TF card external power supply testing device and method and storage medium

Abstract

The invention provides a TF card external power supply testing device and method and a storage medium, and relates to the technical field of testing, and the TF card external power supply testing device comprises a control module, a data acquisition module, a power supply module, a testing module and a display module; the control module is used for acquiring the output voltage and the output current of the power supply module, updating the output voltage and the output current of the power supply module according to the output data and the performance data acquired by the data acquisition module, and generating a test report according to the performance data; the test module is used for carrying out an external power supply test on the TF card to be tested based on the output voltage and the output current provided by the power supply module; the display module is used for receiving and displaying the test report sent by the control module. According to the embodiment of the invention, any power supply condition can be simulated within a certain range to carry out external power supply testing, the requirements of comprehensive power supply compatibility and stability testing on the TF card are met, the testing efficiency is improved, meanwhile, a testing report can be displayed, and the convenience of equipment is improved.

Description

Technical Field

[0001] The present invention relates to the field of testing technology, and in particular to a TF card external power supply testing device, method and storage medium. Background Art

[0002] The working power of TF (MicroSD card) card is usually provided by the electronic device itself, and its power compatibility and stability have a crucial impact on the reading and writing performance and data security of TF card. Therefore, it is an important part to improve the overall performance of electronic devices to conduct comprehensive power compatibility and stability tests on TF card to ensure its reliable operation under different power conditions.

[0003] At present, the following two methods are generally used to test the power compatibility and stability of TF cards: one is to directly use the built-in power system of electronic equipment to test the TF card. This method is simple and easy, but it can only simulate a limited variety of power conditions and cannot meet the needs of comprehensive testing; the other is to use programmable power equipment to test the TF card. This method can simulate a variety of power conditions, but requires professional equipment and operating skills, has a high test cost and low efficiency, and is not suitable for widespread promotion and use. Summary of the invention

[0004] In view of this, the purpose of the present invention is to provide a TF card external power supply testing device, method and storage medium. By setting a control module, the output voltage and output current of the power module can be obtained, and any power supply condition can be simulated within a certain range to perform an external power supply test, thereby meeting the needs of comprehensive power supply compatibility and stability testing of the TF card, improving the test efficiency, and being able to display the test report, thereby improving the convenience of the equipment.

[0005] In a first aspect, an embodiment of the present invention provides a TF card external power supply test device, comprising: a control module, a data acquisition module, a power module, a test module and a display module; the control module is respectively connected to the data acquisition module, the power module and the display module, the power module is connected to the test module, and the data acquisition module is connected to the power module;

[0006] The control module is used to obtain the output voltage and output current of the power module, and update the output voltage and output current of the power module according to the output data and performance data collected by the data acquisition module, and generate a test report according to the performance data;

[0007] The power module is used to provide voltage and current to the test module according to the output voltage and the output current;

[0008] The data acquisition module is used to collect the output data of the power module and the performance data of the TF card to be tested;

[0009] The test module is used to perform an external power supply test on the TF card to be tested based on the output voltage and output current provided by the power module;

[0010] The display module is used to receive and display the test report sent by the control module.

[0011] In a preferred embodiment of the present invention, the power module includes an adjustable voltage module and an adjustable current module;

[0012] Among them, the adjustable voltage module is used to control the output voltage of the power module;

[0013] The adjustable current module is used to control the output current of the power module.

[0014] In a preferred embodiment of the present invention, the above device further comprises a keyboard input module for inputting a test voltage and a test current; the keyboard input module is connected to the control module;

[0015] The control module is also used to receive the test voltage and test current sent by the keyboard input module and set them as the output voltage and output current of the power module.

[0016] In a preferred embodiment of the present invention, the keyboard input module is also used to input a preset voltage and a preset current;

[0017] The control module is further used to receive the preset voltage and preset current sent by the keyboard input module, set the output voltage and output current of the power module to 0, and send the preset voltage and preset current to the test module;

[0018] The test module is also used to provide a preset voltage and a preset current for the TF card to be tested, and to perform an external power supply test.

