Capacitor temperature or voltage coefficient test conversion device

Abstract

The invention relates to the technical field of capacitor performance test, and particularly discloses a capacitor temperature or voltage coefficient test conversion device. According to the invention, the plurality of change-over switches are connected with the capacitor connection ports, and then the station selection module carries out switching control, so that batch testing of a plurality of capacitors to be tested can be realized, and the testing efficiency is greatly improved; meanwhile, the capacitors to be tested can be placed in the temperature test box through the arrangement of the capacitor test clamp and the wire, the effective temperature characteristic data of the multiple capacitors to be tested can be obtained in batches, the capacitors to be tested can be subjected to voltage applying test at the test temperature through the arrangement of the test power supply module, and the test efficiency is improved. The capacitor performance testing device has the advantages of being simple in structure, high in testing precision and wide in application range, and is suitable for large-scale popularization and application.

Description

Technical Field

[0001] The present application relates to the technical field of capacitor performance testing, and in particular to a capacitor temperature or voltage coefficient testing conversion device. Background Art

[0002] As a key component in power systems, electronic equipment and new energy fields, the accurate testing of capacitor performance parameters (such as capacity, loss, withstand voltage, temperature characteristics, etc.) directly affects equipment reliability and safety. In industrial testing scenarios, it is often necessary to verify the performance of batch capacitors under multiple working conditions (such as normal temperature, high temperature, and charge and discharge cycles), but general traditional capacitor testing devices can usually only test a single capacitor and cannot quickly switch and test multiple capacitors at the same time, resulting in low testing efficiency. In addition, existing testing systems usually conduct electrical parameter testing and temperature testing in stages, and cannot monitor the dynamic voltage characteristics of capacitors at specific temperatures in real time. Summary of the invention

[0003] In order to solve the problems existing in the existing capacitor characteristic testing technology, such as only testing a single capacitor and being unable to obtain the characteristics of the capacitor in multiple testing scenarios (test temperature plus test voltage), the present application provides a capacitor temperature or voltage coefficient test conversion device, which can place the capacitor to be tested in a positive or negative temperature environment and perform batch, accurate, and safe charging and discharging capacitor capacity tests.

[0004] In order to achieve the above-mentioned invention object, this application provides the following technical solutions:

[0005] A capacitor temperature or voltage coefficient test conversion device, the conversion device comprising a test power supply module, a function selection module, a station selection module, an internal conversion module, a test signal connection port and a capacitor connection port to be tested;

[0006] The capacitor connection port to be tested is used to connect a plurality of capacitors to be tested, and is connected to a corresponding conversion switch in the internal conversion module through a wire;

[0007] The test signal connection port includes a high-end test signal connection port and a low-end test signal connection port, which are used to connect an external test instrument, and transmit the test signal input by the external test instrument to the capacitor connection port to be tested through the internal conversion module, and then output the test value of the capacitor to be tested to the external test instrument;

[0008] The station selection module includes a plurality of station selection switches, each station selection switch is used to control the on and off of each conversion switch, so that the external test instrument switches to test different capacitors to be tested;

[0009] The function selection module includes a zero-power switch, a discharge switch and a power-on switch; the zero-power switch is connected to the test power module to control the test power module to be turned off; the discharge switch is connected to the test power module to discharge the connected capacitor to be tested; the power-on switch is connected to the test power module to control the test power module to be turned on and apply voltage to the connected capacitor to be tested; the test power module is respectively connected to the high-end test signal connection port and the function selection module;

[0010] The capacitor connection port to be tested includes a plurality of capacitor test fixtures and wires, each capacitor test fixture is used to place the capacitor to be tested and connect the two electrodes of the capacitor to be tested;

[0011] Wherein, the conductor includes a high-temperature wire and a metal braided mesh, which is used to place the connected connection port of the capacitor to be tested in a temperature test box; the temperature test box is used to adjust the ambient temperature of the capacitor to be tested.

