth", etc. (if any) in the specification and claims of the present invention and the above drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in sequences other than those illustrated or described herein.

[0063] In the present invention, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in this application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0064] The present application provides a system, circuit and method for detecting a magnetic angle position sensor chip. The system integrates a sensor chip to be tested, an ATE test platform, a magnetic angle encoder set and an oscilloscope to achieve efficient and accurate detection of the chip. The ATE test platform supplies power and controls the change of the magnetic field, the magnetic angle encoder set converts instructions to change the magnetic field, and the chip outputs analog and digital signals after sensing. The oscilloscope monitors the analog signal, and the ATE test platform processes the digital signal and verifies the accuracy. The system solves the technical problems of limited accuracy, low efficiency and insufficient reliability of the MT6501CT-ADD type magnetic angle position sensor chip during the detection process. Thereby significantly improving the detection accuracy, detection efficiency and detection reliability of the chip detection work.

[0065] The technical solution of the present application and how the technical solution of the present application solves the above-mentioned technical problems are described in detail below with specific embodiments. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present application will be described below in conjunction with the accompanying drawings.

[0066] Figure 1 A schematic diagram of a magnetic angle position sensor chip detection system provided in this embodiment, such as Figure 1 As shown, the present embodiment provides a magnetic angle position sensor chip detection system, the system comprising:

[0067] A sensor chip to be tested, wherein the sensor chip to be tested is installed at a predetermined position in a chip detection system;

[0068] ATE test platform, the ATE test platform is connected to the sensor chip to be tested;

[0069] A magnetic angle encoder set, wherein the magnetic angle encoder set is connected to the ATE test platform;

[0070] An oscilloscope, the oscilloscope being connected to the sensor chip to be tested;

[0071] Among them, the ATE test platform is used to power the sensor chip to be tested, and the ATE test platform is also used to send an instruction to the magnetic angle encoder set to change the magnetic field environment of the sensor chip to be tested; the magnetic angle encoder set is used to convert the instruction into a magnetic field conversion signal for changing the magnetic field environment, the sensor chip to be tested converts the sensed magnetic field conversion signal into an analog signal and a digital signal, the oscilloscope is used to output information of the magnetic angle position corresponding to the analog signal according to the analog signal, and the ATE test platform is also used to input the digital signal and determine whether the information of the magnetic angle position corresponding to the digital signal is accurate according to the digital signal.

[0072] Furthermore, the magnetic angle encoder set comprises:

[0073] A stepper motor controller, wherein the stepper motor controller is connected to the ATE test platform;

[0074] A stepper motor driver, the stepper motor driver is connected to the stepper motor controller;

[0075] A neodymium iron boron magnet connected to the stepper motor driver;

[0076] Among them, the stepper motor controller is used to receive the instruction, and the stepper motor controller is also used to provide and send an angle movement signal according to the instruction. The stepper motor driver is used to receive the angle movement signal, and the stepper motor driver is also used to drive the stepper motor according to the angle movement signal and drive the neodymium iron boron magnet on the rotating shaft of the stepper motor to rotate. The neodymium iron boron magnet is used to provide a magnetic field conversion signal for changing the magnetic field environment for the sensor chip to be tested.

[0077] Furthermore, the detection system also includes a test fixture, which is connected to the ATE test platform. The test fixture is used to place the sensor chip to be tested and connect the ATE test platform to the sensor chip to be tested to transmit information.

[0078] The following is a detailed description of the components of the system and how they are connected:

[0079] The system mainly includes the sensor chip to be tested, an ATE test platform, a magnetic angle encoder set, an oscilloscope and a test fixture.

[0080] The sensor chip to be tested is precisely installed at the preset position of the chip detection system. This position ensures that the chip can stably receive and respond to magnetic field changes during the test.

[0081] The ATE test platform is connected to the sensor chip under test through a dedicated electrical connection line, providing it with a stable operating voltage and controlling the test process. The ATE test platform has a built-in signal generation module that can send instructions to the magnetic angle encoder set. The instructions are about how to change the magnetic field environment of the sensor chip under test. ATE (Automatic Test Equipment) test platform, that is, an automated test platform, is a system that tests the object under test by controlling the test instrument through a computer. The basic principle of the ATE test platform: The ATE test platform applies excitation to the chip or other object under test through test vectors, measures its response output, and compares it with the expected results to determine whether the sensor chip under test meets the specification requirements. In this process, the ATE test platform uses computer programming instead of manual testing, controls the instrument based on the test program, and performs input and output signal detection and analysis on the product under test.

[0082] The magnetic angle encoder set is connected to the ATE test platform through a signal line. The set consists of a stepper motor controller, a stepper motor driver and a NdFeB magnet. The stepper motor controller receives the instructions sent by the ATE test platform and generates an angle motion signal after parsing. The signal is transmitted to the stepper motor through the stepper motor driver, driving it to rotate at a specified angle. The NdFeB magnet is fixed on the shaft of the stepper motor. As the motor rotates, the magnet generates a changing magnetic field, thereby providing the required magnetic field conversion signal for the sensor chip to be tested.

