Operating wavelength selection method and device for phosphorescence temperature measurement, medium and product

Abstract

The invention discloses a phosphorescence temperature measurement working wavelength selection method and device, a medium and a product, and relates to the technical field of phosphorescence temperature measurement, and the method comprises the steps: reading all wavelengths in spectral data, and obtaining wavelength data; traversing all bandwidths of each wavelength in the wavelength data to obtain bandwidth data corresponding to each wavelength; obtaining a plurality of wave band combinations according to the wavelength data and the bandwidth data; establishing a light intensity ratio and temperature mapping model by using each wave band combination; deleting the light intensity ratio and temperature mapping model corresponding to the condition that the system error is greater than a preset threshold value, deleting the light intensity ratio and temperature mapping model corresponding to the condition that the random error is greater than a preset multiple, and finally determining a phosphorescence temperature measurement working wavelength selection result according to the light intensity ratio and temperature mapping model. According to the automatic calculation and selection method, manual calculation is not needed, automatic calculation and selection can be carried out according to spectral data, and meanwhile the problems that in the mapping relation model calibration process, the calibration result uncertainty is large, and the temperature measurement precision is low are solved.

Description

Technical Field

[0001] The present application relates to the technical field of phosphorescence temperature measurement, and in particular to a method, device, medium and product for selecting a working wavelength for phosphorescence temperature measurement. Background Art

[0002] As the "heart" of the aircraft, the thermodynamic cycle in the aircraft engine is the Brayton cycle, and its efficiency and thrust-to-weight ratio are determined by the temperature before the turbine. In order to pursue higher efficiency and thrust-to-weight ratio, increasing the temperature before the turbine has become the development trend of advanced aircraft engines, which makes the protection of the hot end components of aircraft engines constantly face new challenges. The accurate measurement of the temperature of the hot end components of aircraft engines directly determines the accuracy of the engine thermal analysis system and cooling design, and is related to the safety and life of the entire aircraft engine.

[0003] The harsh working environment of the hot end parts of aircraft engines has brought great challenges to traditional temperature testing technologies represented by thermocouples and infrared temperature measurement technology. Traditional temperature testing technology has faced development bottlenecks. Thermocouples will destroy the surface temperature field and are difficult to install on the surface of rotating parts. Infrared temperature measurement technology is greatly affected by surface emissivity and complex gas atmosphere. Phosphorescence temperature measurement technology can overcome the above difficulties. It has the advantages of non-contact, wide temperature measurement range, high temperature measurement accuracy, and is not affected by emissivity and gas composition.

[0004] Phosphorescence temperature measurement technology is to dope rare earth ions into thermal barrier coatings. When excited by excitation light, rare earth ions will radiate phosphorescence. The ratio of the light intensity of the characteristic peaks of phosphorescence is related to the temperature. By measuring the light intensity ratio of the characteristic peaks of phosphorescence and combining the relationship between the light intensity ratio and temperature calibrated in advance, the temperature information of the surface to be measured can be obtained. At present, the selection of characteristic peaks is done by manual calculation to select suitable characteristic peaks from the spectrum to establish a mapping relationship between the light intensity ratio and the temperature. The calculation is time-consuming, the results vary from person to person, there is a lot of uncertainty, and it is impossible to establish the most ideal mapping relationship model for temperature measurement performance. Summary of the invention

[0005] The purpose of this application is to provide a method, device, medium and product for selecting the working wavelength of phosphorescence temperature measurement, which can automatically calculate and select according to spectral data, and at the same time solve the problems of large uncertainty of calibration results and low temperature measurement accuracy in the calibration process of the mapping relationship model.

[0006] To achieve the above objectives, this application provides the following solutions:

[0007] In a first aspect, the present application provides a method for selecting a phosphorescence temperature measurement working wavelength, comprising:

[0008] Acquire several spectral data of phosphorescent materials;

[0009] Read all wavelengths in the spectral data to obtain wavelength data;

[0010] Traversing all bandwidths of each wavelength in the wavelength data to obtain bandwidth data corresponding to each wavelength;

[0011] Acquire a plurality of band combinations according to the wavelength data and the bandwidth data; each of the band combinations includes two working bands; each of the working bands includes one of the wavelengths and a corresponding bandwidth;

[0012] Using each of the waveband combinations to establish a light intensity ratio and temperature mapping model;

[0013] Calculating the systematic error of each of the light intensity ratio and temperature mapping models when performing phosphorescence temperature measurement;

[0014] The light intensity ratio and temperature mapping models corresponding to the system error being greater than a preset threshold are deleted to obtain a plurality of first light intensity ratio and temperature mapping models;

[0015] Calculating the random error of each of the first light intensity ratio and temperature mapping models, and obtaining the minimum random error;

[0016] The first light intensity ratio and temperature mapping model corresponding to the minimum random error whose random error is greater than a preset multiple is deleted to obtain a second light intensity ratio and temperature mapping model;

[0017] The phosphorescence temperature measurement working wavelength selection result is determined according to the second light intensity ratio and the waveband combination corresponding to the temperature mapping model.

[0018] Optionally, the light intensity ratio and temperature mapping model is:

[0019]

[0020] Where I1 and I2 are the phosphorescence intensities of the two working bands, FIR is the light intensity ratio corresponding to the working band combination, B is the coefficient determined by fitting, ΔE is the energy level difference, and k B is the Boltzmann constant, T is the temperature, and C is the coefficient determined by the fitting.

