Deformation monitoring method and device for offshore thin film type photovoltaic structure

Abstract

The invention relates to the technical field of offshore photovoltaic power generation, in particular to a deformation monitoring method and device for an offshore thin film type photovoltaic structure. In offshore thin film type photovoltaic monitoring, firstly, deformation wavelength values of fiber gratings at a plurality of preset point positions are obtained; and according to the values, the wavelength drift distance of the fiber bragg grating at each preset point position is calculated. Then, according to the wavelength drift distance, the curvature of each preset point position is determined; and then, aiming at an area between every two preset point locations, processing by applying an interpolation algorithm based on the curvature of the preset point locations, thereby obtaining curvature distribution of each point on the whole fiber bragg grating. And finally, accurately calculating the actual deformation of the offshore thin film type photovoltaic structure based on the curvature information of the whole fiber grating. Through the whole set of process, real-time and accurate detection of the deformation of the offshore thin film type photovoltaic structure can be realized, and powerful support is provided for ensuring stable operation and safety of a photovoltaic system.

Description

Technical Field

[0001] The present invention relates to the technical field of offshore photovoltaic power generation, and in particular to a deformation monitoring method and device for an offshore thin-film photovoltaic structure. Background Art

[0002] As an innovative photovoltaic power generation technology, floating photovoltaic system (FPV) effectively overcomes many limitations and challenges faced by land-based photovoltaic systems. This technology builds floating bases on the water surface to support photovoltaic modules for power generation. It not only breaks the dependence of traditional ground photovoltaic power stations on land resources, but also relies on its unique natural cooling effect of water bodies and solar radiation reflection to increase its power generation efficiency by about 10% to 15% compared with land-based photovoltaic power stations under the same conditions. In order to adapt to the complex wind, wave and current marine environment conditions, the current offshore floating photovoltaic structures mainly include multi-module connected multi-floating body type and flexible drift.

[0003] There are two types of floating photovoltaic structures. As an important form of large-scale floating photovoltaic structures, flexible thin-film photovoltaic structures have attracted widespread attention due to their excellent wind resistance and relatively low construction costs. However, when this structure encounters strong wave conditions, it is often accompanied by significant pitching motion, causing the film to deform significantly and the photovoltaic panel to tilt too much. It is worth noting that the power generation efficiency of photovoltaic panels is closely related to their tilt angle. When the structure undergoes significant structural deformation under the action of strong waves, its power generation efficiency and structural safety will inevitably be affected.

[0004] Based on this, there is an urgent need for a deformation monitoring method and device for offshore thin-film photovoltaic structures to solve the problem of how to accurately detect the deformation of offshore thin-film photovoltaic structures in real time. Summary of the invention

[0005] In order to solve the problem of how to accurately detect the deformation of an offshore thin-film photovoltaic structure in real time, an embodiment of the present invention provides a deformation monitoring method and device for an offshore thin-film photovoltaic structure.

[0006] In a first aspect, an embodiment of the present invention provides a deformation monitoring method for an offshore thin-film photovoltaic structure, the method being applied to an offshore thin-film photovoltaic structure, the method comprising:

[0007] Obtaining the deformed wavelength values ​​of the fiber grating at a plurality of preset points of the offshore thin-film photovoltaic system;

[0008] Determining the wavelength drift of the fiber grating at each of the preset points based on the deformation wavelength value of the fiber grating;

[0009] Based on the wavelength drift, determining the curvature of each of the preset points;

[0010] Performing interpolation processing on the points between every two preset points according to the curvature of the preset points to obtain the curvature of the entire fiber grating;

[0011] Based on the curvature of the entire fiber grating, the deformation of the offshore thin-film photovoltaic structure is determined to monitor the deformation of the offshore thin-film photovoltaic structure.

[0012] According to a second aspect, the present invention provides a deformation monitoring device for an offshore thin-film photovoltaic structure, comprising:

[0013] An acquisition module, used for acquiring the deformed wavelength values ​​of the fiber Bragg grating at a plurality of preset points of the offshore thin-film photovoltaic system;

[0014] A first data processing module, configured to determine the wavelength drift of the fiber Bragg grating at each of the preset points based on the deformation wavelength value of the fiber Bragg grating;

[0015] A second data processing module, used for determining the curvature of each of the preset points based on the wavelength drift;

[0016] A third data processing module, used for interpolating the points between every two preset points according to the curvature of the preset points to obtain the curvature of the entire fiber Bragg grating;

[0017] The fourth data processing module is used to determine the deformation of the offshore thin-film photovoltaic structure based on the curvature of the entire fiber grating, so as to monitor the deformation of the offshore thin-film photovoltaic structure.

