Detection method and detection light path system of optical spectacle lens

Abstract

The invention discloses a detection method and a detection light path system of an optical spectacle lens, and relates to the technical field of optical spectacle lens detection.The detection method of the optical spectacle lens comprises the steps that a calibration wavefront is obtained; according to the calibration wavefront, obtaining reference focusing light spot dot matrix distribution, and taking the reference focusing light spot dot matrix distribution as a reference position; receiving a to-be-measured optical spectacle lens, and obtaining transmission light focusing light spot dot matrix distribution; acquiring a focusing light spot space wavefront slope distribution matrix according to the reference position and the transmission light focusing light spot dot matrix distribution; obtaining wavefront distribution of transmission light and a corresponding Zernike coefficient in combination with a wavefront sensing algorithm and the focusing light spot space wavefront slope distribution matrix; and obtaining the refractive distribution of the to-be-measured optical spectacle lens by combining the parameters of the to-be-measured optical spectacle lens, the wavefront distribution of the transmission light and the corresponding Zernike coefficient. The content of the detection method of the optical spectacle lens provided by the technical scheme of the invention can improve the detection precision and efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of optical eyeglass lens detection, and in particular to an optical eyeglass lens detection method and a detection light path system. Background Art

[0002] Due to its asymmetric surface shape, excellent imaging quality, flexible spatial layout, rich design freedom and other advantages, free-form surface lenses have been widely developed and applied in the field of functional frame lenses in recent years, providing unlimited possibilities for personalized customized lens design. Common functional lenses include progressive defocus lenses, progressive multifocal lenses, anti-fatigue lenses, etc. Specific areas of such lenses are used to correct hyperopia, ensure that distant objects are imaged at the central macula of the retina to achieve clear vision, and other areas are used to provide peripheral defocus to prevent myopia or to reduce human eye adjustment for near vision. However, compared with traditional symmetrical single-focus lenses, the high performance of free-form surface lenses depends on the dual accuracy of surface luminosity and spatial position, which puts forward more complex and demanding requirements on the optical design and manufacturing process of free-form surface lenses. How to detect and evaluate the surface quality of free-form surface lenses is one of the key technologies to ensure and improve the optical function of free-form surface lenses. Therefore, studying the surface shape measurement of free-form surface lenses is of great significance to improve the surface shape accuracy of free-form surface lenses, promote the further expansion of free-form surface applications of lenses, and meet increasingly complex application needs.

[0003] Traditional free-form surface lens detection methods include laser interferometry, coherent scanning interferometry, and color confocal method. The detection range of surface curvature is limited, the measurement accuracy is low, and it takes a long time. Summary of the invention

[0004] The main purpose of the present invention is to provide a method for detecting optical spectacle lenses, aiming to solve the technical problem that the current lens detection method has low measurement accuracy.

[0005] To achieve the above object, the present invention provides a method for detecting optical lenses, comprising:

[0006] Obtaining a calibration wavefront;

[0007] Obtain the reference focusing spot array distribution according to the calibration wavefront and use it as the reference position;

[0008] Receiving the optical eyeglasses to be tested and obtaining the distribution of the focused light spot array of the transmitted light;

[0009] Acquire a focus spot spatial wavefront slope distribution matrix according to the reference position and the transmission light focus spot array distribution;

[0010] Combining the wavefront sensing algorithm and the focus spot spatial wavefront slope distribution matrix to obtain the wavefront distribution of the transmitted light and the corresponding Zernike coefficient;

[0011] The refractive distribution of the optical lens to be tested is obtained by combining the parameters of the optical lens to be tested, the wavefront distribution of the transmitted light and the corresponding Zernike coefficients.

[0012] The step of obtaining the calibration wavefront comprises:

[0013] A wavefront sensor is used to obtain the wavefront distribution of the collimated light;

[0014] Using a deformable mirror to compensate and correct the wavefront distortion of the wavefront distribution;

[0015] The calibration wavefront is obtained by repeatedly iterating the above two steps.

[0016] In one embodiment, during the repeated iterations, until the wavefront converges and the PV value of the wavefront distribution is less than 0.05λ, the wavefront obtained at this time is the calibration wavefront, and the PV value is defined as the difference between the highest point and the lowest point of the phase in the wavefront distribution.