[0021] Optionally, the reading of all wavelengths in the spectral data to obtain wavelength data; and traversing all bandwidths of each wavelength to obtain bandwidth data corresponding to each wavelength specifically include:

[0022] Read all wavelengths in the spectral data at intervals of 0.85 nm to obtain wavelength data;

[0023] Taking 5 times the minimum step length of the spectrometer as the traversal step length, and the minimum step length of the spectrometer to 200 times the minimum step length of the spectrometer as the traversal range, all bandwidths of each of the wavelengths are traversed to obtain bandwidth data corresponding to each wavelength.

[0024] Optionally, determining the phosphorescence temperature measurement working wavelength selection result according to the second light intensity ratio and the waveband combination corresponding to the temperature mapping model specifically includes:

[0025] Acquire a band combination corresponding to the second light intensity ratio and temperature mapping model to obtain second band combination data;

[0026] Read all wavelengths in the second wavelength combination data at intervals of 0.17 nm to obtain second wavelength data;

[0027] Taking the minimum step size of the spectrometer as the traversal step size, and the minimum step size of the spectrometer to 200 times the minimum step size of the spectrometer as the traversal range, traverse all bandwidths of each wavelength in the second wavelength data to obtain second bandwidth data corresponding to each wavelength;

[0028] Acquire a plurality of second band combinations according to the second wavelength data and the second bandwidth data; each of the second band combinations includes two second working bands; each of the second working bands includes a second wavelength and a corresponding second bandwidth;

[0029] Using each of the second waveband combinations to establish a second light intensity ratio and temperature mapping model;

[0030] Calculating the systematic error of each of the second light intensity ratio and temperature mapping models when performing phosphorescence temperature measurement;

[0031] The second light intensity ratio and temperature mapping models corresponding to the system error being greater than a preset threshold are deleted to obtain a plurality of third light intensity ratio and temperature mapping models;

[0032] Calculating the random error of each of the third light intensity ratio and temperature mapping models;

[0033] The second band combination corresponding to the third light intensity ratio and the temperature mapping model with the smallest random error is used as the optimal working band combination.

[0034] Optionally,

[0035] The light intensity ratio and temperature mapping models corresponding to the system error being greater than a preset threshold are deleted to obtain a plurality of first light intensity ratio and temperature mapping models, specifically including:

[0036] The light intensity ratio and temperature mapping models corresponding to the system error greater than 0.5% are deleted to obtain a plurality of first light intensity ratio and temperature mapping models;

[0037] The first light intensity ratio and temperature mapping model corresponding to the minimum random error whose random error is greater than a preset multiple is deleted to obtain a second light intensity ratio and temperature mapping model, specifically comprising:

[0038] The first light intensity ratio and temperature mapping model corresponding to the minimum random error whose random error is greater than 1.1 times is deleted to obtain a second light intensity ratio and temperature mapping model.

[0039] Optionally, the calculating of the system error of each of the light intensity ratio and temperature mapping models when performing phosphorescence temperature measurement specifically includes:

[0040] For each of the light intensity ratio and temperature mapping models:

[0041] Using the light intensity ratio and temperature mapping model to predict temperature, a predicted value is obtained;

[0042] Calculating the difference between the predicted value and the true value;

[0043] The difference is divided by the true value to obtain the system error.

[0044] Optionally, the calculating the random error of each of the first light intensity ratio and temperature mapping models specifically includes:

[0045] For each of the first light intensity ratio and temperature mapping models;

[0046] Acquire a band combination corresponding to the first light intensity ratio and temperature mapping model;

[0047] Calculate the standard deviation of the light intensity ratio measured by n experiments according to the waveband combination;

[0048] The random error of the first light intensity ratio and temperature mapping model is obtained by dividing the standard deviation by square root n and then by the light intensity ratio average value; the light intensity ratio average value is the average value of the light intensity ratio measured by n experiments according to the band combination.

[0049] In a second aspect, the present application provides a computer device, comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement any of the above-described phosphorescence temperature measurement working wavelength selection methods.

[0050] In a third aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements any of the above-described phosphorescence temperature measurement working wavelength selection methods.

[0051] In a fourth aspect, the present application provides a computer program product, including a computer program, which, when executed by a processor, implements any of the above-mentioned phosphorescence temperature measurement working wavelength selection methods.

[0052] According to the specific embodiments provided in this application, this application discloses the following technical effects:

[0053] The present application provides a method, device, medium and product for selecting a working wavelength for phosphorescence temperature measurement, which reads all wavelengths in spectral data to obtain wavelength data; traverses all bandwidths of each wavelength in the wavelength data to obtain bandwidth data corresponding to each wavelength; obtains a plurality of band combinations according to the wavelength data and the bandwidth data; each of the band combinations includes two working bands; each of the working bands includes one wavelength and a corresponding bandwidth; uses each of the band combinations to establish a light intensity ratio and temperature mapping model; calculates the system error of each of the light intensity ratio and temperature mapping models when performing phosphorescence temperature measurement; deletes the light intensity ratio and temperature mapping model corresponding to a system error greater than a preset threshold to obtain a plurality of first light intensity ratio and temperature mapping models; calculates the random error of each of the first light intensity ratio and temperature mapping models and obtains the minimum random error; deletes the first light intensity ratio and temperature mapping model corresponding to the minimum random error whose random error is greater than a preset multiple to obtain a second light intensity ratio and temperature mapping model; and determines the selection result of the working wavelength for phosphorescence temperature measurement according to the band combination corresponding to the second light intensity ratio and temperature mapping model. The present application provides a method for automatic calculation and selection, which does not require manual calculation, thereby solving the problem that the current selection of characteristic peaks is to select suitable characteristic peaks from the spectrum through manual calculation to establish a mapping relationship between light intensity ratio and temperature, which takes a long time to calculate, and the results vary from person to person, and there is a lot of uncertainty, and it is impossible to establish a mapping relationship model with the most ideal temperature measurement performance. The present application can automatically calculate and select based on spectral data, and at the same time solve the problems of large uncertainty in calibration results and low temperature measurement accuracy in the calibration process of the mapping relationship model. BRIEF DESCRIPTION OF THE DRAWINGS

