Atomic interferometer bias coil magnetic field space distribution optimization method, measurement method and processing system

Abstract

The embodiment of the invention provides an atomic interferometer bias magnetic field space distribution optimization method, a measurement method and a processing system. The measurement method comprises the following steps: acquiring multiple groups of comprehensive magnetic field space distribution curves of a bias coil in one-to-one correspondence with multiple groups of target coil currents; the method specifically comprises the following steps: acquiring a plurality of groups of Raman spectrum data sets of a bias coil in one-to-one correspondence with falling time of a plurality of atomic groups under each group of target coil current; obtaining a plurality of comprehensive magnetic field intensities in one-to-one correspondence with the falling time of the plurality of atomic groups according to the plurality of groups of Raman spectrum data sets; performing compressed sensing reduction processing according to the falling time of the multiple atomic groups and the multiple comprehensive magnetic field intensities to obtain a comprehensive magnetic field space distribution curve corresponding to each group of target coil current; and performing differential processing by using the multiple groups of comprehensive magnetic field space distribution curves to obtain independent magnetic field space distribution curves corresponding to each group of coils in the multiple groups of coils in the bias coil. The magnetic field generated by the bias coil can be measured more accurately, and a better control curve can be obtained.

Description

Technical Field

[0001] The present invention relates to the technical field of atomic interferometers, and in particular to a method for optimizing the spatial distribution of a magnetic field of an atomic interferometer bias coil, a measuring method and a processing system. Background Art

[0002] Atom interferometer is a measuring instrument based on the principle of quantum interference, which can be widely used in the precise measurement of physical quantities such as time, inertia, and magnetic field. During the measurement process of atom interferometer, a bias field uniformly distributed in space is required to provide a quantized axis to reduce the influence of the second-order Zeeman effect on the measurement accuracy. Most of the existing magnetic field design methods are forward designs, that is, modeling and simulation are performed according to the Biosafari theorem to obtain the position of the magnetic field coil and the number of winding turns. However, due to factors such as winding methods and environmental interference, the actual results of the magnetic field distribution have a large deviation from the theoretical value, thereby deteriorating the measurement accuracy of the atom interferometer. Therefore, it is necessary to provide a solution to optimize the design and control of the magnetic field. Summary of the invention

[0003] The purpose of the present invention is to achieve more accurate measurement of the magnetic field of the bias coil in an atom interferometer and to optimize the parameters and control current of the coil according to the measurement results. A method for optimizing the spatial distribution of the magnetic field of the bias coil of an atom interferometer, a measurement method and a processing system are provided.

[0004] An embodiment of the present invention provides a method for measuring a magnetic field of a bias coil of an atomic interferometer, comprising:

[0005] S1: Obtain multiple sets of comprehensive magnetic field spatial distribution curves corresponding to the bias coil and multiple sets of target coil currents; specifically including:

[0006] S11: acquiring multiple sets of Raman spectrum data sets corresponding to the falling time of multiple atomic groups under each set of target coil currents of the bias coil;

[0007] S12: obtaining a plurality of comprehensive magnetic field intensities corresponding to the falling times of a plurality of atomic groups according to a plurality of Raman spectrum data sets;

[0008] S13: performing compressed sensing restoration processing according to the falling time of multiple atomic groups and multiple comprehensive magnetic field intensities to obtain a comprehensive magnetic field spatial distribution curve corresponding to each group of target coil currents;

[0009] Step S2: performing differential processing using multiple groups of comprehensive magnetic field spatial distribution curves to obtain independent magnetic field spatial distribution curves corresponding to each group of coils in the multiple groups of coils in the bias coil.

[0010] Another embodiment of the present invention provides a method for optimizing the spatial distribution of a magnetic field of a bias coil of an atomic interferometer, comprising:

[0011] The magnetic field measurement method of any one of the above items obtains an independent magnetic field spatial distribution curve corresponding to each group of coils in the plurality of groups of coils in the bias coil;

[0012] S3: using each independent magnetic field spatial distribution curve to obtain the actual spatial distribution Fourier coefficients of the magnetic field of each group of coils; obtaining the target spatial magnetic field distribution Fourier coefficients of the bias coil;

[0013] S4: using lasso regression analysis, the target current value of each group of coils is solved according to the Fourier coefficients of the actual spatial distribution of the magnetic field of each group of coils and the Fourier coefficients of the target spatial magnetic field distribution of the coils; the target current value is used to determine the target number of turns of each group of coils.