[0017] In one embodiment, the step of using a deformable mirror to compensate for the wavefront distortion of the collimated light includes:

[0018] Adding a corresponding wavefront compensation value to the deformable mirror according to the wavefront distortion;

[0019] The wavefront distortion is obtained by inverting the wavefront distribution through a processor.

[0020] In one embodiment, the step of acquiring a reference focused light spot array distribution according to a calibration wavefront comprises:

[0021] By calibrating the wavefront incident dual-lens image transfer system and the microlens array, and obtaining the reference focusing light spot array distribution through a CCD camera; and / or,

[0022] The step of obtaining the distribution of the transmission light focus spot array comprises:

[0023] Acquire the wavefront to be measured through the optical lens to be measured by calibrating the wavefront;

[0024] The distribution of the focused light spot array of the transmitted light is obtained by incidenting the wavefront to be measured on the double-lens image transfer system and the microlens array.

[0025] In one embodiment, obtaining a focus spot spatial wavefront slope distribution matrix according to the reference position and the transmission light focus spot array distribution includes:

[0026] The detection focus spot array distribution is compared with the reference focus spot array distribution to obtain the microlens array firsti The subaperture corresponds to x and y The deviations in the directions are Δxi and Δyi respectively, and the spatial wavefront slope matrix G of the focused spot is equal to:

[0027]

[0028] Where n represents the number of sub-apertures in the microlens array, and G represents the wavefront slope in the x or y direction in the i-th sub-aperture:

[0029]

[0030] Where f is the focal length of the microlens array, s is the area of ​​the subaperture, It is the wavefront distribution of the light transmitted by the optical lens to be tested.

[0031] In one embodiment, the Zernike coefficient matrix D can be expressed as:

[0032]

[0033] Among them, Z xk,i represents the integral parameter of the kth Zernike polynomial of the ith subaperture in the x direction, Z yk,i represents the integral parameter of the k-th Zernike polynomial of the ith subaperture in the y direction, and m represents the number of terms of the considered Zernike polynomial;

[0034] The relationship between the Zernike coefficient matrix A and the G and D matrices satisfies:

[0035]

[0036] The Zernike coefficient matrix A can be obtained by matrix inversion:

[0037] A=D + G;

[0038] Among them, D + represents the generalized inverse matrix of the D matrix;

[0039] Get the Zernike coefficients and the wavefront distribution of the light transmitted by the optical lens to be tested It is expressed as:

[0040]

[0041] Z k represents the kth Zernike polynomial.

[0042] In one embodiment, the optical spectacle lens to be tested comprises a front surface and a rear surface arranged opposite to each other, wherein the front surface is a side away from the eye, and the rear surface is a side close to the eye;

[0043] The surface profile distribution z(x,y) of the rear surface satisfies the following formula:

[0044]

[0045] Wherein, Δd(x, y) is the thickness difference distribution of the optical lens to be tested, and the thickness difference distribution satisfies:

[0046] Where, d is the center thickness of the optical lens to be tested, n0 is the refractive index, R is the radius of curvature of the front surface,

[0047] The main radius of curvature of the rear surface is defined as r, which satisfies the following equation:

[0048]

[0049] Any point on the rear surface has two mutually orthogonal radii of curvature r1 and r2, where r1 and r2 are two roots of the above equation;

[0050] The refractive distribution of the optical lens to be tested includes a spherical distribution and a cylindrical distribution, and the spherical distribution S(x, y) and the cylindrical distribution C(x, y) can be calculated by the following formula:

[0051]

[0052] The present invention further proposes a detection optical path system for optical eyeglass lenses, the detection optical path system is applied to the detection method for optical eyeglass lenses as described above, and the detection optical path system comprises:

[0053] light source;

[0054] A collimation module, through which the light beam emitted by the light source forms collimated light;

[0055] A wavefront sensor, used to obtain the wavefront distribution of the collimated light, the calibration wavefront of the calibration light, and the wavefront of the transmitted light;

[0056] A processor, using the wavefront distribution to obtain wavefront distortion through inversion, and obtaining a wavefront compensation value through the wavefront distortion; and

[0057] The processor loads the wavefront compensation value to the deformable mirror to correct the wavefront distortion.

[0058] In one embodiment, the detection optical path system further comprises a dual-lens image transfer system, and the dual-lens image transfer system comprises a first lens and a second lens;

[0059] The optical glasses lens to be tested is placed at a distance s1 in front of the first lens, the focal lengths of the first lens and the second lens are f1 and f2 respectively, and the distance between the two is f1+f2, the distance between the second lens and the microlens array is s2, and s1+s2=f1+f2 is satisfied.