[0054] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0055] Figure 1 This is a diagram of the application environment of a phosphorescence temperature measurement working wavelength selection method in one embodiment of the present application;

[0056] Figure 2 A schematic diagram of a process flow of a phosphorescence temperature measurement working wavelength selection method provided in one embodiment of the present application;

[0057] Figure 3 A schematic diagram of a pure phosphorescence spectrum provided in one embodiment of the present application;

[0058] Figure 4 A schematic diagram of error distribution provided in an embodiment of the present application;

[0059] Figure 5 A schematic diagram of the structure of a computer device provided in one embodiment of the present application. DETAILED DESCRIPTION

[0060] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0061] As the core power component of an aircraft, aircraft engines have a very important impact on all aspects of aircraft performance. From early centrifugal turbojet engines to single-rotor axial-flow turbojet engines, from twin-rotor turbojet engines to low-bypass turbofan engines, and then to high-bypass turbofan engines, modern aircraft engines show a development trend of increasing bypass ratio, increasing pressure ratio, and increasing turbine inlet temperature (i.e., "two wide and one high").

[0062] The continuous improvement of the technical indicators of aircraft engines means that the working environment of its core hot-end components (such as turbine blades, turbine discs, support bearings, etc.) will be more severe than expected. With the coexistence of high temperature, high pressure and high-speed rotation, and the combined effect of multiple influencing factors, the hot-end components are very prone to damage and failure. Therefore, the overall development of aircraft engines in the future will be more difficult, and more structural strength and working performance tests will be required to determine the performance and working reliability of its hot-end components. The main characteristics of these tests are: complex technology, many links, large workload, large investment, and long cycle, and they need to rely on reliable testing technology to provide useful information data. The temperature of the hot-end components of aircraft engines is a key parameter of the hot-end components. The accurate acquisition of the temperature of the hot-end components of aircraft engines directly determines the accuracy of the engine thermal analysis system and cooling design, and is related to the safety and service life of the hot-end components.

[0063] The harsh working environment of the hot end parts of aircraft engines has brought great challenges to traditional temperature testing technologies represented by thermocouples and infrared temperature measurement technology. Traditional temperature testing technology has faced development bottlenecks. Thermocouples will destroy the surface temperature field and are difficult to install on the surface of rotating parts. Infrared temperature measurement technology is greatly affected by surface emissivity and complex gas atmosphere.

[0064] Phosphorescence temperature measurement technology can overcome the above difficulties. It has the advantages of non-contact, wide temperature measurement range, high temperature measurement accuracy, and no influence from emissivity and gas composition. Phosphorescence temperature measurement technology is to dope rare earth ions into thermal barrier coatings. When excited by excitation light, rare earth ions will radiate phosphorescence. The ratio of the light intensity of the characteristic peaks of phosphorescence is related to temperature. By measuring the light intensity ratio of the characteristic peaks of phosphorescence, combined with the relationship between the light intensity ratio and temperature calibrated in advance, the temperature information of the surface to be measured can be obtained. At present, the selection of characteristic peaks of phosphorescence spectrum is done by manually calculating and selecting suitable characteristic peaks from the spectrum to establish a mapping relationship between the light intensity ratio and the temperature. There is no screening method for the combination of characteristic peaks.

[0065] With the development of aircraft engines, technical indicators such as turbine pre-temperature continue to improve, which brings great challenges to the design of aircraft engine hot end components. Reliable testing technology is needed to support its design. The harsh working environment of aircraft engine hot end components has brought great challenges to traditional temperature testing technologies represented by thermocouples and infrared temperature measurement technology. Traditional temperature testing technology has faced development bottlenecks. Phosphorescence temperature measurement technology can overcome the above difficulties. It has the advantages of non-contact, wide temperature measurement range, high temperature measurement accuracy, and no influence from emissivity and gas composition. The principle of phosphorescence temperature measurement technology is that the ratio of the light intensity of the phosphorescence characteristic peak is related to the temperature. By measuring the light intensity ratio of the phosphorescence characteristic peak and combining the relationship between the light intensity ratio and temperature calibrated in advance, the temperature information of the surface to be measured can be obtained. However, the selection of phosphorescence spectrum characteristic peaks is currently done by manually calculating the appropriate characteristic peaks from the spectrum to establish a mapping relationship between the light intensity ratio and the temperature. The calculation is time-consuming, the results vary from person to person, there is a lot of uncertainty, and it is impossible to establish the most ideal mapping relationship model for temperature measurement performance. This application establishes a characteristic peak combination evaluation method based on error analysis theory, develops an automatic selection algorithm for characteristic peaks of rare earth ion emission spectra, selects characteristic peak combinations with high temperature measurement accuracy, and solves the problems of large uncertainty in calibration results and low temperature measurement accuracy in the calibration process of the mapping relationship model.

