Driving system for testing power device, testing system and testing method

Abstract

The invention provides a driving system for testing a power device, and the system comprises a driving power supply which comprises a controller and a voltage modulator, the controller is connected with the control end of the voltage modulator, and the output end of the voltage modulator outputs a voltage signal; the universal drive board comprises a test fixture and a drive circuit, the drive circuit is connected with the test fixture, and the test fixture is used for being connected with a tested power device; and a voltage modulator of the driving power supply is connected with the driving circuit so as to provide voltage for the driving circuit. According to the application, the test fixture and the drive circuit which are used for connecting the tested power device are arranged on the universal drive board, and the drive power supply is connected with the drive circuit to apply the drive voltage to the tested power device, so that the tested power device can be tested, the universality of the drive system for testing the power device is improved, and the test efficiency is improved. Therefore, the driving system for testing the power device is prevented from being customized for the type of the tested power device, and the cost of the driving system is reduced.

Description

Technical Field

[0001] The present invention relates to the technical field of power devices, and in particular to a driving system, a testing system and a testing method for testing power devices. Background Art

[0002] The conventional driving system for testing power devices is customized for each power device. The driving circuit and driving power supply of the driving system are integrated on a driving test circuit, and connected to the tested power device through a test fixture on the driving test circuit. This method results in poor versatility of the driving system for testing power devices, which makes the cost of testing power devices high. Summary of the invention

[0003] In view of this, an object of the present invention is to provide a driving system, a testing system and a testing method for testing a power device, so as to solve the problems of poor versatility and high cost of the driving system for testing the power device.

[0004] Based on the above purpose, the present invention provides a driving system for testing a power device, comprising:

[0005] A driving power supply comprises a controller and a voltage modulator, wherein the controller is connected to a control end of the voltage modulator, and an output end of the voltage modulator outputs a voltage signal;

[0006] A universal driving board, comprising a test fixture and a driving circuit, wherein the driving circuit is connected to the test fixture, and the test fixture is used to connect a power device under test;

[0007] The voltage modulator of the driving power supply is connected to the driving circuit to provide voltage to the driving circuit.

[0008] Furthermore, the driving power supply includes a plurality of voltage modulators, a control end of each of the voltage modulators is connected to the controller, and each of the voltage modulators is connected to a driving circuit.

[0009] Furthermore, the voltage modulator includes a power circuit and a feedback circuit, the control end of the power circuit is connected to the controller, the power circuit outputs a voltage signal, and the feedback circuit is located between the output end of the power circuit and the controller to feed back the voltage signal output by the power circuit to the controller.

[0010] Furthermore, the driving circuit includes an inductive load, a dual-pulse circuit and a DC circuit, the DC circuit is connected to the driving power supply, the dual-pulse circuit and the DC circuit are respectively used to connect to the gate and source of a power device under test, and the inductive load is connected in parallel with the power device under test connected to the DC circuit.

[0011] Furthermore, the driving system also includes a dual pulse generation controller connected to the dual pulse circuit.

[0012] Furthermore, a driving power input interface and a dual pulse signal interface are provided on the universal driving board, the driving power input interface is connected to the DC circuit, and the dual pulse signal interface is connected to the dual pulse circuit.

[0013] Furthermore, the universal driving board includes a plurality of groups of connected driving circuits and test fixtures.

[0014] Furthermore, the universal driving board also includes a driving power supply filter circuit, the driving power supply filter circuit is connected to the driving power supply, and the driving power supply is connected to the driving circuit through the driving power supply filter circuit.

[0015] Based on the same inventive concept, the present application also provides a testing system, comprising a driving system for testing a power device as described above, a high-voltage power supply and a testing device, wherein the high-voltage power supply and the testing device are both connected to a testing fixture to be connected to the power device under test through the testing fixture.

[0016] Based on the same inventive concept, the present application also provides a testing method, using the above-mentioned testing system, the testing method comprising:

[0017] Install the power device under test on the test fixture of the universal driver board;

[0018] Connecting the driving circuit of the universal driving board to the driving power supply;

[0019] Respectively connecting the high voltage power supply and the test device to the test fixture;

[0020] Based on the specifications of the power device under test, input a voltage value to the controller of the driving power supply so that the controller controls the voltage modulator to output a corresponding voltage value;

[0021] The testing device is started to test the parameters of the power device under test.

