A defect detection device for silicon-based OLED products
By using the image generator and optical machine docking module in the silicon-based OLED product bad detection device, the client usage scenario is simulated for bad detection, which solves the problem of insufficient detection accuracy in the prior art, and achieves higher detection accuracy and customer satisfaction.
Patent Information
- Application Number
- CN202411896171.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-23
- Publication Date
- 2025-04-04
AI Technical Summary
The prior art has insufficient accuracy in the detection of poor defects in silicon-based OLED products, and some defects are prone to pass or missed inspection, resulting in loss of yield or customer complaints.
Provided is a silicon-based OLED product defect detection device, including a support structure, a product positioning and adsorption structure, an optical machine docking module, an optical machine and an image generator. Different signals are sent through the image generator, the product is driven to display the target image, and the optical machine docking module and optical machine are used for poor detection. It is compatible with various detection modes such as naked eyes and wide-angle microscopes, and simulates the client usage scenarios.
It improves the accuracy of poor detection of silicon-based OLED products, ensures that the detection results are consistent with the client usage scenarios, reduces the pass-and-over inspection and missed inspection of poor products, and improves the product yield and customer satisfaction.
Smart Images
Figure CN119756796A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of near-eye display devices, and in particular to a device for detecting defects in silicon-based OLED products. Background Art
[0002] Silicon-based OLED (Organic Light Emitting Display) is a core component of near-eye display devices (such as VR (Virtual Reality), MR (Mix Reality), AR (Augmented Reality), etc.); the optical machine is an optical lens selected according to demand, and the near-eye display effect on the client is an important influencing factor for the factory inspection of silicon-based OLED products; in the silicon-based OLED production line, silicon-based OLED products need to be lit up for inspection after production, and only after confirming that there are no defects on the display can they be shipped to customers. Common defects include bright spots, dark spots, bright lines, dark lines or Mura (referring to uneven brightness of the display); due to the high pixel density and small pixel size of silicon-based OLED products, it is difficult to detect defects with the naked eye. The existing technology generally uses a wide-angle microscope to light up the product and project it on a computer monitor for defect detection. The existing detection method is significantly different from the actual use of the client. Some defects are easily passed through the inspection, resulting in yield loss, while some defects are easily missed and the client causes customer complaints. Summary of the invention
[0003] The purpose of this application is to provide a silicon-based OLED product defect detection device, which can improve the accuracy of silicon-based OLED product defect detection.
[0004] To achieve the above objectives, this application provides the following solutions:
[0005] The present application provides a silicon-based OLED product defect detection device, comprising: a support structure, a product positioning adsorption structure, an optical-mechanical docking module, an optical-mechanical device, and an image generator;
[0006] The product positioning adsorption structure is arranged on the top surface of the support structure; the product positioning adsorption structure is used to place the silicon-based OLED product to be inspected;
[0007] The image generator is connected to the silicon-based OLED product to be inspected; the image generator is used to send different signals at preset intervals; different signals correspond to different target images; the silicon-based OLED product to be inspected displays the corresponding target image when receiving different signals;
[0008] The optical-mechanical docking module is rotatably connected to the supporting structure; the optical-mechanical docking module is used to carry the optical machine and align the optical machine with the silicon-based OLED product to be inspected; an observer or an image acquisition device obtains the display result of the silicon-based OLED product to be inspected for the target image through the optical machine; the comparison result between the display result and the target image is used to describe whether the silicon-based OLED product is defective.
[0009] Optionally, the support structure comprises: a first horizontal plate, a second horizontal plate, a first vertical plate, and a second vertical plate;
[0010] The first horizontal plate and the second horizontal plate are arranged in parallel; the first horizontal plate is arranged above the second horizontal plate; the upper surface of the first horizontal plate is the top surface of the supporting structure;
[0011] The first vertical plate and the second vertical plate are both arranged between the first horizontal plate and the second horizontal plate, and the first vertical plate and the second vertical plate are arranged in parallel;
[0012] The image generator is disposed in a gap formed between the first horizontal plate, the second horizontal plate, the first vertical plate, and the second vertical plate.
