Current output circuit and method of automatic test equipment

Abstract

The invention is suitable for the technical field of semiconductor testing, and provides a current output circuit and method for automatic testing equipment, and the circuit comprises a controller, a power supply integrated chip, and a peripheral circuit. The power supply integrated chip is connected with the peripheral circuit and is used for outputting current; the peripheral circuit is electrically connected with the tested component and is used for loading the output current to the tested component during conduction; the controller is in communication connection with the peripheral circuit and is used for controlling the sampling chip branch to be switched on to load the output current of the power supply integrated chip to the tested component when a target current value is greater than a preset current value, and the target current value represents a current value input by the automatic test equipment to the tested component during testing; the controller is also used for controlling the sampling resistor branch to be switched on when the target current value is smaller than or equal to the preset current, and loading the output current of the power supply integrated chip to the tested assembly. According to the invention, the problem that the current output by automatic test equipment in the prior art cannot meet the high-precision requirement of semiconductor test can be solved.

Description

Technical Field

[0001] The present application belongs to the field of semiconductor testing technology, and in particular, relates to a current output circuit and method for automated testing equipment. Background Art

[0002] During the semiconductor testing process, there are situations where ATE equipment (Automatic Test Equipment) needs to continuously output a relatively large current (hundreds of milliamperes to several amperes). In order to ensure that the actual output current value of the ATE equipment when testing the semiconductor is the target current value required for the semiconductor test, the commonly used ATE output current control method is the hardware circuit negative feedback method, which indirectly achieves the output current value by adjusting the voltage across the sampling resistor to a certain value, so that the actual output current of the ATE equipment is the target current value required for the semiconductor test.

[0003] However, the resistance value of the sampling resistor is not constant. Even if the sampling resistor is calibrated before using the ATE equipment, the actual resistance value of the sampling resistor may still change slightly when the ATE equipment continuously outputs a large current for a long time. The large current actually output by the ATE equipment will also drift unidirectionally as the actual resistance value of the sampling resistor changes. As a result, the current actually output by the ATE equipment is not the target current value required for semiconductor testing, and cannot meet the high-precision requirements of semiconductor testing. Summary of the invention

[0004] The embodiments of the present application provide a current output circuit and method for automated testing equipment, which can solve the problem that when the automated testing equipment tests a semiconductor, a large current is continuously output through a sampling resistor for a long time. Since the actual resistance value of the sampling resistor changes with temperature, the large current actually output by the ATE equipment exhibits a unidirectional continuous drift, which cannot meet the high-precision requirements during semiconductor testing.

[0005] In a first aspect, an embodiment of the present application provides a current output circuit of an automated testing device, comprising: a controller, a power supply integrated chip, and a peripheral circuit; wherein:

[0006] The power supply integrated chip is connected to the peripheral circuit and is used to output current;

[0007] The peripheral circuit is electrically connected to the component under test, and includes a sampling resistor branch and a sampling chip branch, and is used to load the output current of the power supply integrated chip to the component under test when it is turned on;

[0008] The controller is connected in communication with the peripheral circuit, and is used to control the sampling chip branch to be turned on and the sampling resistor branch to be turned off when the target current value is greater than the preset current value, wherein the output current of the power supply integrated chip is loaded to the component under test when the sampling chip branch is turned on, and the target current value represents the current value input by the automated test equipment to the component under test during the test;

[0009] The controller is further configured to control the sampling resistor branch to be turned on and the sampling chip branch to be turned off when the target current value is less than or equal to the preset current, wherein when the sampling resistor branch is turned on, the output current of the power supply integrated chip is loaded to the component under test.

[0010] In a possible implementation manner of the first aspect, the peripheral circuit further includes a first control switch, which is communicatively connected to the controller; an input end of the first control switch is connected to a channel output end of the power supply integrated chip;

[0011] The sampling resistor branch includes a sampling resistor, and a first output end of the sampling resistor is connected to an input end of the component under test; the sampling chip branch includes a sampling chip, and a first output end of the sampling chip is connected to an input end of the component under test;

[0012] The controller is further configured to control the output end of the first control switch to be electrically connected to the first input end of the sampling resistor to conduct the sampling resistor branch when the target current value is less than or equal to the preset current value; and to control the output end of the first control switch to be electrically connected to the first input end of the sampling chip to conduct the sampling chip branch when the target current value is greater than the preset current value.

[0013] In a possible implementation manner of the first aspect, the controller is communicatively connected to the power supply integrated chip, and is further configured to calculate a target calibration current value corresponding to the target current value according to the target current value, pre-stored circuit parameters and calibration parameters, and configure the theoretical output current of the power supply integrated chip to the target calibration current value corresponding to the target current value;

[0014] The power supply integrated chip is also used to output current according to the configured theoretical output current, so that when the current is input to the component under test through the peripheral circuit, the input current of the component under test is the target current value; wherein the circuit parameters are determined based on the own parameters of the power supply integrated chip and the own parameters of the peripheral circuit; and the calibration parameters are obtained after multiple fitting of the theoretical output current of the power supply integrated chip and the input current of the component under test.

[0015] In a possible implementation manner of the first aspect, the circuit parameters include power supply chip parameters of the power supply integrated chip, sampling resistor parameters of the sampling resistor branch, and sampling chip parameters of the sampling chip branch;

[0016] The calibration parameters include a resistance calibration parameter of the sampling resistance branch and a chip calibration parameter of the sampling chip branch;

[0017] The controller is further configured to calculate a target calibration current value corresponding to the target current value according to the target current value, the power supply chip parameters, the sampling resistor parameters and the resistor calibration parameters when the sampling resistor branch is turned on;

[0018] The controller is further configured to calculate a target calibration current value corresponding to the target current value according to the target current value, the power supply chip parameters, the sampling chip parameters and the chip calibration parameters when the sampling chip branch is turned on.

[0019] In a possible implementation of the first aspect, the current output circuit further includes: a tester connected in parallel with the component under test, and used to measure the input current of the component under test; the tester is also communicatively connected with the controller, and used to send the measured input current of the component under test to the controller;

[0020] The controller is further configured to calculate the chip calibration parameters of the sampling chip branch according to the theoretical output current of the power supply integrated chip and the input current of the component under test corresponding to the theoretical output current when the sampling chip branch is turned on;

[0021] The controller is further used to calculate the resistance calibration parameter of the sampling resistor branch according to the theoretical output current of the power supply integrated chip and the input current of the component under test corresponding to the theoretical output current when the sampling resistor branch is turned on.

[0022] In a possible implementation manner of the first aspect, the current output circuit further includes: a collection chip, wherein an input end of the collection chip is electrically connected to a current detection output end of the power supply integrated chip;

[0023] The high side of the current detection input terminal of the power supply integrated chip is electrically connected to the input terminal of the peripheral circuit;

[0024] The low side of the current detection input terminal of the power supply integrated chip is electrically connected to the output terminal of the peripheral circuit;

[0025] The controller is also connected to the acquisition chip for sending a current acquisition instruction to the acquisition chip to instruct the acquisition chip to acquire the actual current output by the power supply integrated chip;

[0026] The acquisition chip is used to receive the current acquisition instruction issued by the controller, and in response to the current acquisition instruction, acquire the actual output current of the power supply integrated chip, and send the actual output current of the power supply integrated chip to the controller.