[0022] From the above description, it can be seen that the present invention provides a driving system for testing power devices, which is provided by setting a connected driving power supply and a universal driving board. The driving power supply includes a controller and a voltage modulator. The voltage signal output by the voltage modulator is related to the controller, so that the voltage signal output by the driving power supply can be flexibly set, and is suitable for testing a variety of different specifications of power devices under test. A test fixture and a driving circuit for connecting the power device under test are provided on the universal driving board. The driving power supply is connected to the driving circuit to apply a driving voltage to the power device under test, so as to test the power device under test, thereby improving the versatility of the driving system for testing power devices, thereby avoiding customization of the driving system for testing power devices according to the type of the power device under test, and reducing the cost of the driving system. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0024] Figure 1 This is a schematic diagram of the structure of a driving power supply according to an embodiment of the present invention;

[0025] Figure 2 This is a schematic diagram of the structure of a universal driving board according to an embodiment of the present invention;

[0026] Figure 3 It is a structural schematic diagram of a test system according to an embodiment of the present invention;

[0027] Figure 4 A schematic diagram of the circuit structure of a test system according to an embodiment of the present invention;

[0028] Figure 5 The figure is a flow chart of the testing method according to the embodiment of the present invention.

[0029] In the figure: 10, driving power supply; 11, controller; 12, voltage modulator; 121, power circuit; 122, feedback circuit; 20, universal driving board; 21, driving circuit; 211, inductive load; 212, double pulse circuit; 213, DC circuit; 22, test fixture; 23, driving power supply input interface; 24, double pulse signal interface; 25, driving power supply filter circuit; 30, power device under test; 40, double pulse generation controller; 50, high voltage power supply; 60, test device. DETAILED DESCRIPTION

[0030] In order to make the objectives, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with specific embodiments and with reference to the accompanying drawings.

[0031] It should be noted that, unless otherwise defined, the technical terms or scientific terms used in the embodiments of the present invention should be understood by people with ordinary skills in the field to which this application belongs. The "first", "second" and similar words used in this application do not represent any order, quantity or importance, but are only used to distinguish different components. "Including" or "comprising" and similar words mean that the elements or objects appearing in front of the word cover the elements or objects listed after the word and their equivalents, without excluding other elements or objects. "Connect" or "connected" and similar words are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. "Up", "down", "left", "right" and the like are only used to indicate relative positional relationships. When the absolute position of the described object changes, the relative positional relationship may also change accordingly.

[0032] The testing process of a power device is to apply a driving voltage to the gate of the power device to test the startup voltage and the shutdown voltage of the power device. Therefore, the function of the driving system for testing the power device is to generate a driving voltage acting on the gate of the power device.

[0033] The design method of the drive system for testing power devices is to customize a drive test board for power devices, which includes a drive circuit and a drive power supply. The drive circuit is connected to the power device under test through a test fixture on the drive test board to input a drive voltage to the power device under test. Since different types of power devices have different drive voltage requirements, it is necessary to set the adjustable drive voltage to realize a universal drive system. The traditional method is to design a multi-channel output fixed voltage drive power supply on the drive test board, and switch the drive power supply of different gears through a switch matrix to act on the drive circuit, so that the drive circuit can generate different drive voltages to act on different power devices under test. This method leads to a high design cost of the drive system, and the applicable power device types are limited, and the versatility is poor.

[0034] The embodiments of the present application are described in detail below with reference to the accompanying drawings.

[0035] In some embodiments, the present application provides a driving system for testing a power device, such as Figure 1 and Figure 2 As shown, including:

[0036] The driving power supply 10 includes a controller 11 and a voltage modulator 12, wherein the controller 11 is connected to a control end of the voltage modulator 12, and an output end of the voltage modulator 12 outputs a voltage signal;

[0037] A universal driving board 20, comprising a test fixture 22 and a driving circuit 21, wherein the driving circuit 21 is connected to the test fixture 22, and the test fixture 22 is used to connect a power device 30 under test;

[0038] The voltage modulator 12 of the driving power supply 10 is connected to the driving circuit 21 to provide voltage to the driving circuit 21 .

