A method, device, system and medium for handling abnormalities of a high-mounted brake light

Abstract

The present application provides a method, device, system, and medium for handling abnormalities in a high-mounted brake lamp. The method, in a test system constructed based on a high-mounted brake lamp to be tested, performs an initial ripple test on the high-mounted brake lamp to obtain theoretical interference parameters in the ripple corresponding to an abnormal state of the high-mounted brake lamp to be tested; performs a verification ripple test on the high-mounted brake lamp to be tested in an established vehicle environment to obtain actual interference parameters in the ripple corresponding to an abnormal state of the high-mounted brake lamp to be tested; and obtains final interference parameters in the ripple corresponding to the abnormal state of the high-mounted brake lamp based on the theoretical interference parameters and the actual interference parameters.

Description

Technical Field

[0001] The present application relates to the field of vehicle testing technology, and in particular to a method, device, system, and medium for handling abnormalities of a high-mounted brake light. Background Art

[0002] With the development of the automotive industry, vehicle safety performance has received widespread attention. High-mounted brake lights (HBLs) are an effective means of reducing rear-end collisions and improving vehicle safety. However, HBLs are affected by the external environment, causing their brightness to fluctuate and even flicker, posing a serious threat to the lives and health of those involved in the vehicle. Therefore, methods for addressing these brightness fluctuations and flickering are crucial.

[0003] Existing technology has detailed documentation of brightness variations, causes, and treatments for high-mounted brake lights on gasoline-powered vehicles. However, there is no detailed documentation of testing and treatment methods for high-mounted brake lights on new energy vehicles. New energy vehicles differ from gasoline-powered vehicles in their construction, resulting in different parameters affecting high-mounted brake light performance. Therefore, to improve vehicle safety, research is urgently needed to understand the testing methods, causes, and treatments for brightness variations on new energy vehicles. Summary of the Invention

[0004] The present application provides a method, device, system and medium for handling abnormalities of a high-mounted brake light, so as to solve the problems of brightness change and flickering of the high-mounted brake light of new energy vehicles in the prior art.

[0005] In a first aspect, the present application provides a method for handling an abnormality of a high-mounted brake lamp, comprising:

[0006] In a test system built based on the high-mounted brake lamp to be tested, an initial ripple test process is performed on the high-mounted brake lamp to be tested to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0007] In the established vehicle environment, perform verification ripple testing on the high-mounted brake lamp to be tested to obtain the actual interference parameters in the ripple corresponding to the abnormal state of the high-mounted brake lamp to be tested;

[0008] According to the theoretical interference parameters and the actual interference parameters, the final interference parameters in the ripple corresponding to the abnormality of the high-mounted brake light are obtained.

[0009] In one possible implementation, in a test system built based on the high-mounted brake lamp to be tested, an initial ripple test process is performed on the high-mounted brake lamp to be tested to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state, including:

[0010] Controlling a waveform generator and a modulated power supply in the test system to output a plurality of first simulated ripples to the high-mounted brake lamp to be tested, so as to obtain theoretical interference parameters in the ripples corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0011] The waveform generator is connected to a modulated power supply, and the modulated power supply is connected to a high-mounted brake lamp to be tested.

[0012] In one possible implementation, a verification ripple test is performed on the high-mounted brake lamp to be tested in a built vehicle environment to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state, including:

[0013] Controlling a first test point in the vehicle environment to output a plurality of second simulated ripples to the high-mounted brake lamp to be tested, so as to obtain a first actual interference parameter in the ripples corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0014] The first test point is set at the DC-DC converter, and an external signal generator and an external power supply are superimposed on the DC-DC converter as the actual power supply.

[0015] In one possible implementation, a verification ripple test is performed on the high-mounted brake lamp to be tested in a vehicle environment to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state, including:

[0016] Controlling a second test point in the vehicle environment to output a plurality of third simulated ripples to the high-mounted brake lamp to be tested, so as to obtain a second actual interference parameter in the ripples corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0017] The second test point is set at the battery that powers the high-mounted brake lamp to be tested, and an external signal generator and an external power supply are added to the battery as the actual power supply.

