Solid state disk scanning method and device and related equipment

Abstract

The invention relates to the field of solid state disks, in particular to a solid state disk scanning method and device and related equipment. The method comprises the following steps: acquiring a first real-time temperature of a main control chip in the solid state disk and a second real-time temperature of a flash memory chip in the solid state disk; determining a temperature difference between the first real-time temperature and the second real-time temperature, a magnitude relationship between the first real-time temperature and a first temperature threshold value, and a magnitude relationship between the second real-time temperature and the first temperature threshold value; in response to the fact that the first real-time temperature and / or the second real-time temperature are / is larger than a first temperature threshold value, high-temperature timing is started; in response to the fact that the temperature difference is larger than a second temperature threshold value and / or the duration obtained through high-temperature timing is larger than a time threshold value, scanning is conducted on the flash memory chip; the technical problem that scanning is not timely in an existing solid state disk scanning method can be solved.

Description

Technical Field

[0001] The present application relates to the field of solid state hard disks, and in particular to a solid state hard disk scanning method, device and related equipment. Background Art

[0002] In the prior art, when an SSD (Solid State Drive) is powered on and in an idle state, the SSD will periodically scan the storage blocks in the current storage space to check the status of the storage blocks. If a bad storage block is scanned, the SSD will move the data stored on the bad storage block, but in many cases the data has been damaged.

[0003] In actual applications, storage blocks do not suddenly become bad blocks. They usually first become unstable blocks and then bad blocks. For example, when the temperature of the SSD is too high due to reading and writing operations, it is likely to further accelerate the transformation of storage blocks in the SSD into bad blocks. If the SSD waits until it is idle to start the storage block scanning process, it is likely that the best time to maintain data security has been missed. Summary of the invention

[0004] In view of this, the purpose of the present application is to provide a solid state hard disk scanning method, device and related equipment to solve the technical problem of untimely scanning in the existing solid state hard disk scanning method.

[0005] In a first aspect, the present application provides a solid state hard disk scanning method, which is applied to a solid state hard disk, and the method comprises:

[0006] Acquire a first real-time temperature of a main control chip in the solid-state hard disk and a second real-time temperature of a flash memory chip in the solid-state hard disk;

[0007] Determine a temperature difference between the first real-time temperature and the second real-time temperature, a magnitude relationship between the first real-time temperature and a first temperature threshold, and a magnitude relationship between the second real-time temperature and the first temperature threshold;

[0008] In response to the first real-time temperature and / or the second real-time temperature being greater than a first temperature threshold, starting a high temperature timer;

[0009] In response to the temperature difference being greater than a second temperature threshold, and / or the duration obtained by the high temperature timing being greater than a time threshold, scanning is performed on the flash memory chip.

[0010] In a second aspect, the present application provides a solid state hard disk scanning device, which is applied to a solid state hard disk, and the device includes: a temperature acquisition module, a temperature monitoring module and a scanning module;

[0011] The temperature acquisition module is used to obtain a first real-time temperature of a main control chip in the solid-state hard disk and a second real-time temperature of a flash memory chip in the solid-state hard disk;

[0012] The temperature monitoring module is used to determine the temperature difference between the first real-time temperature and the second real-time temperature, the magnitude relationship between the first real-time temperature and the first temperature threshold, and the magnitude relationship between the second real-time temperature and the first temperature threshold;

[0013] The temperature monitoring module is configured to start a high temperature timing in response to the first real-time temperature and / or the second real-time temperature being greater than a first temperature threshold;

[0014] The scanning module is used for scanning the flash memory chip in response to the temperature difference being greater than a second temperature threshold and / or the time length obtained by the high temperature timing being greater than a time threshold.

[0015] In a third aspect, the present application provides an electronic device, comprising a processor and a memory, wherein the memory is used to store application programs, and the processor runs or executes a software program stored in the memory so that the electronic device implements the above-mentioned solid-state hard disk scanning method.

[0016] In a fourth aspect, the present application provides a computer-readable storage medium, wherein the computer-readable storage medium is used to store program codes executed by a processor, wherein the program codes are used to implement the above-mentioned solid-state hard disk scanning method.