[0027] In a possible implementation manner of the first aspect, the peripheral circuit further includes a second control switch and a third control switch; wherein:

[0028] The second control switch and the third control switch are respectively connected to the controller for communication;

[0029] The output end of the second control switch is electrically connected to the high side of the current detection input end of the power supply integrated chip;

[0030] The output end of the third control switch is electrically connected to the low side of the current detection input end of the power supply integrated chip;

[0031] When the target current value is less than or equal to the preset current value, the controller is further used to control the input end of the second control switch and the input end of the third control switch to be electrically connected to the second input end and the second output end of the sampling resistor, respectively, so that the voltage input to the current detection input end of the power supply integrated chip is the voltage across the two ends of the sampling resistor;

[0032] When the target current value is less than or equal to the preset current value, the controller is further used to control the input end of the second control switch to be electrically connected to the second input end of the sampling chip, and control the input end of the third control switch to be grounded, so that the voltage input to the current detection input end of the power supply integrated chip is the output voltage of the sampling chip, wherein the output voltage of the sampling chip is related to the current flowing through the sampling chip.

[0033] In a possible implementation of the first aspect, the current output circuit further includes: an adjustment circuit, an input end of the adjustment circuit being electrically connected to the second input end of the sampling chip, and configured to adjust the output voltage of the sampling chip;

[0034] When the target current value is greater than the preset current value, the controller is also used to control the input end of the second control switch to be electrically connected to the output end of the adjustment circuit, so that the voltage input to the current detection input end of the power supply integrated chip is an adjusted voltage; wherein the adjusted voltage represents the voltage after the output voltage of the sampling chip is adjusted.

[0035] In a possible implementation manner of the first aspect, the adjustment circuit includes two operational amplifiers, at least one resistor, and at least one capacitor.

[0036] In a second aspect, an embodiment of the present application provides a current output method of an automated testing device, comprising:

[0037] Obtaining a target current value; wherein the target current value represents the current value input by the automated testing equipment to the component under test during the test;

[0038] According to the magnitude of the target current value, determining a conducting branch in the peripheral circuit so that the peripheral circuit loads the current output by the power supply integrated chip to the component under test; wherein the peripheral circuit includes a sampling resistor branch and a sampling chip branch;

[0039] When the target current value is greater than the preset current value, the sampling chip branch is controlled to be turned on and the sampling resistor branch is turned off;

[0040] When the target current value is less than or equal to the preset current value, the sampling resistor branch is controlled to be turned on and the sampling chip branch is controlled to be turned off.

[0041] In a third aspect, an embodiment of the present application provides an automated testing device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements any of the methods described above when executing the computer program.

[0042] In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, it implements any of the methods described above.

[0043] In a fifth aspect, an embodiment of the present application provides a computer program product, which, when executed on a terminal device, enables the terminal device to execute any of the methods described above.

[0044] Compared with the prior art, the embodiments of the present application have the following beneficial effects: the current output circuit of the automated test equipment includes a controller, a power supply integrated chip and a peripheral circuit; the power supply integrated chip is connected to the peripheral circuit for outputting current; the peripheral circuit is electrically connected to the component under test, including a sampling resistor branch and a sampling chip branch, which are used to load the output current of the power supply integrated chip to the component under test when turned on; the controller is communicatively connected to the peripheral circuit, and is used to control the sampling chip branch to be turned on and the sampling resistor branch to be turned off when the target current value is greater than the preset current value, wherein the target current value represents the current value input by the automated test equipment to the component under test during the test, and when the sampling chip branch is turned on, the output current of the power supply integrated chip is loaded to the component under test, so that when a large current is output, the use of the sampling chip branch can be effectively avoided. The controller is further used to control the sampling resistor branch to be turned on and the sampling chip branch to be turned off when the target current value is less than or equal to the preset current, wherein the output current of the power supply integrated chip is loaded to the component under test when the sampling resistor branch is turned on, thereby avoiding the phenomenon of poor output small current accuracy caused by the sampling chip output current when the small current is output, thereby solving the problem that when the automated test equipment tests the semiconductor, the sampling resistor is used to output a large current for a long time in the prior art, and the actual resistance value of the sampling resistor changes with the temperature, resulting in a unidirectional continuous drift of the large current actually output by the ATE equipment, which cannot meet the high-precision requirements of the semiconductor test. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0046] Figure 1 It is a structural schematic diagram of a current output circuit of an automated test device provided by the prior art;

[0047] Figure 2 It is a structural schematic diagram of a current output circuit of another automated test equipment provided by the prior art;

[0048] Figure 3 It is a flow chart of a current output method of an automated test device provided by the prior art;

[0049] Figure 4 It is a structural schematic diagram of a current output circuit of an automated testing device provided in one embodiment of the present application;

[0050] Figure 5 is a structural schematic diagram of a current output circuit of another automated testing device provided in another embodiment of the present application;

[0051] Figure 6 is a structural schematic diagram of a current output circuit of another automated testing device provided in another embodiment of the present application;

[0052] Figure 7 is a structural schematic diagram of an adjustment circuit provided by an embodiment of the present application;

[0053] Figure 8 is a flow chart of a current output method of an automated testing device provided in another embodiment of the present application;

[0054] Fig. 9 It is a flowchart of a method for calculating calibration parameters of a current output circuit provided in an embodiment of the present application. DETAILED DESCRIPTION

[0055] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0056] It should be understood that when used in the present specification and the appended claims, the term "comprising" indicates the presence of described features, wholes, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or combinations thereof.

[0057] It should also be understood that the term “and / or” used in the specification and appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0058] As used in the specification and appended claims of this application, the term "if" can be interpreted as "when" or "uponce" or "in response to determining" or "in response to detecting", depending on the context. Similarly, the phrase "if it is determined" or "if [described condition or event] is detected" can be interpreted as meaning "uponce it is determined" or "in response to determining" or "uponce [described condition or event] is detected" or "in response to detecting [described condition or event]", depending on the context.

[0059] In addition, in the description of the present application specification and the appended claims, the terms "first", "second", "third", etc. are only used to distinguish the descriptions and cannot be understood as indicating or implying relative importance.

[0060] References to "one embodiment" or "some embodiments" etc. described in the specification of this application mean that one or more embodiments of the present application include specific features, structures or characteristics described in conjunction with the embodiment. Therefore, the statements "in one embodiment", "in some embodiments", "in some other embodiments", "in some other embodiments", etc. that appear in different places in this specification do not necessarily refer to the same embodiment, but mean "one or more but not all embodiments", unless otherwise specifically emphasized in other ways. The terms "including", "comprising", "having" and their variations all mean "including but not limited to", unless otherwise specifically emphasized in other ways.

[0061] In the prior art, see Figure 1 , Figure 1 It is a structural diagram of a current output circuit of an automated test equipment provided by the prior art. In the semiconductor testing process, there is a situation where the ATE (Automatic Test Equipment) needs to continuously output a relatively large current (hundreds of milliamperes to several amperes). At present, the commonly used method for controlling the output current of ATE is that the controller communicates with the PMU / DPS chip (the channel module in the figure) through a communication bus (SPI or IIC, etc.), and the PMU / DPS chip (Precision Measurement Unit / Device Power Supplies) is fed back with the output current of the ATE through a sampling resistor (Rsamp in the figure), and the theoretical output current of the PMU / DPS chip is adjusted by the fed-back output current, and the current output by the PMU / DPS chip is loaded to the semiconductor (for example) through the sampling resistor. Figure 1 The DUT (Device Under Test) in the system is used to test semiconductors.