[0012] According to a specific implementation, in the above-mentioned conversion device, a DC isolation and voltage reduction protection module is provided between the connection between the high-end test signal connection port and the test power supply module, and the DC isolation and voltage reduction protection module is used for DC isolation and voltage reduction; a short-circuit alarm protection module is provided between the connection between the low-end test signal connection port and the internal conversion module, and the short-circuit alarm protection module is used for short-circuit alarm when the capacitor to be tested is broken down.

[0013] According to a specific embodiment, in the above-mentioned conversion device, the test power supply module also includes a voltage display module and a voltage regulation module, the voltage regulation module is used to adjust the test DC voltage according to the test voltage condition of the capacitor to be tested, and the voltage display module is used to display the voltage value of the test DC voltage.

[0014] According to a specific implementation, in the above-mentioned conversion device, the test power supply module also includes a test power supply backup interface for connecting an external test voltage.

[0015] According to a specific embodiment, in the above-mentioned conversion device, the capacitor test fixture includes a shielding box and a test socket assembly; the shielding box includes a plurality of shielding plates and partitions; the test socket assembly is installed in the shielding box; the test socket assembly includes a test pin insulated from the shielding box, the test pin is used to connect the two poles of the capacitor to be tested and is connected to the wire; the partition is arranged between the two poles to isolate the two poles of the capacitor to be tested.

[0016] According to a specific implementation, in the above-mentioned conversion device, the capacitor test fixture also includes an opener and a short-circuit device, and the opener and the short-circuit device are installed in parallel with the test socket assembly in a shielding box; the two poles in the opener are always in an open circuit state; the two poles in the short-circuit device are always in a short circuit state; the conversion switch connects the opener to an open circuit state, and the conversion switch connects the short-circuit device to a short circuit state.

[0017] According to a specific embodiment, in the above-mentioned conversion device, the conversion device also includes a test selection module, and the test selection module includes a test switch, an open circuit calibration switch and a short circuit calibration switch; the test switch is used to control the on and off of the workstation selection module, the open circuit calibration switch is used to control the on and off of the conversion switch connected to the open circuit, and the short circuit calibration switch is used to control the on and off of the conversion switch connected to the short circuit.

[0018] According to a specific implementation, in the above-mentioned conversion device, each conversion switch is respectively arranged in a metal box.

[0019] According to a specific implementation, in the above conversion device, the capacitance range of the capacitor to be tested is above 1 pF.

[0020] According to a specific implementation, in the above conversion device, the ambient temperature is -70°C to 300°C.

[0021] Compared with the prior art, the present invention has the following advantages:

[0022] 1. The present application provides a capacitor temperature or voltage coefficient test conversion device, which can realize batch testing and automatic switching of multiple capacitors to be tested by connecting a plurality of conversion switches to the connection port of the capacitor to be tested and then switching and controlling by the station selection module, thereby significantly improving the test efficiency and reducing human errors; at the same time, the present application can place the capacitor to be tested in a temperature test chamber through the setting of a capacitance test fixture and a wire, thereby realizing batch acquisition of effective temperature characteristic data of multiple capacitors to be tested;

[0023] 2. This application realizes the pressure test of the capacitor in a temperature environment by adding a test power supply module to the capacitor test conversion device, thereby obtaining more accurate voltage characteristics and realizing batch acquisition of effective voltage characteristic data of multiple capacitors to be tested;

[0024] 3. The present application is provided with a test mode selection module, which can perform "open circuit calibration" and "short circuit calibration" during testing, which can effectively eliminate the influence of distributed parameters between the test instrument and the capacitor under test, and significantly improve the test accuracy; at the same time, the present application has the advantages of simple structure, high test accuracy and wide application range, and is suitable for large-scale promotion and application. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 A schematic diagram of the structure of a capacitor temperature or voltage coefficient test conversion device provided in an embodiment of the present application;

[0026] Figure 2 A schematic diagram of the structure of the capacitor connection port to be tested provided in an embodiment of the present application;

[0027] Figure 3 A schematic diagram of the structure of another capacitor connection port to be tested provided in an embodiment of the present application;

[0028] Figure 4 A schematic diagram of the structure of another capacitor temperature or voltage coefficient test conversion device provided in an embodiment of the present application;

[0029] Figure 5 A schematic diagram of the structure of a 4TP measurement conversion device for temperature or voltage parameters provided in an embodiment of the present application

[0030] Figure 6 A schematic diagram of the base structure of a capacitance test fixture provided in an embodiment of the present application;

[0031] Figure 7 A schematic diagram of a seat cover structure of a capacitance test fixture provided in an embodiment of the present application. DETAILED DESCRIPTION

[0032] The present application is further described in detail below in conjunction with test examples and specific implementation methods. However, this should not be understood as the scope of the above subject matter of the present application being limited to the following embodiments, and all technologies implemented based on the content of the present application belong to the scope of the present application.