[0083] The oscilloscope is connected to the sensor chip under test through another electrical connection line. When the chip senses changes in the magnetic field environment, it converts them into analog signals and digital signals for output. The oscilloscope can capture these signals in real time. For analog signals, the oscilloscope converts them into visual waveforms and marks the corresponding magnetic angle position information; for digital signals, the oscilloscope transmits them back to the ATE test platform for processing.

[0084] The ATE test platform has a built-in signal processing module for receiving the digital signal transmitted back by the oscilloscope. This module decodes the digital signal and determines whether the magnetic angle position information corresponding to the digital signal is accurate based on the decoding result. (This is the existing technology and function of the ATE test platform, so it will not be introduced in detail here)

[0085] In addition, the system also includes a test fixture for fixing the sensor chip to be tested. The test fixture is connected to the ATE test platform through a connector, ensuring a stable connection and information transmission between the ATE test platform and the sensor chip to be tested. The test fixture is provided with interfaces and slots that match the sensor chip to be tested, which facilitates the rapid installation and removal of the chip.

[0086] The connection mode of the entire detection system is clear and definite, and the signal transmission and data processing processes between the components are standardized and fully disclosed. By using this system, technicians in this field can accurately and efficiently implement the invention content and accurately detect the MT6501CT-ADD type magnetic angle position sensor chip. The system solves the technical problems of limited accuracy, low efficiency and insufficient reliability of the MT6501CT-ADD type magnetic angle position sensor chip in the detection process. Thereby significantly improving the detection accuracy, detection efficiency and detection reliability of the chip detection work.

[0087] The present invention also provides a detection circuit for a magnetic angle position sensor chip, the circuit comprising:

[0088] A detection system power supply total power input circuit, wherein the detection system power supply total power input circuit is connected to the ATE test platform;

[0089] An electric signal is converted into a magnetic field conversion signal circuit, wherein the input end of the electric signal is converted into a magnetic field conversion signal circuit is connected to the ATE test platform, and the output end of the electric signal is converted into a magnetic field conversion signal circuit is connected to the magnetic angle encoder set;

[0090] The magnetic field signal is converted into an analog signal output interface circuit, and the magnetic field signal is converted into an analog signal output interface circuit connected to the sensor chip to be tested;

[0091] A circuit for converting a magnetic field signal into a digital signal, wherein the circuit for converting a magnetic field signal into a digital signal is connected to the sensor chip to be tested;

[0092] A digital signal input and output interface circuit, the digital signal input and output interface circuit is connected to the ATE test platform and the circuit for converting the magnetic field signal into a digital signal;

[0093] Among them, the detection system power supply total power input circuit is used to power the sensor chip to be tested, the digital signal input and output interface circuit is used to output the ATE test platform to send an instruction to the magnetic angle encoder set to change the magnetic field environment of the sensor chip to be tested, the electrical signal is converted into a magnetic field conversion signal circuit to convert the instruction into a magnetic field conversion signal for changing the magnetic field environment, the magnetic field signal is converted into an analog signal output interface circuit to convert the magnetic field conversion signal sensed by the sensor chip to be tested into an analog signal and output the information of the magnetic angle position corresponding to the analog signal according to the analog signal, the magnetic field signal is converted into a digital signal circuit to convert the magnetic field conversion signal sensed by the sensor chip to be tested into a digital signal, and the digital signal input and output interface circuit is also used to input the digital signal and determine whether the information of the magnetic angle position corresponding to the digital signal is accurate through the ATE test platform according to the digital signal.

[0094] Specifically, Figure 2 As shown, it is a schematic diagram of the design of the total power input circuit for the detection system provided in this embodiment. The specific implementation method of the total power input circuit for the detection system provided in this embodiment for powering the sensor chip to be tested is: relying on the DPS13 source in the power board of the ATE test platform to power the power supply of the sensor chip to be tested. The specific connection method of the circuit is that A51, B51, and C51 of the ATE test platform POGO C2 are connected to the power pin VDD of the chip to be tested, and the VSS pin of the chip to be tested is connected to the machine GND. In addition, a 0.1μF capacitor is connected between the chip VDD and GND. Connecting the 104 capacitor here can not only decouple the filter to prevent sudden changes in the power supply voltage, but also suppress electromagnetic interference. This connection method can provide a stable power supply voltage for the detection system.

[0095] Specifically, Figure 3 As shown, it is a schematic diagram of the circuit design of converting the electrical signal into a magnetic field conversion signal provided in this embodiment; the circuit of converting the electrical signal into a magnetic field conversion signal provided in this embodiment relies on the ATE test platform to power the magnetic angle encoder set and use the electrical signal to control the encoder and then control the motor driver (i.e. Figure 3 The specific circuit is: 42 stepper motor controller (i.e. Figure 3 The power interface VCC of the controller in the ATE test platform is connected to the UP_P12V channel of the control board of the ATE test platform, and the encoder is powered by a constant voltage of +12V. The GND interface of the 42 stepper motor controller is connected to the GND of the test machine. The connection method of the control signal interface of the controller is: the power enable signal - (ENA-) is suspended, the power enable signal + (ENA+) is connected to the CN18CH31 channel that supplies the sensor chip to be tested, the direction control signal - (DIR-) is suspended, the direction control signal + (DIR+) and the step pulse signal + (PVL+) are both short-circuited with the power enable signal + (ENA+), and the step pulse signal - (PVL-) is connected to the digital channel [F30, CN20_CH30] of the ATE test machine POGO C2. The connection method between the controller and the motor driver is: there are 4 groups of interfaces on the motor driver, from left to right, they are connected to the controller motor B phase - (B-), the controller motor B phase + (B+), the controller motor A phase - (A-), and the controller motor A phase + (A+). In addition, the encoder has 6 sets of dip switches (as shown in Table 1 below), of which SW1-SW3 are subdivision setting switches, SW4-SW6 are current setting switches, and the dip switch of this system is SW3 to the OFF end, and the other 5 switches are all to the ON end. From then on, the encoder can drive the magnet to rotate counterclockwise at a fixed angle after powering on.