[0062] At the same time, the controller also measures the current or voltage flowing through the sampling resistor through an ADC (Analog-to-digital converter) chip. The calculation method is: divide the voltage sampled by the ADC chip by the theoretical resistance value of the sampling resistor to obtain the current flowing through the sampling resistor.

[0063] Although, before using the sampling resistor to feedback the output current of the ATE, the actual resistance value of the sampling resistor will be uniformly calibrated to correct the deviation between the actual resistance value of the sampling resistor and the theoretical resistance value, so as to reduce the error of the actual output current of the ATE fed back by the sampling resistor, the sampling resistor has a temperature coefficient, and its actual resistance value is not constant. When the ATE outputs a large current for a long time, the increase in the power consumption of the sampling resistor will cause the sampling resistor to continue to heat up, resulting in a change in the actual resistance value of the sampling resistor. When outputting current and measuring, the ATE still relies on the theoretical resistance value of the sampling resistor after the initial calibration. When outputting and measuring a large current for a long time, as the actual resistance value of the sampling resistor changes slightly, the current output by the ATE also drifts unidirectionally and continuously with the change in the actual resistance value, which eventually leads to a deterioration in the accuracy of the output current, and the actual output current of the ATE obtained by feedback from the sampling resistor is also inaccurate. At the same time, the current flowing through the sampling resistor measured by the ADC (Analog-to-digital converter) chip is also inaccurate.

[0064] In order to overcome the error of the actual output current of ATE caused by the temperature change of the sampling resistor, the first method currently used is to set a heat sink on the sampling resistor. When a large current pulse is output, the heat sink has enough time to dissipate the heat and control the resistance temperature of the sampling resistor within a certain range. However, when the current is output for a long time, due to the continuous heating of the sampling resistor, it is difficult for the heat sink to control the resistance temperature of the sampling resistor within a certain range.

[0065] The second method is to use ultra-low temperature drift resistors as sampling resistors. However, ultra-low temperature drift resistors are special and not commonly used on the market. They are generally plug-in type, large in size and high in cost, which makes them impossible to be integrated into ATE boards on a large scale.

[0066] The third method is to use temperature compensation. Figure 2 As shown, Figure 2 It is a structural diagram of a current output circuit of another automated test equipment provided by the prior art. The controller monitors the temperature of the sampling resistor through a temperature sensor and adjusts the theoretical output current of the ATE in real time according to the monitored temperature of the sampling resistor.

[0067] like Figure 2 As shown, a temperature sensor is arranged near the sampling resistor, and the controller communicates with the temperature sensor through a communication bus to monitor the temperature of the sampling resistor Rsamp in real time, thereby dynamically compensating the output current value.

[0068] By setting the temperature sensor, the output current control process is realized, such as Figure 3 As shown, Figure 3It is a flow chart of a current output method of an automated test device provided by the prior art. After the user issues a current output control instruction, the controller obtains the current value to be output by analyzing the circuit parameters, and then obtains the temperature of the sampling resistor at the current moment, calculates the current target value of the current according to the temperature of the sampling resistor, and configures the chip output current according to the current target value of the current. After the configuration is completed, it is necessary to monitor in real time whether the user issues a current output stop command to end the current output. If the user is monitored to issue a current output stop command, the current output is ended. If the user is not monitored to issue a current output stop command, the temperature of the sampling resistor continues to be obtained, and it is determined whether the obtained temperature of the sampling resistor reaches the adjustment node. If the adjustment node is not reached, the temperature of the sampling resistor continues to be obtained. If the adjustment node is reached, the target value of the current continues to be recalculated according to the current temperature of the sampling resistor, and the output current is configured. The above process is repeated until the user ends the current output.

[0069] However, since the monitored temperature of the sampling resistor has errors, and the distance between the sampling resistor and the temperature sensor must be close enough, and the number of temperature sensors must be sufficient, the third method mentioned above, which calculates the target value of the current based on the monitored temperature of the sampling resistor, is not accurate.

[0070] The present application embodiment provides a current output circuit of an automated testing device, see Figure 4 , Figure 4 This is a schematic diagram of the structure of a current output circuit of an automated test device provided in an embodiment of the present application, the current output circuit comprising: a controller, a power supply integrated chip and a peripheral circuit; wherein:

[0071] A power supply integrated chip connected to a peripheral circuit for outputting current;

[0072] The peripheral circuit is electrically connected to the component under test, and includes a sampling resistor branch and a sampling chip branch, and is used to load the output current of the power supply integrated chip to the component under test when it is turned on;

[0073] A controller is connected in communication with the peripheral circuit, and is used to control the sampling chip branch to be turned on and the sampling resistor branch to be turned off when the target current value is greater than the preset current value, wherein when the sampling chip branch is turned on, the output current of the power supply integrated chip is loaded to the component under test, and the target current value represents the current value input by the automated test equipment to the component under test during the test;

[0074] The controller is also used to control the sampling resistor branch to be turned on and the sampling chip branch to be turned off when the target current value is less than or equal to the preset current, wherein when the sampling resistor branch is turned on, the output current of the power supply integrated chip is loaded to the component under test.

[0075] It should be noted that the current output circuit in this embodiment can be applied to a board of an automated testing device, or can be applied to an automated testing device.

[0076] Specifically, when testing semiconductors and other components under test, automated testing equipment is required to provide them with testing current. The current output circuit of the automated testing equipment includes a controller, a power supply integrated chip, and a peripheral circuit, wherein the power supply integrated chip and the peripheral circuit are a channel system for inputting current to the component under test.

[0077] The power supply integrated chip (DPS\PMU chip) is connected to the peripheral circuit and is used to output current, transmit the output current to the component under test through the peripheral circuit, and provide the current required for the component under test. The component under test is the DUT in the figure, which can be a semiconductor.

[0078] The power supply integrated chip is also communicatively connected with the controller, and its communication connection method can be a communication bus (SPI / IIC, Serial Peripheral interface / Inter-Integrated Circuit, serial peripheral device interface). The controller sends a current output control instruction to the power supply integrated chip through the communication bus to control the output current of the power supply integrated chip.

[0079] The peripheral circuit is electrically connected to the channel output terminal of the power supply integrated chip and is also electrically connected to the component under test. It is used to load the output current of the power supply integrated chip to the component under test when the peripheral circuit itself is turned on, so that when the component under test is tested again, the current is directly input to the component under test.

[0080] The peripheral circuit includes a sampling resistor branch and a sampling chip branch. When any one of the sampling resistor branch and the sampling chip branch is turned on, the peripheral circuit is turned on. The sampling resistor branch includes a sampling resistor Rsamp, and the sampling chip branch includes a sampling chip. The sampling chip is a current sampling chip.

[0081] The controller, as the control system of the entire automated test equipment, is connected to the peripheral circuit in communication and can control the conduction branch of the peripheral circuit. When the component under test needs to be tested, the controller controls the conduction branch of the peripheral circuit, and the automated test equipment inputs current to the component under test.

[0082] Since the sampling resistor branch composed of sampling resistors is prone to unidirectional current drift when the automated test equipment outputs large current for a long time, whether to use the sampling resistor branch can be determined based on the size of the target current value to effectively reduce the error of the current output.