[0018] In a possible implementation, the interference parameter includes one or a combination of the following: waveform frequency, amplitude, peak value, deviation value, rise time, and waveform duration.

[0019] In one possible implementation, obtaining, based on the theoretical interference parameter and the actual interference parameter, a final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake light includes:

[0020] If the theoretical interference parameter is consistent with the actual interference parameter, the theoretical interference parameter is used as the final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake light.

[0021] In a second aspect, the present application provides a high-mounted brake light abnormality processing device, comprising:

[0022] a theoretical test module for performing an initial ripple test on the high-mounted brake lamp to be tested in a test system built based on the high-mounted brake lamp to be tested, so as to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0023] The actual test module is used to perform a verification ripple test on the high-mounted brake lamp to be tested in a vehicle environment to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0024] The processing module is used to obtain the final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake light based on the theoretical interference parameter and the actual interference parameter.

[0025] In a third aspect, the present invention provides a high-mounted brake light abnormality handling system, comprising: a high-mounted brake light abnormality handling device, a test system, and a vehicle environment;

[0026] The high-mounted brake light abnormality processing device is used to execute the high-mounted brake light abnormality processing method according to any one of claims 1 to 6.

[0027] In a fourth aspect, the present application provides a high-mounted brake light device, which is provided on a new energy vehicle. The new energy vehicle includes:

[0028] a DC-DC converter, and a battery for powering the high-mounted brake lamp to be tested; wherein the device includes: a first controller, a filter circuit connected to the first controller, a current processing circuit connected to the filter circuit, an LED circuit connected to the current processing circuit, and a second controller connected to the LED circuit;

[0029] The filter circuit includes: a plurality of filter capacitors; wherein the capacitance value of each filter capacitor is set based on the final interference parameter obtained in the abnormality processing method of the high-mounted brake lamp according to any one of claims 1 to 6.

[0030] In a fifth aspect, the present application provides a computer-readable storage medium, comprising: computer-executable instructions are stored in the computer-readable storage medium, and when the computer-executable instructions are executed by a processor, they are used to implement the method according to any one of claims 1 to 6.

[0031] The present application proposes a method, device, system and medium for handling abnormalities of a high-mounted brake light. In a test system constructed based on the high-mounted brake light to be tested, an initial ripple test is performed on the high-mounted brake light to be tested to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake light to be tested is in an abnormal state; in an already constructed whole vehicle environment, a verification ripple test is performed on the high-mounted brake light to be tested to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake light to be tested is in an abnormal state; based on the theoretical interference parameters and the actual interference parameters, the final interference parameters in the ripple corresponding to when the high-mounted brake light is in an abnormal state are obtained. Compared with the existing technology, which is unable to know the interference factors that cause abnormalities in the high-mounted brake lights of new energy vehicles, the present application tests the theoretical interference parameters that cause abnormalities in the high-mounted brake lights of new energy vehicles through a test system, and then further verifies them in the established vehicle environment to obtain the corresponding actual interference parameters, so as to accurately locate the final interference parameters based on the theoretical interference parameters and the actual interference parameters, thereby effectively and conveniently locating the interference parameters that interfere with the abnormalities in the high-mounted brake lights of new energy vehicles, and effectively reducing the impact of the interference parameters on the high-mounted brake lights of new energy vehicles by adding capacitors to form a filtering circuit. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0033] Figure 1 A structural diagram of the test system based on the abnormality handling method for a high-mounted brake light provided in this application;

[0034] Figure 2 A flowchart of a first embodiment of a method for handling an abnormality of a high-mounted brake lamp provided by the present application;

[0035] Figure 3 A flowchart of a second embodiment of a method for handling an abnormality of a high-mounted brake lamp provided in this application;

[0036] Figure 4 A schematic diagram of the structure of a high-mounted brake light vehicle environment provided in this application;

[0037] Figure 5 This is a structural diagram of a first embodiment of a high-mounted brake lamp abnormality processing device provided by the present application;

[0038] Figure 6 This is a structural diagram of a first embodiment of a high-mounted brake light abnormality handling system provided by the present application;

[0039] Figure 7 For this application Figure 7 This is a structural schematic diagram of a high-mounted brake light device provided in this application.