[0096] Table 1: Encoder DIP switches

[0097] SW1 ON SW2 ON SW3 OFF SW4 ON SW5 ON SW6 ON

[0098] Furthermore, if Figure 3 As shown, the circuit for converting the electrical signal into a magnetic field conversion signal comprises:

[0099] Controller circuit (i.e. Figure 3 The controller circuit is connected to the ATE test platform via a digital signal input and output interface circuit;

[0100] Driver circuit (i.e. Figure 3 The driver circuit is connected to the controller circuit;

[0101] Among them, the controller circuit is used to indicate the circuit in the stepper motor controller, the driver circuit is used to indicate the circuit in the stepper motor driver, the controller circuit is used to input the instructions, and the controller circuit is also used to assist the stepper motor controller to provide and output an angle motion signal according to the instructions, the driver circuit is used to input the angle motion signal, and the driver circuit is also used to assist the stepper motor driver to drive the stepper motor according to the angle motion signal and drive the neodymium iron boron magnet on the rotating shaft of the stepper motor to rotate to provide a magnetic field conversion signal for changing the magnetic field environment for the sensor chip to be tested.

[0102] Specifically, Figure 4 As shown in the figure, the voltage curve diagram of the output of the analog signal output interface circuit converted from the magnetic field signal provided in this embodiment is shown in the figure. The analog signal output interface circuit converted from the magnetic field signal is actually to connect a high-precision oscilloscope to the OUT pin of the sensor chip to be tested. Since the OUT pin of the MT6501-ADD chip will feedback the magnetic field angle position in the form of a continuous voltage signal, if the oscilloscope monitors the following Figure 4 The monotonically increasing voltage curve shown proves that the analog output function of the device under test is intact.

[0103] Specifically, Figure 5 As shown in FIG. 1 , it is a schematic diagram of the circuit design for converting the magnetic field signal into a digital signal provided in this embodiment; the circuit for converting the magnetic field signal into a digital signal provided in this embodiment is realized by inputting an electrical signal into the device through the ATE test platform using the SPI interface logic into the sensor chip to be tested, and after the sensor chip to be tested recognizes this digital logic, it feeds back the magnetic field angle in the form of a serial sequence digital signal, and then uses the ATE test platform to collect the output electrical signal and make a judgment. The specific digital signal instructions are as follows: Figure 5 It should be noted that a fixed current needs to be applied to the SDAT pin to achieve pull-up during programming.

[0104] Specifically, Figure 6 , Figure 7 , Figure 8 , Fig. 9 , Fig.10 , Fig.11 The digital signal input and output interface circuits provided in this embodiment are shown in FIG. Figure 1 , Figure 2 , Figure 3 , Figure 4 , Figure 5 , Figure 6 The transmission of digital signals provided in this embodiment is achieved by relying on the digital channel of the ATE test platform to provide the way to apply and measure electrical signals. The specific circuit connection is shown in FIG. Figure 6 , Figure 7 , Figure 8 , Fig. 9 , Fig.10 , Fig.11 As shown. MT6501-ADD chip, chip PIN2 is connected to the digital channel of ATE test machine POGO C2 [A29, CN20_CH55], chip PIN3 is connected to the digital channel of ATE test machine POGO C2 [D32, CN20_CH34], chip PIN4 is connected to the digital channel of ATE test machine POGO C2 [C31, CN20_CH32], chip PIN5 is connected to the digital channel of ATE test machine POGO C2 [D29, CN20_CH15], chip PIN6 is connected to the digital channel of ATE test machine POGO C2 [A31, CN20_CH54], chip PIN7 is connected to the digital channel of ATE test machine POGO C2 [B32, CN20_CH32]. MT6501-ADD chip PIN8 is connected to the machine GND.

[0105] Fig.12 The flowchart of the magnetic angle position sensor chip detection method provided in this embodiment is used to describe the magnetic angle position sensor chip detection method in detail. Figure 2 As shown, the present embodiment provides a method for detecting a magnetic angle position sensor chip, the method comprising:

[0106] S201: Powering the sensor chip to be tested via the ATE test platform.

[0107] The following is the specific implementation process of this step:

[0108] 1. ATE test platform initialization:

[0109] First, start the ATE test platform and perform a system self-check to ensure that all hardware modules (including the power management module) are working properly.