[0019] In a preferred embodiment of the present invention, the test module includes a power supply interface, a constant voltage module and a constant current module;

[0020] The power interface is used to connect the TF card to be tested;

[0021] The constant voltage module is used to provide a preset voltage for the TF card to be tested;

[0022] The constant current module is used to provide a preset current for the TF card to be tested.

[0023] In a preferred embodiment of the present invention, the above-mentioned test module includes a test equipment interface and a signal test interface;

[0024] Wherein, the test equipment interface is used to connect the test equipment;

[0025] The signal test interface is used to connect the signal display device.

[0026] In a second aspect, an embodiment of the present invention further provides a TF card external power supply testing method, which is applied to the control module in claim 1, and the method comprises:

[0027] Get the output voltage and output current of the power module;

[0028] Send the output voltage and output current to the power module to control the power module to provide voltage and current for the external power supply test of the TF card to be tested;

[0029] Receive output data and performance data fed back by the data acquisition module;

[0030] According to the comparison result between the output data and the performance data, the output voltage and the output current are updated;

[0031] Return to execute and send the output voltage and output current to the power module to control the power module to provide voltage and current for the external power test of the TF card to be tested until the external power test is completed;

[0032] A test report is generated according to the performance data, and the test report is sent to the display module to display the test report.

[0033] In a preferred embodiment of the present invention, the updating of the output voltage and the output current according to the comparison result between the output data and the performance data comprises:

[0034] Comparing the actual voltage in the output data with the operating voltage in the performance data to obtain a first comparison result;

[0035] According to the first comparison result, updating the output voltage;

[0036] Comparing the actual current in the output data with the working current in the performance data to obtain a second comparison result;

[0037] The output current is updated according to the second comparison result.

[0038] In a preferred embodiment of the present invention, the above performance data generates a test report, and sends the test report to a display module to display the test report, including:

[0039] Comparing the actual voltage in the performance data with the voltage threshold range to obtain a third comparison result;

[0040] When the third comparison result is that the actual voltage is outside the voltage threshold range, determining that the test result is a voltage abnormality;

[0041] Comparing the actual current in the performance data with the current threshold to obtain a fourth comparison result;

[0042] When the fourth comparison result is that the actual current is greater than the current threshold, determining that the test result is abnormal current;

[0043] The test result is sent as a test report to the display module to display the test report.

[0044] In a third aspect, an embodiment of the present invention further provides a computer-readable storage medium, which stores computer-executable instructions. When the computer-executable instructions are called and executed by a processor, the computer-executable instructions prompt the processor to implement the TF card external power supply test method of the second aspect above.

[0045] The embodiments of the present invention bring the following beneficial effects:

[0046] The embodiment of the present invention provides a TF card external power supply testing device. By arranging a control module and a power supply module in the device, the output voltage and output current of the power supply module can be directly set through the control module, and any power supply condition can be simulated within a certain range to perform an external power supply test, thereby meeting the needs of performing a comprehensive power supply compatibility and stability test on the TF card. There is no need for programming control, which improves the test efficiency. The operation is simple and easy to use. Through modular design, the maintenance and upgrade of the device are convenient, the cost of the device is reduced, and the test report can be displayed, thereby improving the convenience of using the device.

[0047] Other features and advantages of the present invention will be set forth in the following description, or some features and advantages may be inferred or unambiguously determined from the description, or may be learned by implementing the above-mentioned technology of the present invention.

[0048] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, preferred embodiments are given below and described in detail with reference to the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0049] In order to more clearly illustrate the specific implementation methods of the present invention or the technical solutions in the prior art, the drawings required for use in the specific implementation methods or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some implementation methods of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0050] Figure 1a A schematic diagram of the structure of a TF card external power supply testing device provided by an embodiment of the present invention;

[0051] Figure 1b A circuit diagram of a control module provided by an embodiment of the present invention;

[0052] Figure 1cA circuit diagram of a data acquisition module provided by an embodiment of the present invention;

[0053] Figure 2a A schematic diagram of the structure of another TF card external power supply testing device provided by an embodiment of the present invention;

[0054] Figure 2b A circuit diagram of a constant voltage module provided by an embodiment of the present invention;

[0055] Figure 2c A circuit diagram of a constant current module provided by an embodiment of the present invention;

