Device and experimental method for correcting symmetrical discharge defect imaging observation deviation

Abstract

The invention relates to a device for correcting symmetrical discharge defect imaging observation deviation and an experimental method. The device comprises a bearing structure for bearing a corresponding structure; the monitoring structure is provided with a defect model, a reference imager and a correction imager; the angle control structure is used for rotating and adjusting the defect model so as to adjust the monitoring distance and the monitoring angle between the reference imager and the defect model and between the correction imager and the defect model; and the adjustment control structure is used for correcting and adjusting the correction imager and adjusting the shielding degree between the correction imager and the defect model. The device provided by the invention can simulate differences and change rules of ultraviolet imaging monitoring results under the combined action of different monitoring distances, angles, positions and shielding degrees; in the device provided by the invention, the reference imager is rigidly connected with the defect model, so that the relative position of the reference imager and the defect model can be kept unchanged when the angle of the defect model is adjusted, and the influence of an experimental operation process on a correction result is avoided.

Description

Technical Field

[0001] The invention relates to the field of ultraviolet imaging monitoring and operation maintenance of partial discharge of a converter valve, and in particular to a device and an experimental method for correcting imaging observation deviation of symmetrical discharge defects. Background Art

[0002] At present, the importance of DC transmission technology in the power system is gradually increasing, and the number of applications of important circulating equipment such as converter valves is steadily increasing. However, converter valves are prone to partial discharge defects, which may lead to equipment failure or even shutdown. Therefore, the monitoring and diagnosis of partial discharge of converter valves is of great significance to improving the stability of power grid operation. Ultraviolet imaging technology can monitor partial discharge by capturing ultraviolet light signals emitted during partial discharge. This technology has the characteristics of high sensitivity, strong positioning ability, and high technical maturity. It has been widely used in the operation and maintenance of other types of power transmission and transformation equipment in the power grid. However, converter valves generally work in unmanned inspection valve halls. Due to the large number of converter valve equipment inside the valve hall and the complex electric field environment, the requirements for the layout of monitoring equipment are relatively stringent. Therefore, under limited monitoring points, it is difficult to ensure that the ultraviolet imaging equipment fully covers each converter valve. In addition, the position and direction of partial discharge of converter valves are random. The monitoring results of ultraviolet imaging will be affected by distance and angle, and there may even be occlusion problems.

[0003] In summary, in order to ensure the accuracy and reliability of the ultraviolet imaging monitoring and diagnosis results of partial discharge of converter valves, it is necessary to provide an experimental device and experimental method to correct factors such as ultraviolet imaging monitoring distance, angle and occlusion degree. Summary of the invention

[0004] In view of the above problems, a device and an experimental method for correcting the deviation of ultraviolet imaging observation of symmetrical discharge defects are provided, aiming to improve the accuracy and reliability of monitoring partial discharge of converter valve hall equipment.

[0005] The specific technical solutions are as follows:

[0006] A first aspect of the present invention is to provide a device for correcting the imaging observation deviation of symmetrical discharge defects, comprising:

[0007] A bearing structure, used for bearing a corresponding structure;

[0008] Monitoring structure with defect model, reference imager and correction imager;

[0009] An angle control structure for rotating and adjusting the defect model to adjust the monitoring distance and monitoring angle between the reference imager and the correction imager and the defect model; and

[0010] The control structure is adjusted to correct and adjust the correction imager and adjust the occlusion degree between the correction imager and the defect model.

[0011] Furthermore, the bearing structure at least includes a bearing platform.

[0012] Furthermore, the angle control structure includes a control swing arm, which is rotatably mounted on the bearing platform, and the defect model is mounted on the control swing arm.

[0013] Furthermore, the defect model is installed on one end of the control swing arm, and the reference imager is installed on the other end of the control swing arm.

[0014] Furthermore, the defect model includes two discharge rods and two discharge electrodes. The discharge rods are installed on the control swing arm at intervals, and the discharge electrodes are respectively arranged on the side walls opposite to the discharge rods.