[0110] Configure the test environment parameters, including loading test scripts and setting test sequences, through the platform's built-in graphical user interface (GUI) or command line interface (CLI).

[0111] 2. Interface connection of the sensor chip to be tested:

[0112] Connect the sensor chip to be tested (specifically, the MT6501CT-ADD) to the test interface of the ATE test platform through a dedicated test fixture or socket. The interface is designed with a foolproof mechanism to ensure that the chip is correctly installed.

[0113] Check the connection lines to ensure that the power lines and signal lines are not broken or short-circuited and are firmly connected.

[0114] 3. Power supply parameter configuration:

[0115] According to the technical specifications of the sensor chip to be tested, determine the voltage range and current limit required for its normal operation.

[0116] In the ATE test platform's GUI, select the "Power Management" module, set the output voltage to 3.3V, the current limit to 20mA, and enable the overcurrent protection function to prevent device damage due to short circuits or abnormal loads.

[0117] 4. Power supply startup and monitoring: Click the "Start Test" button, and the ATE test platform will provide stable DC power to the sensor chip under test through the test interface according to the preset power supply parameters.

[0118] Real-time monitoring of voltage and current values ​​during the power supply process ensures that they always remain within the set range. The high-precision sensors and ADC (analog-to-digital converter) built into the ATE test platform can collect and display these parameters in real time.

[0119] If abnormal voltage or current fluctuations are found, the ATE test platform will automatically trigger an alarm and stop supplying power to protect the sensor chip under test from damage.

[0120] 5. Power supply status confirmation: Use the GUI or indicator light of the ATE test platform to confirm that the sensor chip under test has successfully received power and entered the standby or working state.

[0121] In some cases, it may be necessary to use tools such as an oscilloscope or logic analyzer to further verify the stability and purity of the power supply signal.

[0122] Through the above steps, the ATE test platform successfully provides a stable and accurate DC power supply for the sensor chip to be tested, laying the foundation for subsequent magnetic field environment testing.

[0123] S202: Sending, via the ATE test platform, an instruction to change the magnetic field environment of the sensor chip to be tested to the magnetic angle encoder kit.

[0124] In this step, the ATE (Automatic Test Equipment) test platform is concretized as the XYZ-ATE-Pro model, which has high-precision signal generation and transmission capabilities and can accurately control and monitor various parameters during the test process. The magnetic angle encoder set is a system composed of a high-precision stepper motor, a stepper motor controller, a stepper motor driver, and a neodymium iron boron magnet, which is used to change the magnetic field environment of the sensor chip to be tested according to the instructions of the ATE test platform.

[0125] Steps to refine:

[0126] 1. ATE test platform instruction generation:

[0127] On the ATE test platform (XYZ-ATE-Pro), select the "magnetic field environment control" function module through the dedicated test software interface.

[0128] According to the technical specifications and test requirements of the sensor chip to be tested, set the change parameters of the magnetic field environment, including the magnetic field strength, the angle of change of the magnetic field direction, etc.

[0129] The ATE test platform automatically generates a sequence of instructions for changing the magnetic field environment based on user settings. The sequence of instructions contains specific information such as the angle, speed, and direction of rotation of the stepper motor.

[0130] 2. Instruction encoding and transmission:

[0131] The ATE test platform encodes the generated instruction sequence and converts it into a digital signal format that can be recognized by the magnetic angle encoder set.

[0132] The encoded instructions are transmitted to the stepper motor controller of the magnetic angle encoder set through the signal output port of the ATE test platform in the form of serial communication (such as RS-232, RS-485 or Ethernet, etc.).

[0133] 3. Stepper motor controller receives instructions:

[0134] After receiving the instruction transmitted by the ATE test platform, the stepper motor controller first performs decoding processing to restore the digital signal to the original instruction sequence generated by the ATE test platform.

[0135] The processing unit (such as a microprocessor or DSP) inside the controller calculates the specific actions that the stepper motor needs to perform based on the decoded instructions, including the rotation angle, rotation speed, and rotation direction.

[0136] 4. Command verification and feedback:

[0137] Before executing the instructions, the stepper motor controller will verify the instructions to ensure their legality and accuracy.

[0138] After verification, the stepper motor controller sends a confirmation signal to the ATE test platform, indicating that it has received the instruction correctly and is ready to execute it.

[0139] After receiving the confirmation signal, the ATE test platform records the current status and continues to monitor the subsequent test process.

[0140] Through the above steps, the ATE test platform successfully sent a command to the magnetic angle encoder kit to change the magnetic field environment of the sensor chip under test. The command contains the specific action information that the stepper motor needs to perform, providing precise control instructions for the subsequent magnetic field conversion signal generation and the test of the sensor chip under test.

[0141] During the implementation process, the command generation, encoding and transmission process of the ATE test platform are all realized through dedicated test software and hardware interfaces, ensuring the accuracy and reliability of the commands. At the same time, the stepper motor controller's verification and feedback mechanism for the commands further improves the stability and safety of the test process.

[0142] S203: Using the magnetic angle encoder set to convert the instruction into a magnetic field conversion signal for changing the magnetic field environment.