[0017] In a fifth aspect, the present application provides a computer program product, which includes computer instructions. When the computer instructions are executed on an electronic device, the electronic device implements the above-mentioned solid-state hard disk scanning method.

[0018] Beneficial effects:

[0019] The present application provides a solid-state hard disk scanning method, which is applied to a solid-state hard disk, and the method includes: obtaining a first real-time temperature of a main control chip in the solid-state hard disk and a second real-time temperature of a flash memory chip in the solid-state hard disk; determining a temperature difference between the first real-time temperature and the second real-time temperature, a magnitude relationship between the first real-time temperature and a first temperature threshold, and a magnitude relationship between the second real-time temperature and the first temperature threshold; in response to the first real-time temperature and / or the second real-time temperature being greater than the first temperature threshold, starting a high temperature timing; in response to the temperature difference being greater than the second temperature threshold, and / or the time length obtained by the high temperature timing being greater than the time threshold, scanning the flash memory chip.

[0020] In summary, the present application uses the relationship between the real-time temperature of the main control chip and the flash memory chip and the first threshold, as well as the relationship between the temperature difference between the main control chip and the flash memory chip and the second threshold, as conditions for triggering scanning, so that the solid-state hard disk can promptly discover and process storage blocks where data corruption may occur, so as to maintain data security to the greatest extent. Therefore, the present application can solve the technical problem of untimely scanning in existing solid-state hard disk scanning methods. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments of the present application will be briefly introduced below. The following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0022] Figure 1 A schematic diagram of a flow chart of a solid state hard disk scanning method provided in an embodiment of the present application;

[0023] Figure 2 A schematic diagram of the structure of a solid state drive scanning device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0024] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution of the present application will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present application.

[0025] The present application provides a solid state hard disk scanning method, which is applied to a solid state hard disk, such as Figure 1 Shown Figure 1 A schematic diagram of a flow chart of a solid state hard disk scanning method provided in an embodiment of the present application, the method comprising:

[0026] S110: Acquire a first real-time temperature of a main control chip in the solid state drive and a second real-time temperature of a flash memory chip in the solid state drive.

[0027] Specifically, in actual applications, high temperature will cause the performance of circuit components inside the main control chip and flash memory chip to decline, thereby affecting the data processing and scheduling capabilities of the main control chip and affecting the data reading and writing speed of the flash memory chip; in addition, high temperature will cause the main control chip's ability to process data to decline, and will also make the flash memory chip more prone to read and write errors, further causing the stored data to be damaged or lost. If the data is damaged or lost, the difficulty of recovery will be greatly increased.

[0028] In actual operation, since high temperature may cause the above-mentioned adverse effects, it is necessary to monitor the temperatures of both the main control chip and the flash memory chip.

[0029] In an embodiment of the present application, temperature sensors are provided on the main control chip and the flash memory chip of the SSD to monitor the real-time temperature of the main control chip and the flash memory chip; in actual operation, the temperature sensor sends the real-time temperature it monitors to the flash memory conversion layer in the main control chip at preset period intervals; wherein, the preset period can be determined according to actual needs, and the present application does not make specific limitations on this.

[0030] In one implementation, after S110, the method further includes: Step (1) to Step (3), the details of which are as follows:

[0031] Step (1): Determine the magnitude relationship between the first real-time temperature and the third temperature threshold and the magnitude relationship between the second real-time temperature and the third temperature threshold.

[0032] The third temperature threshold is greater than the first temperature threshold.

[0033] Step (2): In response to the first real-time temperature and the second real-time temperature being both greater than a third temperature threshold, if the solid state drive is in the process of performing a read or write operation, the read or write operation is stopped.

[0034] Specifically, in an embodiment of the present application, the third temperature threshold is greater than the first temperature threshold. If the first real-time temperature and the second real-time temperature are both greater than the third temperature threshold, it indicates that the current main control chip and the flash memory chip are already at a very high operating temperature. Excessive temperature may cause changes in the physical structure inside the chip, such as metal migration, insulation layer breakdown, etc. These changes may cause permanent damage to the chip. Therefore, whether it is the main control chip or the flash memory chip, it is necessary to stop the current processing process as much as possible to minimize the real-time temperature of the main control chip and the flash memory chip.