[0015] Furthermore, the defect model also includes two top voltage-equalizing rings and two side voltage-equalizing rings. The top voltage-equalizing rings are installed on the top of the discharge rod, and the side voltage-equalizing rings are respectively arranged on the other side walls of the discharge rod that are opposite to each other.

[0016] Furthermore, the discharge rod is made of epoxy resin material, and the discharge electrode, the top voltage-equalizing ring and the side voltage-equalizing ring are made of aluminum alloy material.

[0017] Furthermore, the adjustment control structure includes a three-axis sliding table, a shielding slide rail and a shielding plate. The X-axis sliding table in the three-axis sliding table is installed on the bearing structure, the correction imager is installed on the Z-axis sliding table in the three-axis sliding table, the shielding slide rail is installed on the X-axis sliding table, and the shielding plate is installed on the shielding slide rail. The shielding plate can slide back and forth along the shielding slide rail.

[0018] The second aspect of the present invention is to provide an experimental method for correcting the imaging observation deviation of symmetrical discharge defects, comprising:

[0019] Connecting the output end of the high-voltage DC power supply to the defect model so that the defect model emits an optical signal;

[0020] The correction imager and the reference imager are corrected to zero;

[0021] Adjust the corrective imager according to the monitoring distance and / or the monitoring angle and / or the degree of occlusion;

[0022] The correction imager and the reference imager are used to record data, and the data difference between the reference imager and the correction imager is compared to obtain the correction coefficient.

[0023] Furthermore, the correction and zeroing method is: adjusting the monitoring distance and / or the monitoring angle and / or the degree of occlusion so that the monitoring results of the reference imager and the correction imager are consistent, that is, the correction imager and the reference imager are corrected to zero.

[0024] The beneficial effects of the above scheme are:

[0025] 1) The device provided by the present invention can simulate the difference and change law of ultraviolet imaging monitoring results under the combined effects of different monitoring distances, angles, positions and shielding degrees;

[0026] 2) In the device provided by the present invention, the reference imager is rigidly connected to the defect model, and the relative position of the reference imager and the defect model can be kept unchanged when the angle of the defect model is adjusted, thereby avoiding the influence of the experimental operation process on the correction result and improving the accuracy and reliability of the correction result;

[0027] 3) The device provided by the present invention can ensure that the reference imager and the correction imager work synchronously and monitor the optical signal of the defect model, avoid the influence of the temporal mutation and randomness of local discharge on the correction result, and ensure the controllability, accuracy and reproducibility of the experimental results. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a schematic diagram of the structure of the device provided in an embodiment of the present invention;

[0029] Figure 2 A schematic diagram of the structure of a defect model provided in an embodiment of the present invention;

[0030] Figure 3 A schematic diagram of the structure of the adjustment control structure provided in an embodiment of the present invention;

[0031] Figure 4 It is a schematic diagram of the use of the device provided in the embodiment of the present invention.

[0032] In the attached drawings: 10, defect model; 101, discharge rod; 102, discharge electrode; 103, top equalizing ring; 104, side equalizing ring; 20, reference imager; 30, correction imager; 40, carrying platform; 50, control swing arm; 60, three-axis slide table; 601, X-axis slide table; 602, Z-axis slide table; 603, Y-axis slide table; 70, shielding slide rail; 80, shielding plate. DETAILED DESCRIPTION

[0033] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0034] It should be noted that, in the absence of conflict, the embodiments of the present invention and the features in the embodiments may be combined with each other.

[0035] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, but they are not intended to limit the present invention.

[0036] like Figures 1 to 4 As shown, the device for correcting the ultraviolet imaging observation deviation of symmetrical discharge defects provided in the embodiment of the present invention includes a bearing structure, a monitoring structure, an angle control structure and an adjustment control structure; the bearing structure is used to bear the corresponding structure; the monitoring structure has a defect model 10, a reference imager 20 and a correction imager 30; the angle control structure is used to rotate and adjust the defect model 10, so as to adjust the monitoring distance and monitoring angle between the reference imager 20 and the correction imager 30 and the defect model 10; the adjustment control structure is used to correct and adjust the correction imager 30, and adjust the degree of occlusion between the correction imager 30 and the defect model 10.