[0039] Specifically, the driving power supply 10 is the power supply of the driving circuit 21, and is the power structure of the driving circuit 21, which is used to output a DC voltage of a certain value to the driving circuit 21 so that the driving circuit 21 can operate and can apply a driving voltage to the power device under test 30, so as to facilitate testing of the performance parameters of the power device under test 30.

[0040] The controller 11 of the driving power supply 10 sends a voltage value signal to the voltage modulator 12 . Based on the voltage value signal of the controller 11 , the voltage modulator 12 outputs a voltage matching the voltage value signal to act on the driving circuit 21 .

[0041] The universal driving board 20 can be universally used in the test of the power device 30 under test. First, the driving circuit 21 on the universal driving board 20 is a circuit for driving the power device 30 under test. The only difference is that the voltage of the driving power supply 10 is different. Therefore, when testing different types of power devices 30 under test, the driving circuit 21 can be used. On this basis, the setting of the test fixture 22 can facilitate the connection between the power device 30 under test and the driving circuit 21, and can also achieve universality.

[0042] The output voltage of the driving power supply 10 can be controlled by the controller 11 , so the driving system can be applicable to the testing of various types of power devices, thereby improving the versatility of the driving system.

[0043] It should be noted that the driving power supply 10 is also provided with a user interaction interface connected to the controller 11. The user inputs a voltage value to the controller 11 through the user interaction interface. The controller 11 generates a voltage value signal matching the voltage value received from the user interaction interface and sends the value to the voltage modulator 12. The voltage modulator 12 generates a voltage identical to the voltage value input by the user.

[0044] Exemplarily, the output voltage range of the driving power supply 10 is 0 to 30 V, that is, the driving power supply 10 can output any value within this range, for example, 5.1 V, thereby improving the flexibility of the output voltage of the driving power supply 10 .

[0045] In this embodiment, a driving power supply 10 and a universal driving board 20 are connected, and the driving power supply 10 includes a controller 11 and a voltage modulator 12. The voltage signal output by the voltage modulator 12 is related to the controller 11, so that the voltage signal output by the driving power supply 10 can be flexibly set, which is suitable for testing a variety of different specifications of the power devices 30 under test. A test fixture 22 and a driving circuit 21 for connecting the power device 30 under test are set on the universal driving board 20. The driving power supply 10 is connected to the driving circuit 21 to apply a driving voltage to the power device 30 under test, so as to test the power device 30 under test, thereby improving the versatility of the driving system for testing the power device, thereby avoiding customization of the driving system for testing the power device according to the type of the power device 30 under test, and reducing the cost of the driving system.

[0046] In some embodiments, Figure 1 As shown, the driving power supply 10 includes a plurality of voltage modulators 12 , a control end of each of the voltage modulators 12 is connected to the controller 11 , and each of the voltage modulators 12 is connected to a driving circuit 21 .

[0047] Specifically, the driving power supply 10 includes multiple voltage modulators 12, each of which can output a voltage signal, so that the driving power supply 10 can output multiple voltage values ​​at the same time, and each of the voltage modulators 12 is connected to the controller 11, so that the controller 11 can control the output voltage of each of the voltage modulators 12, so that the driving power supply 10 can be connected to multiple driving circuits 21 to provide power support for the multiple driving circuits 21, so that the driving circuit 21 outputs a driving voltage to the power device 30 under test, thereby improving the practicality of the driving power supply 10, and further improving the practicality of the driving system.

[0048] In some embodiments, the voltage modulator 12 includes a power circuit 121 and a feedback circuit 122, the control end of the power circuit 121 is connected to the controller 11, the power circuit 121 outputs a voltage signal, and the feedback circuit 122 is located between the output end of the power circuit 121 and the controller 11 to feed back the voltage signal output by the power circuit 121 to the controller 11.