[0033] The terms "first", "second", etc. in the specification embodiments, claims, and drawings of the present application are only used for the purpose of distinguishing descriptions, and cannot be understood as indicating or implying relative importance, nor can they be understood as indicating or implying order. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, including a series of steps or units. The method, system, product, or device is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products, or devices.

[0034] In addition, in the description of the embodiments of the present application, "several", "plurality" and "a number" represent at least 2. It can be any number such as 2, 3, 4, 5, 6, 7, 8, 9, and even more than 9.

[0035] In addition, in the description of the technical solution of the present application, unless otherwise clearly specified / defined / restricted, the terms "set", "install", "connect", "connected", "provided with", "laid", and "arranged" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection, and can be welding, riveting, bolting, threading, and other commonly used connection methods in the field. This connection can be a mechanical connection, an electrical connection, or a communication connection; it can be a direct connection, or an indirect connection through an intermediate medium, and it can be the internal connection of two elements.

[0036] Specifically, please refer to Figure 1 , which shows a structural schematic diagram of a capacitor temperature or voltage coefficient test conversion device provided in an embodiment of the present application, wherein the conversion device includes a test power supply module, a function selection module, a station selection module, an internal conversion module, a test signal connection port, and a capacitor connection port to be tested.

[0037] The capacitor connection port to be tested is used to connect a plurality of capacitors to be tested, and is connected to a corresponding conversion switch in the internal conversion module through a wire.

[0038] The test signal connection port includes a high-end test signal connection port and a low-end test signal connection port, which are used to connect an external test instrument, and transmit the test signal input by the external test instrument to the capacitor connection port to be tested through the internal conversion module, and then output the test value of the capacitor to be tested to the external test instrument.

[0039] The station selection module includes a plurality of station selection switches, each of which is used to control the on and off of each conversion switch, so that the external test instrument switches to test different capacitors to be tested.

[0040] The function selection module includes a zero-power switch, a discharge switch and a power-on switch; the zero-power switch is connected to the test power module to control the test power module to be turned off; the discharge switch is connected to the test power module to discharge the connected capacitor to be tested; the power-on switch is connected to the test power module to control the test power module to be turned on and apply voltage to the connected capacitor to be tested; the test power module is respectively connected to the high-end test signal connection port and the function selection module.

[0041] The capacitor connection port to be tested includes several capacitor test fixtures and wires, please refer to Figure 2, which shows a schematic diagram of the structure of the connection port of the capacitor to be tested provided in an embodiment of the present application. Specifically, each capacitor test fixture is used to place the capacitor to be tested and connect the two poles of the capacitor to be tested; wherein the wire includes a high-temperature wire and a metal braided mesh, which is used to place the connected connection port of the capacitor to be tested in a temperature test box; the temperature test box is used to adjust the ambient temperature of the capacitor to be tested. The capacitor test fixture includes a shielding box and a test socket assembly, the shielding box includes a plurality of shielding plates and partitions; the test socket assembly is installed in the shielding box; the test socket assembly includes a test pin insulated from the shielding box, the test pin is used to connect the two poles of the capacitor to be tested and is connected to the wire; the partition is arranged between the two poles to isolate the two poles of the capacitor to be tested.

[0042] Furthermore, in order to provide multiple options for testing the test capacitor without DC voltage, testing at a specified DC voltage, and discharging the test capacitor, in the function selection module, the zero-power switch is connected to the test power module to control the test power module to be turned off; the discharge switch is connected to the test power module to discharge the connected capacitor to be tested; the power-on switch is connected to the test power module to control the test power module to be turned on and apply voltage to the connected capacitor to be tested. It can be understood that discharging the capacitor to be tested is an effective protection for the test personnel and other test instruments who are conducting the next test.