[0035] In actual operation, if the read and write operations are stopped because the first real-time temperature and the second real-time temperature are both greater than the third temperature threshold, the SSD will send a notification to the host (computer device) to inform the host user that the current SSD cannot perform read and write operations at the current moment.

[0036] Step (3): In response to the first real-time temperature and the second real-time temperature both decreasing to be equal to or less than a fourth temperature threshold, resuming the read and write operations.

[0037] Specifically, in an embodiment of the present application, if the first real-time temperature and the second real-time temperature are both reduced to be equal to or less than the fourth temperature threshold, it indicates that the main control chip and the flash memory chip are already at a safe operating temperature, and the read and write operations can be resumed.

[0038] In actual operation, the fourth temperature threshold can be determined according to actual needs, and this application does not make any specific limitation on this.

[0039] S120: Determine the temperature difference between the first real-time temperature and the second real-time temperature, the magnitude relationship between the first real-time temperature and the first temperature threshold, and the magnitude relationship between the second real-time temperature and the first temperature threshold.

[0040] Specifically, in the embodiment of the present application, the purpose of determining the temperature difference between the first real-time temperature and the second real-time temperature, the size relationship between the first real-time temperature and the first temperature threshold, and the size relationship between the second real-time temperature and the first temperature threshold is mainly to perform comprehensive temperature monitoring and evaluation of the working status of the main control chip and flash memory chip inside the SSD to ensure the normal operation of the SSD and extend its service life.

[0041] Among them, by comparing the first real-time temperature with the second real-time temperature, in addition to obtaining basic information such as whether the heat dissipation performance of the SSD is good, it can also determine whether the higher second real-time temperature is caused by the external temperature outside the SSD.

[0042] By comparing the first real-time temperature and the second real-time temperature with the first temperature threshold respectively, it can be determined whether the main control chip and the flash memory chip are within a safe operating temperature range. If the real-time temperature of the main control chip and the real-time temperature of the flash memory chip both exceed the first threshold, it indicates that the SSD needs to perform internal operations with caution to prevent damage to the main control chip and the flash memory chip due to high-temperature operations.

[0043] S130: In response to the first real-time temperature and / or the second real-time temperature being greater than a first temperature threshold, starting a high temperature timer.

[0044] Specifically, in the embodiment of the present application, the high temperature timing is started to promptly respond to the current abnormal temperature of the main control chip and the flash memory chip; in actual operation, if any one of the first real-time temperature and the second real-time temperature is greater than the first temperature threshold temperature, the timer starts working.

[0045] In actual operation, the duration obtained by high-temperature timing can also help to analyze the working time of SSD in high-temperature environment and evaluate its potential impact on hardware life.

[0046] S140: In response to the temperature difference being greater than the second temperature threshold, and / or the duration obtained by high temperature timing being greater than the time threshold, scanning the flash memory chip.

[0047] Specifically, in the embodiment of the present application, the temperature difference is greater than the second temperature threshold and the duration obtained by high temperature timing is greater than the time threshold, both indicating that the current main control chip and the flash memory chip are already at a relatively high operating temperature. Therefore, the data processing capability of the main control chip and the accuracy of the data reading and writing capability of the flash memory chip will be greatly reduced. More importantly, the possibility of damage to the data stored in the flash memory chip will also be greatly increased.

[0048] In one implementation, S140 includes: Step (4) to Step (5), the details of which are as follows:

[0049] Step (4): In response to the temperature difference being greater than the second temperature threshold and / or the current duration obtained by high temperature timing being greater than the time threshold, reserving a scanning process for the flash memory chip.

[0050] Step (5): In response to the first real-time temperature and the second real-time temperature both decreasing to be equal to or less than a fifth temperature threshold, scanning the flash memory chip.

[0051] Specifically, by scheduling the scanning process instead of executing it immediately, additional workload is avoided when the SSD is in a high temperature state. Performing a scan at high temperature may exacerbate the temperature rise and increase the risk of damage to memory chips and flash memory chips. In addition, scanning at lower temperatures may be more efficient because the performance of SSDs at low temperatures is more stable and the error rate is lower.