[0013] Optionally, the support structure further comprises: a third vertical plate;
[0014] The third vertical plate is perpendicular to the first horizontal plate and connected to the upper surface of the first horizontal plate; the optical-mechanical docking module is rotatably connected to the third vertical plate.
[0015] Optionally, the product positioning adsorption structure comprises: a vacuum adsorption module and a product positioning module;
[0016] The vacuum adsorption module and the product positioning module are both arranged on the top surface of the support structure;
[0017] The vacuum adsorption module is used to adsorb the silicon-based OLED product to be inspected;
[0018] The product positioning module assists the optical machine in aligning the silicon-based OLED product to be inspected.
[0019] Optionally, the optical-mechanical docking module comprises: an optical-mechanical mounting plate and a plurality of support columns;
[0020] One side of the optical machine carrying plate is rotatably connected to a side of the third vertical plate away from the first horizontal plate;
[0021] The optical machine mounting plate is provided with an optical machine mounting hole;
[0022] The optical machine installation hole is used to embed the optical machine;
[0023] The plurality of support columns are all arranged on a side close to the product positioning adsorption structure;
[0024] The lengths of the plurality of support columns are all equal; the length of the support column is equal to the height of the third vertical plate.
[0025] Optionally, one side of the optical-mechanical mounting plate is connected to a side of the third vertical plate away from the first horizontal plate via a rotating connection structure.
[0026] Optionally, the rotating connection structure is a hinge.
[0027] Optionally, the number of the support columns is 4.
[0028] Optionally, a limiting column is provided on a side of each of the support columns away from the optical machine mounting plate;
[0029] The limiting cross-sectional radius is smaller than the cross-sectional radius of the supporting column.
[0030] Optionally, a plurality of limiting holes are provided on the first horizontal plate;
[0031] The limiting holes and the limiting columns are arranged in a one-to-one correspondence.
[0032] According to the specific embodiments provided in this application, this application discloses the following technical effects:
[0033] The present application provides a device for detecting defective silicon-based OLED products, including: a supporting structure, a product positioning adsorption structure, an optical-mechanical docking module, an optical machine and an image generator; using a graphic generator, a transfer PCB, and a transfer FPC to be connected to the product in sequence, driving the product to display different pictures; using an optical machine for defect detection; combined with the optical-mechanical docking module, it can be compatible with multiple detection modes such as naked eyes, wide-angle microscopes, and optical-mechanical inspections, among which the optical-mechanical inspection is consistent with the client's usage scenario. BRIEF DESCRIPTION OF THE DRAWINGS
[0034] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.
[0035] Figure 1 This is a usage scenario diagram of a silicon-based OLED product client in an embodiment of the present application;
[0036] Figure 2 Schematic diagram of the structure of a device for detecting defective silicon-based OLED products in one embodiment of the present application. DETAILED DESCRIPTION
[0037] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.
[0038] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the present application is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.