[0018] The embodiment of the present invention provides a deformation monitoring method and device for an offshore thin-film photovoltaic structure. In the offshore thin-film photovoltaic monitoring, the present invention first obtains the deformation wavelength values ​​of the fiber grating at multiple preset points. Based on these values, the wavelength drift of the fiber grating at each preset point is calculated. Next, the curvature of each preset point is determined based on the wavelength drift. Subsequently, for the area between every two preset points, an interpolation algorithm based on the curvature of the preset points is used for processing, so as to obtain the curvature distribution of each point on the entire fiber grating. Finally, based on the curvature information of the entire fiber grating, the actual deformation of the offshore thin-film photovoltaic structure is accurately calculated. Through this whole set of processes, the present invention can realize real-time and accurate detection of the deformation of the offshore thin-film photovoltaic structure, and provide strong support for ensuring the stable operation and safety of the photovoltaic system. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0020] Figure 1 This is a flow chart of a deformation monitoring method for an offshore thin-film photovoltaic structure provided by an embodiment of the present invention;

[0021] Figure 2 is a hardware architecture diagram of an electronic device provided by an embodiment of the present invention;

[0022] Figure 3 This is a structural diagram of a deformation monitoring device for an offshore thin-film photovoltaic structure provided by an embodiment of the present invention;

[0023] Figure 4 A schematic block diagram of an optical fiber shape sensor according to an embodiment is shown;

[0024] Figure 5 A schematic block diagram of an optical fiber shape sensor system according to an embodiment is shown;

[0025] Figure 6 An experimental photographing positioning diagram according to an embodiment is shown;

[0026] Figure 7 A schematic diagram showing a method of the present invention according to an embodiment of the present invention for restoring the deformation of an offshore thin-film photovoltaic structure and comparing it with a photographing positioning structure;

[0027] Figure 8 A schematic diagram showing a structure under test that is a thin-film offshore floating photovoltaic system according to an embodiment is shown. DETAILED DESCRIPTION

[0028] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0029] Please refer to Figure 1 The embodiment of the present invention provides a deformation monitoring method for an offshore thin-film photovoltaic structure, the method comprising:

[0030] Step 100: Obtaining the deformed wavelength values ​​of the fiber Bragg grating at a plurality of preset points of offshore thin-film photovoltaics;

[0031] Step 102: determining the wavelength drift of the fiber Bragg grating at each preset point based on the deformed wavelength value of the fiber Bragg grating;

[0032] Step 104: determining the curvature of each preset point based on the wavelength drift;

[0033] Step 106: interpolating the points between every two preset points according to the curvature of the preset points to obtain the curvature of the entire fiber Bragg grating;

[0034] Step 108: Determine the deformation of the offshore thin-film photovoltaic structure based on the curvature of the entire fiber Bragg grating.

[0035] In this embodiment, in the monitoring of offshore thin-film photovoltaics, the present invention first obtains the deformation wavelength values ​​of the fiber grating at multiple preset points through the fiber shape sensor. Based on these values, the wavelength drift of the fiber grating at each preset point is calculated. Next, the curvature of each preset point is determined based on the wavelength drift. Subsequently, for the area between every two preset points, an interpolation algorithm based on the curvature of the preset points is used for processing, so as to obtain the curvature distribution of each point on the entire fiber grating. Finally, based on the curvature information of the entire fiber grating, the actual deformation of the offshore thin-film photovoltaic structure is accurately calculated. Through this whole set of processes, the present invention can realize real-time and accurate detection of the deformation of the offshore thin-film photovoltaic structure, and provide strong support for ensuring the stable operation and safety of the photovoltaic system.

[0036] In this embodiment, the wavelength drift of the fiber Bragg grating can be determined by subtracting the initial wavelength value of the fiber Bragg grating from the deformed wavelength value of the fiber Bragg grating. Those skilled in the art can customize the initial wavelength value of the fiber Bragg grating according to actual usage.

[0037] In one embodiment of the present invention, under constant temperature conditions, the curvature of the preset point is determined by the following formula:

[0038]

[0039] Where K is the curvature, h is the distance between the FBG structure of the fiber grating and the neutral layer of the fiber shape sensor, Δλ B is the wavelength shift, λ B is the initial wavelength of the fiber Bragg grating, P 11 is the longitudinal elastic coefficient of the optical fiber, P 12 is the transverse elastic coefficient of the optical fiber, ν is the Poisson's ratio of the optical fiber material, and n eff is the effective refractive index of the optical fiber.