[0040] The above drawings illustrate specific embodiments of the present application, which will be described in more detail below. These drawings and the textual description are not intended to limit the scope of the present application in any way, but rather to illustrate the concepts of the present application to those skilled in the art by reference to specific embodiments. DETAILED DESCRIPTION

[0041] To make the purpose, technical solutions, and advantages of the embodiments of the present application more clear, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments made by ordinary technicians in this field based on the inspiration of these embodiments fall within the scope of protection of this application.

[0042] The terms "first", "second", "third", "fourth", etc. (if any) in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequential order. It should be understood that the numbers used in this way are interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0043] With the development of the automotive industry, the use of high-mounted brake lights (HBLs) can effectively reduce the likelihood of rear-end collisions and improve vehicle safety. However, HBLs are affected by the external environment, causing their brightness to fluctuate and even flicker, seriously affecting the driver's ability to judge road conditions. Consequently, these brightness fluctuations and flickering can potentially cause traffic accidents.

[0044] Existing technology has detailed documentation of brightness variations, flickering, and solutions for high-mounted brake lights on fuel-powered vehicles. However, there are no detailed descriptions of testing and treatment methods for high-mounted brake lights on new energy vehicles. New energy vehicles and fuel-powered vehicles have different structures, and the specific parameters that affect high-mounted brake lights vary. Therefore, applying the technical parameters of fuel-powered vehicles to address brightness variations and flickering on new energy vehicles is not applicable.

[0045] In order to solve the above problems, the concept of the present application is to accurately locate the factors that cause the abnormality of the high-mounted brake light.

[0046] The technical solution of the present application is described in detail below through specific embodiments. It should be noted that the following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described in detail in some embodiments.

[0047] Figure 1 This is a test system structure diagram based on a high-mounted brake light abnormality processing method provided in this application, such as Figure 1 As shown, the test system mainly includes: a waveform generator 101, a power module 102 and a high-mounted brake light 103. The waveform generator can control the wave parameters including but not limited to: waveform frequency, amplitude, peak value, deviation value, rise time and waveform duration.

[0048] Figure 2 This is a flow chart of the first embodiment of a method for handling abnormalities of a high-mounted brake light provided by this application. Figure 2 , the processing method includes:

[0049] Step S201: In a test system built based on the high-mounted brake lamp to be tested, an initial ripple test process is performed on the high-mounted brake lamp to be tested to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state.

[0050] In this embodiment, a test system for a high-mounted brake light is established (specifically, Figure 1 As shown in the figure, in order to make the experimental environment match the actual situation, that is, to ensure that the high-mounted brake light can maintain normal working conditions under normal conditions, for example, the test system can be tested in a shielded room, the indoor temperature of the shielded room can be around 25°C, and the indoor humidity can be below 80%.

[0051] In addition, in order to further match the actual situation, in the test system, an AC superimposed ripple is used to perform an abnormality test on the high-mounted brake lamp to be tested. By changing at least one of the above-mentioned key parameters in the AC superimposed ripple, and outputting the AC superimposed ripple to the high-mounted brake lamp through the waveform generator 101 and the power supply module 102, it is determined whether the high-mounted brake lamp will be in an abnormal state under the ripples of different key parameters, and the key parameters in the ripple corresponding to the abnormal state are used as theoretical interference parameters.

[0052] Step S202: Perform a verification ripple test on the high-mounted brake lamp to be tested in the established vehicle environment to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state.

[0053] In this embodiment, the constructed vehicle environment mainly includes: a battery management system (Battery Management System; BMS for short), a power distribution system (Power Distribution Module) connected to the BMS, a DC-DC converter connected to the power distribution system, and a high-mounted brake light connected to the DC-DC converter.

[0054] By changing at least one of the above-mentioned key parameters in the AC superimposed ripple, the DC-DC converter inputs its corresponding ripple into the high-mounted brake light to determine whether the high-mounted brake light is in an abnormal state under the ripples of different key parameters, and thus the key parameters in the ripple corresponding to the abnormal state are used as actual interference parameters.

[0055] Step S203: Obtain, based on the theoretical interference parameter and the actual interference parameter, a final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake lamp.