[0143] The method of using the magnetic angle encoder set to convert the instruction into a magnetic field conversion signal for changing the magnetic field environment specifically includes:

[0144] receiving the instruction through a stepper motor controller, and providing and sending an angle motion signal according to the instruction;

[0145] receiving the angular motion signal via the stepper motor driver;

[0146] Driving a stepper motor according to the angular motion signal and driving a neodymium iron boron magnet on a rotating shaft of the stepper motor to rotate;

[0147] The NdFeB magnet provides the sensor chip to be tested with a magnetic field conversion signal for changing the magnetic field environment.

[0148] In this step, the magnetic angle encoder set consists of a stepper motor controller (model SMC-123), a stepper motor driver (model SMD-456), a stepper motor (model SM-789), and a neodymium iron boron magnet (model NdFeB-XYZ) fixed on the stepper motor shaft. The ATE test platform is responsible for sending commands to control the changes in the magnetic field environment.

[0149] Steps to refine:

[0150] 1. ATE test platform command sending:

[0151] The ATE test platform generates instructions for changing the magnetic field environment according to the test requirements. The instructions include specific parameters such as the magnetic field strength and the angle of direction change.

[0152] The ATE test platform sends the instructions in the form of digital signals to the stepper motor controller (SMC-123) through its communication interface (such as RS-232, Ethernet, etc.).

[0153] 2. Stepper motor controller receives instructions:

[0154] After the stepper motor controller (SMC-123) receives the command sent by the ATE test platform, it first performs decoding processing to convert the digital signal into a command format that can be recognized by the controller.

[0155] The microprocessor inside the controller (such as ARM Cortex-M series) calculates parameters such as the angle (θ) and rotation speed (v) that the stepper motor needs to rotate according to the decoded instructions.

[0156] The controller converts these parameters into angular motion signals and sends them to the stepper motor driver (SMD-456) through its output port.

[0157] 3. Stepper motor driver receives angle motion signal:

[0158] After receiving the angle motion signal sent by the stepper motor controller, the stepper motor driver (SMD-456) performs signal amplification and power conversion processing.

[0159] The power amplifier inside the driver converts the angular motion signal into a current signal that can drive the stepper motor to rotate.

[0160] The driver sends a current signal to the stepper motor (SM-789) through its output port.

[0161] 4. Stepper motor drive and NdFeB magnet rotation:

[0162] After the stepper motor (SM-789) receives the current signal sent by the driver, it generates corresponding electromagnetic force according to the size and direction of the current signal.

[0163] Electromagnetic force acts on the rotor of the stepper motor, causing it to rotate at a predetermined angle (θ) and speed (v).

[0164] The NdFeB-XYZ magnet fixed on the shaft rotates with the rotation of the stepper motor, thereby changing the magnetic field environment around it.

[0165] 5. Magnetic field conversion signal generation:

[0166] When the NdFeB magnet rotates, the parameters such as the strength and direction of the magnetic field around it change, forming a magnetic field change signal.

[0167] The magnetic field conversion signal acts on the sensor chip to be tested, causing it to sense the change in the magnetic field environment.

[0168] Through the above steps, the magnetic angle encoder kit successfully converts the instructions of the ATE test platform into magnetic field conversion signals for changing the magnetic field environment. This signal achieves precise control of the rotation of the NdFeB magnet through the coordinated work of the stepper motor controller, stepper motor driver and stepper motor, thereby changing the magnetic field environment around the sensor chip to be tested.

[0169] During the implementation process, the steps of sending commands of the ATE test platform, decoding and calculation of the stepper motor controller, signal amplification and power conversion of the stepper motor driver, and driving and rotating the stepper motor are all realized through dedicated hardware equipment and software algorithms, ensuring the accuracy of the commands and the precision of the magnetic field conversion signal. At the same time, the various components of the magnetic angle encoder set are strictly matched with the interface and signal transmission protocol to ensure the stability and reliability of the entire system.

[0170] S204: Converting the sensed magnetic field conversion signal into an analog signal and a digital signal through the sensor chip to be tested.

[0171] In this step, the sensor chip to be tested is the MT6501CT-ADD magnetic angle position sensor chip, which has high-precision magnetic field sensing capability and can convert the sensed magnetic field conversion signal into an electrical signal output. The ATE test platform is responsible for providing a stable power supply and controlling the changes in the magnetic field environment. The magnetic angle encoder set (including a stepper motor controller, a stepper motor driver, a stepper motor and a NdFeB magnet) generates a magnetic field conversion signal according to the instructions of the ATE test platform.

[0172] Steps to refine:

[0173] 1. Magnetic field conversion signal induction:

[0174] When the NdFeB magnet of the magnetic angle encoder set rotates, the magnetic field environment around it changes.

[0175] The sensor chip to be tested is located in the magnetic field and senses the magnetic field conversion signal.

[0176] The sensor chip to be tested generates a corresponding potential difference according to the change in magnetic field strength.

[0177] 2. Signal amplification and conditioning:

[0178] The signal amplification circuit integrated inside the sensor chip to be tested amplifies the potential difference to improve the sensitivity of the signal.

[0179] The amplified signal passes through the conditioning circuit to further filter out noise and interference to ensure the accuracy and stability of the signal.