[0083] When the target current value is greater than the preset current value, the sampling resistor is not used to input current to the component under test. At this time, the controller controls the sampling chip branch in the peripheral circuit to be turned on and the sampling resistor branch to be turned off through the communication bus. Figure 5 As shown, Figure 5 It is a structural schematic diagram of the current output circuit of another automated test equipment provided by another embodiment of the present application. Switch A is closed downward, the sampling chip branch is turned on, and the sampling chip branch loads the output current of the power supply integrated chip to the component under test. When the current is large, the hardware circuit can be switched in advance, and the sampling chip branch is used to output feedback and measure the current, and the output current is loaded onto the component under test, so as to avoid the use of sampling resistors when the current is large, which causes the resistor to heat up and the resistance value to drift. Among them, the target current value represents the current value input by the automated test equipment to the component under test during the test. When the target current value is the current value required to be input when the component under test is tested, it is a fixed value.

[0084] When the target current value is less than or equal to the preset current, the sampling resistor is used to input current to the component under test. At this time, the controller controls the sampling resistor branch in the peripheral circuit to be turned on and the sampling chip branch to be turned off through the communication bus. Figure 4 As shown, switch A is closed upward, the sampling resistor branch is turned on, and the sampling resistor branch loads the output current of the power supply integrated chip to the component under test. When a small current is loaded through the sampling resistor, the sampling resistor branch can be switched in advance to output feedback and measure the current, and the output current is loaded to the component under test, which can avoid the problem of small current output and poor measurement accuracy caused by only using the sampling chip output current.

[0085] It should be noted that the preset current value can be set according to specific scenarios, and this embodiment does not specifically limit this.

[0086] It can be understood that the technical solution provided in this embodiment includes a controller, a power supply integrated chip and a peripheral circuit through a current output circuit of an automated test device; the power supply integrated chip is connected to the peripheral circuit for outputting current; the peripheral circuit is electrically connected to the component under test, including a sampling resistor branch and a sampling chip branch, which are used to load the output current of the power supply integrated chip to the component under test when it is turned on; the controller is communicatively connected to the peripheral circuit, and is used to control the sampling chip branch to be turned on and the sampling resistor branch to be turned off when the target current value is greater than the preset current value, wherein the target current value represents the current value input by the automated test device to the component under test during the test, and when the sampling chip branch is turned on, the output current of the power supply integrated chip is loaded to the component under test, so that when a large current is output, the use of the sampling resistor branch can be effectively avoided. The controller is further used to control the sampling resistor branch to be turned on and the sampling chip branch to be turned off when the target current value is less than or equal to the preset current, wherein the output current of the power supply integrated chip is loaded to the component under test when the sampling resistor branch is turned on, thereby avoiding the phenomenon of poor output small current accuracy caused by the sampling chip output current when the small current is output, thereby solving the problem that when the automated test equipment tests the semiconductor, the sampling resistor is used to output a large current for a long time in the prior art, and the actual resistance value of the sampling resistor changes with the temperature, resulting in a unidirectional continuous drift of the large current actually output by the ATE equipment, which cannot meet the high-precision requirements of the semiconductor test.

[0087] In a possible implementation, the peripheral circuit further includes a first control switch, which is communicatively connected to the controller; an input end of the first control switch is connected to a channel output end of the power supply integrated chip;

[0088] The sampling resistor branch includes a sampling resistor, and a first output end of the sampling resistor is connected to an input end of the component under test; the sampling chip branch includes a sampling chip, and a first output end of the sampling chip is connected to an input end of the component under test;

[0089] The controller is also used to control the output end of the first control switch to be electrically connected to the first input end of the sampling resistor when the target current value is less than or equal to the preset current value, so that the sampling resistor branch is turned on; and when the target current value is greater than the preset current value, control the output end of the first control switch to be electrically connected to the first input end of the sampling chip, so that the sampling chip branch is turned on.

[0090] Specifically, Figure 4 and Figure 5 As shown, the above peripheral circuit also includes a first control switch, the input end of the first control switch is connected to the channel output end of the power supply integrated chip, and the power supply integrated chip inputs the current through the channel output end to the input end of the first control switch. The first control switch is Figure 4 and Figure 5 Switch A in the .

[0091] The first control switch (switch A) is connected to the controller in communication, and the controller can control the closing direction of the first switch through the communication connection. When the target current value is less than or equal to the preset current value, such as Figure 4 As shown, the controller controls the first control switch to close upwards, at which time, the output end of the first control switch is electrically connected to the first input end of the sampling resistor. The first output end of the sampling resistor is connected to the input end of the component under test, the sampling resistor branch is turned on, and the sampling chip branch is disconnected. The current output by the power supply integrated chip passes through the sampling resistor and is loaded to the component under test.

[0092] The sampling resistor branch in the peripheral circuit includes a sampling resistor. When the target current value is greater than the preset current value, Figure 5 As shown, the controller controls the first control switch to close downward, at which time, the output end of the first control switch is electrically connected to the first input end of the sampling chip. The first output end of the sampling chip is connected to the input end of the component under test, the sampling chip branch is turned on, and the sampling resistor branch is disconnected. The current output by the power supply integrated chip passes through the sampling chip and is loaded to the component under test.

[0093] In a possible implementation, the controller is communicatively connected to the power supply integrated chip, and is further used to calculate a target calibration current value corresponding to the target current value according to the target current value, pre-stored circuit parameters and calibration parameters, and configure the theoretical output current of the power supply integrated chip to be the target calibration current value corresponding to the target current value;

[0094] The power supply integrated chip is also used to output current according to the configured theoretical output current, so that when the current is input to the component under test through the peripheral circuit, the input current of the component under test is the target current value; wherein the circuit parameters are determined based on the parameters of the power supply integrated chip itself and the parameters of the peripheral circuit itself; the calibration parameters are obtained after multiple fitting of the theoretical output current of the power supply integrated chip and the input current of the component under test.

[0095] Specifically, the controller pre-stores circuit parameters and calibration parameters. The circuit parameters are determined based on the parameters of the power supply integrated chip and the parameters of the peripheral circuit. The calibration parameters are obtained by fitting the theoretical output current of the power supply integrated chip and the input current of the component under test multiple times.

[0096] The controller is in communication connection with the power supply integrated chip. The controller calculates a target calibration current value corresponding to the target current value according to the target current value, pre-stored circuit parameters and calibration parameters, and configures the theoretical output current of the power supply integrated chip to the target calibration current value corresponding to the target current value.

[0097] The controller can also send a current output control instruction to the power supply integrated chip, which carries a target calibration current value corresponding to the target current value, so that the theoretical output current value of the power supply integrated chip is configured as the target calibration current value, and the current is output according to the theoretical output current value.

[0098] The power supply integrated chip can output current according to the theoretical output current configured by the controller, so that when current is input to the component under test through the peripheral circuit, the input current of the component under test is the target current value.

[0099] The power supply integrated chip can also receive a current output control instruction issued by the controller, respond to the current output control instruction, configure the theoretical output current value according to the target calibration current value corresponding to the target current value carried in the current output control instruction, and output current according to the target calibration current value corresponding to the target current value.

[0100] In a possible implementation, the circuit parameters include power supply chip parameters of the power supply integrated chip, sampling resistor parameters of the sampling resistor branch, and sampling chip parameters of the sampling chip branch;

[0101] The calibration parameters include a resistance calibration parameter of a sampling resistor branch and a chip calibration parameter of a sampling chip branch;

[0102] The controller is further used to calculate a target calibration current value corresponding to the target current value according to the target current value, power supply chip parameters, sampling resistor parameters and resistor calibration parameters when the sampling resistor branch is turned on;

[0103] The controller is also used to calculate a target calibration current value corresponding to the target current value according to the target current value, power supply chip parameters, sampling chip parameters and chip calibration parameters when the sampling chip branch is turned on.