[0014] Another embodiment of the present invention provides a method for optimizing the spatial distribution of a magnetic field of a bias coil of an atomic interferometer, comprising:

[0015] The magnetic field measurement method of any one of the above items obtains an independent magnetic field spatial distribution curve corresponding to each group of coils in the plurality of groups of coils in the bias coil;

[0016] S5: Obtain coil response time distribution and current irrelevant term time distribution corresponding to each group of coils according to each independent magnetic field spatial distribution curve;

[0017] S6: determining a target constraint function according to the coil response time distribution and the current irrelevant term time distribution corresponding to each group of coils, and the target magnetic field time distribution;

[0018] S7: Perform dynamic programming solution according to the objective constraint function to obtain a magnetic field control curve with the minimum amplitude change rate; the magnetic field control curve is used to control the current of each set of coils.

[0019] Another embodiment of the present invention provides an atomic interferometer bias coil magnetic field processing system, including a memory and a processor, the memory storing at least one instruction executable by the processor, and the processor executing the instruction to implement the aforementioned magnetic field measurement method or the aforementioned magnetic field spatial distribution optimization method.

[0020] The above-mentioned embodiments of the present invention have at least one or more of the following beneficial effects: the measurement method provided can realize more accurate measurement of the magnetic field generated by the bias magnetic field, and the obtained independent magnetic field spatial distribution curve can be used to determine the spatial distribution of the magnetic field of a single group of coils to facilitate the subsequent optimization design of the spatial distribution of each group of coils, such as calculating the optimal coil position and number of turns, designing the control current curve of a single group of coils, etc. Compared with traditional modeling and simulation, a better optimization solution can be obtained. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] The specific implementation modes of the present invention will be described in detail below with reference to the accompanying drawings.

[0022] Figure 1 A schematic flow chart of a method for measuring the magnetic field of an atom interferometer bias coil provided in accordance with an embodiment of the present invention.

[0023] Figure 2 Schematic diagram of a set of Raman spectrum data sets and the corresponding fitted Raman spectrum lines in one embodiment of the present invention.

[0024] Figure 3 The figure is a schematic diagram of a set of actual magnetic field spatial distribution curves and theoretical magnetic field spatial distribution curves in one embodiment of the present invention.

[0025] Figure 4 Schematic diagram of the principle of the relationship between the falling time and position of atomic clusters.

[0026] Figure 5 It is a schematic diagram of a set of comprehensive spatial distribution curves in one embodiment of the present invention.

[0027] Figure 6 It is a schematic diagram of an optimized actual magnetic field distribution and an ideal magnetic field distribution in one embodiment of the present invention.

[0028] Figure 7 It is a schematic diagram of magnetic field control curves of multiple groups of coils in one embodiment of the present invention.

[0029] Figure 8 A schematic structural diagram of a magnetic field measurement device for an atomic interferometer bias coil provided in one embodiment of the present invention.

[0030] Fig. 9 A schematic structural diagram of a magnetic field optimization device for an atomic interferometer bias coil provided in accordance with an embodiment of the present invention.

[0031] Fig.10 A schematic structural diagram of a magnetic field optimization device for an atom interferometer bias coil provided in another embodiment of the present invention.

[0032] Fig.11 A schematic structural diagram of a magnetic field measurement system for an atom interferometer bias coil provided in accordance with an embodiment of the present invention. DETAILED DESCRIPTION

[0033] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the specific embodiments of the present invention are described in detail below with reference to the accompanying drawings.

[0034] In order to enable those skilled in the art to better understand the technical solution of the present invention, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work should fall within the scope of protection of the present invention.

[0035] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the terms used in this way can be interchangeable where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0036] It should also be noted that the division of multiple embodiments in the present invention is only for the convenience of description and should not constitute a special limitation. The features in various embodiments can be combined and referenced to each other without contradiction.

[0037] like Figure 1 As shown, an embodiment of the present invention provides an atomic interferometer bias coil magnetic field measurement method (referred to as magnetic field measurement method) which can be applied to measure the magnetic field of the bias coil of the atomic interferometer in an atom interferometer. The bias coil is used to generate a bias magnetic field to provide a quantized axis in the atomic interference process.