[0180] 3. Analog signal output:

[0181] The conditioned analog signal is output through the output port of the sensor chip to be tested.

[0182] The analog signal is proportional to the magnetic field conversion signal and can reflect changes in the magnetic field environment.

[0183] The output analog signal can be directly connected to an oscilloscope or ATE test platform for subsequent analysis and processing.

[0184] 4. Digital signal conversion (optional): If the analog signal needs to be converted into a digital signal, the sensor chip to be tested can have a built-in or external analog-to-digital converter (ADC).

[0185] The ADC samples and quantizes the analog signal, converting it into a digital signal.

[0186] The converted digital signal is output through the digital output port of the sensor chip under test, or transmitted to the ATE test platform for processing.

[0187] 5. Signal output and recording: Whether it is an analog signal or a digital signal, it is output to the ATE test platform or oscilloscope through the output port of the sensor chip to be tested.

[0188] The ATE test platform or oscilloscope records and analyzes the signals to evaluate the magnetic field sensing capability and signal conversion accuracy of the sensor chip under test.

[0189] In this embodiment, the MT6501CT-ADD magnetic angle position sensor chip is used as the sensor chip to be tested. Through its internal Hall element, signal amplification circuit, conditioning circuit and optional analog-to-digital converter (ADC), it realizes the function of converting the sensed magnetic field conversion signal into analog signal and digital signal. The ATE test platform provides a stable power supply and magnetic field environment control to ensure the accuracy and reliability of the test.

[0190] It should be noted that in actual applications, the type and performance of the sensor chip to be tested may vary depending on the application scenario. Therefore, when implementing this embodiment, adjustments and optimizations should be made according to specific application requirements and the characteristics of the sensor chip to be tested.

[0191] S205: Using the oscilloscope to output information of the magnetic angle position corresponding to the analog signal according to the analog signal.

[0192] In the steps, we describe in detail how to use an oscilloscope to output the magnetic angle position information corresponding to the analog signal received from the sensor chip under test. The ATE test platform is responsible for powering the sensor chip under test and controlling the magnetic angle encoder set to generate magnetic field conversion signals. The sensor chip under test senses these magnetic field conversion signals and converts them into analog signals.

[0193] Steps to refine:

[0194] 1. Analog signal reception:

[0195] The oscilloscope is connected to the output end of the sensor chip to be tested through its input channel, and receives the analog signal converted by the sensor chip.

[0196] The analog signal is usually a voltage value that changes with time and is proportional to the strength of the magnetic field change signal.

[0197] 2. Signal conditioning and amplification (if necessary):

[0198] An oscilloscope may contain signal conditioning circuits to amplify, filter, or offset the received analog signal to ensure signal accuracy and readability.

[0199] These conditioning steps are optional, depending on the capabilities of the oscilloscope and the characteristics of the signal to be measured.

[0200] 3. Waveform display:

[0201] The oscilloscope converts the received analog signal into a visual waveform and displays it on the screen of the oscilloscope.

[0202] The waveform graph shows how the analog signal changes over time, including information such as the signal's amplitude, frequency, and phase.

[0203] 4. Extraction of magnetic angle position information:

[0204] In order to extract the magnetic angle position information from the waveform, we need to set appropriate trigger conditions and measurement parameters on the oscilloscope.

[0205] The trigger condition can be set to trigger the oscilloscope to capture when the analog signal reaches a certain threshold.

[0206] The measurement parameters include the peak value, valley value, average value or voltage value at a specific time point of the signal.

[0207] By analyzing the characteristics of the waveform (such as the period and phase difference of the waveform), combined with the known correspondence between the magnetic field transformation signal and the magnetic angle position, we can infer the magnetic angle position information corresponding to the analog signal.

[0208] 5. Information output:

[0209] The oscilloscope may have a data logging function that can save the captured waveform and extracted magnetic angle position information as a data file (such as CSV, TXT, etc.) or transfer it to a computer or other device through an interface (such as USB, Ethernet, etc.).

[0210] In addition, the oscilloscope may also provide a digital display function to show the extracted magnetic angle position information directly on the screen.

[0211] 6. Calibration and verification:

[0212] In practical applications, in order to ensure the accuracy of the magnetic angle position information output by the oscilloscope, we may need to perform calibration and verification steps.

[0213] Calibration can be achieved by comparison with a reference signal of known magnetic angular position.

[0214] Verification can be performed by inputting a digital signal through the ATE test platform and comparing the magnetic angle position information output by the oscilloscope with the expected result of the ATE test platform.

[0215] In this embodiment, we describe in detail how an oscilloscope receives an analog signal, displays a waveform, extracts magnetic angle position information, and outputs the information. The specific implementation of these steps may vary depending on the model and performance of the oscilloscope, but the overall process is similar. Through the description of this embodiment, those skilled in the art can clearly understand how to use an oscilloscope to extract magnetic angle position information from an analog signal.

[0216] S206: Input the digital signal through the ATE test platform, and determine whether the information of the magnetic angle position corresponding to the digital signal is accurate according to the digital signal.

