Lamination control method and equipment for embedding pathological tissue

Through the automatic film revision control method, image acquisition and contour extraction technology are used to realize automatic and accurate film revision of embedded pathological tissues, solving the high cost and low efficiency problems caused by artificial dependence, and improving the quality and efficiency of film revision.

CN119919377AActive Publication Date: 2025-05-02SHANDONG JUNTENG MEDICAL TECH CO LTD
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Patent Information

Application Number
CN202411991365.5
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2024-12-31
Publication Date
2025-05-02
Estimated Expiration
2044-12-31

AI Technical Summary

Technical Problem

In the prior art, the patch repairs that embed pathological tissues rely too much on labor, resulting in high labor costs and difficult to guarantee the quality and efficiency of patch repairs, which affects the subsequent slice effect.

Method used

An automatic sheet repair control method is adopted to obtain the embedded wax block image through the image acquisition device, and the preset profile extraction algorithm is used to determine the embedded bottom mold profile area, match the corresponding sheet repair control parameter information group, and control the tool to circulate the sheet repair until the end of the sheet repair condition is met.

Benefits of technology

Automatic and precise film revision of embedded pathological tissue is realized, reducing the dependence on manual operation, improving the level of automation and intelligence of film revision, ensuring the stability and efficiency of film revision quality, and reducing labor costs.

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Abstract

The invention provides a patch control method and equipment for embedding pathological tissues, and belongs to the technical field of medical instruments. The method comprises the following steps: acquiring a first embedding wax block image; based on the first embedding wax block image and a preset contour extraction algorithm, determining a corresponding embedding bottom die contour area, and matching a corresponding first patch control parameter information group according to the embedding bottom die contour area; according to the embedding bottom die contour area, a second embedding wax block image of the embedding wax block is determined, and whether the second embedding wax block image meets the controllable trimming condition or not is judged. When a controllable trimming condition is met, determining a first contour area value corresponding to the embedded wax block, so as to control the cutter to perform cyclic trimming on the embedded wax block based on the first trimming control parameter information group, and obtaining a corresponding third embedded wax block image; and based on the second contour area value and the first contour area value in the third embedded wax block image and a preset trimming threshold value, determining whether the embedded wax block meets a trimming ending condition, so as to obtain a trimmed embedded wax block.
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Description

Technical Field

[0001] The present application relates to the field of medical device technology, and in particular to a film repair control method and device for embedding pathological tissue. Background Art

[0002] In the process of histopathology research and diagnosis, the preparation of tissue sections is a crucial link. Among them, the trimming step of embedded tissue is the key to ensure the quality of the section and the subsequent staining and observation effect, and it can also extend the service life of the sectioning blade. The traditional trimming method mainly relies on manual operation, that is, technicians use knives to manually trim the embedded wax block to remove excess tissue and wax to make the section surface flat and smooth.

[0003] However, there are many shortcomings in the manual film trimming method. First, due to the need to process a large number of tissue samples, technicians often need to perform a large number of repetitive mechanical operations, which is not only time-consuming and labor-intensive, but also easily leads to operator fatigue, which in turn affects the quality of film trimming. Secondly, the quality of manual operations varies, and there are differences in the technical levels of different technicians, making it difficult to ensure that each sample can achieve the ideal film trimming effect. In addition, operational errors are prone to occur during manual film trimming, such as cutting too deep to cause tissue damage, or uneven cutting to cause uneven slice thickness, etc. These problems will have an adverse effect on the subsequent slice quality and diagnostic results. At the same time, some existing automatic film trimming systems are not stable enough and not intelligent enough, and there is still some distance to go to completely get rid of manual precision film trimming.

[0004] Based on this, there is an urgent need for a film retouching control technology solution that can assist users in achieving automatic and accurate film retouching of embedded pathological tissues. Summary of the invention

[0005] The embodiments of the present application provide a control method and device for trimming embedded pathological tissue, which is used to solve the technical problem that the current trimming of embedded pathological tissue is too dependent on manual labor, the labor cost is high, and the quality and efficiency of trimming are difficult to guarantee, which in turn affects the effect of subsequent embedded pathological tissue sectioning.

[0006] On the one hand, an embodiment of the present application provides a method for controlling the trimming of embedded pathological tissue, the method comprising:

[0007] acquiring a first embedded wax block image from an image acquisition device;

[0008] Based on the first embedded wax block image and a preset contour extraction algorithm, a corresponding embedded bottom mold contour area is determined, so as to match a corresponding first trimming control parameter information group according to the embedded bottom mold contour area;

[0009] Determine a second embedded wax block image of the embedded wax block according to the embedded bottom mold contour area, and judge whether the second embedded wax block image meets the controllable repairing condition; wherein the second embedded wax block image is obtained by shooting after backlighting along the shooting direction of the image acquisition device; the controllable repairing condition includes evaluation standard information of one or more evaluation dimensions characterizing image quality;

[0010] When the second embedded wax block image satisfies the controllable trimming condition, determining a first contour area value corresponding to the embedded wax block, controlling a tool to perform cyclic trimming on the embedded wax block based on the first trimming control parameter information group, and acquiring a corresponding third embedded wax block image;

[0011] Based on the second contour area value and the first contour area value in the third embedded wax block image and a preset trimming threshold, it is determined whether the embedded wax block meets the trimming end condition to obtain a trimmed embedded wax block.

[0012] In one implementation of the present application, before acquiring the first embedded wax block image from the image acquisition device, the method further includes:

[0013] After receiving the embedding box ready signal, an automatic tool setting instruction is generated to move the embedding box fixing chuck to a predetermined position, and the current position of the tool motor is recorded through an encoder to complete the automatic tool setting; wherein, the embedding box ready signal is generated based on the embedding box being installed on the embedding box fixing chuck.