[0066] The purpose of this application is to provide a method, device, medium and product for selecting the working wavelength of phosphorescence temperature measurement, which can automatically calculate and select according to spectral data, and at the same time solve the problems of large uncertainty of calibration results and low temperature measurement accuracy in the calibration process of the mapping relationship model.

[0067] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0068] Explanation of terms used in this application:

[0069] 1. Phosphorescence: Phosphorescence is a cold luminescence form that is different from thermal luminescence. Its characteristic is that luminescence can be stimulated by means other than heating, such as ultraviolet stimulation, electron beam impact, etc. When the excitation light stimulates the phosphorescent material, it causes the electron energy level to jump to a high energy level, and then falls back to a low energy level after a certain period of time, and releases energy in the process. Part of the energy causes lattice vibration and is eventually released in the form of heat; the other part of the energy is released in the form of luminescence, including fluorescence and phosphorescence, where the duration of fluorescence is less than 10 -8 s, phosphorescence duration is 10 -5 s to 10 -3 s, which is manifested as a long afterglow after the excitation ends.

[0070] 2. Phosphorescence temperature measurement: A technology that uses the mapping relationship between the spectral characteristics or life characteristics of phosphorescent materials such as rare earth ions and temperature to perform temperature testing, including the intensity ratio method and the life decay method. This patent only involves the intensity ratio method. In the field of aircraft engines, rare earth ions are usually doped into thermal barrier coatings so that the thermal barrier coatings can radiate phosphorescence when excited by excitation light, thereby measuring the temperature of the thermal barrier coatings and characterizing the temperature of the surface of the hot end components coated with the thermal barrier coatings.

[0071] 3. Thermal coupling energy level: Thermal coupling energy level refers to the energy level spacing range of 200 to 2000 cm in a certain system. -1 Due to the influence of heat, all energy states tend to balance and reach a unified state. In this state, the proportion of the number of particles at the thermal coupling energy level follows the Boltzmann distribution and changes with temperature.

[0072] 4. Principle of temperature measurement by intensity ratio method: The intensity ratio method is a temperature measurement method based on thermal coupling energy levels. The number of particles distributed on the thermal coupling energy levels is proportional to the luminescence intensity. Different thermal coupling energy levels emit phosphorescence with different wavelengths, which are reflected in different characteristic peaks in the phosphorescence emission spectrum. The temperature is measured by using the mapping relationship between the intensity ratio of the characteristic peaks corresponding to the thermal coupling energy levels in the phosphorescence emission spectrum and the temperature. In recent years, studies have also shown that non-thermal coupling energy levels can also be used for temperature measurement by intensity ratio method.

[0073] 5. Light intensity ratio and temperature mapping model: According to the temperature measurement principle of phosphorescence intensity ratio method, there is a working band combination (including central wavelength and bandwidth) corresponding to the thermal coupling energy level or non-thermal coupling energy level of rare earth ions in the emission spectrum of phosphorescent materials. The following relationship exists between the phosphorescence intensity ratio of the working band combination and the temperature:

[0074]

[0075] Where I1 and I2 are the phosphorescence intensities of the two working bands, FIR is the light intensity ratio corresponding to the working band combination, B is the coefficient determined by fitting, ΔE is the energy level difference, and k B is the Boltzmann constant, T is the temperature, and C is the coefficient determined by the fitting.

[0076] 6. Characteristic peaks of phosphorescence spectrum: Characteristic peaks in the phosphorescence spectrum corresponding to thermal coupling energy levels that can be used for temperature measurement.

[0077] The phosphorescence temperature measurement working wavelength selection method provided in the embodiment of the present application can be applied to Figure 1 In the application environment shown, the terminal 102 communicates with the server 104 through a network. The data storage system can store data that the server 104 needs to process. The data storage system can be set up separately, integrated on the server 104, or placed on the cloud or other servers. The terminal 102 can send the spectral data to be processed to the server 104. After receiving the spectral data to be processed, the server 104 reads all wavelengths in the spectral data to obtain wavelength data; traverses all bandwidths of each wavelength in the wavelength data to obtain bandwidth data corresponding to each wavelength; obtains a number of band combinations according to the wavelength data and the bandwidth data; each of the band combinations includes two working bands; each of the working bands includes one wavelength and a corresponding bandwidth; uses each of the band combinations to establish a light intensity ratio and temperature mapping model; calculates the system error of each of the light intensity ratio and temperature mapping models when performing phosphorescence temperature measurement; deletes the light intensity ratio and temperature mapping model corresponding to the system error greater than a preset threshold, and obtains a number of first light intensity ratio and temperature mapping models; calculates the random error of each of the first light intensity ratio and temperature mapping models, and obtains the minimum random error; deletes the first light intensity ratio and temperature mapping model corresponding to the minimum random error whose random error is greater than a preset multiple, and obtains a second light intensity ratio and temperature mapping model; determines the phosphorescence temperature measurement working wavelength selection result according to the band combination corresponding to the second light intensity ratio and temperature mapping model. The server 104 can feed back the obtained phosphorescence temperature measurement working wavelength selection result to the terminal 102. In addition, in some embodiments, the phosphorescence temperature measurement working wavelength selection method can also be implemented by the server 104 or the terminal 102 alone, such as the terminal 102 can directly process the spectral data to be processed, or the server 104 can obtain the spectral data to be processed from the data storage system and process it.