[0217] In this step, we describe in detail how to input the digital signal received from the sensor chip under test through the ATE test platform, and determine whether the corresponding magnetic angle position information is accurate based on the digital signal. The ATE test platform is not only responsible for powering the sensor chip under test, but also for sending instructions for changes in the magnetic field environment, and receiving, processing and analyzing the signals output by the sensor chip.

[0218] Steps to refine:

[0219] 1. Digital signal input:

[0220] The ATE test platform receives the digital signal from the sensor chip under test through its digital input channel. The digital signal is the response of the sensor chip to the magnetic field conversion signal and has been converted by an analog-to-digital converter (ADC, built into the sensor chip or ATE test platform).

[0221] Digital signals are usually represented in binary form, with each bit representing a specific voltage range or magnetic field strength.

[0222] 2. Signal preprocessing:

[0223] The ATE test platform may contain a signal preprocessing module to filter, remove noise or calibrate the received digital signal to improve the accuracy and reliability of the signal.

[0224] These preprocessing steps may include digital filtering algorithms (such as FIR filters, IIR filters, etc.) to smooth the signal and remove high-frequency noise.

[0225] 3. Analysis of magnetic angle position information:

[0226] The ATE test platform has a built-in magnetic angle position analysis algorithm to convert the received digital signal into the corresponding magnetic angle position information.

[0227] The algorithm is based on the mapping relationship between the known magnetic field transformation signal and the magnetic angle position, and can be implemented through a lookup table (LUT), interpolation algorithm or machine learning model.

[0228] In this embodiment, we assume that the ATE test platform uses a simple lookup table algorithm, which searches for the corresponding magnetic angle position according to a specific value (or range of values) of the digital signal.

[0229] 4. Accuracy judgment:

[0230] In order to verify the accuracy of the analyzed magnetic angle position information, the ATE test platform compares the analyzed results with the expected magnetic angle position.

[0231] The expected magnetic angle position can be recorded by the ATE test platform when sending magnetic field environment change instructions, or obtained by other reliable measurement means.

[0232] The comparison process may involve calculating the error (such as absolute error, relative error, etc.) between the analysis result and the expected value, and determining whether the error is less than a preset threshold.

[0233] 5. Result output and feedback:

[0234] If the error between the resolved magnetic angle position information and the expected value is within an acceptable range, the ATE test platform will output a signal or message indicating that the test has passed.

[0235] If the error exceeds a preset threshold, the ATE test platform will output a signal or message indicating a test failure and may trigger further diagnostic or calibration steps.

[0236] In addition, the ATE test platform can also record test results, analyzed magnetic angle position information, error values ​​and other data into log files for subsequent analysis and improvement.

[0237] It is understandable that in actual applications, the internal structure and algorithm of the ATE test platform may vary depending on the manufacturer and model. Therefore, when implementing this embodiment, it is necessary to adjust and adapt according to the specific ATE test platform.

[0238] In addition, the accuracy and reliability of the magnetic angle position resolution algorithm depends on many factors, including the performance of the sensor chip, the accuracy of the magnetic field conversion signal, the calibration accuracy of the ATE test platform, etc. Therefore, before testing, the ATE test platform and sensor chip need to be properly calibrated and verified.

[0239] Through the description of this embodiment, those skilled in the art can clearly understand how to input a digital signal through an ATE test platform and determine whether the corresponding magnetic angle position information is accurate based on the digital signal.

[0240] Those skilled in the art will appreciate that all or some of the steps in the methods disclosed above, and the functional modules / units in the systems and devices may be implemented as software, firmware, hardware, or a suitable combination thereof.

[0241] Those skilled in the art will readily appreciate other embodiments of the present application after considering the specification and practicing the invention disclosed herein. The present application is intended to cover any modification, use or adaptation of the present application, which follows the general principles of the present application and includes common knowledge or customary techniques in the art that are not disclosed in the present application. The specification and examples are intended to be exemplary only, and the true scope and spirit of the present application are indicated by the following claims.

[0242] It should be understood that the present application is not limited to the precise structures that have been described above and shown in the drawings, and that various modifications and changes may be made without departing from the scope thereof. The scope of the present application is limited only by the appended claims.

Claims

1. A magnetic angle position sensor chip detection system, characterized in that: The detection system comprises: A sensor chip to be tested, wherein the sensor chip to be tested is installed at a predetermined position in a chip detection system; ATE test platform, the ATE test platform is connected to the sensor chip to be tested; A magnetic angle encoder set, wherein the magnetic angle encoder set is connected to the ATE test platform; An oscilloscope, the oscilloscope being connected to the sensor chip to be tested; Among them, the ATE test platform is used to power the sensor chip to be tested, and the ATE test platform is also used to send an instruction to the magnetic angle encoder set to change the magnetic field environment of the sensor chip to be tested; the magnetic angle encoder set is used to convert the instruction into a magnetic field conversion signal for changing the magnetic field environment, the sensor chip to be tested converts the sensed magnetic field conversion signal into an analog signal and a digital signal, the oscilloscope is used to output information of the magnetic angle position corresponding to the analog signal according to the analog signal, and the ATE test platform is also used to input the digital signal and determine whether the information of the magnetic angle position corresponding to the digital signal is accurate according to the digital signal.