[0014] In one implementation of the present application, based on the first embedded wax block image and a preset contour extraction algorithm, determining the corresponding embedded bottom mold contour area specifically includes:

[0015] The first embedded wax block image is processed by the preset contour extraction algorithm to extract and draw the corresponding embedded bottom mold contour area; wherein the preset contour extraction algorithm is a contour extraction algorithm based on edge detection in the OpenCV library; the image processing at least includes grayscale processing, contrast enhancement, binarization processing, edge detection, contour extraction, and contour drawing.

[0016] In one implementation of the present application, matching the corresponding first trimming control parameter information group according to the embedded bottom mold contour area specifically includes:

[0017] Determine the corresponding embedded bottom mold specifications according to the area of ​​the embedded bottom mold contour area; wherein different embedded bottom mold specifications correspond to different area;

[0018] The embedded bottom mold specifications are matched with a preset control parameter comparison table to determine the first trimming control parameter information group according to the matching result; wherein the preset control parameter comparison table includes a correspondence between different embedded bottom mold specifications and different trimming control parameter information groups; the trimming control parameter information group includes at least the following control parameters: maximum trimming depth, feed amount, number of trimming times between shooting intervals, light intensity, and exposure time.

[0019] In one implementation of the present application, determining a second embedded wax block image of the embedded wax block according to the embedded bottom mold contour area, and judging whether the second embedded wax block image meets the controllable repairing condition specifically includes:

[0020] generating a backlight shooting instruction according to the first film repair control parameter information group, so as to start the backlight lighting device and enable the image acquisition device to shoot, so as to obtain the corresponding initial second embedded wax block image;

[0021] According to the embedding bottom mold contour area, the initial second embedded wax block image is cropped to remove the pixel area outside the embedding bottom mold contour area in the initial second embedded wax block image to obtain the second embedded wax block image;

[0022] Determine parameter information of the second embedded wax block image in each evaluation dimension; wherein each evaluation dimension includes at least: histogram distribution, contrast, noise, and edge quantity;

[0023] Comparing each of the parameter information with each of the evaluation standard information corresponding to the controllable repairing conditions;

[0024] When the comparison result is in compliance with the standard, determining that the second embedded wax block image meets the controllable repairing condition;

[0025] When the comparison result does not meet the standard, the exposure time of the image acquisition device is updated according to the preset rules and the parameter information, and the initial second embedded wax block image is re-photographed and the cumulative number of updated exposure time is increased until the second embedded wax block image meets the controllable repair condition or the cumulative number of updated exposure time is greater than a predetermined value.

[0026] In one implementation of the present application, the method further includes:

[0027] When the cumulative number of updated exposure times is greater than a predetermined value, the embedded bottom mold specification is matched with a preset trimming mode set to trim the embedded wax block according to the matched preset trimming mode; wherein each of the preset trimming modes corresponds to each preset second trimming control parameter information group.

[0028] In an implementation of the present application, after the second embedded wax block image meets the controllable repairing condition, the method further includes:

[0029] Determining the amount of tissue in the second embedded wax block image by using the preset contour extraction algorithm;

[0030] In the case that the number of tissues is multiple, the second editing control parameter information group corresponding to the preset small tissue editing mode is updated to the first editing control parameter information group.

[0031] In one implementation of the present application, the image acquisition device is arranged above the embedded wax block, and the first embedded wax block image and the third embedded wax block image are obtained by shooting along the shooting direction with forward lighting;

[0032] Based on the second contour area value and the first contour area value in the third embedded wax block image and a preset trimming threshold, determining whether the embedded wax block meets a trimming end condition to obtain a trimmed embedded wax block specifically includes:

[0033] According to each of the third embedded wax block images corresponding to the cyclic repair process, the ratio of each of the second contour area values ​​to the first contour area value is calculated as the exposed tissue contour ratio value; wherein the second contour area value corresponds to the exposed tissue portion of the embedded wax block after repairing; and the first contour area value corresponds to the projection area of ​​the pathological tissue in the embedded wax block projected along the shooting direction;

[0034] Comparing the exposed tissue contour proportion values ​​with the preset retouching thresholds in sequence;

[0035] When the exposed tissue contour ratio is greater than the preset trimming threshold, it is determined that the embedded wax block meets the trimming end condition and the trimming cycle is stopped to obtain the trimmed embedded wax block.

[0036] In one implementation of the present application, the method further includes:

[0037] Determine the exposed tissue contour ratio values ​​corresponding to the preset number of consecutive repair times, and add the exposed tissue contour ratio values ​​to the abnormality judgment ratio value sequence in chronological order;

[0038] When the embedded wax block does not meet the trimming end condition and the proportion value change trend corresponding to the abnormal judgment proportion value sequence meets the abnormal alarm condition, a trimming alarm message is generated and the tool is controlled to stop trimming, and the trimming alarm message is sent to the user interface; wherein the abnormal alarm condition is that the proportion value change trend is a non-increasing trend;

[0039] Alternatively, when the exposed tissue contour ratio is greater than 1, the trimming alarm information is generated, the tool is controlled to stop trimming, and the trimming alarm information is sent to the user interface.

[0040] On the other hand, the embodiment of the present application further provides a slice repair control device for embedding pathological tissue, the device comprising:

[0041] At least one processor; and a memory in communication with the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute a trimming control method for embedding pathological tissue as described above.

[0042] Compared with the prior art, the present invention has the following significant effects:

[0043] 1) Through the above technical solution, a film retouching control solution is provided to assist users in realizing automatic and accurate film retouching of embedded pathological tissues. It does not require technicians to actively perform film retouching operations, reduces reliance on manual operations, and improves the level of film retouching automation and intelligence, ensuring the stability of film retouching quality and film retouching efficiency. The film retouching quality is further improved through backlighting processing, and the flexibility and controllability of film retouching control are improved by using a film retouching control parameter information group that can be configured and adjusted according to actual needs.

