Memory test device and test method

Abstract

The present invention provides a memory testing device and a testing method, which can be applied to the field of testing technology. The memory testing device includes: a housing, including an openable and closable upper shell and a lower shell, and a memory card slot is provided inside the lower shell; an adjustable card slot device, movably connected to the memory card slot, for adjusting the size of the memory card slot to dynamically adapt to the physical profile of different-sized memories to be tested; a conveying mechanism, arranged at a position corresponding to the memory card slot, for realizing the positioning cooperation between the memory to be tested and the memory card slot; a downward pressure stroke control device, passing through the upper shell, for adjusting the downward pressure stroke of the downward pressure structure, so as to electrically connect the conductor array on the lower surface of the memory to be tested with the conductive contact array in the memory card slot through the downward pressure structure, and realize the testing of the memory to be tested.

Description

Technical Field

[0001] The present invention relates to the field of testing technologies, and particularly to a memory testing device and a testing method. Background Art

[0002] With the popularization of electronic products and the development of various data clouds, the types of integrated circuits used in electronic products have gradually increased. During the development process of electronic products, it is often necessary to adapt and verify various integrated circuits involved in the electronic products.

[0003] For relatively simple integrated circuit packages, they can basically be soldered by a hot air gun or soldering iron for adaptation and verification. However, for relatively complex integrated circuit packages, such as integrated circuits with BGA (Ball Grid Array) packages like DRAM (Dynamic Random Access Memory), it is difficult to solder them by oneself. Even if they are soldered by oneself, it cannot be guaranteed that they can be normally adapted and verified 100%. Moreover, for such integrated circuits, factory board making is required each time for adaptation and verification, which deteriorates the timeliness of development. Summary of the Invention

[0004] In view of the above problems, the present invention provides a memory testing device and a testing method.

[0005] According to a first aspect of the present invention, there is provided a memory testing device, including: a housing including an openable and closable upper shell and a lower shell, wherein a memory card slot is provided inside the lower shell; an adjustable card slot device movably connected to the memory card slot for adjusting the size of the memory card slot to dynamically adapt to the physical profiles of different-sized memories to be tested; a conveying mechanism disposed at a position corresponding to the memory card slot for realizing the positioning cooperation between the memory to be tested and the memory card slot; a downward pressure stroke control device passing through the upper shell for adjusting the downward pressure stroke of a downward pressure structure, so as to electrically connect the conductor array on the lower surface of the memory to be tested with the conductive contact array in the memory card slot through the downward pressure structure, thereby realizing the testing of the memory to be tested.

[0006] The second aspect of the present invention provides a method for testing a memory, including: controlling the adjustable card slot device to move downward inside the lower case to adjust the size of the memory card slot so that the size of the memory card slot is consistent with the size of the memory to be tested; controlling the memory to be tested to be placed on the conveying mechanism; controlling the conveying mechanism to move downward relative to the lower case to convey the memory to be tested into the memory card slot, so as to realize the positioning and matching between the memory to be tested and the memory card slot; controlling the downward pressure stroke control device to rotate relative to the upper case to adjust the downward pressure stroke of the downward pressure structure, so that the conductor array on the lower surface of the memory to be tested is electrically connected to the conductive contact array in the memory card slot, thereby realizing the test of the memory to be tested.

[0007] According to the memory testing device and method provided by the present invention, based on the size of the memory to be tested, the memory card slot can be adjusted to a size matching the memory to be tested through the adjustable card slot device, so as to dynamically adapt to the physical profile of memory to be tested with different sizes; the conveying mechanism is used to realize the positioning and matching between the memory to be tested and the memory card slot, and also facilitates the placement and taking of the memory to be tested; the downward pressure stroke control device can be used to control the downward pressure stroke of the downward pressure structure, so that while the downward pressure structure contacts the top of the memory to be tested, it can avoid damage to the memory to be tested caused by excessive adjustment of the downward pressure stroke of the downward pressure structure and avoid poor contact between the conductor array at the bottom of the memory to be tested and the conductive contact array caused by insufficient adjustment of the downward pressure stroke of the downward pressure structure. Therefore, the settings of the adjustable card slot device, the downward pressure block and the conveying mechanism improve the versatility and reliability of the memory testing device, make the operation more convenient, and also improve the development efficiency. Description of the Drawings

[0008] Through the following description of the embodiments of the present invention with reference to the drawings, the above content and other objects, features and advantages of the present invention will become clearer.

[0009] Figure 1 The schematic diagram of the memory testing device according to the embodiment of the present invention is shown.

[0010] Figure 2 The schematic diagram of the connection structure between the adjustable card slot device and the memory card slot according to the embodiment of the present invention is shown.

[0011] Figure 3(a) shows the schematic diagram of the adjustment process of the adjustable card slot device according to the embodiment of the present invention.

[0012] Figure 3(b) shows the schematic diagram of the completion of the adjustment of the adjustable card slot device according to the embodiment of the present invention.

[0013] Figure 3(c) shows the schematic diagram of the reset of the adjustable card slot device according to the embodiment of the present invention.

[0014] Figure 4 Shows a schematic diagram of a transfer mechanism according to an embodiment of the present invention.

[0015] Figure 5 Shows a schematic diagram of a transfer mechanism controller according to an embodiment of the present invention.

[0016] Figure 6 Shows a schematic diagram of a memory card slot according to an embodiment of the present invention.

[0017] Figure 7 Shows a schematic diagram of a memory to be tested located in a memory card slot according to an embodiment of the present invention.

[0018] Figure 8 Shows a schematic diagram of a memory test device according to another embodiment of the present invention.