[0056] In this embodiment, for example, if the theoretical interference parameter is consistent with the actual interference parameter, the theoretical interference parameter is used as the final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake lamp.

[0057] In this embodiment, an initial ripple test is performed on the high-mounted brake lamp to be tested in a test system built based on the high-mounted brake lamp to be tested to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; then, a verification ripple test is performed on the high-mounted brake lamp to be tested in an already built vehicle environment to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; then, based on the theoretical interference parameters and the actual interference parameters, final interference parameters in the ripple corresponding to when the high-mounted brake lamp is in an abnormal state are obtained. Compared with the prior art in which it is impossible to know the interference factors that cause the abnormality of the high-mounted brake lamp in the new energy vehicle, the present application tests the theoretical interference parameters that cause the abnormality of the high-mounted brake lamp in the new energy vehicle through the test system, and then further verifies them in the already built vehicle environment to obtain the corresponding actual interference parameters, so that based on the theoretical interference parameters and the actual interference parameters, the final interference parameters are accurately located, thereby effectively and conveniently locating the interference parameters that interfere with the abnormality of the high-mounted brake lamp of the new energy vehicle.

[0058] Figure 3 This is a flow chart of the second embodiment of the abnormality handling method for high-mounted brake lights provided by this application. Figure 2 Based on the embodiment shown, see Figure 3 A specific implementation of step S201 is:

[0059] Step S301: Control the waveform generator and the modulated power supply in the test system to output a plurality of first simulated ripples to the high-mounted brake lamp to be tested, so as to obtain theoretical interference parameters in the ripples corresponding to when the high-mounted brake lamp to be tested is in an abnormal state.

[0060] In this embodiment, if Figure 1 As shown, the waveform generator is connected to the modulatory power supply, the modulatory power supply is connected to the high-mounted brake lamp to be tested, the waveform generator and the modulatory power supply in the test system are controlled, and multiple first simulated ripples (i.e., the above-mentioned AC superimposed ripples) are output to the high-mounted brake lamp to be tested, so as to obtain the theoretical interference parameters in the ripples corresponding to the abnormal state of the high-mounted brake lamp to be tested.

[0061] For example, during testing, when the key parameter in the AC superimposed ripple is frequency, the high-mounted brake light shows no noticeable brightness change between 0 and 40 kHz, but begins to change at 40 kHz, indicating an abnormal state. The brightness of the high-mounted brake light changes between 40 kHz and 96 kHz, and flickers at 96 kHz, indicating an abnormal state. Based on this, it can be determined that frequencies between 40 kHz and 96 kHz, including both 40 kHz and 96 kHz, are theoretical interference parameters.

[0062] Accordingly, a specific implementation of step S202 includes:

[0063] Step S302: Control the first test point in the vehicle environment to output a plurality of second simulated ripples to the high-mounted brake lamp to be tested, so as to obtain a first actual interference parameter in the ripples corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0064] The first test point is set at the DC-DC converter, and an external signal generator and an external power supply are superimposed on the DC-DC converter as the actual power supply.

[0065] Optionally, the method may further include:

[0066] Step S303: Control the second test point in the vehicle environment to output a plurality of third simulated ripples to the high-mounted brake lamp to be tested, so as to obtain a second actual interference parameter in the ripples corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0067] The second test point is set at the battery that supplies power to the high-mounted brake lamp to be tested, and an external signal generator and an external power supply are superimposed on the battery as the actual power supply.

[0068] In this embodiment, combined with Figure 4 To illustrate, Figure 4 This is a schematic diagram of the structure of a high-mounted brake light vehicle environment provided by this application, such as Figure 4 As shown, in this vehicle environment, the first test point and the second test point are as follows Figure 4 The corresponding settings are made in (① represents the first test point; ② represents the second test point). Specifically, the first test point is set at the DC-DC converter; the second test point is set at the battery that powers the high-mounted brake lamp to be tested. Multiple second simulated ripples can then be output to the high-mounted brake lamp to be tested at the first test point, and / or multiple third simulated ripples can be output to the high-mounted brake lamp to be tested at the second test point, to test the actual interference parameters corresponding to an abnormal state of the high-mounted brake lamp.