[0044] 2) Compared with the traditional manual film trimming method, the system also achieves more precise control of key parameters such as feed amount. This high-precision automated operation not only greatly improves the standardization of tissue film trimming, but also effectively reduces the risk of over-deep trimming caused by human factors, ensuring the stability and reliability of the trimming quality.

[0045] 3) The system does not require direct human involvement in the film retouching process, which significantly saves labor costs. This change not only reduces the workload of technicians, but also enables the pathology department to invest more human resources in other key links that require manual judgment and decision-making, thereby promoting the overall work efficiency of the pathology department and providing the hospital with faster and more accurate pathology diagnosis services. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0047] Figure 1 A schematic diagram of a flow chart of a slice repair control method for embedding pathological tissue in an embodiment of the present application;

[0048] Figure 2 It is a schematic diagram of a second embedded wax block image in a film repair control method for embedded pathological tissue in an embodiment of the present application;

[0049] Figure 3 Another schematic flow chart of a method for controlling the repair of embedded pathological tissues in an embodiment of the present application;

[0050] Figure 4 Schematic diagram of the structure of a slice repair control device for embedding pathological tissue in an embodiment of the present application. DETAILED DESCRIPTION

[0051] In order to make the purpose, technical solution and advantages of the present application clearer, the technical solution of the present application will be clearly and completely described below in combination with the specific embodiments of the present application and the corresponding drawings. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present application.

[0052] In the process of making tissue sections, hospitals will perform trimming on the embedded tissues. This step has been widely recognized, with 80% of hospitals tending to adopt a separate trimming work mode, and 50% of hospitals have specially arranged independent technicians to be responsible for the trimming work; the main purpose of trimming is to achieve the flattening of the tissue section and fully expose the tissue surface so that subsequent sections can accurately and completely capture the key tissue structure. At the same time, trimming can effectively extend the service life of the slice blade and reduce the cost increase and efficiency reduction caused by excessive blade wear. In addition, through trimming, the overall work efficiency of technicians in the pathology department can also be improved, enabling them to carry out subsequent work more smoothly; however, it is worth noting that the current manual trimming work still has certain limitations. Since the trimming process involves a large number of repetitive mechanical operations and the work intensity is relatively high, technicians are prone to fatigue and distraction during long-term work, which may lead to problems such as non-standard operation and uneven trimming quality, which has an adverse impact on the standardized management of the pathology department.

[0053] Based on this, the embodiment of the present application provides a control method and device for embedded pathological tissue trimming, which is used to solve the technical problem that the current embedded pathological tissue trimming is too dependent on manual labor, the labor cost is high, and the quality and efficiency of trimming are difficult to guarantee, which in turn affects the effect of subsequent embedded pathological tissue sections. This reduces the burden of a large number of repetitive mechanical operations faced by technicians in the pathology department during the trimming process, while improving the standardization of trimming and the overall standardized management level of the pathology department.

[0054] The following describes in detail various embodiments of the present application in conjunction with the accompanying drawings.

[0055] The present application embodiment provides a method for controlling the repair of embedded pathological tissues. Figure 1 As shown, the method may include steps S101-S105:

[0056] S101, a microcontroller acquires a first embedded wax block image from an image acquisition device.

[0057] It should be noted that the microcontroller is used as the execution subject of the control method for embedding pathological tissue, which is only an example, and the execution subject is not limited to the microcontroller, and this application does not make specific restrictions on this. Among them, the microcontroller can be integrated inside the paraffin slicer, or it can be external to the paraffin slicer, for example, the microcontroller is set in an external control terminal, and is connected to the paraffin slicer and the image acquisition device to control the paraffin slicer to cut.

[0058] In the embodiment of the present application, before acquiring the first embedded wax block image from the image acquisition device, the method further includes:

[0059] After receiving the embedding cassette ready signal, an automatic tool setting command is generated to move the embedding cassette fixing chuck to a predetermined position, and the encoder records the current position of the tool motor to complete the automatic tool setting. The embedding cassette ready signal is generated based on the embedding cassette being installed on the embedding cassette fixing chuck.

[0060] In other words, before performing the trimming, the embedding cassette needs to be fixed on the machine chuck of the paraffin slicer, wherein the embedding cassette fixing step can be fixed by the user or by a mechanical arm, and this application does not make specific restrictions on this. The microcontroller can set a sensor on the machine chuck to detect whether the embedding cassette is fixed. If the embedding cassette is fixed on the machine chuck, an embedding cassette ready signal is generated at this time, and an automatic tool setting instruction is generated. The paraffin slicer receives the automatic tool setting instruction and controls the embedding cassette fixing chuck to move slowly forward until it moves to a predetermined position, which can be set in advance by the user, and this application does not make specific restrictions on this. A contact displacement sensor can be set at the predetermined position, and the contact displacement sensor can send a signal to the microcontroller that it has reached the predetermined position after detecting that it is touched by the embedding cassette fixing chuck. At this time, the microcontroller also records the current position of the tool motor (the motor that controls the cutting movement of the blade) through an encoder. An encoder is a device that can accurately measure the rotation angle or linear displacement. It is usually connected to the motor shaft to track the motion state of the motor in real time. By recording the position of the tool motor when the chuck touches the sensor, the microcontroller can calculate the exact position of the tool (or other tool that needs to be precisely positioned) relative to the workpiece (embedding cassette) as tool setting information. This tool setting information is used to adjust the position of the tool to ensure that the tool can accurately contact the workpiece during subsequent processing. Once the exact position is determined and adjusted in place, the automatic tool setting process is completed.

[0061] If the automatic tool setting is not completed within the preset time, the microcontroller can generate an alarm message to indicate a mechanical failure.