[0043] In a possible implementation, the test power supply module also includes a voltage display and a voltage adjustment knob, which can arbitrarily adjust the test voltage source according to the capacitor test voltage conditions to reach a specified voltage value and intuitively reflect it on the display.

[0044] Furthermore, in order to protect the test instrument and provide sound and light alarm prompts when the test capacitor is broken down. In this embodiment, a DC isolation and voltage reduction protection module is provided between the connection between the high-end test signal connection port and the test power supply module, and the DC isolation and voltage reduction protection module is used for DC isolation and voltage reduction; a short circuit alarm protection module is provided between the connection between the low-end test signal connection port and the internal conversion module, and the short circuit alarm protection module is used for short circuit alarm when the capacitor to be tested is broken down. The DC isolation and voltage reduction protection module and the short circuit alarm protection module are composed of suitable capacitors, diodes, and operational amplifier integrated blocks.

[0045] Furthermore, in this embodiment, the test power supply module uses suitable voltage display, transformer, resistor, electrolytic, voltage stabilizer and other components with a dedicated power supply printed circuit board to provide a stable, reliable, visible and adjustable dedicated DC voltage source for the test capacitor.

[0046] In a possible implementation, the test power module provided in the present application further includes a test power backup interface for connecting an external test voltage. When the internal power supply is damaged or cannot provide a test voltage, the test power supply can be connected through the test power backup interface, and the test voltage can be verified through the test power backup interface.

[0047] It is understandable that in the production and testing process of capacitors, the performance test of capacitors is particularly critical. Traditional test devices mostly use a single-station series test mode, and the capacitor to be tested needs to be manually replaced during the test, resulting in a long test cycle and high labor costs. Especially in high-temperature aging tests, frequent opening of the test chamber to replace samples will destroy the stability of the temperature field and affect the consistency of the test data. Although there are multi-station switching designs in the prior art, mechanical relays or single switch control are generally used, the switching response speed is slow, and there is a lack of isolation protection for multi-channel parallel testing, which can easily cause signal crosstalk or mismeasurement.

[0048] Furthermore, when testing capacitors at high temperatures, conventional wires (such as ordinary PVC insulated wires) are prone to aging of the insulation layer due to long-term high temperatures, causing the risk of short circuits; at the same time, the contact stability between the test probe and the capacitor electrode is affected by thermal expansion, which may cause contact resistance fluctuations and lead to test errors. Most existing solutions use external extension cords to lead samples out of the test chamber, but lack a dedicated connection structure for high-temperature environments, making it difficult to ensure the long-term stability of signal transmission. In addition, existing test systems usually conduct electrical parameter tests and temperature tests in stages, and are unable to monitor the dynamic performance changes of capacitors at specific temperatures in real time. Although a few solutions have attempted to place the test device in a temperature chamber, the impact of internal high temperatures on the performance of the switch module and power supply circuit has not been resolved, resulting in a shortened equipment life or limited test functions.

[0049] In the field of product testing, the withstand voltage coefficient of capacitors and the voltage characteristics of capacitors are one of the important indicators of capacitor performance. The withstand voltage coefficient of capacitors can reflect the safety performance of capacitors; if the withstand voltage coefficient of capacitors is too small, it is easy to cause problems such as breakdown or deformation of capacitors; if the withstand voltage coefficient is too high, the volume and cost of capacitors will increase accordingly. Therefore, it is necessary to select a suitable capacitor when designing a circuit to ensure the stability and reliability of the capacitor. The voltage characteristics of a capacitor refer to the change in the capacitance of a capacitor under different voltages. Usually, the capacitance of a capacitor is calculated based on the voltage across it, that is, C = Q / V, where C represents capacitance, Q represents charge, and V represents voltage. Ideally, the capacitance of a capacitor should be constant, but in actual applications, due to the influence of the material and electric field characteristics inside the capacitor, its capacitance decreases slightly as the voltage increases. This is the voltage characteristic of the capacitor. When applying capacitors in actual circuits, it is necessary to consider the impact of voltage characteristics on circuit performance.