[0038] The method for measuring the magnetic field of the bias coil of an atom interferometer provided in an embodiment of the present invention includes:

[0039] S1: Obtain multiple sets of comprehensive magnetic field spatial distribution curves corresponding to the bias coil and multiple sets of target coil currents; specifically including:

[0040] S11: acquiring multiple sets of Raman spectrum data sets corresponding to the falling time of multiple atomic groups under each set of target coil currents of the bias coil;

[0041] S12: obtaining a plurality of comprehensive magnetic field intensities corresponding to the falling times of a plurality of atomic groups according to a plurality of Raman spectrum data sets;

[0042] S13: performing compressed sensing restoration processing according to the falling time of multiple atomic groups and multiple comprehensive magnetic field intensities to obtain a comprehensive magnetic field spatial distribution curve corresponding to each group of target coil currents;

[0043] Step S2: performing differential processing using multiple groups of comprehensive magnetic field spatial distribution curves to obtain independent magnetic field spatial distribution curves corresponding to each group of coils in the multiple groups of coils in the bias coil.

[0044] In step S1, steps S11 to S13 need to be performed according to each set of target coil currents, and each set of target coil currents may include current values ​​of multiple sets of coils in the bias coil. For example, if the bias coil includes three sets of coils, then one set of target coil currents includes current values ​​corresponding to the three sets of coils.

[0045] In step S11, each of the multiple groups of Raman spectrum data sets includes multiple Raman spectrum data, and each Raman spectrum data includes a frequency value and a Raman signal intensity corresponding to the frequency value. Figure 2 , Figure 2 The horizontal axis is the number of points, which is converted from the frequency value. The vertical axis is the Raman signal intensity. Figure 2 The point set of all original signals in corresponds to a set of Raman spectrum data sets, and each original signal point corresponds to a Raman spectrum data set.

[0046] Each set of Raman spectrum data sets corresponds to a set of target coil currents and to a falling time of an atom group. Specifically, for example, for multiple sets of Raman spectrum data sets corresponding to the first set of target coil currents, the current values ​​in the first set of target coil currents are applied to multiple sets of coils in the bias coil in the atomic interferometer to generate corresponding bias magnetic fields. The cold atom groups are allowed to fall freely, and Raman lasers are used to cause Raman transitions in the cold atom groups. In the bias magnetic field corresponding to the first set of target coil currents, Raman lasers are used to scan at different falling times of the atom groups, and a set of Raman spectrum data sets corresponding to each falling time of the atom groups can be obtained.

[0047] In step S12, each group of comprehensive magnetic field strengths corresponds to a falling time of an atom group; specifically, each group of comprehensive magnetic field strengths corresponds to the magnetic field strength corresponding to the spatial position reached by the atom group at the falling time of the atom group. In step S13, the comprehensive magnetic field spatial distribution curve under the first group of target coil currents can be obtained according to the multiple groups of comprehensive field strengths corresponding to the falling times of multiple atom groups under the first group of target coil currents. Similarly, multiple groups of comprehensive magnetic field spatial distribution curves corresponding to multiple groups of target coil currents can be obtained.

[0048] The bias coil in the atomic interferometer is a coaxial coil, and the magnetic field distribution on its axis is calculated by linear superposition. The magnetic field spatial distribution of each coil and the environment can be obtained by differentiating the measurement results of several groups of coils. Therefore, after differential processing in step S2, the independent magnetic field spatial distribution curve corresponding to each group of coils can be obtained more accurately. The independent magnetic field spatial distribution curve can be used to determine the magnetic field spatial distribution of a single group of coils to facilitate the subsequent spatial distribution optimization design of each group of coils, such as calculating the optimal coil position and number of turns, designing the control current curve of a single group of coils, etc., and a better optimization solution can be obtained compared with traditional modeling and simulation.

[0049] In some embodiments, the number of groups of multiple target coil currents is greater than the number of multiple coil groups. In step S1, each group of target coil currents includes multiple current values ​​corresponding to multiple groups of coils one by one; at least one current value in any two groups of target coil currents is different. For example, the multiple groups of coils include 3 groups of coils, and 4 groups of target coil currents are set accordingly. The first group of coil currents is A1, B1, and C1, the second group of target coil currents is A1, B2, and C1, the third group of target coil currents is A2, B1, and C1, and the fourth group of target coil currents is A1, B1, and C2. Then the differential processing in step S2, for example, differentiates the integrated magnetic field spatial distribution curve corresponding to the second group of target coil currents from the integrated magnetic field spatial distribution curve corresponding to the first group of target coil currents to obtain the corresponding independent magnetic field spatial distribution curve of the second group of coils. Differentiating the integrated magnetic field spatial distribution curve corresponding to the third group of target coil currents from the integrated magnetic field spatial distribution curve corresponding to the first group of target coil currents can obtain the independent magnetic field spatial distribution curve corresponding to the first group of coils. The independent magnetic field spatial distribution curve corresponding to the third group of coils can be obtained by differentiating the comprehensive magnetic field spatial distribution curve corresponding to the fourth group of target coil currents from the comprehensive magnetic field spatial distribution curve corresponding to the first group of target coil currents.