[0049] Specifically, the power circuit 121 is used to generate a corresponding voltage according to the voltage value signal sent by the controller 11. The output end of the power circuit 121 is the output end of the voltage modulator 12. The feedback circuit 122 is used to feed back the voltage of the output end of the power circuit 121 to the controller 11, so that the controller 11 can adjust the electrical signal sent to the control end of the power circuit 121 according to the signal fed back by the feedback circuit 122, so as to reduce the error between the output voltage of the power circuit 121 and the target voltage, thereby improving the stability of the driving power supply 10.

[0050] In addition, the controller 11 sends the electrical signal received from the feedback circuit 122 to the user interaction interface for display, so that the user can understand the output voltage of the voltage modulator 12 in real time.

[0051] It should be noted that the voltage modulator 12 includes two groups of power circuits 121 and feedback circuits 122, wherein one of the power circuits 121 generates a positive voltage signal and a live wire signal, and the other power circuit 121 generates a negative voltage signal and a live wire signal, and the corresponding feedback circuit 122 is connected to the two signals at the same time for feedback, and the live wire signals generated by the two power circuits 121 are output from the same end.

[0052] In this embodiment, the voltage modulator 12 includes a power circuit 121 and a feedback circuit 122. The controller 11 of the power circuit 121 is connected to the controller 11 to output a voltage signal according to the electrical signal of the controller 11. The feedback circuit 122 feeds back the output voltage signal of the power circuit 121 to the controller 11, so that the controller 11 can adjust the output voltage of the power circuit 121 according to the output voltage signal of the power circuit 121, so that the output voltage stability of the power circuit 121 is improved, thereby improving the output stability of the voltage modulator 12 and the driving power supply 10, which is beneficial to the practicality of the driving system.

[0053] In some embodiments, Figure 4 As shown, the driving circuit 21 includes an inductive load 211, a dual pulse circuit 212 and a DC circuit 213. The DC circuit 213 is connected to the driving power supply 10. The dual pulse circuit 212 and the DC circuit 213 are respectively used to connect to the gate and source of a power device 30 under test. The inductive load 211 is connected in parallel with the power device 30 under test connected to the DC circuit 213.

[0054] Specifically, the double pulse circuit 212 is used to test a power device 30 under test, and the DC circuit 213 is used to test another power device 30 under test. The driving power supply 10 is connected to the DC circuit 213 to provide power support for the DC circuit 213. The two power devices 30 under test are arranged in series, and the source of the power device 30 under test connected to the DC circuit 213 is connected to the positive terminal of the driving power supply 10, and the gate of the power device 30 under test is connected to the negative terminal of the driving power supply 10. The drain of the power device 30 under test is connected to the negative terminal of the driving power supply 10. The electrode is used to be connected to the positive terminal of the high-voltage source of the two power devices 30 under test, one end of the inductive load 211 is connected to the drain of the power device 30 under test, and the other end is connected to the source of the power device 30 under test, so as to realize parallel connection with the power device 30 under test, the source of the power device 30 under test connected to the double-pulse circuit 212 is connected to the negative terminal of the high-voltage source of the two power devices 30 under test, and the drain of the power device 30 under test is connected to the source of another power device 30 under test, that is, the series connection of the two power devices 30 under test is realized.

[0055] When the gate of the power device under test 30 connected to the DC circuit 213 is connected to the negative terminal of the driving power supply 10, the power device under test 30 remains in the off state. When the gate of the power device under test 30 connected to the dual pulse circuit 212 is a dual pulse signal, when the pulse signal is high, the power device under test 30 is in the on state, and when the pulse signal is low, the power device under test 30 is in the off state. When the power device 30 under test connected to the dual pulse circuit 212 is in the on state, the current at the positive end of the high voltage source flows into the negative end of the high voltage source via the inductive load 211 and the on power device 30 under test to form a loop, so that the testing device 60 can test the performance parameters of the on power device 30 under test; when the power device 30 under test connected to the dual pulse circuit 212 is in the off state, the current of the high voltage source cannot form a loop, and flows into the source of the power device 30 under test connected to the DC circuit 213 via the inductive load 211, so that the source, drain and gate of the power device 30 under test all have charges, which facilitates the testing device 60 to test the performance parameters of the power device 30 under test.