[0062] Subsequently, after the automatic tool setting is completed, the microcontroller can control the tool to trim the embedded wax block with a preset feed amount, such as 50 microns, for a preset number of times. For example, the embedded wax block is trimmed by 0.1 millimeters (mm). The preset feed amount and the preset trimming times here can be adjusted by the user according to actual use, and this application does not make specific restrictions on this.

[0063] After completing the automatic tool alignment of the paraffin slicer, the microcontroller will control the image acquisition device to capture the image of the embedded wax block to obtain the first embedded wax block image. Among them, the image acquisition device is arranged above the embedded wax block, and the first embedded wax block image and the third embedded wax block image are taken after being illuminated along the shooting direction. The top of the embedded wax block can be understood as the tool setting position, wherein when shooting the first embedded wax block image and the third embedded wax block image, the light can be illuminated along the shooting direction, and blue light can be used. Among them, the default light intensity and exposure time can be used to shoot the image. The specific light intensity and exposure time can be set by the user according to the actual use scenario, and this application does not make specific restrictions on this. By shooting with lighting, a clearer image of the embedded wax block can be obtained, so as to identify the contour of the embedded bottom mold and the contour of the exposed tissue.

[0064] S102, the microcontroller determines the corresponding embedded bottom mold contour area based on the first embedded wax block image and a preset contour extraction algorithm, so as to match the corresponding first trimming control parameter information group according to the embedded bottom mold contour area.

[0065] In the embodiment of the present application, based on the first embedded wax block image and the preset contour extraction algorithm, the corresponding embedded bottom mold contour area is determined, specifically including:

[0066] The first embedded wax block image is processed by a preset contour extraction algorithm to extract and draw the corresponding embedded bottom mold contour area. The preset contour extraction algorithm is a contour extraction algorithm based on edge detection in the OpenCV library. Image processing at least includes grayscale processing, contrast enhancement, binarization processing, edge detection, contour extraction, and contour drawing.

[0067] That is to say, the microcontroller can use the edge detection-based contour extraction algorithm in the cross-platform machine vision library OpenCV library as the preset contour extraction algorithm, and can sequentially perform grayscale processing, contrast enhancement processing, binarization processing, edge detection, contour extraction and contour drawing on the first embedded wax block image, and the microcontroller also identifies contour features (such as area, shape, side length), determines whether the contour is the embedded bottom mold contour, and thus obtains the embedded bottom mold contour area. For example, if the contour shape is a regular square with a side length of 7 mm, then the contour is the embedded bottom mold contour.

[0068] Further, matching the corresponding first trimming control parameter information group according to the embedded bottom mold contour area specifically includes:

[0069] According to the area of ​​the embedded bottom mold contour area, the corresponding embedded bottom mold specifications are determined. Different embedded bottom mold specifications correspond to different area areas. The embedded bottom mold specifications are matched with the preset control parameter comparison table to determine the first trimming control parameter information group according to the matching result. The preset control parameter comparison table includes the correspondence between different embedded bottom mold specifications and different trimming control parameter information groups. The trimming control parameter information group includes at least the following control parameters: maximum trimming depth, feed amount, number of trimming times between shooting intervals, light intensity, and exposure time.

[0070] In other words, the microcontroller pre-stores a preset control parameter comparison table, which contains the correspondence between different embedding bottom mold specifications and different trimming control parameter information groups, such as 7mm*7mm, 15mm*15mm, and larger than 15mm*15mm. Different embedding bottom mold specifications are generally used to carry pathological tissues of different sizes or types. The present application can set different default control parameter information groups for different embedding bottom mold specifications, namely, the first trimming control parameter information groups. The parameter values ​​in different first trimming control parameter information groups can be set by users or experts. Among them, the first trimming control parameter information group includes the maximum trimming depth, the cutting amount, the number of trimming times between shooting intervals, the light intensity, and the exposure time. The maximum trimming depth can be understood as the maximum depth of the embedded bottom mold part that can be removed when the microcontroller controls the tool with a corresponding feed amount for trimming; the feed amount can be understood as the thickness of the part cut by the tool each time; the number of shooting interval trimming times can be understood as the number of trimming times between two consecutive third embedded wax block images taken by the image acquisition device during the cyclic trimming process, that is, after taking an image of the third embedded wax block, another image of the third embedded wax block is taken with an interval of n cuts, where n is a natural number; the light intensity can be understood as the ambient light intensity when the image acquisition device is taking pictures, and the light intensity can be adjusted by the light controlled by the microcontroller; the exposure time can be understood as the exposure time when the image acquisition device is taking pictures.

[0071] Through the above solution, the contour area of ​​the embedded bottom mold that at least contains the pathological tissue can be clearly identified to facilitate film repair control.

[0072] S103, the microcontroller determines a second embedded wax block image of the embedded wax block according to the contour area of ​​the embedded bottom mold, and determines whether the second embedded wax block image meets the controllable trimming condition.

[0073] The second embedded wax block image is obtained by backlighting along the shooting direction of the image acquisition device. The controllable repairing conditions include evaluation standard information of one or more evaluation dimensions that characterize image quality.

[0074] In the embodiment of the present application, according to the contour area of ​​the embedded bottom mold, determining the second embedded wax block image of the embedded wax block, and judging whether the second embedded wax block image meets the controllable repairing condition specifically includes:

[0075] According to the first trimming control parameter information group, a backlight shooting instruction is generated to turn on the backlight lighting device and enable the image acquisition device to shoot, so as to obtain the corresponding initial second embedded wax block image. According to the embedded bottom mold contour area, the initial second embedded wax block image is cropped to remove the pixel area outside the embedded bottom mold contour area in the initial second embedded wax block image to obtain the second embedded wax block image. Determine the parameter information of the second embedded wax block image in each evaluation dimension. Among them, each evaluation dimension includes at least: histogram distribution, contrast, noise, and edge number. Each parameter information is compared with each evaluation standard information corresponding to the controllable trimming condition.

