Double-crystal-oscillator vibration testing device

Abstract

The invention belongs to the technical field of crystal oscillators, and particularly discloses a double crystal oscillator vibration testing device which comprises a first crystal oscillator, a second crystal oscillator and a base. Wherein the first crystal oscillator is connected with the base in a welding manner to form a first electrical loop; the second crystal oscillator is connected with the base in a welding manner to form a second electrical loop; and the base is fixed on a vibration device in a mechanical assembly mode and is electrically connected with a test system so as to carry out vibration test on the first crystal oscillator and the second crystal oscillator.

Description

Technical Field

[0001] The invention belongs to the technical field of crystal oscillators, and in particular relates to a dual crystal oscillator vibration testing device. Background Art

[0002] The vibration resistance of electronic components is an important indicator to measure the performance of an electronic component. Components with poor vibration resistance will bring many uncontrollable variables when working in a vibration environment, which will directly affect the operation of the entire system and even cause system failure. Improving the vibration resistance of electronic components is crucial to ensure the normal operation of electronic systems. Therefore, it is very necessary to conduct a vibration test on the crystal oscillator, which is an important test for space application devices. Traditional vibration tests generally involve welding a single crystal oscillator on a DIP14 ceramic base, and can only test a single crystal oscillator. Due to the large number of test products for the vibration test, the test clamping process is cumbersome and the test efficiency is low. In order to solve the above problems, the present invention designs a dual crystal oscillator vibration test device, so that two SMD5032 crystal oscillators can be assembled on a DIP14 ceramic base, which optimizes the vibration test process and improves the vibration test efficiency. Summary of the invention

[0003] The invention provides a dual crystal oscillator vibration test device, which is used to solve the problem that the test device in the traditional crystal oscillator vibration monitoring test can only test a single crystal oscillator, thus causing low test efficiency.

[0004] The present invention provides a dual crystal vibration test device, the device comprising:

[0005] A first crystal oscillator, a second crystal oscillator and a base;

[0006] Wherein, the first crystal oscillator is connected to the base by welding to form a first electrical circuit;

[0007] The second crystal oscillator is connected to the base by welding to form a second electrical circuit;

[0008] The base is fixed on the vibration device by mechanical assembly and is electrically connected to the test system to perform vibration test on the first crystal oscillator and the second crystal oscillator.

[0009] A dual crystal oscillator vibration test device provided by an embodiment of the present invention realizes the function of simultaneously assembling two SMD5032 crystal oscillators on a DIP14 ceramic base for vibration monitoring test by improving the structural design of the test device, thereby reducing the test cost and improving the test efficiency.

[0010] Other features and advantages of the present invention will be described in the following description, and partly become apparent from the description, or be understood by practicing the present invention. The purpose and other advantages of the present invention can be realized and obtained by the structures particularly pointed out in the written description, claims, and drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0012] Figure 1 A schematic structural diagram of a dual crystal oscillator vibration testing device provided according to an embodiment of the present invention;

[0013] Reference numerals:

[0014] A101, first SMD5032 crystal oscillator; B102, second SMD5032 crystal oscillator; 103, DIP14 ceramic base. DETAILED DESCRIPTION

[0015] In order to make the purpose, technical solutions and advantages of this specification more clear, the technical solutions of this specification will be clearly and completely described below in combination with the specific embodiments of this specification and the corresponding drawings. Obviously, the described embodiments are only part of the embodiments of this specification, not all of the embodiments. Based on the embodiments in this specification, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this specification.

[0016] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, device, product or equipment that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or equipment.

[0017] The technical solutions provided by the embodiments of this specification are described in detail below in conjunction with the accompanying drawings.

[0018] In order to improve the vibration monitoring efficiency of a crystal oscillator, an embodiment of the present invention provides a dual crystal oscillator vibration testing device.

[0019] Figure 1 FIG. 1 is a schematic diagram of a dual crystal vibration test device according to an embodiment of the present invention. Figure 1 , the device comprises:

[0020] A first crystal oscillator, a second crystal oscillator and a base;

[0021] Wherein, the first crystal oscillator is connected to the base by welding to form a first electrical circuit;

[0022] The second crystal oscillator is connected to the base by welding to form a second electrical circuit;

[0023] The base is fixed on the vibration device by mechanical assembly and is electrically connected to the test system to perform vibration test on the first crystal oscillator and the second crystal oscillator.

[0024] In a specific embodiment,

[0025] The models of the first crystal oscillator and the second crystal oscillator are both SMD5032 crystal oscillators;

[0026] The model of the base is a DIP14 ceramic base.