[0056] In this embodiment, the driving circuit 21 drives the two power devices under test 30 through the inductive load 211, thereby facilitating the testing of the two power devices under test 30. The dual-pulse circuit 212 can apply two voltages to the power device under test 30 connected thereto to realize the on and off of the power device under test 30. The power device under test 30 connected to the DC circuit 213 can change its state synchronously according to the state of the power device under test 30 connected to the dual-pulse circuit 212, thereby facilitating the testing device 60 to test its performance parameters. The driving circuit 21 can simultaneously test the different performance parameters of the two power devices under test 30, thereby greatly improving the testing efficiency and reducing the testing cost.

[0057] In some embodiments, the driving system further includes a dual pulse generation controller 4011 connected to the dual pulse circuit 212 .

[0058] Specifically, the dual pulse generation controller 4011 is the power source of the dual pulse circuit 212, and is used to output a dual pulse signal, thereby turning on or off the power device 30 under test connected to the dual pulse circuit 212.

[0059] In this embodiment, the dual pulse generation controller 4011 is the power source of the dual pulse circuit 212 in the driving circuit 21, and is used to output a dual pulse signal to facilitate the testing of the performance parameters of the power device 30 under test connected to the dual pulse circuit 212 under the action of the dual pulse signal.

[0060] In some embodiments, Figure 2 As shown, the universal driving board 20 is provided with a driving power input interface 23 and a dual pulse signal interface 24 , the driving power input interface 23 is connected to the DC circuit 213 , and the dual pulse signal interface 24 is connected to the dual pulse circuit 212 .

[0061] Specifically, the driving circuit 21 is located on the universal driving board 20, and the driving circuit 21 includes the dual pulse circuit 212 and the DC circuit 213. The dual pulse circuit 212 needs to be connected to the dual pulse generating controller 4011, and the DC circuit 213 needs to be connected to the driving power supply 10. The universal driving board 20 is provided with the driving power supply input interface 23 connected to the DC circuit 213, and the dual pulse signal interface 24 connected to the dual pulse circuit 212, which can facilitate the connection between the universal driving board 20 and the driving power supply 10 and the dual pulse generating controller 4011, thereby improving the efficiency of the driving system when testing the power device 30 under test, which is beneficial to improving the practicality of the driving system.

[0062] It should be noted that the output end of the driving power supply 10 is provided with a driving power supply output interface adapted to the driving power supply input interface 23 , so as to facilitate the connection between the driving power supply 10 and the universal driving board 20 .

[0063] In some embodiments, Figure 2 As shown, the universal driving board 20 includes a plurality of groups of connected driving circuits 21 and test fixtures 22 .

[0064] Specifically, the universal driving board 20 is provided with a connected driving circuit 21 and a test fixture 22, and the test fixture 22 is used to connect with the power device 30 under test, so that the driving circuit 21 drives the power device 30 under test and completes the test. The driving circuit 21 and the test fixture 22 are arranged on the universal driving board 20 so that the electrical components of the driving circuit 21 and the connection relationship between them can be fixed, which is conducive to improving the test efficiency of the driving system in testing the power device 30 under test. Accordingly, the universal driving board 20 includes a plurality of groups of connected driving circuits 21 and test fixtures 22, which can further improve the test efficiency of the universal driving board 20 in testing the power device 30 under test, achieve the technical effect of batch testing the power device 30 under test, and help improve the practicality and promotion of the driving system.

[0065] In some embodiments, Figure 2 As shown, the universal driving board 20 further includes a driving power filter circuit 25 , and the driving power filter circuit 25 is connected to the driving power 10 , and the driving power 10 is connected to the driving circuit 21 through the driving power filter circuit 25 .