[0078] The terminal 102 may be, but is not limited to, various desktop computers, laptop computers, smart phones, tablet computers, IoT devices, and portable wearable devices. The IoT devices may be smart speakers, smart TVs, smart air conditioners, smart vehicle-mounted devices, etc. The portable wearable devices may be smart watches, smart bracelets, head-mounted devices, etc. The server 104 may be implemented as an independent server or a server cluster consisting of multiple servers, or may be a cloud server.

[0079] In an exemplary embodiment, Figure 2 As shown, a method for selecting a phosphorescence temperature measurement wavelength is provided. The method is executed by a computer device, and can be executed by a computer device such as a terminal or a server alone, or can be executed by a terminal and a server together. In the embodiment of the present application, the method is applied to Figure 1 The server 104 in the example is used as an example to illustrate the method, which includes the following steps S1 to S10. Among them:

[0080] The application scenario of this embodiment is the calibration of the rare earth ion emission peak intensity ratio and temperature mapping model. During the mapping model calibration experiment, it is necessary to collect phosphorescence spectra at different temperatures. This embodiment proposes that during the experiment, the phosphorescence spectrum and the background radiation spectrum are collected at different temperatures at the same time, and the phosphorescence spectrum and the background radiation spectrum at each temperature are collected 20 times.

[0081] S1. Obtaining a number of spectral data of phosphorescent materials.

[0082] In this embodiment, 20 groups of phosphorescence spectra collected at each temperature are subtracted from 20 groups of background radiation spectra to obtain 20 groups of pure phosphorescence spectra at each temperature. For YSZ:Dy material, the phosphorescence spectra and background radiation spectra at different temperatures are collected and offset corrected to obtain pure phosphorescence spectra. Figure 3 shown.

[0083] S2. Read all wavelengths in the spectral data to obtain wavelength data. In this embodiment, all wavelengths in the spectral data are read at intervals of 0.85 nm to obtain wavelength data.

[0084] S3, traversing all bandwidths of each wavelength in the wavelength data to obtain bandwidth data corresponding to each wavelength. In this embodiment, 5 times the minimum step length of the spectrometer is used as the traversal step length, and the minimum step length of the spectrometer to 200 times the minimum step length of the spectrometer is used as the traversal range, traversing all bandwidths of each wavelength, and obtaining bandwidth data corresponding to each wavelength.

[0085] S4. Acquire several band combinations according to the wavelength data and the bandwidth data; each of the band combinations includes two working bands; each of the working bands includes one wavelength and a corresponding bandwidth.

[0086] The working band is defined by the central wavelength and bandwidth. Different phosphorescent materials have different emission spectra corresponding to different wavelength ranges. Taking YSZ:Dy as an example, its emission spectrum is as follows: Figure 3 The emission wavelength range includes 450nm-500nm and 540nm-620nm, among which 450nm-500nm is the commonly used working band combination range. Therefore, when optimizing the band combination of the phosphorescent material YSZ:Dy, the initial traversal range of the central wavelength of the working band combination is 450nm-500nm. The larger the traversal step size, the higher the calculation efficiency, and the smaller the traversal step size, the higher the calculation accuracy. In order to ensure high calculation accuracy while improving calculation efficiency, this embodiment sets two rounds of traversal. In the first round of traversal, the calculation step size of the central wavelength is set to 0.85nm (the minimum step size of the spectrometer used in this laboratory is 0.17nm, and 0.85nm is 5 times the minimum step size of the spectrometer), the traversal range of the bandwidth is from the minimum step size of the spectrometer to 200 times the minimum step size of the spectrometer, and the traversal step size is set to 5 times the minimum step size of the spectrometer. In the second round of traversal, the calculation step size of the central wavelength is set to 0.17nm, the traversal range of the bandwidth is from the minimum step size of the spectrometer to 200 times the minimum step size, and the traversal step size is set to the minimum step size of the spectrometer.

[0087] S5. Using each of the waveband combinations, establish a light intensity ratio and temperature mapping model.

[0088] Specifically, in this embodiment, the spectrum data is input into the program, and then the possible working bands in the spectrum are traversed. According to the temperature measurement principle of the phosphorescence intensity ratio method, there are working band combinations corresponding to the thermal coupling energy level of rare earth ions or working band combinations corresponding to the non-thermal coupling energy level in the emission spectrum of the phosphorescent material. There is the following relationship between the phosphorescence intensity ratio of the working band combination and the temperature, that is, the light intensity ratio and temperature mapping model is:

[0089]

[0090] Where I1 and I2 are the phosphorescence intensities of the two working bands, FIR is the light intensity ratio corresponding to the working band combination, B is the coefficient determined by fitting, ΔE is the energy level difference, and k B is the Boltzmann constant, T is the temperature, and C is the coefficient determined by the fitting.

[0091] S6. Calculate the system error of each of the light intensity ratio and temperature mapping models when performing phosphorescence temperature measurement.

[0092] The calculation process of the system error is as follows: for each of the light intensity ratio and temperature mapping models:

[0093] Using the light intensity ratio and temperature mapping model to predict temperature, a predicted value is obtained;

[0094] Calculating the difference between the predicted value and the true value;

[0095] The difference is divided by the true value to obtain the system error.

[0096] S7. Delete the light intensity ratio and temperature mapping models corresponding to the system error greater than the preset threshold, and obtain several first light intensity ratio and temperature mapping models. In this embodiment, the light intensity ratio and temperature mapping models corresponding to the system error greater than 0.5% are deleted to obtain several first light intensity ratio and temperature mapping models. Among them, 0.5% is the preset threshold selected in this embodiment, and different values ​​can be used for different phosphorescent materials and different application scenarios.