[0104] Specifically, the internal parameters of the power supply integrated chip and the internal parameters of the peripheral circuit will affect the actual output current of the test equipment. When calculating the target calibration current value corresponding to the target current value based on the pre-stored circuit parameters and calibration parameters, the circuit parameters include the power supply chip parameters of the power supply integrated chip, the sampling resistor parameters of the sampling resistor branch, and the sampling chip parameters of the sampling chip branch.

[0105] The calibration parameters include the resistance calibration parameters of the sampling resistor branch and the chip calibration parameters of the sampling chip branch. The resistance calibration parameters of the sampling resistor branch are obtained by fitting the theoretical output current of the power supply integrated chip and the input current of the component under test multiple times when the sampling resistor branch is used to load current to the component under test.

[0106] The resistance calibration parameters of the sampling chip branch are obtained by fitting the theoretical output current of the power supply integrated chip and the input current of the component under test multiple times when the sampling chip branch is used to load current to the component under test.

[0107] When the component under test needs to input current, that is, the target current value is I target , and when the target current value is less than or equal to the preset current value, the sampling resistor branch is turned on, and the sampling resistor branch is used to load current to the component under test. At this time, according to the following formula, the controller calculates the target calibration current value corresponding to the target current value based on the target current value, power supply chip parameters, sampling resistor parameters and resistor calibration parameters, that is, the theoretical output current Code that needs to be configured for the power supply integrated chip:

[0108] Code=(R samp ×I target ×IGain PMU , DPS )×Gain R cali +offset R cali ;

[0109] Where: Code represents the theoretical output current of the DPS / PMU chip; R samp Indicates the sampling resistor parameters; I target Indicates the target current value; IGain PMU、DPS Indicates the power supply chip parameters; Gain R cali Indicates the resistance gain parameter in the resistance calibration parameter; offset R cali Indicates the resistor offset parameter in the resistor calibration parameter.

[0110] In an alternative example, R samp Indicates the resistance of the sampling resistor, IGain PMU、DPS Represents the internal current gain of the power supply chip, which is a fixed value.

[0111] The controller is also used to calculate a target calibration current corresponding to the target current according to the target current value, power supply chip parameters, sampling chip parameters and chip calibration parameters when the sampling chip branch is turned on.

[0112] When the component under test needs to input current, that is, the target current value is I target, and when the target current value is greater than the preset current value, the sampling chip branch is turned on, and the sampling chip branch is used to load current to the component under test. At this time, according to the following formula, based on the target current value, power supply chip parameters, sampling chip parameters and chip calibration parameters, the target calibration current value corresponding to the target current value is calculated, that is, the theoretical output current Code that needs to be configured for the power supply integrated chip:

[0113] Code=(G samp ×I target ×IGain PMU、DPS )×Gain G cali +offset G cali ;

[0114] Where Code represents the theoretical output current of the DPS / PMU chip; G samp Indicates the sampling chip parameters; I target Indicates the target current value; IGain PMU、DPS Indicates the power supply chip parameters; Gain G cali Indicates the chip gain parameter in the chip calibration parameters; offset G cali Indicates the chip offset parameters in the chip calibration parameters.

[0115] In a specific example, G samp Indicates the current conversion ratio (or sensitivity) of the sampling chip, which is related to the sampling chip itself. For example, every time the current passing through the sampling chip increases / decreases by 1000mA, the voltage output by the sampling chip increases / decreases by 400mV, then its current conversion ratio (sensitivity) G samp =400mV / A.

[0116] In a possible implementation, the current output circuit further includes: a tester connected in parallel with the component under test, and used to measure the input current of the component under test; the tester is also connected in communication with the controller, and used to send the measured input current of the component under test to the controller;

[0117] The controller is further used to calculate the chip calibration parameters of the sampling chip branch according to the theoretical output current of the power supply integrated chip and the input current of the component under test corresponding to the theoretical output current when the sampling chip branch is turned on;

[0118] The controller is also used to calculate the resistance calibration parameters of the sampling resistor branch according to the theoretical output current of the power supply integrated chip and the input current of the measured component corresponding to the theoretical output current when the sampling resistor branch is turned on.

[0119] Specifically, the current output circuit also includes a tester, such as Figure 6 As shown, Figure 6 It is a structural schematic diagram of a current output circuit of another automated test equipment provided by another embodiment of the present application, wherein the tester is connected in parallel with the component under test to measure the input current of the component under test. The input end of the tester is connected to the output end of the channel system, and the channel system includes a power supply integrated chip and a peripheral circuit. The input current of the component under test measured by the tester is regarded as the actual output current output by the above-mentioned channel system.

[0120] In an optional example, the tester may be a high-precision multimeter for directly measuring the input current of the component under test.

[0121] Specifically, the tester is also connected to the controller for communication, and is used to send the measured input current of the component under test to the controller. When the sampling chip branch is turned on, the controller also calculates the chip calibration parameters of the sampling chip branch according to the theoretical output current of the power supply integrated chip and the input current of the component under test corresponding to the theoretical output current. Among them, when the sampling chip branch is turned on, the theoretical output current of the power supply integrated chip is configured for the power supply integrated chip by the controller, so as to control the power supply integrated chip to input the input current corresponding to the theoretical output current to the component under test through the sampling chip.

[0122] When the sampling resistor branch is turned on, the controller also calculates the resistance calibration parameter of the sampling resistor branch according to the theoretical output current of the power supply integrated chip and the input current of the component under test corresponding to the theoretical output current. Among them, when the sampling resistor branch is turned on, the theoretical output current of the power supply integrated chip is configured for the power supply integrated chip by the controller to control the power supply integrated chip to input the input current corresponding to the theoretical output current to the component under test through the sampling resistor.

[0123] In an optional example, when the sampling chip branch is turned on, the chip calibration parameters of the sampling chip branch are calculated according to the theoretical output current of the power supply integrated chip and the input current of the component under test corresponding to the theoretical output current, such as Fig. 9 As shown, Fig. 9 1 is a flow chart of a method for calculating calibration parameters of a current output circuit provided by an embodiment of the present application, which specifically includes:

[0124] Start calculating the chip calibration parameters, use the high-precision multimeter as the reference, control the sampling chip branch to conduct, build the calibration model, and load the calibration points on the host computer. The calibration points are used to fit the input current and theoretical output current of the component under test. The calibration model can be a mapping function, that is, the mapping function between the theoretical output current and the input current of the component under test when the sampling chip branch is turned on. Since the chip calibration parameters include Gain Gcali Chip gain parameters and offset G cali Chip bias parameters require at least two calibration points for fitting.

[0125] When selecting calibration points, select n points at equal intervals.

[0126] For any calibration point, the controller configures the theoretical output current of the power supply integrated chip as a specific output current value, and uses a high-precision multimeter to measure the current passing through the component under test, and the input current of the component under test is the actual input current value. Each point has a theoretical output current and an input current of the component under test, and n points get n sets of data (x i ,y i ), where i = 1, 2, 3, ... n, represents the point, x i Indicates that i The corresponding input current of the measured component at the i-th point, y i Represents the theoretical output current of the ith point. When a calibration point is loaded, the calibration model determines whether all channels and calibration points have been traversed. When the calibration model has traversed all points and loaded each point, multiple theoretical output currents and the input current of the component under test corresponding to each theoretical output current are obtained.