[0076] If the comparison result is in compliance with the standard, it is determined that the second embedded wax block image meets the controllable repairing condition.

[0077] If the comparison result does not meet the standards, the exposure time of the image acquisition device is updated according to the preset rules and various parameter information, and the initial second embedded wax block image is re-photographed and the cumulative exposure time is updated several times until the second embedded wax block image meets the controllable repair conditions or the cumulative exposure time is updated several times greater than the preset value.

[0078] That is to say, after the microcontroller determines the contour area of ​​the embedded bottom mold, the light intensity and exposure time in the first trimming control parameter information group are used, and the image acquisition device is used to shoot the embedded bottom mold against the light to obtain the initial second embedded wax block image. Among them, the microcontroller can control the front light lighting device to turn off, and turn on the back light lighting device under the embedded wax block, so as to perform back light lighting from the back of the embedded wax block, so as to obtain the initial second embedded wax block image through the image acquisition device. Subsequently, the microcontroller can also use the embedded bottom mold contour area to crop the initial second embedded wax block image, retain the pixel area corresponding to the embedded bottom mold contour area in the initial second embedded wax block image, and obtain the second embedded wax block image. Since the second embedded wax block image is obtained by shooting with back light, wax is transparent and pathological tissue is generally not transparent, at this time, the contour of the pathological tissue can be more intuitively and clearly displayed in the second embedded wax block image.

[0079] Subsequently, the microcontroller will extract the parameter information of the second embedded wax block image according to the evaluation dimension, including at least histogram distribution information, contrast, noise, and edge number. The microcontroller will call the evaluation standard information in the pre-stored controllable repair conditions and compare it with the extracted parameter information. Specifically, if the waveform of the histogram is too biased to the left, that is, the dark area, it means that the image is dark as a whole and may be underexposed; if the waveform is too biased to the right, that is, the bright area, it means that the image is bright as a whole and may be overexposed; the ideal histogram waveform should cover the entire brightness range, and the waveform distribution is uniform, which means that the image is moderately exposed and rich in details; the evaluation standard information of the histogram distribution of the present application may include a defined waveform distribution standard, and the evaluation dimension meets the standard when the histogram distribution meets the waveform distribution standard in the parameter information. The evaluation standard information of contrast can be set to a contrast standard interval, and the corresponding evaluation dimension meets the standard when the contrast is in the contrast standard interval. The evaluation standard information of noise can be a noise standard interval, and the corresponding evaluation dimension meets the standard when the noise is in the noise standard interval. The evaluation standard information of the edge quantity may be an edge quantity threshold. When the edge quantity threshold is greater than the edge quantity evaluation dimension, the edge quantity evaluation dimension meets the standard.

[0080] When all evaluation dimensions meet the standards, the microcontroller determines that the comparison result meets the standards, and determines that the second embedded wax block image meets the controllable film repair condition. When the comparison result does not meet the standards, the microcontroller can adjust the exposure time according to the preset rules and the gap between each parameter information and the standard of the corresponding evaluation dimension information, and re-shoot the initial second embedded wax block image. Among them, the preset rules include the corresponding relationship between the gap and the exposure time adjustment step. For example, if it is judged to be overexposed and the degree of overexposure is high (the histogram distribution is biased to the right and the number of right-distributed pixels accounts for more than 70%), the exposure time is reduced in steps of 5 milliseconds. For example, if it is judged to be overexposed and the degree of overexposure is low (such as the histogram distribution is biased to the right and the number of right-distributed pixels accounts for more than 50% and less than 70%), the exposure time is reduced in steps of 3 milliseconds. If it is judged to be underexposed, the exposure time is extended by 3 milliseconds. If the microcontroller still does not meet the controllable film repair condition after adjusting the exposure time to a predetermined value, it stops updating the exposure time. The preset value can be set by the user according to the actual usage scenario, and this application does not make any specific limitations on this.

[0081] More specifically, when the cumulative number of updated exposure times is greater than a predetermined value, the embedded bottom mold specification is matched with a preset trimming mode set to perform trimming on the embedded wax block according to the matched preset trimming mode. There is a corresponding relationship between each preset trimming mode and each preset second trimming control parameter information group.

[0082] In other words, when the exposure time is updated too many times, the cause of failure to meet the controllable trimming conditions may be due to the influence of special pathological tissues, such as the presence of fat, connective tissue, etc. in the pathological tissues. At this time, the microcontroller can match the preset trimming mode set set by the user for the special pathological tissue wax block. The preset trimming mode set can be divided into large tissue and small tissue. At the same time, the threshold trimming mode has a corresponding preset second trimming control parameter group. The microcontroller can perform trimming on the embedded wax block according to the control parameters in the second trimming control parameter group.

[0083] S104, when the second embedded wax block image meets the controllable trimming condition, the microcontroller determines the first contour area value corresponding to the embedded wax block, controls the tool to perform cyclic trimming on the embedded wax block based on the first trimming control parameter information group, and obtains the corresponding third embedded wax block image.

[0084] Among them, contour acquisition method 1: the first contour area value is the projection area of ​​the pathological tissue of the embedded wax block in the second embedded wax block image along the shooting direction. The present application can calculate the first contour area value after binarizing the second embedded wax block image through grayscale processing and the maximum between-class variance method (OTSU) algorithm.

[0085] In another embodiment of the present application, contour acquisition method 2: the first contour area value of the present application can also be the area value of the smallest rectangle containing the projection area of ​​the pathological tissue of the embedded wax block, such as Figure 2 As shown, the entire image field of view is the second embedded wax block image, and the area of ​​the required image field of view portion is the first contour area value.