[0066] Specifically, the filter circuit of the driving circuit 21 can filter out the ripples in the output voltage of the driving power supply 10, reduce the AC component in the DC voltage output by the driving power supply 10, retain the DC component, reduce the output voltage ripple coefficient, and make the waveform smoother, which is beneficial for the driving power supply 10 to better act on the driving circuit 21 and is beneficial to improving the practicality of the driving system.

[0067] Based on the same inventive concept, the present application also provides a testing system, such as Figure 3 and Figure 4 As shown, it includes the driving system for testing the power device mentioned above, a high voltage power supply 50 and a testing device 60 , wherein the high voltage power supply 50 and the testing device 60 are both connected to the testing fixture 22 to be connected to the power device 30 under test through the testing fixture 22 .

[0068] Specifically, the high-voltage power supply 50 is the power source of the power device under test 30 . When the power device under test 30 is turned on, the high-voltage power supply 50 and the power device under test 30 can form a loop, thereby facilitating the test device 60 to test the power device under test 30 .

[0069] It should be noted that the driving system can test different performance parameters of two power devices 30 under test at the same time. Therefore, the testing device 60 includes two testing modules, which are respectively connected to the two power devices 30 under test.

[0070] In this embodiment, the high-voltage power supply 50 is the power source of the power device under test 30, the driving system is the driving structure of the power device under test 30, and is connected to the gate of the power device under test 30. The testing device 60 is used to test the performance parameters of the power device under test 30 under different states, thereby realizing the testing of the power device under test 30. The testing is performed through the driving system, which can greatly improve the testing efficiency. At the same time, the versatility of the driving system can reduce the testing cost of the testing system.

[0071] Based on the same inventive concept, the present application also provides a testing method, using the testing system as described above, such as Figure 5 As shown, the test method includes:

[0072] Step S101, installing the power device 30 under test on the test fixture 22 of the universal driving board 20;

[0073] Specifically, the power device under test 30 is connected to the driving circuit 21. Since the test fixture 22 has an installation position for the power device under test 30 and is connected to the driving circuit 21, the power device under test 30 can be installed on the test fixture 22 of the universal driving board 20 to achieve the connection between the power device under test 30 and the driving circuit 21.

[0074] It should be noted that the test fixture 22 includes two installation positions, so the two power devices under test 30 are installed on the test fixture 22 in sequence, wherein the installation position of the power device under test 30 is related to the performance parameters of its test, therefore, the test fixture 22 is marked with the test type, based on the marking on the test fixture 22 and the test type of the power device under test 30, the two power devices under test 30 are installed at the corresponding positions of the test fixture 22.

[0075] Step S102, connecting the driving circuit 21 of the universal driving board 20 and the driving power supply 10;

[0076] Specifically, the universal driving board 20 is connected to the driving power source 10 , so that the driving power source 10 is connected to the driving circuit 21 .

[0077] It should be noted that the driving power supply 10 is connected to the driving power supply 10 interface of the universal driving board 20 to achieve connection with the driving circuit 21. Two power devices 30 under test are installed on the test fixture 22, and the driving circuit 21 also needs to be connected to the double pulse generation controller 4011 to act on the gate of one power device 30 under test with the driving power supply 10 respectively.

[0078] Step S103, connecting the high voltage power supply 50 and the test device 60 to the test fixture 22 respectively;

[0079] Specifically, the high-voltage power supply 50 and the testing device 60 are both connected to the power device under test 30 through the testing fixture 22, the testing device 60 is connected in parallel with the power device under test 30 to test the performance parameters of the power device under test 30, and the high-voltage power supply 50 is connected in series with the power device under test 30 to output voltage to the power device under test 30.

[0080] Step S104, based on the specification of the power device 30 under test, input a voltage value to the controller 11 of the driving power supply 10, so that the controller 11 controls the voltage modulator 12 to output a corresponding voltage value;

[0081] Specifically, the gate of the power device under test 30 is connected to the driving power supply 10, so the output voltage of the driving power supply 10 acts on the gate of the power device under test 30. According to the specifications and type of the power device under test 30, the output voltage of the driving power supply 10 is controlled to make the driving power supply 10 adapt to the power device under test 30, thereby facilitating testing.