[0019] Figure 9 Shows a flowchart of a test method for a memory according to an embodiment of the present invention. Detailed implementation manners

[0020] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are merely exemplary and are not intended to limit the scope of the present invention. In the following detailed description, for the sake of explanation, many specific details are set forth to provide a thorough understanding of the embodiments of the present invention. However, obviously, one or more embodiments can also be implemented without these specific details. In addition, in the following description, descriptions of well-known structures and technologies are omitted to avoid unnecessarily obscuring the concepts of the present invention.

[0021] The terms used herein are merely for describing specific embodiments and are not intended to limit the present invention. The terms "including", "comprising", etc. used herein indicate the presence of the described features, steps, operations, and / or components, but do not exclude the presence or addition of one or more other features, steps, operations, or components.

[0022] All terms used herein (including technical and scientific terms) have the meanings commonly understood by those skilled in the art, unless otherwise defined. It should be noted that the terms used herein should be interpreted as having a meaning consistent with the context of this specification and should not be interpreted in an idealized or overly rigid manner.

[0023] In the case of using expressions such as "at least one of A, B, and C", generally, it should be interpreted according to the meaning commonly understood by those skilled in the art (for example, "a system having at least one of A, B, and C" should include, but is not limited to, a system having only A, only B, only C, having A and B, having A and C, having B and C, and / or having A, B, and C).

[0024] In the process of implementing the present invention, it is found that the number of bottom solder balls, the pitch of solder balls, the size of solder balls, etc. of the same generation of DRAM will remain consistent to ensure compatibility and consistency. However, due to different manufacturing processes, there are differences in the outer frame sizes of the same generation of DRAM produced by different suppliers.

[0025] In the related art, the area in the test socket (Test Socket) for placing DRAM is fixed, and the test socket can only be singly compatible with DRAM of one size, that is, DRAM with an outer frame size that is too large or too small cannot be directly placed in the test socket and precisely connected to the pins at the bottom of the test socket.

[0026] Therefore, an embodiment of the present invention provides a memory test device to adapt to DRAM of different sizes.

[0027] Figure 1 A schematic diagram of a memory test device according to an embodiment of the present invention is shown.

[0028] As Figure 1 shown, the housing of the memory test device 100 may include an openable and closable upper shell 101 and a lower shell 102. A pressing structure 104 is provided inside the upper shell 101, and a memory card slot 103 is provided inside the lower shell 102. The memory card slot 103 is located at the bottom of the lower shell.

[0029] Among them, the memory card slot 103 is used to place the memory to be tested to test the memory to be tested; the memory to be tested may be DRAM.

[0030] Among them, since the memory test device (Test Socket) 100 has an openable and closable upper shell and lower shell, it can be opened. For example, through the fixed connecting member 108, the upper shell 101 can be lifted to open the memory test device; alternatively, the memory test device may not be provided with the fixed connecting member 108, and the upper shell of the memory test device is detachable, and the upper shell is removed to open the memory test device.

[0031] According to an embodiment of the present invention, the memory test device may further include an adjustable card slot device. When the housing of the memory test device is in a cuboid structure, the number of adjustable card slot devices may be four, and they are respectively arranged on the four side surfaces of the outer surface of the lower shell to adjust the length and width dimensions of the memory card slot from four directions, so that the size of the memory card slot is consistent with the size of the memory to be tested.

[0032] In Figure 1In this case, taking four adjustable card slot devices as an example, the memory test device 100 may include a first adjustable card slot device 1051, a second adjustable card slot device 1052, and a third adjustable card slot device 1053. Since Figure 1 is a side view of the memory test device, an adjustable card slot device is further provided on the opposite side of the side where the third adjustable card slot device 1053 is located.

[0033] According to an embodiment of the present invention, the adjustable card slot device is movably connected to the memory card slot. The adjustable card slot device may also be connected to the memory card slot 103 via a connection structure to achieve the movable connection between the adjustable card slot device and the memory card slot. The connection structure between each adjustable card slot device and the memory card slot is the same.

[0034] Taking Figure 1 the first adjustable card slot device 1051 in as an example, the first adjustable card slot device 1051 is connected to one side of the memory card slot 103 via a connection structure 109.

[0035] Since the adjustable card slot device is connected to the memory card slot via a connection structure, the adjustable card slot device can be used to drive the connection structure to move into the interior of the lower case when moving into the interior of the lower case, thereby driving the position of the memory card slot to change, that is, the size of the memory card slot can be adjusted via the connection structure to dynamically adapt to the physical profiles of different sizes of memories to be tested.

[0036] According to an embodiment of the present invention, the memory test device may further include a transfer mechanism 106. The transfer mechanism 106 is disposed inside the lower case 102 and is located at a position corresponding to the memory card slot. For example, the transfer mechanism 106 is located directly above the memory card slot 103. The transfer mechanism 106 is used to place the memory to be tested and transfer the memory to be tested into the memory card slot 103 to achieve the positioning and cooperation between the memory to be tested and the memory card slot.

[0037] According to an embodiment of the present invention, the memory testing device further includes a downward pressing stroke control device 107. The downward pressing stroke control device 107 is disposed corresponding to the memory card slot 103. For example, the downward pressing stroke control device 107 may be located directly above the memory card slot 103. The downward pressing stroke control device 107 passes through and extends downward above the outer surface of the upper housing 101. The end of the downward pressing stroke control device 107 is connected to the downward pressing structure 104. The downward pressing stroke control device 107 is used to adjust the downward pressing stroke of the downward pressing structure 104, that is, to adjust the downward displacement of the downward pressing structure 104, so that the downward pressing structure 104 contacts the top of the memory to be tested located in the memory card slot 103, and the electrical connection between the conductor array on the lower surface of the memory to be tested and the conductive contact array in the memory card slot is realized, so as to implement the test of the memory to be tested.

[0038] In one embodiment, the downward pressing structure 104 may be a square structure, and the downward pressing stroke control device 107 may include a screw part to move downward by rotation and drive the downward pressing structure 104 to also move downward.