[0056] Figure 2d A circuit diagram of a power module provided by an embodiment of the present invention;

[0057] Figure 3 A flowchart of another TF card external power supply testing method provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0058] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0059] With the development of science and technology, the functions of electronic devices are becoming more and more diversified. Among them, TF card (MicroSD card), as a small storage medium, is widely used in various electronic devices such as mobile phones, cameras, tablets, etc. The working power of TF card is usually provided by the electronic device itself, and its power compatibility and stability have a crucial impact on the reading and writing performance and data security of TF card. Therefore, it is an important part of improving the overall performance of electronic devices to conduct comprehensive power compatibility and stability tests on TF card to ensure its reliable operation under different power conditions.

[0060] At present, the following two methods are generally used to test the compatibility and stability of TF card power supply: one is to directly use the built-in power supply system of the electronic device to test the TF card. This method is simple and easy, but it can only simulate a limited variety of power supply conditions and cannot meet the needs of comprehensive testing; the other is to use programmable power supply equipment to test the TF card. This method can simulate a variety of power supply conditions. Due to the lack of professional equipment specifically for testing TF card external power supplies on the market, the test efficiency is low and the accuracy of the results is difficult to guarantee.

[0061] Based on this, a TF card external power supply testing device provided by an embodiment of the present invention can set a control module and a power module in the device, and can directly set the output voltage and output current of the power module through the control module, and can simulate any power supply condition within a certain range to perform an external power supply test, thereby meeting the needs of comprehensive power supply compatibility and stability testing of the TF card. There is no need for programming control, which improves the test efficiency, is simple to operate, and is easy to use. Through modular design, it is convenient for maintenance and upgrading of the device, and the cost of the device is reduced. At the same time, the test report can be displayed, which improves the convenience of using the device.

[0062] To facilitate understanding of this embodiment, a TF card external power supply testing device disclosed in an embodiment of the present invention is first introduced in detail.

[0063] Example 1

[0064] The embodiment of the present invention provides a TF card external power supply testing device, Figure 1a A schematic diagram of a TF card external power supply test device provided by an embodiment of the present invention is shown in FIG. Figure 1a As shown, the TF card external power supply test device may include: a control module 101, a data acquisition module 102, a power module 103, a test module 104 and a display module 105; the control module 101 is connected to the data acquisition module 102, the power module 103 and the display module 105 respectively, the power module 103 is connected to the test module 104, and the data acquisition module 102 is connected to the power module 103;

[0065] The control module 101 is used to obtain the output voltage and output current of the power module, and update the output voltage and output current of the power module according to the output data and performance data collected by the data acquisition module, and generate a test report according to the performance data;

[0066] Figure 1b A circuit diagram of a control module provided by an embodiment of the present invention, such as Figure 1b As shown, PWMA and PWMB are input signals of the control module, which are used to receive the output voltage and output current of the power module, and OUTA and OUTB are output signals of the control module, which are used to control the power module to provide voltage and current to the test module according to the output voltage and output current.

[0067] The power supply module 103 is used to provide voltage and current to the test module according to the output voltage and output current;

[0068] The data acquisition module 102 is used to collect the output data of the power module and the performance data of the TF card to be tested;

[0069] Figure 1cA circuit diagram of a data acquisition module provided by an embodiment of the present invention, such as Figure 1c As shown, the data acquisition module includes circuits of two chips, U4 and U5. The circuit of the U4 chip is used to collect the output data of the power module, wherein V OUT refers to the output signal of the power module, PB14, I2C2 SDA and I2C2 SDL refer to the output signals of the data acquisition module, and are used to send the collected output data of the power module to the control module. The circuit of the U5 chip is used to collect the performance data of the TF card to be tested, wherein V OUT refers to the input signal of the test module, PB15, I2C1 SDA and I2C1 SDL refer to the output signals of the data acquisition module, and are used to send the collected output data of the TF card to be tested to the control module. Since the output end of the power module is electrically connected to the input end of the test module, the output signal of the power module is the same signal as the input signal of the test module.

