Chip testing equipment

Abstract

The invention discloses chip testing equipment, relates to the technical field of chip testing, and can realize limiting of a chip grabbing mechanism and prevent a chip from being crushed by a suction head. The invention discloses chip testing equipment which comprises a rack, a plurality of testing plates, a chip storage disc, a chip grabbing mechanism and a testing jig. The test board is used for testing the performance of the chip. And the chip storage disc is arranged on the rack. The chip storage disc is used for storing chips to be detected and detected chips. The chip grabbing mechanism is arranged on the rack. The chip grabbing mechanism comprises a supporting frame, a translation frame, a sliding seat and a grabbing assembly. The grabbing assembly is driven by an air cylinder. And when the chip grabbed by the grabbing assembly is in contact with the test station on the test plate, the cylinder is in the maximum output stroke. By measuring and calculating the maximum stroke of the air cylinder, the maximum stroke of the chip grabbing mechanism after grabbing the chip is that the chip is just placed on the test position on the test fixture, and a test plate can be prevented from being crushed by unstable stroke of the air cylinder.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and in particular to a chip testing device. Background Art

[0002] Current chip testing equipment generally has the problem of insufficient positioning accuracy of the gripping mechanism. When using a cylinder-driven suction device to transport chips, there is a risk of crushing the chip or damaging the test board due to imprecise stroke control, which greatly increases the hidden cost of production. Summary of the invention

[0003] The purpose of the present invention is to solve at least one of the technical problems existing in the prior art and to provide a chip testing device that can achieve the limit of the chip grabbing mechanism and prevent the suction head from crushing the chip.

[0004] A chip testing device according to an embodiment of the present invention comprises a rack, a plurality of test boards, a chip storage tray, a chip grabbing mechanism and a test fixture, wherein the plurality of test boards are arranged on the rack, and the test boards are used to test chip performance; the chip storage tray is arranged on the rack, and the chip storage tray is used to store chips to be tested and chips after testing; the chip grabbing mechanism is arranged on the rack, and the chip grabbing mechanism comprises a supporting frame, a translation frame, a sliding seat and a grabbing assembly, wherein the supporting frame is arranged on the rack and is located on both sides of the plurality of test boards, the translation frame is slidably arranged on the supporting frame along the X-axis, the translation frame is located above the plurality of test boards, the sliding seat is slidably arranged on the translation frame along the Y-axis, the grabbing assembly is liftably arranged on the sliding seat, the grabbing assembly is driven by a cylinder, and when the grabbing assembly grabs the chip and contacts the test station on the test board, the cylinder is at the maximum output stroke; the test fixture is arranged on the test board, and the test fixture is used to clamp the chip to complete the test.

[0005] At least the following beneficial effects are achieved: a chip testing device includes a rack, a plurality of test boards, a chip storage tray, a chip grabbing mechanism and a test fixture. A plurality of test boards are arranged on the rack. The test boards are used to test chip performance. The chip storage tray is arranged on the rack. The chip storage tray is used to store chips to be tested and chips after testing. The chip grabbing mechanism is arranged on the rack. The chip grabbing mechanism includes a support frame, a translation frame, a sliding seat and a grabbing assembly. The support frame is arranged on the rack and is located on both sides of a plurality of test boards. The translation frame is slidably arranged on the support frame along the X-axis. The translation frame is located above a plurality of test boards. The sliding seat is slidably arranged on the translation frame along the Y-axis. The grabbing assembly is liftably arranged on the sliding seat. The grabbing assembly is driven by a cylinder. When the grabbing assembly grabs the chip and contacts the test station on the test board, the cylinder is at the maximum output stroke. The test fixture is arranged on the test board. The test fixture is used to clamp the chip to complete the test. By measuring the maximum stroke of the cylinder and selecting a support frame of suitable height, the maximum stroke of the chip grabbing mechanism after grabbing the chip is achieved to just place the chip on the test position on the test fixture, which can avoid the situation where the cylinder stroke is unstable and easily crushes the test board.