[0050] Similarly, the test of capacitor voltage characteristics mainly relies on professional measuring instruments to ensure the accuracy of the measurement data. During the measurement process, the rated uninterrupted DC voltage is added to the test capacitor, and the test value of the test capacitor is continuously recorded to calculate the change of the capacitor capacitance to the voltage characteristic, so as to draw the capacitor's C (capacitance)-V (voltage) characteristic curve.

[0051] Specifically, the present application provides a capacitor temperature or voltage coefficient test conversion device, which connects a number of conversion switches to the connection port of the capacitor to be tested, and then controls the switching by the workstation selection module, so as to realize batch testing and automatic switching of multiple capacitors to be tested, thereby significantly improving the test efficiency and reducing human errors; at the same time, the present application can place the capacitor to be tested in a temperature test chamber through the setting of a capacitor test fixture and a wire, thereby realizing batch acquisition of effective temperature characteristic data of multiple capacitors to be tested.

[0052] In addition, the present application realizes voltage testing of the capacitor in a temperature environment by adding a test power supply module to the capacitor test conversion device, thereby obtaining more accurate voltage characteristics and realizing batch acquisition of effective voltage characteristic data of multiple capacitors to be tested; and, the present application greatly reduces the electrode interference of the capacitor to be tested and the interference of the environment on the test through the setting of metal partitions and test needles, so that the test results can be more accurate. At the same time, the present application has the advantages of simple structure, high test accuracy and wide application range, and is suitable for large-scale promotion and application.

[0053] The capacitor test conversion device provided in the present application is further described below in conjunction with specific implementations.

[0054] Taking a common chip capacitor as an example, the chip capacitor is placed in a capacitor test fixture in the capacitor connection port to be tested. The capacitor test fixture is connected to the two poles of the chip capacitor through a built-in test needle, and a metal partition is used to separate the two poles of the chip capacitor.

[0055] In a possible implementation, the test needle uses a gold-plated needle tip, and its contact area with the chip capacitor needs to be smaller than the upper and lower electrode areas of the chip capacitor. This can effectively eliminate the distributed parameters of the upper and lower test needles and improve the accuracy of the test.

[0056] Furthermore, the two poles of the chip capacitor are respectively connected to the conversion start of the internal conversion module through wires. Wherein, the conversion switch is set corresponding to the test signal connection port. For example, in this embodiment, the test signal connection port is a BNC four-terminal output, including a high-end test signal connection port and a low-end test signal connection port, and the conversion switches are respectively set with two, corresponding to the high-end test signal connection port and the low-end test signal connection port. Correspondingly, one pole of the chip capacitor is connected to the high-end test signal connection port through a conversion switch, and the other pole is connected to the low-end test signal connection port through a conversion switch. Each wire is connected accordingly. It can be understood that if there are N chip capacitors that need to be tested, 2N wires are required for connection, and the corresponding number of the conversion switches is also 2N.

[0057] Correspondingly, each conversion switch is linked to a station selection switch, and the number of the station selection switches is also the number of the corresponding chip capacitors. It can be understood that if the connection port of the capacitor to be tested is connected to the internal conversion module in sequence, and then the station selection switch in the station selection module is connected to the conversion switch in the internal conversion module in sequence, then the order of the station selection switches is the order of the chip capacitors. That is, when the value to be tested of the i-th chip capacitor needs to be tested, it is only necessary to control the i-th station selection switch to be turned on.

[0058] In this embodiment, the station selection module uses a station conversion switch with a rotation angle of 360 degrees, which can further reduce the return to zero time and improve the test efficiency.