[0039] According to an embodiment of the present invention, a conductive contact array is further provided in the memory card slot 103, that is, a conductive contact array is also provided at the bottom of the memory testing device. The conductive contact array may be a pin array. When the downward pressing stroke control device 107 makes the downward pressing structure 104 contact the top of the memory to be tested, the conductor array on the lower surface of the memory to be tested is electrically connected to the conductive contact array.

[0040] Specifically, the memory testing device may be disposed on a test circuit board. The other ends of the conductive contacts in the conductive contact array are electrically connected to the test circuit board, so that when the conductor array on the lower surface of the memory to be tested is electrically connected to the conductive contact array, the test of the memory to be tested can be realized. Thus, only by adjusting the memory card slot to a corresponding size and placing the memory to be tested in the memory card slot can the test of memory to be tested with different sizes be realized.

[0041] Among them, the conductors in the conductor array on the lower surface of the memory to be tested may be solder balls, and the arrangement of the conductors in the conductor array on the lower surface of the memory to be tested is the same as that of the conductive contacts in the conductive contact array; the arrangement of the conductors in the conductor array on the lower surface of the memories to be tested with different sizes is the same.

[0042] According to an embodiment of the present invention, based on the size of the memory to be tested, the memory card slot can be adjusted to a size matching the memory to be tested through an adjustable card slot device, so as to dynamically adapt to the physical profile of memory to be tested with different sizes; the transfer mechanism is used to realize the positioning cooperation between the memory to be tested and the memory card slot, and also facilitates the placement and taking of the memory to be tested; the downward stroke control device can be used to control the downward stroke of the downward pressing structure, so that while the downward pressing structure contacts the top of the memory to be tested, it is avoided that the downward stroke of the downward pressing structure is adjusted excessively, resulting in damage to the memory to be tested, and it is also avoided that the downward stroke of the downward pressing structure is adjusted insufficiently, resulting in poor contact between the conductor array at the bottom of the memory to be tested and the conductive contact array. Therefore, the settings of the adjustable card slot device, the downward pressing block and the transfer mechanism improve the versatility and reliability of the memory testing device, make the operation more convenient, and also improve the development efficiency.

[0043] Figure 2 The schematic diagram showing the connection structure between the adjustable card slot device and the memory card slot according to an embodiment of the present invention is shown.

[0044] As Figure 2 shown, the first adjustable card slot device 1051, the second adjustable card slot device 1052, and the third adjustable card slot device 1053 are arranged on the outer surface of the lower shell 102. Among them, a fourth adjustable card slot device 1054 is also arranged on the opposite side of the side where the third adjustable card slot device 1053 is located.

[0045] According to an embodiment of the present invention, the connection structure may include a boosting adapter, a card slot pusher, and a traction spring; the memory card slot may include a card slot wall, that is, the memory card slot is an area surrounded by four card slot walls; the adjustable card slot device is connected to the first end of the boosting adapter, the second end of the boosting adapter is connected to the first end of the card slot pusher, the second end of the card slot pusher is connected to the card slot wall, and both ends of the traction spring are respectively connected to the first end of the card slot pusher and the inner surface of the lower shell.

[0046] Taking Figure 1 the first adjustable card slot device 1051 in Figure 2 as an example, the connection structure 109 for connecting the first adjustable card slot device 1051 and the memory card slot 103 may specifically include a boosting adapter 201, a card slot pusher 202, and a traction spring 203 as shown in

[0047] Specifically, taking 4 card slot walls as an example, the first adjustable card slot device 1051 is connected to the first end of the boosting adapter 201, the second end of the boosting adapter 201 is connected to the first end of the card slot pusher 202, the second end of the card slot pusher 202 is connected to the first card slot wall 2051, and both ends of the traction spring are respectively connected to the first end of the card slot pusher 202 and the inner surface of the lower shell 102.

[0048] According to an embodiment of the present invention, based on the connection relationship among the adjustable card slot device, the boosting adapter, the card slot pusher, and the traction spring, by moving the adjustable card slot device, the boosting adapter and the card slot pusher can be driven to move, so that the size of the memory card slot can be adjusted.

[0049] According to an embodiment of the present invention, the inner surface of the lower shell is further provided with a first scale tooth and a second scale tooth, and the boosting adapter is located between the first scale tooth and the second scale tooth.

[0050] As Figure 2 shown, a first scale tooth and a second scale tooth are provided on both sides of each boosting adapter. One end of the first scale tooth and the second scale tooth is connected to the inner surface of the lower shell 102, and the first scale tooth and the second scale tooth are provided at the same horizontal height relative to the ground of the lower shell 102. Taking the boosting adapter 201 as an example, the boosting adapter 201 is located between the first scale tooth 2041 and the second scale tooth 2042.

[0051] According to an embodiment of the present invention, the boosting adapter can be an arrow-shaped structure, and the arrow tip part of the boosting adapter is of an openable and closable design, that is, the arrow tip part of the boosting adapter can be both expanded and contracted. Due to the openable and closable design of the boosting adapter, the adjustable card slot device can be configured to push the boosting adapter and the card slot pusher to move relative to the first scale tooth and the second scale tooth during the process of moving into the interior of the lower shell, so that the card slot wall moves, and thus the size of the memory card slot can be adjusted to be adapted to the size of the memory to be tested according to the scale markings of the first scale tooth and / or the second scale tooth, that is, the size of the memory card slot is adjusted to be the same as the size of the memory to be tested.

[0052] Wherein, scale markings are provided on the first scale tooth and / or the second scale tooth, and corresponding scales can be provided at each tooth of the first scale tooth and / or the second scale tooth, and the scale markings are used to represent the distance between two opposite card slot walls.