[0040] In this embodiment, those skilled in the art can customize the distance between the FBG structure of the fiber Bragg grating and the neutral layer of the fiber shape sensor, the longitudinal elastic coefficient of the fiber, the transverse elastic coefficient of the fiber, the material Poisson's ratio of the fiber and the effective refractive index of the fiber according to actual usage, and the curvature can be accurately solved by the above formula.

[0041] In one embodiment of the present invention, when under variable temperature conditions, the curvature of the preset point is determined by the following formula:

[0042]

[0043] Where K is the curvature, h is the distance between the FBG structure of the fiber grating and the neutral layer of the fiber shape sensor, Δλ B is the wavelength shift, λ B is the initial wavelength of the fiber Bragg grating, P 11 is the longitudinal elastic coefficient of the optical fiber, P 12 is the transverse elastic coefficient of the optical fiber, ν is the Poisson's ratio of the optical fiber material, and n eff is the effective refractive index of the optical fiber, α is the thermal expansion coefficient, ξ is the thermo-optical coefficient, and ΔT is the temperature change.

[0044] In this embodiment, those skilled in the art can customize the distance between the FBG structure of the fiber Bragg grating and the neutral layer of the fiber shape sensor, the longitudinal elastic coefficient of the fiber, the transverse elastic coefficient of the fiber, the material Poisson's ratio of the fiber, the effective refractive index of the fiber, the thermal expansion coefficient, the thermo-optical coefficient, and the temperature change according to actual use. The influence of the temperature change on the curvature added to the above formula can improve the accuracy of calculating the curvature under the condition of variable temperature, thereby improving the accuracy of determining the deformation of the offshore thin-film photovoltaic structure.

[0045] In one embodiment of the present invention, the interpolation process includes one of the following processing modes:

[0046] Linear interpolation processing;

[0047] Hermite interpolation processing;

[0048] Cubic spline interpolation processing.

[0049] In this embodiment, linear interpolation processing: This method is based on the curvature of two adjacent preset points, and estimates the curvature of the points between them through a linear function. This method is simple and direct. According to the principle that two points determine a straight line, a linear change relationship is constructed between the curvatures of the two points, so as to obtain the approximate curvature of other points between the two points. Hermite interpolation processing: This method not only considers the curvature value of the preset points, but also incorporates the curvature change trend (i.e., derivative value) at these points. By constructing a polynomial that meets the conditions of specific function values ​​and derivative values, the curvature interpolation calculation is performed on the points between the two preset points, so that the interpolation result is more accurate and detailed in reflecting the curvature change. Cubic spline interpolation processing: It divides the entire fiber grating into several small segments according to the preset points, and uses a cubic polynomial for interpolation on each small segment. This method requires that at each preset point, not only the function value (i.e., curvature) must be continuous, but its first-order derivative and second-order derivative must also be continuous. In this way, it can be ensured that the curvature distribution of the entire fiber grating is smoother, more reasonable, and more in line with actual physical changes.

[0050] In one embodiment of the present invention, the deformation of the offshore thin-film photovoltaic structure is determined based on the curvature of the entire fiber Bragg grating, including:

[0051] According to the curvature of the entire fiber Bragg grating, the coordinates of each point on the entire fiber Bragg grating in the space coordinate system are determined;

[0052] Based on the coordinates of each point on the entire fiber Bragg grating in the space coordinate system, the deformation of the offshore thin-film photovoltaic structure is determined.

[0053] In this embodiment, in the process of analyzing the deformation of the offshore thin-film photovoltaic structure, after obtaining the curvature of the entire fiber Bragg grating, the coordinates of each point on the entire fiber Bragg grating in the spatial coordinate system can be determined by means of the two-dimensional discrete format of the Frenet-Serret equation. The Frenet-Serret equation originally describes the geometric properties of a curve in three-dimensional space, but through reasonable simplification and discretization, the present invention can apply it to two-dimensional situations. Specifically, the present invention is based on a series of discrete preset points on the fiber Bragg grating, and regards the entire fiber Bragg grating as a broken line formed by connecting these discrete points in sequence.