[0052] In one implementation, a first state table and a second state table are stored in the main control chip, the first state table is used to record the storage location of the unstable block in the flash memory chip, and the second state table is used to record the storage location of the cold data block in the flash memory chip; S140 includes: steps (6) to (11), the details of which are as follows:

[0053] Step (6): According to the storage location of the unstable block recorded in the first state table, a first scan is performed on the data stored in the unstable block to obtain a first scan result.

[0054] Specifically, when the data stored in the storage block reaches a preset ratio of the error correction limit capability of the ECC (Error Correction Code) or the data stored in the storage block enters the reread process for correction, the storage block is considered to be an unstable block; wherein the reread process is for the first ECC error correction failure, and the ECC error correction is re-executed after adjusting the internal parameters of the flash memory chip; the preset ratio can be determined according to actual needs.

[0055] Cold data blocks refer to storage blocks in flash memory chips that are accessed relatively infrequently.

[0056] In actual operation, unstable blocks and cold data blocks are determined according to different standards, so there are storage blocks that are both unstable blocks and cold data blocks.

[0057] In the embodiment of the present application, since the data stored in the unstable block is very prone to errors, if the unstable block is not handled in time, it may gradually deteriorate and eventually become a bad storage block. When the temperature in the flash memory chip is too high, it will accelerate the conversion of the unstable block to a bad storage block.

[0058] In actual operation, since the data stored in the unstable block is very prone to errors, it needs to be scanned first compared to other storage blocks.

[0059] Step (7): According to the first state table, the cold data blocks that have not been scanned for the first time among the multiple unstable blocks recorded in the second state table are determined as blocks to be scanned.

[0060] Specifically, after the first scan for unstable blocks is completed, it is necessary to scan other storage blocks that are risky in storing data; in an embodiment of the present application, after the first scan for unstable blocks is completed, it is necessary to scan cold data blocks, but since some storage blocks are both unstable blocks and cold data blocks, when scanning cold data blocks, it is necessary to exclude the unstable blocks that have been scanned.

[0061] Step (8): According to the storage location of the block to be scanned recorded in the second status table, a second scan is performed on the data stored in the block to be scanned to obtain a second scanning result.

[0062] Specifically, after the block to be scanned is determined, a second scan may be performed on the data stored in the block to be scanned to obtain a second scan result.

[0063] Step (9): According to the first scanning result, an unstable block containing erroneous stored data is determined as a bad storage block.

[0064] Specifically, by analyzing the first scanning result, an unstable block with data storage errors is identified and the unstable block is determined to be marked as a storage bad block.

[0065] Step (10): Add the bad storage block to the garbage collection queue.

[0066] Specifically, the storage blocks in the garbage collection queue are used for garbage collection (GC).

[0067] Step (11): According to the second scanning result, the cold data block containing the stored data error is determined as an unstable block.

[0068] Step (12): updating the unstable blocks determined according to the second scanning result to the first status table, or adding the unstable blocks to the garbage collection queue.

[0069] Specifically, by adding storage bad blocks and unstable blocks to a garbage collection queue, they can be erased in the garbage collection process to release storage space.

[0070] Second, the present application provides a solid state hard disk scanning device, which is applied to a solid state hard disk, such as Figure 2 As shown, Figure 2 This is a schematic diagram of the structure of a solid state hard disk scanning device provided in an embodiment of the present application, the device includes: a temperature acquisition module 310, a temperature monitoring module 320 and a scanning module 330;

[0071] The temperature acquisition module 310 is used to obtain a first real-time temperature of a main control chip in the solid-state hard disk and a second real-time temperature of a flash memory chip in the solid-state hard disk;

[0072] The temperature monitoring module 320 is used to determine the temperature difference between the first real-time temperature and the second real-time temperature, the magnitude relationship between the first real-time temperature and the first temperature threshold, and the magnitude relationship between the second real-time temperature and the first temperature threshold;

[0073] The temperature monitoring module 320 is used to start a high temperature timing in response to the first real-time temperature and / or the second real-time temperature being greater than a first temperature threshold;

[0074] The scanning module 330 is configured to scan the flash memory chip in response to the temperature difference being greater than a second temperature threshold and / or the duration obtained by high temperature timing being greater than a time threshold.