[0127] According to the n sets of data (x i ,y i ), through univariate or multivariate linear fitting, the function mapping relationship between the theoretical output current and the input current of the component under test is obtained. The function mapping relationship includes Gain G cali Chip gain parameters and offset G cali Chip bias parameters. These two parameters are stored in the controller to complete the calculation of the calibration parameters of the theoretical output current of the sampling chip branch.

[0128] When the sampling chip branch is turned on, the chip calibration parameters of the sampling chip branch are calculated according to the theoretical output current of the power supply integrated chip at multiple points and the input current of the measured component corresponding to the theoretical output current according to the same fitting method as above, and the Gain in the resistance calibration parameter is obtained. R cali Resistor Gain Parameters and Offset R cali The resistor bias parameters are not described here. The two parameters are stored in the controller to complete the calculation of the calibration parameters of the theoretical output current of the sampling resistor branch.

[0129] In a possible implementation, the current output circuit further includes: a collection chip, wherein an input terminal of the collection chip is electrically connected to a current detection output terminal of the power supply integrated chip;

[0130] The high side of the current detection input terminal of the power supply integrated chip is electrically connected to the input terminal of the peripheral circuit;

[0131] The low side of the current detection input terminal of the power supply integrated chip is electrically connected to the output terminal of the peripheral circuit;

[0132] The controller is also connected to the acquisition chip for sending a current acquisition instruction to the acquisition chip to instruct the acquisition chip to acquire the actual current output by the power supply integrated chip;

[0133] The acquisition chip is used to receive the current acquisition instruction issued by the controller, and in response to the current acquisition instruction, acquire the actual output current of the power supply integrated chip, and send the actual output current of the power supply integrated chip to the controller.

[0134] Specifically, the current output circuit also includes a collection chip. The controller is in communication connection with the collection chip, and the controller can send a current collection instruction to the collection chip to instruct the collection chip to collect the actual current output by the power supply integrated chip.

[0135] The high side of the current detection input terminal of the power supply integrated chip is electrically connected to the input terminal of the peripheral circuit, and the low side of the current detection input terminal of the power supply integrated chip is electrically connected to the output terminal of the peripheral circuit. The input terminal of the acquisition chip is electrically connected to the current detection output terminal of the power supply integrated chip.

[0136] The acquisition chip is a voltage acquisition chip. When receiving the current acquisition instruction issued by the controller, the acquisition chip can respond to the current acquisition instruction and collect the voltage across the sampling resistor or the output voltage of the sampling chip by subtracting the voltage on the low side of the current detection input terminal from the voltage on the high side of the current detection input terminal. Since the voltage is related to the current, the actual output current of the power supply integrated chip is obtained by calculation, and the actual output current of the power supply integrated chip is sent to the controller. The actual output current of the power supply integrated chip collected by the acquisition chip can be compared with the input current of the component under test measured by the tester, so as to obtain a more accurate current output by the channel system.

[0137] In a possible implementation, the peripheral circuit further includes a second control switch and a third control switch; wherein:

[0138] The second control switch and the third control switch are respectively connected to the controller for communication;

[0139] The output end of the second control switch is electrically connected to the high side of the current detection input end of the power supply integrated chip;

[0140] The output end of the third control switch is electrically connected to the low side of the current detection input end of the power supply integrated chip;

[0141] When the target current value is less than or equal to the preset current value, the controller is further used to control the input end of the second control switch and the input end of the third control switch to be electrically connected to the second input end and the second output end of the sampling resistor, respectively, so that the voltage input to the current detection input end of the power supply integrated chip is the voltage across the two ends of the sampling resistor;

[0142] When the target current value is less than or equal to the preset current value, the controller is also used to control the input end of the second control switch to be electrically connected to the second input end of the sampling chip, and control the input end of the third control switch to be grounded, so that the voltage input to the current detection input end of the power supply integrated chip is the output voltage of the sampling chip, wherein the output voltage of the sampling chip is related to the current flowing through the sampling chip.

[0143] Specifically, the peripheral circuit further includes a second control switch ( Figure 4 and Figure 5 switch B) and the third control switch ( Figure 4 and Figure 5 The second control switch and the third control switch are respectively connected to the controller for communication. The controller can control the closing direction of the second control switch and the third control switch.

[0144] The output end of the second control switch is electrically connected to the high side of the current detection input end of the power supply integrated chip, and the output end of the third control switch is electrically connected to the low side of the current detection input end of the power supply integrated chip.

[0145] When the target current value is less than or equal to the preset current value, the sampling resistor branch needs to be turned on. At this time, the controller controls switch B and switch C to close upward, and the input end of the second control switch and the input end of the third control switch are electrically connected to the second input end and the second output end of the sampling resistor, respectively, so that the voltage input to the current detection input end of the power supply integrated chip is the voltage across the two ends of the sampling resistor, and the current input to the current detection input end of the power supply integrated chip is the current flowing through the sampling resistor. The current flowing through the sampling resistor can be indirectly calculated and fed back to the power supply integrated chip to obtain the current flowing through the sampling resistor.

[0146] When the target current value is greater than the preset current value, the sampling chip branch needs to be turned on. At this time, the controller controls switch B and switch C to close downward, the input end of the second control switch is electrically connected to the second input end of the sampling chip, and the input end of the third control switch is controlled to be grounded, so that the voltage input to the current detection input end of the power supply integrated chip is the output voltage of the sampling chip. Since the output voltage of the sampling chip is related to the current flowing through the sampling chip, the current flowing through the sampling chip can be calculated based on the output voltage of the sampling chip, so that the power supply integrated chip can obtain the current flowing through the sampling chip through indirect feedback.

[0147] In a possible implementation, the current output circuit further includes: an adjustment circuit, wherein an input terminal of the adjustment circuit is electrically connected to the second input terminal of the sampling chip and is used to adjust the output voltage of the sampling chip;

[0148] When the target current value is greater than the preset current value, the controller is also used to control the input end of the second control switch to be electrically connected to the output end of the adjustment circuit, so that the voltage input to the current detection input end of the power supply integrated chip is an adjusted voltage; wherein the adjusted voltage represents the voltage after the output voltage of the sampling chip is adjusted.

[0149] Specifically, the current output circuit further includes an adjustment circuit, the input end of the adjustment circuit is electrically connected to the second input end of the sampling chip, and is used to adjust the output voltage of the sampling chip.

[0150] When the target current value is greater than the preset current value, the sampling chip branch is turned on, and the controller also controls the input end of the second control switch to be electrically connected to the output end of the adjustment circuit, so that the voltage input to the current detection input end of the power supply integrated chip is the voltage after the adjustment process. Among them, the voltage after the adjustment process represents the voltage after the output voltage of the sampling chip is adjusted. Since the output voltage of the sampling chip is adjusted, the output voltage of the sampling chip is related to the current flowing through the sampling chip. After the adjustment process, the current flowing through the sampling chip is adjusted accordingly, and the current input to the current detection input end of the power supply integrated chip will also be adjusted, and adjusted to the current flowing through the sampling chip after the output voltage of the sampling chip is adjusted.

[0151] In a possible implementation manner, the adjustment circuit includes two operational amplifiers, at least one resistor, and at least one capacitor.

[0152] Specifically, the adjustment circuit includes two operational amplifiers, at least one resistor and at least one capacitor. Figure 7 As shown, Figure 7It is a structural diagram of an adjustment circuit provided in an embodiment of the present application. The adjustment circuit includes R1, R2, R3, R4 and R5, operational amplifier 1 and operational amplifier 2, and capacitor C1, a total of 5 resistors, 2 operational amplifiers and one capacitor.