[0059] Furthermore, in order to eliminate the influence of the distributed parameters between the capacitor connection port to be tested and the external test instrument and realize accurate testing, the embodiment of the present application also provides a capacitor temperature or voltage coefficient test conversion device, wherein the capacitor test fixture also includes an open circuit and a short circuit, such as Figure 3 As shown. The test pin in the opener is set to an open circuit state, and the test pin in the shorter is set to a short circuit state. The opener and the shorter are connected in the same way as the capacitor test fixture to connect the high-end test signal connection port, the low-end test signal connection port and the internal conversion module. Furthermore, the embodiment of the present application also provides a test selection module, which includes a test switch, an open circuit calibration switch and a short circuit calibration switch, such as Figure 4As shown. In order to better control the station selection module, the test switch is used to control the on and off of the station selection module. Only when the test switch is turned on, the station selection switch can be turned on to perform the switching control of the internal conversion module. Correspondingly, the open circuit calibration switch is used to control the on and off of the conversion switch connected to the open circuit, and the short circuit calibration switch is used to control the on and off of the conversion switch connected to the short circuit.

[0060] The above arrangement can effectively link the capacitor test conversion device, and can perform "open circuit calibration" and "short circuit calibration" on the entire test system.

[0061] In one possible implementation, see Figure 5 , which shows a schematic structural diagram of a 4TP measurement and conversion device for temperature or voltage parameters provided in an embodiment of the present application. Through this embodiment, a test of applying a DC voltage under rated temperature conditions can be achieved.

[0062] Further, based on the above technical solution, the function selection module and the test selection module include simple settings and input and output functions. In another possible implementation method, the function selection module and the test selection module can cooperate through an input device and a processor, obtain execution instructions through the input device, and then execute corresponding instructions through the processor, including zero power, power on, discharge, open circuit, short circuit, test, etc. Among them, the test is used to control the work selection switch, and the selection of each capacitor to be tested by the work selection switch can also be realized by a central processing unit. Exemplarily, the processor can be a central processing unit (CPU) or a microcontroller (MCU).

[0063] The processor may further include a hardware chip. The hardware chip may be an application-specific integrated circuit (ASIC), a programmable logic device (PLD) or a combination thereof. The PLD may be a complex programmable logic device (CPLD), a field-programmable gate array (FPGA), a generic array logic (GAL) or any combination thereof.

[0064] The processor may further include a memory for storing the above-mentioned execution instructions, the program of the central processing unit, etc. The memory may include a volatile memory (volatile memory), such as a random-access memory (random-access memory, RAM); the memory may also include a non-volatile memory (non-volatile memory), such as a flash memory (flash memory), a hard disk drive (hard disk drive, HDD) or a solid-state drive (solid-state drive, SSD); the memory may also include a combination of the above-mentioned types of memory.

[0065] The processor can be an integrated circuit chip with signal processing capabilities. The processor can be a general-purpose processor, a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.

[0066] It should be noted that the capacitor test conversion device provided in the present application is used to detect the temperature coefficient of the capacitance of the capacitor under specified temperature conditions. It is an intermediate conversion device. It does not have a testing function by itself and needs to be equipped with suitable external testing instruments and temperature test chambers when used. The external testing instruments are capacitance testers and other instruments that can test the capacitance of capacitors. Specifically, the ambient temperature provided by the temperature test chamber is -70°C to 300°C. In addition, in order to implement this application, the capacitor test conversion device provided in the present application also includes a device power supply port for providing a working voltage to the device, and the device power supply port is used to connect an external power supply to provide a working voltage to each module of the device. This is a conventional setting and will not be repeated here.

[0067] Specifically, for the placed chip capacitor to be tested, the entire capacitor placement device needs to be placed in a temperature test box during testing, and then connected to the internal conversion module through a wire. It can be understood that only a part of the wire is in the temperature test box, and then connected to the internal conversion module outside the temperature test box. The wire adopts a high-temperature wire, which is mainly used to transmit signals under positive and negative temperature environments. In addition, for shielding and protection, the wire also includes a metal braided mesh, which is mainly used to shield the two ends of the wire connection to reduce test interference. In a possible implementation, when the wire is connected to the internal conversion module, an aviation plug can be selected for further shielding connection.