[0006] According to some embodiments of the present invention, the grabbing assembly includes a mounting plate, a lifting cylinder, a lifting seat, a negative pressure suction head and a fixture unlocking kit, the mounting plate is arranged on the sliding seat, the lifting cylinder is arranged on the mounting plate, the lifting seat is connected to the output end of the lifting cylinder, the lifting cylinder is used to drive the lifting seat to lift and lower, the negative pressure suction head is arranged on the lifting seat, the negative pressure suction head is used to suck the chip, the fixture unlocking kit is arranged on the lifting seat, the fixture unlocking kit rises and falls with the lifting seat, and the fixture unlocking kit can be inserted into and unlock the test fixture.

[0007] According to some embodiments of the present invention, the test fixture includes a fixture base plate, a clamping bracket, a clamping plate, a torsion spring and a protective plate. The fixture base plate is arranged on the test board. A through slot is provided in the middle of the fixture base plate. The through slot corresponds to the test position of the test board. A chip can be accommodated in the through slot. The clamping bracket is arranged on the fixture base plate. There are two groups of clamping brackets, and the two groups of clamping brackets are respectively located on both sides of the through slot. There are two clamping plates, and the two clamping plates are respectively hinged to the two clamping brackets. The clamping plate includes a clamping end and an unlocking end. The clamping end can press the chip toward the through slot. The torsion spring connects the clamping bracket and the clamping plate, and the torsion spring drives the clamping end to press toward the through slot.

[0008] According to some embodiments of the present invention, the jig unlocking kit includes a plurality of guide posts, a plurality of return springs, a movable plate and an unlocking plug plate, the plurality of guide posts are arranged on the lifting seat, the movable plate is slidably arranged on the guide posts, a protrusion is provided at the lower end of the guide post to prevent the movable plate from detaching from the guide post, the return spring is sleeved on the guide post, one end of the return spring abuts against the lifting seat, and the other end abuts against the movable plate, the unlocking plug plate is arranged on the movable plate, and the unlocking plug plate can press the unlocking end when it moves downward to lift the clamping end.

[0009] According to some embodiments of the present invention, an unlocking avoidance groove is provided on the jig bottom plate, and the unlocking avoidance groove is used to avoid the unlocking end.

[0010] According to some embodiments of the present invention, the chip grabbing mechanism further includes a stroke adjustment component, the stroke adjustment component is connected to the grabbing component, and the stroke adjustment component is used to adjust the limit distance of the negative pressure suction head.

[0011] According to some embodiments of the present invention, the stroke adjustment assembly includes a mounting column, a sleeve, a sliding pin and a locking column, the mounting column is arranged on the lifting seat, the sleeve is movably sleeved on the mounting column, a plurality of fixing holes are provided on the sleeve, and the plurality of fixing holes are evenly distributed along the circumference of the sleeve, the sleeve is provided with a sliding groove, the sliding groove is a spiral long groove, the sliding pin is inserted in the mounting column, the sliding pin slides freely in the sliding groove, the diameter of the sliding pin is equal to the groove width of the sliding groove, and a plurality of locking screw holes are provided on the mounting column, the plurality of locking screw holes are divided into two groups, the two groups of locking screw holes are respectively evenly arranged along the circumference of the mounting column, the number of locking screw holes in each group is equal to the number of fixing holes, the locking column passes through the fixing hole and is screwed in the locking screw hole, and the two groups of locking screw holes have different lengths from the end of the mounting column.

[0012] According to some embodiments of the present invention, the locking column includes a threaded end and a knob end, and a surface of the knob end is provided with knurling.

[0013] According to some embodiments of the present invention, the chip storage tray is provided with a plurality of chip placement slots, and the chip placement slots are provided with material removal avoidance slots on both sides. The chip placement slots are used to accommodate chips, and the material removal avoidance slots are used to avoid the unlocking plug plate. According to some embodiments of the present invention, a curved surface is provided at the lower end of the unlocking plug plate.