[0060] The technical solution of the present invention obtains a reference focusing spot array distribution by adopting a calibrated wavefront, obtains a transmitted light focusing spot array distribution according to the transmitted light passing through the optical lens to be tested with a free-form surface, combines the transmitted light focusing spot array distribution with the reference focusing spot array distribution to obtain a focusing spot spatial wavefront slope distribution matrix, and then combines the wavefront sensing algorithm to obtain the transmitted light wavefront distribution and the corresponding Zernike coefficient, and the two are combined with the parameters of the optical lens to be tested to obtain the overall refractive distribution of the optical lens to be tested. In this way, the detection method of obtaining the refractive distribution by inverting the transmitted light wavefront distribution can improve the detection accuracy of the refractive distribution of the free-form surface. This method can effectively and quickly detect and evaluate the optical properties of free-form surfaces, and has important guiding value for the customization of high-precision free-form surfaces. BRIEF DESCRIPTION OF THE DRAWINGS

[0061] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying creative work.

[0062] Figure 1 A schematic diagram of a flow chart of an embodiment of a method for detecting optical eyeglass lenses provided by the present invention;

[0063] Figure 2 A schematic diagram of a detection optical path system for an optical eyeglass lens provided by the present invention;

[0064] Figure 3 It is a light spot focusing array diagram of the microlens array before and after the collimated light correction compensation;

[0065] Figure 4 Schematic diagram of wavefront distribution before and after collimated light compensation correction;

[0066] Figure 5 A schematic diagram of the optical lens detection optical path system provided by the present invention after the optical lens to be tested is inserted;

[0067] Figure 6 Schematic diagram of imaging of the wavefront to be measured on the CCD.

[0068] Description of Figure Numbers:

[0069] 1. Light source; 2. Laser beam expander; 3. Collimation module; 4. Collimated wavefront distribution; 5. Deformable mirror; 6. Plane reflector; 7. Calibrated wavefront distribution; 8. Optical lens to be tested; 9. Wavefront to be tested; 10. Dual-lens image transfer system; 11. Microlens array; 12. CCD; 13. Processor.

[0070] The realization of the purpose, functional features and advantages of the present invention will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0071] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0072] It should be noted that if the embodiments of the present invention involve directional indications (such as up, down, left, right, front, back, etc.), the directional indications are only used to explain the relative position relationship, movement status, etc. between the components in a certain specific posture. If the specific posture changes, the directional indication will also change accordingly.

[0073] In addition, if there are descriptions involving "first", "second", etc. in the embodiments of the present invention, the descriptions of "first", "second", etc. are only used for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of technical features indicated. Therefore, the features limited to "first" and "second" may explicitly or implicitly include at least one of the features. In addition, if "and / or" or "and / or" appears in the full text, its meaning includes three parallel solutions. Taking "A and / or B" as an example, it includes solution A, solution B, or solutions that satisfy both A and B. In addition, the technical solutions between the various embodiments can be combined with each other, but it must be based on the ability of ordinary technicians in this field to implement. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0074] In the prior art, conventional free-form surface lens detection methods include laser interferometry, coherent scanning interferometry, and color confocal method, which have limited detection range of surface curvature, low measurement accuracy, and are time-consuming.

[0075] The invention provides a method for detecting optical spectacle lenses.

[0076] See also Figure 1As shown, in one embodiment of the present invention, the optical lens detection method includes:

[0077] S1: obtain calibration wavefront;

[0078] S2: Obtain the reference focusing spot array distribution according to the calibration wavefront and use it as the reference position;

[0079] S3: receiving the optical eyeglasses to be tested, and obtaining the distribution of the focused light spot array of the transmitted light;

[0080] S4: acquiring a focus spot spatial wavefront slope distribution matrix according to the reference position and the focus spot array distribution of the transmitted light;

[0081] S5: Combining the wavefront sensing algorithm and the focus spot spatial wavefront slope distribution matrix to obtain the wavefront distribution of the transmitted light and the corresponding Zernike coefficient;

[0082] S6: Obtain the refractive distribution of the optical lens to be tested by combining the parameters of the optical lens to be tested, the wavefront distribution of the transmitted light and the corresponding Zernike coefficients.