[0050] Wherein, step S12 specifically includes:

[0051] S121: solving the Raman resonance spectrum line fitting function for the multiple groups of Raman spectrum data sets respectively to obtain multiple groups of peak frequencies corresponding to the Raman resonance peaks of the multiple Raman resonance spectrum lines; the multiple groups of peak frequencies correspond to the multiple groups of Raman spectrum data sets one by one;

[0052] S122: Obtain multiple comprehensive magnetic field intensities corresponding to the falling times of multiple atomic clusters according to the multiple groups of peak frequencies.

[0053] The magnetic field strength can be calculated from the Raman resonance peak spacing, as Figure 2 As shown, after solving the Raman resonance spectrum fitting function for each set of Raman data sets, the corresponding Raman resonance spectrum can be depicted. The fitted Raman resonance spectrum is shown in Figure 2 As shown in the fitting curve, for example Figure 2 The fitting curve in has three peak positions, and the frequency values ​​corresponding to the three peak positions are the peak frequencies of the Raman resonance spectrum line. The multiple peak frequencies of each Raman resonance spectrum line constitute a group of peak frequencies. In step S122, the comprehensive magnetic field intensity corresponding to the Raman resonance spectrum line (that is, corresponding to the falling time of the atomic group) can be obtained according to the difference between two adjacent peak frequencies in each group of peak frequencies. When each group of peak frequencies contains more than two peak frequencies, the average value of the difference between multiple adjacent peak frequencies can be taken as the calculated value of the group of peak frequencies.

[0054] Specifically, in step S121, the Raman resonance spectrum fitting function is:

[0055]

[0056] Where n is the number of peak frequencies of a set of Raman resonance lines, a i is the Raman signal intensity corresponding to the i-th peak frequency; b i is the frequency value corresponding to the i-th peak frequency; c i is the Raman signal width corresponding to the i-th peak frequency. i , b i 、c i are fitting parameters.

[0057] Specifically, the least square method is used to solve the Raman resonance spectrum fitting function in step S121. The least square method is used to fit in step S121, which can avoid interference caused by measurement noise to the greatest extent.

[0058] Specifically, when solving the Raman resonance spectrum fitting function, the error function is defined as:

[0059]

[0060] Where y is the actual measured value, that is, the Raman signal intensity value of the corresponding Raman resonance spectrum data. According to the principle of least squares method, the error function needs to be minimized, that is, err is the value of each fitting parameter (a i , b i 、c i ) has a partial derivative of 0, that is,

[0061] Formula (1):

[0062]

[0063] Formula (2):

[0064]

[0065] Formula (3):

[0066]

[0067] Through the above formulas (1) to (3), the function fitting is transformed into the secondary equation group for solution, and Newton's method formula (4) is used:

[0068] z k+1 =z k -J(z k ) -1 F(z k )

[0069] Where, F is the above formula (1), formula (2), and formula (3), J is the Jacobian matrix of F, and z is the fitting parameter to be solved. For example, we need to find b in the above fitting function. i , then formula (4) can be written as formula (5):

[0070] b k+1 =b k -J(b k ) -1 F(b k )

[0071] At this time, F(b k ) is the aforementioned formula (2).

[0072] Based on the characteristics of the Raman curve, an initial value is given according to multiple Raman spectrum data in each set of Raman spectrum data. By continuous iteration, a can be solved according to the above formula (4). i , b i 、c i , and since err is the error function, there is only one solution for each fitting parameter.

[0073] In step S122, according to b i+1 -b i The corresponding comprehensive magnetic field strength can be converted. For example, the corresponding comprehensive magnetic field strength can be calculated by formula (6).

[0074]

[0075] Among them, α step is the chirp step size of the Raman laser.

[0076] After step S12 is completed, the comprehensive magnetic field strength corresponding to the falling time of multiple atomic groups is obtained. Figure 4 The time can be converted into the corresponding position relationship according to the free fall of the atomic group in a vacuum. The formula for the free fall of the atomic group in a vacuum is:

[0077]

[0078] In the free-fall formula, x is the displacement of the atomic group during free fall, and t is the free-fall time of the atomic group. In step S13, compressive sensing reduction processing can bypass the Nyquist limit of uniform sampling, and the entire curve can be restored using a small number of sampling points. The principle of compressive sensing reduction processing can be referred to formula (7).