[0014] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The present invention is further described below in conjunction with the accompanying drawings and embodiments; Figure 1 The structure of the preferred embodiment of the present invention is shown in FIG. Figure 1 ; Figure 2 The structure of the preferred embodiment of the present invention is shown in FIG. Figure 2 (omit the outer shell); Figure 3 The structure of the preferred embodiment of the present invention is shown in FIG. Figure 3 (Omit the housing and rack); Figure 4 This is a schematic diagram of the structure of a grabbing assembly in a preferred embodiment of the present invention; Figure 5 This is a structural schematic diagram of a stroke adjustment assembly of a preferred embodiment of the present invention; Figure 6 It is a cross-sectional view of a stroke adjustment assembly of a preferred embodiment of the present invention; Figure 7 This is a schematic diagram of the structure of the installation column of a preferred embodiment of the present invention; Figure 8 This is a schematic structural diagram of a sleeve in a preferred embodiment of the present invention; Fig. 9 This is a schematic diagram of the structure of a test board and a chip storage tray in a preferred embodiment of the present invention; Fig.10 for Fig. 9 A partial enlarged view of the middle A; Fig.11 for Fig. 9 A partial enlarged view of point B in the middle; Fig.12 The structure of the test fixture of the preferred embodiment of the present invention is shown in FIG. Figure 1 ; Fig.13 A cross-sectional view of a test fixture according to a preferred embodiment of the present invention Fig.14 The structure of the test fixture of the preferred embodiment of the present invention is shown in FIG. Figure 2 ; Fig.15 for Fig.14 A partial enlarged view of point C in the middle; Reference numerals: Rack 10; A number of test panels 20; Chip storage tray 30, chip placement slot 31, material removal avoidance slot 32; Chip grabbing mechanism 40; Support frame 41, translation frame 42, sliding seat 43, grab assembly 44, mounting plate 441, lifting cylinder 442, lifting seat 443, negative pressure suction head 444, fixture unlocking kit 445, guide column 445a, return spring 445b, movable plate 445c, unlocking plug plate 445d, stroke adjustment assembly 45, mounting column 451, locking screw hole 451a, sleeve 452, fixing hole 452a, slide groove 452b, sliding pin 453, locking column 454, threaded end 454a, knob end 454b, Test fixture 50 , fixture bottom plate 51 , through slot 511 , unlocking avoidance slot 512 , clamping bracket 52 , clamping plate 53 , clamping end 531 , unlocking end 532 , torsion spring 54 , and protective plate 55 . DETAILED DESCRIPTION

[0016] In the description of the present invention, it should be understood that descriptions involving orientations, such as up, down, front, back, left, right, etc., and orientations or positional relationships indicated are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0017] In the description of the present invention, if there is a description of first and second, it is only for the purpose of distinguishing the technical features, and cannot be understood as indicating or implying the relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.

[0018] In the description of the present invention, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in the present invention based on the specific content of the technical solution.

[0019] Reference Figures 1 to 15A chip testing device includes a rack 10, a plurality of test boards 20, a chip storage tray 30, a chip grabbing mechanism 40 and a test fixture 50. A plurality of test boards 20 are arranged on the rack 10. The test boards 20 are used to test chip performance. The chip storage tray 30 is arranged on the rack 10. The chip storage tray 30 is used to store chips to be tested and chips after testing. The chip grabbing mechanism 40 is arranged on the rack 10. The chip grabbing mechanism 40 includes a support frame 41, a translation frame 42, a sliding seat 43 and a grabbing assembly 44. The support frame 41 is arranged on the rack 10 and is located on both sides of the plurality of test boards 20. The translation frame 42 is slidably arranged on the support frame 41 along the X-axis. The translation frame 42 is located above the plurality of test boards 20. The sliding seat 43 is slidably arranged on the translation frame 42 along the Y-axis. The grabbing assembly 44 is arbitrarily arranged on the sliding seat 43. The grabbing assembly 44 is driven by a cylinder. When the grabbing assembly 44 grabs the chip and contacts the test station on the test board 20, the cylinder is at the maximum output stroke. The test fixture 50 is arranged on the test board 20. The test fixture 50 is used to clamp the chip to complete the test.