[0083] It should be noted that this detection method is applied to an optical lens detection optical path system, referring to Figure 2 and Figure 5 As shown, specifically, the detection optical path system includes: a light source 1, a laser beam expander 2, a collimation module 3, a deformable mirror 5, a plane reflector 6, a dual-lens image transfer system 10, a wavefront sensor composed of a microlens array 11 and a CCD 12 camera, a PC processor 13, etc. The light source 1 is a laser light source 1 for emitting a light beam, the laser beam expander 2 diffuses the light beam to form divergent light, the collimation module 3 collimates the divergent light to form collimated light, the deformable mirror 5 and the plane reflector 6 are used to reflect the collimated light into the dual-lens image system, the wavefront sensor is used to obtain the collimated light wavefront distribution, the PC processor 13 is used to invert and obtain the collimated light wavefront distortion, and load the corresponding wavefront compensation value onto the deformable mirror 5.

[0084] In this embodiment, when the collimated light is corrected multiple times and a calibration wavefront is obtained, the collimated light incident on the dual-lens image transfer system is the calibration light, and the calibration light is further incident on the microlens array to obtain a reference focus spot array distribution, and the position of the spot in this array distribution is used as the reference position. The optical lens to be tested is inserted into the detection optical path system, wherein the position where the optical lens to be tested is inserted is between the plane reflector and the dual-lens image transfer system. The calibration light passes through the optical lens to be tested to form a transmitted light. Compared with the calibration light, the transmitted light wavefront distribution, that is, the test wavefront is affected by the free-form surface of the optical lens to be tested and changes, and the transmission light focus spot array distribution is further obtained through the microlens array. The spot deviates from the reference position of the spot obtained by the calibration light. According to the offset and then combined with the wavefront sensing algorithm, the focus spot spatial front slope distribution matrix can be obtained. Then, the refractive distribution of the optical lens to be tested is obtained by combining the parameters of the optical lens to be tested, the wavefront distribution of the transmitted light and the corresponding Zernike coefficient.

[0085] The technical solution of the present invention obtains a reference focusing spot array distribution by adopting a calibrated wavefront, obtains a transmitted light focusing spot array distribution according to the transmitted light passing through the optical lens to be tested with a free-form surface, combines the transmitted light focusing spot array distribution with the reference focusing spot array distribution to obtain a focusing spot spatial wavefront slope distribution matrix, and then combines the wavefront sensing algorithm to obtain the transmitted light wavefront distribution and the corresponding Zernike coefficient, and the two are combined with the parameters of the optical lens to be tested to obtain the overall refractive distribution of the optical lens to be tested. In this way, the detection method of obtaining the refractive distribution by inverting the transmitted light wavefront distribution can improve the detection accuracy of the refractive distribution of the free-form surface. This method can effectively and quickly detect and evaluate the optical properties of free-form surfaces, and has important guiding value for the customization of high-precision free-form surfaces.

[0086] In one embodiment, S1: the step of obtaining a calibration wavefront comprises:

[0087] S11: Acquire the wavefront distribution of the collimated light using a wavefront sensor;

[0088] S12: compensating and correcting the wavefront distortion of the wavefront distribution by using a deformable mirror;

[0089] S13: The calibration wavefront is obtained by repeatedly iterating the above two steps.

[0090] It should be noted that, in the iterative process, until the wavefront converges and the PV value of the wavefront distribution is less than 0.05λ, the wavefront obtained at this time is the calibration wavefront, where the PV value is defined as the difference between the highest point and the lowest point of the phase in the wavefront distribution.

[0091] Further, S12: the step of using a deformable mirror to compensate and correct the wavefront distortion of the collimated light includes:

[0092] Adding a corresponding wavefront compensation value to the deformable mirror according to the wavefront distortion;

[0093] The wavefront distortion is obtained by inverting the wavefront distribution through a processor.