[0068] For examples, please refer to Figure 6 and Figure 7 , which shows a schematic diagram of the structure of the base and seat cover of a capacitance test fixture provided by an embodiment of the present application. As shown in the figure, the capacitance test fixture can simultaneously support the testing of two chip capacitors to be tested. Specifically, the chip capacitor to be tested is placed in a placement area on the base, and a raised test pin (C and D) is provided in the center of the placement area. The test pin is used to connect the low-end test signal connection port, and connect one pole of the chip capacitor to be tested. The other end of the base is provided with a test pin (A and B) connected to the high-end test signal connection port. The seat cover is provided with test pins (A', B', C', D') and connecting wires at the corresponding positions of the chip capacitor to be tested and the other end of the base. After the seat cover is closed, the other pole of the chip capacitor to be tested can be connected to the other end of the base, and the placement of the chip capacitor to be tested is completed. In addition, in order to ensure the stability of the chip capacitor to be tested, the test pin on the seat cover is also provided with a spring that moves in a small range, which can fix the chip capacitor to be tested after the seat cover is closed. For example, the capacitor connection port to be tested is composed of multiple capacitance test fixtures arranged together.

[0069] It is understandable that in order to meet the measurement requirements under positive and negative temperature environments, the capacitance test fixture should be made of metal materials with good thermal conductivity, such as PEI and PPS materials, as the main body of the capacitance test fixture.

[0070] In a possible implementation, the external test instrument outputs a test signal to the capacitor test conversion device, specifically, the test signal includes outputting a high test current and a high test resistance through the high-end test signal connection port, and outputting a low test current and a low test resistance through the low-end test signal connection port. It can be understood that based on the interface principle of the high-end test signal connection port and the low-end test signal connection port in the capacitor test conversion device provided by the present application, a 4TP measurement method is adopted, which belongs to the most commonly used measurement technology of the automatic balancing bridge capacitance meter, mainly including connecting the two poles of the capacitor to be tested with different high and low-end test signals, so as to obtain its capacitance. It can be understood that the conversion switch in the internal conversion module is connected to the high-end test signal connection port, that is, if the high-end test signal connection port has only one test signal, the conversion switch is only set to one switch; if the high-end test signal connection port outputs two signals at the same time, the conversion switch is corresponding to the parallel setting of two switches, and so on. Furthermore, the configuration of the low-end test signal connection port and the conversion switch is the same as the configuration of the high-end test signal connection port and the conversion switch, and will not be described in detail herein.

[0071] At the same time, when the high-end test signal connection port and the low-end test signal connection port are connected to an external test instrument, a shielded wire containing a metal braided mesh is also required to be used to eliminate the influence of parameter distribution. Further, in a possible implementation, each of the above-mentioned conversion switches is respectively arranged in a metal box, and the separated installation plays a shielding role.

[0072] It should be noted that the capacitor test conversion device provided in the present application can perform batch capacity testing on capacitors with a capacity range of more than 1pF.

[0073] It is understandable that the capacitor testing device provided by the embodiment of the present application can be used to test the temperature coefficient of the capacitor to be tested in a positive or negative temperature environment, and the test power supply module is optional. If the test power supply module is not selected, only the temperature coefficient of the capacitor to be tested is tested. If it is selected, the voltage coefficient of the capacitor to be tested can be further tested. Correspondingly, when testing the voltage coefficient of the capacitor to be tested, whether to place the capacitor to be tested in a positive or negative temperature environment for temperature coefficient testing is also optional, and can be correspondingly expanded and selected based on the actual application of the capacitor testing device, which will not be repeated here.

[0074] It should be understood that the device disclosed in the embodiments of the present application can be implemented in other ways. For example, the division of the modules is only a logical function division, and there may be other division methods in actual implementation, such as multiple modules or components can be combined or integrated into another device, or some features can be ignored or not executed. Another point is that the communication connection between the units can be through some interfaces, servers or indirect coupling or communication connection, which can be electrical or other forms.

[0075] Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a concrete manner for ease of understanding.

[0076] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application should be included in the protection scope of the present application.