[0020] It is worth noting that by measuring the maximum stroke of the cylinder and selecting a support frame 41 of suitable height, the maximum stroke of the chip grasping mechanism 40 after grasping the chip is achieved to just place the chip on the test position on the test fixture 50, which can avoid the situation where the cylinder stroke is unstable and easily crushes the test board 20 to the greatest extent.

[0021] It should be noted that the sliding of the translation frame 42 along the Y-axis direction and the sliding of the sliding seat 43 along the X-axis direction are driven by two sets of driving devices, and the driving devices can be driven by motors with screws, or linear motors and other devices.

[0022] It should be noted that the X-axis direction and the Y-axis direction described in the text are the directions in the accompanying drawings of the specification. Figure 2 The X-axis direction and Y-axis direction shown in the coordinate system.

[0023] Reference Figure 4 The grab assembly 44 includes a mounting plate 441, a lifting cylinder 442, a lifting seat 443, a negative pressure suction head 444 and a fixture unlocking kit 445. The mounting plate 441 is arranged on the sliding seat 43. The lifting cylinder 442 is arranged on the mounting plate 441. The lifting seat 443 is connected to the output end of the lifting cylinder 442. The lifting cylinder 442 is used to drive the lifting seat 443 to move up and down. The negative pressure suction head 444 is arranged on the lifting seat 443. The negative pressure suction head 444 is used to suck the chip. The fixture unlocking kit 445 is arranged on the lifting seat 443. The fixture unlocking kit 445 moves up and down with the lifting seat 443. The fixture unlocking kit 445 can be inserted into and unlock the test fixture 50.

[0024] It is understandable that the chip can be positioned by the test fixture 50 , and the chip can also be pressed tightly against the test position of the test board 20 , thereby preventing poor contact from affecting the chip test.

[0025] Reference Figures 12 to 15 The test fixture 50 includes a fixture base plate 51, a clamping bracket 52, a clamping plate 53, a torsion spring 54 and a protective plate 55. The fixture base plate 51 is arranged on the test board 20. A through slot 511 is provided in the middle of the fixture base plate 51. The through slot 511 corresponds to the test position of the test board 20. The chip can be accommodated in the through slot 511. The clamping bracket 52 is arranged on the fixture base plate 51. There are two groups of clamping brackets 52. The two groups of clamping brackets 52 are respectively located on both sides of the through slot 511. There are two clamping plates 53. The two clamping plates 53 are respectively hinged to the two clamping brackets 52. The clamping plate 53 includes a clamping end 531 and an unlocking end 532. The clamping end 531 can press the chip toward the through slot 511. The torsion spring 54 connects the clamping bracket 52 and the clamping plate 53. The torsion spring 54 drives the clamping end 531 to press toward the through slot 511.

[0026] It is understandable that, after the chip is placed in the through slot 511, the pressing end 531 can press the chip onto the test board to avoid test errors caused by poor contact. Pressing the unlocking end 532 can cause the pressing end 531 to tilt up to achieve unlocking.

[0027] Reference Figure 4 The jig unlocking kit 445 includes a plurality of guide posts 445a, a plurality of return springs 445b, a movable plate 445c and an unlocking plug plate 445d. The plurality of guide posts 445a are arranged on the lifting seat 443. The movable plate 445c is slidably arranged on the guide posts 445a. A protrusion is arranged at the lower end of the guide posts 445a to prevent the movable plate 445c from detaching from the guide posts 445a. The return spring 445b is sleeved on the guide posts 445a. One end of the return spring 445b abuts against the lifting seat 443, and the other end abuts against the movable plate 445c. The unlocking plug plate 445d is arranged on the movable plate 445c. The unlocking plug plate 445d moves downward to press the unlocking end 532 so that the pressing end 531 is lifted.