[0053] In Figure 2 it, scale markings are provided on the first scale tooth and / or the second scale tooth corresponding to each boosting adapter; the two first scale teeth in the same direction are the same, the two second scale teeth are also the same, and the scale markings provided on the first scale tooth and / or the second scale tooth are consistent.

[0054] Taking Figure 2Taking the scale markings shown in [Fig. 0] as an example, the scale markings of the first scale teeth 2041 and / or the second scale teeth 2042 opposite to the first adjustable card slot device 1051 are 6 mm to 8 mm. There are three saw teeth provided in both the first scale teeth 2041 and the second scale teeth 2042. When the boost adapter 201 moves downward inside the lower housing by one saw tooth, the boost adapter 201 will be located at the 8 mm scale marking. Similarly, moving the boost adapter corresponding to the second adjustable card slot device 1052 downward inside the lower housing by one saw tooth can indicate that the second adjustable card slot device 1052 and the first adjustable card slot device 1051 adjust the distance between the first card slot wall 2051 and the second card slot wall 2052 to 8 mm. Similarly, the adjustment principles of the third adjustable card slot device 1053 and the fourth adjustable card slot device 1054 are the same as those of the second adjustable card slot device 1052 and the first adjustable card slot device 1051, and will not be elaborated here.

[0055] Among them, the scale markings on the first scale teeth and / or the second scale teeth can be set according to actual needs.

[0056] Fig. 3(a) shows a schematic diagram of the adjustment process of the adjustable card slot device according to an embodiment of the present invention.

[0057] As shown in Fig. 3(a), taking the first adjustable card slot device 1051 as an example, during the process of the first adjustable card slot device 1051 moving downward inside the lower housing, such as moving in the direction shown by the arrow in Fig. 3(a), when the boost adapter 201 passes through the saw teeth in the first scale teeth and the second scale teeth, the tip part of the arrow of the boost adapter 201 is affected by the saw teeth and will contract to pass through the saw teeth. The contraction trajectory of the tip part of the arrow of the boost adapter 201 can be shown by the dashed line in Fig. 3(a).

[0058] Among them, the tip part of the arrow of the boost adapter 201 is parallel to the bottom of the lower housing; the contraction trajectory of the boost adapter can be specifically described as that the two hypotenuse parts of the tip of the arrow of the boost adapter are affected by the saw teeth, and the two hypotenuse parts contract, that is, the included angle between the two hypotenuse parts becomes smaller, and the part between the two hypotenuses folds downward in the direction of the inside of the lower housing.

[0059] Fig. 3(b) shows a schematic diagram of the completion of the adjustment of the adjustable card slot device according to an embodiment of the present invention.

[0060] As shown in Fig. 3(b), when it is necessary to move the first adjustable card slot device 1051 downward inside the lower housing by a distance of one saw tooth, after the boost adapter 201 passes through the first saw tooth, the boost adapter 201 is stuck at the plane of the first saw tooth of the first scale teeth 2041 and the second scale teeth 2042 on both sides, so that the first card slot wall 2051 moves from the position shown in Fig. 3(a) to the position shown in Fig. 3(b), thereby completing the adjustment.

[0061] Based on the above, the adjustment processes of the second adjustable card slot device 1052, the third adjustable card slot device 1053, and the fourth adjustable card slot device 1054 are the same as that of the first adjustable card slot device 1051, and thus will not be elaborated herein.

[0062] According to an embodiment of the present invention, serrated first scale teeth and second scale teeth are provided on both sides of the boosting adapter. The boosting adapter is arrow-shaped and the arrow tip part is designed to be openable and closable. When the scale adjuster moves into the interior of the lower shell, since the arrow tip part of the boosting adapter can contract, it pushes the boosting adapter and the card slot pusher to move along the serrations on the first scale teeth and the second scale teeth, so as to move the card slot wall, thereby enabling the size of the memory card slot to be adjusted to be consistent with the size of the memory under test according to the scale markings on the first scale teeth and / or the second scale teeth. At this time, the boosting adapter will be stuck on the scale teeth on both sides to stabilize the card slot wall, making the adjusted size of the memory card slot fixed.

[0063] According to an embodiment of the present invention, the adjustable card slot device can be configured to rotate a preset angle relative to the lower shell when the test on the memory under test is completed, so that when the constraints of the first scale teeth and the second scale teeth are removed, the traction spring restores to achieve the reset of the memory card slot.

[0064] Wherein, the preset angle can represent the angle that the adjustable card slot device needs to rotate relative to the lower shell in order to make the arrow tip part of the boosting adapter not be restricted by the serrations.

[0065] FIG. 3(c) shows a schematic diagram of the reset of the adjustable card slot device according to an embodiment of the present invention.

[0066] As shown in FIG. 3(c), taking the first adjustable card slot device 1051 as an example, when the test on the memory under test is completed, the first adjustable card slot device 1051 can be rotated a preset angle relative to the lower shell, so that the arrow tip part of the boosting adapter 201 is not restricted by the serrations. For example, the first adjustable card slot device 1051 is rotated 90° relative to the lower shell so that the arrow tip part of the boosting adapter 201 is perpendicular to the bottom of the lower shell, making the arrow tip part of the boosting adapter 201 not be restricted by the serrations. Since both ends of the traction spring are respectively connected to the inner surface of the lower shell and the first end of the card slot pusher, as shown in FIG. 3(b), thus during the restoration process of the traction spring 203, it can drive the boosting adapter, the card slot pusher, and the card slot wall to move along the arrow direction shown in FIG. 3(c) to achieve the backward reset of the memory card slot.

[0067] Wherein, the card slot wall will not rotate with the rotation of the boosting adapter.