[0094] Figure 2 In order to calibrate the wavefront distribution, a schematic diagram of the optical path is obtained. In the specific implementation process, the light source 1 is a laser light source. The laser light source obtains divergent light through the laser beam expander 2, and the divergent light obtains primary collimated light through the collimation module 3 composed of three lenses. There is still some low-frequency wavefront distortion in its collimated wavefront distribution 4. If the incident detection is directly performed on the optical lens 8 to be tested, additional detection errors will be introduced. Therefore, the primary collimated wavefront 4 needs to be wavefront corrected and controlled. The primary collimated light passes through the deformable mirror 5, the plane reflector 6 and the dual-lens image transfer system 10 and is transmitted to the wavefront sensor composed of the microlens array 11 and the CCD 12. The CCD 12 is placed at the focal plane of the microlens array 11. After the PC processor 13 inverts and obtains the primary collimated light wavefront distortion, the corresponding wavefront compensation value is loaded onto the deformable mirror 5. At present, it is difficult to ensure accurate compensation of wavefront distortion by wavefront control of a single deformable mirror, and there may be under-compensation or over-compensation. Therefore, it is necessary to perform repeated iterations of "detection-compensation-detection-...-compensation-detection" until the wavefront distribution converges and the PV value is less than 0.05λ, and the calibration wavefront distribution 7 is obtained. Of course, it is understandable that after repeated iterative compensation, the low-frequency wavefront distortion in the collimated wavefront distribution 4 of the collimated light is corrected and compensated, and the calibration light is obtained.

[0095] The initial collimated light, i.e. the wavefront before correction and the wavefront after compensation correction are distributed as follows: Figure 4 As shown, there is low-frequency wavefront distortion inside the wavefront before correction, and the PV value in the beam is greater than 1λ. However, with the iteration of compensation correction, the PV value of the wavefront distribution of the final calibration light is lower than 0.05λ.

[0096] S2: Obtain the reference focusing spot array distribution according to the calibration wavefront and use it as the reference position, including:

[0097] S21: Calibrate the wavefront incident dual-lens image transfer system and the microlens array, and obtain the reference focus spot array distribution through the CCD camera.

[0098] The collimated light is corrected and compensated before and after the microlens array spot focusing array is shown in the figure below. Figure 3 As shown in the figure, the array distribution of the calibration wavefront obtained after correction is a "●" distribution, which basically presents a square grid distribution, that is, the calibration grid, and its position in the x and y directions is the reference position. The wavefront array distribution of the uncorrected collimated light is a "○" distribution, which deviates from the square grid in the x and y directions.

[0099] S3: receiving the optical eyeglasses to be tested and obtaining the distribution of the focused light spot array of the transmitted light, including:

[0100] S31: obtaining the wavefront to be measured through the optical lens to be measured by calibrating the wavefront;

[0101] S32: Obtain the distribution of the focused light spot array of the transmitted light through the incident double-lens image transfer system and the microlens array of the wavefront to be measured.

[0102] In the specific implementation process, the optical lens to be tested is placed on Figure 5 In the detection optical path system, the light beam entering the optical lens to be tested is already the calibration light after wavefront correction. The optical lens to be tested is placed at a distance s1 in front of the first lens of the dual-lens image transfer system. The dual-lens image transfer system also includes a second lens. The focal lengths of the two lenses are f1 and f2, respectively, and the distance between the two lenses is equal to f1+f2. The distance between the second lens and the microlens array is s2, where the distance must satisfy s1+s2=f1+f2. Just after the calibration light passes through the optical lens to be tested, its wavefront distribution is affected by the free-form surface and changes to become the wavefront to be tested. Since the optical lens to be tested itself has photometric information, the wavefront to be tested may be divergent light or convergent light. At the same time, there is additional photometric information introduced by the free-form surface inside the wavefront to be tested. On the one hand, the dual-lens image transfer system can ensure that the incident wavefront to be measured is diffraction-free on the incident microlens array, thereby ensuring the accuracy of detecting the wavefront to be measured. On the other hand, the dual-lens image transfer system lens focal length ratio f1 / f2 can effectively control the beam aperture of the incident microlens array, ensuring that the transmitted light wavefront information of the lens with an aperture of several centimeters is effectively recorded by the microlens array at the same time and directly inverted to obtain the refractive distribution of the entire lens.

[0103] Specifically, the wavefront to be measured is focused by a microlens array, such as Figure 6 As shown in the imaging diagram of the CCD camera, the black dot-shaped focused light spot and the grid correspond to the reference position of the calibration light, that is, the initial position. As the optical lens to be tested is inserted, the introduced free surface will cause the wavefront disturbance of the calibration light passing through the optical lens to be tested, causing the corresponding focused array light spot in each sub-aperture of the microlens array to deviate. The direction of the deviation is shown in Figure 6 The single arrow is shown in FIG. 1 , and the light spot deviating from the focusing array is represented by a gray dot light spot.