[0039] Silicon-based OLED product client usage scenarios such as Figure 1 As shown, in an exemplary embodiment, as Figure 2As shown, a device for detecting defective silicon-based OLED products is provided, comprising: a supporting structure, a product positioning adsorption structure, an optical-mechanical docking module, an optical-mechanical device and an image generator; the product positioning adsorption structure is arranged on the top surface of the supporting structure; the product positioning adsorption structure is used to place the silicon-based OLED product to be inspected; the image generator is connected to the silicon-based OLED product to be inspected; the traditional connection method is to use a transfer PCB (Printed Circuit Board) board to connect the image generator to the silicon-based OLED product to be inspected, and the transfer PCB board needs to be replaced accordingly when detecting different silicon-based OLED products, and the cost of the transfer PCB board is relatively high; in order to save costs, the image generator is connected to the transfer PCB board; the transfer PCB board is connected to the transfer FPC (Flexible Printed Circuit) board; the transfer FPC board is connected to the silicon-based OLED product to be inspected; when detecting different silicon-based OLED products, only the low-cost transfer FPC board needs to be replaced accordingly, and there is no need to replace the more expensive PCB board. The image generator is used to send out different signals at preset intervals; different signals correspond to different target images; the silicon-based OLED product to be inspected displays the corresponding target image when receiving different signals; the optical-mechanical docking module is rotatably connected to the supporting structure; the optical-mechanical docking module is used to carry the optical machine and align the optical machine with the silicon-based OLED product to be inspected; the near-eye display device is implemented through screen coverage, but because the product is too close to the naked eye, it is easy to be distorted when viewed directly, and an optical lens is directly added between the naked eye and the display. In the optical lens, an optical machine (multi-layer lenses with different optical parameters) is selected according to customer needs to achieve light refraction, thereby achieving excellent display effects; the observer or image acquisition device obtains the display result of the silicon-based OLED product to be inspected for the target image through the optical machine; the comparison result of the display result and the target image is used to describe whether the silicon-based OLED product is defective. For example, if the target image is a completely black image and there are white spots in the image displayed by the silicon-based OLED product, it can be considered that the silicon-based OLED product has a poor black display; if the target image is a completely white image and there are black spots in the image displayed by the silicon-based OLED product, it can be considered that the silicon-based OLED product has a poor white display.
[0040] The product positioning adsorption structure includes: vacuum adsorption module and product positioning module; both vacuum adsorption module and product positioning module are set on the top surface of the support structure; vacuum adsorption module is used to adsorb the silicon-based OLED product to be inspected; fixed products are vacuum adsorbed, and holes are opened at the platform below the required fixed products to provide negative pressure, which can avoid product movement and complete more accurate defect confirmation. The product positioning module assists the optical machine to align with the silicon-based OLED product to be inspected, which can ensure that the center of the optical machine corresponds to the center of the product.
[0041] The support structure includes: a first horizontal plate, a second horizontal plate, a first vertical plate and a second vertical plate; the first horizontal plate and the second horizontal plate are arranged in parallel; the first horizontal plate is arranged above the second horizontal plate; the upper surface of the first horizontal plate is the top surface of the support structure; the first vertical plate and the second vertical plate are both arranged between the first horizontal plate and the second horizontal plate, and the first vertical plate and the second vertical plate are arranged in parallel; the image generator is arranged in the gap formed between the first horizontal plate, the second horizontal plate, the first vertical plate and the second vertical plate. The support structure also includes: a third vertical plate; the third vertical plate is perpendicular to the first horizontal plate and connected to the upper surface of the first horizontal plate; the optical-mechanical docking module is rotatably connected to the third vertical plate.
[0042] The optical-machine docking module includes: an optical-machine mounting plate and a plurality of support columns; one side of the optical-machine mounting plate is rotatably connected to the side of the third vertical plate away from the first horizontal plate; an optical-machine mounting hole is provided on the optical-machine mounting plate; the optical-machine mounting hole is used to embed the optical machine; a plurality of support columns are arranged on a side close to the product positioning adsorption structure; the lengths of the plurality of support columns are equal; the lengths of the support columns are equal to the height of the third vertical plate. The number of support columns is 4. A limiting column is arranged on the side of each support column away from the optical-machine mounting plate; the limiting cross-sectional radius is smaller than the cross-sectional radius of the support column. A plurality of limiting holes are arranged on the first horizontal plate; the limiting holes and the limiting columns are arranged one by one. One side of the optical-machine mounting plate is connected to the side of the third vertical plate away from the first horizontal plate through a rotating connection structure. The rotating connection structure is a hinge. The optical-machine docking module adopts a flip-page design. The optical machine can be removed when flipping up, which is convenient for naked eye or wide-angle microscope observation. The optical machine is used for observation during docking to simulate the client imaging effect.
[0043] This application uses a graphic generator, a transfer PCB board, and a transfer FPC board to define the PIN according to the signals required by the product and connect them in sequence. The graphic generator can be used to drive the product to display different pictures to detect the product display effect and provide a solution for connecting the optical machine with the product to simulate the usage scenario of silicon-based OLED products on the client side. In conjunction with the product lighting solution, the optical machine can be used for defect detection.