[0153] Adjust the circuit input voltage V in After being connected in series with R1, R2 and operational amplifier 1 in parallel, they are respectively connected in series with R1 and R3 to form a first series branch.

[0154] Bias voltage input V offset It is connected in series with R4 to form a second series branch, and the second series branch is connected in parallel with the first series branch.

[0155] After capacitor C1 is connected in parallel with R5 and op amp 2, a first parallel branch is formed. After the second series branch is connected in parallel with the first series branch, it is connected in series with the first parallel branch. After that, the circuit output V is adjusted. out .

[0156] In an optional example, the adjustment circuit is composed of an operational amplifier circuit, which can process the voltage output by the sampling chip. Common processing includes scaling, biasing, and filtering.

[0157] Scaling means adjusting the voltage output by the sampling chip so that the full-scale voltage (the maximum voltage corresponding to the maximum current) output by the sampling chip matches the full-scale voltage of the power supply integrated chip.

[0158] Biasing means adjusting the voltage value corresponding to the sampling chip when there is no current, generally so that after adjustment, the output voltage is zero volts when there is zero current.

[0159] Filtering means that the voltage output by the chip will be low-pass filtered to remove high-frequency noise.

[0160] When the voltage does not meet the output requirements of the power supply integrated chip, an adjustment circuit is needed to adjust the voltage of the sampling chip, as follows:

[0161] For a stable current, the output voltage of the sampling chip is stable, that is, a low-frequency signal. Therefore, the calculation formula for the adjusted output voltage is:

[0162]

[0163] Among them, V in Indicates input voltage, V out Represents the adjusted output voltage, V offset Indicates bias voltage. Generally, no bias is required, so V offset Set to 0V or disconnect.

[0164] When bias is not required, the adjusted output voltage V out and input voltage Vin The calculation between them can be simplified to:

[0165]

[0166] By adjusting the resistance values ​​of R5 and R3, the output voltage of the sampling chip can be changed to meet the requirements of the power supply integrated chip. The scaling ratio of the adjustment circuit is determined by the hardware (R5 and R3). Once the hardware is determined, the ratio is determined accordingly. The scaling ratio is stored in the controller and can be used for subsequent calculations.

[0167] The scaling ratio G (gain) can be calculated according to the following formula:

[0168]

[0169] The function of filtering is to filter out the high-frequency disturbance caused by the chip itself and the hardware circuit design itself. The cutoff frequency of the filter is f c It can be set according to the actual situation. For example, it can be calculated according to the following formula:

[0170]

[0171] It can be seen that the filter cutoff frequency f c The functions and features are completely determined by the hardware and have nothing to do with the board driver software.

[0172] It can be understood that the technical solution provided in this embodiment includes a controller, a power supply integrated chip and a peripheral circuit through a current output circuit of an automated test device; the power supply integrated chip is connected to the peripheral circuit for outputting current; the peripheral circuit is electrically connected to the component under test, including a sampling resistor branch and a sampling chip branch, which are used to load the output current of the power supply integrated chip to the component under test when it is turned on; the controller is communicatively connected to the peripheral circuit, and is used to control the sampling chip branch to be turned on and the sampling resistor branch to be turned off when the target current value is greater than the preset current value, wherein the target current value represents the current value input by the automated test device to the component under test during the test, and when the sampling chip branch is turned on, the output current of the power supply integrated chip is loaded to the component under test, so that when a large current is output, the use of the sampling resistor branch can be effectively avoided. The controller is further used to control the sampling resistor branch to be turned on and the sampling chip branch to be turned off when the target current value is less than or equal to the preset current, wherein the output current of the power supply integrated chip is loaded to the component under test when the sampling resistor branch is turned on, thereby avoiding the phenomenon of poor output small current accuracy caused by the sampling chip output current when the small current is output, thereby solving the problem that when the automated test equipment tests the semiconductor, the sampling resistor is used to output a large current for a long time in the prior art, and the actual resistance value of the sampling resistor changes with the temperature, resulting in a unidirectional continuous drift of the large current actually output by the ATE equipment, which cannot meet the high-precision requirements of the semiconductor test.

[0173] Corresponding to the current output circuit described in the above embodiment, refer to Figure 8 , Figure 8 This is a flow chart of a current output method for an automated testing device provided in another embodiment of the present application. For ease of explanation, only the part related to the embodiment of the present application is shown.

[0174] The current output method of the automated test equipment in this embodiment includes:

[0175] Obtaining a target current value; wherein the target current value represents the current value input by the automated test equipment to the component under test during the test;

[0176] According to the magnitude of the target current value, a conducting branch in the peripheral circuit is determined so that the peripheral circuit loads the current output by the power supply integrated chip to the component under test; wherein the peripheral circuit includes a sampling resistor branch and a sampling chip branch;

[0177] When the target current value is greater than the preset current value, the sampling chip branch is controlled to be turned on and the sampling resistor branch is turned off;

[0178] When the target current value is less than or equal to the preset current value, the sampling resistor branch is controlled to be turned on and the sampling chip branch is controlled to be turned off.

[0179] In an optional example, if Figure 8 As shown, the user sends a current output control instruction, parses the target current value from the current output control instruction, and determines whether the target current value is greater than a preset current value.

[0180] When it is determined that the target current value is greater than the preset current value, the controller controls the hardware circuit to switch to the sampling chip branch, obtains the pre-stored sampling chip parameters and chip calibration parameters, calculates the target calibration current value, and configures the theoretical output current of the power supply integrated chip to the target calibration current value.

[0181] When it is determined that the target current value is less than or equal to the preset current value, the controller controls the hardware circuit to switch to the sampling resistor branch, obtains the pre-stored sampling resistor parameters and resistor calibration parameters, calculates the target calibration current value, and configures the theoretical output current of the power supply integrated chip to the target calibration current value.

[0182] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of the present application.

[0183] It should be noted that the above method and the circuit embodiment of the present application are based on the same concept. For its specific functions and technical effects, please refer to the circuit embodiment part, which will not be repeated here.

[0184] The technicians in the relevant field can clearly understand that for the convenience and simplicity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In practical applications, the above-mentioned function allocation can be completed by different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. The functional units and modules in the embodiment can be integrated in a processing unit, or each unit can exist physically separately, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other, and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0185] An embodiment of the present application also provides an automated testing device, which terminal device includes: at least one processor, a memory, and a computer program stored in the memory and executable on the at least one processor, wherein the processor implements the steps in any of the above-mentioned method embodiments when executing the computer program.

[0186] An embodiment of the present application further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in the above-mentioned method embodiments can be implemented.

[0187] An embodiment of the present application provides a computer program product. When the computer program product runs on a mobile terminal, the mobile terminal can implement the steps in the above-mentioned method embodiments when executing the computer program product.

[0188] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the processes in the above-mentioned embodiment method, which can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium, and the computer program can implement the steps of the above-mentioned various method embodiments when executed by the processor. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium can at least include: any entity or device that can carry the computer program code to the camera / terminal device, recording medium, computer memory, read-only memory (ROM, Read-Only Memory), random access memory (RAM, RandomAccess Memory), electric carrier signal, telecommunication signal and software distribution medium. For example, a USB flash drive, a mobile hard disk, a magnetic disk or an optical disk. In some jurisdictions, according to legislation and patent practice, computer-readable media cannot be electric carrier signals and telecommunication signals.