[0079] y = Φx = ΦΨs

[0080] In formula (7), x is an N-dimensional signal, y is an M-dimensional observation value, where M << N, Φ is an M*N-dimensional observation matrix that projects the high-dimensional signal x into a low-dimensional space, Ψ is a sparse matrix, and s is a sparse coefficient. Using Ψs to replace x and representing it in the sparse basis. By converting the measured results to the frequency domain and using orthogonal matching pursuit, the elements with the highest residual correlation are selected iteratively and then orthogonalized. Finally, the original signal can be restored, and the comprehensive magnetic field spatial distribution curve as shown in Figure 5 can be obtained ( Figure 5 reduction result in).

[0081] The embodiment of the present invention also provides an optimization method for the magnetic field spatial distribution of the bias coil of an atomic interferometer (abbreviated as the magnetic field optimization method), including the magnetic field measurement method provided in the foregoing embodiment to obtain an independent magnetic field spatial distribution curve corresponding to each coil in each group of coils in the bias coil; that is, including the foregoing steps S1 and S2. The magnetic field optimization method further includes:

[0082] S3: Obtain the Fourier coefficients of the actual spatial distribution of the magnetic field of each group of coils using each independent magnetic field spatial distribution curve; obtain the Fourier coefficients of the target spatial magnetic field distribution of the bias coil;

[0083] S4: Use lasso regression analysis to solve the target current value of each group of coils according to the Fourier coefficients of the actual spatial distribution of the magnetic field of each group of coils and the Fourier coefficients of the target spatial magnetic field distribution of the bias coil; the target current value is used to determine the target number of turns of each group of coils.

[0084] Among them, the formula for lasso regression analysis in step S4 is:

[0085]

[0086] In the formula for lasso regression analysis, I is the target current value of each group of coils; A is the Fourier coefficient of the actual spatial distribution of the magnetic field of each group of coils, and B is the Fourier coefficient of the target spatial distribution of the bias coil, that is, the Fourier coefficient corresponding to the ideal magnetic field spatial distribution of the bias magnetic field.

[0087] Among them, the constraint condition of the lasso regression analysis formula is given by hardware limitations and can be referred to formula (8):

[0088] s.t‖x‖ p ≤τ

[0089] In formula (8), x corresponds to current, p is the norm, and τ is the constraint range. The sparse least squares method can be used to solve it.

[0090] Before performing step S3 and step S4, the positions of the plurality of coils may be finely adjusted. The target number of turns of each coil may be determined according to the current value of each coil, and the corresponding number of turns of the coil may be adjusted to the target number of turns.

[0091] Steps S1 to S4 may be performed multiple times, and steps S1 to S4 may be repeated each time the number of coil turns is adjusted.

[0092] The embodiment of the present invention also provides a method for optimizing the spatial distribution of the magnetic field of the bias coil of an atomic interferometer (hereinafter referred to as a magnetic field optimization method), including the magnetic field measurement method provided in the above embodiment, to obtain an independent magnetic field spatial distribution curve corresponding to each group of coils in the bias coil. That is, it includes the above steps S1 to S2, and also includes:

[0093] S5: Obtain coil response time distribution and current irrelevant term time distribution corresponding to each group of coils according to each independent magnetic field spatial distribution curve;

[0094] S6: determining a target constraint function according to the coil response time distribution and the current irrelevant term time distribution corresponding to each group of coils, and the target magnetic field time distribution;

[0095] S7: Perform dynamic programming according to the objective constraint function to obtain the magnetic field control curve with the minimum amplitude change rate; used to control the current of each set of coils.

[0096] Among them, in step S5, you can refer to Figure 6 The ideal spatial distribution curve of a group of coils is shown as line L3, and the magnetic field spatial distribution curve obtained in step S2 is shown as line L4. The current-independent spatial distribution of the group of coils can be obtained according to the magnetic field spatial lines L4 and L3. The coil response time distribution and the current-independent time distribution of the group of coils can be obtained by correlating time and position through the atomic free fall formula.

