Device for vibration test of low-temperature superconducting magnet supporting structure

Abstract

The invention relates to the technical field of vibration testing, and discloses a device for vibration testing of a low-temperature superconducting magnet supporting structure. The device comprises an internal adjusting unit and an external fixing unit, the adjusting unit comprises two adjusting structure sub-blocks, two mirror image adjusting structure sub-blocks, a longitudinal adjusting piece and a vertical adjusting piece, and the adjusting structure sub-blocks and the mirror image adjusting structure sub-blocks are connected through the longitudinal adjusting piece; the two adjusting structure sub-blocks are connected through a vertical adjusting piece, the two mirror image adjusting structure sub-blocks are connected through a vertical adjusting piece, the adjusting structure sub-blocks and the mirror image adjusting structure sub-blocks are each provided with a supporting structure interface used for arranging a to-be-tested supporting structure, and the external fixing unit is fixed to the vibration table and used for arranging the internal adjusting unit. Therefore, the deformation of the supporting piece caused by cold contraction deformation of the inner Dewar and the influence of the quality of the inner Dewar on the vibration state of the supporting piece can be considered, and the vibration state of the supporting piece in actual work can be restored to the maximum extent.

Description

Technical Field

[0001] The invention relates to the technical field of vibration testing, and in particular to a device for vibration testing of a low-temperature superconducting magnet support structure. Background Art

[0002] The low-temperature superconducting magnet support structure is located between the outer and inner dewars of the superconducting magnet (which contains superconducting coils). It is used to connect the outer and inner dewars and is the core load-bearing component of the superconducting magnet. During the normal operation of the superconducting coils, the temperature of the inner dewar will drop from room temperature to 4.2K. The shrinkage and deformation of the inner dewar material will cause a large difference between the support and the original assembly state. The connection between the support and the inner dewar will be greatly deformed, which will bring greater stress to the inside of the support, thereby affecting the vibration state of the support. At the same time, the weak radial stiffness caused by the low heat leakage design of the support will cause its radial vibration to be greatly affected by the load mass.

[0003] Since liquid helium is expensive, if the support component samples are assembled in the superconducting magnet machine for vibration testing, the refrigeration process will consume a large amount of liquid helium, and the sample testing often requires multiple rounds of iterations, which will greatly increase the development cost of the support component. At the same time, the internal vacuuming process before superconducting magnet refrigeration will also take a lot of time. If a conventional vibration test bench is used for vibration testing, the vibration state of the support component during actual operation cannot be restored. In addition, due to the influence of the prestress of the support structure caused by the deformation caused by the extremely low temperature inside on the vibration state, and the influence of the load mass of the support component on its vibration cannot be considered, the vibration test data of the support component has no reference significance for the evaluation of its anti-vibration performance during normal operation. Summary of the invention

[0004] The invention provides a device for vibration testing of a low-temperature superconducting magnet support structure, which can solve the technical problems in the prior art.

[0005] The present invention provides a device for vibration testing of a low-temperature superconducting magnet support structure, wherein the device comprises an internal adjustment unit and an external fixing unit, the adjustment unit comprises two adjustment structure blocks, two mirror adjustment structure blocks, a longitudinal adjustment piece and a vertical adjustment piece, the adjustment structure block and the mirror adjustment structure block are connected via the longitudinal adjustment piece, the two adjustment structure blocks are connected via the vertical adjustment piece, and the two mirror adjustment structure blocks are connected via the vertical adjustment piece, the adjustment structure block and the mirror adjustment structure block are both provided with a support structure interface for setting a support structure to be tested, and the external fixing unit is fixed on a vibration table for setting the internal adjustment unit.

[0006] Preferably, the longitudinal adjustment member and the vertical adjustment member are adjustment screws, and the adjustment screws are correspondingly connected to the adjustment structure block and the mirror adjustment structure block through threaded holes on the respective sides of the adjustment structure block and the mirror adjustment structure block.