[0028] It should be noted that when the unlocking plug 445d is inserted into the test fixture 50 for unlocking, in order to avoid interference between the fixture unlocking kit 445 and the protective plate 55 and to block the downward movement of the negative pressure suction head 444, when the unlocking plug 445d presses down the unlocking end 532, the movable plate 445c will rise along the guide column 445a under the reaction force. When the unlocking plug 445d is separated from the unlocking end 532, the reset spring 445b drives the movable plate 445c to reset.

[0029] Reference Figures 12 to 15 The fixture bottom plate 51 is provided with an unlocking avoidance groove 512. The unlocking avoidance groove 512 is used to avoid the unlocking end 532.

[0030] It can be understood that the unlocking avoidance groove 512 can prevent the unlocking end 532 from being blocked when rotating.

[0031] It should be noted that, in the embodiment of the present invention, the working process of the test fixture 50 is as follows: The chip grabbing mechanism 40 moves to the top of the chip storage tray 30, and then the lifting cylinder 442 drives the lifting seat 443 to descend until the negative pressure suction head 444 absorbs the chip, and then the lifting cylinder 442 drives the lifting seat 443 to rise, and then drives the translation frame 42 and the sliding seat 43 through the driving mechanism, so that the grabbing assembly 44 is located directly above the test board 20, and then the lifting cylinder 442 drives the lifting seat 443 to descend, so that the unlocking plug plate 445d presses down the unlocking end 532, and then the pressing end 531 is tilted under the drive of the unlocking end 532. At this time, the chip located on the negative pressure suction head 444 is no longer blocked by the pressing end 531, and the lifting cylinder 442 continues to drive the lifting seat 443 to descend until the maximum stroke of the lifting cylinder 442 is reached, and the chip is just located in the through groove 511. Then the lifting cylinder 442 drives the lifting seat 443 to rise, the unlocking plug plate 445d gradually rises, and the torsion spring 54 drives the pressing end 531 to press the chip for testing.

[0032] Reference Figures 4 to 8 The chip grabbing mechanism 40 further includes a stroke adjustment component 45. The stroke adjustment component 45 is connected to the grabbing component 44. The stroke adjustment component 45 is used to adjust the limit distance of the negative pressure suction head 444.

[0033] Reference Figures 4 to 8 , the stroke adjustment assembly 45 includes a mounting column 451, a sleeve 452, a sliding pin 453 and a locking column 454. The mounting column 451 is arranged on the lifting seat 443. The sleeve 452 is movably sleeved on the mounting column 451. A plurality of fixing holes 452a are provided on the sleeve 452. The plurality of fixing holes 452a are evenly distributed along the circumference of the sleeve 452. A sliding groove 452b is provided on the sleeve 452. The sliding groove 452b is a spiral long groove. The sliding pin 453 is inserted into the mounting column 451. The sliding pin 453 slides freely in the sliding groove 452b. The diameter of the sliding pin 453 is equal to the groove width of the sliding groove 452b. A plurality of locking screw holes 451a are provided on the mounting column 451. The plurality of locking screw holes 451a are divided into two groups. The two groups of locking screw holes 451a are evenly arranged along the circumference of the mounting column 451. The number of each set of locking screw holes 451a is equal to the number of fixing holes 452a. The locking column 454 passes through the fixing holes 452a and is screwed into the locking screw holes 451a. The two sets of locking screw holes 451a have different lengths from the end of the mounting column 451.