[0082] It should be noted that the output voltage value of the driving power supply 10 is the voltage value output by the voltage modulator 12 , and the output value of the voltage modulator 12 is related to the controller 11 . Therefore, the output voltage of the driving power supply 10 can be controlled by the controller 11 .

[0083] Step S105 , starting the testing device 60 to test the parameters of the power device 30 under test.

[0084] Specifically, after the test system is connected, the test device 60 can be started to complete the test of the power device 30 under test.

[0085] In this embodiment, the testing method of the testing system is clarified, so that the testing process of the power device 30 under test is safe and effective, and the output voltage value of the driving power supply 10 can be flexibly adjusted according to the parameters of the power device 30 under test, thereby improving the practicality of the testing system.

[0086] Those skilled in the art should understand that the discussion of any of the above embodiments is merely illustrative and is not intended to imply that the scope of the present application (including the claims) is limited to these examples. In line with the present invention, the technical features in the above embodiments or different embodiments may be combined, the steps may be implemented in any order, and there are many other variations of the different aspects of the present invention as described above, which are not provided in detail for the sake of simplicity.

[0087] The embodiments of the present invention are intended to cover all such substitutions, modifications and variations that fall within the broad scope of the appended claims. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A driving system for testing a power device, characterized in that: include: A driving power supply comprises a controller and a voltage modulator, wherein the controller is connected to a control end of the voltage modulator, and an output end of the voltage modulator outputs a voltage signal; A universal driving board, comprising a test fixture and a driving circuit, wherein the driving circuit is connected to the test fixture, and the test fixture is used to connect a power device under test; The voltage modulator of the driving power supply is connected to the driving circuit to provide voltage to the driving circuit.

2. The driving system for testing a power device according to claim 1, characterized in that: The driving power supply includes a plurality of voltage modulators, a control end of each of the voltage modulators is connected to the controller, and each of the voltage modulators is connected to a driving circuit.

3. The driving system for testing a power device according to claim 1, characterized in that: The voltage modulator includes a power circuit and a feedback circuit. The control end of the power circuit is connected to the controller. The power circuit outputs a voltage signal. The feedback circuit is located between the output end of the power circuit and the controller to feed back the voltage signal output by the power circuit to the controller.

4. The driving system for testing a power device according to claim 1, characterized in that: The driving circuit includes an inductive load, a dual-pulse circuit and a DC circuit. The DC circuit is connected to the driving power supply. The dual-pulse circuit and the DC circuit are respectively used to connect to the gate and source of a power device under test. The inductive load is connected in parallel to the power device under test connected to the DC circuit.

5. The driving system for testing a power device according to claim 4, characterized in that: It also includes a double pulse generation controller connected to the double pulse circuit.

6. The driving system for testing a power device according to claim 4, characterized in that: The universal driving board is provided with a driving power input interface and a dual pulse signal interface, the driving power input interface is connected to the DC circuit, and the dual pulse signal interface is connected to the dual pulse circuit.

7. The driving system for testing a power device according to claim 1, characterized in that: The universal driving board includes a plurality of groups of connected driving circuits and test fixtures.

8. The driving system for testing a power device according to claim 1, characterized in that: The universal driving board further comprises a driving power supply filter circuit, wherein the driving power supply filter circuit is connected to the driving power supply, and the driving power supply is connected to the driving circuit via the driving power supply filter circuit.

9. A testing system, characterized in that: The invention comprises a driving system for testing a power device according to any one of claims 1 to 8, a high-voltage power supply and a testing device, wherein the high-voltage power supply and the testing device are both connected to a testing fixture so as to be connected to the power device under test through the testing fixture.

10. A testing method, characterized in that: Using the test system as claimed in claim 9, the test method comprises: Install the power device under test on the test fixture of the universal driver board; Connecting the driving circuit of the universal driving board to the driving power supply; Respectively connecting the high voltage power supply and the test device to the test fixture; Based on the specifications of the power device under test, input a voltage value to the controller of the driving power supply so that the controller controls the voltage modulator to output a corresponding voltage value; The testing device is started to test the parameters of the power device under test.

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