2. The detection system according to claim 1, characterized in that: The magnetic angle encoder kit comprises: A stepper motor controller, wherein the stepper motor controller is connected to the ATE test platform; A stepper motor driver, the stepper motor driver is connected to the stepper motor controller; A neodymium iron boron magnet connected to the stepper motor driver; Among them, the stepper motor controller is used to receive the instruction, and the stepper motor controller is also used to provide and send an angle movement signal according to the instruction. The stepper motor driver is used to receive the angle movement signal, and the stepper motor driver is also used to drive the stepper motor according to the angle movement signal and drive the neodymium iron boron magnet on the rotating shaft of the stepper motor to rotate. The neodymium iron boron magnet is used to provide a magnetic field conversion signal for changing the magnetic field environment for the sensor chip to be tested.

3. The detection system according to claim 1, characterized in that: The detection system further comprises a test fixture, which is connected to the ATE test platform. The test fixture is used to place the sensor chip to be tested and connect the ATE test platform with the sensor chip to be tested to transmit information.

4. A detection circuit for a magnetic angle position sensor chip, characterized in that: The detection circuit is applied to the detection system according to any one of claims 1 to 3, and the detection circuit comprises: A detection system power supply total power input circuit, wherein the detection system power supply total power input circuit is connected to the ATE test platform; An electric signal is converted into a magnetic field conversion signal circuit, wherein the input end of the electric signal is converted into a magnetic field conversion signal circuit is connected to the ATE test platform, and the output end of the electric signal is converted into a magnetic field conversion signal circuit is connected to the magnetic angle encoder set; The magnetic field signal is converted into an analog signal output interface circuit, and the magnetic field signal is converted into an analog signal output interface circuit connected to the sensor chip to be tested; A circuit for converting a magnetic field signal into a digital signal, wherein the circuit for converting a magnetic field signal into a digital signal is connected to the sensor chip to be tested; A digital signal input and output interface circuit, the digital signal input and output interface circuit is connected to the ATE test platform and the circuit for converting the magnetic field signal into a digital signal; Among them, the detection system power supply total power input circuit is used to power the sensor chip to be tested, the digital signal input and output interface circuit is used to output the ATE test platform to send an instruction to the magnetic angle encoder set to change the magnetic field environment of the sensor chip to be tested, the electrical signal is converted into a magnetic field conversion signal circuit to convert the instruction into a magnetic field conversion signal for changing the magnetic field environment, the magnetic field signal is converted into an analog signal output interface circuit to convert the magnetic field conversion signal sensed by the sensor chip to be tested into an analog signal and output the information of the magnetic angle position corresponding to the analog signal according to the analog signal, the magnetic field signal is converted into a digital signal circuit to convert the magnetic field conversion signal sensed by the sensor chip to be tested into a digital signal, and the digital signal input and output interface circuit is also used to input the digital signal and determine whether the information of the magnetic angle position corresponding to the digital signal is accurate through the ATE test platform according to the digital signal.

5. The detection circuit according to claim 4, characterized in that: The circuit for converting the electrical signal into a magnetic field conversion signal comprises: A controller circuit, wherein the controller circuit is connected to the ATE test platform via a digital signal input and output interface circuit; a driver circuit connected to the controller circuit; Among them, the controller circuit is used to indicate the circuit in the stepper motor controller, the driver circuit is used to indicate the circuit in the stepper motor driver, the controller circuit is used to input the instructions, and the controller circuit is also used to assist the stepper motor controller to provide and output an angle motion signal according to the instructions, the driver circuit is used to input the angle motion signal, and the driver circuit is also used to assist the stepper motor driver to drive the stepper motor according to the angle motion signal and drive the neodymium iron boron magnet on the rotating shaft of the stepper motor to rotate to provide a magnetic field conversion signal for changing the magnetic field environment for the sensor chip to be tested.

6. A method for detecting a magnetic angle position sensor chip, characterized in that: The detection method is applied to the detection system according to any one of claims 1 to 3, and the detection method comprises: Powering the sensor chip to be tested via the ATE test platform; Sending an instruction to change the magnetic field environment of the sensor chip to be tested to the magnetic angle encoder kit through the ATE test platform; Using the magnetic angle encoder set to convert the instruction into a magnetic field conversion signal for changing the magnetic field environment; The sensor chip to be tested converts the sensed magnetic field conversion signal into an analog signal and a digital signal; Using the oscilloscope to output information of the magnetic angle position corresponding to the analog signal according to the analog signal; The digital signal is input through the ATE test platform, and whether the information of the magnetic angle position corresponding to the digital signal is accurate is determined according to the digital signal.

7. The method according to claim 6, characterized in that The method of using the magnetic angle encoder set to convert the instruction into a magnetic field conversion signal for changing the magnetic field environment includes: receiving the instruction through a stepper motor controller, and providing and sending an angle motion signal according to the instruction; receiving the angular motion signal via the stepper motor driver; Driving a stepper motor according to the angular motion signal and driving a neodymium iron boron magnet on a rotating shaft of the stepper motor to rotate; The NdFeB magnet provides the sensor chip to be tested with a magnetic field conversion signal for changing the magnetic field environment.

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