[0075] In one implementation, the temperature monitoring module 320 is further used to determine the magnitude relationship between the first real-time temperature and the third temperature threshold and the magnitude relationship between the second real-time temperature and the third temperature threshold; wherein the third temperature threshold is greater than the first temperature threshold;

[0076] And, the device also includes: a control module;

[0077] A control module, configured to stop executing the read and write operations if the solid state hard disk is in the process of executing the read and write operations in response to the first real-time temperature and the second real-time temperature being greater than a third temperature threshold;

[0078] The control module is further configured to resume the read and write operations in response to the first real-time temperature and the second real-time temperature both decreasing to be equal to or less than a fourth temperature threshold.

[0079] In one implementation, the scanning module 330 is further configured to reserve a scanning process for the flash memory chip in response to the temperature difference being greater than a second temperature threshold and / or the current duration obtained by high temperature timing being greater than a time threshold;

[0080] The scanning module 330 is further configured to scan the flash memory chip in response to the first real-time temperature and the second real-time temperature both decreasing to be equal to or less than a fifth temperature threshold.

[0081] In one implementation, a first state table and a second state table are stored in the main control chip, the first state table is used to record the storage position of the unstable block in the flash memory chip, and the second state table is used to record the storage position of the cold data block in the flash memory chip; the scanning module 330 is also used to perform a first scan on the data stored in the unstable block according to the storage position of the unstable block recorded in the first state table to obtain a first scanning result;

[0082] The scanning module 330 is further configured to determine, according to the first state table, cold data blocks that have not been scanned for the first time among the plurality of unstable blocks recorded in the second state table as blocks to be scanned;

[0083] The scanning module 330 is further configured to perform a second scan on the data stored in the block to be scanned according to the storage location of the block to be scanned recorded in the second status table to obtain a second scanning result.

[0084] In one implementation, the device further includes: a control module;

[0085] The control module is further used to determine, according to the first scanning result, an unstable block in which stored data has errors as a storage bad block;

[0086] The control module is also used to add bad storage blocks to the garbage collection queue.

[0087] In one implementation, the control module is further configured to determine, according to the second scanning result, a cold data block in which stored data has errors as an unstable block;

[0088] The control module is further configured to update the unstable block determined according to the second scanning result to the first state table, or to add the unstable block to the garbage collection queue.

[0089] Third, the present application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, and when the processor executes the computer program, steps S110 to S140 provided in the above embodiment are implemented.

[0090] Fourth, the present application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, steps S110 to S140 of the above embodiment are executed.

[0091] Fifth, the computer program product provided in the present application includes a computer-readable storage medium storing program code. The instructions included in the program code can be used to execute the method in the previous method embodiment. The specific implementation can refer to steps S110 to S140 of the method embodiment, which will not be repeated here.

[0092] In the embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, and the indirect coupling or communication connection of the devices or units can be electrical, mechanical or other forms.

[0093] In addition, the units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0094] Furthermore, the functional modules in the various embodiments of the present application may be integrated together to form an independent part, or each module may exist separately, or two or more modules may be integrated to form an independent part.

[0095] It should be noted that if the function is implemented in the form of a software function module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application can essentially be embodied in the form of a software product, or the part that contributes to the prior art or the part of the technical solution. The computer software product is stored in a storage medium, including a number of instructions to enable a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM) random access memory (RAM), disk or optical disk, and other media that can store program codes.

[0096] In this document, relational terms such as first and second, etc. are used merely to distinguish one entity or operation from another entity or operation, but do not necessarily require or imply any such actual relationship or order between these entities or operations.

[0097] The above description is only an embodiment of the present application and is not intended to limit the protection scope of the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A solid state hard disk scanning method, characterized in that: Applied to a solid state drive, the method comprises: Acquire a first real-time temperature of a main control chip in the solid-state hard disk and a second real-time temperature of a flash memory chip in the solid-state hard disk; Determine a temperature difference between the first real-time temperature and the second real-time temperature, a magnitude relationship between the first real-time temperature and a first temperature threshold, and a magnitude relationship between the second real-time temperature and the first temperature threshold; In response to the first real-time temperature and / or the second real-time temperature being greater than a first temperature threshold, starting a high temperature timer; In response to the temperature difference being greater than a second temperature threshold, and / or the duration obtained by the high temperature timing being greater than a time threshold, scanning is performed on the flash memory chip.