[0069] The abnormal state includes but is not limited to: flickering state and brightness change state, etc. Interference parameters include one or a combination of the following: waveform frequency, amplitude, peak value, deviation value, rise time and waveform duration.

[0070] It should be noted that in this embodiment, in the whole vehicle environment, the test is carried out using the waveform frequency as an example. If the actual interference parameters verified by the test are consistent with the theoretical interference parameters, the theoretical interference parameters can be used as the final interference parameters in the ripple corresponding to the abnormality of the high-mounted brake light.

[0071] In this embodiment, based on the determination of the theoretical interference parameters, the corresponding first test point and / or second test point are set in the whole vehicle environment to test and verify the high-mounted brake light, so as to obtain the actual interference parameters in the whole vehicle environment that is more in line with the actual environment, and then determine the final interference parameters based on the theoretical interference parameters and the actual interference parameters, so as to more effectively and accurately determine the interference parameters that cause the high-mounted brake light to be in an abnormal state, and provide effective guidance for the subsequent resolution of the abnormal state.

[0072] Figure 5 This is a structural diagram of a first embodiment of a high-mounted brake light abnormality processing device provided by this application, as shown in FIG. Figure 5 As shown, the processing device includes: a theoretical testing module 51 , a practical testing module 52 and a processing module 53 .

[0073] Among them, the theoretical test module 51 is used to perform initial ripple test processing on the high-mounted brake lamp to be tested in a test system built based on the high-mounted brake lamp to be tested, so as to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state.

[0074] The actual test module 52 is used to perform a verification ripple test on the high-mounted brake lamp to be tested in a vehicle environment, so as to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state.

[0075] The processing module 53 is configured to obtain, based on the theoretical interference parameter and the actual interference parameter, a final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake lamp.

[0076] In this embodiment, the processing device can perform the above Figure 2 or Figure 3 The implementation principle and benefits of the method shown are similar and will not be described here.

[0077] Figure 6 This is a structural diagram of a first embodiment of a high-mounted brake light abnormality handling system provided by this application, as shown in FIG. Figure 6 As shown, the processing device includes: a high-mounted brake light abnormality processing device 61, a test system 62 and a vehicle environment 63.

[0078] Among them, the abnormal processing device 63 of the high-mounted brake light triggers the test system 62 to use the initial ripple to test the high-mounted brake light to be tested, and obtains the theoretical interference parameters in the ripple corresponding to when the high-mounted brake light is in an abnormal state, and then triggers the whole vehicle environment 63 to continue to use the initial ripple to perform a verification test on the high-mounted brake light to be tested, and obtain the actual interference parameters, and then obtain the final interference parameters based on the theoretical interference parameters and the actual interference parameters.

[0079] The present application also provides a high-mounted brake light device, which is set on a new energy vehicle, and the new energy vehicle includes: a DC-DC converter, and a battery for powering the high-mounted brake light to be tested. For example, Figure 7 A schematic diagram of the structure of a high-mounted brake light device provided in this application is shown as follows: Figure 7 As shown, the device includes: a first controller 701, a filter circuit 702 connected to the first controller 701, a current regulation circuit 703 connected to the filter circuit, an LED circuit 704 connected to the current regulation circuit, and a second controller 705 connected to the LED circuit;

[0080] The filter circuit includes: a plurality of filter capacitors; wherein the capacitance value of each filter capacitor is set based on the final interference parameter obtained in the abnormality handling method of the high-mounted brake light described in the above embodiment. And capacitors C2 and C3 of different values ​​are usually connected in parallel (such as Figure 7 As shown), a resonant relationship is formed to make the voltage lag behind the current, and the entire circuit has capacitance, which enables it to suppress a frequency band when used in the high-mounted brake light.

[0081] For example, when the final interference parameter is an AC superimposed ripple frequency of 96 kHz, the capacitance value of the filter capacitors C2 and C3 connected in parallel is 47 μF.

[0082] An embodiment of the present application also provides a readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the technical solution provided by any of the aforementioned method embodiments is implemented.