[0068] According to an embodiment of the present invention, after the size of the memory card slot is adjusted and completed, since the boosting adapter is arrow-shaped, it will be stuck on the sawtooth to fix the size of the memory card slot. Thus, after the test of the memory to be tested is completed, the adjustable card slot device needs to be rotated by a preset angle relative to the lower housing, and the boosting adapter is also driven to rotate by the preset angle, so as to eliminate the constraint of the sawtooth on the boosting adapter, so that the traction spring between the inner surface of the lower housing and the first end of the card slot push restores to realize the reset of the memory card slot.

[0069] Figure 4 Fig. shows a schematic diagram of a transmission mechanism according to an embodiment of the present invention.

[0070] As Figure 4 shown, the transmission mechanism 106 can be a quadrilateral frame structure, and claw supports are provided at four corners of the quadrilateral frame for placing the memory to be tested.

[0071] According to an embodiment of the present invention, the memory to be tested 410 can be placed in the transmission mechanism 106, and the four claw supports in the transmission mechanism 106 are used to firmly clamp the memory to be tested 410, that is, the memory to be tested 410 is placed on the four claw supports to realize placing the memory to be tested in the transmission mechanism.

[0072] In one embodiment, the memory to be tested 410 is placed in the transmission mechanism 106, and the position of the memory to be tested 410 in the transmission mechanism 106 can be as Figure 4 shown, that is, the four claw supports of the transmission mechanism 106 can support the memory to be tested 410.

[0073] Wherein, the claw support forms a certain angle with the angular bisector of the two adjacent sides of the claw support and extends downward to the bottom of the lower housing. For example, the claw support forms a 45° angle with the angular bisector of the two adjacent sides of the claw support.

[0074] According to an embodiment of the present invention, based on the transmission mechanism as Figure 4 shown, the memory to be tested can be placed in the transmission mechanism, and the four claw supports in the transmission mechanism can stably clamp the memory to be tested, so that the memory to be tested can be smoothly transmitted to the memory card slot by the transmission mechanism.

[0075] Figure 5 Fig. shows a schematic diagram of a transmission mechanism controller according to an embodiment of the present invention.

[0076] As Figure 5 shown, which is a front view of the memory test device, the memory test device may further include a transmission mechanism controller 510, and a vertically movable handle 511 relative to the lower housing may be provided on the transmission mechanism controller 510.

[0077] Among them, the handle can be connected to the transfer mechanism to control the transfer mechanism. For example, Figure 5 the handle 511 shown in

[0078] is connected to the transfer mechanism 106. According to an embodiment of the present invention, the handle 511 on the transfer mechanism controller 510 can be used to control the transfer mechanism 106 to also move downward relative to the lower housing 102 by moving the handle 511 downward relative to the lower housing 102 when the memory to be tested is placed on the transfer mechanism 106, so as to transfer the memory to be tested into the memory card slot 103.

[0079] According to an embodiment of the present invention, the memory test device may further include a transfer mechanism controller for controlling the transfer mechanism. A handle is provided on the transfer mechanism controller. By moving the handle downward relative to the lower housing, the transfer mechanism can also be controlled to move downward, so that the memory to be tested can be transferred into the memory card slot, which is beneficial to stably and gently place the memory to be tested in the memory card slot and avoid the memory to be tested not being accurately placed in the memory card slot.

[0080] According to an embodiment of the present invention, the handle on the transfer mechanism controller can also be used to control the transfer mechanism to move upward relative to the lower housing when the test of the memory to be tested is completed, so as to take out the memory to be tested.

[0081] For example, Figure 5 as shown, when the test of the memory to be tested is completed, by moving the handle 511 upward relative to the lower housing 102, the transfer mechanism 106 is controlled to also move upward relative to the lower housing 102 to facilitate taking out the memory to be tested from the transfer mechanism 106.

[0082] According to an embodiment of the present invention, when the test of the memory to be tested is completed, by moving the handle upward relative to the lower housing, the transfer mechanism drives the memory to be tested to also move upward, thus facilitating the taking of the memory to be tested.

[0083] According to an embodiment of the present invention, the position of the pawls in the transfer mechanism is fixed; the size of the area formed by the ends of the four pawls in the transfer mechanism is smaller than the size of the memory to be tested and the size of the quadrilateral frame is larger than the size of the memory to be tested.

[0084] According to an embodiment of the present invention, during the process of placing the memory to be tested on the transfer mechanism, by placing the memory to be tested downward from the quadrilateral frame to the corresponding positions of the four pawls. Therefore, the size of the quadrilateral frame needs to be larger than the maximum size of the memory to be tested, so that the memory to be tested of any size can be placed downward from the quadrilateral frame. The size of the area formed by the ends of the four pawls needs to be smaller than the minimum size of the memory to be tested, so that the four pawls can stably hold the memory to be tested of any size, that is, the memory to be tested of any size will not fall off from the ends of the four pawls.

[0085] Among them, the positions of the four pawls can be set according to the size of the memory to be tested.

[0086] According to an embodiment of the present invention, the size of the area formed by the ends of the four pawls in the transfer mechanism is smaller than the size of the memory to be tested, so that the four pawls can hold the memory to be tested with the minimum size. The size of the quadrilateral frame is larger than the size of the memory to be tested, so that the memory to be tested with the maximum size can be placed therein, that is, memories to be tested of different sizes can be placed.

[0087] Figure 6 The schematic diagram of the memory card slot according to an embodiment of the present invention is shown.

[0088] As Figure 6 shown, taking 4 card slot walls as an example, the memory card slot is the area surrounded by the first card slot wall 2051, the second card slot wall 2052, the third card slot wall 2053 and the fourth card slot wall 2054. A strip texture is formed on the surface of the memory card slot that contacts the memory to be tested, that is, a strip texture is formed on the surfaces of the first card slot wall 2051, the second card slot wall 2052, the third card slot wall 2053 and the fourth card slot wall 2054 that contact the memory to be tested.