[0097] The objective constraint function formula in step S6 is:

[0098]

[0099] Step S7 can be expressed by formula (9):

[0100]

[0101] In the objective constraint function, n is the number of coil groups; x i(t) is the control parameter corresponding to the i-th group of coils, that is, the current value, A i (t) is the coil response time distribution of the i-th group of coils, e(t) is the time distribution of the current-independent term, and Target(t) is the time distribution of the target magnetic field. Where a < X < b, and a and b are the amplitude limits of the magnetic field current.

[0102] The control curve obtained in step S7 can be referred to Figure 7 as shown, where L5, L6, and L7 are the current control curves of the three groups of coils respectively. During actual control, the corresponding currents can be provided for the three groups of coils at the corresponding times according to the current control curves of these three groups, so that the magnetic field generated by the bias coil is more uniform.

[0103] Refer to Figure 8 The embodiment of the present invention also provides an atomic interferometer bias coil magnetic field measurement device 10, including a comprehensive magnetic field measurement module 11 and an independent magnetic field measurement module 12. The comprehensive magnetic field measurement module 11 is used to obtain multiple groups of comprehensive magnetic field spatial distribution curves corresponding to the bias coil and the currents of multiple groups of target coils one by one, that is, to perform the foregoing step S1. The comprehensive magnetic field measurement module 11 specifically includes a Raman data acquisition unit 111, a magnetic field intensity calculation unit 112, and a compressive sensing reduction processing unit 113. The Raman data acquisition unit 111 is used to obtain multiple groups of Raman spectrum data sets corresponding to the bias coil and the falling times of multiple atomic clusters one by one under each group of target coil currents, that is, to perform the foregoing step S11. The magnetic field intensity calculation unit 112 is used to obtain multiple comprehensive magnetic field intensities corresponding to the falling times of multiple atomic clusters one by one according to multiple groups of Raman spectrum data sets, that is, to perform the foregoing step S12. The compressive sensing reduction processing unit 113 is used to perform compressive sensing reduction processing according to the falling times of multiple atomic clusters and multiple comprehensive magnetic field intensities to obtain the comprehensive magnetic field spatial distribution curve corresponding to each group of target coil currents, that is, to perform the foregoing step S13. Specifically, the magnetic field intensity calculation unit further includes a fitting subunit and a calculation subunit. The fitting subunit is used to solve the Raman resonance spectral line fitting function for multiple groups of Raman spectrum data sets respectively, and obtain multiple groups of peak frequencies corresponding to the Raman resonance peaks of multiple Raman resonance spectral lines; the multiple groups of peak frequencies correspond to the multiple groups of Raman spectrum data sets one by one. The calculation subunit is used to obtain multiple comprehensive magnetic field intensities corresponding to the falling times of multiple atomic clusters one by one according to multiple groups of peak frequencies. The independent magnetic field measurement module 12 is used to perform differential processing on multiple groups of comprehensive magnetic field spatial distribution curves to obtain the independent magnetic field spatial distribution curves corresponding to each coil in multiple groups of coils in the bias coil, that is, to perform the foregoing step S2.

[0104] Regarding the specific structural principle and effect of the atomic interferometer bias coil magnetic field measurement device, reference can be made to the description in the atomic interferometer bias coil magnetic field measurement method in the foregoing embodiment, and details are not repeated here.

[0105] Reference Fig. 9 The embodiment of the present invention also provides an atomic interferometer bias coil magnetic field optimization device 100 (hereinafter referred to as a magnetic field optimization device), including the aforementioned atomic interferometer bias coil magnetic field measurement device 10, that is, including the aforementioned comprehensive magnetic field measurement module 11 and the independent magnetic field measurement module 12, the magnetic field optimization device 100 also includes a Fourier coefficient calculation module 13 and a lasso regression analysis module 14, the Fourier coefficient calculation module 13 is used to obtain the actual spatial distribution Fourier coefficients of the magnetic field of each group of coils using each independent magnetic field space distribution curve; obtain the target spatial magnetic field distribution Fourier coefficients of the bias coil, that is, for executing the aforementioned step S3. The lasso regression analysis module 14 is used to solve the target current value of each group of coils according to the actual spatial distribution Fourier coefficients of the magnetic field of each group of coils and the target spatial magnetic field distribution Fourier coefficients of the bias coil using lasso regression analysis; the target current value is used to determine the target number of turns of each group of coils, that is, for executing the aforementioned step S4.

[0106] The atomic interferometer bias coil magnetic field optimization device 100 of this embodiment further includes, for example, an output module, which is used to output a target current value, so as to determine the target number of turns of each group of coils according to the target current value, and to modify the number of turns of the corresponding coil to the target number of turns, so as to optimize the magnetic field. The specific structural principle and effect of the atomic interferometer bias coil magnetic field optimization device 100 can refer to the description of the atomic interferometer bias coil magnetic field optimization method in the aforementioned embodiment, and will not be repeated here one by one.