[0054] Assuming that the coordinates of the starting point of the fiber Bragg grating are known, starting from the starting point, according to the curvature information between two adjacent points, the two-dimensional discrete format of the Freynard-Schrell equation is used for iterative calculation. For two adjacent discrete points, the local curvature of the curve connecting the two points can be determined according to the magnitude of the curvature. Using this curvature, combined with the coordinates of the previous point in the spatial coordinate system, and the tangent vector of the curve and other information, through specific mathematical calculations (for example, calculating the angle change according to the curvature, and then updating the tangent vector direction according to the angle change, and then determining the coordinate offset of the next point), the coordinates of the next point in the spatial coordinate system can be calculated. Repeating the above steps continuously, starting from the starting point, recursively calculating point by point, the coordinates of all points on the entire fiber Bragg grating in the spatial coordinate system can be determined in turn. Connecting the coordinates of each point on the entire fiber Bragg grating in the spatial coordinate system can determine the deformation of the offshore thin-film photovoltaic structure.

[0055] like Figure 4 and 5 As shown, in this embodiment, firstly, a two-dimensional optical fiber shape sensor is made based on the optical fiber shape restoration algorithm. The optical fiber shape sensor uses a spring steel sheet as a substrate, and its size is 660*10*0.5mm (length*width*thickness). The customized bare optical fiber is bonded to the steel sheet in a pre-stretched state, and then coated with epoxy resin glue for protection. abcde are the positions of 5 grating regions. The curvature of these 5 points is determined by reading the wavelength drift of the 5 grating regions. The method of the present invention (algorithm restoration in the figure) restores the shape information of the shape sensor.

[0056] like Figure 6 and Figure 7 As shown, in this embodiment, the two-dimensional fiber optic shape sensor is manufactured, and its accuracy needs to be verified by testing. The fiber optic shape sensor is fixed in four shapes on the experimental platform, and the accuracy of the algorithm is verified by taking pictures and positioning. The shape restoration algorithm based on the cubic spline interpolation method has significantly improved the accuracy of restoring the four shapes. Among them, the root mean square error values ​​of shapes one, two, three and four are 0.0523, 0.0578, 0.0732 and 0.0849. The error is within the expected range of the experiment, which verifies that the method of the present invention can accurately restore the deformed shape of the offshore thin-film photovoltaic structure.

[0057] like Figure 8As shown, in this embodiment, the structure to be measured is a thin-film offshore floating photovoltaic system, which is mainly composed of a photovoltaic module (4), a hydroelastic membrane (2), a buoyancy ring (1), a communication line (6), a cable, an anchor, an inverter and a transformer. Among them, the hydroelastic membrane provides a platform for installing a photovoltaic module, and the lightweight photovoltaic module is installed on the hydroelastic membrane or integrated with the hydroelastic membrane. The edge of the hydroelastic membrane is fixed on the inner ring of the buoyancy ring. The buoyancy ring is responsible for providing most of the buoyancy of the entire system, so that the flexible film floats on the free water surface, and also acts as a protective wall to prevent waves from hitting the membrane and the photovoltaic module platform. Extreme environmental loads act on the entire platform structure mainly to cause deformation of the hydroelastic membrane. Now the two-dimensional optical fiber shape sensor is glued to the hydroelastic membrane in the thin-film photovoltaic structure or consolidated by other means to ensure that the hydroelastic membrane and the optical fiber two-dimensional optical fiber shape sensor can be deformed in coordination with the overall structure when subjected to external force loads. The optical fiber sensing network installed in it senses the deformation and modulates it into a change in the central wavelength. The fiber grating demodulator obtains the change in the central wavelength and transmits it to the computer. Through signal processing, algorithm calculation, image processing and other steps, the thin-film photovoltaic structure is finally displayed in real time on the computer screen.

[0058] like Figure 2 , Figure 3 As shown, an embodiment of the present invention provides a deformation monitoring and measuring device for an offshore thin-film photovoltaic structure. The device embodiment can be implemented by software, or by hardware or a combination of software and hardware. From the hardware level, Figure 2 As shown, it is a hardware architecture diagram of an electronic device in which a deformation monitoring and measuring device for an offshore thin-film photovoltaic structure provided by an embodiment of the present invention is located. Figure 2 In addition to the processor, memory, network interface, and non-volatile memory shown, the electronic device in the embodiment may also include other hardware, such as a forwarding chip responsible for processing messages, etc. Taking software implementation as an example, Figure 3 As shown, as a device in a logical sense, the CPU of the electronic device in which it is located reads the corresponding computer program in the non-volatile memory into the internal memory and runs it.