[0089] Among them, the lengths of the first card slot wall 2051, the second card slot wall 2052, the third card slot wall 2053 and the fourth card slot wall 2054 are smaller than the length of the side surface of the memory to be tested with the minimum size, so as to avoid the obstruction of the card slot wall to the pawls while stabilizing the memory to be tested.

[0090] According to an embodiment of the present invention, a strip texture can be formed on the surface of the card slot wall that contacts the memory to be tested, so as to increase the friction between the memory to be tested and the periphery of the memory card slot, ensure that the memory to be tested is firmly installed in the memory card slot and stabilize the memory to be tested, thereby facilitating the precise fitting of the conductor array at the bottom of the memory to be tested and the conductive contact array.

[0091] According to an embodiment of the present invention, grooves are further provided around the memory card slot. When the transfer mechanism transfers the memory to be tested into the memory card slot, the transfer mechanism enters the grooves.

[0092] Figure 7 The schematic diagram shows a memory to be tested according to an embodiment of the present invention located in a memory card slot.

[0093] As Figure 7 shown, the memory 410 to be tested is located in the memory card slot formed by the first card slot wall 2051, the second card slot wall 2052, the third card slot wall 2053, and the fourth card slot wall 2054, and the transfer mechanism 106 also enters the grooves around the memory card slot accordingly.

[0094] In Figure 7 , the conductor array on the lower surface of the memory 410 to be tested is in electrical contact with the conductive contact array 710 in the memory card slot.

[0095] According to an embodiment of the present invention, when the transfer mechanism transfers the memory to be tested to the memory card slot at the bottom, the transfer mechanism will also enter the pre - reserved groove accordingly, without affecting the fitting of the conductor array at the bottom of the memory to be tested and the conductive contact array. And when the test of the memory to be tested is completed, the transfer mechanism moves upward relative to the lower housing, and the claws will protrude from the bottom of the groove and move upward relative to the lower housing to send out the memory to be tested.

[0096] According to an embodiment of the present invention, a rotation scale is also formed on the surface of the downward pressure stroke control device, and the rotation scale can be used to characterize the downward pressure stroke of the downward pressure structure.

[0097] According to an embodiment of the present invention, a viewing window is also provided on the outer surface of the lower housing, and a downward pressure scale is formed on the viewing window. The downward pressure scale can be used to display the distance between the downward pressure structure and the memory to be tested.

[0098] Figure 8 The schematic diagram shows a memory test device according to another embodiment of the present invention.

[0099] As Figure 8 shown, a rotation scale 810 is also formed on the surface of the downward pressure stroke control device 107. The rotation scale 810 can characterize the downward pressure stroke of the downward pressure structure. For example, when the rotation scale on the surface of the downward pressure stroke control device 107 indicates 4, it can indicate that the downward pressure stroke of the downward pressure structure is 4 unit lengths at this time, that is, the downward pressure structure moves downward by 4 unit lengths of distance.

[0100] In Figure 8In this case, taking two visual windows as an example, the outer surface of the lower housing is further provided with a first visual window 821 and a second visual window 822. A first downward pressure scale is formed on the first visual window 821, and a second downward pressure scale is formed on the second visual window 822. The first downward pressure scale and the second downward pressure scale can be used to display the distance between the downward pressure structure and the memory to be tested. Among them, the first downward pressure scale on the first visual window 821 and the second downward pressure scale on the second visual window 822 are the same; the part of the outer surface of the lower housing where the visual window is provided can be made of a transparent material.

[0101] In one embodiment, if the distance between the downward pressure structure and the memory to be tested observed through the first visual window 821 and the second visual window 822 is 10 unit lengths, the downward pressure travel control device 107 can be rotated so that the rotation scale formed on the surface of the downward pressure travel control device 107 points to the scale mark of 10, so as to press down the downward pressure structure by a distance of 10 unit lengths, so that the downward pressure structure contacts the top of the memory to be tested.

[0102] Among them, the units of the downward pressure scale and the rotation scale can be mm; the scale marks of the downward pressure scale and the rotation scale can be set according to actual needs.

[0103] According to an embodiment of the present invention, the surface of the downward pressure travel control device is provided with a rotation scale to indicate the downward pressure travel of the downward pressure structure at this time through the rotation scale. The downward pressure scale on the visual window facilitates observing the distance between the downward pressure structure and the memory to be tested. Thus, based on the rotation scale and the downward pressure scale, the appropriate downward pressure travel of the downward pressure structure can be adjusted, avoiding damage to the memory to be tested caused by excessive adjustment of the downward pressure travel of the downward pressure structure and poor contact between the conductor array at the bottom of the memory to be tested and the conductive contact array and inability to fix the memory to be tested caused by insufficient adjustment of the downward pressure travel of the downward pressure structure.

[0104] According to an embodiment of the present invention, the size of the lower surface of the downward pressure structure is smaller than the size of the memory to be tested, so as to electrically connect the conductor arrays on the lower surfaces of memories to be tested with different sizes to the conductive contact arrays in the memory card slots.

[0105] According to an embodiment of the present invention, the lower surface of the downward pressure structure needs to contact the top of the memory to be tested, so as to apply a certain force to the memory to be tested to make the memory to be tested in close contact with the conductive contact array. Therefore, the size of the lower surface of the downward pressure structure needs to be smaller than the upper surface size of the smallest memory to be tested, so that the downward pressure structure can adapt to the contact surfaces of memories to be tested with different sizes and make the conductor arrays on the lower surfaces of memories to be tested fit precisely with the conductive contact arrays.