[0107] Reference Fig.10 The embodiment of the present invention also provides another atomic interferometer bias coil magnetic field optimization device 200 (hereinafter referred to as magnetic field optimization device), including the aforementioned atomic interferometer bias coil magnetic field measurement device 10, that is, including the aforementioned comprehensive magnetic field measurement module 11 and independent magnetic field measurement module 12, the magnetic field optimization device 200 also includes a time distribution acquisition module 15, a constraint function determination module 16 and a control curve acquisition module 17, the time distribution acquisition module 15 is used to obtain the coil response time distribution and the current irrelevant term time distribution corresponding to each group of coils according to each independent magnetic field space distribution curve; that is, it is used to perform the aforementioned step S5. The constraint function determination module 16 is used to determine the target constraint function according to the coil response time distribution and the current irrelevant term time distribution corresponding to each group of coils, and the target magnetic field time distribution; that is, it is used to perform the aforementioned step S6 and the control curve acquisition module 17 is used to perform dynamic programming solution according to the target constraint function to obtain the magnetic field control curve with the minimum amplitude change speed; the magnetic field control curve is used to control the current of each group of coils; that is, it is used to perform the aforementioned step S7.

[0108] Reference Fig.11An embodiment of the present invention further provides an atomic interferometer bias coil magnetic field processing system 300, including a memory 301 and a processor 302, wherein the memory 301 stores at least one instruction executable by the processor, and the processor 302 is used to execute instructions to implement any of the aforementioned magnetic field measurement methods or to execute instructions to implement any of the aforementioned magnetic field optimization methods.

[0109] An embodiment of the present invention also provides a storage medium, which is, for example, a non-volatile memory and stores computer program code, and the computer program code is used to implement the atomic interferometer bias coil magnetic field measurement method or the atomic interferometer bias coil magnetic field spatial distribution optimization method as described in any of the aforementioned embodiments.

[0110] In the several embodiments provided in the present application, it should be understood that the disclosed systems, devices and / or methods can be implemented in other ways. For example, the device embodiments described above are only schematic, for example, the division of units / modules is only a logical function division, and there may be other division methods in actual implementation, for example, multiple units or modules can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0111] The units / modules described as separate components may or may not be physically separated, and the components shown as units / modules may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units / modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0112] In addition, each functional unit / module in each embodiment of the present invention may be integrated into one processing unit / module, or each unit / module may exist physically separately, or two or more units / modules may be integrated into one unit / module. The above-mentioned integrated unit / module may be implemented in the form of hardware or in the form of hardware plus software functional units / modules.

[0113] The above-mentioned integrated unit / module implemented in the form of a software functional unit / module can be stored in a computer-readable storage medium. The above-mentioned software functional unit is stored in a storage medium, including a number of instructions for enabling one or more processors of a computer device (which can be a personal computer, a server, or a network device, etc.) to perform partial steps of the methods of various embodiments of the present invention. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (Read-Only Memory, referred to as ROM), random access memory (Random Access Memory, referred to as RAM), disk or optical disk and other media that can store program codes.

[0114] The above are only preferred embodiments of the present invention, and are not intended to limit the present invention in any form. Although the present invention has been disclosed as a preferred embodiment as above, it is not intended to limit the present invention. Any technician familiar with the profession can make some changes or modifications to equivalent embodiments of equivalent changes using the technical contents disclosed above without departing from the scope of the technical solution of the present invention. However, any simple modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present invention without departing from the content of the technical solution of the present invention are still within the scope of the technical solution of the present invention.

Claims

1. A method for measuring the magnetic field of an atomic interferometer bias coil, characterized in that: include: S1: Obtain multiple sets of comprehensive magnetic field spatial distribution curves corresponding to the bias coil and multiple sets of target coil currents; specifically including: S11: acquiring multiple sets of Raman spectrum data sets corresponding to the falling time of multiple atomic groups under each set of target coil currents of the bias coil; S12: obtaining a plurality of comprehensive magnetic field intensities corresponding to the falling times of a plurality of atomic groups according to a plurality of Raman spectrum data sets; S13: performing compressed sensing restoration processing according to the falling time of multiple atomic groups and multiple comprehensive magnetic field intensities to obtain a comprehensive magnetic field spatial distribution curve corresponding to each group of target coil currents; Step S2: performing differential processing using multiple groups of comprehensive magnetic field spatial distribution curves to obtain independent magnetic field spatial distribution curves corresponding to each group of coils in the multiple groups of coils in the bias coil.