[0059] like Figure 3 As shown, this embodiment provides a deformation monitoring and measuring device for an offshore thin-film photovoltaic structure, the device comprising:

[0060] An acquisition module 300 is used to acquire the deformed wavelength values ​​of the fiber Bragg grating at a plurality of preset points of the offshore thin-film photovoltaic system;

[0061] A first data processing module 302 is used to determine the wavelength drift of the fiber Bragg grating at each of the preset points based on the deformation wavelength value of the fiber Bragg grating;

[0062] A second data processing module 304 is used to determine the curvature of each of the preset points based on the wavelength drift;

[0063] The third data processing module 306 is used to perform interpolation processing on the points between every two preset points according to the curvature of the preset points to obtain the curvature of the entire fiber Bragg grating;

[0064] The fourth data processing module 308 is used to determine the deformation of the offshore thin-film photovoltaic structure based on the curvature of the entire fiber Bragg grating, so as to perform deformation monitoring on the offshore thin-film photovoltaic structure.

[0065] In one embodiment of the present invention, under constant temperature conditions, the curvature of the preset point is determined by the following formula:

[0066]

[0067] Where K is the curvature, h is the distance between the FBG structure of the fiber grating and the neutral layer of the fiber shape sensor, Δλ B is the wavelength shift, λ B is the initial wavelength of the fiber Bragg grating, P 11 is the longitudinal elastic coefficient of the optical fiber, P 12 is the transverse elastic coefficient of the optical fiber, ν is the Poisson's ratio of the optical fiber material, and n eff is the effective refractive index of the optical fiber.

[0068] In one embodiment of the present invention, when under variable temperature conditions, the curvature of the preset point is determined by the following formula:

[0069]

[0070] Where K is the curvature, h is the distance between the FBG structure of the fiber grating and the neutral layer of the fiber shape sensor, Δλ B is the wavelength shift, λ B is the initial wavelength of the fiber Bragg grating, P 11 is the longitudinal elastic coefficient of the optical fiber, P 12 is the transverse elastic coefficient of the optical fiber, ν is the Poisson's ratio of the optical fiber material, and n eff is the effective refractive index of the optical fiber, α is the thermal expansion coefficient, ξ is the thermo-optical coefficient, and ΔT is the temperature change.

[0071] In one embodiment of the present invention, the interpolation processing includes one of the following processing modes:

[0072] Linear interpolation processing;

[0073] Hermite interpolation processing;

[0074] Cubic spline interpolation processing.

[0075] In one embodiment of the present invention, the fourth data processing module is used to perform the following steps:

[0076] Determining the coordinates of each point on the entire fiber grating in the space coordinate system according to the curvature of the entire fiber grating;

[0077] Based on the coordinates of each point on the entire fiber grating in the space coordinate system, the deformation of the offshore thin-film photovoltaic structure is determined.

[0078] It is to be understood that the structure illustrated in the embodiment of the present invention does not constitute a specific limitation on a deformation monitoring and measuring device for an offshore thin-film photovoltaic structure. In other embodiments of the present invention, a deformation monitoring and measuring device for an offshore thin-film photovoltaic structure may include more or fewer components than shown in the figure, or combine certain components, or split certain components, or arrange the components differently. The components shown in the figure may be implemented in hardware, software, or a combination of software and hardware.

[0079] The information interaction, execution process and other contents between the modules in the above-mentioned device are based on the same concept as the embodiment of the method of the present invention. For the specific contents, please refer to the description in the embodiment of the method of the present invention, and no further description is given here.

[0080] It should be noted that, in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0081] A person of ordinary skill in the art can understand that all or part of the steps of implementing the above method embodiments can be completed by hardware related to program instructions, and the aforementioned program can be stored in a computer-readable storage medium. When the program is executed, it executes the steps of the above method embodiments; and the aforementioned storage medium includes: ROM, RAM, magnetic disk or optical disk, etc., various media that can store program codes.

[0082] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A deformation monitoring method for an offshore thin-film photovoltaic structure, characterized in that: The method is applied to offshore thin-film photovoltaics, and the method comprises: Obtaining the deformed wavelength values ​​of the fiber grating at a plurality of preset points of the offshore thin-film photovoltaic system; Determining the wavelength drift of the fiber grating at each of the preset points based on the deformation wavelength value of the fiber grating; Based on the wavelength drift, determining the curvature of each of the preset points; Performing interpolation processing on the points between every two preset points according to the curvature of the preset points to obtain the curvature of the entire fiber grating; Based on the curvature of the entire fiber grating, the deformation of the offshore thin-film photovoltaic structure is determined to monitor the deformation of the offshore thin-film photovoltaic structure.