[0097] S8. Calculate the random error of each of the first light intensity ratio and temperature mapping models, and obtain the minimum random error.

[0098] The random error calculation process is as follows: for each of the first light intensity ratio and temperature mapping models;

[0099] Acquire a band combination corresponding to the first light intensity ratio and temperature mapping model;

[0100] Calculate the standard deviation of the light intensity ratio measured by n experiments according to the waveband combination;

[0101] The random error of the first light intensity ratio and temperature mapping model is obtained by dividing the standard deviation by square root n and then by the light intensity ratio average value; the light intensity ratio average value is the average value of the light intensity ratio measured by n experiments based on the band combination.

[0102] The above S2-S8 is the first round of traversal process. In the first round of traversal, the light intensity ratio of each working band is first calculated, and then a mapping relationship model between the average light intensity ratio of 20 repeated experiments in each working band and the temperature is established, and the difference between the temperature predicted by the mapping relationship model and the actual temperature (measured by the thermocouple in the calibration furnace) is calculated and divided by the actual temperature as the system error. If the system error is ≤0.5%, the group of data is retained and the random error of the group of data is evaluated, otherwise it is not retained; the random error evaluation method is the standard deviation of the light intensity ratio measured in 20 experiments of the group of working bands divided by the square root of 20, and then divided by the average value of the light intensity ratio measured in 20 experiments.

[0103] If the improvement of the wavelength accuracy of the working band is not considered, the data retained in the first round of traversal can be directly selected as the optimal working band combination with the smallest random error; if the improvement of the wavelength accuracy of the working band is considered, all working band combinations with random errors not greater than 1.1 times the minimum random error are selected as the optimal working band range, and the second round of traversal is carried out within this range. (The purpose of selecting a random error not greater than 1.1 times the minimum random error is to reduce the amount of calculation in the second round of traversal. After irrelevance verification, the results are the same when the multiple is set to 1.1, 1.2, and 1.3).

[0104] S9, the first light intensity ratio and temperature mapping model corresponding to the minimum random error whose random error is greater than a preset multiple is deleted to obtain a second light intensity ratio and temperature mapping model. In this embodiment, the first light intensity ratio and temperature mapping model corresponding to the minimum random error whose random error is greater than 1.1 times is deleted to obtain a second light intensity ratio and temperature mapping model.

[0105] S10. Determine a phosphorescence temperature measurement working wavelength selection result according to a wavelength combination corresponding to the second light intensity ratio and a temperature mapping model.

[0106] Specifically:

[0107] Acquire a band combination corresponding to the second light intensity ratio and temperature mapping model to obtain second band combination data;

[0108] Read all wavelengths in the second wavelength combination data at intervals of 0.17 nm to obtain second wavelength data;

[0109] Taking the minimum step size of the spectrometer as the traversal step size, and the minimum step size of the spectrometer to 200 times the minimum step size of the spectrometer as the traversal range, traverse all bandwidths of each wavelength in the second wavelength data to obtain second bandwidth data corresponding to each wavelength;

[0110] Acquire a plurality of second band combinations according to the second wavelength data and the second bandwidth data; each of the second band combinations includes two second working bands; each of the second working bands includes a second wavelength and a corresponding second bandwidth;

[0111] Using each of the second waveband combinations to establish a second light intensity ratio and temperature mapping model;

[0112] Calculating the systematic error of each of the second light intensity ratio and temperature mapping models when performing phosphorescence temperature measurement;

[0113] The second light intensity ratio and temperature mapping models corresponding to the system error being greater than a preset threshold are deleted to obtain a plurality of third light intensity ratio and temperature mapping models;

[0114] Calculating the random error of each of the third light intensity ratio and temperature mapping models;

[0115] The second band combination corresponding to the third light intensity ratio and the temperature mapping model with the smallest random error is used as the optimal working band combination.

[0116] In short, the above step S10 is the second round of traversal process. In the second round of traversal, the traversed wavelength range is defined by the central wavelength and the bandwidth. The working band combination includes a band with a longer wavelength and a band with a shorter wavelength. The traversal range is defined separately. The central wavelength range of the band with a longer wavelength is taken as the minimum range of all working band combinations with random errors not greater than 1.1 times the minimum random error screened out in the first round. The same is true for the band with a shorter wavelength. The calculation step of the central wavelength is set to 0.17nm, and the traversal range of the bandwidth is from the minimum step of the spectrometer to 200 times the minimum step, and the traversal step is set to the minimum step of the spectrometer. The traversal process is consistent with the first round of traversal. After screening out all working band combinations with system errors ≤0.5%, their random errors are evaluated, and the working band combination with the smallest random error is taken as the optimal working band combination.

[0117] In the traversal range, all possible working band combinations are exhaustively enumerated, and for each pair of working band combinations, light intensity ratio and temperature mapping relationship models 1 to n are established, and then the system errors of models 1 to n are judged. If the system error does not meet the requirements, the model is deleted, otherwise, the model is accepted as the accurate model. In the accurate model, the random errors of the model are further compared and analyzed, and the model with the smallest random error is selected as the optimal model. The working band corresponding to the model is the optimal working band of the two-dimensional phosphorescence temperature measurement system.