2. The method according to claim 1, characterized in that: After obtaining the first real-time temperature of the main control chip in the solid-state hard disk and the second real-time temperature of the flash memory chip in the solid-state hard disk, the method further includes: Determine a magnitude relationship between the first real-time temperature and a third temperature threshold and a magnitude relationship between the second real-time temperature and the third temperature threshold; Wherein, the third temperature threshold is greater than the first temperature threshold; In response to the first real-time temperature and the second real-time temperature being both greater than the third temperature threshold, if the solid state drive is in the process of performing a read or write operation, stopping the read or write operation; In response to the first real-time temperature and the second real-time temperature both decreasing to be equal to or less than a fourth temperature threshold, the read and write operations are resumed.

3. The method according to claim 1, characterized in that In response to the temperature difference being greater than a second temperature threshold, and / or the duration obtained by the high temperature timing being greater than a time threshold, scanning the flash memory chip comprises: In response to the temperature difference being greater than a second temperature threshold and / or the current duration obtained by the high temperature timing being greater than a time threshold, reserving a scanning process for the flash memory chip; In response to the first real-time temperature and the second real-time temperature both decreasing to be equal to or less than a fifth temperature threshold, scanning is performed on the flash memory chip.

4. The method according to claim 1, characterized in that The main control chip stores a first state table and a second state table, wherein the first state table is used to record the storage location of the unstable block in the flash memory chip, and the second state table is used to record the storage location of the cold data block in the flash memory chip; The scanning of the flash memory chip includes: According to the storage position of the unstable block recorded in the first state table, performing a first scan on the data stored in the unstable block to obtain a first scan result; According to the first state table, determining the cold data blocks that have not been scanned for the first time among the plurality of unstable blocks recorded in the second state table as blocks to be scanned; According to the storage position of the block to be scanned recorded in the second status table, a second scan is performed on the data stored in the block to be scanned to obtain a second scan result.

5. The method according to claim 4, characterized in that After performing a first scan on the data stored in the unstable block to obtain a first scan result, the method further includes: According to the first scanning result, determining the unstable block in which the stored data has errors as a storage bad block; The bad storage block is added to a garbage collection queue.

6. The method according to claim 4, characterized in that After performing a second scan on the data stored in the block to be scanned to obtain a second scan result, the method further includes: According to the second scanning result, the cold data block in which the stored data has errors is determined as the unstable block; The unstable block determined according to the second scanning result is updated to the first state table, or the unstable block is added to a garbage collection queue.

7. A solid state hard disk scanning device, characterized in that: Applied to a solid state hard disk, the device comprises: a temperature acquisition module, a temperature monitoring module and a scanning module; The temperature acquisition module is used to obtain a first real-time temperature of a main control chip in the solid-state hard disk and a second real-time temperature of a flash memory chip in the solid-state hard disk; The temperature monitoring module is used to determine the temperature difference between the first real-time temperature and the second real-time temperature, the magnitude relationship between the first real-time temperature and the first temperature threshold, and the magnitude relationship between the second real-time temperature and the first temperature threshold; The temperature monitoring module is configured to start a high temperature timing in response to the first real-time temperature and / or the second real-time temperature being greater than a first temperature threshold; The scanning module is used for scanning the flash memory chip in response to the temperature difference being greater than a second temperature threshold and / or the time length obtained by the high temperature timing being greater than a time threshold.

8. An electronic device, characterized in that: The electronic device includes a processor and a memory, the memory is used to store application programs, and the processor runs or executes the software program stored in the memory so that the electronic device implements the solid state hard disk scanning method as described in any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium is used to store program codes executed by a processor, and the program codes are used to implement the solid-state hard disk scanning method according to any one of claims 1 to 6.

10. A computer program product, characterized in that The computer program product includes computer instructions. When the computer instructions are executed on an electronic device, the electronic device implements the solid-state hard disk scanning method as claimed in any one of claims 1 to 6.

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