[0106] According to an embodiment of the present invention, the pressing structure is used to contact the top of the memory to be tested, so that the conductor array on the lower surface of the memory to be tested is in good contact with the conductive contact array. Therefore, the size of the lower surface of the pressing structure needs to be smaller than the minimum size of the memory to be tested, so that the pressing structure can adapt to the contact surfaces of memories to be tested with different sizes, and improve the stability and fitting accuracy of the contact between the memory to be tested and the conductive contact array.

[0107] Based on the above, the memory test device of the present invention can adjust the size of the memory card slot to dynamically adapt to the physical profiles of memories to be tested with different sizes, and is provided with a transfer mechanism, a viewing window, etc., making the operation convenient while ensuring the stable and reliable testing of the memory to be tested.

[0108] Figure 9 The flowchart of the test method for a memory according to an embodiment of the present invention is shown.

[0109] As Figure 9 shown, the method 900 includes operations S910 to S940.

[0110] Among them, the method 900 is applied to the memory test device 100 described above.

[0111] In operation S910, control the adjustable card slot device to move inside the lower case to adjust the size of the memory card slot so that the size of the memory card slot is the same as the size of the memory to be tested.

[0112] According to an embodiment of the present invention, before testing the memory to be tested, the upper case 101 as Figure 1 shown can be first lifted, and based on the size of the memory to be tested, control the adjustable card slot device to move inside the lower case to adjust the size of the memory card slot to be the same as the size of the test memory.

[0113] In operation S920, control the memory to be tested to be placed on the transfer mechanism.

[0114] In operation S930, control the transfer mechanism to move downward relative to the lower case to transfer the memory to be tested into the memory card slot, realizing the positioning and matching of the memory to be tested and the memory card slot.

[0115] According to an embodiment of the present invention, the transfer mechanism can be controlled to move downward relative to the lower case through the handle 511 on the transfer mechanism controller 510 as Figure 5 shown.

[0116] In operation S940, the downward pressing stroke control device is controlled to rotate relative to the upper shell to adjust the downward pressing stroke of the downward pressing structure, so that the conductor array on the lower surface of the memory under test is electrically connected to the conductive contact array in the memory card slot, thereby realizing the test of the memory under test.

[0117] According to an embodiment of the present invention, it is possible to control the rotation of the downward pressing stroke control device relative to the upper shell based on the first downward pressing scale on the first visual window 821, the second downward pressing scale on the second visual window 822, and the rotation scale 810 as shown in Figure 8 so that the downward pressing structure contacts the top of the memory under test.

[0118] According to an embodiment of the present invention, based on the size of the memory under test, the memory card slot can be adjusted to a size matching the memory under test through the adjustable card slot device to dynamically adapt to the physical profiles of different sizes of memories under test; the transfer mechanism is used to realize the positioning cooperation between the memory under test and the memory card slot, and also facilitates the placement and removal of the memory under test; the downward pressing stroke control device can be used to control the downward pressing stroke of the downward pressing structure, so that while the downward pressing structure contacts the top of the memory under test, it is avoided that the downward pressing stroke of the downward pressing structure is adjusted excessively, resulting in damage to the memory under test, and it is also avoided that the downward pressing stroke of the downward pressing structure is adjusted insufficiently, resulting in poor contact between the conductor array at the bottom of the memory under test and the conductive contact array. Therefore, the settings of the adjustable card slot device, the downward pressing block, and the transfer mechanism improve the versatility and reliability of the memory test device, make the operation more convenient, and also improve the development efficiency.

[0119] According to an embodiment of the present invention, when the test of the memory under test is completed, the above-mentioned memory test method further includes: controlling the downward pressing stroke control device to rotate relative to the upper shell so that the downward pressing structure moves upward relative to the lower shell into the interior of the upper shell; controlling the adjustable card slot device to rotate a preset angle relative to the lower shell so that the memory card slot is reset; controlling the transfer mechanism to move upward relative to the lower shell to facilitate the removal of the memory under test.

[0120] According to an embodiment of the present invention, when the test of the memory under test is completed, the downward pressing stroke control device is controlled to rotate relative to the upper shell so that the downward pressing structure moves upward relative to the lower shell into the interior of the upper shell. At this time, the rotation direction of the downward pressing stroke control device is opposite to the rotation direction in operation S940.

[0121] According to an embodiment of the present invention, as shown in FIG. 3(c), the adjustable card slot device is controlled to rotate a preset angle relative to the lower shell, driving the booster adapter to rotate a corresponding preset angle, thereby removing the constraint of the saw teeth, and resetting the memory card slot during the recovery process of the traction spring.

[0122] According to an embodiment of the present invention, when the test of the memory under test is completed, the downward stroke control device is controlled to rotate relative to the upper shell to move the downward pressing structure upward into the upper shell, so that the upper shell can be opened, and the adjustable card slot device is controlled to rotate a preset angle relative to the lower shell to reset the memory card slot, and the conveying mechanism is controlled to move upward so that the memory under test can be taken out.

[0123] The flowcharts and block diagrams in the accompanying drawings illustrate the possible architectures, functions, and operations of systems, methods, and computer program products according to various embodiments of the present invention. In this regard, each block in the flowchart or block diagram may represent a module, a program segment, or a part of code that contains one or more executable instructions for implementing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the blocks may occur in a different order than that marked in the accompanying drawings. For example, two consecutive blocks shown may actually be executed substantially in parallel, and they may sometimes be executed in the reverse order, depending on the functions involved. It should also be noted that each block in the block diagram or flowchart, as well as the combination of blocks in the block diagram or flowchart, can be implemented by a dedicated hardware-based system that performs the specified functions or operations, or can be implemented by a combination of dedicated hardware and computer instructions.

[0124] Those skilled in the art can understand that the features described in the various embodiments of the present invention can be combined and / or combined in various ways, even if such combinations or combinations are not explicitly described in the present invention. In particular, without departing from the spirit and teachings of the present invention, the features described in the various embodiments of the present invention can be combined and / or combined in various ways. All such combinations and / or combinations fall within the scope of the present invention.