[0118] In this embodiment, for the yttria-stabilized zirconia (YSZ:Dy) material doped with dysprosium ions, two temperature measurement bands are screened out within the temperature range of 532K-990K, as shown in Table 1 below:

[0119] Table 1 Optimization results of temperature measurement bands

[0120] Central wavelength (nm) Bandwidth(nm) Temperature measurement wavelength 1 460.5 19 Temperature measurement wavelength 2 493.5 25

[0121] In this embodiment, a band combination evaluation method is established based on error theory:

[0122] According to the temperature measurement accuracy index and combined with the error theory, the temperature measurement error is allocated. The temperature measurement error is allocated to the calibration error and the measured error according to the equal action principle of error allocation. The calibration error is the error generated during the calibration process, and the measured error is the error generated during the actual temperature test. The calibration error can be further allocated to the systematic error and random error according to the equal action principle. The error allocation calculation formula is as follows:

[0123]

[0124] Where E is the temperature measurement error, e calibration is the calibration error, e measured is the measured error.

[0125]

[0126] Where Δ is the systematic error and δ is the random error.

[0127] For example, when the temperature measurement error is set to 1%, according to the principle of equal action of error distribution, the calibration error and the measured error are equal, and the calibration error and the measured error are both 0.71%. The calibration error is further distributed into systematic error and random error according to the principle of equal action, and the systematic error and the random error are both 0.5%.

[0128] When the mapping relationship model between the light intensity ratio and the temperature meets the systematic error index, the obtained model can be considered accurate. Under this premise, considering that the phosphorescence thermal quenching phenomenon intensifies, the phosphorescence intensity weakens, and the repeatability of the phosphorescence signal decreases with the increase of temperature, which leads to an increase in the random error of the calibration result, in order to explore a higher upper limit of temperature measurement and higher temperature measurement precision, the characteristic band combination with the smallest random error is selected as the optimal working band combination. The systematic error of the mapping relationship corresponding to the band combination meets the accuracy requirements, with high accuracy, minimal random error, and high precision. Therefore, the mapping relationship corresponding to the band combination has the characteristics of high accuracy and high precision.

[0129] The present application proposes a working band selection method suitable for the intensity ratio phosphorescence temperature measurement mode. By establishing a band combination evaluation method, working band selection with high temperature measurement accuracy is achieved, and the problems of large uncertainty in calibration results and low temperature measurement accuracy that exist in the calibration process of the intensity ratio and temperature mapping relationship model are solved.

[0130] The working band selection method proposed by the present invention comprises the following steps:

[0131] 1. Spectral data preprocessing: averaging multiple phosphorescence spectra and multiple background radiation spectra collected at each temperature to support the calculation of systematic errors and random errors;

[0132] 2. Background radiation offset correction: subtract the background radiation spectrum from the average phosphorescence spectrum at each temperature to obtain the average pure phosphorescence spectrum at each temperature, eliminating the influence of background radiation;

[0133] 3. Construction of band combination evaluation system. A band combination evaluation system is established based on error theory and error requirements of the temperature measurement object, including systematic error requirements and random error requirements. The systematic error requirements are allocated according to the total error requirements, and the random error takes the minimum value.

[0134] 4. To implement the band optimization algorithm, first input the spectral data, traverse the possible working bands in the spectrum, establish a mapping relationship model between intensity ratio and temperature for each working band combination, and then optimize the working band combination based on the band combination evaluation system to obtain the final optimal working band.

[0135] This application establishes a characteristic peak combination evaluation method based on error analysis theory and develops an automatic selection algorithm for characteristic peaks of rare earth ion emission spectra to select working band combinations with high temperature measurement accuracy, thereby solving problems such as large uncertainty in calibration results and low temperature measurement accuracy in the calibration process of the mapping relationship model.

[0136] In an exemplary embodiment, a computer device is provided, which may be a server or a terminal. The computer device includes a processor, a memory, an input / output interface (I / O for short) and a communication interface. The processor, the memory and the input / output interface are connected via a system bus, and the communication interface is connected to the system bus via the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal via a network connection. When the computer program is executed by the processor, a phosphorescence temperature measurement working wavelength selection method is implemented.

[0137] In an exemplary embodiment, a computer device is further provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor implements the steps in the above-mentioned method embodiments when executing the computer program.

[0138] In an exemplary embodiment, a computer-readable storage medium is provided, storing a computer program, and when the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0139] In an exemplary embodiment, a computer program product is provided, including a computer program, and when the computer program is executed by a processor, the steps in the above method embodiments are implemented.

[0140] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with relevant regulations.

[0141] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM may be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0142] The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. The non-relational database may include a distributed database based on blockchain, etc., but is not limited thereto. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but is not limited thereto.

[0143] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0144] This article uses specific examples to illustrate the principles and implementation methods of this application. The description of the above embodiments is only used to help understand the method and core ideas of this application. At the same time, for those skilled in the art, according to the ideas of this application, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting this application.