[0070] The test module 104 is used to perform an external power supply test on the TF card to be tested based on the output voltage and output current provided by the power module;

[0071] The display module 105 is used to receive and display the test report sent by the control module.

[0072] The TF card to be tested refers to a TF card that needs to be tested with an external power supply. The external power supply test refers to using a power supply outside the TF card to provide different voltages and currents to the TF card, thereby testing the working state of the TF card under different voltages and currents, and obtaining test results. The test results are used to describe the working state of the TF card to be tested. The test results include working state and fault diagnosis results. The working state includes normal and fault, wherein normal means that the TF card to be tested works normally. Fault means that the TF card to be tested fails and cannot work normally. Furthermore, the fault may also include voltage abnormality and current abnormality, wherein voltage abnormality means that there is a problem with the voltage of the TF card to be tested. Current abnormality means that there is a problem with the current of the TF card to be tested. The fault diagnosis result is used to describe the cause of the fault. Exemplary fault diagnosis results may include voltage too high, voltage too low, current too large, and current too small.

[0073] The working principle of the device is as follows:

[0074] When the user uses the TF card external power supply test device to test the external power supply, the output voltage and output current of the power supply module are input to the TF card external power supply test device, that is, the output voltage and output current of the power supply are sent to the control module. The output voltage and output current can be any voltage value within the preset range. Exemplarily, the preset range for the output voltage can be 0V to 5V, so the user can use any voltage value as the output voltage within the range of 0V to 5V. Further, the output voltage can be 2.5V or 3V. The control module sends the received output voltage and output current of the power supply module to the power supply module, and the power supply module provides voltage and current to the test module according to the received output voltage and output current. That is, the voltage input to the test module is the output voltage of the power supply module, and the current input to the test module is the input current. The test module tests the TF card to be tested based on the voltage and current provided by the power supply module. During the test, the data acquisition module collects output data from the output end of the power supply module, collects performance data of the TF card to be tested from the input end of the test module, and sends the collected output data and performance data to the control module. The control module compares the output data and the performance data to obtain a comparison result, and generates a test report according to the comparison result. The control module sends the test report to the display module, and the display module displays the test report.

[0075] It is understandable that the output data includes the voltage and current actually output by the power module, and the performance data includes the voltage and current actually input by the test module. The control module compares the voltage actually output by the power module with the voltage actually input by the test module. If the voltage actually output by the power module is the same as the voltage actually input by the test module, or the difference between the voltage actually output by the power module and the voltage actually input by the test module is within the preset voltage error range, it indicates that the TF card to be tested is working properly and the test result is normal. If the voltage actually output by the power module is not the same as the voltage actually input by the test module, and the difference between the voltage actually output by the power module and the voltage actually input by the test module is outside the preset voltage error range, it indicates that the TF card to be tested cannot work properly, and the working state included in the test result is fault, and the fault diagnosis result is that the voltage is too high or the voltage is too low. In the same principle, the control module compares the current actually output by the power module with the current actually input by the test module. If the current actually output by the power module is the same as the current actually input by the test module, or the difference between the current actually output by the power module and the current actually input by the test module is within the preset current error range, it indicates that the TF card to be tested is working properly and the test result is normal. If the current actually output by the power module is different from the current actually input by the test module, and the difference between the current actually output by the power module and the current actually input by the test module is outside the preset current error range, it indicates that the TF card to be tested cannot work normally, and the test results include the working state as fault, and the fault diagnosis result as overcurrent or undercurrent.

[0076] Furthermore, the TF card external power supply test device also includes a protection module, which may include an overvoltage protection circuit, an undervoltage protection circuit, an overcurrent protection circuit, and a short circuit protection circuit to ensure safety and reliability during the test. These protection circuits can prevent device damage and personal injury caused by power supply abnormalities or load abnormalities. The protection module is connected to the control module and the test module respectively.

[0077] Furthermore, the TF card external power supply test device also includes a 5-12V DC power input module, which is used to provide power to the control module to ensure the normal operation of the control module.