[0044] This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand the device and its core ideas of this application. At the same time, for those skilled in the art, according to the ideas of this application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting this application.
Claims
1. A device for detecting defective silicon-based OLED products, characterized in that: include: Support structure, product positioning adsorption structure, optical-mechanical docking module, optical-mechanical and image generator; The product positioning adsorption structure is arranged on the top surface of the support structure; The product positioning adsorption structure is used to place the silicon-based OLED product to be inspected; The image generator is connected to the silicon-based OLED product to be inspected; the image generator is used to send different signals at preset intervals; different signals correspond to different target images; the silicon-based OLED product to be inspected displays the corresponding target image when receiving different signals; The optical-mechanical docking module is rotatably connected to the supporting structure; the optical-mechanical docking module is used to carry the optical machine and align the optical machine with the silicon-based OLED product to be inspected; an observer or an image acquisition device obtains the display result of the silicon-based OLED product to be inspected for the target image through the optical machine; the comparison result between the display result and the target image is used to describe whether the silicon-based OLED product is defective.
2. The device for detecting defective silicon-based OLED products according to claim 1, characterized in that: The support structure comprises: a first horizontal plate, a second horizontal plate, a first vertical plate and a second vertical plate; The first horizontal plate and the second horizontal plate are arranged in parallel; the first horizontal plate is arranged above the second horizontal plate; the upper surface of the first horizontal plate is the top surface of the supporting structure; The first vertical plate and the second vertical plate are both arranged between the first horizontal plate and the second horizontal plate, and the first vertical plate and the second vertical plate are arranged in parallel; The image generator is disposed in a gap formed between the first horizontal plate, the second horizontal plate, the first vertical plate, and the second vertical plate.
3. The device for detecting defective silicon-based OLED products according to claim 2, characterized in that: The support structure further comprises: a third vertical plate; The third vertical plate is perpendicular to the first horizontal plate and connected to the upper surface of the first horizontal plate; the optical-mechanical docking module is rotatably connected to the third vertical plate.
4. The device for detecting defective silicon-based OLED products according to claim 1, characterized in that: The product positioning adsorption structure comprises: a vacuum adsorption module and a product positioning module; The vacuum adsorption module and the product positioning module are both arranged on the top surface of the support structure; The vacuum adsorption module is used to adsorb the silicon-based OLED product to be inspected; The product positioning module assists the optical machine in aligning the silicon-based OLED product to be inspected.
5. The device for detecting defective silicon-based OLED products according to claim 3, characterized in that: The optical-mechanical docking module comprises: an optical-mechanical mounting plate and a plurality of support columns; One side of the optical machine carrying plate is rotatably connected to a side of the third vertical plate away from the first horizontal plate; The optical machine mounting plate is provided with an optical machine mounting hole; The optical machine installation hole is used to embed the optical machine; The plurality of support columns are all arranged on a side close to the product positioning adsorption structure; The lengths of the plurality of support columns are all equal; the length of the support column is equal to the height of the third vertical plate.
6. The device for detecting defective silicon-based OLED products according to claim 5, characterized in that: One side of the optical machine mounting plate is connected to a side of the third vertical plate away from the first horizontal plate via a rotating connection structure.
7. The device for detecting defective silicon-based OLED products according to claim 6, characterized in that: The rotating connection structure is a hinge.
8. The device for detecting defective silicon-based OLED products according to claim 6, characterized in that: The number of the support columns is 4.
9. The device for detecting defective silicon-based OLED products according to claim 6, characterized in that: A limiting column is provided on one side of each of the support columns away from the optical machine mounting plate; The limiting cross-sectional radius is smaller than the cross-sectional radius of the supporting column.
10. The device for detecting defective silicon-based OLED products according to claim 6, characterized in that: The first horizontal plate is provided with a plurality of limiting holes; The limiting holes and the limiting columns are arranged in a one-to-one correspondence.