[0037] As a specific example, Figure 1 , Figure 4 As shown, the above-mentioned bearing structure at least includes a bearing platform 40, and the above-mentioned bearing platform 40 can be used to support auxiliary structures such as a monitoring structure, an angle control structure, and an adjustment control structure.

[0038] As a specific example, Figure 1 , Figure 2 , Figure 4 As shown, the angle control structure includes a control swing arm 50, which is rotatably mounted on a carrying platform 40, and the defect model 10 is mounted on the control swing arm 50; under the above structure, the reference imager 20 can be fixedly mounted on the carrying platform 40, and when the control swing arm 50 is rotated, the monitoring distance and monitoring angle between the defect model 10 on the control swing arm 50 and the reference imager 20 change.

[0039] Taking into account the randomness and uncertainty of the local discharge phenomenon of the defect model 10, the results obtained when imaging and monitoring the defect model 10 at different times may not be comparable. Therefore, in this embodiment, the reference imager 20 can be further installed on the control swing arm 50, so that the reference imager 20 can rotate together with the defect model 10 to ensure that the relative positions of the two remain unchanged. Under this structure, the light signal emitted by the defect model 10 remains vertically irradiated on the reference imager 20. The advantage of this approach is that it avoids changes in the monitoring conditions of the reference imager 20 when adjusting the experimental conditions, ensuring that the correction results under different experimental conditions are consistent, and can simplify the functional structure of the distance control and monitoring position and occlusion degree control mechanism 3, thereby improving the stability of the device and the reproducibility of the correction results.

[0040] As a specific example, Figure 1 , Figure 2 As shown, the defect model 10 comprises two discharge rods 101 and two discharge electrodes 102. The discharge rod 10 is mounted on the control swing arm 50, and the discharge electrodes 102 are respectively arranged on the side walls of the discharge rods 101 on the opposite sides. Under the above structure, the output end and the ground end of the high-voltage DC power supply are respectively connected to the two discharge rods 101, and the output voltage is adjusted to generate electricity and emit optical signals between the two discharge rods 101. It should be noted that, as Figure 2 As shown, in order to make the external electric field uniform and prevent discharge from occurring outside the discharge rod 101, two top grading rings 103 and two side grading rings 104 may be installed on the top and side of the discharge rod 10. In the present invention, the discharge rod 101 is made of insulating material such as epoxy resin material, and the discharge electrode 102, the top grading ring 103 and the side grading ring 104 are made of aluminum alloy material to restore the actual converter valve material.

[0041] As a specific example, Figure 1 , Figure 3 , Figure 4 As shown, the above-mentioned adjustment control structure includes a three-axis sliding table 60, a shielding slide rail 70 and a shielding plate 80. The X-axis sliding table 601 in the three-axis sliding table 60 is installed on the bearing structure, the correction imager 30 is installed on the Z-axis sliding table 602 in the three-axis sliding table 60, the shielding slide rail 70 is installed on the X-axis sliding table 601, and the shielding plate 80 is installed on the shielding slide rail 70. The shielding plate 80 can slide back and forth along the shielding slide rail 70; under the above-mentioned structure, after the defect model 10 is rotated and adjusted, the monitoring distance can be adjusted by cooperating with the X-axis sliding table 601 and the Y-axis sliding table 603, and then the shielding plate 80 and / or the Z-axis sliding table 602 can be slid to adjust the monitoring angle.

[0042] The experimental method utilizing the above-mentioned device in the present invention is:

[0043] Connecting the output end of the high-voltage DC power supply to the defect model 10, so that the defect model 10 emits an optical signal;

[0044] Adjust the monitoring distance and / or monitoring angle and / or shielding degree so that the monitoring results of the reference imager 20 and the correction imager 30 are consistent, that is, the correction imager 30 and the reference imager 20 are corrected to zero;

[0045] Adjust the correction imager 30 according to the monitoring distance and / or the monitoring angle and / or the degree of occlusion;

[0046] The correction imager 30 and the reference imager 20 record data, such as the spot area, the number of photons, etc., and compare the data difference between the reference imager 20 and the correction imager 30 to obtain the correction coefficient.