[0086] The above-mentioned control of the tool to perform cyclic trimming on the embedded wax block based on the first trimming control parameter information group and obtaining the corresponding third embedded wax block image specifically includes:

[0087] The microcontroller controls the cutter to continuously cut the embedded wax block with the control parameters in the first trimming control parameter information group, thereby performing a cyclic trimming operation, and at the same time uses the image acquisition device to capture the third embedded wax block image according to the number of trimming times at the shooting interval, for example, a third embedded wax block image is captured after trimming three times. The third embedded wax block image is an embedded wax block image captured with backlighting turned off and frontlighting turned on, and frontlighting can make the third embedded wax block image more clearly display the pixel points on the surface of the embedded wax block.

[0088] In the embodiment of the present application, after the second embedded wax block image meets the controllable repairing condition, the method further includes:

[0089] The number of tissues in the second embedded wax block image is determined by a preset contour extraction algorithm. If the number of tissues is multiple, the second trimming control parameter information group corresponding to the preset small tissue trimming mode is updated to the first trimming control parameter information group.

[0090] That is to say, the microcontroller can also identify the number of tissues in the second embedded wax block image through the above-mentioned preset contour extraction algorithm, which can be obtained by identifying the number of contour areas. One piece of contour area corresponds to one pathological tissue. When the number of tissues is multiple (greater than 1), it may be caused by a plurality of small tissues placed in an embedding box. At this time, the embedded bottom mold specification identified is not the embedded bottom mold specification corresponding to the small tissue. For example, the embedded bottom mold specification corresponding to the small tissue is 7mm*7mm, and the embedded bottom mold specification is 15mm*15mm at this time. The microcontroller updates the second trimming control parameter information group corresponding to the threshold small tissue trimming mode to the first trimming control parameter information group, so as to trim the small tissue. At this time, the second embedded wax block image contains the first sub-contour area value of multiple pieced projection areas, and the multiple first sub-contour area values ​​constitute the above-mentioned first contour area value. In addition, its second contour area value is also composed of multiple second sub-contour area values.

[0091] S105, the microcontroller determines whether the embedded wax block meets the trimming end condition based on the second contour area value and the first contour area value in the third embedded wax block image and a preset trimming threshold value to obtain a trimmed embedded wax block.

[0092] In the embodiment of the present application, based on the second contour area value and the first contour area value in the third embedded wax block image and the preset trimming threshold, determining whether the embedded wax block meets the trimming end condition to obtain the trimmed embedded wax block specifically includes:

[0093] According to each third embedded wax block image corresponding to the cyclic repair process, the ratio of each second contour area value to the first contour area value is calculated as the exposed tissue contour ratio value. Among them, the second contour area value corresponds to the exposed tissue part after the embedded wax block is repaired. The first contour area value corresponds to the projection area of ​​the pathological tissue in the embedded wax block along the shooting direction. Each exposed tissue contour ratio value is compared with the preset repair threshold value in turn. When the exposed tissue contour ratio value is greater than the preset repair threshold value, it is determined that the embedded wax block meets the repair end condition and the cyclic repair is stopped to obtain the repaired embedded wax block.

[0094] That is to say, the present application can identify the contour of the tissue part exposed by the trimming through the third embedded wax block image. The exposed tissue contour can be a graphic of an irregular tissue edge (corresponding to contour acquisition method one) or a minimum rectangle containing the exposed tissue edge (corresponding to contour acquisition method two). Which method is used depends on whether the above-mentioned contour acquisition method one or contour acquisition method two is selected, which can be selected by the user, and the present application does not make specific limitations on this.

[0095] Subsequently, the microcontroller calculates the ratio of the second contour area value to the first contour area value to obtain the exposed tissue contour ratio value. If the exposed tissue contour ratio value is greater than the preset trimming threshold, the microcontroller determines that the embedded wax block has met the trimming end condition and stops the trimming cycle to obtain a trimmed embedded wax block. The preset trimming threshold is set by the user according to the actual usage scenario, for example, it is set to 0.8.

[0096] In addition, during the above-mentioned cyclic repair process, the microcontroller also determines the proportion values ​​of each exposed tissue contour corresponding to the preset number of consecutive repair times, and adds the proportion values ​​of each exposed tissue contour to the abnormal judgment proportion value sequence in chronological order.

[0097] When the embedded wax block does not meet the trimming end condition and the proportion value change trend corresponding to the abnormal judgment proportion value sequence meets the abnormal alarm condition, a trimming alarm message is generated and the tool is controlled to stop trimming, and the trimming alarm message is sent to the user interface. Among them, the abnormal alarm condition is that the proportion value change trend is a non-increasing trend.

[0098] Alternatively, when the exposed tissue contour ratio is greater than 1, a repairing alarm message is generated and the tool is controlled to stop repairing, and the repairing alarm message is sent to the user interface.

[0099] In addition, when the cyclic trimming reaches the maximum trimming depth, the trimming will stop and a trimming alarm message will be generated.

[0100] In other words, the above provides an abnormal handling method, and the abnormal alarm condition is that the trend of the proportion value change is a non-increasing trend, which can be understood as that the proportion value of each exposed tissue contour in the abnormal judgment proportion value sequence remains unchanged or becomes smaller and smaller. The retouching alarm information can be a picture or text information, and this application does not make specific limitations on this. The user interface can be a display screen connected to the microcontroller, or a user terminal, such as a user's mobile phone, computer and other devices, and this application does not make specific limitations on this.