[0078] A TF card external power supply testing device provided by an embodiment of the present invention can directly set the output voltage and output current of the power supply module through the control module by arranging a control module and a power supply module in the device, and can simulate any power supply condition within a certain range to perform an external power supply test, thereby meeting the demand for comprehensive power supply compatibility and stability testing of the TF card, and does not require programming control, thereby improving the test efficiency, being simple to operate, and being easy to use. Through a modular design, the maintenance and upgrading of the device is facilitated, and the cost of the device is reduced. At the same time, the test report can be displayed, thereby improving the convenience of using the device.

[0079] Example 2

[0080] The embodiment of the present invention also provides another TF card external power supply testing device; the device is implemented on the basis of the device in the above embodiment.

[0081] Figure 2a A schematic diagram of the structure of another TF card external power supply testing device provided by an embodiment of the present invention is shown in FIG. Figure 2a As shown, the TF card external power supply test device also includes a keyboard input module 106 for inputting a test voltage and a test current; the keyboard input module 106 is connected to the control module 101;

[0082] The control module is also used to receive the test voltage and test current sent by the keyboard input module and set them as the output voltage and output current of the power module.

[0083] The user inputs the output voltage and output current of the power module to the control module through the keyboard input module, and can set the output voltage and output current of the power module arbitrarily according to actual needs without programming control, which improves the convenience of using the device and improves the test efficiency.

[0084] Furthermore, the keyboard input module is also used to input a preset voltage and a preset current;

[0085] The control module is further used to receive the preset voltage and preset current sent by the keyboard input module, set the output voltage and output current of the power module to 0, and send the preset voltage and preset current to the test module;

[0086] The test module is also used to provide a preset voltage and a preset current for the TF card to be tested, and to perform an external power supply test.

[0087] The test module includes a power supply interface, a constant voltage module and a constant current module;

[0088] The power interface is used to connect the TF card to be tested;

[0089] The constant voltage module is used to provide a preset voltage for the TF card to be tested;

[0090] The constant current module is used to provide a preset current for the TF card to be tested.

[0091] The constant voltage module refers to a pre-set module for providing voltage to the TF card to be tested. Through the constant voltage module, only certain fixed voltage values ​​can be provided to the TF card to be tested. The preset voltage refers to the voltage that the constant voltage module can provide. The preset voltage may include 2.8V, 3V, and 3.3V. For voltages not included in the preset voltage, they can be provided by the power module. The constant current module refers to a pre-set module for providing current to the TF card to be tested.

[0092] The constant current module can only provide a few fixed current values ​​for the TF card to be tested. The preset current refers to the current that the constant current module can provide. It is understandable that when the TF card to be tested is tested with an external power supply, some commonly used voltages and currents can be directly provided by the constant voltage module and the constant current module without the need to use the power module, which increases the flexibility of the external power supply test.

[0093] Figure 2b A circuit diagram of a constant voltage module provided by an embodiment of the present invention is shown in FIG. Figure 2b As shown, the constant voltage module includes circuits of three chips, U1, U2 and U3. In U1, VCC 5V refers to the input voltage of the constant voltage module, which can be provided by an external power supply. VCC 33V refers to the output voltage of the constant voltage module, which can output a voltage of 3.3V to the TF card to be tested. LOD EN is the enable signal of the chip, and the control module can control the U1 circuit to output a voltage of 3.3V for the TF card to be tested through the LOD EN signal. In U2, VCC 3V refers to the output voltage of the constant voltage module, which can output a voltage of 3V to the TF card to be tested. LOD EN is the enable signal of the chip, and the control module can control the U2 circuit to output a voltage of 3.3V for the TF card to be tested through the LOD EN signal. In U3, VCC28V refers to the output voltage of the constant voltage module, which can output a voltage of 2.8V to the TF card to be tested. LOD EN is the enable signal of the chip, and the control module can control the U3 circuit to output a voltage of 3.3V for the TF card to be tested through the LOD EN signal.

[0094] Figure 2c A circuit diagram of a constant current module provided by an embodiment of the present invention is shown in FIG. Figure 2c As shown, SDIO_VCC is used to output a preset current to the TF card to be tested. By shorting pins 1 and 2 in the 2*2 pins, shorting pins 3 and 4 in the 2*2 pins, and shorting pins 1 and 2 and pins 3 and 4 in the 2*2 pins at the same time, three different sizes of preset currents can be output to the TF card to be tested.