Claims

1. A capacitor temperature or voltage coefficient test conversion device, characterized in that: The conversion device comprises a test power supply module, a function selection module, a station selection module, an internal conversion module, a test signal connection port and a capacitor connection port to be tested; The capacitor connection port to be tested is used to connect a plurality of capacitors to be tested, and is connected to a corresponding conversion switch in the internal conversion module through a wire; The test signal connection port includes a high-end test signal connection port and a low-end test signal connection port, which are used to connect an external test instrument, and transmit the test signal input by the external test instrument to the capacitor connection port to be tested through the internal conversion module, and then output the test value of the capacitor to be tested to the external test instrument; The station selection module includes a plurality of station selection switches, each station selection switch is used to control the on and off of each conversion switch, so that the external test instrument switches to test different capacitors to be tested; The function selection module includes a zero-power switch, a discharge switch and a power-on switch; the zero-power switch is connected to the test power module to control the test power module to be turned off; the discharge switch is connected to the test power module to discharge the connected capacitor to be tested; the power-on switch is connected to the test power module to control the test power module to be turned on and apply voltage to the connected capacitor to be tested; The test power supply module is respectively connected to the high-end test signal connection port and the function selection module; The capacitor connection port to be tested includes a plurality of capacitor test fixtures and wires, each capacitor test fixture is used to place the capacitor to be tested and connect the two electrodes of the capacitor to be tested; Wherein, the conductor includes a high temperature wire and a metal braided mesh, which is used to place the connected connection port of the capacitor to be tested in a temperature test box; The temperature test box is used to adjust the ambient temperature of the capacitor to be tested.

2. A capacitor temperature or voltage coefficient test conversion device according to claim 1, characterized in that: A DC isolation and voltage reduction protection module is provided between the connection between the high-end test signal connection port and the test power supply module, and the DC isolation and voltage reduction protection module is used for DC isolation and voltage reduction; a short-circuit alarm protection module is provided between the connection between the low-end test signal connection port and the internal conversion module, and the short-circuit alarm protection module is used for short-circuit alarm when the capacitor to be tested is broken down.

3. A capacitor temperature or voltage coefficient test conversion device according to claim 1, characterized in that: The test power supply module also includes a voltage display module and a voltage regulation module. The voltage regulation module is used to adjust the test DC voltage according to the test voltage condition of the capacitor to be tested, and the voltage display module is used to display the voltage value of the test DC voltage.

4. A capacitor temperature or voltage coefficient test conversion device according to claim 1, characterized in that: The test power supply module also includes a test power supply standby interface for connecting an external test voltage.

5. A capacitor temperature or voltage coefficient test conversion device according to claim 1, characterized in that: The capacitor test fixture includes a shielding box and a test socket assembly; the shielding box includes a plurality of shielding plates and partitions; the test socket assembly is installed in the shielding box; the test socket assembly includes a test pin insulated from the shielding box, the test pin is used to connect the two poles of the capacitor to be tested and is connected to the wire; the partition is arranged between the two poles and is used to isolate the two poles of the capacitor to be tested.

6. A capacitor temperature or voltage coefficient test conversion device according to claim 5, characterized in that: The capacitor test fixture also includes an opener and a short-circuiter, which are installed in parallel with the test socket assembly in a shielding box; the two poles in the opener are always in an open circuit state; the two poles in the short-circuit device are always in a short circuit state; the conversion switch connects the opener to an open circuit state, and the conversion switch connects the short-circuit device to a short circuit state.

7. A capacitor temperature or voltage coefficient test conversion device according to claim 6, characterized in that: The conversion device also includes a test selection module, which includes a test switch, an open circuit calibration switch and a short circuit calibration switch; the test switch is used to control the on and off of the workstation selection module, the open circuit calibration switch is used to control the on and off of the conversion switch connected to the open circuit, and the short circuit calibration switch is used to control the on and off of the conversion switch connected to the short circuit.

8. A capacitor temperature or voltage coefficient test conversion device according to claim 1, characterized in that: Each conversion switch is respectively arranged in a metal box.

9. A capacitor temperature or voltage coefficient test conversion device according to claim 1, characterized in that: The capacitance range of the capacitor to be tested is above 1 pF.

10. A capacitor temperature or voltage coefficient test conversion device according to claim 1, characterized in that: The ambient temperature is -70°C to 300°C.

Images