[0027] In a specific embodiment,

[0028] The DIP14 ceramic base 103 supplies power to the first SMD5032 crystal oscillator A101 and the second SMD5032 crystal oscillator A102 at the same time, and uses the first frequency output terminal and the second frequency output terminal to output the frequency signals of the first SMD5032 crystal oscillator and the second SMD5032 crystal oscillator respectively.

[0029] In a specific embodiment,

[0030] The frequency signals of the first SMD5032 crystal oscillator and the second SMD5032 crystal oscillator are respectively transmitted to the test system, so that the test system can monitor the frequency output signals of the first SMD5032 crystal oscillator and the second SMD5032 crystal oscillator in real time online during the vibration experiment to determine whether the test requirements are met.

[0031] In a specific embodiment,

[0032] The pins of the testing device include pin #1, pin #2, pin #3 and pin #4;

[0033] The pin connection of the test device adopts the DIP14 crystal oscillator electrical connection method, where:

[0034] The 2# pin is used for grounding;

[0035] The 4# pin is used for power supply;

[0036] The 1# pin is used to output the frequency signal of the first SMD5032 crystal oscillator;

[0037] The 3# pin is used to output the frequency signal of the second SMD5032 crystal oscillator.

[0038] In a specific embodiment,

[0039] The base has an area of ​​20.8 mm×13.1 mm; the area of ​​a single SMD5032 crystal oscillator is 5.0 mm×3.1 mm.

[0040] It should be noted that the vibration monitoring test device commonly used at present generally welds a single crystal oscillator on a DIP14 ceramic base, and can only test a single crystal oscillator. However, the area of ​​the DIP14 ceramic base is 20.8mm×13.1mm, while the area of ​​the SMD5032 crystal oscillator is only 5.0mm×3.1mm, which is a great waste of the surface utilization of the DIP14 ceramic base, and also provides a possibility to assemble two SMD5032 crystal oscillators on a DIP14 ceramic base.

[0041] A dual crystal oscillator vibration test device provided by the present invention breaks through the constraint that only one crystal oscillator can be mounted on a single DIP14 base in traditional vibration tests, improves the efficiency of vibration tests, and reduces the cost of tests. A unique DIP14 base is designed on which two SMD5032 crystal oscillators can be placed side by side, so that the two crystal oscillators can be subjected to vibration tests at the same time. Through the application of the present invention, the cost of tests can be greatly reduced and the efficiency of tests can be improved.

[0042] Although the preferred embodiments of the present invention have been described, those skilled in the art may make additional changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including the preferred embodiments and all changes and modifications that fall within the scope of the present invention.

[0043] Obviously, those skilled in the art can make various changes and modifications to the present invention without departing from the spirit and scope of the present invention. Thus, if these modifications and variations of the present invention fall within the scope of the claims of the present invention and their equivalents, the present invention is also intended to include these modifications and variations.

Claims

1. A dual crystal vibration test device, characterized in that: The device comprises: A first crystal oscillator, a second crystal oscillator and a base; Wherein, the first crystal oscillator is connected to the base by welding to form a first electrical circuit; The second crystal oscillator is connected to the base by welding to form a second electrical circuit; The base is fixed on the vibration device by mechanical assembly and is electrically connected to the test system to perform vibration test on the first crystal oscillator and the second crystal oscillator.

2. The device according to claim 1, characterized in that The models of the first crystal oscillator and the second crystal oscillator are both SMD5032 crystal oscillators; The model of the base is a DIP14 ceramic base.

3. The device according to claim 2, characterized in that The DIP14 ceramic base supplies power to the first SMD5032 crystal oscillator and the second SMD5032 crystal oscillator at the same time, and uses the first frequency output terminal and the second frequency output terminal to output the frequency signals of the first SMD5032 crystal oscillator and the second SMD5032 crystal oscillator respectively.

4. The device according to claim 3, characterized in that The frequency signals of the first SMD5032 crystal oscillator and the second SMD5032 crystal oscillator are respectively transmitted to the test system, so that the test system can monitor the frequency output signals of the first SMD5032 crystal oscillator and the second SMD5032 crystal oscillator in real time online during the vibration experiment to determine whether the test requirements are met.

5. The device according to claim 4, characterized in that The pins of the testing device include pin #1, pin #2, pin #3 and pin #4; The pin connection of the test device adopts the DIP14 crystal oscillator electrical connection method, where: The 2# pin is used for grounding; The 4# pin is used for power supply; The 1# pin is used to output the frequency signal of the first SMD5032 crystal oscillator; The 3# pin is used to output the frequency signal of the second SMD5032 crystal oscillator.

6. The device according to claim 1, characterized in that The base has an area of ​​20.8 mm×13.1 mm; the area of ​​a single SMD5032 crystal oscillator is 5.0 mm×3.1 mm.

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