[0095] Furthermore, the power module 103 includes an adjustable voltage module and an adjustable current module;

[0096] Among them, the adjustable voltage module is used to control the output voltage of the power module;

[0097] The adjustable current module is used to control the output current of the power module.

[0098] Figure 2d A circuit diagram of a power module provided by an embodiment of the present invention is shown in FIG. Figure 2d As shown in FIG. 1 , OUTA and OUTB refer to the signals sent by the control module to the power module, which are used to control the output voltage and output current of the power module. VOUT refers to the actual output voltage and current signals of the power module. The data acquisition module is connected to the V OUT terminal to collect the output data of the power module.

[0099] Further, the test module includes a test equipment interface and a signal test interface;

[0100] Wherein, the test equipment interface is used to connect the test equipment;

[0101] The signal test interface is used to connect the signal display device.

[0102] The test equipment refers to a device that needs to use a TF card external power supply test device to perform an external power supply test, which can be an SD card, CF card, etc., which improves the applicability of the device. The signal display device is used to display the performance data of the TF card to be tested. Exemplarily, the signal display device can be an oscilloscope.

[0103] Example 3

[0104] The embodiment of the present invention provides a TF card external power supply testing method. Figure 3 The present invention provides a flowchart of a TF card external power supply testing method. Figure 3 As shown, the TF card external power supply test method may include the following steps:

[0105] Step S301, obtaining the output voltage and output current of the power module.

[0106] Specifically, the keyboard input module may be used to input the output voltage and output current of the power module into the control module.

[0107] Step S302: sending the output voltage and the output current to the power module to control the power module to provide voltage and current for the external power supply test of the TF card to be tested.

[0108] The control module sends the output voltage and output current to the power module. After receiving the output voltage and output current, the power module provides voltage and current to the test module according to the values ​​of the output voltage and the output current.

[0109] Step S303: receiving output data and performance data fed back by the data acquisition module.

[0110] The data acquisition module collects output data and performance data once every period of time, and sends the output data and performance data to the control module. The output data includes actual voltage and actual current, where the actual voltage refers to the voltage actually output by the power module, and the data acquisition module can collect the actual voltage from the output end of the power module. The actual current refers to the current actually output by the power module, and the data acquisition module can collect the actual current from the output end of the power module. The performance data includes working voltage and working current. The working voltage refers to the actual voltage input to the TF card to be tested, and the data acquisition module can collect the working voltage from the input end of the test module. The working current refers to the actual current input to the TF card to be tested, and the data acquisition module can collect the working current from the input end of the test module.

[0111] Step S304: updating the output voltage and the output current according to the comparison result between the output data and the performance data.

[0112] The control module compares the received output data with the performance data and adjusts the output voltage and output current according to the comparison result.

[0113] Specifically, the output voltage and the output current may be updated through steps A1 to A4.

[0114] Step A1, comparing the actual voltage in the output data with the operating voltage in the performance data to obtain a first comparison result.

[0115] The first comparison result may be that the actual voltage is greater than the operating voltage, or may be that the actual voltage is less than the operating voltage.

[0116] Step A2: updating the output voltage according to the first comparison result.

[0117] When the actual voltage is greater than the working voltage, the output voltage can be adjusted down to reduce the actual voltage until the difference between the actual voltage and the working voltage is within the voltage error range, then the output voltage is stopped from being updated, and the reduction range can be determined based on the difference between the actual voltage and the working voltage. The voltage error range can be pre-set based on actual conditions.

[0118] When the actual voltage is lower than the working voltage, the output voltage can be increased to raise the actual voltage until the difference between the actual voltage and the working voltage is within the voltage error range, then the output voltage is stopped from being updated. The increase in magnitude can be determined based on the difference between the actual voltage and the working voltage.

[0119] Step A3: compare the actual current in the output data with the working current in the performance data to obtain a second comparison result.

[0120] The second comparison result may be that the actual current is greater than the working current, or may be that the actual current is less than the working current.

[0121] Step A4: updating the output current according to the second comparison result.