[0104] S4: Acquiring a focus spot spatial wavefront slope distribution matrix according to the reference position and the focus spot array distribution of the transmitted light comprises:

[0105] S41: Detect the distribution of the focused light spot array and compare it with the reference focused light spot array to obtain the deviations of the i-th sub-aperture of the microlens array in the x and y directions respectively: i and Δy i, the spatial wavefront slope matrix G of the focused spot is equal to:

[0106]

[0107] Where n represents the number of sub-apertures in the microlens array, and G represents the wavefront slope in the x or y direction in the i-th sub-aperture:

[0108]

[0109] Where f is the focal length of the microlens array, s is the area of ​​the subaperture, It is the wavefront distribution of the light transmitted by the optical lens to be tested.

[0110] The Zernike coefficient matrix D can be expressed as:

[0111]

[0112] Among them, Z xk,i represents the integral parameter of the kth Zernike polynomial of the ith subaperture in the x direction, Z yk,i represents the integral parameter of the k-th Zernike polynomial of the ith subaperture in the y direction, and m represents the number of terms of the considered Zernike polynomial;

[0113] The relationship between the Zernike coefficient matrix A and the G and D matrices satisfies:

[0114]

[0115] The Zernike coefficient matrix A can be obtained by matrix inversion:

[0116] A=D + G;

[0117] Among them, D + represents the generalized inverse matrix of the D matrix;

[0118] Get the Zernike coefficients and the wavefront distribution of the light transmitted by the optical lens to be tested It is expressed as:

[0119]

[0120] Z k represents the kth Zernike polynomial.

[0121] In a specific implementation process, the optical glasses lens to be tested includes a front surface and a rear surface arranged opposite to each other, the front surface is a side away from the eye, and the rear surface is a side close to the eye;

[0122] The surface distribution z(x,y) of the rear surface satisfies the following formula:

[0123]

[0124] Wherein, Δd(x, y) is the thickness difference distribution of the optical lens to be tested, and the thickness difference distribution satisfies:

[0125] Wherein, d is the center thickness of the optical lens to be tested, n0 is the refractive index, and R is the radius of curvature of the front surface of the lens;

[0126] The radius of curvature of the rear surface is defined as r, which satisfies the following equation:

[0127]

[0128] Any point on the rear surface has two mutually orthogonal radii of curvature r1 and r2, r1 and r2 are the two roots of the above equation;

[0129] The refractive distribution of the optical lens to be tested includes spherical distribution and cylindrical distribution, and the spherical distribution S(x, y) and cylindrical distribution C(x, y) can be calculated by the following formula:

[0130]

[0131] refer to Figure 2 and Figure 5 As shown, the present invention also proposes a detection optical path system for optical eyeglasses, the detection optical path system is applied to the detection method of optical eyeglasses as described in the above embodiment, and the detection optical path system includes: a light source 1, a collimation module 3, a wavefront sensor, a processor 13 and a deformable mirror 5. Among them, the light beam emitted by the light source 1 forms collimated light through the collimation module 3; the wavefront sensor is used to obtain the wavefront distribution of the collimated light, the calibration wavefront of the calibration light and the wavefront of the transmitted light; the processor 13 is a PC processor 13, and uses the wavefront distribution to obtain the wavefront distortion through inversion, and obtains the wavefront compensation value through the wavefront distortion; the deformable mirror 5, the processor 13 loads the wavefront compensation value to the deformable mirror 5 to correct the wavefront distortion.

[0132] In the specific implementation process, the light source 1 is a laser light source, and the laser light source emits laser light and diffuses it through the laser beam expander 2 to obtain divergent light. The divergent light is injected into the collimation module 3, which includes a combination of three lenses and collimates the divergent light to obtain collimated light.

[0133] There is some low-frequency wavefront distortion in the collimated wavefront distribution 4 of the collimated light, and the processor 13 and the deformable mirror 5 cooperate to correct and compensate the wavefront distortion to obtain the calibration light. Specifically, the collimated light is reflected by the deformable mirror 5 to the plane reflector 6, and the plane reflector 6 reflects the collimator to the microlens array 11, and then the CCD12 obtains the wavefront distribution of the collimated light. Among them, the deformable mirror 5 and the plane reflector 6 are arranged in parallel and tilted, and the CCD12 is placed at the focal plane of the microlens array 11. The PC processor 13 is connected to the CCD12 and obtains the wavefront distortion of the collimated light by inversion through the wavefront distribution of the collimated light, and loads the corresponding wavefront compensation value onto the deformable mirror 5. The microlens array 11 and the CCD12 are combined to form a wavefront sensor for detecting the wavefront distribution. The wavefront sensor and the PC processor 13 cooperate to iterate through multiple detection-compensation until the obtained wavefront distribution converges and the PV value is less than 0.05λ. At this time, the obtained wavefront distribution is used as the calibration wavefront distribution 7 and the collimated light is the calibration light.