Claims

1. A method for selecting a working wavelength for phosphorescence temperature measurement, characterized in that: The phosphorescence temperature measurement working wavelength selection method comprises: Acquire several spectral data of phosphorescent materials; Read all wavelengths in the spectral data to obtain wavelength data; Traversing all bandwidths of each wavelength in the wavelength data to obtain bandwidth data corresponding to each wavelength; Acquire a plurality of band combinations according to the wavelength data and the bandwidth data; each of the band combinations includes two working bands; each of the working bands includes one of the wavelengths and a corresponding bandwidth; Using each of the waveband combinations to establish a light intensity ratio and temperature mapping model; Calculating the systematic error of each of the light intensity ratio and temperature mapping models when performing phosphorescence temperature measurement; The light intensity ratio and temperature mapping models corresponding to the system error being greater than a preset threshold are deleted to obtain a plurality of first light intensity ratio and temperature mapping models; Calculating the random error of each of the first light intensity ratio and temperature mapping models, and obtaining the minimum random error; The first light intensity ratio and temperature mapping model corresponding to the minimum random error whose random error is greater than a preset multiple is deleted to obtain a second light intensity ratio and temperature mapping model; The phosphorescence temperature measurement working wavelength selection result is determined according to the second light intensity ratio and the waveband combination corresponding to the temperature mapping model.

2. The phosphorescence temperature measurement working wavelength selection method according to claim 1 is characterized in that: The light intensity ratio and temperature mapping model is: Where I1 and I2 are the phosphorescence intensities of the two working bands, FIR is the light intensity ratio corresponding to the working band combination, B is the coefficient determined by fitting, ΔE is the energy level difference, and k B is the Boltzmann constant, T is the temperature, and C is the coefficient determined by the fitting.

3. The phosphorescence temperature measurement working wavelength selection method according to claim 1 is characterized in that: The step of reading all wavelengths in the spectral data to obtain wavelength data; Traverse all bandwidths of each wavelength to obtain bandwidth data corresponding to each wavelength, including: Read all wavelengths in the spectral data at intervals of 0.85 nm to obtain wavelength data; Taking 5 times the minimum step length of the spectrometer as the traversal step length, and the minimum step length of the spectrometer to 200 times the minimum step length of the spectrometer as the traversal range, all bandwidths of each of the wavelengths are traversed to obtain bandwidth data corresponding to each wavelength.

4. The phosphorescence temperature measurement working wavelength selection method according to claim 3 is characterized in that: The step of determining the phosphorescence temperature measurement working wavelength selection result according to the wavelength combination corresponding to the second light intensity ratio and the temperature mapping model specifically includes: Acquire a band combination corresponding to the second light intensity ratio and temperature mapping model to obtain second band combination data; Read all wavelengths in the second wavelength combination data at intervals of 0.17 nm to obtain second wavelength data; Taking the minimum step size of the spectrometer as the traversal step size, and the minimum step size of the spectrometer to 200 times the minimum step size of the spectrometer as the traversal range, traverse all bandwidths of each wavelength in the second wavelength data to obtain second bandwidth data corresponding to each wavelength; Acquire a plurality of second band combinations according to the second wavelength data and the second bandwidth data; each of the second band combinations includes two second working bands; each of the second working bands includes a second wavelength and a corresponding second bandwidth; Using each of the second waveband combinations to establish a second light intensity ratio and temperature mapping model; Calculating the systematic error of each of the second light intensity ratio and temperature mapping models when performing phosphorescence temperature measurement; The second light intensity ratio and temperature mapping models corresponding to the system error being greater than a preset threshold are deleted to obtain a plurality of third light intensity ratio and temperature mapping models; Calculating the random error of each of the third light intensity ratio and temperature mapping models; The second band combination corresponding to the third light intensity ratio and the temperature mapping model with the smallest random error is used as the optimal working band combination.

5. The phosphorescence temperature measurement working wavelength selection method according to claim 1, characterized in that: The light intensity ratio and temperature mapping models corresponding to the system error being greater than a preset threshold are deleted to obtain a plurality of first light intensity ratio and temperature mapping models, specifically including: The light intensity ratio and temperature mapping models corresponding to the system error greater than 0.5% are deleted to obtain a plurality of first light intensity ratio and temperature mapping models; The first light intensity ratio and temperature mapping model corresponding to the minimum random error whose random error is greater than a preset multiple is deleted to obtain a second light intensity ratio and temperature mapping model, specifically comprising: The first light intensity ratio and temperature mapping model corresponding to the minimum random error whose random error is greater than 1.1 times is deleted to obtain a second light intensity ratio and temperature mapping model.

6. The phosphorescence temperature measurement working wavelength selection method according to claim 1, characterized in that: The calculating of the system error of each of the light intensity ratio and temperature mapping models when performing phosphorescence temperature measurement specifically includes: For each of the light intensity ratio and temperature mapping models: Using the light intensity ratio and temperature mapping model to predict temperature, a predicted value is obtained; Calculating the difference between the predicted value and the true value; The difference is divided by the true value to obtain the system error.

7. The phosphorescence temperature measurement working wavelength selection method according to claim 1, characterized in that: The calculating of the random error of each of the first light intensity ratio and temperature mapping models specifically includes: For each of the first light intensity ratio and temperature mapping models; Acquire a band combination corresponding to the first light intensity ratio and temperature mapping model; Calculate the standard deviation of the light intensity ratio measured by n experiments according to the waveband combination; The random error of the first light intensity ratio and temperature mapping model is obtained by dividing the standard deviation by square root n and then by the light intensity ratio average value; the light intensity ratio average value is the average value of the light intensity ratio measured by n experiments based on the band combination.

8. A computer device comprising: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the phosphorescence temperature measurement working wavelength selection method described in any one of claims 1 to 7.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the phosphorescence temperature measurement working wavelength selection method described in any one of claims 1 to 7 is implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the phosphorescence temperature measurement working wavelength selection method described in any one of claims 1 to 7 is implemented.

Images