[0034] It is understandable that when it is necessary to test chips with different thickness specifications, the locking column 454 can be unscrewed, the sleeve 452 can be rotated, and the sliding pin 453 can slide into the guide in the slide groove 452b, so that the relative position of the sleeve 452 and the mounting column 451 changes, thereby being suitable for testing chips of other specifications.

[0035] In some embodiments of the present invention, when the sleeve 452 rotates 67.5 degrees, the limit position of the negative pressure suction head 444 can be changed by 1 mm, thereby achieving testing of chips with different thickness specifications.

[0036] Reference Figures 4 to 8 The locking column 454 includes a threaded end 454a and a knob end 454b. The knob end 454b is provided with knurling on its surface.

[0037] It is understandable that the provision of the knob end 454b can facilitate unscrewing the locking column 454 when the chip specification needs to be changed.

[0038] Reference Fig.11 The chip storage tray 30 is provided with a plurality of chip placement slots 31. Both sides of the chip placement slots 31 are provided with material removal avoidance slots 32. The chip placement slots 31 are used to accommodate chips. The material removal avoidance slots 32 are used to avoid the unlocking plug plate 445d.

[0039] Reference Figure 4 The lower end of the unlocking plug plate 445d is provided with a curved surface.

[0040] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0041] Of course, the present invention is not limited to the above-mentioned embodiments, and those skilled in the art may make equivalent modifications or substitutions without violating the spirit of the present invention, and these equivalent modifications or substitutions are all included in the scope defined by the claims of this application.

Claims

1. A chip testing device, characterized in that: include: Rack (10); a plurality of test boards (20), wherein the plurality of test boards (20) are arranged on the rack (10), and the test boards (20) are used to test chip performance; A chip storage tray (30), the chip storage tray (30) being arranged on the rack (10), the chip storage tray (30) being used to store chips to be tested and chips after testing; A chip grabbing mechanism (40), the chip grabbing mechanism (40) being arranged on the frame (10), the chip grabbing mechanism (40) comprising a support frame (41), a translation frame (42), a sliding seat (43) and a grabbing assembly (44), the support frame (41) being arranged on the frame (10) and being located on both sides of the plurality of test boards (20), the translation frame (42) being slidably arranged on the support frame (41) along an X-axis, the translation frame (42) being located above the plurality of test boards (20), the sliding seat (43) being slidably arranged on the translation frame (42) along a Y-axis, the grabbing assembly (44) being liftably arranged on the sliding seat (43), the grabbing assembly (44) being driven by a cylinder, and when the grabbing assembly (44) grabs a chip and contacts a test station on the test board (20), the cylinder is at a maximum output stroke; A test fixture (50), wherein the test fixture (50) is arranged on the test board (20), and the test fixture (50) is used to clamp a chip to complete a test.

2. A chip testing device according to claim 1, characterized in that: The gripping assembly (44) comprises a mounting plate (441), a lifting cylinder (442), a lifting seat (443), a negative pressure suction head (444) and a fixture unlocking kit (445); the mounting plate (441) is arranged on the sliding seat (43); the lifting cylinder (442) is arranged on the mounting plate (441); the lifting seat (443) is connected to the output end of the lifting cylinder (442); the lifting cylinder (442) is used to drive the lifting seat (443) to move up and down; the negative pressure suction head (444) is arranged on the lifting seat (443); the negative pressure suction head (444) is used to suck up a chip; the fixture unlocking kit (445) is arranged on the lifting seat (443); the fixture unlocking kit (445) moves up and down with the lifting seat (443); and the fixture unlocking kit (445) can be inserted into and unlock the test fixture (50).