2. The method for measuring the magnetic field of the bias coil of an atomic interferometer as claimed in claim 1, characterized in that: Step S12 specifically includes: S121: solving the Raman resonance spectrum line fitting function for the multiple groups of Raman spectrum data sets respectively to obtain multiple groups of peak frequencies corresponding to the Raman resonance peaks of the multiple Raman resonance spectrum lines; the multiple groups of peak frequencies correspond to the multiple groups of Raman spectrum data sets one by one; S122: Obtain multiple comprehensive magnetic field intensities corresponding to the falling times of multiple atomic clusters according to the multiple groups of peak frequencies.

3. The method for measuring the magnetic field of the bias coil of an atomic interferometer as claimed in claim 2, characterized in that: The Raman resonance spectrum fitting function is: Where n is the number of peak frequencies of a set of Raman resonance lines, a i is the Raman signal intensity corresponding to the i-th peak frequency; b i is the frequency value corresponding to the i-th peak frequency; c i is the Raman signal width corresponding to the i-th peak frequency.

4. The method for measuring the magnetic field of the bias coil of an atomic interferometer as claimed in claim 3, characterized in that: In step S121, the least square method is used to solve the Raman resonance spectrum line fitting function.

5. The method for measuring the magnetic field of the bias coil of an atomic interferometer as claimed in claim 1, characterized in that: In step S1, the number of the multiple groups of target coil currents is greater than the number of the multiple groups of coils; in step S1, each group of target coil currents includes multiple current values ​​corresponding to the multiple groups of coils one by one; at least one current value in any two groups of target coil currents is different.

6. A method for optimizing the spatial distribution of magnetic field of bias coil of atomic interferometer, characterized in that: include: Obtaining an independent magnetic field spatial distribution curve corresponding to each group of coils in the bias coil according to the magnetic field measurement method as claimed in any one of claims 1 to 5; S3: using each independent magnetic field spatial distribution curve to obtain the actual spatial distribution Fourier coefficients of the magnetic field of each group of coils; obtaining the target spatial magnetic field distribution Fourier coefficients of the bias coil; S4: using lasso regression analysis, the target current value of each group of coils is solved according to the Fourier coefficients of the actual spatial distribution of the magnetic field of each group of coils and the Fourier coefficients of the target spatial magnetic field distribution of the bias coil; the target current value is used to determine the target number of turns of each group of coils.

7. The method for optimizing the magnetic field of the bias coil of an atomic interferometer as claimed in claim 6, characterized in that: The formula for lasso regression analysis in step S4 is: In the lasso regression analysis formula, I is the target current value of each set of coils; A is the actual spatial distribution Fourier coefficient of the magnetic field of each set of coils; and B is the target spatial distribution Fourier coefficient of the bias coil.

8. A method for optimizing the spatial distribution of magnetic field of bias coil of atomic interferometer, characterized in that: include: Obtaining an independent magnetic field spatial distribution curve corresponding to each group of coils in the bias coil according to the magnetic field measurement method as claimed in any one of claims 1 to 5; S5: Obtain coil response time distribution and current irrelevant term time distribution corresponding to each group of coils according to each independent magnetic field spatial distribution curve; S6: determining a target constraint function according to the coil response time distribution and the current irrelevant term time distribution corresponding to each group of coils, and the target magnetic field time distribution; S7: Perform dynamic programming solution according to the objective constraint function to obtain a magnetic field control curve with the minimum amplitude change rate; the magnetic field control curve is used to control the current of each set of coils.

9. The method for optimizing the magnetic field of the bias coil of an atomic interferometer according to claim 8, characterized in that: The objective constraint function formula is: In the objective constraint function, n is the number of coil groups; x i (t) is the control parameter corresponding to the i-th coil group, A i (t) is the coil response time distribution of the i-th coil group, e(t) is the current independent term time distribution, and Target(t) is the target magnetic field time distribution.

10. An atomic interferometer bias coil magnetic field processing system, characterized in that: It comprises a memory and a processor, the memory stores at least one instruction executable by the processor, and the processor is used to execute the instruction to implement the magnetic field measurement method as claimed in any one of claims 1 to 5 or the magnetic field spatial distribution optimization method as claimed in any one of claims 6 to 9.

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