2. The method according to claim 1, characterized in that When under constant temperature conditions, the curvature of the preset point is determined by the following formula: Where K is the curvature, h is the distance between the FBG structure of the fiber grating and the neutral layer of the fiber shape sensor, Δλ B is the wavelength shift, λ B is the initial wavelength of the fiber Bragg grating, P 11 is the longitudinal elastic coefficient of the optical fiber, P 12 is the transverse elastic coefficient of the optical fiber, ν is the Poisson's ratio of the optical fiber material, and n eff is the effective refractive index of the optical fiber.

3. The method according to claim 1, characterized in that When under variable temperature conditions, the curvature of the preset point is determined by the following formula: Where K is the curvature, h is the distance between the FBG structure of the fiber grating and the neutral layer of the fiber shape sensor, Δλ B is the wavelength shift, λ B is the initial wavelength of the fiber Bragg grating, P 11 is the longitudinal elastic coefficient of the optical fiber, P 12 is the transverse elastic coefficient of the optical fiber, ν is the Poisson's ratio of the optical fiber material, and n eff is the effective refractive index of the optical fiber, α is the thermal expansion coefficient, ξ is the thermo-optical coefficient, and ΔT is the change in temperature.

4. The method according to claim 1, characterized in that: The interpolation process includes one of the following processing modes: Linear interpolation processing; Hermite interpolation processing; Cubic spline interpolation processing.

5. The method according to claim 4, characterized in that The method of determining the deformation of the offshore thin-film photovoltaic structure based on the curvature of the entire fiber grating comprises: Determining the coordinates of each point on the entire fiber grating in the space coordinate system according to the curvature of the entire fiber grating; Based on the coordinates of each point on the entire fiber grating in the space coordinate system, the deformation of the offshore thin-film photovoltaic structure is determined.

6. A deformation monitoring device for an offshore thin-film photovoltaic structure, characterized in that: include: An acquisition module, used for acquiring the deformed wavelength values ​​of the fiber Bragg grating at a plurality of preset points of the offshore thin-film photovoltaic system; A first data processing module, configured to determine the wavelength drift of the fiber Bragg grating at each of the preset points based on the deformation wavelength value of the fiber Bragg grating; A second data processing module, used for determining the curvature of each of the preset points based on the wavelength drift; A third data processing module, used for performing interpolation processing on the points between every two preset points according to the curvature of the preset points to obtain the curvature of the entire fiber Bragg grating; The fourth data processing module is used to determine the deformation of the offshore thin-film photovoltaic structure based on the curvature of the entire fiber grating, so as to monitor the deformation of the offshore thin-film photovoltaic structure.

7. The device according to claim 6, characterized in that When under constant temperature conditions, the curvature of the preset point is determined by the following formula: Where K is the curvature, h is the distance between the FBG structure of the fiber grating and the neutral layer of the fiber shape sensor, Δλ B is the wavelength shift, λ B is the initial wavelength of the fiber Bragg grating, P 11 is the longitudinal elastic coefficient of the optical fiber, P 12 is the transverse elastic coefficient of the optical fiber, ν is the Poisson's ratio of the optical fiber material, and n eff is the effective refractive index of the optical fiber.

8. The device according to claim 6, characterized in that When under variable temperature conditions, the curvature of the preset point is determined by the following formula: Where K is the curvature, h is the distance between the FBG structure of the fiber grating and the neutral layer of the fiber shape sensor, Δλ B is the wavelength shift, λ B is the initial wavelength of the fiber Bragg grating, P 11 is the longitudinal elastic coefficient of the optical fiber, P 12 is the transverse elastic coefficient of the optical fiber, ν is the Poisson's ratio of the optical fiber material, and n eff is the effective refractive index of the optical fiber, α is the thermal expansion coefficient, ξ is the thermo-optical coefficient, and ΔT is the temperature change.

9. The device according to claim 6, characterized in that The interpolation process includes one of the following processing modes: Linear interpolation processing; Hermite interpolation processing; Cubic spline interpolation processing.

10. The device according to claim 9, characterized in that The method of determining the deformation of the offshore thin-film photovoltaic structure based on the curvature of the entire fiber grating comprises: Determining the coordinates of each point on the entire fiber grating in the space coordinate system according to the curvature of the entire fiber grating; Based on the coordinates of each point on the entire fiber grating in the space coordinate system, the deformation of the offshore thin-film photovoltaic structure is determined.

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