[0007] Preferably, an operating member is provided on the adjusting screw for causing the adjusting screw to rotate axially.

[0008] Preferably, the adjusting member is a hexagonal structural member.

[0009] Preferably, a mounting hole is provided at the bottom of the internal adjustment unit, and the internal adjustment unit is fixed on the vibration table through the mounting hole.

[0010] Preferably, the side wall of the internal adjustment unit is provided with a mounting interface for setting the support structure to be measured, a mounting avoidance groove and an operation avoidance groove.

[0011] Preferably, the number of the longitudinal adjustment members and the number of the vertical adjustment members are both four.

[0012] Through the above technical solution, the internal adjustment unit can be used to simulate the shrinkage deformation of the inner dewar, and at the same time simulate the vibration load of the support when it is working normally, taking into account the deformation of the support caused by the shrinkage deformation of the inner dewar and the influence of the mass of the inner dewar on the vibration state of the support, and the vibration state of the support in actual work can be restored to the greatest extent. The device described in the present invention has the advantages of low cost and simple operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] The included drawings are used to provide a further understanding of the embodiments of the present invention, which constitute a part of the specification, are used to illustrate the embodiments of the present invention, and together with the text description, explain the principles of the present invention. Obviously, the drawings in the following description are only some embodiments of the present invention, and for ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0014] Figure 1 A schematic diagram showing an internal adjustment unit of a device for vibration testing of a low-temperature superconducting magnet support structure according to an embodiment of the present invention is shown;

[0015] Figure 2 A schematic diagram showing an external fixing unit of a device for vibration testing of a low-temperature superconducting magnet support structure according to an embodiment of the present invention is shown;

[0016] Figure 3 A schematic diagram showing the connection between an internal adjustment unit and a support structure to be tested according to an embodiment of the present invention is shown;

[0017] Figure 4A schematic diagram of assembling an apparatus for vibration testing of a low-temperature superconducting magnet support structure and a support structure to be tested according to an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0018] It should be noted that, in the absence of conflict, the embodiments in this application and the features in the embodiments can be combined with each other. The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and is by no means intended to limit the present invention and its application or use. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0019] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0020] Unless otherwise specifically stated, the relative arrangement of the parts and steps described in these embodiments, numerical expressions and numerical values ​​do not limit the scope of the present invention. At the same time, it should be understood that, for ease of description, the sizes of the various parts shown in the accompanying drawings are not drawn according to the actual proportional relationship. The technology, method and equipment known to ordinary technicians in the relevant field may not be discussed in detail, but in appropriate cases, the technology, method and equipment should be regarded as a part of the authorization specification. In all examples shown and discussed here, any specific value should be interpreted as being merely exemplary, rather than as a limitation. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once a certain item is defined in an accompanying drawing, it does not need to be further discussed in subsequent drawings.

[0021] like Figure 1-4As shown, an embodiment of the present invention provides a device for vibration testing of a low-temperature superconducting magnet support structure, wherein the device includes an internal adjustment unit and an external fixing unit, the adjustment unit includes two adjustment structure blocks 1, two mirror adjustment structure blocks 2, a longitudinal adjustment member 3 and a vertical adjustment member 4, the adjustment structure block 1 and the mirror adjustment structure block 2 are connected via the longitudinal adjustment member 3, the two adjustment structure blocks 1 are connected via the vertical adjustment member 4, and the two mirror adjustment structure blocks 2 are connected via the vertical adjustment member 4, the adjustment structure block 1 and the mirror adjustment structure block 2 are both provided with a support structure interface 5 for setting a support structure to be tested 10 (a support structure to be tested of a low-temperature superconducting magnet), and the external fixing unit is fixed on a vibration table for setting the internal adjustment unit.

[0022] The relative positions between the adjusting structure block 1 and the mirror adjusting structure block 2, between two adjusting structure blocks 1, and between two mirror adjusting structure blocks 2 are adjusted by corresponding adjusting members.