[0134] After the optical lens 8 to be tested is inserted into the plane reflector 6, it can be understood that the optical lens 8 to be tested is inserted into the test optical path system after obtaining the calibration wavefront distribution 7. After the calibration light passes through the optical lens 8 to be tested, the calibration wavefront distribution 7 is affected by the free-form surface of the optical lens 8 to be tested and changes into the wavefront 9 to be tested, and the calibration light becomes the transmitted light.

[0135] Furthermore, the detection optical path system further comprises a dual-lens image transfer system 10, and the dual-lens image transfer system 10 comprises a first lens and a second lens;

[0136] The optical glasses lens to be tested is placed at a distance s1 in front of the first lens, the focal lengths of the first lens and the second lens are f1 and f2 respectively, and the distance between the two is f1+f2, the distance between the second lens and the microlens array is s2, and s1+s2=f1+f2 is satisfied.

[0137] Specifically, after the optical lens 8 to be tested is inserted into the test optical path system, it is located between the plane reflector 6 and the dual-lens image transfer system 10, and the optical lens 8 to be tested is placed at a distance s1 in front of the first lens of the dual-lens image transfer system 10, the focal lengths of the two lenses are f1 and f2 respectively, and the distance between the two lenses is equal to f1+f2, and the distance between the second lens and the microlens array is s2, wherein the distance must satisfy s1+s2=f1+f2. After the calibration light passes through the optical lens 8 to be tested, its wavefront distribution is affected by the free-form surface and changes to become the wavefront 9 to be tested. Since the optical lens 8 to be tested itself has photometric information, the wavefront 9 to be tested may be divergent light or convergent light, and there is additional photometric information introduced by the free-form surface inside the wavefront 9 to be tested. On the one hand, the dual-lens image transfer system 10 can ensure that the wavefront 9 to be measured is incident on the microlens array 11 without diffraction, thereby ensuring the accuracy of detecting the wavefront 9 to be measured. On the other hand, the focal length ratio f2 / f1 of the dual-lens image transfer system 10 can effectively control the aperture of the light beam incident on the microlens array 11, thereby ensuring the transmitted light wavefront of the lens with an aperture of several centimeters, that is, the information of the wavefront 9 to be measured is effectively recorded by the microlens array at the same time and directly inverted to obtain the refractive distribution of the entire lens.

[0138] The above description is only an exemplary embodiment of the present invention, and does not limit the patent scope of the present invention. All equivalent structural changes made by using the contents of the present invention specification and drawings under the inventive concept of the present invention, or directly / indirectly applied in other related technical fields are included in the patent protection scope of the present invention.

Claims

1. A method for detecting optical eyeglass lenses, characterized in that: include: Obtaining a calibration wavefront; Obtain the reference focusing spot array distribution according to the calibration wavefront and use it as the reference position; Receiving the optical eyeglasses to be tested and obtaining the distribution of the focused light spot array of the transmitted light; Acquire a focus spot spatial wavefront slope distribution matrix according to the reference position and the transmission light focus spot array distribution; Combining the wavefront sensing algorithm and the focus spot spatial wavefront slope distribution matrix to obtain the wavefront distribution of the transmitted light and the corresponding Zernike coefficient; The refractive distribution of the optical lens to be tested is obtained by combining the parameters of the optical lens to be tested, the wavefront distribution of the transmitted light and the corresponding Zernike coefficients.

2. The method for detecting an optical eyeglass lens according to claim 1, wherein: The step of obtaining the calibration wavefront comprises: A wavefront sensor is used to obtain the wavefront distribution of the collimated light; Using a deformable mirror to compensate and correct the wavefront distortion of the wavefront distribution; The calibration wavefront is obtained by repeatedly iterating the above two steps.

3. The method for detecting an optical eyeglass lens according to claim 2, wherein: In the iterative process, until the wavefront converges and the PV value of the wavefront distribution is less than 0.05λ, the wavefront obtained at this time is the calibration wavefront, and the PV value is defined as the difference between the highest point and the lowest point of the phase in the wavefront distribution.