[0122] When the actual current is greater than the working current, the output current can be adjusted down to reduce the actual current until the difference between the actual current and the working current is within the current error range, then the output current is stopped from being updated, and the reduction range can be determined based on the difference between the actual current and the working current. The current error range can be pre-set based on actual conditions.

[0123] When the actual current is less than the working current, the output current can be increased to increase the actual current until the difference between the actual current and the working current is within the current error range, and then the output current is stopped from being updated. The increase in amplitude can be determined based on the difference between the actual current and the working current.

[0124] Step S305, returning to the execution to send the output voltage and the output current to the power module, so as to control the power module to provide voltage and current for the external power test of the TF card to be tested, until the external power test is completed.

[0125] In the process of updating the output voltage and output current, each time the output voltage and output current are updated, the data acquisition module can obtain the output data of the power module and the performance data of the TF card to be tested, so that the control module can execute steps A1-A4. If the difference between the actual voltage and the operating voltage is always outside the voltage error range, or the difference between the actual current and the operating current is always outside the current error range within the preset adjustment time range, it indicates that the TF card to be tested is faulty and the external power supply test is terminated. The preset adjustment time range can be a time range pre-set in the control module, or it can be input to the control module through the keyboard input module. An exemplary adjustment time range can be 2s.

[0126] Step S306: Generate a test report based on the performance data, and send the test report to the display module to display the test report.

[0127] Specifically, a test report may be generated and displayed through steps B1 to B5.

[0128] Step B1, comparing the actual voltage in the performance data with the voltage threshold range to obtain a third comparison result.

[0129] The third comparison result includes the actual voltage being within the voltage threshold range and the actual voltage being outside the voltage threshold range. The actual voltage being within the voltage threshold range includes the actual voltage being equal to the maximum value or the minimum value of the voltage threshold range. The voltage threshold range can be set according to actual conditions.

[0130] Step B2: When the third comparison result is that the actual voltage is outside the voltage threshold range, determine that the test result is a voltage abnormality.

[0131] When the actual voltage is outside the voltage threshold range, it indicates that the TF card to be tested is faulty. In this case, the test result is determined as voltage abnormality.

[0132] Step B3: Compare the actual current in the performance data with the current threshold to obtain a fourth comparison result.

[0133] The fourth comparison result includes that the actual current is less than or equal to the current threshold, and the actual current is greater than the current threshold. The current threshold can be set according to actual conditions.

[0134] Step B4: when the fourth comparison result is that the actual current is greater than the current threshold, determine that the test result is a current abnormality.

[0135] When the actual current is greater than the current threshold, it indicates that the TF card to be tested is faulty, and the test result is determined to be abnormal current.

[0136] Step B5, sending the test result as a test report to the display module to display the test report.

[0137] By comparing the output data and performance data, the device can automatically adjust the output voltage and output current, thereby reducing the error between the output data and the performance data, reducing the occurrence of misjudgment of TF card failures to be tested, and thus improving the accuracy of the test report.

[0138] Example 4

[0139] An embodiment of the present invention further provides a computer-readable storage medium, which stores computer-executable instructions. When the computer-executable instructions are called and executed by a processor, the computer-executable instructions prompt the processor to implement the above-mentioned TF card external power supply test method. The specific implementation can be found in the method embodiment, which will not be repeated here.

[0140] The computer program product for the TF card external power supply test method provided in the embodiment of the present invention includes a computer-readable storage medium storing a non-volatile program code executable by a processor. The instructions included in the program code can be used to execute the method in the previous method embodiment. The specific implementation can be referred to the method embodiment, which will not be repeated here.

[0141] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0142] In the several embodiments provided by the present invention, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. The device embodiments described above are only schematic. For example, the division of units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, and the indirect coupling or communication connection of devices or units can be electrical, mechanical or other forms.

[0143] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0144] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0145] If the function is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a non-volatile computer-readable storage medium that is executable by a processor. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the methods of each embodiment of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), disk or optical disk, etc. Various media that can store program codes.