[0189] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0190] Those of ordinary skill in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0191] In the embodiments provided in the present application, it should be understood that the disclosed devices / network equipment and methods can be implemented in other ways. For example, the device / network equipment embodiments described above are merely schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0192] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0193] The embodiments described above are only used to illustrate the technical solutions of the present application, rather than to limit them. Although the present application has been described in detail with reference to the aforementioned embodiments, a person skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application, and should all be included in the protection scope of the present application.

Claims

1. A current output circuit of an automated test device, characterized in that: include: Controller, power supply integrated chip and peripheral circuit; Among them: The power supply integrated chip is connected to the peripheral circuit and is used to output current; The peripheral circuit is electrically connected to the component under test, and includes a sampling resistor branch and a sampling chip branch, and is used to load the output current of the power supply integrated chip to the component under test when it is turned on; The controller is connected in communication with the peripheral circuit, and is used to control the sampling chip branch to be turned on and the sampling resistor branch to be turned off when the target current value is greater than the preset current value, wherein the output current of the power supply integrated chip is loaded to the component under test when the sampling chip branch is turned on, and the target current value represents the current value input by the automated test equipment to the component under test during the test; The controller is further configured to control the sampling resistor branch to be turned on and the sampling chip branch to be turned off when the target current value is less than or equal to the preset current, wherein when the sampling resistor branch is turned on, the output current of the power supply integrated chip is loaded to the component under test.

2. The current output circuit of the automated testing equipment according to claim 1, characterized in that: The peripheral circuit further includes a first control switch, which is communicatively connected to the controller; an input end of the first control switch is connected to a channel output end of the power supply integrated chip; The sampling resistor branch includes a sampling resistor, and a first output end of the sampling resistor is connected to an input end of the component under test; the sampling chip branch includes a sampling chip, and a first output end of the sampling chip is connected to an input end of the component under test; The controller is further configured to control the output end of the first control switch to be electrically connected to the first input end of the sampling resistor when the target current value is less than or equal to the preset current value, so as to turn on the sampling resistor branch; When the target current value is greater than the preset current value, the output end of the first control switch is controlled to be electrically connected to the first input end of the sampling chip, so that the sampling chip branch is turned on.

3. The current output circuit of the automated testing equipment according to claim 2, characterized in that: The controller is communicatively connected to the power supply integrated chip, and is further used to calculate a target calibration current value corresponding to the target current value according to the target current value, pre-stored circuit parameters and calibration parameters, and configure the theoretical output current of the power supply integrated chip to the target calibration current value corresponding to the target current value; The power supply integrated chip is also used to output current according to the configured theoretical output current, so that when the current is input to the component under test through the peripheral circuit, the input current of the component under test is the target current value; wherein the circuit parameters are determined based on the own parameters of the power supply integrated chip and the own parameters of the peripheral circuit; and the calibration parameters are obtained after multiple fitting of the theoretical output current of the power supply integrated chip and the input current of the component under test.

4. The current output circuit of the automated testing equipment according to claim 3, characterized in that: The circuit parameters include power supply chip parameters of the power supply integrated chip, sampling resistor parameters of the sampling resistor branch, and sampling chip parameters of the sampling chip branch; The calibration parameters include a resistance calibration parameter of the sampling resistance branch and a chip calibration parameter of the sampling chip branch; The controller is further configured to calculate a target calibration current value corresponding to the target current value according to the target current value, the power supply chip parameters, the sampling resistor parameters and the resistor calibration parameters when the sampling resistor branch is turned on; The controller is further configured to calculate a target calibration current value corresponding to the target current value according to the target current value, the power supply chip parameters, the sampling chip parameters and the chip calibration parameters when the sampling chip branch is turned on.

5. The current output circuit of the automated testing equipment as claimed in claim 3, characterized in that: The current output circuit further includes: a tester connected in parallel with the component under test, and used to measure the input current of the component under test; the tester is also connected in communication with the controller, and used to send the measured input current of the component under test to the controller; The controller is further configured to calculate the chip calibration parameters of the sampling chip branch according to the theoretical output current of the power supply integrated chip and the input current of the component under test corresponding to the theoretical output current when the sampling chip branch is turned on; The controller is further used to calculate the resistance calibration parameter of the sampling resistor branch according to the theoretical output current of the power supply integrated chip and the input current of the component under test corresponding to the theoretical output current when the sampling resistor branch is turned on.

6. The current output circuit of the automated testing equipment according to claim 2, characterized in that: The current output circuit further comprises: a collection chip, wherein the input end of the collection chip is electrically connected to the current detection output end of the power supply integrated chip; The high side of the current detection input terminal of the power supply integrated chip is electrically connected to the input terminal of the peripheral circuit; The low side of the current detection input terminal of the power supply integrated chip is electrically connected to the output terminal of the peripheral circuit; The controller is also connected to the acquisition chip for sending a current acquisition instruction to the acquisition chip to instruct the acquisition chip to acquire the actual current output by the power supply integrated chip; The acquisition chip is used to receive the current acquisition instruction issued by the controller, and in response to the current acquisition instruction, acquire the actual output current of the power supply integrated chip, and send the actual output current of the power supply integrated chip to the controller.

7. The current output circuit of the automated testing equipment according to claim 6, characterized in that: The peripheral circuit further includes a second control switch and a third control switch; wherein: The second control switch and the third control switch are respectively connected to the controller for communication; The output end of the second control switch is electrically connected to the high side of the current detection input end of the power supply integrated chip; The output end of the third control switch is electrically connected to the low side of the current detection input end of the power supply integrated chip; When the target current value is less than or equal to the preset current value, the controller is further used to control the input end of the second control switch and the input end of the third control switch to be electrically connected to the second input end and the second output end of the sampling resistor, respectively, so that the voltage input to the current detection input end of the power supply integrated chip is the voltage across the two ends of the sampling resistor; When the target current value is less than or equal to the preset current value, the controller is further used to control the input end of the second control switch to be electrically connected to the second input end of the sampling chip, and control the input end of the third control switch to be grounded, so that the voltage input to the current detection input end of the power supply integrated chip is the output voltage of the sampling chip, wherein the output voltage of the sampling chip is related to the current flowing through the sampling chip.

8. The current output circuit of the automated testing equipment according to claim 7, characterized in that: The current output circuit further includes: an adjustment circuit, the input end of the adjustment circuit is electrically connected to the second input end of the sampling chip, and is used to adjust the output voltage of the sampling chip; When the target current value is greater than the preset current value, the controller is also used to control the input end of the second control switch to be electrically connected to the output end of the adjustment circuit, so that the voltage input to the current detection input end of the power supply integrated chip is an adjusted voltage; wherein the adjusted voltage represents the voltage after the output voltage of the sampling chip is adjusted.

9. The current output circuit of the automated testing equipment according to claim 8, characterized in that: The adjustment circuit includes two operational amplifiers, at least one resistor and at least one capacitor.

10. A current output method for automated testing equipment, characterized in that: include: Obtaining a target current value; wherein the target current value represents the current value input by the automated testing equipment to the component under test during the test; According to the magnitude of the target current value, determining a conducting branch in the peripheral circuit so that the peripheral circuit loads the current output by the power supply integrated chip to the component under test; wherein the peripheral circuit includes a sampling resistor branch and a sampling chip branch; When the target current value is greater than the preset current value, the sampling chip branch is controlled to be turned on and the sampling resistor branch is turned off; When the target current value is less than or equal to the preset current value, the sampling resistor branch is controlled to be turned on and the sampling chip branch is controlled to be turned off.

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