[0083] Those skilled in the art will appreciate that all or part of the steps in the above-described method embodiments can be implemented using hardware associated with program instructions. The aforementioned program can be stored in a computer-readable storage medium. When executed, the program performs the steps of the above-described method embodiments. The aforementioned storage medium includes various media capable of storing program code, such as ROM, RAM, magnetic disks, or optical disks.

[0084] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A method for handling abnormalities of a high-mounted brake light, characterized in that: include: In a test system built based on the high-mounted brake lamp to be tested, performing an initial ripple test process on the high-mounted brake lamp to be tested to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; In the established vehicle environment, performing a verification ripple test on the high-mounted brake lamp to be tested to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; According to the theoretical interference parameter and the actual interference parameter, a final interference parameter in the ripple corresponding to when the high-mounted brake lamp is in an abnormal state is obtained.

2. The method according to claim 1, characterized in that The test system constructed based on the high-mounted brake lamp to be tested performs an initial ripple test on the high-mounted brake lamp to be tested to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state, including: controlling a waveform generator and a modulated power supply in the test system to output a plurality of first simulated ripples to the high-mounted brake lamp to be tested, so as to obtain theoretical interference parameters in the ripples corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; Wherein, the waveform generator is connected to the modulatable power supply, and the modulatable power supply is connected to the high-mounted brake lamp to be tested.

3. The method according to claim 2, characterized in that The verification ripple test is performed on the high-mounted brake lamp to be tested in the established vehicle environment to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state, including: controlling a first test point in the vehicle environment to output a plurality of second simulated ripples to the high-mounted brake lamp to be tested, so as to obtain a first actual interference parameter in the ripples corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; The first test point is set at the DC-DC converter, and an external signal generator and an external power supply are superimposed on the DC-DC converter as the actual power supply.

4. The method according to claim 2 or 3, characterized in that The verification ripple test is performed on the high-mounted brake lamp to be tested in a vehicle environment to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state, including: controlling a second test point in the vehicle environment to output a plurality of third simulated ripples to the high-mounted brake lamp to be tested, so as to obtain a second actual interference parameter in the ripples corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; The second test point is set at the battery that supplies power to the high-mounted brake lamp to be tested, and an external signal generator and an external power supply are superimposed on the battery as the actual power supply.

5. The method according to any one of claims 2 to 4, characterized in that: The interference parameters include one or a combination of the following: waveform frequency, amplitude, peak value, deviation value, rise time and waveform duration.

6. The method according to any one of claims 2 to 4, characterized in that: The obtaining, based on the theoretical interference parameter and the actual interference parameter, a final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake lamp includes: If the theoretical interference parameter is consistent with the actual interference parameter, the theoretical interference parameter is used as the final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake lamp.

7. A high-mounted brake light abnormality processing device, characterized in that: include: a theoretical test module, configured to perform an initial ripple test process on the high-mounted brake lamp to be tested in a test system built based on the high-mounted brake lamp to be tested, so as to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; an actual testing module, configured to perform a verification ripple test on the high-mounted brake lamp to be tested in a vehicle environment, so as to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; The processing module is used to obtain, based on the theoretical interference parameter and the actual interference parameter, a final interference parameter in the ripple corresponding to when the high-mounted brake lamp is in an abnormal state.

8. A high-mount brake light abnormality handling system, characterized in that: include: High-mounted brake light abnormality handling device, test system, and vehicle environment; The high-mounted brake light abnormality handling device is used to execute the high-mounted brake light abnormality handling method according to any one of claims 1 to 6.

9. A high-mounted brake light device, characterized in that: The device is provided on a new energy vehicle, the new energy vehicle comprising: a DC-DC converter and a battery for powering the high-mounted brake lamp to be tested; wherein the device comprises: a first controller, a filter circuit connected to the first controller, a current processing circuit connected to the filter circuit, an LED circuit connected to the current processing circuit, and a second controller connected to the LED circuit; The filtering circuit includes: a plurality of filtering capacitors; wherein the capacitance value of each filtering capacitor is set based on the final interference parameter obtained in the abnormality processing method for the high-mounted brake lamp according to any one of claims 1 to 6.

10. A computer-readable storage medium, characterized in that The computer-readable storage medium stores computer-executable instructions, which are used to implement the method according to any one of claims 1 to 6 when executed by a processor.

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