[0101] Figure 3 Another flow chart of a method for controlling the repair of embedded pathological tissue provided in an embodiment of the present application is as follows: Figure 3 As shown, the following steps are included:

[0102] S301, clamp in place, automatic tool setting; S302, whether the automatic tool setting is completed, if not, execute S303, if yes, execute S304; S303, alarm: mechanical failure; S304, trim the tissue by 0.1mm; S305, illuminate the top, take a picture with default parameters; S306, increase the contrast of the picture, determine the specifications of the embedding bottom mold, and confirm the field of view (tissue size); S307, get the specifications of the embedding bottom mold: less than 15mm*15mm type bottom mold, 15mm*15mm to 24mm*24 type bottom mold, greater than 24mm*24mm type bottom mold; S308, according to the specifications of the embedding bottom mold, you can confirm the various default parameters required for the next step (maximum trimming depth, feed amount, number of trimming intervals between shooting, default light intensity and exposure time when taking pictures); S309, use the default parameters to proceed Take photos with front light and take photos of the corresponding field of view; S3010, determine whether the image quality meets the controllable retouching conditions; if not, execute S3011, if yes, execute S3013; S3011, determine whether to change the exposure time to take more than 3 photos, if yes, execute S3012, if no, execute S3010; S3012, convert to the preset retouching mode according to the tissue size; S3013, determine whether it is a tissue in the fixed field of view, if not, execute S3014, if yes, execute S3015; S3014, set the retouching parameters to the preset small tissue (less than 15*15mm base film) mode by default; S3015, confirm the first contour area value under the field of view; S3016, take the third embedded wax block image; S3017, cyclically determine the exposed tissue contour proportion value until the preset retouching threshold or the maximum retouching thickness is reached.

[0103] Through the above technical solution, a film retouching control solution is provided to assist users in realizing automatic and accurate film retouching of embedded pathological tissues. It does not require technicians to actively perform film retouching operations, reduces reliance on manual operations, and improves the level of film retouching automation and intelligence, ensuring the stability of film retouching quality and film retouching efficiency. The film retouching quality is further improved through backlighting processing, and the flexibility and controllability of film retouching control are improved by using a film retouching control parameter information group that can be configured and adjusted according to actual needs.

[0104] In addition, compared with traditional manual retouching methods, the system also achieves more precise control over key parameters such as feed amount. This high-precision automated operation not only greatly improves the standardization of tissue retouching, but also effectively reduces the risks of over-deep retouching due to human factors, ensuring the stability and reliability of retouching quality.

[0105] The system does not require direct human involvement in the film retouching process, which significantly saves labor costs. This change not only reduces the workload of technicians, but also enables the pathology department to invest more human resources in other key links that require manual judgment and decision-making, thereby promoting the overall work efficiency of the pathology department and providing the hospital with faster and more accurate pathology diagnosis services.

[0106] Figure 4 A schematic diagram of a structure of a slice repair control device for embedding pathological tissue provided in an embodiment of the present application, such as Figure 4 As shown, the device includes:

[0107] At least one processor. And a memory in communication with the at least one processor. The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to:

[0108] A first embedded wax block image is obtained from an image acquisition device. Based on the first embedded wax block image and a preset contour extraction algorithm, a corresponding embedded bottom mold contour area is determined to match the corresponding first trimming control parameter information group according to the embedded bottom mold contour area. According to the embedded bottom mold contour area, a second embedded wax block image of the embedded wax block is determined, and it is judged whether the second embedded wax block image meets the controllable trimming condition. The second embedded wax block image is obtained by shooting after backlighting along the shooting direction of the image acquisition device. The controllable trimming condition includes evaluation standard information of one or more evaluation dimensions characterizing image quality. When the second embedded wax block image meets the controllable trimming condition, a first contour area value corresponding to the embedded wax block is determined to control the tool to perform cyclic trimming on the embedded wax block based on the first trimming control parameter information group, and obtain a corresponding third embedded wax block image. Based on the second contour area value and the first contour area value in the third embedded wax block image and the preset trimming threshold, it is determined whether the embedded wax block meets the trimming end condition to obtain a trimmed embedded wax block.

[0109] Each embodiment in this application is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the device embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment.

[0110] The device and method provided in the embodiments of the present application correspond one to one, and therefore, the device also has similar beneficial technical effects as the corresponding method. Since the beneficial technical effects of the method have been described in detail above, the beneficial technical effects of the device will not be repeated here.

[0111] It should also be noted that the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, commodity or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, commodity or device. In the absence of more restrictions, the elements defined by the sentence "comprises a ..." do not exclude the existence of other identical elements in the process, method, commodity or device including the elements.

[0112] The above is only an embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various changes and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application should be included in the scope of the claims of the present application.

Claims

1. A method for controlling the repair of embedded pathological tissue, characterized in that: The method comprises: acquiring a first embedded wax block image from an image acquisition device; Based on the first embedded wax block image and a preset contour extraction algorithm, a corresponding embedded bottom mold contour area is determined, so as to match a corresponding first trimming control parameter information group according to the embedded bottom mold contour area; Determine a second embedded wax block image of the embedded wax block according to the embedded bottom mold contour area, and judge whether the second embedded wax block image meets the controllable repairing condition; wherein the second embedded wax block image is obtained by shooting after backlighting along the shooting direction of the image acquisition device; the controllable repairing condition includes evaluation standard information of one or more evaluation dimensions characterizing image quality; When the second embedded wax block image satisfies the controllable trimming condition, determining a first contour area value corresponding to the embedded wax block, controlling a tool to perform cyclic trimming on the embedded wax block based on the first trimming control parameter information group, and acquiring a corresponding third embedded wax block image; Based on the second contour area value and the first contour area value in the third embedded wax block image and a preset trimming threshold, it is determined whether the embedded wax block meets the trimming end condition to obtain a trimmed embedded wax block.