[0146] Finally, it should be noted that the above embodiments are only specific implementations of the present invention, which are used to illustrate the technical solutions of the present invention, rather than to limit them. The protection scope of the present invention is not limited thereto. Although the present invention is described in detail with reference to the above embodiments, ordinary technicians in the field should understand that any technician familiar with the technical field can still modify the technical solutions recorded in the above embodiments within the technical scope disclosed by the present invention, or can easily think of changes, or make equivalent replacements for some of the technical features therein; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present invention, and should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention shall be based on the protection scope of the claims.

Claims

1. A TF card external power supply test device, characterized in that: include: A control module, a data acquisition module, a power module, a test module and a display module; the control module is connected to the data acquisition module, the power module and the display module respectively, the power module is connected to the test module, and the data acquisition module is connected to the power module; The control module is used to obtain the output voltage and output current of the power module, and update the output voltage and output current of the power module according to the output data and performance data collected by the data acquisition module, and generate a test report according to the performance data; The power supply module is used to provide voltage and current to the test module according to the output voltage and the output current; The data acquisition module is used to collect the output data of the power module and the performance data of the TF card to be tested; The testing module is used to perform an external power supply test on the TF card to be tested based on the output voltage and output current provided by the power module; The display module is used to receive and display the test report sent by the control module.

2. The device according to claim 1, characterized in that The power supply module includes an adjustable voltage module and an adjustable current module; Wherein, the adjustable voltage module is used to control the output voltage of the power module; The adjustable current module is used to control the output current of the power module.

3. The device according to claim 1, characterized in that The device also includes a keyboard input module for inputting a test voltage and a test current; the keyboard input module is connected to the control module; The control module is also used to receive the test voltage and the test current sent by the keyboard input module, and set them as the output voltage and output current of the power module.

4. The device according to claim 3, characterized in that The keyboard input module is also used to input a preset voltage and a preset current; The control module is further used to receive the preset voltage and the preset current sent by the keyboard input module, set the output voltage and the output current of the power module to 0, and send the preset voltage and the preset current to the test module; The test module is also used to provide the preset voltage and the preset current to the TF card to be tested, and perform an external power supply test.

5. The device according to claim 4, characterized in that The test module includes a power supply interface, a constant voltage module and a constant current module; The power interface is used to connect the TF card to be tested; The constant voltage module is used to provide a preset voltage for the TF card to be tested; The constant current module is used to provide a preset current for the TF card to be tested.

6. The device according to claim 1, characterized in that The test module includes a test equipment interface and a signal test interface; Wherein, the test equipment interface is used to connect the test equipment; The signal test interface is used to connect to a signal display device.

7. A TF card external power supply testing method, characterized in that: Applied to the control module in claim 1, the method comprises: Get the output voltage and output current of the power module; The output voltage and the output current are sent to the power module to control the power module to provide voltage and current for the external power supply test of the TF card to be tested; Receive output data and performance data fed back by the data acquisition module; updating the output voltage and the output current according to a comparison result between the output data and the performance data; Return to execute sending the output voltage and the output current to the power module, so as to control the power module to provide voltage and current for the external power supply test of the TF card to be tested, until the external power supply test is completed; A test report is generated according to the performance data, and the test report is sent to a display module to display the test report.

8. The method according to claim 7, characterized in that Updating the output voltage and the output current according to a comparison result between the output data and the performance data includes: Comparing the actual voltage in the output data with the operating voltage in the performance data to obtain a first comparison result; updating the output voltage according to the first comparison result; Comparing the actual current in the output data with the operating current in the performance data to obtain a second comparison result; The output current is updated according to the second comparison result.

9. The method according to claim 7, characterized in that: Generating a test report according to the performance data, and sending the test report to a display module to display the test report, including: Comparing the actual voltage in the performance data with the voltage threshold range to obtain a third comparison result; When the third comparison result is that the actual voltage is outside the voltage threshold range, determining that the test result is a voltage abnormality; Comparing the actual current in the performance data with the current threshold to obtain a fourth comparison result; When the fourth comparison result is that the actual current is greater than the current threshold, determining that the test result is a current abnormality; The test result is sent as a test report to a display module to display the test report.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer-executable instructions. When the computer-executable instructions are called and executed by the processor, the computer-executable instructions prompt the processor to implement the TF card external power supply testing method according to any one of claims 7 to 9.

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