[0023] Through the above technical solution, the internal adjustment unit can be used to simulate the shrinkage deformation of the inner dewar, and at the same time simulate the vibration load of the support when it is working normally, taking into account the deformation of the support caused by the shrinkage deformation of the inner dewar and the influence of the mass of the inner dewar on the vibration state of the support, and the vibration state of the support in actual work can be restored to the greatest extent. The device described in the present invention has the advantages of low cost and simple operation.

[0024] For example, the sum of the masses of the four regulating structure blocks is equal to the mass of the Dewar in the full liquid state inside the low-temperature superconducting magnet.

[0025] According to one embodiment of the present invention, the longitudinal adjustment member 3 and the vertical adjustment member 4 are adjustment screws, and the adjustment screws are correspondingly connected to the adjustment structure block 1 and the mirror adjustment structure block 2 through threaded holes on the respective sides of the adjustment structure block 1 and the mirror adjustment structure block 2.

[0026] That is, each adjusting screw is connected to the corresponding adjusting structure block through the threaded hole on the side surface of the adjusting member block.

[0027] According to an embodiment of the present invention, an operating member is provided on the adjusting screw for causing the adjusting screw to rotate axially.

[0028] According to an embodiment of the present invention, the adjusting member is a hexagonal structural member.

[0029] That is, the relative positions of the four structural blocks can be adjusted by rotating the screws axially through the hexagonal structures on each adjusting screw (for example, the middle portion).

[0030] According to an embodiment of the present invention, a mounting hole 9 is provided at the bottom of the internal adjustment unit, and the internal adjustment unit is fixed on the vibration table through the mounting hole.

[0031] That is, the internal adjustment unit may have a mounting hole at the bottom, and the device for vibration testing may be connected to the table top of the vibration table.

[0032] According to an embodiment of the present invention, the side wall of the internal adjustment unit is provided with a mounting interface 6 for setting the support structure to be measured, a mounting avoidance groove 7 and an operation avoidance groove 8.

[0033] Among them, the installation interface is used for the installation and fixation of the support structure to be tested, the installation avoidance groove is used for the installation avoidance when the internal adjustment unit is connected to the support structure to be tested and is installed as a whole on the external fixing unit, and the operation avoidance groove is used for the operation avoidance when adjusting the support structure to be tested is deformed.

[0034] According to an embodiment of the present invention, the number of the longitudinal adjustment members 3 and the number of the vertical adjustment members 4 are both four.

[0035] For example, two longitudinal adjustment members 3 are arranged between the adjustment structure block 1 and the mirror adjustment structure block 2, two vertical adjustment members 4 are arranged between the two adjustment structure blocks 1, and two vertical adjustment members 4 are arranged between the two mirror adjustment structure blocks 2.

[0036] The operation flow of the device for vibration testing of a low-temperature superconducting magnet support structure according to the present invention is described below with reference to examples.

[0037] 1) Install the external fixing unit on the vibration table through the bottom mounting hole;

[0038] 2) Install the four support structures to be tested in the corresponding interfaces of the internal adjustment structure blocks, and adjust the longitudinal and vertical adjustment screws to make each structure block in the initial position. That is, in this installation state, the position of the support structure to be tested is consistent with the interface position of the external fixing unit of the tooling (device for vibration testing), such as Figure 3 As shown;

[0039] 3) Place the connected internal adjustment unit and the support structure to be tested as a whole from top to bottom into the external fixing unit, and connect and fix the support structure to be tested and the external fixing unit through the corresponding interface, such as Figure 4 As shown;

[0040] 4) Through the operation avoidance groove on the side wall of the external fixing unit, rotate the 8 adjustment screws until the deformation of the support structure is consistent with the shrinkage deformation of the inner Dewar, and then perform a vibration test on the support structure to be tested to restore the vibration state of the support in actual operation to the greatest extent.