2. A method for controlling the repair of embedded pathological tissue according to claim 1, characterized in that: Before acquiring the first embedded wax block image from the image acquisition device, the method further includes: After receiving the embedding box ready signal, an automatic tool setting instruction is generated to move the embedding box fixing chuck to a predetermined position, and the current position of the tool motor is recorded through an encoder to complete the automatic tool setting; wherein, the embedding box ready signal is generated based on the embedding box being installed on the embedding box fixing chuck.

3. A method for controlling the repair of embedded pathological tissue according to claim 1, characterized in that: Based on the first embedded wax block image and a preset contour extraction algorithm, determining a corresponding embedded bottom mold contour area specifically includes: The first embedded wax block image is processed by the preset contour extraction algorithm to extract and draw the corresponding embedded bottom mold contour area; wherein the preset contour extraction algorithm is a contour extraction algorithm based on edge detection in the OpenCV library; the image processing at least includes grayscale processing, contrast enhancement, binarization processing, edge detection, contour extraction, and contour drawing.

4. A method for controlling the repair of embedded pathological tissue according to claim 1, characterized in that: Matching the corresponding first trimming control parameter information group according to the embedded bottom mold contour area specifically includes: Determine the corresponding embedded bottom mold specifications according to the area of ​​the embedded bottom mold contour area; wherein different embedded bottom mold specifications correspond to different area; The embedded bottom mold specifications are matched with a preset control parameter comparison table to determine the first trimming control parameter information group according to the matching result; wherein the preset control parameter comparison table includes a correspondence between different embedded bottom mold specifications and different trimming control parameter information groups; the trimming control parameter information group includes at least the following control parameters: maximum trimming depth, feed amount, number of trimming times between shooting intervals, light intensity, and exposure time.

5. A method for controlling the repair of embedded pathological tissue according to claim 4, characterized in that: Determining a second embedded wax block image of the embedded wax block according to the embedded bottom mold contour area, and judging whether the second embedded wax block image meets the controllable repairing condition, specifically includes: generating a backlight shooting instruction according to the first film repair control parameter information group, so as to start the backlight lighting device and enable the image acquisition device to shoot, so as to obtain the corresponding initial second embedded wax block image; According to the embedding bottom mold contour area, the initial second embedded wax block image is cropped to remove the pixel area outside the embedding bottom mold contour area in the initial second embedded wax block image to obtain the second embedded wax block image; Determine parameter information of the second embedded wax block image in each evaluation dimension; wherein each evaluation dimension includes at least: histogram distribution, contrast, noise, and edge quantity; Comparing each of the parameter information with each of the evaluation standard information corresponding to the controllable repairing conditions; When the comparison result is in compliance with the standard, determining that the second embedded wax block image meets the controllable repairing condition; When the comparison result does not meet the standard, the exposure time of the image acquisition device is updated according to the preset rules and the parameter information, and the initial second embedded wax block image is re-photographed and the cumulative number of updated exposure time is increased until the second embedded wax block image meets the controllable repair condition or the cumulative number of updated exposure time is greater than a predetermined value.

6. A method for controlling the repair of embedded pathological tissue according to claim 5, characterized in that: The method further comprises: When the cumulative number of updated exposure times is greater than a predetermined value, the embedded bottom mold specification is matched with a preset trimming mode set to trim the embedded wax block according to the matched preset trimming mode; wherein each of the preset trimming modes corresponds to each preset second trimming control parameter information group.

7. A method for controlling the repair of embedded pathological tissue according to claim 6, characterized in that: After the second embedded wax block image meets the controllable repairing condition, the method further includes: Determining the amount of tissue in the second embedded wax block image by using the preset contour extraction algorithm; In the case that the number of tissues is multiple, the second editing control parameter information group corresponding to the preset small tissue editing mode is updated to the first editing control parameter information group.

8. A method for controlling the repair of embedded pathological tissue according to claim 1, characterized in that: The image acquisition device is arranged above the embedded wax block, and the first embedded wax block image and the third embedded wax block image are obtained by shooting along the shooting direction with front lighting; Based on the second contour area value and the first contour area value in the third embedded wax block image and a preset trimming threshold, determining whether the embedded wax block meets a trimming end condition to obtain a trimmed embedded wax block specifically includes: According to each of the third embedded wax block images corresponding to the cyclic repair process, the ratio of each of the second contour area values ​​to the first contour area value is calculated as the exposed tissue contour ratio value; wherein the second contour area value corresponds to the exposed tissue portion of the embedded wax block after repairing; and the first contour area value corresponds to the projection area of ​​the pathological tissue in the embedded wax block projected along the shooting direction; Comparing the exposed tissue contour proportion values ​​with the preset retouching thresholds in sequence; When the exposed tissue contour ratio is greater than the preset trimming threshold, it is determined that the embedded wax block meets the trimming end condition and the trimming cycle is stopped to obtain the trimmed embedded wax block.

9. A method for controlling the repair of embedded pathological tissue according to claim 8, characterized in that: The method further comprises: Determine the exposed tissue contour ratio values ​​corresponding to the preset number of consecutive repair times, and add the exposed tissue contour ratio values ​​to the abnormality judgment ratio value sequence in chronological order; When the embedded wax block does not meet the trimming end condition and the proportion value change trend corresponding to the abnormal judgment proportion value sequence meets the abnormal alarm condition, a trimming alarm message is generated and the tool is controlled to stop trimming, and the trimming alarm message is sent to the user interface; wherein the abnormal alarm condition is that the proportion value change trend is a non-increasing trend; Alternatively, when the exposed tissue contour ratio is greater than 1, the trimming alarm information is generated, the tool is controlled to stop trimming, and the trimming alarm information is sent to the user interface.

10. A film repair control device for embedding pathological tissue, characterized in that: The device comprises: at least one processor; and, a memory communicatively connected to the at least one processor; wherein, The memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the slice repair control method for embedded pathological tissue as described in any one of claims 1 to 9.

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