3. A chip testing device according to claim 2, characterized in that: The test fixture (50) comprises a fixture base plate (51), a clamping bracket (52), a clamping plate (53), a torsion spring (54) and a protective plate (55); the fixture base plate (51) is arranged on the test board (20); a through slot (511) is provided in the middle of the fixture base plate (51); the through slot (511) corresponds to a test position of the test board (20); a chip can be accommodated in the through slot (511); the clamping bracket (52) is arranged on the fixture base plate (51); the clamping bracket (52) is in two groups; the two groups of the clamping brackets (52) are provided on the fixture base plate (51); The clamping brackets (52) are respectively located on both sides of the through slot (511), and there are two clamping plates (53). The two clamping plates (53) are respectively hinged to the two clamping brackets (52), and the clamping plate (53) comprises a clamping end (531) and an unlocking end (532). The clamping end (531) can press the chip toward the through slot (511). The torsion spring (54) connects the clamping bracket (52) and the clamping plate (53), and the torsion spring (54) drives the clamping end (531) to press toward the through slot (511).

4. A chip testing device according to claim 3, characterized in that: The jig unlocking kit (445) comprises a plurality of guide posts (445a), a plurality of return springs (445b), a movable plate (445c) and an unlocking plug plate (445d). The plurality of guide posts (445a) are arranged on the lifting seat (443). The movable plate (445c) is slidably arranged on the guide posts (445a). A protrusion is arranged at the lower end of the guide post (445a) to prevent the movable plate (445c) from detaching from the guide post (445a). The return spring (445b) is sleeved on the guide post (445a). One end of the return spring (445b) abuts against the lifting seat (443), and the other end abuts against the movable plate (445c). The unlocking plug plate (445d) is arranged on the movable plate (445c). The unlocking plug plate (445d) moves downward to press the unlocking end (532) so that the pressing end (531) is lifted.

5. A chip testing device according to claim 3, characterized in that: An unlocking avoidance groove (512) is provided on the jig bottom plate (51), and the unlocking avoidance groove (512) is used to avoid the unlocking end (532).

6. A chip testing device according to claim 2, characterized in that: The chip grabbing mechanism (40) further comprises a stroke adjustment component (45), wherein the stroke adjustment component (45) is connected to the grabbing component (44), and the stroke adjustment component (45) is used to adjust the limit distance of the negative pressure suction head (444).

7. A chip testing device according to claim 6, characterized in that: The stroke adjustment component (45) comprises a mounting column (451), a sleeve (452), a sliding pin (453) and a locking column (454); the mounting column (451) is arranged on the lifting seat (443); the sleeve (452) is movably sleeved on the mounting column (451); a plurality of fixing holes (452a) are provided on the sleeve (452); the plurality of fixing holes (452a) are evenly distributed along the circumference of the sleeve (452); a sliding groove (452b) is provided on the sleeve (452); the sliding groove (452b) is a spiral long groove; the sliding pin (453) is inserted into the mounting column (451); the sliding pin (453) is inserted into the mounting column (451); and the sliding pin (453) is inserted into the mounting column (451). The slide groove (452b) slides freely, the diameter of the sliding pin (453) is equal to the groove width of the slide groove (452b), and a plurality of locking screw holes (451a) are opened on the mounting column (451). The plurality of locking screw holes (451a) are divided into two groups. The two groups of locking screw holes (451a) are evenly arranged along the circumference of the mounting column (451), and the number of locking screw holes (451a) in each group is equal to the number of the fixing holes (452a). The locking column (454) passes through the fixing hole (452a) and is screwed in the locking screw hole (451a). The lengths of the two groups of locking screw holes (451a) from the end of the mounting column (451) are different.

8. A chip testing device according to claim 7, characterized in that: The locking column (454) comprises a threaded end (454a) and a knob end (454b), and a surface of the knob end (454b) is provided with knurling.

9. The chip testing device according to claim 4, characterized in that: The chip storage tray (30) is provided with a plurality of chip placement slots (31), and material removal avoidance slots (32) are provided on both sides of the chip placement slots (31). The chip placement slots (31) are used to accommodate chips, and the material removal avoidance slots (32) are used to avoid the unlocking plug plate (445d).

10. The chip testing device according to claim 4, characterized in that: The lower end of the unlocking plug plate (445d) is provided with a curved surface.

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