[0041] It can be seen from the above embodiments that the device for vibration testing of a low-temperature superconducting magnet support structure according to the present invention has at least the following advantages:

[0042] (1) The vibration state of the low-temperature superconducting magnet support structure under vacuum and low temperature conditions is simulated by mechanical devices, which greatly reduces the testing cost and cycle of the support structure samples to be tested.

[0043] (2) In addition to simulating the normal working vibration state of the support structure, the mechanical device can realize vibration testing of the support structure under different deformation amounts, thereby achieving more comprehensive acquisition of the vibration characteristics of the support structure.

[0044] In the description of the present invention, it is necessary to understand that the directions or positional relationships indicated by directional words such as "front, back, up, down, left, right", "lateral, vertical, perpendicular, horizontal" and "top, bottom" are usually based on the directions or positional relationships shown in the drawings. They are only for the convenience of describing the present invention and simplifying the description. Unless otherwise specified, these directional words do not indicate or imply that the devices or elements referred to must have a specific direction or be constructed and operated in a specific direction. Therefore, they cannot be understood as limiting the scope of protection of the present invention. The directional words "inside and outside" refer to the inside and outside relative to the contours of each component itself.

[0045] For ease of description, spatially relative terms such as "above", "above", "on the upper surface of", "above", etc. may be used here to describe the spatial positional relationship between a device or feature and other devices or features as shown in the figure. It should be understood that spatially relative terms are intended to include different orientations of the device in use or operation in addition to the orientation described in the figure. For example, if the device in the accompanying drawings is inverted, the device described as "above other devices or structures" or "above other devices or structures" will be positioned as "below other devices or structures" or "below other devices or structures". Thus, the exemplary term "above" can include both "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatially relative descriptions used here are interpreted accordingly.

[0046] In addition, it should be noted that the use of terms such as "first" and "second" to limit components is only for the convenience of distinguishing the corresponding components. If not otherwise stated, the above terms have no special meaning and therefore cannot be understood as limiting the scope of protection of the present invention.

[0047] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A device for vibration testing of a low-temperature superconducting magnet support structure, characterized in that: The device comprises an internal adjustment unit and an external fixing unit, wherein the adjustment unit comprises two adjustment structure blocks (1), two mirror adjustment structure blocks (2), a longitudinal adjustment member (3) and a vertical adjustment member (4); the adjustment structure block (1) and the mirror adjustment structure block (2) are connected via the longitudinal adjustment member (3), the two adjustment structure blocks (1) are connected via the vertical adjustment member (4), and the two mirror adjustment structure blocks (2) are connected via the vertical adjustment member (4); the adjustment structure block (1) and the mirror adjustment structure block (2) are both provided with a support structure interface (5) for setting a support structure to be tested; and the external fixing unit is fixed on a vibration table for setting the internal adjustment unit.

2. The device according to claim 1, characterized in that The longitudinal adjustment member (3) and the vertical adjustment member (4) are adjustment screws, and the adjustment screws are correspondingly connected to the adjustment structure block (1) and the mirror adjustment structure block (2) through threaded holes on the respective sides of the adjustment structure block (1) and the mirror adjustment structure block (2).

3. The device according to claim 2, characterized in that The adjusting screw is provided with an operating member for causing the adjusting screw to rotate axially.

4. The device according to claim 3, characterized in that The adjusting member is a hexagonal structural member.

5. The device according to claim 4, characterized in that The bottom of the internal adjustment unit is provided with a mounting hole, and is fixed on the vibration platform through the mounting hole.

6. The device according to claim 5, characterized in that The side wall of the internal adjustment unit is provided with a mounting interface (6) for setting the support structure to be measured, a mounting avoidance groove (7) and an operation avoidance groove (8).

7. The device according to any one of claims 1 to 6, characterized in that The number of the longitudinal adjustment members (3) and the number of the vertical adjustment members (4) are both four.

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