4. The method for detecting an optical spectacle lens according to claim 2, wherein: The step of using a deformable mirror to compensate and correct the wavefront distortion of the collimated light comprises: Adding a corresponding wavefront compensation value to the deformable mirror according to the wavefront distortion; The wavefront distortion is obtained by inverting the wavefront distribution through a processor.

5. The method for detecting an optical spectacle lens according to claim 1, wherein: The step of obtaining the reference focusing light spot array distribution according to the calibration wavefront comprises: By calibrating the wavefront incident dual-lens image transfer system and the microlens array, and obtaining the reference focusing light spot array distribution through a CCD camera; and / or, The step of obtaining the distribution of the transmission light focus spot array comprises: Acquire the wavefront to be measured through the optical lens to be measured by calibrating the wavefront; The distribution of the focused light spot array of the transmitted light is obtained by incidenting the wavefront to be measured on the double-lens image transfer system and the microlens array.

6. The method for detecting an optical spectacle lens according to claim 1, wherein: Acquiring a focus spot spatial wavefront slope distribution matrix according to the reference position and the focus spot array distribution of the transmitted light comprises: The detection focus spot array distribution is compared with the reference focus spot array distribution to obtain the deviation of the i-th sub-aperture of the microlens array in the x and y directions respectively: Δx i and Δy i , the spatial wavefront slope matrix G of the focused spot is equal to: Where n represents the number of sub-apertures in the microlens array, and G represents the wavefront slope in the x or y direction in the i-th sub-aperture: Where f is the focal length of the microlens array, s is the area of ​​the subaperture, It is the wavefront distribution of the light transmitted by the optical lens to be tested.

7. The method for detecting an optical spectacle lens according to claim 6, wherein: The Zernike coefficient matrix D can be expressed as: Where Z xk,i represents the integral parameter of the kth Zernike polynomial of the ith subaperture in the x direction, Z yk,i represents the integral parameter of the k-th Zernike polynomial of the ith subaperture in the y direction, and m represents the number of terms of the considered Zernike polynomial; The relationship between the Zernike coefficient matrix A and the G and D matrices satisfies: The Zernike coefficient matrix A can be obtained by matrix inversion: A=D + G; Among them, D + represents the generalized inverse matrix of the D matrix; Get the Zernike coefficients and the wavefront distribution of the light transmitted by the optical lens to be tested It is expressed as: Z k represents the kth Zernike polynomial.

8. The method for detecting an optical eyeglass lens according to claim 7, wherein: The optical spectacle lens to be tested comprises a front surface and a rear surface which are arranged opposite to each other, wherein the front surface is a side away from the eye, and the rear surface is a side close to the eye; The surface profile distribution z(x,y) of the rear surface satisfies the following formula: Wherein, Δd(x, y) is the thickness difference distribution of the optical lens to be tested, and the thickness difference distribution satisfies: Wherein, d is the center thickness of the optical lens to be tested, n0 is the refractive index, and R is the radius of curvature of the front surface; The radius of curvature of the rear surface is defined as r, which satisfies the following equation: Any point on the rear surface has two mutually orthogonal curvature radii r1 and r2, where r1 and r2 are two roots of the above equation; The refractive distribution of the optical lens to be tested includes a spherical distribution and a cylindrical distribution, and the spherical distribution S(x, y) and the cylindrical distribution C(x, y) can be calculated by the following formula:

9. An optical lens detection light path system, characterized in that: The detection optical path system is applied to the detection method of the optical lens according to any one of claims 1 to 8, and the detection optical path system comprises: light source; A collimation module, through which the light beam emitted by the light source forms collimated light; A wavefront sensor, used to obtain the wavefront distribution of the collimated light, the calibration wavefront of the calibration light, and the wavefront of the transmitted light; A processor, which obtains wavefront distortion using the wavefront distribution, and obtains a wavefront compensation value through the wavefront distortion; and The processor loads the wavefront compensation value to the deformable mirror to correct the wavefront distortion.

10. The detection optical path system according to claim 9, characterized in that: The detection optical path system further comprises a dual-lens image transfer system, wherein the dual-lens image transfer system comprises a first lens and a second lens; The optical glasses lens to be tested is placed at a distance s1 in front of the first lens, the focal lengths of the first lens and the second lens are f1 and f2 respectively, and the distance between the two is f1+f2, the distance between the second lens and the microlens array is s2, and s1+s2=f1+f2 is satisfied.

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