[0047] The above are only preferred embodiments of the present invention, and are not intended to limit the implementation methods and protection scope of the present invention. Those skilled in the art should be aware that all solutions obtained by equivalent substitutions and obvious changes made using the description and illustrations of the present invention should be included in the protection scope of the present invention.

Claims

1. A device for correcting the imaging observation deviation of symmetrical discharge defects, characterized in that: include: A bearing structure, used for bearing a corresponding structure; Monitoring structure with defect model, reference imager and correction imager; An angle control structure, used for rotating and adjusting the defect model, so as to adjust the monitoring distance and monitoring angle between the reference imager and the correction imager and the defect model; as well as The adjustment control structure is used to correct and adjust the correction imager and adjust the degree of occlusion between the correction imager and the defect model.

2. The device for correcting the imaging observation deviation of symmetrical discharge defects according to claim 1, characterized in that: The bearing structure at least includes a bearing platform.

3. The device for correcting the imaging observation deviation of symmetrical discharge defects according to claim 2, characterized in that: The angle control structure comprises a control swing arm which is rotatably mounted on the bearing platform, and the defect model is mounted on the control swing arm.

4. The device for correcting the imaging observation deviation of symmetrical discharge defects according to claim 2 or 3, characterized in that: The defect model is installed on one end of the control swing arm, and the reference imager is installed on the other end of the control swing arm.

5. The device for correcting the imaging observation deviation of symmetrical discharge defects according to claim 4, characterized in that: The defect model includes two discharge rods and two discharge electrodes. The discharge rods are installed on the control swing arm at intervals, and the discharge electrodes are respectively arranged on the side walls opposite to the discharge rods.

6. The device for correcting the imaging observation deviation of symmetrical discharge defects according to claim 5, characterized in that: The defect model also includes two top voltage-equalizing rings and two side voltage-equalizing rings. The top voltage-equalizing rings are correspondingly installed on the top of the discharge rod, and the side voltage-equalizing rings are correspondingly arranged on the other side walls of the discharge rod that are away from each other.

7. The device for correcting the imaging observation deviation of symmetrical discharge defects according to claim 6, characterized in that: The discharge rod is made of epoxy resin material, and the discharge electrode, the top voltage equalizing ring and the side voltage equalizing ring are made of aluminum alloy material.

8. The device for correcting the imaging observation deviation of symmetrical discharge defects according to claim 1, characterized in that: The adjustment control structure includes a three-axis sliding table, a shielding slide rail and a shielding plate. The X-axis sliding table of the three-axis sliding table is installed on the bearing structure, the correction imager is installed on the Z-axis sliding table of the three-axis sliding table, the shielding slide rail is installed on the X-axis sliding table, the shielding plate is installed on the shielding slide rail, and the shielding plate can slide back and forth along the shielding slide rail.

9. An experimental method for correcting the imaging observation deviation of symmetrical discharge defects, characterized in that: The device for correcting the imaging observation deviation of symmetrical discharge defects according to any one of claims 1 to 8 comprises: Connecting the output end of the high-voltage DC power supply to the defect model so that the defect model emits an optical signal; The correction imager and the reference imager are corrected to zero; Adjust the corrective imager according to the monitoring distance and / or the monitoring angle and / or the degree of occlusion; The correction imager and the reference imager are used to record data, and the data difference between the reference imager and the correction imager is compared to obtain a correction coefficient.

10. The dual-channel partial discharge defect imaging observation deviation correction method according to claim 9, characterized in that: The correction and zeroing method is: adjusting the monitoring distance and / or monitoring angle and / or occlusion degree to make the monitoring results of the reference imager and the correction imager consistent, that is, the correction imager and the reference imager are corrected to zero.

Images