[0125] The embodiments of the present invention have been described above. However, these embodiments are for illustrative purposes only and are not intended to limit the scope of the present invention. Although the embodiments have been described separately above, this does not mean that the measures in each embodiment cannot be used advantageously in combination. Without departing from the scope of the present invention, those skilled in the art can make various substitutions and modifications, and all such substitutions and modifications should fall within the scope of the present invention.

Claims

1. A memory testing device, characterized in that: The memory testing device comprises: The housing comprises an upper housing and a lower housing which can be opened and closed, wherein a memory card slot is arranged in the lower housing; An adjustable slot device, movably connected to the memory slot, for adjusting the size of the memory slot to dynamically adapt to the physical contours of the memory to be tested of different sizes; Wherein, the memory test device further comprises a booster connector, a slot pusher and a traction spring; the memory slot comprises a slot wall; the adjustable slot device is connected to the first end of the booster connector, the second end of the booster connector is connected to the first end of the slot pusher, the second end of the slot pusher is connected to the slot wall, and the two ends of the traction spring are respectively connected to the first end of the slot pusher and the inner surface of the lower shell; The inner surface of the lower shell is provided with a first scale tooth and a second scale tooth, the booster connector is located between the first scale tooth and the second scale tooth, and the booster connector is in the shape of an arrow; The adjustable slot device is configured to push the booster connector and the slot pusher to move relative to the first scale tooth and the second scale tooth during the process of moving toward the inside of the lower shell, so as to move the slot wall, thereby adjusting the size of the memory slot to match the size of the memory to be tested according to the scale mark of the first scale tooth and / or the scale mark of the second scale tooth; A transmission mechanism, arranged at a position corresponding to the memory card slot, for realizing the positioning and matching between the memory to be tested and the memory card slot; A downward pressing stroke control device passes through the upper shell and is used to adjust the downward pressing stroke of the downward pressing structure so as to electrically connect the conductor array on the lower surface of the memory to be tested with the conductive contact array in the memory card slot through the downward pressing structure to realize the test of the memory to be tested.

2. The memory testing device according to claim 1, characterized in that: The adjustable slot device is configured to rotate a preset angle relative to the lower shell when the test of the memory to be tested is completed, so that when the constraints of the first scale teeth and the second scale teeth are removed, the traction spring is restored to achieve the resetting of the memory slot.

3. The memory testing device according to claim 1, characterized in that: The conveying mechanism is a quadrilateral frame, and four corners of the quadrilateral frame are provided with supporting claws, and the supporting claws are used to place the memory to be tested.

4. The memory testing device according to claim 3, characterized in that: The memory testing device further comprises a conveying mechanism controller, on which a handle is provided which is vertically movable relative to the lower shell; The handle on the conveying mechanism controller is used to control the conveying mechanism to move downward relative to the lower shell when the memory to be tested is placed on the conveying mechanism, so as to convey the memory to be tested to the memory card slot.

5. The memory testing device according to claim 4, characterized in that: The handle on the conveying mechanism controller is also used to control the conveying mechanism to move upward relative to the lower shell when the test of the memory to be tested is completed, so as to take out the memory to be tested.

6. The memory testing device according to claim 5, characterized in that: Grooves are also arranged around the memory card slot. When the conveying mechanism conveys the memory to be tested to the memory card slot, the conveying mechanism enters the grooves.

7. The memory testing device according to claim 3, characterized in that: The positions of the claws in the conveying mechanism are fixed; the size of the area formed by the ends of the four claws in the conveying mechanism is smaller than the size of the memory to be tested and the size of the quadrilateral frame is larger than the size of the memory to be tested.

8. The memory testing device according to any one of claims 1 to 7, characterized in that: A stripe texture is formed on a surface of the memory card slot that contacts the memory to be tested.

9. The memory testing device according to any one of claims 1 to 7, characterized in that: A rotation scale is formed on the surface of the pressing stroke control device, and the rotation scale is used to indicate the pressing stroke of the pressing structure.

10. The memory testing device according to claim 9, characterized in that: A visual window is arranged on the outer surface of the lower shell, and a pressing scale is formed on the visual window. The pressing scale is used to display the distance between the pressing structure and the memory to be tested.

11. The memory testing device according to claim 10, characterized in that: The size of the lower surface of the pressing structure is smaller than the size of the memory to be tested, so as to electrically connect the conductor array on the lower surface of the memory to be tested of different sizes with the conductive contact array in the memory card slot.

12. A memory testing method, characterized in that: The memory testing device according to any one of claims 1 to 11; the method comprising: Control the adjustable card slot device to move toward the inside of the lower shell to adjust the size of the memory card slot so that the size of the memory card slot is consistent with the size of the memory to be tested; Controlling the storage device to be tested to be placed on a conveying mechanism; Controlling the conveying mechanism to move downward relative to the lower shell to convey the memory to be tested to the memory card slot, thereby achieving positioning and matching between the memory to be tested and the memory card slot; The pressing stroke control device is controlled to rotate relative to the upper shell to adjust the pressing stroke of the pressing structure, so that the conductor array on the lower surface of the memory to be tested is electrically connected to the conductive contact array in the memory card slot to implement the test of the memory to be tested.

13. The method according to claim 12, characterized in that When the test of the memory to be tested is completed, the method further includes: Controlling the downward pressing stroke control device to rotate relative to the upper shell so that the downward pressing structure moves upward relative to the lower shell to the inside of the upper shell; Controlling the adjustable card slot device to rotate relative to the lower shell by a preset angle to reset the memory card slot; The conveying mechanism is controlled to move upward relative to the lower shell so as to take out the memory to be tested.

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